CN109411331B - Two-dimensional superlattice indium selenide, preparation method thereof and application thereof in preparation of photoelectric detector - Google Patents

Two-dimensional superlattice indium selenide, preparation method thereof and application thereof in preparation of photoelectric detector Download PDF

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CN109411331B
CN109411331B CN201811235022.0A CN201811235022A CN109411331B CN 109411331 B CN109411331 B CN 109411331B CN 201811235022 A CN201811235022 A CN 201811235022A CN 109411331 B CN109411331 B CN 109411331B
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冯伟
刘赫
于苗苗
秦芳璐
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Abstract

本发明公开了一种二维超晶格硒化铟及其制备方法与在制备光电探测器中的应用,属于高性能光电探测器领域;二维超晶格硒化铟的制备方法为:SiO2/Si基底预处理;用透明胶带粘贴InSe材料后转移到SiO2/Si基底上,浸泡丙酮;真空条件下高温处理,即可在SiO2/Si基底表面制得二维超晶格InSe纳米片。本发明方法制备的二维超晶格InSe具有高的电学输运性能、高的光响应、良好的稳定性和快速的光响应速度,在高性能光电探测器领域具有很好的应用前景。The invention discloses a two-dimensional superlattice indium selenide, a preparation method thereof, and an application in the preparation of a photoelectric detector, belonging to the field of high-performance photoelectric detectors; the preparation method of the two-dimensional superlattice indium selenide is: SiO 2 /Si substrate pretreatment; paste InSe material with scotch tape and transfer it to SiO 2 /Si substrate, soak in acetone; high temperature treatment under vacuum conditions, two-dimensional superlattice InSe nanostructures can be prepared on the surface of SiO 2 /Si substrate piece. The two-dimensional superlattice InSe prepared by the method of the invention has high electrical transport performance, high light response, good stability and fast light response speed, and has a good application prospect in the field of high-performance photodetectors.

Description

二维超晶格硒化铟及其制备方法与在制备光电探测器中的 应用Two-dimensional superlattice indium selenide and its preparation method and use in the preparation of photodetectors application

技术领域technical field

本发明属于高性能光电探测器领域;具体涉及二维超晶格硒化铟及其制备方法与在制备光电探测器中的应用。The invention belongs to the field of high-performance photoelectric detectors, and in particular relates to two-dimensional superlattice indium selenide, a preparation method thereof, and applications in the preparation of photoelectric detectors.

背景技术Background technique

光电探测器是一种将光学信号转变为电学信号的器件,在光通讯、光成像、环境监测、导弹监测和远程操控等领域具有巨大的应用前景,是科学界的热点研究领域,吸引了科学家的广泛关注,得到了快速的发展。具有良好的吸光能力和电学性能的半导体材料是设计制备高性能光电探测器的基础基础。基于传统半导体材料(硅、氮化镓和砷铟镓)的光电探测器表现出较小的光电探测性能,光响应值小于1A/W。A photodetector is a device that converts optical signals into electrical signals. It has great application prospects in the fields of optical communication, optical imaging, environmental monitoring, missile monitoring and remote control. It is a hot research field in the scientific community and attracts scientists. wide attention and rapid development. Semiconductor materials with good light-absorbing ability and electrical properties are the basis for designing and fabricating high-performance photodetectors. Photodetectors based on traditional semiconductor materials (silicon, gallium nitride, and indium gallium arsenide) exhibit small photodetection performance, with photoresponse values less than 1 A/W.

纳米材料具有不同于三维材料的特殊的电学和光学性能,在高性能光电探测器领域具有巨大的应用前景。到目前为止,科学家探索了各种纳米材料,如碳纳米管和纳米线。然而,器件较差的稳定性和材料较差的重复性是困扰一维纳米材料应用的最大问题。二维半导体材料可以克服一维材料的弱点,且与现在的薄膜集成技术相适应。然而二维半导体材料的电学输运性能远小于三维半导体材料,探索高电学输运性能的二维半导体材料对发展高性能的光电探测器具有重大意义。Nanomaterials have special electrical and optical properties different from three-dimensional materials, and have great application prospects in the field of high-performance photodetectors. So far, scientists have explored various nanomaterials such as carbon nanotubes and nanowires. However, the poor stability of devices and poor repeatability of materials are the biggest problems that plague the application of 1D nanomaterials. Two-dimensional semiconductor materials can overcome the weaknesses of one-dimensional materials and are compatible with current thin-film integration technologies. However, the electrical transport properties of two-dimensional semiconductor materials are much smaller than that of three-dimensional semiconductor materials. The exploration of two-dimensional semiconductor materials with high electrical transport properties is of great significance for the development of high-performance photodetectors.

发明内容SUMMARY OF THE INVENTION

本发明要解决现有二维半导体材料电学输运性能差及其光电探测器的光探测性能低的技术问题,而提供了二维超晶格硒化铟的制备方法及其在制备光电探测器中的应用。The invention aims to solve the technical problems of poor electrical transport performance of existing two-dimensional semiconductor materials and low photodetection performance of photodetectors, and provides a preparation method of two-dimensional superlattice indium selenide and the method for preparing the photodetector. applications in .

本发明以硒化铟(InSe)纳米片为原料,采用固相退火法制备了二维超晶格InSe,并构筑了光电探测器。The invention uses indium selenide (InSe) nanosheets as raw materials, adopts a solid phase annealing method to prepare a two-dimensional superlattice InSe, and constructs a photodetector.

首先,本发明提供一种二维超晶格硒化铟的制备方法,技术方案如下:First, the present invention provides a preparation method of two-dimensional superlattice indium selenide, and the technical scheme is as follows:

步骤一、将SiO2/Si基底进行预处理;Step 1, pretreating the SiO 2 /Si substrate;

步骤二、用透明胶带反复粘贴块体InSe材料,然后将透明胶带粘贴在经步骤一处理后的SiO2/Si基底上,撕去透明胶带后,将SiO2/Si基底浸泡在丙酮中,取出SiO2/Si基底即可在其表面获得随机分布的二维InSe纳米片;Step 2: Repeatedly stick the bulk InSe material with scotch tape, and then stick the scotch tape on the SiO 2 /Si substrate processed in step 1. After tearing off the scotch tape, soak the SiO 2 /Si substrate in acetone, take out The SiO 2 /Si substrate can obtain randomly distributed two-dimensional InSe nanosheets on its surface;

步骤三、将SiO2/Si基底放入管式炉中,将管式炉抽真空,并通入Ar/H2的混合气体,升温至350℃,保温,然后降温至室温,取出SiO2/Si基底,即可在SiO2/Si基底表面制得二维超晶格InSe纳米片。Step 3. Put the SiO 2 /Si substrate into the tube furnace, evacuate the tube furnace, and pass in the mixed gas of Ar/H 2 , heat up to 350 ° C, keep the temperature, and then cool down to room temperature, take out the SiO 2 / Si substrate, that is, two-dimensional superlattice InSe nanosheets can be prepared on the surface of SiO 2 /Si substrate.

步骤一中,所述SiO2/Si基底厚度为300nm。所述SiO2/Si基底预处理方法具体为:将SiO2/Si基底依次浸入异丙醇、丙酮、乙醇和超纯水中超声处理,用氮气吹干,待用。所述超声处理的实质是进行超声清洗,超声频率10KHz以上即可。In step 1, the thickness of the SiO 2 /Si substrate is 300 nm. The SiO 2 /Si substrate pretreatment method is specifically as follows: the SiO 2 /Si substrate is immersed in isopropanol, acetone, ethanol and ultrapure water in sequence for ultrasonic treatment, dried with nitrogen, and ready for use. The essence of the ultrasonic treatment is to perform ultrasonic cleaning, and the ultrasonic frequency can be above 10KHz.

步骤二中,所述反复粘贴块体InSe材料,指将透明胶带粘贴在块体InSe材料表面,然后将透明胶带取下,重复上述操作4-9次,每次粘贴操作使用透明胶带的位置相同(大致重叠即可)。In step 2, the repeated sticking of the bulk InSe material refers to sticking the scotch tape on the surface of the bulk InSe material, then removing the scotch tape, repeating the above operation 4-9 times, and using the same position of the scotch tape for each sticking operation (roughly overlapping).

步骤二中,所述透明胶带优选Scotch单面透明胶带。In step 2, the Scotch single-sided scotch tape is preferred for the scotch tape.

步骤二中,所述将透明胶带粘贴在经步骤一处理后的SiO2/Si基底上,粘贴时间为5~12小时。In the second step, the transparent tape is pasted on the SiO 2 /Si substrate processed in the first step, and the pasting time is 5-12 hours.

步骤二中,所述将SiO2/Si基底浸泡在丙酮中,浸泡时间为2~4小时。In the second step, the SiO 2 /Si substrate is soaked in acetone, and the soaking time is 2-4 hours.

步骤三中,所述抽真空,压强为50-100Torr。In step 3, the vacuum is performed, and the pressure is 50-100 Torr.

步骤三中,所述Ar/H2的混合气体中,Ar/H2的体积比为(9-4):1;所述Ar/H2的混合气体的流量为100-150sccm。In step 3, in the mixed gas of Ar/H 2 , the volume ratio of Ar/H 2 is (9-4):1; the flow rate of the mixed gas of Ar/H 2 is 100-150 sccm.

步骤三中,所述升温,升温速度为20-40℃/min。In step 3, in the temperature increase, the temperature increase rate is 20-40°C/min.

步骤三中,所述保温,保温时间为0.5-1.5小时。In step 3, the heat preservation time is 0.5-1.5 hours.

步骤三中,所述降温,降温速度为100-200℃/min。In step 3, the cooling rate is 100-200°C/min.

另外,本发明还提供上述方法制备的二维超晶格InSe及其在制备光电探测器中的应用,其应用具体为:取表面带有二维超晶格InSe纳米片的SiO2/Si基底,在InSe纳米片一侧用银胶固定金属掩膜板覆盖二维超晶格InSe纳米片的中心位置,两侧各留出二维超晶格InSe纳米片宽度至少3μm,然后置于真空镀膜机中,真空条件下在InSe纳米片一侧依次蒸镀金属铬电极和金属金电极,即得到二维超晶格硒化铟光电探测器,用于紫外-可见光的探测。In addition, the present invention also provides the two -dimensional superlattice InSe prepared by the above method and its application in the preparation of photodetectors. , use silver glue to fix the metal mask on one side of the InSe nanosheet to cover the center of the two-dimensional superlattice InSe nanosheet, leaving a width of at least 3 μm on each side of the two-dimensional superlattice InSe nanosheet, and then place it in a vacuum coating In the machine, a metal chromium electrode and a metal gold electrode are sequentially evaporated on one side of the InSe nanosheet under vacuum conditions to obtain a two-dimensional superlattice indium selenide photodetector for ultraviolet-visible light detection.

所述表面带有二维超晶格InSe纳米片的SiO2/Si基底,其表面上的InSe纳米片横向尺寸为20-40μm,厚度为20-40nm。The SiO 2 /Si substrate with two-dimensional superlattice InSe nanosheets on the surface has a lateral size of 20-40 μm and a thickness of 20-40 nm on the surface of the InSe nanosheets.

所述真空条件,真空度为1×10-4-5×10-4Pa。In the vacuum conditions, the degree of vacuum is 1×10 -4 -5×10 -4 Pa.

所述蒸镀金属铬电极的厚度为5-10nm。The thickness of the vapor-deposited metal chromium electrode is 5-10 nm.

所述蒸镀金属金电极的厚度为30-50nm。The thickness of the vapor-deposited metal gold electrode is 30-50 nm.

有益效果beneficial effect

本发明方法制备的二维超晶格InSe具有高的电学输运性能、高的光响应、良好的稳定性和快速的光响应速度,在高性能光电探测器领域具有很好的应用前景。The two-dimensional superlattice InSe prepared by the method of the invention has high electrical transport performance, high light response, good stability and fast light response speed, and has good application prospects in the field of high-performance photodetectors.

本发明方法制备的二维超晶格InSe用于制备光电探测器,得到的光电探测器在可见光照射下电流显著增加,说明本发明制备的二维超晶格InSe具有很好的光电探测性能,光响应值高达应变系数高达1.95×105A/W,远高于传统半导体(硅、氮化镓和砷铟镓<1A/W)和二维半导体材料(InSe:103A/W,MoS2:880A/W)。The two-dimensional superlattice InSe prepared by the method of the present invention is used to prepare a photodetector, and the obtained photodetector has a significant increase in current under the irradiation of visible light, indicating that the two-dimensional superlattice InSe prepared by the present invention has good photoelectric detection performance. The photoresponse value is as high as the gage factor as high as 1.95×10 5 A/W, which is much higher than that of traditional semiconductors (silicon, gallium nitride and indium gallium arsenide < 1A/W) and two-dimensional semiconductor materials (InSe: 10 3 A/W, MoS 2 :880A/W).

本发明方法制备的二维超晶格InSe用于制备光电探测器,得到的光电探测器具有良好的稳定性和快的相应速度(20ms),二维超晶格硒化铟在高性能光电探测器领域具有很大的应用前景。The two-dimensional superlattice InSe prepared by the method of the invention is used to prepare a photodetector, and the obtained photodetector has good stability and fast corresponding speed (20ms). The device field has great application prospects.

附图说明Description of drawings

图1是a)二维InSe和b)二维超晶格InSe的选取电子衍射图像;1 is a selected electron diffraction image of a) two-dimensional InSe and b) two-dimensional superlattice InSe;

图2是二维超晶格InSe光电探测器的a)三维示意图、b)光学图像和c)原子力图像;Figure 2 is a) a three-dimensional schematic diagram, b) an optical image and c) an atomic force image of a two-dimensional superlattice InSe photodetector;

图3是制备的二维超晶格InSe的电学输运性能:a)转移曲线和b)输出曲线;Figure 3 is the electrical transport properties of the prepared two-dimensional superlattice InSe: a) transfer curve and b) output curve;

图4是二维超晶格InSe光电探测器在700nm激发光激发下的电流曲线;Fig. 4 is the current curve of the two-dimensional superlattice InSe photodetector under excitation light of 700 nm;

图5是二维超晶格InSe光电探测器的a)稳定性和b)响应速度曲线。Figure 5 is a) stability and b) response speed curves of a two-dimensional superlattice InSe photodetector.

具体实施方式Detailed ways

实施例1二维超晶格InSe的制备Example 1 Preparation of two-dimensional superlattice InSe

步骤一、将300nm厚度的SiO2/Si基底依次用异丙醇、丙酮、乙醇和超纯水中10KHz下超声处理,超声处理时间均为10min,用氮气吹干,待用;Step 1. The SiO 2 /Si substrate with a thickness of 300 nm is ultrasonically treated with isopropanol, acetone, ethanol and ultrapure water at 10KHz in turn, the ultrasonic treatment time is 10min, dried with nitrogen, and set aside for use;

步骤二、用透明胶带基本相同的位置反复粘贴块体InSe材料6次,然后将透明胶带粘贴在经步骤一处理后的300nm SiO2/Si基底上的SiO2一侧8小时,除去透明胶带后,将SiO2/Si基底浸泡在丙酮中3小时,取出SiO2/Si基底即可在其表面获得随机分布的二维InSe纳米片;Step 2: Repeatedly paste the bulk InSe material 6 times at the same position with the transparent tape, and then paste the transparent tape on the SiO 2 side of the 300nm SiO 2 /Si substrate processed in the first step for 8 hours. After removing the transparent tape , soak the SiO 2 /Si substrate in acetone for 3 hours, and then take out the SiO 2 /Si substrate to obtain randomly distributed two-dimensional InSe nanosheets on its surface;

步骤三、将SiO2/Si基底放入管式炉中,将管式炉抽真空至80Torr,并通入100sccmAr/H2的混合气体(VAr:VH2=80:20),17.5分钟将炉温升至350℃,保持1小时,然后2分钟降至室温,取出SiO2/Si基底,即可制得二维超晶格InSe。Step 3. Put the SiO 2 /Si substrate into the tube furnace, evacuate the tube furnace to 80 Torr, and feed the mixed gas of 100sccmAr / H The furnace temperature was raised to 350°C, maintained for 1 hour, and then lowered to room temperature for 2 minutes, and the SiO 2 /Si substrate was taken out to obtain the two-dimensional superlattice InSe.

实施例2二维超晶格InSe光电探测器的制备Example 2 Preparation of two-dimensional superlattice InSe photodetector

选择实施例1制备的300nm SiO2/Si基底表面上横向尺寸为50微米和厚度为31nm的二维超晶格InSe纳米片,用银胶固定金属掩膜板覆盖二维超晶格InSe纳米片中心位置,两侧各留出二维超晶格InSe纳米片宽度3μm,然后置于真空镀膜机中,在真空度为3×10-4Pa条件下,在二维超晶格InSe纳米片一侧依次蒸镀5nm金属铬和40nm金属金电极,即可得到二维超晶格InSe光电探测器。The two-dimensional superlattice InSe nanosheets with a lateral dimension of 50 μm and a thickness of 31 nm on the surface of the 300 nm SiO 2 /Si substrate prepared in Example 1 were selected, and the two-dimensional superlattice InSe nanosheets were covered with a silver glue-fixed metal mask. In the center position, two-dimensional superlattice InSe nanosheets with a width of 3 μm are left on each side, and then placed in a vacuum coating machine, under the condition of vacuum degree of 3×10 -4 Pa, on the two-dimensional superlattice InSe nanosheets one The two-dimensional superlattice InSe photodetector can be obtained by evaporating 5nm metal chromium and 40nm metal gold electrodes in turn.

采用本实施方式的二维超晶格InSe光电探测器对700nm激发光的探测:Detection of excitation light at 700 nm using the two-dimensional superlattice InSe photodetector of this embodiment:

本实施方式中,通过热处理得到二维超晶格InSe纳米片,图1是本征InSe和超晶格InSe的选取电子衍射图像,对比可以得知热处理可以得到二维超晶格InSe。选取尺寸在20-40微米、厚度在20-40纳米的二维超晶格InSe作为光电探测器的沟道材料。图2c是二维超晶格InSe光电探测器的原子力图像,如图2c所示选取的二维超晶格InSe纳米片的厚度是31nm。图3是制备的二维超晶格InSe的电学输运曲线,计算得到超晶格InSe的电子迁移率高达299cm2V-1s-1,由图3可以得知该力学传感器具有高的电学传导性能,为高性能光电探测器奠定基础。图4是二维超晶格InSe光电探测器在激发功率0.29mW/cm2的700nm激发光激发下的电流曲线,由图4可以得知在700nm激发光作用下电流显著增加,说明二维InSe具有很好的光探测性能,计算得到施加5V电压时光电探测器的光响应值高达1.95×105A/W。图5是在0.1V电压、0.29mW/cm2的700nm激发光测试条件下光电探测器的稳定性和响应速度曲线,由此可以得知二维超晶格InSe光电探测器具有很好的稳定性和快速的光响应速度(20ms),进一步说明二维超晶格InSe具有很好的光电探测性能。In this embodiment, two-dimensional superlattice InSe nanosheets are obtained by heat treatment. FIG. 1 is a selected electron diffraction image of intrinsic InSe and superlattice InSe. By comparison, it can be known that two-dimensional superlattice InSe can be obtained by heat treatment. The two-dimensional superlattice InSe with a size of 20-40 μm and a thickness of 20-40 nm was selected as the channel material of the photodetector. Figure 2c is the atomic force image of the two-dimensional superlattice InSe photodetector, and the thickness of the selected two-dimensional superlattice InSe nanosheet is 31 nm as shown in Figure 2c. Figure 3 is the electrical transport curve of the prepared two-dimensional superlattice InSe. The calculated electron mobility of the superlattice InSe is as high as 299cm 2 V -1 s -1 . It can be seen from Figure 3 that the mechanical sensor has high electrical Conductive properties, laying the foundation for high-performance photodetectors. Figure 4 is the current curve of the two-dimensional superlattice InSe photodetector under the excitation of 700 nm excitation light with an excitation power of 0.29 mW/cm 2 . It can be seen from Figure 4 that the current increases significantly under the action of 700 nm excitation light, indicating that the two-dimensional InSe It has good photodetection performance, and the photoresponse of the photodetector is calculated to be as high as 1.95×10 5 A/W when a voltage of 5V is applied. Figure 5 shows the stability and response speed curves of the photodetector under the test conditions of 0.1V voltage and 700nm excitation light of 0.29mW/ cm2 . It can be seen that the two-dimensional superlattice InSe photodetector has good stability The high photoresponse and fast photoresponse speed (20ms) further indicate that the two-dimensional superlattice InSe has good photodetection performance.

Claims (9)

1.一种二维超晶格硒化铟的制备方法,其特征在于:包括以下步骤:1. a preparation method of two-dimensional superlattice indium selenide, is characterized in that: comprise the following steps: 步骤一、将SiO2/Si基底进行预处理;Step 1, pretreating the SiO 2 /Si substrate; 步骤二、用透明胶带反复粘贴块体InSe材料,然后将透明胶带粘贴在经步骤一处理后的SiO2/Si基底上,撕去透明胶带后,将 SiO2/Si基底浸泡在丙酮中,取出SiO2/Si基底在其表面获得随机分布的二维InSe纳米片;Step 2: Repeatedly stick the bulk InSe material with scotch tape, and then stick the scotch tape on the SiO 2 /Si substrate processed in step 1. After tearing off the scotch tape, soak the SiO 2 /Si substrate in acetone, take out The SiO 2 /Si substrate obtains randomly distributed two-dimensional InSe nanosheets on its surface; 步骤三、将SiO2/Si基底放入管式炉中,将管式炉抽真空,并通入Ar/H2的混合气体,Ar/H2的体积比为(9-4):1,升温至350 ℃,保温,然后降温至室温,取出 SiO2/Si基底在SiO2/Si基底表面制得二维超晶格InSe纳米片;升温速度为20-40 ℃/min;所述保温时间为0.5-1.5小时;降温速度为100-200 ℃/min。Step 3, put the SiO 2 /Si substrate into the tube furnace, evacuate the tube furnace, and pass into the mixed gas of Ar/H 2 , the volume ratio of Ar/H 2 is (9-4): 1, The temperature was raised to 350 °C, maintained at a temperature of 20-40 °C/min, and the SiO 2 /Si substrate was taken out to obtain two-dimensional superlattice InSe nanosheets on the surface of the SiO 2 /Si substrate; the heating rate was 20-40 ° C/min; the holding time was It is 0.5-1.5 hours; the cooling rate is 100-200 ℃/min. 2.根据权利要求1所述的二维超晶格硒化铟的制备方法,其特征在于:步骤一中,所述SiO2/Si基底厚度为300 nm;所述SiO2/Si基底预处理方法具体为:将SiO2/Si基底依次浸入异丙醇、丙酮、乙醇和超纯水中超声处理,用氮气吹干,待用。2 . The preparation method of two-dimensional superlattice indium selenide according to claim 1 , wherein in step 1, the thickness of the SiO 2 /Si substrate is 300 nm; the SiO 2 /Si substrate is pretreated. 3 . The specific method is as follows: the SiO 2 /Si substrate is sequentially immersed in isopropanol, acetone, ethanol and ultrapure water for ultrasonic treatment, dried with nitrogen, and set aside for use. 3.根据权利要求1所述的二维超晶格硒化铟的制备方法,其特征在于:步骤二中,所述反复粘贴块体InSe材料,指将透明胶带粘贴在块体InSe材料表面,然后将透明胶带取下,重复操作4-9次。3. The preparation method of two-dimensional superlattice indium selenide according to claim 1, characterized in that: in step 2, the repeated sticking of the bulk InSe material refers to sticking a scotch tape on the surface of the bulk InSe material, Then remove the scotch tape and repeat the operation 4-9 times. 4.根据权利要求1所述的二维超晶格硒化铟的制备方法,其特征在于:步骤二中所述将透明胶带粘贴在经步骤一处理后的SiO2/Si基底上,粘贴时间为5~12小时。4. The preparation method of two-dimensional superlattice indium selenide according to claim 1, characterized in that: described in step 2, the transparent tape is pasted on the SiO 2 /Si substrate processed in step one, and the pasting time 5~12 hours. 5.根据权利要求1所述的二维超晶格硒化铟的制备方法,其特征在于:步骤二中,所述将SiO2/Si基底浸泡在丙酮中,浸泡时间为2~4小时。5 . The method for preparing two-dimensional superlattice indium selenide according to claim 1 , wherein in step 2, the SiO 2 /Si substrate is soaked in acetone for a soaking time of 2 to 4 hours. 6 . 6.根据权利要求1所述的二维超晶格硒化铟的制备方法,其特征在于:步骤三中,所述抽真空,压强为50-100 Torr;所述通入Ar/H2的混合气体时通入的流量为100-150 sccm。6. The preparation method of two-dimensional superlattice indium selenide according to claim 1, characterized in that: in step 3 , the vacuum is evacuated, and the pressure is 50-100 Torr; The flow rate of the mixed gas is 100-150 sccm. 7.一种权利要求1-6任一项所述的二维超晶格硒化铟的制备方法制备的二维超晶格硒化铟。7. A two-dimensional superlattice indium selenide prepared by the method for preparing two-dimensional superlattice indium selenide according to any one of claims 1-6. 8.一种采用如权利要求7所述的二维超晶格硒化铟制备光电探测器的方法,其特征在于:取表面带有二维超晶格InSe纳米片的SiO2/Si基底,在InSe纳米片一侧用银胶固定金属掩膜板覆盖二维超晶格InSe纳米片的中心位置,两侧各留出二维超晶格InSe纳米片宽度至少3 μm,然后置于真空镀膜机中,真空条件下在InSe纳米片一侧依次蒸镀金属铬电极和金属金电极,即得到二维超晶格硒化铟光电探测器。8. A method for preparing a photodetector using the two-dimensional superlattice indium selenide as claimed in claim 7, characterized in that: taking a SiO 2 /Si substrate with a two-dimensional superlattice InSe nanosheet on the surface, On one side of the InSe nanosheets, a metal mask was fixed with silver glue to cover the center of the two-dimensional superlattice InSe nanosheets, leaving a width of at least 3 μm on each side of the two-dimensional superlattice InSe nanosheets, and then placed in vacuum coating In the machine, a metal chromium electrode and a metal gold electrode are sequentially evaporated on one side of the InSe nanosheet under vacuum conditions to obtain a two-dimensional superlattice indium selenide photodetector. 9.根据权利要求8所述的一种采用二维超晶格硒化铟制备光电探测器的方法,其特征在于:所述表面带有二维超晶格InSe纳米片的SiO2/Si基底,其表面上的InSe纳米片横向尺寸为20-40 μm,厚度为20-40 nm;所述真空条件,真空度为1×10-4 - 5×10-4 Pa;金属铬电极的厚度为5-10 nm;金属金电极的厚度为30-50 nm。9 . The method for preparing a photodetector using two-dimensional superlattice indium selenide according to claim 8 , wherein the surface has a SiO 2 /Si substrate with two-dimensional superlattice InSe nanosheets. 10 . , the lateral size of the InSe nanosheets on the surface is 20-40 μm, and the thickness is 20-40 nm; under the vacuum conditions, the vacuum degree is 1×10 -4 - 5×10 -4 Pa; the thickness of the metal chromium electrode is 5-10 nm; the thickness of the metallic gold electrode is 30-50 nm.
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