CN109347544B - Optical fiber time domain reflectometer based on ultra-low noise near-infrared single photon detection system - Google Patents
Optical fiber time domain reflectometer based on ultra-low noise near-infrared single photon detection system Download PDFInfo
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Abstract
The invention provides an optical fiber time domain reflectometer based on an extremely low noise near-infrared single photon detection system. The method is characterized in that: the device comprises a pulse generator 1, a light source 2, a three-port optical fiber circulator 3, a light splitter 4, a near-infrared single photon detector array 5, an avalanche event detection circuit array 6, a logic AND gate circuit 7, a signal processing module 8 and a measured optical fiber 9. The invention can be used for the optical fiber time domain reflection measurement with low noise, large dynamic range and high precision. The method can be widely used for measuring the characteristics of the optical fiber in the fields of telecommunication and sensing, such as physical defects, fracture positions, joint loss and positions and the length of the optical fiber.
Description
(I) technical field
The invention relates to an optical fiber time domain reflectometer system based on an extremely low noise near-infrared single photon detection system, which can be used for measuring optical fiber characteristics such as physical defects, fracture positions, joint loss and positions and optical fiber lengths in the fields of telecommunication and sensing and belongs to the technical field of optical fiber sensing.
(II) background of the invention
An Optical Time Domain Reflectometer (OTDR) -based optical fiber time domain reflectometer is a common measuring instrument, which can measure physical defects, a fracture position, a splice loss and position of an optical fiber and an optical fiber length without damaging the optical fiber by using the principle of back reflection and scattering of light in the optical fiber. The optical fiber time domain reflectometer is an essential measuring tool in optical fiber communication and optical cable construction, and is widely applied to detection and maintenance of related systems. The optical detection system of classical OTDR systems is based on Linear photodetectors such as PIN photodiodes or Linear avalanche photodiodes (Linear-APDs). The measurable dynamic range and measurement accuracy of linear photodetector-based OTDR systems are limited by the sensitivity, responsivity of the used photodetector and its own large dark current and thermal noise. To further improve performance, researchers have proposed and validated single photon detector-based OTDR systems. Compared with the OTDR system based on the linear photon detector, the OTDR system based on the single photon detector has larger dynamic range and higher precision, can detect farther distance and does not have a so-called blind area due to the extremely high sensitivity of the detector (the internal gain of the detector is improved by 3-4 orders compared with the traditional detector).
The existing OTDR system based on single photon detector mainly comprises three types (1) an OTDR system based on Superconducting Nanowire Single Photon Detector (SNSPD); (2) an OTDR system based on an up-conversion module and a silicon-based single photon detector; (3) OTDR systems based on near-infrared single-photon detectors (single-photon avalanche diodes based on Germanium (Germanium), indium gallium arsenide (InGaAs) or indium gallium arsenide/indium phosphide (InGaAs/InP)).
Superconducting Nanowire Single Photon Detectors (SNSPDs) have evolved in the past decade, and OTDR systems based on Superconducting Nanowire Single Photon Detectors (SNSPDs) have also been proposed and designed, as described in published patent 201110314519.3, published patent 201310600853.4, and in the literature, "Photon-Counting Optical Time-Domain reflectance Using a Superconducting Nanowire Single-Photon Detector, Journal of light Technology,30(16):2583-2588, (2012)" and in the literature "Long-halogen and high-resolution Optical Time Domain reflectance Using Superconducting Nanowire Single-Photon detectors, Scientific memories, 5: 10441" (applied to the present application). Its advantages are high sensitivity, high repetition rate, low Dark Count Rate (DCR) and high system detection efficiency. However, superconducting nanowire photon detectors need to operate at ultra-low temperature conditions, typically in a liquid helium cryostat to reduce thermal noise. The need for cryogenic cooling and temperature control significantly increases the overall system size, complexity and cost, and greatly limits its application to practical measurement and detection operations.
The silicon-based single photon detector (Si-SPAD) can realize low noise, low back pulse and operation in a free mode. However, since the silicon-based single photon detector is not sensitive to the communication wavelength, designers need to design a frequency up-converter to convert the optical signal close to 1550nm into the optical signal in the visible light region, and then use the silicon-based single photon detector to detect the converted optical signal, as disclosed in the patent publication 201310380182.5 and the references "High resolution optical time domain reflection based on 1.55 μm up-conversion photo-conversion module, Optics Express 15,8237 up-photo 8242 (2007)" and "217 km dispersion photo-conversion optical time-domain reflection based on ultra-low wavelength up-conversion single photon detector, optical expression, 21: 24674-24679(2013) ″. This adds cost, instability and complexity to the overall system since up-converters for optical signals require expensive high performance optics (e.g., periodically poled lithium niobate crystals (PPLN), bragg gratings, optical bandpass filters, etc.) and complicated calibration. In addition, the up-converter reduces the photon detection efficiency, and the noise generated by the up-converter is received by the detector, which causes system errors.
Near-infrared single Photon avalanche diode based OTDR system is another single Photon OTDR system, the literature "Photon counting OTDR: advanced and limitations, Journal of light technology.28, 952-964 (2010)" and the literature "Enhanced v-optical time domain reflection using localized InGaAs/InP single-Photon avalanche detector, optical Engineering,55 (9)": 094101, 2016 "proposes related design and verification. Compared with other two single photon OTDR systems, the OTDR system based on the near-infrared single photon avalanche diode does not need a strict temperature control system and a complex optical signal conversion module, is relatively simple in design and stable in system, and is easy to use in outdoor variable test environments. However, due to the large noise (including dark count rate and post-pulse probability) of the near-infrared single-photon avalanche diode, the OTDR data is easily distorted seriously, so that it cannot operate under free running conditions. In the existing OTDR system based on the near-infrared single photon avalanche diode, a designer uses a time gating circuit to operate the near-infrared single photon avalanche diode. Because the near-infrared single photon avalanche diode operated under the time gating circuit is designed for the application with known photon arrival time, however, in the related application of the OTDR, the signal photon arrival time is unknown, which enables the existing OTDR system based on the near-infrared single photon avalanche diode to measure only a part of optical fibers at a time, which causes the measurement time to be much longer than that of the OTDR system based on the detector under the free operation condition, more than 3 times, and meanwhile, the longer the optical fiber, the longer the required additional test time.
In order to solve the problems, the invention discloses an optical fiber time domain reflectometer system based on an extremely low noise near-infrared single photon detection system, wherein the near-infrared single photon detection system in the system can realize low noise operation of low dark counting rate and low back pulse rate in a free operation state. The signal-to-noise ratio of the OTDR system based on the near-infrared single-photon detector is improved, and data distortion is reduced. In addition, the system does not need to perform segmented detection on the optical fiber, which greatly reduces the test time required by the system.
Compared with the classical OTDR system based on the general PIN photodiode and the linear avalanche diode, the invention has larger dynamic range and higher precision, can detect farther distance and has no so-called blind area.
Compared with an OTDR system based on a superconducting nanowire single photon detector or a silicon-based single photon detector, the invention does not need a strict temperature control system and a complex optical signal up-conversion module, and has the advantages of lower cost, simple design, stable system, higher portability and stronger practicability.
Disclosure of the invention
The invention aims to provide an optical fiber time domain reflectometer system based on an extremely low noise near-infrared single photon detection system.
The purpose of the invention is realized as follows:
an optical fiber time domain reflectometer based on an extremely low noise near-infrared single photon detection system is composed of a pulse generator 1, a light source 2, a three-port optical fiber circulator 3, a light splitter 4, a near-infrared single photon detector array 5, an avalanche event detection circuit array 6, a logic AND gate circuit 7, a signal processing module 8 and a detected optical fiber 9. In the system, a pulse generator 1 generates a pulse signal which, on the one hand, triggers a signal processing module 8 to start recording time and, on the other hand, causes a light source 2 to emit pulsed light. The light source 2 is connected with an a port of the three-port optical fiber circulator 3, pulse light is incident into the three-port optical fiber circulator 3, a pulse light signal output from a b port of the three-port optical fiber circulator 3 is incident into an optical fiber 9 to be detected, the pulse light signal passes through the optical fiber 9 to be detected to obtain backward scattering light, the backward scattering light is input into the three-port optical fiber circulator 3, the backward scattering light is input into the optical splitter 4 through a c port by the optical fiber circulator 3, the optical splitter 4 divides the backward scattering light into multiple paths of optical signals with the same power, and the optical signals are respectively output to each single photon detector in the near-infrared single photon detector array 5. The rear end of the near-infrared single-photon detector array 5 is connected with an avalanche event detection circuit array 6. The avalanche event detection circuit array 6 converts the triggered avalanche events in the near-infrared single photon detector array 5 into standard transistor-transistor logic level (TTL) signals and outputs them to the logic and gate circuit 7. The logic and circuit 7 performs logic operation on the TTL signal output from the avalanche event detection circuit array 6, and outputs the result to the signal processing module 8. The signal processing module 8 performs statistical analysis on the time interval between the pulse signal generated by the pulse generator 1 and the TTL signal output by the and logic circuit 7, and gives a measurement result after processing.
The light source 1 may be one of a near-infrared LED light source, a laser diode light source, and an ASE light source.
The number of output optical signals of the optical splitter 4 is the same as that of the detectors in the near-infrared single-photon avalanche diode array 5. The number of avalanche event detection circuits in the avalanche event detection circuit array 6 is the same as that of avalanche diodes in the near-infrared single photon detector array 5. The rear end of each single photon avalanche diode is connected with an avalanche event detection circuit, and the avalanche event detection circuit converts avalanche events triggered in the single photon avalanche diodes into TTL signals and outputs the TTL signals. The avalanche event detection circuit may be a comparator or inverter in combination with a passive quenching circuit or an active quenching circuit. Avalanche events of a single photon avalanche diode can be triggered by backscattered light signals and can also be triggered by self defects, thermal effects or residual charges under the condition of no light. The avalanche event detection circuit converts all avalanche events into TTL signals to be output.
The near-infrared single photon detector array 5 is composed of a plurality of near-infrared single photon avalanche diodes with the same or similar performance, and the near-infrared single photon avalanche diodes can be any one of Germanium (Germanium), indium gallium arsenide (InGaAs) or indium gallium arsenide/indium phosphide (InGaAs/InP) based single photon avalanche diodes, and the number of the near-infrared single photon avalanche diodes in the array can be selected according to the requirements on the performance and the noise of the detector.
The number of input ports of the logic AND gate circuit 7 is consistent with the number of single photon avalanche diodes in the near-infrared single photon detector array 5. And the logic AND gate circuit 7 receives TTL signals which are output by the avalanche event detection circuit array 6 and triggered by avalanche events in the near-infrared single-photon detector array 5. Only when all avalanche diodes in the near-infrared single photon detector array 5 trigger avalanche events, the logic and circuit 7 outputs a TTL signal pulse, and the signal processing module 8 receives and processes the TTL signal pulse. When an optical signal is incident to the near-infrared single photon detector array 5, all the avalanche diodes are triggered, and the logic AND gate circuit 7 outputs a photon counting pulse. When no optical signal is incident on the near-infrared single photon detector array 5, avalanche diodes in the array are possibly affected by self defects, thermal effects or residual charges to trigger avalanche events, and noises such as dark pulses, rear pulses and the like are generated. Especially, when the number of the near-infrared single-photon detectors in the array is large enough, the probability that all avalanche diodes of the near-infrared single-photon detector array 5 are triggered to generate noise-related pulses at the same time is close to 0, and at this time, the signal logic and gate 7 does not output photon counting pulses. Through the above manner, the possibility of receiving the TTL signal irrelevant to the incident light signal by the signal processing module 8 is greatly reduced, the noise of the whole detection system is also reduced to be extremely low, and the signal-to-noise ratio is greatly improved.
In the OTDR system based on the single photon detection system, the performance of the whole OTDR system is greatly improved in the aspects of dynamic range, measurement precision, measurement speed and the like by the ultra-low noise single photon detection system. Compared with the traditional gating signal structure, the OTDR system based on the near-infrared single-photon detector can realize low-noise operation of low dark counting rate and low back pulse rate in the free operation state of the near-infrared single-photon detection system. The signal-to-noise ratio of the OTDR system based on the near-infrared single-photon detector is improved, and data distortion is reduced. In addition, the system does not need to perform segmented detection on the optical fiber, which greatly reduces the test time required by the system.
Compared with a classical OTDR system based on PIN photodiodes and linear avalanche diodes, the invention has larger dynamic range and higher precision, can detect farther distance and has no so-called blind area.
Compared with an OTDR system based on a superconducting nanowire single photon detector or a silicon-based single photon detector, the invention does not need a strict temperature control system and a complex optical signal up-conversion module, and has the advantages of lower cost, simple design, stable system, higher portability and stronger practicability.
(IV) description of the drawings
FIG. 1 is a schematic structural diagram of a fiber-optic time-domain reflectometer system based on a very low noise near-infrared single photon detection system. The device comprises a pulse generator 1, a light source 2, a three-port optical fiber circulator 3, a light splitter 4, a near-infrared single photon detector array 5, an avalanche event detection circuit array 6, a logic AND gate circuit 7, a signal processing module 8 and a measured optical fiber 9.
FIG. 2 is an embodiment of a fiber optic time domain reflectometry system based on a very low noise near infrared single photon detection system. The system consists of a pulse generator 201, a light source 202, a three-port optical fiber circulator 203, an optical splitter 204, a single photon detection system 205, a signal processing module 206 and a measured optical fiber 207.
Figure 3 is a schematic diagram of a single photon detection system used in implementation, which is composed of three near-infrared single photon detectors 301, 302 and 303 with the same structure and similar performance, avalanche event detection circuits 304, 305 and 306, and a three-port input logic and gate circuit 307.
Fig. 4 is a schematic diagram of avalanche events in a near-infrared single photon detector converted into TTL signals (pulse signals) by avalanche event detection circuits.
Fig. 5 is a schematic diagram of the output signal of the avalanche event detection circuit passing through a logic and gate circuit and outputting a noise-reduced signal. Because the occurrence time of avalanche events (light pulses) generated by incident light signals is the same, after passing through the logic AND gate circuit, TTL signal output can be generated at the output of the logic AND gate circuit; the occurrence time of avalanche events (dark pulses and back pulses) triggered by internal noise is random (possibly different), so that after passing through the logic and gate circuit, TTL signal output is basically not generated at the output of the logic and gate circuit, and by this way, the output noise of the single photon detection system is greatly reduced.
(V) detailed description of the preferred embodiments
The invention is further illustrated below with reference to specific examples.
FIG. 2 shows an embodiment of a fiber-optic time-domain reflectometer system based on a very low noise near-infrared single photon detection system. The system consists of a pulse generator 201, a light source 202, a three-port optical fiber circulator 203, a transmission optical fiber 204, a three-port connected optical fiber coupler 205, a single photon detection system 206, a signal processing module 207 and a measured optical fiber 208.
The pulse generator 201 in the system generates a pulse signal, the pulse signal triggers the signal processing module 206 to start recording time on one hand, on the other hand, pulse light emitted by the light source 202 is incident to the port a of the three-port optical fiber circulator 203, the pulse light signal output from the port b of the three-port optical fiber circulator 203 is incident to the optical fiber 207 to be tested, the pulse light signal passes through the optical fiber 207 to be tested to obtain backward scattering light, the backward scattering light is input to the three-port optical fiber circulator 203, and the optical fiber circulator 203 outputs the backward scattering light to the optical splitter 204. The optical splitter 204 splits the backscattered light into 3 paths of optical signals with the same power, and outputs the optical signals to the single photon detection system 205, and the single photon detection system 205 converts the optical signals into standard transistor-transistor logic level (TTL) signals and outputs the TTL signals to the signal processing module 206. The signal processing module 206 performs statistical analysis on the time interval between the pulse signal generated by the pulse generator 201 and the TTL signal output by the single photon detection system 205, and then provides a measurement result after processing.
The noise of the single photon detection system needs to be reduced as much as possible because the noise (including the dark pulse and the post pulse) of the single photon detection system can make the output of the TTL signal independent of the optical signal, so that the OTDR system generates errors and limits the measurement range. In order to realize the noise reduction of the single photon detection system, the structure of the single photon detection system is shown in fig. 3, and the single photon detection system is composed of three near-infrared single photon detectors 301, 302 and 303 with the same structure and similar performance, avalanche event detection circuits 304, 305 and 306, and a three-port input logic and gate circuit 307. The back-reflected and scattered optical signals in the tested optical fiber of the reflectometer system are averagely incident into 3 near-infrared single-photon detectors in the single-photon detection system. Avalanche events are generated inside the near-infrared single photon detector, and include events caused by back-reflected and scattered optical signals in the optical fiber, avalanche events caused by internal dark pulses and post-pulses. These avalanche events are converted into TTL signals (pulse signals) by the avalanche event detection circuit, as shown in fig. 4. Because the occurrence time of avalanche events (light-related pulses) generated by incident light signals is the same, after passing through the logic AND gate circuit, TTL signal output can be generated at the output of the logic AND gate circuit; the occurrence times of avalanche events (dark pulse and back pulse) triggered by internal noise are random (possibly different), so after passing through the logic and circuit, the TTL signal output is not generated at the output of the logic and circuit, as shown in fig. 5. In this way, the output noise of a single photon detection system is greatly reduced. Theoretically, when the number of single photon avalanche diodes in a single photon detection system reaches a certain large number, the noise of the whole single photon detection system is reduced to approach 0.
In the OTDR system based on the single photon detection system, the performance of the whole OTDR system is greatly improved in the aspects of dynamic range, measurement precision, measurement speed and the like by the ultra-low noise single photon detection system. Compared with the traditional gating signal structure, the OTDR system based on the near-infrared single-photon detector can realize low-noise operation of low dark counting rate and low back pulse rate in the free operation state of the near-infrared single-photon detection system. The signal-to-noise ratio of the OTDR system based on the near-infrared single-photon detector is improved, and data distortion is reduced. In addition, the system does not need to perform segmented detection on the optical fiber, which greatly reduces the test time required by the system.
Claims (1)
1. An optical fiber time domain reflectometer based on an extremely low noise near-infrared single photon detection system is characterized in that the reflectometer consists of a pulse generator, a light source, a three-port optical fiber circulator, a light splitter, a near-infrared single photon detector array, an avalanche event detection circuit array, a logic AND gate circuit, a signal processing module and a measured optical fiber 9; the pulse generator in the system generates a pulse signal, and the pulse signal triggers the signal processing module to start recording time on one hand and enables the light source to emit pulse light on the other hand; the light source is connected with an a port of the three-port optical fiber circulator, pulse light is incident into the three-port optical fiber circulator, pulse light signals output from a b port of the three-port optical fiber circulator are incident into an optical fiber to be tested, the pulse light signals pass through the optical fiber to be tested to obtain backward scattering light, the backward scattering light is input into the three-port optical fiber circulator through the c port by the optical fiber circulator, the backward scattering light is divided into multiple paths of optical signals with the same power by the optical splitter and is output to each single photon detector in the near-infrared single photon detector array; the rear end of the near-infrared single-photon detector array is connected with an avalanche event detection circuit array; the avalanche event detection circuit array converts triggered avalanche events in the near-infrared single-photon detector array into standard transistor-transistor logic level (TTL) signals and outputs the signals to a logic AND gate circuit; the logic AND gate circuit performs logic operation on the TTL signal output by the avalanche event detection circuit array, and the result is output to the signal processing module; the signal processing module carries out statistical analysis on the time interval between the pulse signal generated by the pulse generator and the TTL signal output by the logic AND gate circuit, and a measurement result is given after the time interval is processed; the light source selects one of near infrared LED light source, laser diode light source and ASE light source; the number of output optical signals of the optical splitter is the same as that of detectors in the near-infrared single-photon avalanche diode array; the number of avalanche event detection circuits in the avalanche event detection circuit array is the same as that of avalanche diodes in the near-infrared single-photon detector array; the rear end of each single photon avalanche diode is connected with an avalanche event detection circuit, and the avalanche event detection circuit converts avalanche events triggered in the single photon avalanche diodes into TTL signals and outputs the TTL signals; the avalanche event detection circuit is a combination of a comparator or an inverter and a passive quenching circuit or an active quenching circuit; the avalanche event of the single photon avalanche diode is triggered by a backscattered light signal or under the influence of self defects, thermal effect or residual charge under the condition of no light; the avalanche event detection circuit converts all avalanche events into TTL signals to be output; the near-infrared single photon detector array is composed of a plurality of near-infrared single photon avalanche diodes with the same or similar structures and performances, the near-infrared single photon avalanche diodes are any one of the single photon avalanche diodes based on Germanium (Germanium), indium gallium arsenide (InGaAs) or indium gallium arsenide/indium phosphide (InGaAs/InP), and the number of the near-infrared single photon avalanche diodes in the array is selected according to the requirements on the performances and the noise of the detector; the number of input ports of the logic AND gate circuit is consistent with the number of single photon avalanche diodes in the near-infrared single photon detector array; the logic AND gate circuit receives a TTL signal which is output by the avalanche event detection circuit array and is triggered by an avalanche event in the near-infrared single-photon detector array; when all avalanche diodes in the near-infrared single-photon detector array trigger avalanche events, the logic AND gate circuit outputs a TTL signal pulse, and the signal processing module receives and processes the pulse; when an optical signal is incident to the near-infrared single-photon detector array, all the avalanche diodes are triggered, and the logic AND gate circuit outputs a photon counting pulse; when no optical signal is incident to the near-infrared single photon detector array, the avalanche diode in the array is influenced by the defects, the thermal effect or the residual charge of the avalanche diode to trigger an avalanche event, and a dark pulse or a rear pulse is generated; when the number of the near-infrared single-photon detectors in the array is large enough, the probability that all avalanche diodes of the near-infrared single-photon detector array are simultaneously triggered to produce noise-related pulses is close to 0, and at the moment, the signal logic AND gate does not output photon counting pulses.
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| CN108075828A (en) * | 2017-12-16 | 2018-05-25 | 国网湖北省电力有限公司信息通信公司 | A kind of OTDR devices based on multi-channel optical fibre optical monitoring signal |
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