CN109031065A - Other a pair of test methods of high pressure for wire test instrument - Google Patents
Other a pair of test methods of high pressure for wire test instrument Download PDFInfo
- Publication number
- CN109031065A CN109031065A CN201810815977.7A CN201810815977A CN109031065A CN 109031065 A CN109031065 A CN 109031065A CN 201810815977 A CN201810815977 A CN 201810815977A CN 109031065 A CN109031065 A CN 109031065A
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- Prior art keywords
- test
- foot position
- wire
- unqualified
- pair
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Abstract
Other a pair of test methods of the high pressure that the present invention relates to a kind of for wire test instrument, comprising the following steps: system scans the foot position of wire rod, wherein the foot position of short circuit together is considered as 1 foot position, foot position breaking each other is numbered in order is 1,2,3, n;One of foot position is set as testing it is high-end, remaining foot position be set as test low side, carry out Hi-pot test;In test process, if occur it is primary unqualified, that is, can determine whether the high voltage parameter of the wire rod be it is unqualified, only when the test result of all steps be all it is qualified, could judge that the high voltage parameter of the wire rod is qualified;When test result is unqualified, system shows unqualified foot bit number.Other a pair of test methods of high pressure for being used for wire test instrument can greatly reduce the testing time of high voltage parameter, to substantially increase testing efficiency, test is accurate and reliable, ensure that the quality of product.
Description
Technical field:
The present invention relates to Electronic Testing Technology field more particularly to a kind of other a pair of surveys of high pressure for wire test instrument
Method for testing.
Background technique:
The development of electronic age of today, wire rod are getting faster, and type is more and more.The pin number amount of wire rod is often very
It is more, for example Typec wire rod both ends add up just 46 foot positions.So wire rod foot position is more, necessarily affects wire test
Complexity.The high voltage parameter of wire rod, often time-consuming longest, if pin number amount is more, testing efficiency is lower.
If having a pin number amount is 8 wire rod, need to test its high voltage parameter.We judge the high pressure of a wire rod
Whether parameter is qualified, it require that: the high voltage parameter between any two foot position of wire rod is qualified.So according to arrangement group
The formula of conjunction is it can be concluded that the theoretical number tested are as follows: n* (n-1)/2=28 could be completed so needing to carry out 28 tests
The test of the entire high voltage parameter of wire rod.
Summary of the invention:
The purpose of the present invention is in view of the drawbacks of the prior art, provide one kind can quickly detect wire rod any two foot position
Between high voltage parameter it is whether qualified for other test methods of high pressure a pair of wire test instrument.
The present invention is achieved through the following technical solutions: a kind of other a pair of test sides of high pressure for wire test instrument
Method, comprising the following steps:
1) the foot position of system scanning wire rod, wherein the foot position of short circuit together is considered as 1 foot position, by foot position breaking each other
In order number be 1,2,3, n;
2) one of foot position is set as testing it is high-end, remaining foot position be set as test low side, carry out Hi-pot test;
3) in test process, as long as there is primary unqualified, termination test immediately, and judge the high pressure ginseng of the wire rod
Number be it is unqualified, only when the test result of all steps be all it is qualified, could judge the wire rod high voltage parameter be qualification
's;
4) when test result is unqualified, system shows unqualified foot bit number.
Preferably, in step 2), one of foot position is set as testing high-end by system one by one, remaining foot position is set as testing
Low side.
In addition, random number can also be used in system in step 2), one of foot position is set as testing high-end, remaining foot at random
Position is set as test low side, as long as guaranteeing that each random foot position does not duplicate, completes all foot bit tests.
High voltage parameter of the invention includes ac voltage withstanding, DC break down voltage and insulation resistance.
The beneficial effects of the present invention are: other a pair of test methods of the high pressure for wire test instrument of the invention can be big
The big testing time for reducing high voltage parameter, to substantially increase testing efficiency, test is accurate and reliable, ensure that the matter of product
Amount.
Detailed description of the invention:
Fig. 1 is the pin position setting list of other a pair of test methods of the high pressure for wire test instrument of the invention;
Fig. 2 is a preferred embodiment of the present invention pin position setting list;
Fig. 3 is the comparison diagram of the present invention with test method in the prior art.
Specific embodiment:
The preferred embodiments of the present invention will be described in detail with reference to the accompanying drawing, so that advantages and features of the invention energy
It is easier to be understood by those skilled in the art, so as to make a clearer definition of the protection scope of the present invention.
A kind of other a pair of test methods of high pressure for wire test instrument, comprising the following steps:
Scan the foot position of wire rod first, wherein short circuit foot position together is considered as 1 foot position, by foot position breaking each other according to
Serial number are as follows: 1,2,3, n;
So by a pair of other methods, the pin position setting list tested every time can be listed, as shown in Figure 1 ,+: table
Show connect test it is high-end ,-: expression connect test low side;
Then foot position can be set as testing high-end, remaining foot according to the sequence enumerated in Fig. 1 by we from 1 to n one by one
Position is set as test low side, carries out Hi-pot test;
Meanwhile we can not also be out-of-order also possible according to the sequence in Fig. 1, as long as completing to be set out in Fig. 1
All tests;
In test process, as long as appearance is primary unqualified, that is, judge that the high voltage parameter of the wire rod to be unqualified, only works as institute
The test result of step be all it is qualified, could judge that the high voltage parameter of the wire rod is qualified;
Meanwhile when test result is unqualified, it is unqualified which foot position other a pair of methods of testing can accurately find out.
Illustrated below using the wire rod of 8 foot positions as example:
Because in wire rod, the relationship between foot position has short circuit and open circuit, if then the butt-swelling position of short circuit should be regarded as 1 foot
Position.Namely whole equipotential during the test, is handled as a foot position.The wire rod of 8 foot positions in example, foot position
Between relationship be entirely open circuit.High voltage parameter: ac voltage withstanding, 3 kinds of test items of DC break down voltage and insulation resistance are contained
Mesh.
Step 1: foot position 1 be set as testing it is high-end, foot position 2~7 be set as test low side,
Test passes indicate: foot position 1 with the high voltage parameter of an any other foot position be it is qualified,
Test failure indicates: 1 high voltage parameter of foot position is unqualified;
Step 2: foot position 2 is set as testing high-end, and remaining 7 foot positions are set as test low side,
Test passes indicate: foot position 2 with the high voltage parameter of an any other foot position be it is qualified,
Test failure indicates: 2 high voltage parameter of foot position is unqualified;
Every time test, will wherein 1 foot position be set as testing it is high-end, remaining foot position be all set to test low side.
As shown in Fig. 2, list 8 times test all pin position settings ,+: expression connect test it is high-end-: expression connect test it is low
End.
After above 8 times tests, if all qualified, mean that:
The high voltage parameter of foot position 1 and an any other foot position is qualified;
The high voltage parameter of foot position 2 and an any other foot position is qualified;
……………………………………………………….
The high voltage parameter of foot position 8 and an any other foot position is qualified;
We are it follows that the high voltage parameter between any two foot position of the wire rod is qualified.
It summarizes: needing to test by 28 times according to theory, after other a pair of test methods of the invention, it is only necessary to
8 times, greatly improve testing efficiency.As pin number amount increases, the superiority of the algorithm is more prominent, as shown in Figure 3.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.
Claims (4)
1. a kind of other a pair of test methods of high pressure for wire test instrument, which comprises the following steps:
1) the foot position of system scanning wire rod, wherein the foot position of short circuit together is considered as 1 foot position, by foot position breaking each other according to suitable
It is 1 that sequence, which is numbered, 2,3, n;
2) one of foot position is set as testing it is high-end, remaining foot position be set as test low side, carry out Hi-pot test;
3) in test process, if occur it is primary unqualified, that is, can determine whether the high voltage parameter of the wire rod be it is unqualified, only work as institute
The test result of step be all it is qualified, could judge that the high voltage parameter of the wire rod is qualified;
4) when test result is unqualified, system shows unqualified foot bit number.
2. other a pair of test methods of the high pressure according to claim 1 for wire test instrument, which is characterized in that step
2) in, one by one one of foot position is set as testing it is high-end, remaining foot position be set as test low side.
3. other a pair of test methods of the high pressure according to claim 1 for wire test instrument, which is characterized in that step
2) in, at random one of foot position is set as testing it is high-end, remaining foot position be set as test low side.
4. other a pair of test methods of the high pressure according to claim 1 for wire test instrument, which is characterized in that described
High voltage parameter includes ac voltage withstanding, DC break down voltage and insulation resistance.
Priority Applications (1)
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CN201810815977.7A CN109031065A (en) | 2018-07-24 | 2018-07-24 | Other a pair of test methods of high pressure for wire test instrument |
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CN201810815977.7A CN109031065A (en) | 2018-07-24 | 2018-07-24 | Other a pair of test methods of high pressure for wire test instrument |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116930823A (en) * | 2023-09-18 | 2023-10-24 | 常州同惠电子股份有限公司 | High-voltage adjacent test method and system for wire tester |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106154127A (en) * | 2016-06-27 | 2016-11-23 | 成都蓉盛达系统工程技术有限公司 | The wire harness pressure method for rapidly testing of insulation |
CN107727518A (en) * | 2017-08-23 | 2018-02-23 | 安徽凌宇电缆科技有限公司 | A kind of cable performance test device and apply its cable performance method of testing |
CN108089055A (en) * | 2016-11-23 | 2018-05-29 | 中国航发商用航空发动机有限责任公司 | A kind of testing lines device and its test method |
-
2018
- 2018-07-24 CN CN201810815977.7A patent/CN109031065A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106154127A (en) * | 2016-06-27 | 2016-11-23 | 成都蓉盛达系统工程技术有限公司 | The wire harness pressure method for rapidly testing of insulation |
CN108089055A (en) * | 2016-11-23 | 2018-05-29 | 中国航发商用航空发动机有限责任公司 | A kind of testing lines device and its test method |
CN107727518A (en) * | 2017-08-23 | 2018-02-23 | 安徽凌宇电缆科技有限公司 | A kind of cable performance test device and apply its cable performance method of testing |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116930823A (en) * | 2023-09-18 | 2023-10-24 | 常州同惠电子股份有限公司 | High-voltage adjacent test method and system for wire tester |
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Application publication date: 20181218 |