CN109682364B - Piezoelectric MEMS Decoupling Structure and MEMS Gyroscope - Google Patents

Piezoelectric MEMS Decoupling Structure and MEMS Gyroscope Download PDF

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CN109682364B
CN109682364B CN201811529259.XA CN201811529259A CN109682364B CN 109682364 B CN109682364 B CN 109682364B CN 201811529259 A CN201811529259 A CN 201811529259A CN 109682364 B CN109682364 B CN 109682364B
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piezoelectric
upper electrode
mems
decoupling
longitudinal beam
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CN109682364A (en
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杨健
韩国威
司朝伟
王晓东
宁瑾
颜伟
刘雯
杨富华
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Institute of Semiconductors of CAS
University of Chinese Academy of Sciences
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    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
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Abstract

The invention discloses a piezoelectric MEMS decoupling structure and an MEMS gyroscope, wherein the piezoelectric MEMS decoupling structure comprises: a T type beam structure, including crossbeam and the longeron of integration, this T type beam structure includes from bottom to top in proper order: a substrate, a lower electrode layer and a piezoelectric material layer; the second upper electrode is used as a detection electrode, is T-shaped, is positioned on the T-shaped beam structure, and is symmetrical about the central line of the longitudinal beam; and the first upper electrode and the third upper electrode are used as driving electrodes, are positioned on the longitudinal beam, are symmetrically distributed on two sides of the central line of the longitudinal beam, and are mutually independent from the part of the second upper electrode positioned on the longitudinal beam. The decoupling structure is provided with the T-shaped beam structure comprising the integrated cross beam and the integrated longitudinal beam in the whole shape, and the T-shaped detection electrodes which are symmetrical about the central line of the longitudinal beam and the two driving electrodes which are symmetrically distributed on the longitudinal beam are arranged on the T-shaped beam structure, so that complete decoupling is realized, and the detection precision of the gyroscope can be effectively improved.

Description

压电MEMS解耦结构及MEMS陀螺仪Piezoelectric MEMS Decoupling Structure and MEMS Gyroscope

技术领域technical field

本公开属于微电子技术领域,涉及一种压电MEMS解耦结构及MEMS陀螺仪。The present disclosure belongs to the technical field of microelectronics, and relates to a piezoelectric MEMS decoupling structure and a MEMS gyroscope.

背景技术Background technique

微机电系统(MEMS,Micro-electro Mechanical Systems)器件由于具有体积小、功耗低、成本低、易于集成等优势,而被广泛应用在消费电子领域。MEMS陀螺仪是惯性导航中的核心器件,其根据科氏效应原理可检测旋转体的角速度。根据MEMS陀螺仪的基本原理,MEMS陀螺仪包括两个相互正交的谐振模态,即:驱动模态和检测模态。在驱动信号的激励下,陀螺仪结构会发生谐振。当有角速度时,由于科氏效应,在科里奥利力的作用下,在检测电极上会有检测信号输出。Micro-electromechanical systems (MEMS, Micro-electro Mechanical Systems) devices are widely used in the field of consumer electronics due to their advantages of small size, low power consumption, low cost, and easy integration. MEMS gyroscope is the core device in inertial navigation, which can detect the angular velocity of rotating body according to the principle of Coriolis effect. According to the basic principle of MEMS gyroscope, MEMS gyroscope includes two mutually orthogonal resonance modes, namely: driving mode and detection mode. Under the excitation of the drive signal, the gyroscope structure will resonate. When there is an angular velocity, due to the Coriolis effect, there will be a detection signal output on the detection electrode under the action of the Coriolis force.

然而由于结构上的耦合效应,当陀螺仪工作在驱动模态时,在没有外界角速度作用的情况下,陀螺仪结构在检测方向上也会有位移变化,检测电极上仍然会有信号输出,该现象即为MEMS陀螺仪的正交耦合效应。陀螺仪的正交耦合现象会严重影响陀螺仪的检测精度等特性,因此需要在结构设计中抑制正交耦合。常见的抑制正交耦合的方法有:静电调谐、驱动模态单自由度设计、检测模态单自由度设计等。但是由于基于科氏效应的陀螺仪本身就是依靠耦合实现的角速度检测,因此难以实现完全的解耦。However, due to the coupling effect on the structure, when the gyroscope works in the driving mode, without the action of the external angular velocity, the gyroscope structure will also have a displacement change in the detection direction, and there will still be signal output on the detection electrode. The phenomenon is the orthogonal coupling effect of the MEMS gyroscope. The orthogonal coupling phenomenon of the gyroscope will seriously affect the detection accuracy and other characteristics of the gyroscope, so it is necessary to suppress the orthogonal coupling in the structural design. Common methods for suppressing orthogonal coupling include: electrostatic tuning, single-degree-of-freedom design of driving modes, and single-degree-of-freedom design of detection modes. However, since the gyroscope based on the Coriolis effect itself relies on coupling to realize the angular velocity detection, it is difficult to achieve complete decoupling.

发明内容SUMMARY OF THE INVENTION

(一)要解决的技术问题(1) Technical problems to be solved

本公开提供了一种压电MEMS解耦结构及MEMS陀螺仪,以至少部分解决以上所提出的技术问题。The present disclosure provides a piezoelectric MEMS decoupling structure and a MEMS gyroscope to at least partially solve the above technical problems.

(二)技术方案(2) Technical solutions

根据本公开的一个方面,提供了一种压电MEMS解耦结构,包括:一T型梁结构1,包括一体化的横梁11和纵梁12,该T型梁结构1自下而上依次包括:衬底101、下电极层102和压电材料层103;第二上电极142,作为检测电极,呈T型,位于T型梁结构1之上,关于纵梁中心线120对称;以及第一上电极141和第三上电极143,作为驱动电极,位于纵梁12之上,对称分布于纵梁中心线120两侧,与第二上电极142位于纵梁12上的部分相互独立。According to an aspect of the present disclosure, a piezoelectric MEMS decoupling structure is provided, comprising: a T-beam structure 1 including an integrated cross beam 11 and a longitudinal beam 12 , the T-beam structure 1 sequentially includes from bottom to top : the substrate 101, the lower electrode layer 102 and the piezoelectric material layer 103; the second upper electrode 142, serving as a detection electrode, is T-shaped, is located on the T-shaped beam structure 1, and is symmetrical about the longitudinal beam centerline 120; and the first The upper electrode 141 and the third upper electrode 143, as driving electrodes, are located on the longitudinal beam 12, symmetrically distributed on both sides of the longitudinal beam centerline 120, and are independent from the part of the second upper electrode 142 located on the longitudinal beam 12.

在本公开的一些实施例中,纵梁12作为驱动梁,横梁11作为检测梁。In some embodiments of the present disclosure, the longitudinal beam 12 acts as a driving beam, and the cross beam 11 acts as a detection beam.

在本公开的一些实施例中,在驱动模态下,第一上电极141和第三上电极143连接至一对差分驱动信号,以驱动该T型梁结构1发生面内振动。In some embodiments of the present disclosure, in the driving mode, the first upper electrode 141 and the third upper electrode 143 are connected to a pair of differential driving signals to drive the T-beam structure 1 to vibrate in-plane.

在本公开的一些实施例中,第一上电极141和第三上电极143的形状、尺寸相同。In some embodiments of the present disclosure, the first upper electrode 141 and the third upper electrode 143 have the same shape and size.

在本公开的一些实施例中,第二上电极142在横梁上的部分呈长条状、蜿蜒状、或其组合。In some embodiments of the present disclosure, the portion of the second upper electrode 142 on the beam is elongated, meandering, or a combination thereof.

在本公开的一些实施例中,衬底101的材料包括如下材料的一种或其组合:硅、二氧化硅、以及SOI。In some embodiments of the present disclosure, the material of the substrate 101 includes one or a combination of the following materials: silicon, silicon dioxide, and SOI.

在本公开的一些实施例中,压电材料层103的材料包括如下材料的一种或其组合:压电单晶体、压电多晶薄膜、多晶体压电陶瓷、高分子压电材料、以及聚合物-压电陶瓷复合材料。In some embodiments of the present disclosure, the material of the piezoelectric material layer 103 includes one or a combination of the following materials: piezoelectric single crystal, piezoelectric polycrystalline thin film, polycrystalline piezoelectric ceramic, polymer piezoelectric material, and polymer Matter-piezoceramic composites.

在本公开的一些实施例中,压电MEMS解耦结构,还包括:锚点15,位于纵梁12的端点处。In some embodiments of the present disclosure, the piezoelectric MEMS decoupling structure further includes: an anchor point 15 located at the end point of the stringer 12 .

根据本公开的另一个方面,提供了一种MEMS陀螺仪,包括本公开任一项提到的压电MEMS解耦结构。According to another aspect of the present disclosure, there is provided a MEMS gyroscope including the piezoelectric MEMS decoupling structure mentioned in any one of the present disclosure.

在本公开的一些实施例中,MEMS陀螺仪,还包括:一质量块2,该质量块2中包含一容置空间,该容置空间用于放置压电MEMS解耦结构的横梁11和纵梁12。In some embodiments of the present disclosure, the MEMS gyroscope further includes: a mass block 2, wherein the mass block 2 includes an accommodating space, and the accommodating space is used for placing the beam 11 and the vertical beam of the piezoelectric MEMS decoupling structure. Beam 12.

(三)有益效果(3) Beneficial effects

从上述技术方案可以看出,本公开提供的压电MEMS解耦结构及MEMS陀螺仪,具有以下有益效果:It can be seen from the above technical solutions that the piezoelectric MEMS decoupling structure and the MEMS gyroscope provided by the present disclosure have the following beneficial effects:

该解耦结构的整体形状设置为一包含一体化横梁和纵梁的T型梁结构,第一上电极和第三上电极对称分布于纵梁中心线两侧,作为驱动电极,第二上电极为一关于纵梁中心线左右对称的T型电极,作为检测电极;在驱动模态下,基于压电材料的压电效应,通过在上下电极上施加电压,即可驱动整个结构发生面内的谐振,纵梁作为驱动梁,横梁作为检测梁,由于结构耦合,在T型梁的横梁上仍然会有位移变形,即驱动模态的振动会耦合到检测梁上,引起检测梁发生位移变形,由于第二上电极相对纵梁中心线是左右对称的,因正交耦合而导致的检测梁形变会在第二上电极处极化出等量的异号电荷,这些等量的异号电荷在第二上电极实现相互中和,因此T型梁结构和第二上电极的设置使得该结构整体表现为检测电极上无耦合信号输出,即实现了完全解耦,可有效提高陀螺仪的检测精度。The overall shape of the decoupling structure is set as a T-beam structure including an integrated cross beam and a longitudinal beam. The first upper electrode and the third upper electrode are symmetrically distributed on both sides of the center line of the longitudinal beam. It is a T-shaped electrode that is symmetrical about the center line of the longitudinal beam as a detection electrode; in the driving mode, based on the piezoelectric effect of the piezoelectric material, by applying a voltage to the upper and lower electrodes, the entire structure can be driven to generate in-plane detection. Resonance, the longitudinal beam is used as the driving beam, and the transverse beam is used as the detection beam. Due to the structural coupling, there will still be displacement deformation on the transverse beam of the T-beam, that is, the vibration of the driving mode will be coupled to the detection beam, causing displacement and deformation of the detection beam. Since the second upper electrode is left-right symmetrical with respect to the center line of the longitudinal beam, the deformation of the detection beam caused by the orthogonal coupling will polarize the same amount of opposite-sign charges at the second upper electrode. The second upper electrode achieves mutual neutralization. Therefore, the arrangement of the T-beam structure and the second upper electrode makes the structure as a whole show that there is no coupled signal output on the detection electrode, that is, complete decoupling is realized, which can effectively improve the detection accuracy of the gyroscope. .

附图说明Description of drawings

图1为根据本公开一实施例所示的压电MEMS解耦结构的示意图。FIG. 1 is a schematic diagram of a piezoelectric MEMS decoupling structure according to an embodiment of the present disclosure.

图2为根据本公开一实施例所示的带有两个压电MEMS解耦结构的MEMS陀螺仪的结构示意图。FIG. 2 is a schematic structural diagram of a MEMS gyroscope with two piezoelectric MEMS decoupling structures according to an embodiment of the present disclosure.

图3为根据本公开一实施例所示的驱动模态下压电MEMS解耦结构实现解耦的示意图,其中,(a)为检测电极中对应电荷检测位置A、B、F、C、D示意,(b)为检测电极上正负电荷分布示意图。3 is a schematic diagram of decoupling achieved by a piezoelectric MEMS decoupling structure in a driving mode according to an embodiment of the present disclosure, wherein (a) is the corresponding charge detection positions A, B, F, C, D in the detection electrodes Schematic diagram, (b) is a schematic diagram of the distribution of positive and negative charges on the detection electrode.

【符号说明】【Symbol Description】

1-T型梁结构;1-T beam structure;

11-横梁; 12-纵梁;11 - beam; 12 - longitudinal beam;

101-衬底; 102-下电极层;101-substrate; 102-lower electrode layer;

103-压电材料层;103-piezoelectric material layer;

141-第一上电极; 142-第二上电极;141-first upper electrode; 142-second upper electrode;

143-第三上电极;143 - the third upper electrode;

120-纵梁中心线; 15-锚点;120- stringer center line; 15- anchor point;

2-质量块。2- Mass block.

具体实施方式Detailed ways

为了解决正交耦合现象导致的陀螺仪的检测精度下降、现有的抑制正交耦合的方法不能实现完全解耦的问题,本公开提出一种压电MEMS解耦结构及MEMS陀螺仪,通过将解耦结构的整体形状设置为一包含一体化横梁和纵梁的T型梁结构,并在该T型梁结构上设置关于纵梁中心线对称的T型检测电极和在纵梁上对称分布的两个驱动电极,以实现完全解耦,可有效提高陀螺仪的检测精度。In order to solve the problems that the detection accuracy of the gyroscope is reduced due to the orthogonal coupling phenomenon, and the existing methods for suppressing the orthogonal coupling cannot achieve complete decoupling, the present disclosure proposes a piezoelectric MEMS decoupling structure and a MEMS gyroscope. The overall shape of the decoupling structure is set as a T-beam structure including integrated beams and longitudinal beams, and T-shaped detection electrodes symmetrical about the center line of the longitudinal beam and symmetrically distributed on the longitudinal beam are arranged on the T-shaped beam structure. Two drive electrodes are used to achieve complete decoupling, which can effectively improve the detection accuracy of the gyroscope.

为使本公开的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本公开进一步详细说明。本公开中,“呈T型”表示该形状包含相交的一横向和一纵向。In order to make the objectives, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below with reference to the specific embodiments and the accompanying drawings. In the present disclosure, "T-shaped" means that the shape includes a transverse direction and a longitudinal direction that intersect.

在本公开的第一个示例性实施例中,提供了一种压电MEMS解耦结构。In a first exemplary embodiment of the present disclosure, a piezoelectric MEMS decoupling structure is provided.

图1为根据本公开一实施例所示的压电MEMS解耦结构的示意图。FIG. 1 is a schematic diagram of a piezoelectric MEMS decoupling structure according to an embodiment of the present disclosure.

参照图1所示,本公开的压电MEMS解耦结构,包括:1, the piezoelectric MEMS decoupling structure of the present disclosure includes:

一T型梁结构1,包括一体化的横梁11和纵梁12,该T型梁结构1自下而上依次包括:衬底101、下电极层102和压电材料层103;A T-beam structure 1 includes an integrated cross beam 11 and a longitudinal beam 12. The T-beam structure 1 sequentially includes from bottom to top: a substrate 101, a lower electrode layer 102 and a piezoelectric material layer 103;

第二上电极142,作为检测电极,呈T型,位于T型梁结构1之上,关于纵梁中心线120对称;以及The second upper electrode 142, serving as a detection electrode, is T-shaped, is located on the T-shaped beam structure 1, and is symmetrical about the centerline 120 of the longitudinal beam; and

第一上电极141和第三上电极143,作为驱动电极,位于纵梁12之上,对称分布于纵梁中心线120两侧,与第二上电极142位于纵梁12上的部分相互独立。The first upper electrode 141 and the third upper electrode 143, as driving electrodes, are located on the longitudinal beam 12, symmetrically distributed on both sides of the longitudinal beam centerline 120, and are independent of the part of the second upper electrode 142 on the longitudinal beam 12.

本实施例中,该压电MEMS解耦结构,还包括:锚点15,位于纵梁12的端点处,以进行该压电MEMS解耦结构的固定。In this embodiment, the piezoelectric MEMS decoupling structure further includes: an anchor point 15 located at the end point of the longitudinal beam 12 for fixing the piezoelectric MEMS decoupling structure.

本实施例中,衬底101、下电极层102和压电材料层103的形状均为T型,共同构成T型梁结构1,T型梁结构1与位于该T型梁结构1之上的3个独立的上电极-第一上电极141、第二上电极142和第三上电极143整体形成压电MEMS解耦结构,在驱动模态下,基于压电材料的压电效应,通过在上下电极上施加电压,即可驱动整个结构发生面内的谐振。In this embodiment, the shapes of the substrate 101 , the lower electrode layer 102 and the piezoelectric material layer 103 are all T-shaped, and together form a T-shaped beam structure 1 , and the T-shaped beam structure 1 and the T-shaped beam structure 1 are located on top of the T-shaped beam structure 1 . The three independent upper electrodes - the first upper electrode 141, the second upper electrode 142 and the third upper electrode 143 form a piezoelectric MEMS decoupling structure as a whole. In the driving mode, based on the piezoelectric effect of the piezoelectric material, the Applying a voltage to the upper and lower electrodes can drive the entire structure to generate in-plane resonance.

下面来详细介绍本实施例的压电MEMS解耦结构的各个部分。Each part of the piezoelectric MEMS decoupling structure of this embodiment will be described in detail below.

本实施例中,衬底101的材料包括如下材料的一种或几种:硅、二氧化硅、以及SOI(硅绝缘体,也称绝缘体上硅,在顶层硅和绝缘衬底硅之间包含一埋氧层)。In this embodiment, the material of the substrate 101 includes one or more of the following materials: silicon, silicon dioxide, and SOI (silicon-on-insulator, also known as silicon-on-insulator, which includes a layer between the top layer silicon and the insulating substrate silicon. buried oxide layer).

本实施例中,压电材料层103的材料包括如下材料的一种或几种:压电单晶体、压电多晶薄膜、多晶体压电陶瓷、高分子压电材料、以及聚合物-压电陶瓷复合材料,比如:氮化铝、石英、压电陶瓷等。In this embodiment, the material of the piezoelectric material layer 103 includes one or more of the following materials: piezoelectric single crystal, piezoelectric polycrystalline film, polycrystalline piezoelectric ceramic, polymer piezoelectric material, and polymer-piezoelectric Ceramic composite materials, such as: aluminum nitride, quartz, piezoelectric ceramics, etc.

本实施例中,第一上电极141和第三上电极143,作为驱动电极,位于纵梁12之上,对称分布于纵梁中心线120两侧。在驱动模态下,在第一上电极141和第三上电极143连接至一对差分驱动信号,可以驱动该T型梁结构1发生面内振动。In this embodiment, the first upper electrode 141 and the third upper electrode 143, as driving electrodes, are located on the longitudinal beam 12 and are symmetrically distributed on both sides of the longitudinal beam center line 120 . In the driving mode, when the first upper electrode 141 and the third upper electrode 143 are connected to a pair of differential driving signals, the T-beam structure 1 can be driven to generate in-plane vibration.

本实施例中,对应纵梁12作为驱动梁,横梁11作为检测梁。第二上电极142,作为检测电极,呈T型,位于T型梁结构1之上,关于纵梁中心线120对称。In this embodiment, the corresponding longitudinal beams 12 are used as driving beams, and the transverse beams 11 are used as detection beams. The second upper electrode 142, serving as a detection electrode, is T-shaped, is located on the T-shaped beam structure 1, and is symmetrical with respect to the centerline 120 of the longitudinal beam.

在本公开的一些实施例中,第一上电极141和第三上电极143的形状、尺寸相同。In some embodiments of the present disclosure, the first upper electrode 141 and the third upper electrode 143 have the same shape and size.

例如,本实施例中,第一上电极141和第三上电极143均为矩形,且第一上电极141和第三上电极143的长度相等,宽度也相等。当然,在其它实施例中,第一上电极141和第三上电极143还可以是其他的形状。For example, in this embodiment, the first upper electrode 141 and the third upper electrode 143 are both rectangular, and the length and width of the first upper electrode 141 and the third upper electrode 143 are the same. Of course, in other embodiments, the first upper electrode 141 and the third upper electrode 143 may also have other shapes.

在本公开的一些实施例中,第二上电极142在横梁上的部分呈长条状、蜿蜒状、或其组合。In some embodiments of the present disclosure, the portion of the second upper electrode 142 on the beam is elongated, meandering, or a combination thereof.

例如,本实施例中,第二上电极142在横梁上的部分呈蜿蜒状。For example, in this embodiment, the portion of the second upper electrode 142 on the beam is serpentine.

在本公开的第二个示例性实施例中,提供了一种包含上述压电MEMS解耦结构的MEMS陀螺仪。In a second exemplary embodiment of the present disclosure, there is provided a MEMS gyroscope including the piezoelectric MEMS decoupling structure described above.

图2为根据本公开一实施例所示的带有两个压电MEMS解耦结构的MEMS陀螺仪的结构示意图。FIG. 2 is a schematic structural diagram of a MEMS gyroscope with two piezoelectric MEMS decoupling structures according to an embodiment of the present disclosure.

参照图2所示,本实施例的MEMS陀螺仪,包括:两个压电MEMS解耦结构,以及一质量块2,该质量块2中包含一容置空间,该容置空间用于放置两个压电MEMS解耦结构的横梁11和纵梁12。Referring to FIG. 2 , the MEMS gyroscope of this embodiment includes: two piezoelectric MEMS decoupling structures, and a mass block 2 . The mass block 2 includes an accommodating space for placing two The beams 11 and the longitudinal beams 12 of the piezoelectric MEMS decoupling structure.

在本实施例中,如图2所示,两个压电MEMS解耦结构的锚点15,位于纵梁12的端点处。In this embodiment, as shown in FIG. 2 , the anchor points 15 of the two piezoelectric MEMS decoupling structures are located at the end points of the longitudinal beams 12 .

为方便描述该压电MEMS解耦结构的解耦原理和特性,下面结合具体陀螺仪完整结构加以说明。In order to conveniently describe the decoupling principle and characteristics of the piezoelectric MEMS decoupling structure, the following description will be given in conjunction with the complete structure of the specific gyroscope.

本实施例中,图2中的MEMS陀螺仪包含两个压电MEMS解耦结构和一个质量块2,2个锚点15分别设置在2个T型梁结构1的纵梁12的端点处。第一上电极141和第三上电极143作为一对差分驱动电极,驱动整个结构发生面内的振动,即为该MEMS陀螺仪的驱动模态,该MEMS陀螺仪(下面简称陀螺仪)用于检测z轴方向(即垂直于陀螺仪平面方向)的角速度。当有z轴的角速度作用在陀螺仪上时会产生科里奥利力,在科里奥利力的作用下陀螺仪的结构在x轴方向会发生振动,此振动模态即为检测模态,该检测模态的信号可由第二上电极142检测。以上即为该陀螺仪工作的基本原理。In this embodiment, the MEMS gyroscope in FIG. 2 includes two piezoelectric MEMS decoupling structures and a mass 2 , and the two anchor points 15 are respectively arranged at the end points of the longitudinal beams 12 of the two T-beam structures 1 . The first upper electrode 141 and the third upper electrode 143 are used as a pair of differential driving electrodes to drive the entire structure to generate in-plane vibration, which is the driving mode of the MEMS gyroscope. The MEMS gyroscope (hereinafter referred to as the gyroscope) is used for Detect the angular velocity in the z-axis direction (ie, perpendicular to the gyroscope plane). When the angular velocity of the z-axis acts on the gyroscope, a Coriolis force will be generated. Under the action of the Coriolis force, the structure of the gyroscope will vibrate in the direction of the x-axis. This vibration mode is the detection mode. , the signal of the detection mode can be detected by the second upper electrode 142 . The above is the basic principle of the working of the gyroscope.

正交耦合指的是,在没有外界角速度作用时,由陀螺仪的驱动模态耦合到检测结构上的信号大小。在本公开所示的包含压电MEMS解耦结构的MEMS陀螺仪中,敏感部件为T型梁结构1,该T型梁结构1的纵梁12作为驱动梁,横梁11作为检测梁。当陀螺仪工作在驱动模态时,由于结构耦合,在T型梁结构1的横梁11上仍然会有位移变形,即驱动模态的振动会耦合到检测梁上,引起检测梁发生位移变形。而本公开中的第二上电极142是关于纵梁中心线120左右对称的,因正交耦合而导致的检测梁形变会在第二上电极142处极化出等量的异号电荷,这些等量的异号电荷在第二上电极142上会相互中和,因此T型梁结构和第二上电极的设置使得该结构整体表现为检测电极-第二上电极142上无耦合信号输出,即实现了完全解耦。Orthogonal coupling refers to the magnitude of the signal coupled to the detection structure by the driving mode of the gyroscope when there is no external angular velocity. In the MEMS gyroscope including the piezoelectric MEMS decoupling structure shown in the present disclosure, the sensitive component is a T-beam structure 1 , the longitudinal beam 12 of the T-beam structure 1 is used as a driving beam, and the cross beam 11 is used as a detection beam. When the gyroscope works in the driving mode, due to the structural coupling, there will still be displacement deformation on the beam 11 of the T-beam structure 1, that is, the vibration of the driving mode will be coupled to the detection beam, causing displacement and deformation of the detection beam. However, the second upper electrode 142 in the present disclosure is symmetrical about the center line 120 of the longitudinal beam, and the deformation of the detection beam caused by the orthogonal coupling will polarize the second upper electrode 142 with equal charges of opposite signs. The same amount of opposite-sign charges will neutralize each other on the second upper electrode 142, so the arrangement of the T-beam structure and the second upper electrode makes the structure as a whole appear as the detection electrode - the second upper electrode 142 has no coupled signal output, That is, complete decoupling is achieved.

图3为根据本公开一实施例所示的驱动模态下压电MEMS解耦结构实现解耦的示意图,其中,(a)为检测电极中对应检测电荷位置A、B、F、C、D示意,(b)为检测电极上正负电荷分布示意图。3 is a schematic diagram of a piezoelectric MEMS decoupling structure in a driving mode according to an embodiment of the present disclosure to achieve decoupling, wherein (a) is the positions A, B, F, C, and D of the detection electrodes corresponding to the detection charges Schematic diagram, (b) is a schematic diagram of the distribution of positive and negative charges on the detection electrode.

在一实例中,如图3中(a)所示,在驱动模态下,检测电极(第二上电极142)位于横梁11上的部分设置几个对称分布的电荷检测位置A、B、F(位于中心)、C(与A对称)、D(与B对称),其电荷分布情况对应如图3中(b)所示,第二上电极142位于横梁上的部分关于纵梁中心线120左右对称,对应在中心点F左侧的A、B点呈现不同量的正电荷,对应在A、B点对称分布的位置C(与A对称)、D(与B对称)点呈现分别与A、B点等量的负电荷,如此一来,等量的异号电荷会在检测电极上发生相互中和。In an example, as shown in FIG. 3( a ), in the driving mode, the portion of the detection electrode (the second upper electrode 142 ) located on the beam 11 is provided with several symmetrically distributed charge detection positions A, B, F (located in the center), C (symmetrical to A), and D (symmetrical to B), and their charge distributions correspond to those shown in (b) in FIG. Left and right symmetry, corresponding to the points A and B on the left side of the center point F, showing different amounts of positive charge, corresponding to the symmetrical distribution of points A and B, the positions C (symmetric to A) and D (symmetric to B) appear respectively with A and B. The negative charges of the same amount at point B and point B, in this way, the same amount of opposite-sign charges will neutralize each other on the detection electrode.

综上所述,本公开提供了一种压电MEMS解耦结构及MEMS陀螺仪,通过将解耦结构的整体形状设置为一包含一体化横梁和纵梁的T型梁结构,并在该T型梁结构上设置关于纵梁中心线对称的T型检测电极和在纵梁上对称分布的两个驱动电极,第一上电极和第三上电极对称分布于纵梁中心线两侧,作为驱动电极,第二上电极为一关于纵梁中心线左右对称的T型电极,作为检测电极;在驱动模态下,基于压电材料的压电效应,通过在上下电极上施加电压,即可驱动整个结构发生面内的谐振,纵梁作为驱动梁,横梁作为检测梁,由于结构耦合,在T型梁的横梁上仍然会有位移变形,即驱动模态的振动会耦合到检测梁上,引起检测梁发生位移变形,由于第二上电极相对纵梁中心线是左右对称的,因正交耦合而导致的检测梁形变会在第二上电极处极化出等量的异号电荷,这些等量的异号电荷在第二上电极实现相互中和,因此T型梁结构和第二上电极的设置使得该结构整体表现为检测电极上无耦合信号输出,即实现了完全解耦,可有效提高陀螺仪的检测精度。To sum up, the present disclosure provides a piezoelectric MEMS decoupling structure and a MEMS gyroscope. By setting the overall shape of the decoupling structure as a T-beam structure including integrated beams and longitudinal beams, and at the T The beam structure is provided with a T-shaped detection electrode that is symmetrical about the centerline of the longitudinal beam and two drive electrodes that are symmetrically distributed on the longitudinal beam. The first upper electrode and the third upper electrode are symmetrically distributed on both sides of the longitudinal beam centerline. Electrodes, the second upper electrode is a T-shaped electrode symmetrical about the center line of the longitudinal beam, which is used as a detection electrode; in the driving mode, based on the piezoelectric effect of the piezoelectric material, by applying a voltage to the upper and lower electrodes, it can be driven. In-plane resonance occurs in the whole structure, the longitudinal beam is used as the driving beam, and the transverse beam is used as the detection beam. Due to structural coupling, there will still be displacement deformation on the transverse beam of the T-beam, that is, the vibration of the driving mode will be coupled to the detection beam, causing The detection beam is displaced and deformed. Since the second upper electrode is left-right symmetrical with respect to the center line of the longitudinal beam, the deformation of the detection beam caused by the orthogonal coupling will polarize the same amount of opposite-sign charges at the second upper electrode. These etc. The amount of opposite-signal charges are mutually neutralized on the second upper electrode, so the arrangement of the T-beam structure and the second upper electrode makes the structure as a whole show that there is no coupled signal output on the detection electrode, that is, complete decoupling is realized, which can effectively Improve the detection accuracy of the gyroscope.

应该理解的是,当元件(诸如层、膜、区域、或衬底)描述为在另一元件“上”时,该元件可直接在该另一元件上,或者也可存在中间元件。而且,在说明书以及权利要求书中,当描述有元件“连接”至另一元件时,该元件可“直接连接”至该另一元件,或者通过第三元件“电连接”至该另一元件。并且图中各部件的形状和尺寸不反映真实大小和比例,而仅示意本公开实施例的内容。另外,在权利要求中,不应将位于括号之间的任何参考符号构造成对权利要求的限制。It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present. Also, in the specification and claims, when an element is described as being "connected" to another element, the element can be "directly connected" to the other element or "electrically connected" to the other element through a third element . Moreover, the shapes and sizes of the components in the figures do not reflect the actual size and proportion, but merely illustrate the contents of the embodiments of the present disclosure. Furthermore, in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim.

再者,单词“包含”或“包括”不排除存在未列在权利要求中的元件或步骤。位于元件之前的单词“一”或“一个”不排除存在多个这样的元件。Furthermore, the word "comprising" or "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements.

说明书与权利要求中所使用的序数例如“第一”、“第二”、“第三”等的用词,以修饰相应的元件,其本身并不意味着该元件有任何的序数,也不代表某一元件与另一元件的顺序、或是制造方法上的顺序,该些序数的使用仅用来使具有某命名的一元件得以和另一具有相同命名的元件能做出清楚区分。The ordinal numbers such as "first", "second", "third", etc. used in the description and the claims are used to modify the corresponding elements, which themselves do not mean that the elements have any ordinal numbers, nor do they Representing the order of a certain element and another element, or the order in the manufacturing method, the use of these ordinal numbers is only used to clearly distinguish an element with a certain name from another element with the same name.

以上所述的具体实施例,对本公开的目的、技术方案和有益效果进行了进一步详细说明,所应理解的是,以上所述仅为本公开的具体实施例而已,并不用于限制本公开,凡在本公开的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本公开的保护范围之内。The specific embodiments described above further describe the purpose, technical solutions and beneficial effects of the present disclosure in detail. It should be understood that the above-mentioned specific embodiments are only specific embodiments of the present disclosure, and are not intended to limit the present disclosure. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present disclosure should be included within the protection scope of the present disclosure.

Claims (10)

1.一种压电MEMS解耦结构,其特征在于,包括:1. a piezoelectric MEMS decoupling structure, is characterized in that, comprises: 一T型梁结构(1),包括一体化的横梁(11)和纵梁(12),该T型梁结构(1)自下而上依次包括:衬底(101)、下电极层(102)和压电材料层(103);A T-beam structure (1), comprising an integrated cross beam (11) and a longitudinal beam (12), the T-beam structure (1) sequentially includes from bottom to top: a substrate (101), a lower electrode layer (102) ) and a piezoelectric material layer (103); 第二上电极(142),作为检测电极,呈T型,位于所述T型梁结构(1)之上,关于纵梁中心线(120)对称;以及The second upper electrode (142), serving as a detection electrode, is T-shaped, is located on the T-shaped beam structure (1), and is symmetrical about the centerline (120) of the longitudinal beam; and 第一上电极(141)和第三上电极(143),作为驱动电极,位于所述纵梁(12)之上,对称分布于纵梁中心线(120)两侧,与所述第二上电极(142)位于纵梁(12)上的部分相互独立。The first upper electrode (141) and the third upper electrode (143), as driving electrodes, are located on the longitudinal beam (12), symmetrically distributed on both sides of the longitudinal beam center line (120), and are connected with the second upper electrode (120). The parts of the electrodes (142) located on the longitudinal beams (12) are independent of each other. 2.根据权利要求1所述的压电MEMS解耦结构,其中,所述纵梁(12)作为驱动梁,横梁(11)作为检测梁。2. The piezoelectric MEMS decoupling structure according to claim 1, wherein the longitudinal beam (12) is used as a driving beam, and the transverse beam (11) is used as a detection beam. 3.根据权利要求1所述的压电MEMS解耦结构,其中,在驱动模态下,所述第一上电极(141)和第三上电极(143)连接至一对差分驱动信号,以驱动该T型梁结构(1)发生面内振动。3. The piezoelectric MEMS decoupling structure according to claim 1, wherein, in a driving mode, the first upper electrode (141) and the third upper electrode (143) are connected to a pair of differential driving signals to The T-beam structure (1) is driven to generate in-plane vibration. 4.根据权利要求1所述的压电MEMS解耦结构,其中,所述第一上电极(141)和第三上电极(143)的形状、尺寸相同。4. The piezoelectric MEMS decoupling structure according to claim 1, wherein the first upper electrode (141) and the third upper electrode (143) have the same shape and size. 5.根据权利要求1所述的压电MEMS解耦结构,其中,所述第二上电极(142)在横梁上的部分呈长条状、蜿蜒状、或其组合。5. The piezoelectric MEMS decoupling structure according to claim 1, wherein a portion of the second upper electrode (142) on the beam is elongated, meandering, or a combination thereof. 6.根据权利要求1所述的压电MEMS解耦结构,其中,所述衬底(101)的材料包括如下材料的一种或其组合:硅、二氧化硅、或SOI。6. The piezoelectric MEMS decoupling structure according to claim 1, wherein the material of the substrate (101) comprises one or a combination of the following materials: silicon, silicon dioxide, or SOI. 7.根据权利要求1所述的压电MEMS解耦结构,其中,所述压电材料层(103)的材料包括如下材料的一种或其组合:压电单晶体、压电多晶薄膜、多晶体压电陶瓷、高分子压电材料、以及聚合物-压电陶瓷复合材料。7. The piezoelectric MEMS decoupling structure according to claim 1, wherein the material of the piezoelectric material layer (103) comprises one or a combination of the following materials: piezoelectric single crystal, piezoelectric polycrystalline thin film, polycrystalline Crystalline piezoelectric ceramics, polymeric piezoelectric materials, and polymer-piezoelectric ceramic composites. 8.根据权利要求1所述的压电MEMS解耦结构,还包括:8. The piezoelectric MEMS decoupling structure of claim 1, further comprising: 锚点(15),位于所述纵梁(12)的端点处。Anchor points (15) are located at the end points of the stringers (12). 9.一种MEMS陀螺仪,其特征在于,包括权利要求1至8中任一项所述的压电MEMS解耦结构。9 . A MEMS gyroscope, comprising the piezoelectric MEMS decoupling structure according to any one of claims 1 to 8 . 10 . 10.根据权利要求9所述的MEMS陀螺仪,还包括:一质量块(2),该质量块(2)中包含一容置空间,该容置空间用于放置所述压电MEMS解耦结构的横梁(11)和纵梁(12)。10. The MEMS gyroscope according to claim 9, further comprising: a mass block (2), wherein the mass block (2) comprises an accommodating space, and the accommodating space is used to place the piezoelectric MEMS decoupling The beams (11) and the longitudinal beams (12) of the structure.
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