CN109406541A - A kind of device and method detecting the filth of external insulation equipment surface metal - Google Patents
A kind of device and method detecting the filth of external insulation equipment surface metal Download PDFInfo
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- CN109406541A CN109406541A CN201811398892.XA CN201811398892A CN109406541A CN 109406541 A CN109406541 A CN 109406541A CN 201811398892 A CN201811398892 A CN 201811398892A CN 109406541 A CN109406541 A CN 109406541A
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- Prior art keywords
- filth
- surface metal
- plasma atomic
- emission
- light wave
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
Abstract
The present invention relates to external insulation equipment filth detection fields, more particularly to a kind of device and method for detecting the filth of external insulation equipment surface metal.A kind of device detecting the filth of external insulation equipment surface metal, comprising: laser is used for emission pulse laser, and the pulse laser is for exciting the surface metal filth to generate plasma atomic-emission light wave；Spectrometer, for acquiring the plasma atomic-emission light wave, to generate corresponding plasma atomic emission spectroscopy；And processor, prestore calibration model；Wherein, the processor is used to obtain the ingredient of the surface metal filth and the concentration of each ingredient according to the plasma atomic emission spectroscopy and the calibration model.The present invention can accurately and comprehensively measure the metal particle in external insulation equipment surface filth.
Description
Technical field
The present invention relates to external insulation equipment filth detection fields, more particularly to a kind of detection external insulation equipment surface metal
Filthy device further relates to a kind of method for detecting the filth of external insulation equipment surface metal.
Background technique
It is more concentrated in the distribution of such as heavy plants such as heavy metal mine, steel plant, power plant, non-ferrous metals smelting works
Severe filthy area, metallic dust can be attached to the external insulation equipment surface such as insulator, casing, cabinet, these metal powders
Dirt meeting grotesque electric field simultaneously may cause flashover fault, constitutes and seriously threatens to the power equipment safety operation of substation.And it passes
The close close method of ash of salt used by uniting can not effectively judge the presence of metal particle in external insulation equipment surface filth.
Summary of the invention
Based on this, it is necessary in view of the above technical problems, provide a kind of dress for detecting the filth of external insulation equipment surface metal
It sets.
A kind of device detecting the filth of external insulation equipment surface metal, comprising:
Laser, is used for emission pulse laser, the pulse laser for excite the surface metal filth generate etc. from
Daughter atom emits light wave；
Spectrometer, for acquiring the plasma atomic-emission light wave, to generate corresponding plasma atomic-emission
Spectrum；And
Processor prestores calibration model；
Wherein, the processor is used for according to the plasma atomic emission spectroscopy and the calibration model, to described
The parameter of surface metal filth carries out analysis detection.
Described device in one of the embodiments, further include:
Sequence controller is connect with the laser and the spectrometer respectively；
Wherein, the sequence controller is used to control the working sequence of the spectrometer, so that the spectrometer is described
Surface metal filth acquires the plasma atomic-emission light wave after being excited completely.
Described device in one of the embodiments, further include:
Reflecting mirror, for changing the pulse laser direction of propagation；
Condenser lens, for reducing the spot diameter of the pulse laser；
Wherein, the reflecting mirror and condenser lens setting are propagated in the pulse laser from the laser described
In the optical path of surface metal filth.
Described device in one of the embodiments, further include:
Movable working platform, for carrying and moving surface metal filth sample to be measured.
The parameter of the surface metal filth includes: in one of the embodiments,
The ingredient of metal filth.
The parameter of the surface metal filth includes: in one of the embodiments,
The concentration of the filthy each ingredient of metal.
A kind of method detecting the filth of external insulation equipment surface metal is also provided.
A method of detection external insulation equipment surface metal is filthy, comprising:
The surface metal filth is excited to generate plasma atomic-emission light wave；
The plasma atomic-emission light wave is acquired, to generate corresponding plasma atomic emission spectroscopy；And
The plasma atomic emission spectroscopy and calibration model are compared, surface metal described in analysis detection is filthy
Parameter.
In one of the embodiments, the method also includes:
The signal when surface metal filth is not excited is acquired as background signal, and generates corresponding background signal
Spectrum；
Wherein, the plasma atomic-emission light wave is acquired, to generate corresponding plasma atomic emission spectroscopy
Step, comprising:
Signal after acquiring the surface metal filth excitation, generates corresponding first signal spectrum；
First signal spectrum is subtracted into the background signal spectrum, generates the plasma of the surface metal filth
Atomic emission spectrum.
In one of the embodiments, the method also includes:
Noise Elimination from Wavelet Transform is carried out, at area normalization to the plasma atomic emission spectroscopy of the surface metal filth
Reason, to improve the signal-to-noise ratio of the plasma atomic emission spectroscopy of the surface metal filth generated.
It is described to establish calibration model packet in one of the embodiments, the method also includes establishing the calibration model
It includes:
Calibration sample is configured, respectively by the single metal mixed of kaolin or diatomite and various concentration, configures multiple contain
The artificial pollution of the single metal of various concentration；
The artificial pollution is excited to generate plasma atomic-emission light wave；
The plasma atomic-emission light wave of the artificial pollution is acquired, to generate the Plasma-Atomic hair of artificial pollution
Penetrate spectrum；And
In conjunction with specific atomic spectra database, using mathematical method to collected multiple artificial pollutions etc.
Plasma-atomic emission spectrum is handled, and the calibration mould of the parameter of equal atoms body atomic emission spectrum and metal filth is obtained
Type.
The device and method of above-mentioned detection external insulation equipment surface metal filth is filthy by laser excitating surface metal
Plasma atomic-emission light wave is generated, and corresponding plasma atomic emission spectroscopy is generated by spectrometer, in conjunction with institute
The parameter that calibration model obtains the surface metal filth is stated, can accurately and comprehensively be measured in external insulation equipment surface filth
Metal particle.
Detailed description of the invention
Fig. 1 is the structural block diagram that the device of external insulation equipment surface metal filth is detected in one embodiment；
Fig. 2 is the structural block diagram that the device of external insulation equipment surface metal filth is detected in another embodiment；
Fig. 3 is the schematic diagram that the device of external insulation equipment surface metal filth is detected in one embodiment；
Fig. 4 is the flow chart that the method for external insulation equipment surface metal filth is detected in one embodiment；
Fig. 5 is the flow chart that the method for external insulation equipment surface metal filth is detected in another embodiment；
Fig. 6 is the flow chart that calibration model is established in Fig. 5 embodiment.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is used only for explaining the present invention, and
It is not used in the restriction present invention.
Fig. 1 is the structural block diagram that the device of external insulation equipment surface metal filth is detected in one embodiment, such as Fig. 1 institute
Show, a kind of device 10 detecting the filth of external insulation equipment surface metal, it may include laser 110, spectrometer 120 and processor
130, wherein laser 110 can be used for emission pulse laser, and the pulse laser can be used for excitating surface metal filth 20 and generate
Plasma atomic-emission light wave；Spectrometer 120 can be used for acquiring the plasma atomic-emission light wave, and can be according to institute
Collected plasma atomic-emission light wave generates corresponding plasma atomic emission spectroscopy；Processor 130 prestores fixed
Model is marked, can be according to the plasma atomic emission spectroscopy and the calibration model, it is filthy that analysis detection obtains surface metal
20 relevant parameter.
Specifically, the high Q impulse Nd:YAG laser of stability can be used in laser 110, and capable of emitting pulsewidth is small
In (microgram or nanogram magnitude, projected area are small for very small part on the pulse laser for being equal to 30ns, surface metal filth surface
In 1mm) transparent plasma then can be formed, in an atmosphere the time existing for plasma by pulse laser transient heating
It is very short, as plasma disappearance emits the light wave of ultraviolet band or visible light wave range；Spectrometer 120 can be to collected etc.
Plasma-atomic emission lightwave signal amplifies, and can effectively improve signal-to-noise ratio, spectrometer by adjusting the gain of spectrometer light intensity
120 can be fiber spectrometer, and the fiber spectrometer may include optical fiber and spectrometer ontology, the optical fiber can acquire it is described it is equal from
Daughter atom emits light wave, and by the collected plasma atomic-emission light wave transmissions and can be coupled into spectrometer sheet
Body, due to the portability of optical fiber, strong anti-interference ability and the excellent working performance such as flexible, so that spectrometer is built very
Flexibly；Processor 130 can be computer.
In one of the embodiments, as shown in Fig. 2, a kind of device 10 for detecting the filth of external insulation equipment surface metal is gone back
It may include sequence controller 140, connect respectively with laser 110 and spectrometer 120, sequence controller 140 is for controlling spectrum
The working sequence of instrument 120 so that spectrometer 120 is after surface metal filth 20 is excited completely, then acquires the plasma
Atomic emissions light wave, so that the plasma atomic-emission light wave collected is more accurate；Specifically, pulsed laser irradiation
Before to filthy 20 surfaces of surface metal in the time of 30 microseconds, surface metal filth 20 is not excited also completely, spectrum
The collected mainly background signal of instrument 120, generated is continuous background emission spectrum, after the time of 30 microseconds,
The collected plasma atomic-emission light wave for being only surface metal filth 20 of spectrometer 120, to produce accurate table
The plasma atomic emission spectroscopy of face metal filth, the gate-width time delay of the charge-coupled device by controlling spectrometer 120, can make
Spectrometer 120 is obtained according to required sequential working.
In one of the embodiments, as shown in Fig. 2, a kind of device 10 for detecting the filth of external insulation equipment surface metal is gone back
It may include reflecting mirror 150 and condenser lens 160, wherein reflecting mirror 150 and the setting of condenser lens 160 are in pulse laser from laser
Device 110 propagates in the optical path of surface metal filth 20, and the mirror surface of reflecting mirror 150 and the optical axis of pulse laser are at 45 °, focuses saturating
The optical axis of mirror 160 and the optical axis coincidence of pulse laser, also, reflecting mirror 150 and condenser lens 160 put sequence interchangeable,
Reflecting mirror 150 can be used for changing the pulse laser direction of propagation, and the hot spot that condenser lens 160 can be used for reducing the pulse laser is straight
Diameter.
A kind of device 10 for detecting the filth of external insulation equipment surface metal may also include removable in one of the embodiments,
Dynamic workbench 170 can make the focus of condenser lens be located exactly at surface metal filth 20 by mobile working platform 170
On, so that maximal efficiency excitating surface metal filth 20 generates plasma atomic-emission light wave, meanwhile, also mobile work is flat
Platform 170 is located exactly at surface metal filth 20 on 120 probe focus of spectrometer, so that maximal efficiency collects plasma original
Son transmitting light wave can realize the detection of the filthy different sampled points of surface metal with mobile working platform 170.
The parameter of the surface metal filth may include the ingredient of metal filth in one of the embodiments, can also wrap
The concentration for including the filthy each ingredient of metal, may also comprise other parameters that can be obtained from the plasma atomic emission spectroscopy.
Below with reference to specific application, the device that the filth of external insulation equipment surface metal is detected in the application is carried out detailed
Illustrate:
Fig. 3 is the schematic diagram that the device of external insulation equipment surface metal filth is detected in one embodiment, as shown in figure 3,
In an alternative embodiment, a kind of device detecting the filth of external insulation equipment surface metal, it may include laser, reflection
Mirror, condenser lens, workbench, fiber spectrometer, sequence controller and computer, laser can emit high energy pulse and swash
Light, and be radiated in the surface metal filth for being placed in workbench after reflecting mirror reflection and condenser lens focus, surface gold
Belong to filthy excitation, and emit plasma atomic-emission light wave, fiber spectrometer acquire the light wave and generate it is corresponding etc. from
Daughter atom emission spectrum is controlled the working sequence of fiber spectrometer by sequence controller, then passes through computer comparative analysis institute
The plasma atomic emission spectroscopy and calibration model stated, to obtain the metal component and each metal component of surface metal filth
Concentration.
The device of above-mentioned detection external insulation equipment surface metal filth, generated by laser excitating surface metal filth etc.
Plasma-atomic emission light wave, and corresponding plasma atomic emission spectroscopy is generated by spectrometer, in conjunction with the calibration
Model obtains the metal component of the surface metal filth and the concentration of each ingredient, can accurately and comprehensively measure external insulation equipment
Metal particle in surface filth.
The present invention also provides a kind of methods for detecting the filth of external insulation equipment surface metal.As shown in figure 4, outside a kind of detection
The method of insulator arrangement surface metal filth, comprising:
S210 excites the surface metal filth to generate plasma atomic-emission light wave；
S220 acquires the plasma atomic-emission light wave, to generate corresponding plasma atomic emission spectroscopy；With
And
The plasma atomic emission spectroscopy is compared S230 with calibration model, the gold of surface described in analysis detection
Belong to filthy parameter.
Specifically, can be filthy by mobile surface metal, excite multiple samplings on surface metal filth surface
Point (such as 5) generates corresponding plasma atomic-emission light to acquire corresponding plasma atomic-emission light wave
Spectrum, then the spectral information of multiple sample points is taken into the average plasma atomic emission spectroscopy as the surface metal filth.
Fig. 5 is the flow chart that the method for external insulation equipment surface metal filth is detected in another embodiment, such as Fig. 5 institute
Show, a method of detection external insulation equipment surface metal is filthy, further includes:
S240 acquires the signal when surface metal filth is not excited as background signal, and generates corresponding back
Scape signal spectrum；
Specifically, it does not start to work in laser, when being exported without laser, acquires background signal, generate corresponding background
Signal spectrum.
S220 in one of the embodiments, can include:
S221, the signal after acquiring the surface metal filth excitation, generates corresponding first signal spectrum；
First signal spectrum is subtracted the background signal spectrum by S222, generate the surface metal it is filthy etc.
Plasma-atomic emission spectrum；
Specifically, the signal after the surface metal filth excitation includes the plasma that the surface metal filth generates
Atomic emissions light wave and the background signal；To which finally obtained is the surface metal dirt for not including background signal spectrum
Dirty plasma atomic emission spectroscopy ensure that measurement result is more accurate.
A kind of method detecting the filth of external insulation equipment surface metal in one of the embodiments, may also include that
S250, to the plasma atomic emission spectroscopy of the surface metal filth carries out Noise Elimination from Wavelet Transform, area is returned
One change processing, to improve the signal-to-noise ratio of the plasma atomic emission spectroscopy of the surface metal filth generated, to make
The plasma atomic emission spectroscopy for obtaining the surface metal filth generated is more accurate.
A kind of method detecting the filth of external insulation equipment surface metal in one of the embodiments, may also include that
S260 establishes calibration model.As shown in fig. 6, S260 can include:
S261 configures calibration sample.
Specifically, the gold of the daily accumulation in external insulation equipments surface such as insulator, casing is chosen in one of the embodiments,
Belong to the typical elements such as filthy Specific disposition artificial pollution, such as nickel (Ni), copper (Cu), manganese (Mn), iron (Fe), zinc (Zn), and root
According to specific atomic spectra database such as National Institute of Standards and Technology (National Institute of
Standards and Technology, NIST) atomic spectra database (Atomic Spectra Database) announced
The corresponding resonant wavelength of the above element is chosen as optical electivity wavelength, such as the resonant wavelength of Ni is 352.454nm, then Ni
Optical electivity wavelength uses 352.454nm；It according to selected metallic element, mixes with kaolin or diatomite, matches respectively
Set artificial pollution (such as 0.1%, 3%, 6%, 9%, 12%, 15%) of 6 kinds or more the mass fractions 0.1%~15%；Again
Configured artificial pollution is applied on tablet press machine 10MPa~15MPa (such as 10MPa, 11MPa, 12MPa, 13MPa,
14MPa, 15MPa) pressure, obtain the calibration sample of muffin shape.
S262 excites the calibration sample to generate plasma atomic-emission light wave.
S263 acquires the plasma atomic-emission light wave of the calibration sample, to generate the plasma of calibration sample
Atomic emission spectrum.
Specifically, calibration sample is placed on workbench, adjustment condenser lens focal position makes to be emitted laser action
On calibration sample surface, laser of the pulsewidth less than or equal to 30ns is issued using laser, the calibration sample is formed by gasification
Plasma, the light wave emitted in spectrometer collection Cathode plasma explosion cooling procedure, to generate the plasma of calibration sample
Body atomic emission spectrum, each calibration sample surface randomly choose 5 testing sites, and the selection of testing site can be flat by mobile working
Platform is operated, and the spectrum of 5 testing sites is averaged, the spectral information as the calibration sample.
S264, in conjunction with specific atomic spectra database, using mathematical method to the collected multiple calibration samples of institute
The plasma atomic emission spectroscopy of product is handled, and determining for equal atoms body atomic emission spectrum and the parameter of metal filth is obtained
Mark model.
Specifically, the calibration model for waiting the parameter of atoms body atomic emission spectrum and metal filth can be equal former daughter atom
Emission spectrum and the ingredient of metal filth and the calibration model of each constituent concentration, according to selected element species and corresponding light
Spectrum selection wavelength, chooses the corresponding element spectral line position of each calibration sample and spectral intensity, in conjunction with corresponding calibration sample gold
Belong to mass fraction, summarizes the spectral intensity and concentration information that obtain all calibration samples, using concentration as dependent variable, spectral intensity
As independent variable, equal atoms body atomic emission spectrum and the ingredient of metal filth and the concentration of each ingredient are obtained using mathematical method
Calibration model.
Mathematical method can be unitary linear scaled curve method or Partial Least Squares in one of the embodiments,.Specifically
Ground, unitary linear scaled curve method, i.e., at one using spectral intensity as abscissa, concentration is in the coordinate diagram of ordinate, respectively
The coordinate points under identical element (spectral intensity, concentration) are drawn, Linear regression is fitted these coordinate points and obtains unitary line
Linearity curve；Partial Least Squares, that is, establishing multiple component spectrum intensity is dependent variable, and concentration is argument models, is obtained polynary
The multiple linear relationship of spectral intensity and concentration under element effect.The selection of mathematical model can follow following rule: when unitary line
Property calibration curve method when obtaining the linearity (R2) of equation lower than 0.75, select Partial Least Squares mathematical model as scalar number
According to library model.
It should be noted that the device and method of detection external insulation equipment surface metal filth provided by the present invention is available
In surface metal filth sample detecting, it can also be used to on-line monitoring of the external insulation equipment in electrification, it is convenient and right rapidly
External insulation equipment itself does not injure.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (10)
1. a kind of device for detecting the filth of external insulation equipment surface metal characterized by comprising
Laser is used for emission pulse laser, and the pulse laser is for exciting the surface metal filth to generate plasma
Atomic emissions light wave；
Spectrometer, for acquiring the plasma atomic-emission light wave, to generate corresponding plasma atomic emission spectroscopy；
And
Processor prestores calibration model；
Wherein, the processor is used for according to the plasma atomic emission spectroscopy and the calibration model, to the surface
The parameter of metal filth carries out analysis detection.
2. the apparatus according to claim 1, which is characterized in that further include:
Sequence controller is connect with the laser and the spectrometer respectively；
Wherein, the sequence controller is used to control the working sequence of the spectrometer, so that the spectrometer is on the surface
Metal filth acquires the plasma atomic-emission light wave after being excited completely.
3. the apparatus according to claim 1, which is characterized in that further include:
Reflecting mirror, for changing the pulse laser direction of propagation；
Condenser lens, for reducing the spot diameter of the pulse laser；
Wherein, the reflecting mirror and the condenser lens, which are arranged, propagates to the surface from the laser in the pulse laser
In the optical path of metal filth.
4. the apparatus according to claim 1, which is characterized in that further include:
Movable working platform, for carrying and moving surface metal filth sample to be measured.
5. the apparatus according to claim 1, which is characterized in that the parameter of the surface metal filth includes:
The ingredient of metal filth.
6. the apparatus according to claim 1, which is characterized in that the parameter of the surface metal filth includes:
The concentration of the filthy each ingredient of metal.
7. a kind of method for detecting the filth of external insulation equipment surface metal characterized by comprising
The surface metal filth is excited to generate plasma atomic-emission light wave；
The plasma atomic-emission light wave is acquired, to generate corresponding plasma atomic emission spectroscopy；And
The plasma atomic emission spectroscopy and calibration model are compared, the ginseng of the filth of surface metal described in analysis detection
Number.
8. the method according to the description of claim 7 is characterized in that further include:
The signal when surface metal filth is not excited is acquired as background signal, and generates corresponding background signal light
Spectrum；
Wherein, the plasma atomic-emission light wave is acquired, the step of to generate corresponding plasma atomic emission spectroscopy,
Include:
Signal after acquiring the surface metal filth excitation, generates corresponding first signal spectrum；
First signal spectrum is subtracted into the background signal spectrum, generates the Plasma-Atomic of the surface metal filth
Emission spectrum.
9. according to the method described in claim 8, it is characterized by further comprising:
Noise Elimination from Wavelet Transform, area normalization processing are carried out to the plasma atomic emission spectroscopy of the surface metal filth,
To improve the signal-to-noise ratio of the plasma atomic emission spectroscopy of the surface metal filth generated.
10. the foundation is calibrated the method according to the description of claim 7 is characterized in that further including establishing the calibration model
Model includes:
Calibration sample is configured, respectively by the single metal mixed of kaolin or diatomite and various concentration, is configured multiple containing difference
The artificial pollution of the single metal of concentration；
The artificial pollution is excited to generate plasma atomic-emission light wave；
The plasma atomic-emission light wave of the artificial pollution is acquired, to generate the plasma atomic-emission light of artificial pollution
Spectrum；And
In conjunction with specific atomic spectra database, using mathematical method to collected multiple artificial pollutions plasma
Body atomic emission spectrum is handled, and the calibration model of the parameter of equal atoms body atomic emission spectrum and metal filth is obtained.
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