CN109540940B - 一种短波长x射线衍射仪器设备及其准直器快速更换装置 - Google Patents
一种短波长x射线衍射仪器设备及其准直器快速更换装置 Download PDFInfo
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- 229910000838 Al alloy Inorganic materials 0.000 description 1
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- 239000002178 crystalline material Substances 0.000 description 1
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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CN201811487680.9A CN109540940B (zh) | 2018-12-06 | 2018-12-06 | 一种短波长x射线衍射仪器设备及其准直器快速更换装置 |
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CN201811487680.9A CN109540940B (zh) | 2018-12-06 | 2018-12-06 | 一种短波长x射线衍射仪器设备及其准直器快速更换装置 |
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CN109540940A CN109540940A (zh) | 2019-03-29 |
CN109540940B true CN109540940B (zh) | 2021-06-29 |
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Families Citing this family (2)
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CN113740366B (zh) * | 2020-05-27 | 2023-11-28 | 中国兵器工业第五九研究所 | 无损检测单晶体或定向结晶体内部晶体取向差异和晶界缺陷的方法及装置 |
CN113176285B (zh) * | 2021-04-23 | 2023-12-15 | 中国兵器工业第五九研究所 | 一种短波长特征x射线内部残余应力无损测试方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1896784A (zh) * | 2005-11-24 | 2007-01-17 | 中国科学院长春光学精密机械与物理研究所 | 聚合物紫外/可见光准直器集成组件、基片结构及制作 |
CN101303908A (zh) * | 2008-06-24 | 2008-11-12 | 西南技术工程研究所 | 一种x射线准直器装置 |
CN201910257U (zh) * | 2010-12-22 | 2011-07-27 | 深圳市海博科技有限公司 | 放疗系统的准直装置 |
CN104483282A (zh) * | 2014-12-31 | 2015-04-01 | 郑州光力科技股份有限公司 | 自校准气室及光纤气体传感器检测系统 |
CN106267587A (zh) * | 2016-08-18 | 2017-01-04 | 上海联影医疗科技有限公司 | 准直器定位组件 |
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- 2018-12-06 CN CN201811487680.9A patent/CN109540940B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1896784A (zh) * | 2005-11-24 | 2007-01-17 | 中国科学院长春光学精密机械与物理研究所 | 聚合物紫外/可见光准直器集成组件、基片结构及制作 |
CN101303908A (zh) * | 2008-06-24 | 2008-11-12 | 西南技术工程研究所 | 一种x射线准直器装置 |
CN201910257U (zh) * | 2010-12-22 | 2011-07-27 | 深圳市海博科技有限公司 | 放疗系统的准直装置 |
CN104483282A (zh) * | 2014-12-31 | 2015-04-01 | 郑州光力科技股份有限公司 | 自校准气室及光纤气体传感器检测系统 |
CN106267587A (zh) * | 2016-08-18 | 2017-01-04 | 上海联影医疗科技有限公司 | 准直器定位组件 |
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