CN109642829B - 时间温度传感器位置偏移误差校正 - Google Patents

时间温度传感器位置偏移误差校正 Download PDF

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CN109642829B
CN109642829B CN201780052485.0A CN201780052485A CN109642829B CN 109642829 B CN109642829 B CN 109642829B CN 201780052485 A CN201780052485 A CN 201780052485A CN 109642829 B CN109642829 B CN 109642829B
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temperature
power
die
activity
performance
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CN109642829A (zh
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A·A·麦瑞克
M·圣-劳伦特
M·卡西马萨尔
R·钱德拉
M·阿拉姆
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Qualcomm Inc
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Qualcomm Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G01K7/427Temperature calculation based on spatial modeling, e.g. spatial inter- or extrapolation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/14Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00Testing or calibrating of thermometers
    • G01K15/005Calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16Constructional details or arrangements
    • G06F1/20Cooling means
    • G06F1/206Cooling means comprising thermal management
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Sources (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
CN201780052485.0A 2016-09-08 2017-08-15 时间温度传感器位置偏移误差校正 Active CN109642829B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/260,194 2016-09-08
US15/260,194 US10309838B2 (en) 2016-09-08 2016-09-08 Temporal temperature sensor position offset error correction
PCT/US2017/046967 WO2018048587A1 (en) 2016-09-08 2017-08-15 Temporal temperature sensor position offset error correction

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CN109642829A CN109642829A (zh) 2019-04-16
CN109642829B true CN109642829B (zh) 2020-12-08

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US (1) US10309838B2 (enExample)
EP (1) EP3510371B1 (enExample)
JP (1) JP2019529890A (enExample)
KR (1) KR102513948B1 (enExample)
CN (1) CN109642829B (enExample)
BR (1) BR112019003764B1 (enExample)
WO (1) WO2018048587A1 (enExample)

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CN105912442B (zh) * 2016-04-12 2019-01-04 英业达科技有限公司 具有温度管理功能的电子装置
TWI679399B (zh) * 2018-10-23 2019-12-11 國立高雄科技大學 晶片內建曲率校正架構及其方法
KR102731715B1 (ko) * 2019-09-16 2024-11-18 주식회사 엘엑스세미콘 온도센서를 구비한 소스드라이버 및 표시장치
TWI755090B (zh) * 2019-10-28 2022-02-11 仁寶電腦工業股份有限公司 基於人工智慧的功率配置方法和功率配置裝置
US11762439B2 (en) 2019-12-17 2023-09-19 Mediatek Inc. Method and apparatus of dynamic thermal management based on surface temperatures of portable device
US11520369B2 (en) * 2020-02-04 2022-12-06 Qualcomm Incorporated Clock instantaneous temperature-rate-of-change measurement
CN111442855A (zh) * 2020-04-07 2020-07-24 珠海格力电器股份有限公司 一种温度检测装置、功率模块及其温度检测方法
CN111595488B (zh) * 2020-04-15 2022-05-24 岭东核电有限公司 核电站柴油机油温检测方法、装置、终端设备及存储介质
EP3910306B1 (en) * 2020-05-13 2023-08-09 Schneider Electric Industries SAS Electrical apparatus thermal monitoring
US11231760B1 (en) * 2020-07-21 2022-01-25 Nvidia Corporation Techniques for accurately determining the temperature at various locations of an operating integrated circuit
US11798501B2 (en) * 2020-08-25 2023-10-24 Google Llc Power monitoring for correcting ambient temperature measurement by electronic devices
KR102891516B1 (ko) 2020-11-02 2025-11-25 삼성전자 주식회사 전력 측정에 기초한 온도 검출 및 열 관리를 위한 방법 및 장치
US12061123B2 (en) * 2021-11-19 2024-08-13 Renesas Electronics Corporation Semiconductor device and trimming method of the same
CN114154334B (zh) * 2021-12-06 2024-08-23 中国电子科技集团公司第十三研究所 芯片级热特性分析方法、装置及终端设备
US20220114318A1 (en) * 2021-12-20 2022-04-14 Intel Corporation Methods and apparatus for in-field thermal calibration
US20250164318A1 (en) * 2023-11-21 2025-05-22 Qualcomm Incorporated Frequency error correction based on identifying the worst thermal aggressor of multiple thermal aggressors
CN118654719B (zh) * 2024-08-19 2024-11-12 陕西森旺信息技术有限公司 基于传感器的电伴热带状态实时监测方法

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US7757103B2 (en) * 2006-12-20 2010-07-13 Intel Corporation Method and apparatus to estimate energy consumed by central processing unit core
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BR112019003764A2 (pt) 2019-05-21
US20180066998A1 (en) 2018-03-08
EP3510371B1 (en) 2021-07-14
KR102513948B1 (ko) 2023-03-23
EP3510371A1 (en) 2019-07-17
KR20190043550A (ko) 2019-04-26
CN109642829A (zh) 2019-04-16
BR112019003764B1 (pt) 2022-11-29
US10309838B2 (en) 2019-06-04
WO2018048587A1 (en) 2018-03-15
JP2019529890A (ja) 2019-10-17

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