CN110823364A - High-intensity illuminometer calibration device and calibration method - Google Patents
High-intensity illuminometer calibration device and calibration method Download PDFInfo
- Publication number
- CN110823364A CN110823364A CN201911183138.9A CN201911183138A CN110823364A CN 110823364 A CN110823364 A CN 110823364A CN 201911183138 A CN201911183138 A CN 201911183138A CN 110823364 A CN110823364 A CN 110823364A
- Authority
- CN
- China
- Prior art keywords
- light source
- optical
- illuminometer
- diaphragm
- illumination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000005286 illumination Methods 0.000 claims abstract description 76
- 230000007935 neutral effect Effects 0.000 claims abstract description 29
- 230000003287 optical effect Effects 0.000 claims description 115
- 238000004088 simulation Methods 0.000 claims description 34
- 230000017525 heat dissipation Effects 0.000 claims description 32
- 238000005259 measurement Methods 0.000 claims description 27
- 238000012360 testing method Methods 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 12
- 238000005516 engineering process Methods 0.000 claims description 7
- 239000000523 sample Substances 0.000 claims description 6
- 239000003292 glue Substances 0.000 claims description 3
- 230000009977 dual effect Effects 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 6
- 230000003595 spectral effect Effects 0.000 description 6
- 238000013461 design Methods 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 5
- 230000004907 flux Effects 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- CKQBSDUWDZEMJL-UHFFFAOYSA-N [W].[Br] Chemical compound [W].[Br] CKQBSDUWDZEMJL-UHFFFAOYSA-N 0.000 description 3
- 230000002238 attenuated effect Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0455—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings having a throughhole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a through-hole for a light collecting or light injecting optical fibre
Abstract
The invention relates to a device and a method for calibrating a high-intensity illuminometer, belongs to the field of detection equipment, and discloses a device and a method for calibrating a high-intensity illuminometer, which utilize a high-power LED array light source as a luminous source, adopt a double-lens light path to converge and mix light beams, ensure that emergent light conforms to the inverse square law, and ensure that the illumination at a light outlet 1m is greater than 105lx; and tracing the source of the high-intensity illumination light source to the national illumination standard by using a neutral filter attenuation method, and then calibrating the high-intensity illuminometer by using the traced high-intensity illumination light source, thereby finally realizing the magnitude tracing of the high-intensity illuminometer.
Description
Technical Field
The disclosure belongs to the field of detection equipment, and particularly relates to a calibration device and a calibration method of an intense illumination photometer.
Background
With the development of aerospace technology, the comfort and safety of cabin illumination are brought forward by modern warHigher requirements, especially for the performance stability and reliability test of displays under strong light background, are increasingly emphasized. For example, in the case of no obscuration during daylight hours, the illumination on an on-board display may reach 105lx, in order to ensure the performance of the airborne display under the background environment of strong illumination, the strong illumination light source and the strong illumination photometer become essential detection equipment in the development, production and inspection processes of the airborne display and other special purposes.
On the basis of the conventional luminosity guide rail technology, many scientific research institutions in China optimize the calibration capability of a photometer and expand the capability, for example: the Kunshan constant technology service company improves a rack, a slide rail, a shielding plate and the like in a conventional luminosity guide rail, and can position a light source and an illuminometer by adopting the same adjusting mode, so that the detection convenience of the illuminometer is improved (ZL 201820084298.2); an integrating sphere light source system, a diaphragm, an optical collimation system, a standard weak light detector, a translation table and the like are utilized by the optical research institute of Xian application to develop a weak light luminosity calibration device, and the weak light luminosity calibration device is realized by 10-3lx～10-9And (4) calibrating the weak light illumination of the weak light measuring instrument in the lx range. The Fujian province's measurement science research institute utilizes ultraviolet source equipment, integrating sphere, adjustable diaphragm subassembly etc. to design a calibrating device of ultraviolet irradiance meter, has expanded the measuring wave band of irradiance from visible light to ultraviolet.
The prior art expands the measuring range to weak illumination, ultraviolet and other directions on the basis of conventional illumination calibration, but the technologies have many defects when calibrating an intensive photometer, and mainly comprise the following points:
(1) the sunlight color temperature is about 6500K, and the existing illuminometer calibration device adopts a 2586K A light source, and calibration of the illuminometer used under the 6500K color temperature condition can cause certain deviation.
(2) The illumination range which can be calibrated in the prior art is 50 lx-3000 lx, and the illumination range can be reduced to 10 by arranging the light source A in the integrating sphere and matching with the diaphragm assembly and the optical collimation system-3lx～10-9lx. However, 10 cannot be generated5light conditions of the order of lx.
(3) The highest value of national illumination calibration is 103lx magnitude, the problem of magnitude traceability of the high illuminance cannot be solved in the prior art, and the reliability of the test result of the high illuminance meter is poor.
Disclosure of Invention
Aiming at the defects of the prior art, the invention designs the device and the method for calibrating the high-intensity illuminometer, which utilize a high-power LED array light source as a luminous source, adopt a double-lens light path to converge and mix light beams, ensure that emergent light conforms to the inverse square law, and ensure that the illumination at the position of 1m of a light outlet is more than 105lx; and tracing the source of the high-intensity illumination light source to the national illumination standard by using a neutral filter attenuation method, and then calibrating the high-intensity illuminometer by using the traced high-intensity illumination light source, thereby finally realizing the magnitude tracing of the high-intensity illuminometer.
The first technical scheme of the disclosure:
a high-intensity illuminometer calibration device comprises a high-intensity illuminance simulation light source, an optical platform, a high-intensity illuminometer value traceability system, an optical measurement system and an optical darkroom; the strong illumination simulation light source is arranged on the five-dimensional adjusting table; the five-dimensional adjusting table is arranged at one end of the optical guide rail; the posture of the high-illumination standard light source is adjusted.
The optical measurement system comprises a five-dimensional adjusting platform, an optical guide rail, a diaphragm assembly and a four-dimensional adjusting platform; the high-intensity light measurement system comprises a filter set and a standard illuminometer.
The optical guide rail is arranged on the optical platform; the four-dimensional adjusting table is placed on the optical guide rail, can slide on the guide rail and is used for adjusting the posture of the measured piece.
The diaphragm group is arranged on the optical guide rail, is arranged between the five-dimensional adjusting table and the four-dimensional adjusting table, and can slide on the guide rail; each diaphragm in the diaphragm group is provided with diaphragm holes which are coaxial with the light source emitted by the high-intensity simulation light source.
A neutral optical filter is arranged on a diaphragm hole on the diaphragm close to the high-illumination artificial light source in the diaphragm group; the standard illuminometer is arranged on the four-dimensional adjusting platform; the neutral filter is used for adjusting the illumination intensity to the measuring range of a standard illuminometer, the standard illuminometer is arranged on a four-dimensional adjusting table, and the four-dimensional adjusting table can adjust the light source to vertically irradiate the standard illuminometer.
The strong illumination simulation light source, the optical platform, the optical measurement system and the strong illumination measurement value system are all arranged in the optical darkroom.
Further, the high-illumination simulation light source comprises a heat dissipation system, a light source, an optical collimation system, a power supply system and a shell; the heat dissipation system, the luminous source and the optical collimation system of the high-illumination simulation light source are arranged in the shell; the heat dissipation system, the light source and the optical collimation system are sequentially arranged from left to right; the luminous source is a high-power LED array light source; the LED array light source is fixed on the heat dissipation system through the heat conduction substrate; the optical collimation system consists of two plano-convex lenses; the first plano-convex lens collects and converges light emitted by the LED light source in a hemispherical space, and then the second plano-convex lens is used for continuously converging mixed light to improve the uniformity of output light; the power supply system is arranged on the shell and supplies power to the light source; the side of the shell facing the optical collimation system is provided with an optical hole.
Further, the heat dissipation system comprises a heat dissipation fin and a heat dissipation fan; the heat conducting substrate is fixed on the radiating fin through heat conducting glue; the radiating fan is arranged at the rear end of the radiating fin; the radiating fin adopts a fin-shaped structure.
Furthermore, the shell of the high-illumination simulation light source consists of a U-shaped shell, a bottom plate, a front cover plate and a rear cover plate; the front cover plate and the rear cover plate are connected with a U-shaped opening of the U-shaped shell, and the bottom plate is connected with a rectangular opening of the U-shaped shell; the heat dissipation system and the optical alignment system are fixed on the bottom plate; two side walls of the U-shaped shell are provided with heat dissipation ports; the power supply is fixed at the top of the U-shaped shell; the front cover plate is provided with a light hole.
Furthermore, the power supply system is an internal direct current power supply module or an external direct current module.
Further, the diaphragm group comprises at least four optical billows; each optical wave is installed on the optical guide rail through the optical wave base; the optical filter fixture with the slot is attached to an optical diaphragm hole on the first optical diaphragm in the light source emitting direction of the high-illumination simulation light source and used for placing a neutral optical filter.
Further, the distance between the first optical wave and the high-intensity simulation light source in the light source emission direction is 1 m.
Furthermore, the optical guide rail adopts a parallel double-rail technology; the optical guide rail is provided with a magnetic grid ruler; the magnetic grid head includes a read head and a magnetic scale.
Further, the optical measurement system also comprises a light source unevenness measurement tool clamp; the light source unevenness measuring tool clamp comprises a nine-hole target plate and a fixed base plate; the nine-hole target plate is fixed on a fixed base; the substrate is fixed on the smooth holes.
Furthermore, the nine-hole target plate has 9 openings arranged in a 3 × 3 array, can be designed to have different opening diameters, and is matched with different diaphragms for use, so that the uniformity of the high-illumination standard light source is tested.
The second technical scheme of the disclosure:
a calibration method based on the calibration device comprises the following steps:
A. the high-illumination simulation light source is lightened through a power supply system, the light source outputs light to be coaxial with each diaphragm hole by adjusting the five-dimensional adjusting platform, a diaphragm with a proper hole diameter is selected, the position of the diaphragm on the light rail is determined, and the influence of stray light on a test result is reduced;
B. selecting an applicable neutral optical filter from the optical filter group, and adjusting the illumination value of the optical filter to the measurement range of a standard illuminometer;
C. and adjusting the four-dimensional adjusting table to enable the light beam to vertically enter the standard illuminometer probe, and moving the four-dimensional adjusting table back and forth to finish the illuminance accuracy calibration of different positions of the strong illuminance standard light source.
Compared with the prior art:
(1): this application is through utilizing high-power LED array as the light emitting source, adopts the double-lens light path to assemble and mix the light beam, ensures that the emergent light accords with the inverse square law.
(2): the heat resistance of the high-power LED array light source is an important factor influencing the service life and the stability of the high-power LED array light source, the high-power LED array light source is arranged on a heat dissipation system, and a scheme that a heat radiator and a heat dissipation fan are combined through passive convection heat dissipation is adopted, so that the high-power heat resistance is reduced by 0.15 ℃/W, the volume and the weight of the light source are reduced, the heat dissipation effect is improved, and the working reliability of the light source is ensured.
(3): the strong illuminometer calibration device disclosed by the invention is characterized in that a neutral optical filter is arranged on a diaphragm with the distance of 1m between the high-intensity simulation light source and the light source in the light source emission direction; and tracing the source of the high-intensity illumination light source to the national illumination standard, and then calibrating the high-intensity illumination meter by using the traced high-intensity illumination light source, thereby finally realizing the magnitude tracing of the high-intensity illumination meter.
(4): the strong illuminometer calibration device disclosed by the invention can generate strong illuminance light radiation with the color temperature of 6500K, and is suitable for calibrating illuminometers used under the condition of 6500K color temperature, such as solar radiation illuminometers and the like.
(5): the calibration method of the high-intensity illuminometer can improve the calibration range of the illuminometer to 105lx magnitude, and the tracing of the magnitude of the strong illumination is realized through the neutral filter and the standard illuminometer.
Drawings
FIG. 1 is a diagram of an apparatus for calibrating an illuminometer according to the present disclosure;
FIG. 2 is an internal structural diagram of the high illuminance simulation light source device of the present disclosure;
FIG. 3 is a schematic view of a light source of the high illuminance simulation light source apparatus of the present disclosure;
FIG. 4 is a schematic view of the housing structure of the high illuminance simulation light source device of the present disclosure;
FIG. 5 is a schematic view of an optical platform of the calibration apparatus of the illuminance meter according to the present disclosure;
FIG. 6 is a schematic view of a diaphragm set of the calibrating apparatus of the illuminometer according to the present disclosure;
FIG. 7 is a front view of a five-dimensional adjustment table of the present disclosure;
FIG. 8 is a side view of a five-dimensional adjustment table of the present disclosure;
FIG. 9 is a top view of a five-dimensional adjustment table of the present disclosure;
FIG. 10 is a front view of a four-dimensional adjustment table of the present disclosure;
FIG. 11 is a side view of a four-dimensional adjustment table of the present disclosure;
FIG. 12 is a top view of a four-dimensional adjustment table of the present disclosure;
fig. 13 is a schematic block diagram illustrating a high illuminance light source magnitude tracing technique according to the present disclosure;
fig. 14 is a graph of spectral transmittance of a transmissive neutral density filter of the present disclosure;
FIG. 15 is a graph of spectral transmittance of a reflective neutral density filter according to the present disclosure;
FIG. 16 is a diagram of a filter holder and aperture combination according to the present disclosure;
FIG. 17 is a block diagram of a uniformity test target of the present disclosure;
fig. 18 is a graph of the effect of the uniformity test target plate and diaphragm combination of the present disclosure.
DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION
The present disclosure is further described with reference to the drawings and the detailed description below.
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
Referring to fig. 1-2, the device mainly comprises an intensive illumination simulation light source 1, an optical platform 2, an optical guide rail 3, a five-dimensional adjusting table 4, a four-dimensional adjusting table 5, a diaphragm group 6, a filter group 7, a standard illuminometer 8, a standard diffuse reflection plate 9, a power supply system 10, a shading device 11 and the like.
Wherein five dimension adjustment platform 4 and optical guide 3 set up on optical platform 2, and the left end of optical guide 3 is arranged in to five dimension adjustment platform 4, and high strength emulation light source device 1 sets up on five dimension adjustment platform 4 for adjust the gesture of high illuminance standard light source, the adjustment dimension includes: front and back, left and right, up and down, pitching and horizontal rotation.
The four-dimensional adjusting table is arranged on the optical guide rail, can slide back and forth on the guide rail and is used for adjusting the posture of the standard illuminometer, the standard illuminometer is ensured to be irradiated by the light source of the diaphragm group, and the adjusting dimension comprises: left and right, up and down, pitching and horizontal rotation.
The diaphragm group is arranged on the optical guide rail and can slide left and right on the optical guide rail, the diaphragm group is arranged between the standard light source with strong illumination and the four-dimensional adjusting table, each diaphragm in the diaphragm group is provided with diaphragm holes, and the diaphragm holes are coaxial with the light source emitted by the high-intensity simulation light source. These diaphragm holes have 6 different opening diameters: phi 20mm, phi 50mm, phi 100mm, phi 150mm, phi 200mm, phi 300 mm.
A neutral optical filter is arranged on a diaphragm hole on the diaphragm of the diaphragm group, which is close to the high-intensity simulation light source from the left end; the neutral filter is used for adjusting the illumination intensity to the measurement range of a standard illuminometer.
The shading device is built by aluminum profiles, the top of the shading device is provided with a shading curtain, a guide rail and a lighting system, the periphery shading cloth is arranged on the curtain guide rail, the opening is staggered for a certain distance, and the internal illumination is lower than 10-1lx. All the devices are placed inside the shading device, and darkroom testing is achieved.
And finally, the power supply system provides power output for the whole system and controls the five-dimensional adjusting table and the four-dimensional adjusting table at the same time.
As shown in fig. 1, firstly, the high-illuminance simulation light source is turned on by the power supply system, the light source outputs light to be coaxial with each diaphragm hole by adjusting the five-dimensional adjusting platform, a diaphragm with a proper hole diameter is selected, the position of the diaphragm on the light track is determined, and the influence of stray light on the test result is reduced; selecting an applicable neutral optical filter from the optical filter group, and adjusting the illumination value of the optical filter to the measurement range of a standard illuminometer; and adjusting the four-dimensional adjusting table to enable the light beam to vertically enter the standard illuminometer probe, and moving the four-dimensional adjusting table back and forth to finish the illuminance accuracy calibration of different positions of the strong illuminance standard light source.
The nine-hole target plate is placed in a light path, the standard illuminometer is used for testing the illumination of different holes, the target plate with the small diameter of the opening is selected in a short distance, the target plate with the straight and large opening is selected in a long distance, and after the calibration of the uniformity of the standard light source with strong illumination is completed, the nine-hole target plate, the standard illuminometer and the filter set are moved out of the light path.
And placing the standard diffuse reflection plate in the light path, calibrating the brightness value and the color temperature value on the diffuse reflection plate through a brightness meter, and moving the standard diffuse reflection plate out of the light path after the calibration is finished, thereby completing the calibration of the standard light source with strong illumination.
Then, the illuminometer to be measured is placed in a light path, a light beam is vertically incident on the surface of a probe of the illuminometer through a four-dimensional adjusting table, and the four-dimensional adjusting table is moved back and forth to finish the calibration of the accuracy of different illuminance ranges of different illuminometers.
Fig. 2 is an internal structure diagram of a high-illuminance simulation light source device according to the present disclosure, which includes a heat dissipation fan 110, a heat dissipation plate 120, a high-power LED array light source 130, an optical collimating system 140, a power supply system 150, and a housing 160.
Wherein the heat dissipation fan 110, the heat dissipation plate 120, the high-power LED array light source 130 and the optical collimation system 140 are arranged inside the housing 160; and the heat dissipation fan 110, the heat dissipation plate 120, the high-power LED array light source 130 and the optical collimating system 140 are sequentially disposed from left to right.
Because the high-power LED array light source works in a direct current mode, the output of a power supply of the high-power LED array light source needs to be a direct current voltage. The device adopts two modes to supply power to the light source, namely an internal direct-current power supply module and an external high-stability direct-current power supply. This design provides a more reliable way of operation for the light source.
For the power supply mode of the built-in direct current type power supply, the power supply is packaged in the shell of the light source, the temperature of the internal devices of the power supply reaches 70 ℃ when the power supply works, the generated heat can increase the local temperature of the light source and influence the stability of the light source, and therefore the power supply is only used for supplying power when the light source works for a short time or outdoors. And when the laboratory works for a long time, an external direct current power supply mode can be selected.
As shown in fig. 2, the optical collimating system 140 of the present disclosure is composed of two focusing lenses, and the light emitted from the LED light source in the hemispherical space is collected and converged by the plano-convex lens, and then continuously converged by the second lens, so as to improve the uniformity of the output light. The area where the light energy is most concentrated after the first condensation, where the luminous intensity of the light source may be more than 150000cd, but still large due to the divergence angle. After two times of compression, the light utilization rate reaches more than 50%.
Specifically, the shell of the high-intensity simulation light source device consists of a U-shaped shell, a bottom plate, a front cover plate and a rear cover plate; the front cover plate and the rear cover plate are connected with a U-shaped opening of the U-shaped shell, and the bottom plate is connected with a rectangular opening of the U-shaped shell; the heat dissipation system and the optical alignment system are fixed on the bottom plate; two side walls of the U-shaped shell are provided with heat dissipation ports; the power supply is fixed at the top of the U-shaped shell; the front cover plate is provided with a light hole.
For a high-power LED array light source, 2856K bromine tungsten lamps are mostly adopted as light intensity standard lamps by the current domestic and foreign metering technical mechanisms, and the traceability of illumination intensity and brightness values is solved. However, the bromine-tungsten lamp has large volume, low luminous efficiency, and is packaged by glass, fragile, short in service life, and light radiation is distributed in 4 pi space, so that the bromine-tungsten lamp is not suitable for being used as an intense light source. The xenon lamp has high luminous efficiency, high brightness and spectrum close to the solar spectrum, is usually used for simulating sunlight in a laboratory, but has high power consumption and high photo-thermal property and is also a defect of the xenon lamp as strong light illumination. The device is not suitable for a small high-illumination simulation light source with low power consumption, so that the device develops a low-power consumption, high-color temperature and high-illumination simulation light source based on a high-power LED array light source.
In particular, the thermal resistance of a high-power LED array light source is an important factor affecting its lifetime and stability. The thermal resistance is the resistance of heat on a heat flow path, which reflects the magnitude of heat transfer capacity between media or media, and indicates the magnitude of temperature rise caused by 1W heat, generally indicated by the symbol RjsIs represented by, i.e. RjsT/Q in deg.c/W. For a given material, the thermal resistance is not only related to the heat conductivity coefficient rho of the material, but also related to the heat conduction distance L and the sectional area A perpendicular to the heat flow direction on the heat flow pathThe thermal resistance of the thermally conductive link can therefore be calculated using equation (1).
For a high-power LED array light source, under a certain ambient temperature, when the thermal resistance is small, the luminous flux is approximately proportional to the forward working current. When the thermal resistance increases, the luminous flux will tend to saturate and then gradually decrease as the forward current increases to a certain level due to the increase of junction temperature. Reducing junction temperature and LED thermal resistance is therefore one of the most straightforward ways to improve LED luminous efficiency. Therefore, the LED high power 131 of the present disclosure as shown in fig. 4 is fixed on the heat conducting substrate 132, and then the heat conducting substrate 132 is fixed on the heat sink 12 by the heat conducting glue, and the heat dissipating fan 13 is disposed at the rear end of the heat sink 12; thus, the scheme of combining the radiating fins 12 with the passive convection radiating is adopted, so that the thermal resistance is reduced by 0.15 ℃/W, the volume and the weight of the light source are reduced, the radiating effect is improved, and the working reliability of the light source is ensured.
Specifically, the heat conducting substrate 132 and the heat sink 12 in this embodiment are made of aluminum alloy, the heat sink is made of fin-shaped structure as shown in the figure, and finally the heat dissipation fan 11 is added at the rear end of the heat sink 12.
As in fig. 5, the optical platform 2 of the present disclosure may be leveled by a high precision level; wherein the optical platform adopts a stainless steel panel, and the inner core adopts a honeycomb structure.
The optical guide rail 3 of the present disclosure is not only a measuring table, but also an object stage, on which a diaphragm group and its clamp, a neutral filter and its clamp, a standard diffuse reflection plate and its clamp, and a standard illuminometer and a support table need to be placed, and these clamps or support tables need to stably move on the optical measuring guide rail according to the measuring requirements, so the optical guide rail of the present disclosure adopts a parallel double-rail technology. In order to accurately measure the accurate position of the measured piece to the light source in the moving process, the designed optical guide rail is provided with the magnetic grid ruler, so that the influence of the light of the laser range finder on the measurement result in the measuring process can be reduced. The measurement accuracy of the magnetic grid ruler is +/-0.01 mm. The magnetic grid ruler consists of a read head and a magnetic ruler, and the read head and the magnetic ruler work according to the magnetic induction principle. When the read head makes linear motion in the magnetic field space of the S-magnetic scale, the read head can output position pulses meeting the standard in real time according to the relevant motion displacement.
As shown in fig. 6, the diaphragm holes on the diaphragm group of the present disclosure are mainly used for blocking stray light, and the diaphragm is usually disposed on the optical guide rail and can freely slide on the optical slide rail. When the device works, the diaphragms are not simultaneously placed on the slide rail, and corresponding aperture diaphragms are selected according to test requirements. The diaphragm group is arranged between the standard light source with strong illumination and the four-dimensional adjusting platform, each diaphragm in the diaphragm group is provided with a diaphragm hole which is coaxial with the light source emitted by the high-intensity simulation light source, and the holes are sequentially enlarged in the emitting direction of the light source; the aperture diaphragm is processed by adopting an aluminum alloy material, and the surface is blackened. The space diaphragm is fixed on the diaphragm clamp, and the clamp is placed on the optical slide rail.
The five-dimensional adjusting test bench is used for placing the high-illumination simulation light source, accurately adjusting the posture of the light source, ensuring that the light emergent direction of the high-illumination simulation light source is parallel to the direction of the optical slide rail, and enabling the optical axis to coincide with the center of the stray light blocking diaphragm group as much as possible. Therefore, the five-dimensional adjustment test bench must meet the technical requirements of equipment debugging and working. The three-dimensional adjusting test bench is shown in fig. 7-9, the lowest part of the adjusting bench is a horizontal linear displacement bench 41, and the maximum stroke in the left-right direction is 40 cm. The upper layer is a linear displacement table 42 which can move back and forth, and the maximum stroke is 20 cm. The third layer is a rotary table 43 which can rotate in the horizontal direction and is manually adjusted by a screw rod, the rotary table is fixed on a lifting sliding table 44, a pitching table 45 is arranged on the upper surface of the rotary table, and an object stage 46 is arranged on the upper surface of the pitching table 45. The turntable is controlled by the lifting platform to drive the objective table to move in the vertical direction. The whole five-dimensional adjusting table is made of stainless steel, and the displacement table at the bottom is fixed on the optical platform, so that the stability of the platform is ensured. The five-dimensional adjusting test bench is mainly used for fixing and adjusting the posture of a tested piece.
Referring to fig. 10-12, the four-dimensional stage 5 of the present disclosure is fixed to the optical rail 2 and can slide precisely on the rail. Therefore, only two linear displacement directions of the left and right slide movement 51 and the up and down slide 55 are designed in the design. Wherein the pitch table 53 and the object table 54 are the same as the five-dimensional adjustment table, and the display clamp 58 to be tested is designed to be manually adjusted to meet the requirements of the tests of displays of different sizes. Below this four-dimensional adjusting station, designed laser range finder anchor clamps, can fix laser range finder on the testboard, make laser range finder 56 and five-dimensional testboard keep synchronous motion, realize the accurate measurement to measured piece and source export radial distance. The reflection white band 57 provided for the laser range finder is fixed below the five-dimensional test bed for the light source and is kept fixed with the five-dimensional test bed for the light source.
The test piece holder 58 may also hold a standard light meter. In order to reduce the influence of scattered light on the measurement result, all components of the five-dimensional test bench are treated by a blackening process.
The illuminometer calibration device disclosed by the invention has the advantages that the illuminance value is more than 100,000lx at the position 1m away from the light source outlet. However, the domestic standard traceability range is 3000 lx. Therefore, the device realizes the tracing of the illumination magnitude of the high-illumination light source by adopting a method of adding the neutral optical filter and the standard illuminometer. As shown in fig. 13: placing an aperture diaphragm with a clear aperture of 20mm at a distance of 1m from a high-illumination light source, designing an optical filter clamp for the aperture diaphragm, placing a neutral optical filter with a transmissivity of tau into the clamp according to test requirements, placing an illumination probe of a standard illuminometer behind the optical filter, and reading an illumination indication value E of the illuminometermCalculating the actual illuminance E of the light source at the position according to the following formulas。
Es＝Em/τ (2)
(1) Selection of standard illuminometers
The standard illuminometer is a key device for realizing the value traceability of the high-illumination light source. In order to not influence the illumination measurement result, the indicator of the illuminometer is generally designed without a backlight source, so that in a dark room, the direct reading of the indication value of the illuminometer is difficult, and the illuminometer with an illumination probe connected with a host machine through a flexible wire is selected in the device. The illuminometer can directly trace to the national illuminance standard and can also trace to the national defense highest standard. The illuminometer can be used for calibrating the illuminance value of the high-illuminance light source after tracing.
(2) Type selection of neutral filter
Neutral filters are of two types: reflective and absorptive. The reflection type is to plate a reflection film on optical glass, and control of light flux is realized by reflection. The absorption filter changes the light flux of transmitted light by absorbing light. In the reflective neutral density filter, the spectral transmittance of the reflective neutral density filter is relatively flat compared to that of the transmissive neutral density filter, but the reflected light of the reflective type forms stray light in the environment, and therefore measures are taken to reduce the influence of the stray light on the measurement result in application. However, in the high-precision spectral radiometer, a reflection-type neutral filter is generally used to attenuate a wide-spectrum light because the transmission-type spectral responsivity is not flat and the light with different wavelengths is not attenuated in equal proportion. Fig. 14 is a graph showing the transmittance of the transmission type neutral density filter, and fig. 15 is a graph showing the transmittance of the reflection type neutral density filter.
The device selects a group of reflection type neutral optical filters with optical density OD of 0.5, 1.0, 1.5 and 2.0 respectively at the visible light wave band transmissivity, and the group of optical filters has relatively flat spectral transmissivity at the wavelength of 380nm to 780nm and the diameter is 25 mm. The light source can be attenuated by 300 times to 1000 times through the combination of the light filters, when the illumination is 100,000lx when no attenuation is generated at the position of 1m, the illumination can be attenuated to 100 lx-3000 lx through the combination of the attenuators, and then the illumination of the light source can be easily traced to the national standard by using a standard illuminometer which is traced by the magnitude.
Meanwhile, in order to ensure the stability of the measurement result, the clamp of the optical filter is fixed on the aperture diaphragm with the clear aperture of 20mm, and the structure is shown in fig. 16. The filter holder 71 is designed to be insertable, i.e. the selected filter is inserted directly into the slot 72 of the holder. The design has the characteristic of convenient use and can ensure the repeatability of positioning.
The non-uniformity measurement of the light source of the device of the present disclosure is to measure the illuminance of 9 points on the light emitting surface and then calculate the illuminance non-uniformity of the light source. In order to guarantee the accuracy of illuminance meter location when light source illuminance unevenness is measured, improve and measure repeatability, this disclosure has designed 3 sets of frock clamp, matches the use with phi 50mm and phi 150 mm's diaphragm respectively. The structure of the clamp for matching the diaphragm with the diameter of 50mm is shown in fig. 17, and the clamp consists of a nine-hole target plate 61 and a fixed substrate 62, wherein the nine-hole target plate 61 is fixed on the fixed substrate 62; the base plate 62 is mounted on a 150mm diaphragm through 4 fixing holes 63.
The above description is only exemplary of the present disclosure, and not intended to limit the present disclosure to the particular embodiments, but is intended to cover all modifications, equivalents, improvements, and equivalents included within the spirit and scope of the present disclosure.
Other technical features than those described in the specification are known to those skilled in the art, and are not described in detail herein in order to highlight the novel features of the present invention.
Claims (10)
1. The device for calibrating the high-intensity illuminometer is characterized by comprising a high-intensity illuminance simulation light source, an optical platform, a high-intensity illuminometer value tracing system, an optical measuring system and an optical darkroom;
the optical measurement system comprises a five-dimensional adjusting platform, an optical guide rail, a diaphragm assembly and a four-dimensional adjusting platform; the intense illumination measurement value system comprises a filter set and a standard illuminometer;
the strong illumination simulation light source is arranged on the five-dimensional adjusting table; the five-dimensional adjusting table is arranged at one end of the optical guide rail; the attitude of the high-illumination standard light source is adjusted; adjusting the dimensions includes: front-back, left-right, up-down, pitching and horizontal rotation;
the optical guide rail is arranged on the optical platform; the four-dimensional adjusting table is placed on the optical guide rail, can slide on the guide rail and is used for adjusting the posture of the measured piece; adjusting the dimensions includes: left and right, up and down, pitching and horizontal rotation;
the diaphragm group is arranged on the optical guide rail, is arranged between the five-dimensional adjusting table and the four-dimensional adjusting table, and can slide on the guide rail; each diaphragm in the diaphragm group is provided with diaphragm holes which are coaxial with the light source emitted by the high-intensity simulation light source;
a neutral optical filter is arranged on a diaphragm hole on a diaphragm close to the high-illumination artificial light source in the diaphragm group; the standard illuminometer is arranged on the four-dimensional adjusting platform; the neutral optical filter is used for adjusting the illumination intensity to a measurement range of a standard illuminometer, the standard illuminometer is arranged on a four-dimensional adjusting table, and the four-dimensional adjusting table can adjust a light source to vertically irradiate the standard illuminometer;
the strong illumination simulation light source, the optical platform, the optical measurement system and the strong illumination measurement value system are all arranged in the optical darkroom.
2. The apparatus for calibrating an illuminance meter as claimed in claim 1, wherein said illuminance emulation light source comprises a heat dissipation system, a light source, an optical alignment system, a power supply system, a housing;
the heat dissipation system, the luminous source and the optical collimation system of the high-illumination simulation light source are arranged in the shell; the heat dissipation system, the light source and the optical collimation system are sequentially arranged from left to right;
the light emitting source is a high-power LED array light source; the LED array light source is fixed on the heat dissipation system through the heat conduction substrate; the optical collimation system consists of two plano-convex lenses; the first plano-convex lens collects and converges light emitted by the LED array light source in a hemispherical space, and then the second plano-convex lens is used for continuously converging mixed light to improve the uniformity of output light;
the power supply system is arranged on the shell and supplies power to the light source; and one surface of the shell facing the optical collimation system is provided with an optical hole.
3. An illuminance meter calibration device as defined in claim 2 wherein said heat dissipation system comprises a heat sink and a heat dissipation fan; the heat conducting substrate is fixed on the radiating fin through heat conducting glue; the heat dissipation fan is arranged at the rear end of the heat dissipation sheet; the radiating fin adopts a fin-shaped structure.
4. The apparatus for calibrating an illuminance meter as claimed in claim 2, wherein said housing is formed of a U-shaped housing, a bottom plate, and front and rear cover plates; the front cover plate and the rear cover plate are connected with a U-shaped opening of the U-shaped shell, and the bottom plate is connected with a rectangular opening of the U-shaped shell; the heat dissipation system and the optical alignment system are fixed on the bottom plate; two side walls of the U-shaped shell are provided with heat dissipation ports; the power supply is fixed at the top of the U-shaped shell; the front cover plate is provided with a light hole.
5. An illuminometer calibration device as claimed in claim 1, wherein said diaphragm assembly includes at least four diaphragms; each optical wave is installed on the optical guide rail through the optical wave base; the optical filter fixture with the slot is attached to an optical diaphragm hole on the first optical diaphragm in the light source emitting direction of the high-illumination simulation light source and used for placing a neutral optical filter.
6. The apparatus for calibrating an illuminance meter as claimed in claim 5, wherein the distance between the first optical wave in the light source emitting direction and the illuminance simulation light source is 1 m.
7. An illuminometer calibration device as claimed in claim 1, wherein said optical guide is of parallel dual track technology; the optical guide rail is provided with a magnetic grating ruler; the magnetic grid head includes a read head and a magnetic scale.
8. An illuminance meter calibration device as defined in claim 1 wherein said optical measurement system further comprises a light source non-uniformity measurement fixture; the light source unevenness measuring tool clamp comprises a nine-hole target plate and a fixed substrate; the nine-hole target plate is fixed on the fixed base plate; the fixed substrate is fixed on the smooth holes.
9. The apparatus for calibrating an illuminance meter as claimed in claim 8, wherein the nine-hole target plate has 9 openings arranged in a 3 x 3 array, and can be designed with different opening diameters to match with different diaphragms for testing the uniformity of the illuminance simulation light source.
10. A calibration method based on the calibration apparatus of claim 1, wherein the method comprises the steps of:
A. the high-illumination simulation light source is lightened through a power supply system, the light source outputs light to be coaxial with each diaphragm hole by adjusting the five-dimensional adjusting platform, a diaphragm with a proper hole diameter is selected, the position of the diaphragm on the light rail is determined, and the influence of stray light on a test result is reduced;
B. selecting an applicable neutral optical filter from the optical filter group, and adjusting the illumination value of the optical filter to the measurement range of a standard illuminometer;
C. and adjusting the four-dimensional adjusting table to enable the light beam to vertically enter the standard illuminometer probe, and moving the four-dimensional adjusting table back and forth to finish the illuminance accuracy calibration of different positions of the strong illuminance standard light source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911183138.9A CN110823364A (en) | 2019-11-27 | 2019-11-27 | High-intensity illuminometer calibration device and calibration method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911183138.9A CN110823364A (en) | 2019-11-27 | 2019-11-27 | High-intensity illuminometer calibration device and calibration method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110823364A true CN110823364A (en) | 2020-02-21 |
Family
ID=69560082
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911183138.9A Pending CN110823364A (en) | 2019-11-27 | 2019-11-27 | High-intensity illuminometer calibration device and calibration method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110823364A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323121A (en) * | 2020-03-10 | 2020-06-23 | 中国科学院国家空间科学中心 | Ultraviolet spectrum remote sensing instrument wide-range linearity testing device and method |
| CN113916502A (en) * | 2021-09-29 | 2022-01-11 | 歌尔光学科技有限公司 | Intelligent glasses infrared LED testing method, system and positioning method thereof |
| CN116358696A (en) * | 2023-05-31 | 2023-06-30 | 中国科学院合肥物质科学研究院 | Micro-light source radiation calibration transfer adjustment system and method adopting laser level meter |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03295423A (en) * | 1990-04-13 | 1991-12-26 | Matsushita Electric Ind Co Ltd | Light shield cylinder type luminance meter |
| JPH0638056B2 (en) * | 1988-02-05 | 1994-05-18 | 松下電器産業株式会社 | Method and apparatus for measuring germicidal radiation irradiance |
| CN204114637U (en) * | 2014-09-03 | 2015-01-21 | 陕西众森电能科技有限公司 | A kind of light source mixed light system of LED solar simulator |
| CN205426332U (en) * | 2016-02-17 | 2016-08-03 | 天津量传计量检测技术有限公司 | Measure calibrating installation of ultra violet radiation illuminance |
| CN206301531U (en) * | 2016-11-05 | 2017-07-04 | 天津良益科技有限公司 | A kind of laser speckle photography experiment instrument |
| CN207991689U (en) * | 2018-01-18 | 2018-10-19 | 昆山恒准技术服务有限公司 | A kind of illumination photometer testing calibration device |
| CN208313428U (en) * | 2018-05-11 | 2019-01-01 | 杭州远方检测校准技术有限公司 | A kind of portable optical calibrated tester |
-
2019
- 2019-11-27 CN CN201911183138.9A patent/CN110823364A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0638056B2 (en) * | 1988-02-05 | 1994-05-18 | 松下電器産業株式会社 | Method and apparatus for measuring germicidal radiation irradiance |
| JPH03295423A (en) * | 1990-04-13 | 1991-12-26 | Matsushita Electric Ind Co Ltd | Light shield cylinder type luminance meter |
| CN204114637U (en) * | 2014-09-03 | 2015-01-21 | 陕西众森电能科技有限公司 | A kind of light source mixed light system of LED solar simulator |
| CN205426332U (en) * | 2016-02-17 | 2016-08-03 | 天津量传计量检测技术有限公司 | Measure calibrating installation of ultra violet radiation illuminance |
| CN206301531U (en) * | 2016-11-05 | 2017-07-04 | 天津良益科技有限公司 | A kind of laser speckle photography experiment instrument |
| CN207991689U (en) * | 2018-01-18 | 2018-10-19 | 昆山恒准技术服务有限公司 | A kind of illumination photometer testing calibration device |
| CN208313428U (en) * | 2018-05-11 | 2019-01-01 | 杭州远方检测校准技术有限公司 | A kind of portable optical calibrated tester |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323121A (en) * | 2020-03-10 | 2020-06-23 | 中国科学院国家空间科学中心 | Ultraviolet spectrum remote sensing instrument wide-range linearity testing device and method |
| CN113916502A (en) * | 2021-09-29 | 2022-01-11 | 歌尔光学科技有限公司 | Intelligent glasses infrared LED testing method, system and positioning method thereof |
| CN113916502B (en) * | 2021-09-29 | 2024-03-15 | 歌尔科技有限公司 | Intelligent glasses infrared LED test method, system and positioning method thereof |
| CN116358696A (en) * | 2023-05-31 | 2023-06-30 | 中国科学院合肥物质科学研究院 | Micro-light source radiation calibration transfer adjustment system and method adopting laser level meter |
| CN116358696B (en) * | 2023-05-31 | 2023-08-22 | 中国科学院合肥物质科学研究院 | Micro-light source radiation calibration transfer adjustment system and method adopting laser level meter |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110823364A (en) | High-intensity illuminometer calibration device and calibration method | |
| CN101581770B (en) | Method for testing lumen efficiency of LED lamps | |
| CN102338323A (en) | Steady state solar simulator | |
| CN106644989B (en) | Absorbance detection system | |
| CN104792498B (en) | A kind of light source dynamic testing method | |
| CN105157958A (en) | Continuous-illuminance, centering, diameter-varying and angle-varying type test platform for lighting lamps | |
| CN105628196A (en) | Device and method of testing ultraviolet focal plane array response features | |
| Hanselaer et al. | A new integrating sphere design for spectral radiant flux determination of light-emitting diodes | |
| D'Alessandro et al. | Low cost high intensity LED illumination device for high uniformity solar testing | |
| CN101813455A (en) | Target source with adjustable contrast ratio | |
| CN101694401B (en) | Method for testing optical attenuation of LED light source | |
| CN209640200U (en) | A kind of full spectral-transmission favtor instrument for quick measuring | |
| CN207460398U (en) | For the test fixture of testing lens parsing power | |
| Zhou et al. | A new spatial integration method for luminous flux determination of light-emitting diodes | |
| CN109100119A (en) | For testing the method and system of lamps and lanterns | |
| CN113865716A (en) | Thermal infrared imager test system | |
| CN109781249B (en) | Device for indoor test of direct radiation meter and optical axis alignment method thereof | |
| D'Alessandro et al. | Low cost high intensity LED illumination device for high uniformity laboratory purposes | |
| CN208458977U (en) | System for testing lamps and lanterns | |
| JP6028601B2 (en) | Light resistance test equipment | |
| Kiefel et al. | Monochromatic collimated light source for an indoor lens efficiency tester | |
| Santourian et al. | Investigation of the suitability of high-power LEDs for the use as radiation source for PTB’s gonioreflectometer | |
| Kuvaldin et al. | Apparatus for measuring the main characteristics of compact objectives | |
| JP5754281B2 (en) | Irradiation device | |
| CN218297556U (en) | Light distribution measuring device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200221 |