CN103217614A - System and method for detecting connectivity of pins of Dewar flask - Google Patents

System and method for detecting connectivity of pins of Dewar flask Download PDF

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CN103217614A
CN103217614A CN2013100983709A CN201310098370A CN103217614A CN 103217614 A CN103217614 A CN 103217614A CN 2013100983709 A CN2013100983709 A CN 2013100983709A CN 201310098370 A CN201310098370 A CN 201310098370A CN 103217614 A CN103217614 A CN 103217614A
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switch matrix
pin
pins
connectivity
detection
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华桦
何忞
胡晓宁
林春
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Shanghai Institute of Technical Physics of CAS
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Abstract

本发明公开了一种杜瓦瓶引脚连通性检测系统及检测方法,检测系统包括:开关矩阵、源表、计算机,其连接方式为:开关矩阵的两个行选输出端口分别与源表的两个输入端口相连,开关矩阵、源表的通讯端口分别与计算机的两个USB端口相连。检测方法包括以下步骤:首先将被检测杜瓦瓶安装于检测系统中,然后利用计算机向开关矩阵、源表循环发送配置信号,依次将杜瓦瓶不同内外引脚和源表电学连通以进行电阻测试,再利用电阻测试数据判断引脚间连通性,当引脚间连通性全部判断完毕后,保存检测结果。本发明的优点是:1,实现了杜瓦瓶引脚连通性检测的自动化,提高检测效率;2,避免了人工更换引脚连接导致的检测不准确。

Figure 201310098370

The invention discloses a Dewar bottle pin connectivity detection system and detection method. The detection system includes: a switch matrix, a source meter, and a computer. The two input ports are connected, and the communication ports of the switch matrix and the source meter are respectively connected with the two USB ports of the computer. The detection method includes the following steps: first, install the detected Dewar bottle in the detection system, then use the computer to send configuration signals to the switch matrix and the source meter in a cyclic manner, and sequentially connect the different internal and external pins of the Dewar bottle with the source meter electrically to perform resistance Test, and then use the resistance test data to judge the connectivity between the pins. When the connectivity between the pins is all judged, save the test results. The advantages of the present invention are: 1. The automation of the detection of the pin connectivity of the Dewar bottle is realized, and the detection efficiency is improved; 2. The inaccurate detection caused by manual replacement of the pin connection is avoided.

Figure 201310098370

Description

一种杜瓦瓶引脚连通性检测系统及检测方法A Dewar bottle pin connectivity detection system and detection method

技术领域:Technical field:

本发明涉及红外焦平面器件用杜瓦瓶检测领域,具体涉及一种杜瓦瓶引脚连通性检测系统及检测方法。The invention relates to the detection field of a Dewar bottle used for an infrared focal plane device, in particular to a detection system and a detection method for the connectivity of a pin of a Dewar bottle.

背景技术:Background technique:

杜瓦瓶在红外焦平面探测器性能测试过程中需要广泛使用,红外焦平面探测器芯片测试用杜瓦瓶引脚数量众多,内外引脚数量通常为50个或78个。杜瓦瓶在投入使用之前需要进行引脚连通性检测,现有的杜瓦瓶引脚连通性检测方法是利用手持万用表进行人工手动检测,具体方法是利用万用表的欧姆档测试不同引脚之间的电阻来判断引脚间是否连通。由于杜瓦瓶引脚连通性检测需要测试内外对应引脚间的导通性和内外不对应引脚间的绝缘性。对于内外引脚数量均为50个的杜瓦瓶至少需要进行1125次人工万用表测量以检测杜瓦瓶引脚连通性,对于内外引脚数量均为78个的杜瓦瓶则至少需要进行2701次人工万用表测量。人工手动检测效率较低且容易引起测试人员疲劳造成漏检或误检。Dewar flasks need to be widely used in the performance testing process of infrared focal plane detectors. Dewar flasks used for testing infrared focal plane detector chips have a large number of pins, and the number of internal and external pins is usually 50 or 78. Dewar bottles need to be tested for pin connectivity before they are put into use. The existing Dewar bottle pin connectivity testing method is to use a hand-held multimeter for manual testing. The resistance to determine whether there is continuity between the pins. Since the detection of the continuity of the pins of the Dewar bottle needs to test the continuity between the inner and outer corresponding pins and the insulation between the inner and outer non-corresponding pins. For a dewar with 50 internal and external pins, at least 1125 manual multimeter measurements are required to detect the connectivity of the dewar pins, and for a dewar with 78 internal and external pins, at least 2701 measurements are required Manual multimeter measurement. The efficiency of manual detection is low and it is easy to cause fatigue of the testers, resulting in missed or false detections.

发明内容:Invention content:

为了解决上述人工手动检测存在的问题,本发明的目的是提供一种能够实现杜瓦瓶引脚连通性检测的自动化,提高检测效率与准确度的一种杜瓦瓶引脚连通性检测系统及检测方法。In order to solve the problems of the above-mentioned manual detection, the object of the present invention is to provide a kind of Dewar pin connectivity detection system that can realize the automation of Dewar pin connectivity detection and improve detection efficiency and accuracy. Detection method.

为达上述目的,本发明提供一种杜瓦瓶引脚连通性检测系统,包括:开关矩阵102、源表103和计算机104,所述的开关矩阵102是具有多路行选、列选开关功能的可程控开关矩阵,所述的源表103是具有电阻测试功能的可程控源表,所述的计算机104是通用微型计算机。其连接方式为:开关矩阵102的两个行选输出端口分别和源表103的两个输入端口相连,开关矩阵102、源表103的通讯端口分别和计算机104的两个USB端口相连。For reaching above-mentioned purpose, the present invention provides a kind of Dewar bottle pin connectivity detection system, comprising: switch matrix 102, source meter 103 and computer 104, described switch matrix 102 is to have multi-way row selection, column selection switch function The programmable switch matrix, the source meter 103 is a programmable source meter with a resistance test function, and the computer 104 is a general-purpose microcomputer. The connection method is as follows: the two row selection output ports of the switch matrix 102 are respectively connected with the two input ports of the source meter 103, and the communication ports of the switch matrix 102 and the source meter 103 are respectively connected with two USB ports of the computer 104.

一种杜瓦瓶引脚连通性检测方法,步骤为:A method for detecting the connectivity of the pins of a Dewar flask, the steps of which are as follows:

一、将待检测杜瓦瓶101的内、外引脚分别和开关矩阵102的两组列选端口相连;1. Connect the inner and outer pins of the dewar vessel 101 to be detected to two groups of column selection ports of the switch matrix 102;

二、利用计算机104向开关矩阵102发送配置信号,使待检测杜瓦瓶101的内、外引脚中的各一个分别与开关矩阵102的两组列选端口导通;Two, utilize computer 104 to send configuration signal to switch matrix 102, make each one in the inner and outer pins of dewar bottle 101 to be detected conduct with two groups of column selection ports of switch matrix 102 respectively;

三、利用计算机104向源表103发送配置信号,测试待检测杜瓦瓶101内外引脚之间的电阻,测试完毕后向计算机104传输测试结果;3. Utilize the computer 104 to send configuration signals to the source meter 103, test the resistance between the inner and outer pins of the Dewar bottle 101 to be detected, and transmit the test results to the computer 104 after the test is completed;

四、利用测试结果判断被测引脚间的连通性;4. Use the test results to judge the connectivity between the tested pins;

五、循环步骤二、步骤三、步骤四对待检测杜瓦瓶101所有内外引脚之间的连通性进行判断;Five, loop step 2, step 3, step 4 to judge the connectivity between all internal and external pins of the Dewar vessel 101 to be detected;

六、在计算机104硬盘上保存检测结果。6. Save the test results on the computer 104 hard disk.

本发明的有益效果是:The beneficial effects of the present invention are:

1)实现了杜瓦瓶引脚连通性测试的自动化,提高测试效率。1) Realized the automation of Dewar bottle pin connectivity test and improved test efficiency.

2)杜瓦瓶不同引脚连接的变换由计算机控制完成,避免了人工更换引脚连接的不确定性。2) The transformation of different pin connections of the Dewar flask is completed by computer control, which avoids the uncertainty of manual replacement of pin connections.

附图说明:Description of drawings:

图1是本发明测试系统示意图。Fig. 1 is a schematic diagram of the testing system of the present invention.

图2是本发明具体实施例待检测杜瓦瓶内外引脚、开关矩阵、源表连接关系示意图。其中,201为与源表103相连的正极端口,202为与源表103相连的负极端口,203为与待检测杜瓦瓶101相连的外引脚,204为与待检测杜瓦瓶101相连的内引脚,205为与开关矩阵102第1组1×96线列开关相连的纵向端口,206为与开关矩阵102第2组1×96线列开关相连的纵向端口,207为与开关矩阵102第1组1×96线列开关相连的横向端口,208为与开关矩阵102第2组1×96线列开关相连的横向端口。Fig. 2 is a schematic diagram of the connection relationship between the inner and outer pins of the Dewar vessel to be tested, the switch matrix, and the source meter according to a specific embodiment of the present invention. Wherein, 201 is the positive port connected with the source meter 103, 202 is the negative port connected with the source meter 103, 203 is the outer pin connected with the Dewar bottle 101 to be detected, and 204 is the pin connected with the Dewar bottle 101 to be detected. Inner pin, 205 is the vertical port connected to the first group of 1×96 line-column switches of the switch matrix 102, 206 is the vertical port connected to the second group of 1×96 line-column switches of the switch matrix 102, and 207 is connected to the switch matrix 102 208 is the horizontal port connected to the second group of 1×96 line switches of the switch matrix 102 .

图3是本发明具体实施例中Labview检测程序运行步骤示意图。Fig. 3 is a schematic diagram of the running steps of the Labview detection program in a specific embodiment of the present invention.

具体实施方式:Detailed ways:

为了更清楚地说明本发明,下面结合附图和具体实施例对本发明进行进一步详述如下:In order to illustrate the present invention more clearly, below in conjunction with accompanying drawing and specific embodiment the present invention is further detailed as follows:

参见图1,本发明检测系统中的待检测杜瓦瓶101为红外焦平面器件中测杜瓦瓶,具有内外引脚各50个,开关矩阵102为安装两块Keithley7075开关矩阵卡的Keithley707B开关矩阵主机,具有2组1×96线列开关,源表103为Keithley2400多功能源表,计算机104安装Labview软件,可以通过Labview软件编写测试程序对开关矩阵102和源表103进行控制和数据采集。Referring to Fig. 1, the Dewar bottle 101 to be detected in the detection system of the present invention is the Dewar bottle measured in the infrared focal plane device, with 50 internal and external pins, and the switch matrix 102 is a Keithley707B switch matrix with two Keithley7075 switch matrix cards installed The host has two sets of 1×96 line-column switches, the source meter 103 is a Keithley2400 multi-function source meter, and the computer 104 is installed with Labview software, which can be used to control the switch matrix 102 and the source meter 103 and collect data by writing test programs through the Labview software.

待检测杜瓦瓶101、开关矩阵102和源表103相连,具体连接方式参见图2,正极端口201与横向端口207相连,负极端口202与横向端口208相连,外引脚203的各个引脚依次与纵向端口205的各个端口相连,内引脚204的各个引脚依次与纵向端口206的各个端口相连。The dewar bottle 101 to be detected, the switch matrix 102 and the source meter 103 are connected. The specific connection method is shown in FIG. Each pin of the inner pin 204 is connected with each port of the longitudinal port 206 in turn.

开关矩阵102、源表103通过连接线与计算机104相连。利用计算机104编写Labview检测程序控制开关矩阵102、源表103进行杜瓦引脚连通性检测。The switch matrix 102 and the source meter 103 are connected to the computer 104 through connection lines. Using the computer 104 to write a Labview detection program to control the switch matrix 102 and the source meter 103 to detect the connectivity of the Dewar pins.

Labview检测程序运行步骤参见图3,第1步,配置开关矩阵102,使纵向端口205与纵向端口206中特定端口对应的开关闭合,其余开关断开,实现待检测杜瓦瓶101内、外引脚中的两个特定引脚电学连通,第2步,配置源表103,进行电阻测试,第3步,将源表103测试的电阻数据传输至计算机104,第4步,对计算机104接收的电阻数据进行判断,电阻大于1×109欧姆判断杜瓦瓶引脚间断开,电阻小于10欧姆判断杜瓦瓶引脚间连通。第5步,循环第1、2、3、4步,对待检测杜瓦瓶101内、外引脚之间所有可能的连接进行连通性检测,第6步,在计算机104中保存检测结果。Refer to Figure 3 for the running steps of the Labview detection program. In the first step, configure the switch matrix 102 so that the switches corresponding to the specific ports in the longitudinal port 205 and the longitudinal port 206 are closed, and the remaining switches are disconnected to realize the internal and external introduction of the Dewar bottle 101 to be detected. The two specific pins in the feet are electrically connected, the 2nd step, configure the source meter 103, and carry out the resistance test, the 3rd step, transmit the resistance data tested by the source meter 103 to the computer 104, the 4th step, receive the resistance data of the computer 104 The resistance data is judged. If the resistance is greater than 1× 109 ohms, it is judged that the pins of the Dewar bottle are disconnected, and if the resistance is less than 10 ohms, it is judged that the pins of the Dewar bottle are connected. Step 5: Repeat steps 1, 2, 3, and 4 to perform connectivity detection on all possible connections between the inner and outer pins of the Dewar vessel 101 to be detected. Step 6: Save the detection results in the computer 104 .

上述具体实施例只是为了详细说明本发明,并非对本发明做任何形式上的限定。The above specific embodiments are only for describing the present invention in detail, and do not limit the present invention in any form.

Claims (2)

1. Dewar flask pin detection of connectivity system comprises: switch matrix (102), source table (103) and computing machine (104) is characterized in that:
Described switch matrix (102) is the program-controlled switch matrix with the choosing of multichannel row, column selection switching function, and described source table (103) is the program-controlled source table with resistance test function, and described computing machine (104) is a mini-computer;
Two row of switch matrix (102) select output port to link to each other with two input ports of source table (103) respectively, and the PORT COM of switch matrix (102), source table (103) links to each other with two USB port of computing machine (104) respectively.
2. Dewar flask pin method for detecting connectivity based on the described system of claim 1 is characterized in that may further comprise the steps:
One, the inside and outside pin with Dewar flask to be detected (101) links to each other with two groups of column selection ports of switch matrix (102) respectively;
Two, utilize computing machine (104) to send configuration signal to switch matrix (102), make in the inside and outside pin of Dewar flask to be detected (101) each one respectively with two groups of column selection ports conducting of switch matrix (102);
Three, utilize computing machine (104) Xiang Yuanbiao (103) to send configuration signal, test the resistance between the inside and outside pin of Dewar flask to be detected (101), test backcasting machine (104) the test transmission result that finishes;
Four, utilize test result to judge connectedness between tested pin;
Five, circulation step two, step 3, step 4 are judged the connectedness between all inside and outside pins of Dewar flask to be detected (101);
Six, on computing machine (104) hard disk, preserve testing result.
CN2013100983709A 2013-03-26 2013-03-26 System and method for detecting connectivity of pins of Dewar flask Pending CN103217614A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107238791A (en) * 2017-07-20 2017-10-10 南京富士通南大软件技术有限公司 Driving test environment based on VTSystem is from adaption system
CN110361601A (en) * 2019-08-02 2019-10-22 深圳市全洲自动化设备有限公司 A kind of LCD device pin Electrical Indexes method for rapidly testing
CN116224015A (en) * 2022-12-15 2023-06-06 北京京城清达电子设备有限公司 An automatic measurement device for infrared sensor pins

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101281231A (en) * 2008-05-22 2008-10-08 株洲南车时代电气股份有限公司 Method for testing locomotive general-purpose circuit board function
US20120242357A1 (en) * 2011-03-23 2012-09-27 Hamilton Sundstrand Corporation Automatic fault insertion, calibration and test system
CN203249981U (en) * 2013-03-26 2013-10-23 中国科学院上海技术物理研究所 System for detecting connectivity of pins of Dewar flask

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101281231A (en) * 2008-05-22 2008-10-08 株洲南车时代电气股份有限公司 Method for testing locomotive general-purpose circuit board function
US20120242357A1 (en) * 2011-03-23 2012-09-27 Hamilton Sundstrand Corporation Automatic fault insertion, calibration and test system
CN203249981U (en) * 2013-03-26 2013-10-23 中国科学院上海技术物理研究所 System for detecting connectivity of pins of Dewar flask

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107238791A (en) * 2017-07-20 2017-10-10 南京富士通南大软件技术有限公司 Driving test environment based on VTSystem is from adaption system
CN107238791B (en) * 2017-07-20 2019-09-20 南京富士通南大软件技术有限公司 Self-adaptive system of driving test environment based on VTSystem
CN110361601A (en) * 2019-08-02 2019-10-22 深圳市全洲自动化设备有限公司 A kind of LCD device pin Electrical Indexes method for rapidly testing
CN110361601B (en) * 2019-08-02 2021-05-25 深圳市全洲自动化设备有限公司 Method for rapidly testing electric indexes of pins of LCD (liquid crystal display) device
CN116224015A (en) * 2022-12-15 2023-06-06 北京京城清达电子设备有限公司 An automatic measurement device for infrared sensor pins

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Application publication date: 20130724