CN109313302A - For handling the device and method of film - Google Patents
For handling the device and method of film Download PDFInfo
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- CN109313302A CN109313302A CN201780035351.8A CN201780035351A CN109313302A CN 109313302 A CN109313302 A CN 109313302A CN 201780035351 A CN201780035351 A CN 201780035351A CN 109313302 A CN109313302 A CN 109313302A
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- Prior art keywords
- film
- component
- state
- display
- handle
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C55/00—Shaping by stretching, e.g. drawing through a die; Apparatus therefor
- B29C55/02—Shaping by stretching, e.g. drawing through a die; Apparatus therefor of plates or sheets
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C55/00—Shaping by stretching, e.g. drawing through a die; Apparatus therefor
- B29C55/02—Shaping by stretching, e.g. drawing through a die; Apparatus therefor of plates or sheets
- B29C55/04—Shaping by stretching, e.g. drawing through a die; Apparatus therefor of plates or sheets uniaxial, e.g. oblique
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D11/00—Producing optical elements, e.g. lenses or prisms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D11/00—Producing optical elements, e.g. lenses or prisms
- B29D11/00634—Production of filters
- B29D11/00644—Production of filters polarizing
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J129/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Adhesives based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Adhesives based on derivatives of such polymers
- C09J129/02—Homopolymers or copolymers of unsaturated alcohols
- C09J129/04—Polyvinyl alcohol; Partially hydrolysed homopolymers or copolymers of esters of unsaturated alcohols with saturated carboxylic acids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
- G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
- G02B5/3041—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133528—Polarisers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
- G01N2021/177—Detector of the video camera type
Abstract
The present invention discloses a kind of device being related to for handling film.Include: that state measures component for handling the device of film, shoots the image of film;State determines component, and the location status of film is determined based on the image for the film for measuring component shooting by state;And status display component shows label corresponding with the location status of film based on the location status for determining film determined by component as state on film.
Description
Technical field
Each embodiment be related to it is a kind of for handle film device and it is a kind of handle film method.More specifically,
Each embodiment is related to a kind of device for handling film, measures and shows the state of film and permit a determination that film
State.
Background technique
Optical thin film is generally referred to for manufacturing such as liquid crystal display (Liquid Crystal Display, LCD) etc.
The film of display device, and the example of optical thin film may include polarizing film, diffusion film, reflective film, prismatic film etc..
A kind of polarizing film as optical thin film is the light for having a certain wavelength to liquid crystal display device transmission
Optical element.
In general polarizing film, polarizer protective film is (for example, triacetyl cellulose (TriAcetyl
Cellulose, TAC) film) to be stacked in may include one of polarizer of polyvinyl alcohol (PolyVinyl Alcohol, PVA)
On surface or two surfaces, and polarizer can have adhesive layer, release film, surface protective film, functional coating wherein
Etc. the multilayer architecture being stacked on polarizer protective film.
Such multiple field polarizing film is generally fabricated to piece shape and is wound on roller, and can cut and use single depending on the application
Only sheet of polarizing film.
In the general processing procedure of manufacture polarizing film, PVA film is dyed with iodine or pigment, then to PVA film
Boric acid is added, iodine or pigment are attached to PVA film, and stretched PVA film.
The dyeing, connection and stretching processing procedure can be executed separately or concurrently, and the order of these processing procedures is changeable.
It is after completing the dyeing, connection and stretching processing procedure, prepared polarizer is dry, and will be such as TAC
The surface or two surfaces that polarizer protective film is adhered to dried polarizer are to prepare polarizer.
In general optical thin film, show the state of optical thin film label can be deleted during manufacturing optical thin film or
Change, and user possibly can not identify the state of optical thin film or possibly can not clearly correspond to the position of the defect of label.
Therefore, it can be necessary to review to filminess, this is extremely inconvenient.
Furthermore, it is possible to be not easy the state according to film and clearly specify the presence in the defects of finished product or semi-finished product,
And the processing procedure of manufacture film is controlled to prevent defect under conditions of harsh, this can reduce the efficiency of thin film fabrication processing procedure
And increase the cost of film.
(on 2 3rd, 2016 are published in, denomination of invention: optical thin film at Korean patent disclosure the 2016-12441st
Preparation method, the optical component prepared by the same procedure and optical thin film and polarizer and liquid crystal display comprising it
Device) in disclose the prior art.
Summary of the invention
Technological challenge
Each embodiment relate to it is a kind of for handle film device and it is a kind of handle film method, measure,
Determine and show the state of the film.
Technical solution
The embodiment can by provide it is a kind of for handling the device of film and reach, described device includes: quantity of state
Component is surveyed, the image of film is shot;State determines component, thin to determine based on the image for the film for measuring component shooting by state
The location status of film;And status display component, based on the location status for determining film determined by component as state, according to thin
The location status of film marks to show.
State measures component can include: light irradiates component, to film irradiation light;And image taking component, reception are shone
It is incident upon the light of film and shoots the image of film.
Light irradiation component can irradiate the linear light parallel with the width direction of film.
It may include that multiple states measure component, and state measurement component can be along the longitudinal direction of film for handling the device of film
Direction alignment.
State measures component can include: first state measures component, measures in component in first state, the first light irradiates structure
Part is set on the first side of film and the first image taking component is set in second side of film;And second state measure
Component measures in component in the second state, and the second light irradiation component is set in second side of film and the second image taking structure
Part is set on the first side of film.
Status display component can show label according to the location status of film on the corresponding position of film.
Status display component may include display member, and display member shows the shape of film and to film jet ink
State.
It may include multiple display members for handling the device of the film, and display member can be along the width of the film
Direction alignment.
Display member can show the state of film by spraying multiple ink-jet points.
Status display component can further include: display supporting member supports display member;And display transfer component, connection
To display supporting member and shift display supporting member.
Show transfer component can include: lifting transfer component, be connected to display supporting member and to display supporting member into
Row lifting;And rotation transfer component, display supporting member is rotated.
State determines that component can be based on gray scale (gray) value for the location drawing picture for measuring the film that component is measured by state
Whether the location status of film is determined within the scope of reference gray level value.
State determines that component can determine the location status of film: the wherein gray scale of film based at least one of following
The area size of defect area of the value beyond reference gray level value range;The non-round angle value of defect area;The width of defect area;Or
The length of defect area.
Embodiment can be reached by a kind of method for handling film, which comprises by the image for shooting film
To measure the state of film;By the image of the film measured in the measurement based on the state in film to the position shape of film
State is classified to determine the state of film;And the position by identified film in the determination based on the state in film
State and show the label of the location status of film to show the state of film.
The state for measuring film may include measuring component shooting film by multiple states of the longitudinal direction alignment along film
Image.
The state for determining film may include being based on gray scale (gray) value by the location drawing picture for measuring measured film
The no location status that film is determined within the scope of reference gray level value.
The state for determining film may include the location status that film is determined based at least one of following: wherein film
Gray value beyond reference gray level value range defect area area size;The non-round angle value of defect area;Defect area
Width;Or the length of defect area.
The state of display film may include the location status according to film and show label on the corresponding position of film.
Effect of the invention
The location status of film is measured for the device for handling film and the method for handling film, and according to the institute of film
The state of measurement shows label on the correspondence place of film, this makes it possible to easily detect the state of film.
Detailed description of the invention
Fig. 1 illustrates the perspective view of the device according to the embodiment for being used to handle film;
Fig. 2 illustrates the front view of the device according to the embodiment for being used to handle film;
Fig. 3 illustrates the plan view of the device according to the embodiment for being used to handle film;
Fig. 4 illustrates that the image to the film measured in the device for being used to handle film according to embodiment is handled
Processing procedure;
Fig. 5 illustrates that the region of the defect area of the film measured in the device for being used to handle film according to embodiment is big
It is small;
Fig. 6 illustrates the non-round angle value of the film measured in the device for being used to handle film according to embodiment;
Fig. 7 illustrates the directionality of the defect area measured in the device for being used to handle film according to embodiment;
Fig. 8 illustrates the breadth length ratio of the defect area measured in the device for being used to handle film according to embodiment:
Fig. 9 illustrates label according to the embodiment;
Figure 10 illustrates a kind of method of processing film according to the embodiment.
Specific embodiment
Hereinafter, exemplary embodiment is being illustrated more fully below with reference to the accompanying drawings.In the accompanying drawings, clear to illustrate
For the sake of, the size in each area Ceng Ji can be exaggerated.
Various terms are defined throughout this manual, and except the spy provided in particular situations being such as set forth below
Other than in the context for describing or using calmly, the meaning of any specific term will also manage in the context of entire file herein
Solution.
Fig. 1 illustrates the perspective view of the device according to the embodiment for being used to handle film.Fig. 2 illustrates according to the embodiment be used to
Handle the front view of the device of film.Fig. 3 illustrates the plan view of the device according to the embodiment for being used to handle film.
In embodiments, referring to figs. 1 to Fig. 3, according to the embodiment to be used to handle the device (1) of film may include state
Measure component (100), state determines component (200) and status display component (300).It can for handling the device (1) of film
It measures and determines the state of film (10), and can show mark on the corresponding position of film (10) according to the state of film (10)
Remember (70).
In embodiments, film (10) can be for for manufacturing such as liquid crystal display (liquid crystal
Display, LCD) etc. display devices optical thin film.The example of film (10) may include polarizing film, diffusion film, reflection it is thin
Film or prismatic film etc..
For example, before being pasted to liquid crystal display panel, film (10) can be the polarisation for liquid crystal display
Film.In the present embodiment, state measures component (100) and state determines that component (200) respectively can measure and determine film
(10) location status, and status display component (300) can show the label (70) for the state for showing film (10).Therefore, may be used
It is examined easily before film (10) is pasted to display panel or even after film (10) is pasted to display panel
Measure the state of film (10).
In embodiments, when film (10) is transferred to a direction by the transferring roller (31) of film transfer component (30)
When, component (100) can be measured by state and film (10) is measured, or when film (10) are in film transfer component (30)
When stopping place on transferring roller (31), component (100) can be measured by state and film (10) is measured.
When being measured by state measurement component (100) to the state of film (10), the mobility of film (10) can root
Number or the specification of component (100) etc. is measured according to the type of film (10), state and is changed.
State measures component (100) can obtain the image of film (10) after the image of shooting film (10).Implementing
In mode, it may include light irradiation component (110) and image taking component (130) that state, which measures component (100),.Illumination is incident upon thin
Film (10), and the image from the light of film (10) transmission or reflection is shot to obtain the analogy image of film (10).
Illumination can be incident upon film (10) by light irradiation component (110).In embodiments, light irradiation component (110) can shine
The linear light parallel with the width direction of film (10) (in Fig. 3, in left-right direction) is penetrated, and image taking component can be made
(130) light received from film (10) transmission or reflection is to obtain the images of film (10).
Image taking component (130) can receive from light irradiation component (110) and expose to the light of film (10), and can shoot thin
The analogy image of film (10).For example, image taking component (130) can be camera.
For example, image taking component (130) can be to shoot when film (10) are in and stop place or slowly movement
The area camera (area camera) of the image of one region (area) of film (10).For example, image taking component
It (130) can be the line camera (line camera) of the image of linear light of the shooting from highly mobile film (10).Photograph
The type of machine can change according to the mobility of film (10), from type of light of light irradiation component (110) irradiation etc..
In embodiments, it may include multiple states measure component (100), and state measurement component (100) can be along film
(10) longitudinal direction (in Fig. 3, along the vertical direction) alignment.State measurement component (100) can obtain thin at multiple places
The multiple images of film (10), with improve the accuracy of image and prevent for shoot film (10) image and stop film transfer or
Reduce film transfer velocity.In embodiments, state measure component (100) may include first state measure component (150) and
Second state measures component (170), and the state of film (10) can be measured repeatedly.
It is measured in component (150) in first state, the first light irradiation component (111) may be disposed at the first side of film (10)
Upper (in Fig. 2, being set on upside), and the first image taking component (131) may be disposed in second side of film (10) (
It in Fig. 2, is set on downside).First state, which measures component (150), to irradiate and transmit excessively thin from from the first side of film (10)
The light of film (10) and the image for obtaining film (10).
It is measured in component (170) in the second state, the second light irradiation component (113) may be disposed at second side of film (10)
Upper (in Fig. 2, being set on downside), and the second image taking component (133) may be disposed on the first side of film (10) (
It in Fig. 2, is set on upside).Second state, which measures component (170), to irradiate and transmit excessively thin from second side from film (10)
The light of film (10) and the image for obtaining film (10).
By adjusting transmitted through the direction of the light of film (10), the position of image for obtaining film (10) etc., can get thin
The multiple images of film (10), and image obtained can be transferred to state and determine component (200).State determines component (200)
The state of film (10) can be determined based on multiple images data, and can classify to the data.
Other than adjustment light irradiation component (110) and image taking component (130) (position relative to film (10)),
It also can be by adjusting the light (angle of the longitudinal direction relative to film (10) for exposing to film (10) from light irradiation component (110)
Degree), the inclined degree (longitudinal direction or width direction relative to film (10)) of image taking component (130) etc. and obtain more
A image.
It can be according to the type of film (10), thin by the method that image taking component (130) obtain the image of film (10)
Mobility of film (10) etc. and change, and except first state measures in addition to component (150) and the second state measure component (170),
Also the third state can be added and measure component, the 4th state measurement component etc..
For example, it may include third light irradiation component (115) and third image taking that the third state, which measures component (190),
Component (135).Third light irradiation component (115) can irradiate the light of the longitudinal direction tilt angle (θ) relative to film (10), and
Third image taking component (135) can shoot from third light irradiation component (115) light image, with obtain with the first shape
State measures the image of film (10) that component and the second state measure component (150,170) different angle and shoot.
State determines that component (200) is determined using the image for the film (10) for measuring component (100) shooting from state
The location status of film (10).
Fig. 4 illustrates that the image to the film measured in the device for being used to handle film according to embodiment is handled
Processing procedure.Fig. 5 illustrates the area size of the defect area of the film measured in the device for being used to handle film according to embodiment.
In embodiments, referring to Fig. 4 and Fig. 5, state determines that component (200) can be based on measuring component by state
(100) whether the gray value of the location drawing picture of the film (10) measured is in thin to determine within the scope of reference gray level (gray) value
The location status of film (10).The identified state history of film (10) can be stored in storage member, or may be output to defeated
Component (90) out.
Referring to Fig. 4, state determines that component (200) can will measure the 8 bit analogy images that component (100) is measured from state
Multiple regions are divided into, and gray scale (gray) the value numerical digit in each region can be turned to the number between 0 and 255.State
Determine whether component (200) can be within the scope of reference gray level value the defect for determining each region based on the grayscale through digitisation
Presence.Reference gray level value range can be predefined based on historical record is measured, or may be configured as measuring component from state
(100) average value measured.
When some region of gray value exceeds predetermined reference gray level value range, the region can be considered as defect
Region.It can be based on the area size of defect area (S), length of the width of defect area (S), defect area (S) etc. and to thin
The state of film (10) is classified.
It, can be based on the width (w) and length (l) for being considered as detected region (area) and by defect area referring to Fig. 5
(S) area size is defined as area size=(w+l)/2.
Fig. 6 illustrates the non-round angle value of the film measured in the device for being used to handle film according to embodiment.Fig. 7 explanation
The directionality of the defect area measured in the device for being used to handle film according to embodiment.Fig. 8 illustrates according to embodiment
The breadth length ratio as directionality of the defect area measured in device for handling film.
The out-of-roundness of defect area (S) can also be passed through in addition to the area size of defect area (S) referring to Fig. 6 to Fig. 8
Value and classify to the location status of film (10).For example, for the low non-round angle value of defect area (S), such as zero (0),
Defect area (S) can be considered as existing defects due to scratch.
In addition, the breadth length ratio (referring to Fig. 8) and gray scale of the slope (referring to Fig. 7) of defect area (S), defect area (S)
Value difference can also be considered as the reference of classification film (10), to determine the location status of film (10).
In embodiments, status display component (300) can determine film determined by component (200) according to as state
(10) location status shows label (70) on the corresponding position of film (10).
Status display component (300) according to the location status of film (10) by showing and the location status pair of film (10)
The label (70) answered, user can detect the location status of film (10) easily.
In embodiments, status display component (300) may include display member (310).Display member (310) can pass through
The location status of film (10) is shown to film (10) jet ink.For example, display member (310) can be along film (10)
Width direction alignment.Therefore, can pass through in the case where not shifting display member (310) along the width direction of film (10)
Display member (310) corresponding position operation and label (70) are shown on corresponding position.
(70) can be marked according to the state of film (10) and with different length, region, size etc. to show, so that operation
Person can identify the state of film (10) after forming label (70).
In embodiments, label (70) can be formed by spraying multiple ink-jet points (71), and the number of ink-jet point (71)
Mesh, spacing, arrangement etc. can change according to the state in region.
For example, ink-jet point (71) can be formed 0.3 millimeter to 5.0 millimeters of size, and ink-jet point (71) is most
Small spacing can be 0.3 millimeter to 5.0 millimeters, so that user can with the naked eye identify ink-jet point (71).
Size, the spacing etc. of ink-jet point (71) can change according to following: the size of film (10);Identification label (70)
User or the resolution for marking detection means (400);The number of display member (310);The size etc. of display member (310).
Ink-jet point (71) can be shown in the film such as the carrier thin film of optical thin film or protective film and film (10)
On, manufacture that the film can be removed after manufacturing device without countermeasure set.
In embodiments, label (70) can be shown by the ink-jet point (71) for being formed multiple rows.When label (70) quilt
When being formed as 2 row ink-jet points (71), the first row can display defect type and the second row can display defect region (S) region
Size.
For example, a point (71) being shown in the first row can be shown that defect and is shown in as caused by scratch
Two points (71) in the first row can be shown that defect is as caused by piercing through.
The number for the point (71) being shown on the second row can be shown that the area size of defect area (S).Defect area (S)
Area size is shown and can showing more points (71) on second row when the area size in defect area (S) is big.
Not isolabeling (70) in different conditions can also be shown with the various alignment thereofs or spacing of multiple points (71).
In embodiments, status display component (300) can further include display supporting member (330) and display transfer component
(350).Display supporting member (330) can be connected to display member (310) and can support display member (310).Display support structure
Part (330) can be formed along the width direction of film (10), and can support multiple display members (310).
Display transfer component (350) can be connected to display supporting member (330), and transferable display supporting member (330).
Display transfer component (350) can be changed display member (310) and be shown in the position of the label (70) on film (10), or can turn
Display member (310) are moved for repairing or controlling display member (310).In embodiments, display transfer component (350) can wrap
Include lifting transfer component (351) and rotation transfer component (353).
Lifting transfer component (351) can be connected to the end of display supporting member (330), and can be to display supporting member
(330) it is gone up and down.For example, lifting transfer component (351) can be using hydraulic cylinder or rack and pinion gearing come to aobvious
Show that supporting member (330) is gone up and down, but the other methods in lifting technology territory also can be used.
Rotate transfer component (353) rotatable display supporting member (330).For example, it rotates transfer component (353)
Rotary shaft can be connected to display supporting member (330), and rotating transfer component (353) may include the device for generating rotary driving force
(for example, motor) shows the position of label (70) with rotational display supporting member (330) and caning be controlled on film (10).
In embodiments, the device (1) for handling film can further include label detection means (400).Label detection
Component (400) can read label (70) according to the location status of film (10) being shown on status display component (300), and
Can determine future of film (10) with or without the use of.
For example, label detection means (400) it is detectable by barcode machine (50) be shown in bar code on film (10) and
The label (70) of film (10), and based on label (70), label detection means (400) can determine whether the film (10) corresponding to bar code
It is the defective defect film of tool, the normal film without defect or the defective normal film of tool.
Labeled detection means (400) be determined as having defective film (10) can after passing through panel and attaching place with
Illusory film is rejected together with carrier thin film when being wound.
Labeled detection means (400), which are determined as normal film (10), can be pasted to panel, and can be manufactured into for example
The display devices such as liquid crystal display.
Figure 10 illustrates a kind of method of processing film according to the embodiment.0 it will illustrate processing according to the embodiment referring to Fig.1
The method (S1) of film.
In embodiments, the method (S1) of film is handled can include: measure the state (S100) of film, determine film
State (S200) and the state (S300) for showing film.
In the state (S100) for measuring film, state, which measures component (100), can shoot image and the acquisition of film (10)
The image of film (10).When measuring state (S100) of film, along multiple quantity of states of the longitudinal direction alignment of film (10)
The image of film (10) can be shot by surveying component (100), and can obtain the image of film (10) in multiple places in many ways.
It, can be based on the image pair measured in the state (S100) for measuring film in the state (S200) for determining film
The location status of film (10) is classified.In state (S200) for determining film, the location status of film (10) can be based on
Whether the gray value by measuring the location drawing picture for the film (10) that (S100) is measured, which is within the scope of reference gray level value, determines.
It, can be based on the identified film in the state (S200) for determining film in the state (S300) of display film
(10) location status and in the label (70) for showing the location status according to film (10) on film (10).In display film
When state (S300), it can be shown on the corresponding position of film (10) according to the label (70) of the location status of film (10) with aobvious
Show the state of film (10).
The method (S1) of processing film can further include detection label (S400).In detection label (S400), can have certainly
The film (10) of label (70) detects label (70) and may recognize that the state of film (10), this permits a determination that film
(10) future with or without the use of.
In the device (1) according to the embodiment for being used to handle film and the method (S1) for handling film, it can measure thin
The location status of film (10), and the label (70) according to the state measured can be shown on corresponding position.It therefore, can be easily
Detect the state of film (10).
Be disclosed herein various exemplary embodiments, and although using specific term, these terms be only used for and
It is interpreted ordinary meaning and illustrative meaning, and not to limit purpose.In some cases, unless in addition clearly referring to
It is bright, otherwise as in technique there is technical staff to understand before present application is filed an application, in conjunction with a specific embodiment
Feature, characteristic, and/or the element illustrated can be used alone or with the feature in conjunction with described in other embodiments, characteristic, and/or
Element is applied in combination.Therefore, it will be understood by those skilled in the art that without departing substantially from essence of the invention as described in claims which follow
Under conditions of mind and range, the variation in various forms and details can be made.
(explanation of symbol)
1: the device for handling film
10: film
30: film transfer component
31: transferring roller
50: barcode machine
70: label
71: point/ink-jet point
90: output link
100: state measures component
110: light irradiates component
111: the first light irradiate component
113: the second light irradiate component
115: third light irradiates component
130: image taking component
131: the first image taking components
133: the second image taking components
135: third image taking component
150: first state measures component
170: the second states measure component
190: the third state measures component
200: state determines component
300: status display component
310: display member
330: display supporting member
350: display transfer component
351: lifting transfer component
353: rotation transfer component
400: label detection means
S: defect area
Claims (18)
1. a kind of device for handling film, comprising:
State measures component, shoots the image of the film;
State determines component, determines the film based on the described image for the film for measuring component shooting by the state
Location status;And
Status display component, based on the location status for determining the film determined by component as the state, according to institute
The location status of film is stated to show label.
2. the apparatus according to claim 1, wherein quantity of state survey component includes:
Light irradiates component, to the film irradiation light;And
Image taking component receives the image for being irradiated to the light of the film and shooting the film.
3. being used to handle the device of film according to claim 2, wherein component irradiation and the film are penetrated in the illumination
The parallel linear light of width direction.
4. be used to handle the device of film according to claim 2, wherein described, to be used to handle the device of film include multiple
The state measures component, and the state measures component and is aligned along the longitudinal direction of the film.
5. being used to handle the device of film according to claim 4, wherein quantity of state survey component includes:
First state measures component, measures in component in the first state, and the first light irradiation component is set to the film
On first side and the first image taking component is set in second side of the film;And
Second state measures component, measures in component in second state, and the second light irradiation component is set to the film
In described second side and the second image taking component is set on first side of the film.
6. being used to handle the device of film according to claim 1, wherein the status display component is according to the film
The location status and label is shown on the corresponding position of the film.
7. according to claim 1 to the device for being used to handle film described in any one of 6, wherein the status display component includes
Display member, the display member show the state of the film and to the film jet ink.
8. being used to handle the device of film according to claim 7, wherein the device for being used to handle the film includes
Multiple display members, and the display member is aligned along the width direction of the film.
9. being used to handle the device of film according to claim 7, wherein the display member is by spraying multiple ink-jet points
And show the state of the film.
10. being used to handle the device of film according to claim 7, wherein the status display component further include:
It shows supporting member, supports the display member;And
It shows transfer component, is connected to the display supporting member and shifts the display supporting member.
11. being used to handle the device of film according to claim 10, wherein the display transfer component includes:
Transfer component is gone up and down, the display supporting member is connected to and the display supporting member is gone up and down;And
Transfer component is rotated, the display supporting member is rotated.
12. according to claim 1 to the device for being used to handle film described in any one of 6, wherein the state determines component base
Reference gray level value range whether is in the gray value for the location drawing picture for measuring the film that component is measured by the state
Inside determine the location status of the film.
13. be used to handle the device of film according to claim 12, wherein the state determines component based in following
At least one described location status to determine the film: wherein the gray value of the film exceeds the reference gray level
It is worth the area size of the defect area of range;The non-round angle value of the defect area;The width of the defect area;Or it is described scarce
Fall into the length in region.
14. a kind of method for handling film, comprising:
The state of the film is measured by shooting the image of the film;
By the described image of the film measured in the measurement based on the state in the film to described
The location status of film is classified to be determined the state of the film;And
And the location status of the film identified in the determination based on the state in the film
Show the label of the location status of the film to show to the state of the film.
15. 4 method for being used to handle film according to claim 1, wherein the measurement of the state of the film
The image of the film is shot including measuring component by multiple states of the longitudinal direction alignment along the film.
16. 4 method for being used to handle film according to claim 1, wherein the determination of the state of the film
Whether it is within the scope of reference gray level value including the gray value based on the location drawing picture by the film measured
To determine the location status of the film.
17. 6 method for being used to handle film according to claim 1, wherein the determination of the state of the film
The location status including determining the film based at least one of following: the wherein gray value of the film
The area size of defect area beyond the reference gray level value range;The non-round angle value of the defect area;The defect area
The width in domain;Or the length of the defect area.
18. the method for being used to handle film described in any one of 4 to 17 according to claim 1, wherein the shape of the film
The display of state includes the location status according to the film and shows the mark on the corresponding position of the film
Note.
Applications Claiming Priority (3)
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KR1020160071344A KR101955757B1 (en) | 2016-06-08 | 2016-06-08 | Apparatus and method for processing film |
KR10-2016-0071344 | 2016-06-08 | ||
PCT/KR2017/005004 WO2017213356A1 (en) | 2016-06-08 | 2017-05-15 | Apparatus and method for processing film |
Publications (1)
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CN109313302A true CN109313302A (en) | 2019-02-05 |
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CN201780035351.8A Pending CN109313302A (en) | 2016-06-08 | 2017-05-15 | For handling the device and method of film |
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KR (1) | KR101955757B1 (en) |
CN (1) | CN109313302A (en) |
TW (1) | TWI693150B (en) |
WO (1) | WO2017213356A1 (en) |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116985444A (en) * | 2023-07-05 | 2023-11-03 | 广东汇发塑业科技有限公司 | Traction method for improving transmittance in degradation process of biodegradable film |
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---|---|---|---|---|
KR102601715B1 (en) * | 2023-07-26 | 2023-11-13 | 주식회사 엔비컨스 | Apparatus for measuring the wrinkle on film |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005274383A (en) * | 2004-03-25 | 2005-10-06 | Sumitomo Chemical Co Ltd | Inspection method for hole defect of oriented film |
CN1873398A (en) * | 2005-06-01 | 2006-12-06 | 住友化学株式会社 | Method for manufacture cascade optics thin film |
CN1879005A (en) * | 2003-11-20 | 2006-12-13 | Hoya株式会社 | Method of inspecting unevenness defect of pattern and device therefor |
CN101360990A (en) * | 2006-01-11 | 2009-02-04 | 日东电工株式会社 | Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device |
CN101358934A (en) * | 2007-07-31 | 2009-02-04 | 夏普株式会社 | Inspection device, inspection method, inspection system and method of manufacturing color filter |
CN101981438A (en) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | Method of inspecting polarizing film |
CN101980797A (en) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | System and method for sorting polarization film |
JP2011226957A (en) * | 2010-04-21 | 2011-11-10 | Sanritz Corp | Defect inspection method and defect inspection device of polarizing plate |
KR20130043550A (en) * | 2011-10-20 | 2013-04-30 | 주식회사 엘지화학 | Apparatus for inspecting faulty of optical film |
CN103399018A (en) * | 2011-08-18 | 2013-11-20 | 三星康宁精密素材株式会社 | Apparatus and method for detecting surface defect of glass substrate |
CN103913860A (en) * | 2012-12-31 | 2014-07-09 | 东友精细化工有限公司 | Determinator on production line |
CN105372257A (en) * | 2014-08-19 | 2016-03-02 | 东友精细化工有限公司 | Optical membrane inspecting device |
CN105527298A (en) * | 2014-10-16 | 2016-04-27 | 东友精细化工有限公司 | System and method for inspection of sheet-shaped product and polarizing plate for use in such inspection |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3483153B2 (en) * | 1992-09-10 | 2004-01-06 | コニカミノルタホールディングス株式会社 | Method for producing photosensitive film magazine and method for producing photosensitive film magazine package |
JP4950374B2 (en) * | 2000-06-23 | 2012-06-13 | 株式会社小森コーポレーション | Sheet-like object identification method and identification apparatus |
KR100701598B1 (en) * | 2005-03-30 | 2007-03-29 | 충청북도 | A defect detection device of thin film |
KR20090054137A (en) * | 2007-11-26 | 2009-05-29 | 한국표준과학연구원 | Inspection system for tracing defects of optical film using contact image sensor(cis) module |
JP2012154679A (en) * | 2011-01-24 | 2012-08-16 | Jx Nikko Nisseki Ekisho Firm Co Ltd | Defect marking device |
KR20120110666A (en) * | 2011-03-30 | 2012-10-10 | 엘지디스플레이 주식회사 | Apparatus and method for manufacturing display device of in-line type |
KR20140088789A (en) * | 2013-01-03 | 2014-07-11 | 동우 화인켐 주식회사 | Inspection device for optical film |
JP2015108663A (en) * | 2013-12-03 | 2015-06-11 | 住友化学株式会社 | Apparatus for manufacturing optical member laminate |
KR20150086633A (en) * | 2014-01-20 | 2015-07-29 | 동우 화인켐 주식회사 | Apparatus of inspecting optical film and method of inspecting the same |
CN204128496U (en) * | 2014-08-07 | 2015-01-28 | 日东电工株式会社 | Blooming bonding position determinator and optical display production line |
-
2016
- 2016-06-08 KR KR1020160071344A patent/KR101955757B1/en active IP Right Grant
-
2017
- 2017-05-15 CN CN201780035351.8A patent/CN109313302A/en active Pending
- 2017-05-15 WO PCT/KR2017/005004 patent/WO2017213356A1/en active Application Filing
- 2017-06-07 TW TW106118819A patent/TWI693150B/en active
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1879005A (en) * | 2003-11-20 | 2006-12-13 | Hoya株式会社 | Method of inspecting unevenness defect of pattern and device therefor |
JP2005274383A (en) * | 2004-03-25 | 2005-10-06 | Sumitomo Chemical Co Ltd | Inspection method for hole defect of oriented film |
CN1873398A (en) * | 2005-06-01 | 2006-12-06 | 住友化学株式会社 | Method for manufacture cascade optics thin film |
CN101360990A (en) * | 2006-01-11 | 2009-02-04 | 日东电工株式会社 | Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device |
CN101358934A (en) * | 2007-07-31 | 2009-02-04 | 夏普株式会社 | Inspection device, inspection method, inspection system and method of manufacturing color filter |
CN101980797A (en) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | System and method for sorting polarization film |
CN101981438A (en) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | Method of inspecting polarizing film |
JP2011226957A (en) * | 2010-04-21 | 2011-11-10 | Sanritz Corp | Defect inspection method and defect inspection device of polarizing plate |
CN103399018A (en) * | 2011-08-18 | 2013-11-20 | 三星康宁精密素材株式会社 | Apparatus and method for detecting surface defect of glass substrate |
KR20130043550A (en) * | 2011-10-20 | 2013-04-30 | 주식회사 엘지화학 | Apparatus for inspecting faulty of optical film |
CN103913860A (en) * | 2012-12-31 | 2014-07-09 | 东友精细化工有限公司 | Determinator on production line |
CN105372257A (en) * | 2014-08-19 | 2016-03-02 | 东友精细化工有限公司 | Optical membrane inspecting device |
CN105527298A (en) * | 2014-10-16 | 2016-04-27 | 东友精细化工有限公司 | System and method for inspection of sheet-shaped product and polarizing plate for use in such inspection |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116985444A (en) * | 2023-07-05 | 2023-11-03 | 广东汇发塑业科技有限公司 | Traction method for improving transmittance in degradation process of biodegradable film |
CN116985444B (en) * | 2023-07-05 | 2024-04-02 | 广东汇发塑业科技有限公司 | Traction method for improving transmittance in degradation process of biodegradable film |
Also Published As
Publication number | Publication date |
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KR20170138898A (en) | 2017-12-18 |
TW201808597A (en) | 2018-03-16 |
WO2017213356A1 (en) | 2017-12-14 |
KR101955757B1 (en) | 2019-03-07 |
TWI693150B (en) | 2020-05-11 |
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