CN110361601B - Method for rapidly testing electric indexes of pins of LCD (liquid crystal display) device - Google Patents

Method for rapidly testing electric indexes of pins of LCD (liquid crystal display) device Download PDF

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CN110361601B
CN110361601B CN201910710010.7A CN201910710010A CN110361601B CN 110361601 B CN110361601 B CN 110361601B CN 201910710010 A CN201910710010 A CN 201910710010A CN 110361601 B CN110361601 B CN 110361601B
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pins
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pin
groups
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CN110361601A (en
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黄双平
华卫华
朱庆华
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Shenzhen Quanzhou Automation Equipment Technology Co ltd
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Shenzhen Quanzhou Automation Equipment Technology Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Abstract

The invention discloses a method for rapidly testing the electrical index of a pin of an LCD device, which comprises the following steps: step S1, dividing the same type pins in the LCD device into a plurality of AnGroup and plurality of BnGroup AnGroup B andngroups are staggered and separated, AnNumber of pins of group and BnThe number of pins of a group is 2mA plurality of; step S2, initializing the test, and making n =0 and m = 0; step S3, test AnGroup B andnwhether the electrical index of the group is qualified or not is judged, if not, unqualified is prompted, if yes, step S4 is executed, step S4 is executed, n = n +1, and m = m + 1; step S5, adding each AnAll pins in the group are connected in parallel with each other, and each BnAll pins in a group are connected in parallel with each other, test AnGroup B andnwhether the electrical index of the group is qualified or not, if not, indicating that the group is unqualified, and if so, executing a step S6; step S6, judge AnNumber of groups and BnWhether the number of groups is 1, if not, performing step S4, if yes, performing step S7; in step S7, the test ends. The invention can improve the scanning test efficiency and avoid missing detection.

Description

Method for rapidly testing electric indexes of pins of LCD (liquid crystal display) device
Technical Field
The invention relates to a method for testing an LCD device, in particular to a method for quickly testing electric indexes of pins of the LCD device.
Background
LCD products typically have multiple pins, and any pin may have a short circuit or a large scan current defect. The conventional testing method is to traverse all pins and test the electrical parameters of only one pin at a time. Specifically, referring to fig. 1, assuming that there are M COM pins and N SEG pins in an LCD product, when testing the insulation resistance of all pins, it is necessary to traverse all M COM pins, test the resistance of each COM pin (between the COM pin and other COM pins), and then traverse N SEG pins, and test the resistance of each SEG pin (between the SEG pins). The method is similar when testing the scan current of each pin. The efficiency of the test method is low, and each electrical index needs to execute M + N times of tests. This process takes a long time when the number of pins of the LCD product is large.
In fact, the insulation resistance between the pins of good products of LCD devices is very large, and the insulation resistance is much larger than the determination standard of short circuit after a plurality of pins are connected in parallel. The scanning current of the LCD good product is similar to the scanning current, and the current value of the LCD good product is in accordance with the judging condition of the good product after a plurality of pins are connected in parallel. In the LCD industry, a plurality of COM pins or SEG pins on a product are often connected in parallel by a special fixture or PCB, so as to reduce the number of test scans and achieve the effect of increasing the test speed. However, the parallel connection of the pins also has side effects, and if the parallel pins have poor electrical property, the parallel connection of the pins cannot be tested.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a method for rapidly testing the pin electrical index of the LCD device, which adopts a test mode of multiple parallel and cross coverage, not only improves the scan test efficiency, but also ensures that any pin can be tested, thereby avoiding missed detection.
In order to solve the technical problems, the invention adopts the following technical scheme.
A method for rapidly testing the electrical index of a pin of an LCD device comprises the following steps: step S1, dividing the same type pins in the LCD device into a plurality of AnGroup and plurality of BnGroup A ofnGroup B and thenGroups are staggered and separated, AnNumber of pins of group and BnThe number of pins of a group is 2mA plurality of; step S2, initializing the test, and making n =0 and m = 0; step S3, testing the AnGroup B and thenWhether the electrical index of the group is qualified or not is judged, if not, unqualified is prompted, if yes, step S4 is executed, step S4 is executed, n = n +1, and m = m + 1; step S5, adding each AnAll pins in the group are connected in parallel with each other, and each BnAll pins in the group are connected in parallel with each other, and the A is testednGroup B and thenWhether the electrical index of the set is qualified or not,if not, indicating that the product is not qualified, and if so, executing step S6; step S6, judging AnNumber of groups and said BnWhether the number of groups is 1, if not, performing step S4, if yes, performing step S7; in step S7, the test ends.
Preferably, the pin types in the LCD device include a COM pin and an SEG pin, and in the test method, the COM pin and the SEG pin are respectively tested by executing steps S1 to S7.
Preferably, said A is testednGroup B and thenThe set of electrical properties includes: testing of neighboring AnGroup B andninsulation resistance value between groups.
Preferably, said A is testednGroup B and thenThe set of electrical properties includes: test A separatelynGroup B andnthe value of the scan current for the group.
In the method for rapidly testing the electric indexes of the pins of the LCD device, the pins of the same type in the LCD device are firstly grouped, and 1 pin is divided into one group in the initial state, thereby obtaining a plurality of AnGroup and plurality of BnGroup, and test A separatelynGroup B andnand (4) evaluating the electrical indexes of the group again, so that n = n +1 and m = m +1, and further grouping and retesting the pins of the LCD device again until the testing process is finished. Compared with the prior art, the invention adopts a test method of multiple parallel connection and cross coverage, obviously improves the scanning test efficiency, simultaneously ensures that any two pins can be tested once, thoroughly avoids the condition of missing detection, greatly improves the reliability and the accuracy of the test result of the LCD device, and better meets the application requirement.
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FIG. 1 is a flow chart of a prior art test method;
FIG. 2 is a flow chart of a rapid test method of the present invention;
FIG. 3 is a schematic diagram of the grouping of pins of an LCD device in the rapid test method according to the present invention.
Detailed Description
The invention is described in more detail below with reference to the figures and examples.
The invention discloses a method for rapidly testing the electrical index of a pin of an LCD device, which is shown by combining a figure 2 and a figure 3 and comprises the following steps:
step S1, dividing the same type pins in the LCD device into a plurality of AnGroup and plurality of BnGroup A ofnGroup B and thenGroups are staggered and separated, AnNumber of pins of group and BnThe number of pins of a group is 2mA plurality of;
step S2, initializing the test, and making n =0 and m = 0;
step S3, testing the AnGroup B and thenIf the electrical index of the group is not qualified, indicating that the group is not qualified, if so, executing step S4,
step S4, let n = n +1, m = m + 1;
step S5, adding each AnAll pins in the group are connected in parallel with each other, and each BnAll pins in the group are connected in parallel with each other, and the A is testednGroup B and thenWhether the electrical index of the group is qualified or not, if not, indicating that the group is unqualified, and if so, executing a step S6;
step S6, judging AnNumber of groups and said BnWhether the number of groups is 1, if not, performing step S4, if yes, performing step S7;
in step S7, the test ends.
In the method, the pins of the same type in the LCD device are firstly grouped, and 1 pin is divided into one group in the initial state, thereby obtaining a plurality of AnGroup and plurality of BnGroup, and test A separatelynGroup B andnand (4) evaluating the electrical indexes of the group again, so that n = n +1 and m = m +1, and further grouping and retesting the pins of the LCD device again until the testing process is finished. Compared with the prior art, the invention adopts a test method of multiple parallel connection and cross coverage, obviously improves the scanning test efficiency, simultaneously ensures that any two pins can be tested once, and thoroughly avoids missed detectionThe situation appears, the reliability and the accuracy of the test result of the LCD device are greatly improved, and the application requirement is well met.
Preferably, the pin types in the LCD device include a COM pin and an SEG pin, and in the testing method, the COM pin and the SEG pin are respectively tested by executing steps S1 to S7.
In this example, test AnGroup B and thenThe set of electrical properties includes: testing of neighboring AnGroup B andninsulation resistance value between groups.
Similarly, test said AnGroup B and thenThe set of electrical properties includes: test A separatelynGroup B andnthe value of the scan current for the group.
Based on the pin type and the electrical index type, the following embodiments can be referred to in the practical application of the present invention:
example one
Referring to fig. 3, taking the test of the insulation resistance between 16 COM pins as an example, first 1(= 2)0) All COM pins are divided into adjacent A by root pins as intervals0、B0And two groups, testing whether the insulation resistance between the two groups is qualified. Then, the process is repeated by 2(= 2)1) All COM pins are divided into A by taking root pins as spans1、B1Two groups were tested. Then, the value is increased by 4(= 2)2) All COM pins are divided into A by taking root pins as spans2、B2Two groups were tested. Finally, the value is further increased by 8(= 2)3) All COM pins are divided into A by taking root pins as spans3、B3Two groups were tested. Thus only 4 tests are needed to cover 24And the number of the COM pins is not less than 16, and any two pins are divided into different groups in the test process, and when the insulation resistance between any two COM pins is defective, the insulation resistance can be detected at least once, so that the scanning test efficiency is improved, the missing detection condition is effectively avoided, and the reliability and the accuracy of the test result are improved.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents or improvements made within the technical scope of the present invention should be included in the scope of the present invention.

Claims (4)

1. A method for rapidly testing the electrical index of a pin of an LCD device is characterized by comprising the following steps:
step S1, dividing the same type pins in the LCD device into a plurality of AnGroup and plurality of BnGroup A ofnGroup B and thenGroups are staggered and separated, AnNumber of pins of group and BnThe number of pins of a group is 2mA plurality of;
step S2, initializing the test, and making n equal to 0 and m equal to 0;
step S3, testing the AnGroup B and thenIf the electrical index between the groups is not qualified, the method will not be qualified, if yes, go to step S4,
step S4, let n be n +1 and m be m + 1;
step S5, adding each AnAll pins in the group are connected in parallel with each other, and each BnAll pins in the group are connected in parallel with each other, and the A is testednGroup B and thenWhether the electrical index of the group is qualified or not, if not, indicating that the group is unqualified, and if so, executing a step S6;
step S6, judging AnNumber of groups and said BnWhether the number of groups is 1, if not, executing step S4, if yes, executing step S7;
in step S7, the test ends.
2. The method for rapidly testing the pin electrical index of the LCD device according to claim 1, wherein the pin types in the LCD device comprise a COM pin and an SEG pin, and in the testing method, the COM pin and the SEG pin are respectively tested by executing steps S1 to S7.
3. The LCD device pin electrical index rapid test method of claim 1, wherein the test A is performednGroup B and thenThe set of electrical properties includes: testing of neighboring AnGroup B andninsulation resistance value between groups.
4. The LCD device pin electrical index rapid test method of claim 1, wherein the test A is performednGroup B and thenThe set of electrical properties includes: test A separatelynGroup B andnthe value of the scan current for the group.
CN201910710010.7A 2019-08-02 2019-08-02 Method for rapidly testing electric indexes of pins of LCD (liquid crystal display) device Active CN110361601B (en)

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CN112363002A (en) * 2020-11-25 2021-02-12 常州同惠电子股份有限公司 Multi-element parallel test method for safety voltage-resistant instrument

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