CN109256072A - The lighting test system of display device - Google Patents
The lighting test system of display device Download PDFInfo
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- CN109256072A CN109256072A CN201811094515.7A CN201811094515A CN109256072A CN 109256072 A CN109256072 A CN 109256072A CN 201811094515 A CN201811094515 A CN 201811094515A CN 109256072 A CN109256072 A CN 109256072A
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- clock
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- Engineering & Computer Science (AREA)
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- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Controls And Circuits For Display Device (AREA)
Abstract
This application discloses a kind of lighting test systems of display device, comprising: micro-control module, clock module, processing module and bridge joint conversion module；Wherein, the clock module includes clock judgement unit, the first clock unit and second clock unit, the clock judgement unit includes preset value, when the frequency of the pixel clock signal is more than the preset value, the clock judgement unit configures first clock unit and generates the first clock signal, and the second clock unit generates pixel clock signal according to first clock signal.Pass through the combination of clock judgement unit and the first clock unit and second clock unit in the clock module, so that display device lighting test system more originally has broader applicable frequency range, display device can not normally light completion test when solving the problem of the frequency of clock signal needed for lighting beyond original clock module extreme value.
Description
Technical field
The present invention relates to display device technology field, in particular to the lighting test system of a kind of liquid crystal display device.
Background technique
Liquid crystal display device (Liquid Crystal Display, abbreviation LCD) has low-power consumption, frivolous, Low emissivity etc.
Plurality of advantages, therefore now substantially instead of traditional cathode-ray tube (CRT) display.Liquid crystal display device quilt at present
It is widely used in the electricity such as digital TV in high resolution, desktop computer, laptop, tablet computer, mobile phone, digital camera
In sub- equipment.
Liquid crystal display device must all pass through lighting test before by factory.So-called lighting test is referred to liquid crystal
The clock signal of display device and gray scale voltage, the data-signal input liquid crystal display device of red, green, blue pixel, to check
Whether liquid crystal display device can normally work.Fig. 1 is the lighting test system schematic of the display device of the prior art,
It mainly include micro-control module 110, clock module 120, processing module 130, bridge joint conversion module 140 and display device 150.
Micro-control module 110 is, for example, ARM (Acorn RISC Machine) processor, for providing pattern information according to test request
And parameter information, and pattern information and parameter information are sent to processing module 130, while configurable clock generator module 120.When
Clock module 120 uses cdce706 chip, and cdce706 chip can produce the clock signal of certain frequency.Processing module 130
For example field programmable gate array (Field-Programmable Gate Array, FPGA).Processing module 130 will receive
Signal conversion after be sent to bridge joint conversion module 140.The signal received is converted into display dress by bridge joint conversion module 140
Set 150 identifiable mobile industry processor interface (Mobile Industry Processor Interface, MIPI) signals
Or embedded display port (Embedded Display Port, EDP) signal, and it is sent to display device 150, with complete
Bridge chip (Bridge IC) can be used in the lighting test of pairs of display device 150, bridge joint conversion module 140 here.
However, the lighting test system 100 of the display device of the prior art lights required clock letter in display device 150
When number frequency is more than the upper frequency limit of cdce706 chip, will generate can not light display device 150 or display device 150 is in
The phenomenon of existing picture exception can not carry out display device 150 effectively to detect operation.Traditional solution is by clock mould
The chip of block 120 is changed to the advanced chip with the higher frequency upper limit or is changed to the FPGA in processing module 130 more
High level fpga chip, such solution not only will cause a large amount of of cost and go up and the wastes of hardware resource, while by
Voluntarily generating clock signal in processing module 130 cannot achieve dynamic regulation, and the program is made to be only capable of showing specific standard parameter
Showing device is tested, and application range is relatively narrow, poor compatibility.
Summary of the invention
In view of this, the present invention provides a kind of lighting test system of display device, to solve clock needed for display device
The problem of signal frequency is excessively high, and test macro can not normally complete test controls cost of testing system, avoids the wave of hardware resource
Take, realizes the dynamic regulation of clock signal at high frequencies.
The present invention provides a kind of lighting test system of display device characterized by comprising
Micro-control module, parameter information needed for providing display device according to test request；
Clock module generates pixel clock signal according to the parameter information；
Processing module generates point screen signal and synchronization signal according to the parameter information and pixel clock signal；
Conversion module is bridged, for format needed for the point screen signal is converted into display device；
Wherein, the frequency of pixel clock signal needed for the parameter information includes at least display device, the clock mould
Block includes clock judgement unit, the first clock unit and second clock unit, and the clock judgement unit includes preset value, described
Preset value is the upper frequency limit value for the clock signal that first clock unit can generate, when the required pixel clock letter
Number frequency when being more than the preset value, the clock judgement unit configures first clock unit and generates the first clock letter
Number, the frequency of first clock signal and the frequency of the pixel clock signal are at preset ratio, the second clock unit
The pixel clock signal is generated according to first clock signal.
Preferably, the second clock unit is bi-directionally connected with the processing module, and setting according to the processing module
It sets, corresponding process of frequency multiplication is carried out to first clock signal, obtains the pixel clock signal.
Preferably, when the frequency of required pixel clock signal is less than or equal to the preset value, the first clock list
The first clock signal that member generates can meet the frequency requirement of required pixel clock signal, when the first clock signal is as pixel
Clock signal passes through the second clock unit and is transmitted to the processing module.
Preferably, the clock judgement unit configures first clock unit by I2C bus.
Preferably, the preset ratio isWherein n is the integer more than or equal to 1.
Preferably, first clock unit includes clock chip, and the second clock unit includes that clock signal generates
Circuit.
Preferably, the lighting test system further includes power monitoring module, the power monitoring module and the micro-control
Molding block is connected, for monitoring the power of the display device while carrying out lighting test.
Preferably, the micro-control module includes ARM microprocessor, and the processing module is field programmable gate array.
Preferably, the lighting test system further includes cue module, the cue module and the micro-control module phase
Connection, for reminding staff at the end of lighting test.
Preferably, the bridge joint conversion module is used to for the point screen signal that processing module generates being converted into mobile industry processing
Any one in device interface signal, embedded display port signal and low-voltage differential signal.
The beneficial effects of the present invention are:
A kind of display device lighting test system provided by the invention, improves clock module, passes through clock mould
The combination of clock judgement unit and the first clock unit and second clock unit in block, so that the lighting test system of display device
More originally there is broader applicable frequency range, when exceeding original clock module extreme value to solve the frequency of required clock signal,
Display device can not normally light the problem of completion test, while also largely save cost, realize clock letter
Number wider scope dynamic regulation, improve the scope of application of display device lighting test system, provided just for user
Benefit.
Detailed description of the invention
By referring to the drawings to the description of the embodiment of the present invention, the above and other purposes of the present invention, feature and
Advantage will be apparent from, in the accompanying drawings:
Fig. 1 show the schematic diagram of the lighting test system of the display device of the prior art.
Fig. 2 show the schematic diagram of the lighting test system of display device of the embodiment of the present invention.
Fig. 3 show the schematic diagram of the lighting test system of another embodiment of the present invention display device.
Specific embodiment
Below based on embodiment, present invention is described, but the present invention is not restricted to these embodiments.Under
Text is detailed to describe some specific detail sections in datail description of the invention.Do not have for a person skilled in the art
The present invention can also be understood completely in the description of these detail sections.In order to avoid obscuring essence of the invention, well known method, mistake
There is no narrations in detail for journey, process, element and circuit.
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment all should belong to the scope of protection of the invention.
Fig. 2 is the schematic diagram of the lighting test system of display device of the embodiment of the present invention.As shown in Fig. 2, of the invention is aobvious
The lighting test system 200 of showing device includes micro-control module 210, clock module 220, processing module 230, bridge joint conversion module
240.Clock module 220 includes clock judgement unit 221, the first clock unit 222 and second clock unit 223.
The micro-control module 210 is, for example, ARM (Acorn RISC Machine) processor, for according to test request
Pattern information and parameter information are provided, and pattern information and parameter information are passed through into SPI (Serial Peripheral
Interface, Serial Peripheral Interface (SPI)) communication be sent to the processing module 230.The parameter information includes the display device
Resolution ratio, the frequency of pixel clock signal, refresh rate etc..
Clock module 220 is connected with micro-control module 210, for generate light display device 250 needed for pixel when
Clock signal；The clock judgement unit 221 includes preset value, and the preset value is, for example, first clock unit 222 can
The upper frequency limit value of the clock signal of generation, the parameter that the clock judgement unit 221 is provided according to the micro-control module 210
Information judges whether the frequency of its required pixel clock signal is more than the preset value.
When the frequency of the pixel clock signal is not more than the preset value, what first clock unit 222 generated
First clock signal can meet the frequency requirement of the pixel clock signal, and the first clock signal is worn as pixel clock signal
The processing module 230 is transmitted to after crossing the second clock unit 223.
When the frequency of the pixel clock signal is more than the preset value, the clock judgement unit 221 configures described
First clock unit 222 generates the first clock signal, the frequency of first clock signal and the frequency of the pixel clock signal
Rate is at preset ratio.The half of for example, described pixel clock signal frequency, a quarter, 1/8th ... 2 n times
The pixel clock signal frequency of one or other ratios of power point.And first clock signal of generation is exported to described
Second clock unit 223, the second clock unit 223 include clock signal generating circuit, and with the processing module 230 pairs
To connection, with according to the setting of the processing module 230, to first clock signal carry out corresponding process of frequency multiplication or other
Processing mode obtains pixel clock signal.The frequency of the pixel clock signal meets the requirement of the display device 250, institute
It states pixel clock signal to export to processing module 230, to generate point screen signal and synchronization signal, lights display device 250 to be measured.
The for example, field programmable gate array of processing module 230 (Field-Programmable Gate Array,
FPGA).The processing module 230 is according to the pattern information logic corresponding with parameter information generation that micro-control module 210 transmits
Data, the logical data include image data and clock signal.The processing module 230 configures institute according to the clock signal
State second clock unit 223.
Conversion module 240 is bridged to be used to described image data conversion becoming the identifiable display data of display device 250,
Specifically include mobile industry processor interface (Mobile Industry Processor Interface, MIPI) signal or
Bridge-type core can be used in embedded display port (Embedded Display Port, EDP) signal, bridge joint conversion module 240
Piece (Bridge IC), bridge joint conversion module 240 receive the digital signal of TTL format, the digital signal of TTL format are converted to
The corresponding MIPI signal of the interface of display device 250 or EDP signal, and the clock signal after conversion is sent to the display
Device 250, to complete the lighting test to display device 250.It should be noted that in the present embodiment, micro-control module 210
For arm processor, clock module 220 includes the first clock unit 222 and second clock unit 223, first clock unit
222 generate chip, the second clock unit with the different clock of the second clock unit 223 for example, 2 pieces of upper frequency limits
The 223 clock frequency upper limit is greater than the clock frequency upper limit of first clock unit 222.Preferably, the second clock list
Member 223 can also be phaselocked loop, carry out process of frequency multiplication to the first clock signal that first clock unit 222 generates, thus
Obtain the pixel clock signal that frequency meets 250 demand of display device.Processing module 230 is field programmable gate array,
Bridging conversion module 240 is the bridge chip that the digital signal of TTL format can be converted to MIPI signal or EDP signal.
Wherein, micro-control module 210 is connected with clock module 220 and processing module 230 respectively, and control bridge connects conversion
Module 240 works.Processing module 230 is connected with clock module 220 and bridge joint conversion module 240.
Fig. 3 is the schematic diagram of the lighting test system of another embodiment of the present invention display device, further, the lighting
Test macro 200 may also include power monitoring module 260 and cue module 270, the power monitoring module 260 and the micro-control
Molding block 210 is connected, for monitoring the power of the display device 250 while carrying out lighting test.The prompt mould
Block 270 is also connected with the micro-control module 210, for reminding staff, the prompt mould at the end of lighting test
Block 270 can be used the modes such as sound or warning light and remind staff.
A kind of display device lighting test system provided by the invention, improves clock module, passes through clock mould
The combination of clock judgement unit and the first clock unit and second clock unit in block so that display device lighting test system compared with
Originally there is broader applicable frequency range, when exceeding original clock module extreme value to solve the frequency of required clock signal, show
Showing device can not normally light the problem of completion test, while also largely save cost, realize clock signal
In the dynamic regulation of wider scope, the scope of application of display device lighting test system is improved, is provided convenience for user.
In addition, it should be understood by one skilled in the art that attached drawing is provided to the purpose of explanation, attached drawing provided herein
It is not necessarily drawn to scale.It should be noted that used specific when describing particularly unique feature of the present invention or aspect
Term should not be considered as implying that the term is this time redefined to be limited to include associated with this term
Any specific feature of the features or aspect of invention.
It will also be appreciated that example embodiment is provided, so that the disclosure is comprehensive, and its range is sufficiently conveyed
To those skilled in the art.Many specific details are presented to provide thorough understanding of the disclosure.Those skilled in the art will
Understand, does not need using specific detail, example embodiment can be carried out in many different forms, and example embodiment is not
It should be understood to limit the scope of the present disclosure.In some example embodiments, well-known device structure and well-known
Technology be not described in.
The above description is only a preferred embodiment of the present invention, is not intended to restrict the invention, for those skilled in the art
For, the invention can have various changes and changes.All any modifications made within the spirit and principles of the present invention are equal
Replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of lighting test system of display device characterized by comprising
Micro-control module, parameter information needed for providing display device according to test request；
Clock module generates pixel clock signal according to the parameter information；
Processing module generates point screen signal and synchronization signal according to the parameter information and pixel clock signal；
Conversion module is bridged, for format needed for the point screen signal is converted into display device；
Wherein, the frequency of pixel clock signal needed for the parameter information includes at least display device, the clock module packet
Clock judgement unit, the first clock unit and second clock unit are included, the clock judgement unit includes preset value, described default
Value is the upper frequency limit value for the clock signal that first clock unit can generate, when the required pixel clock signal
When frequency is more than the preset value, the clock judgement unit configures first clock unit and generates the first clock signal, institute
The frequency of the first clock signal and the frequency of the pixel clock signal are stated into preset ratio, the second clock unit is according to institute
It states the first clock signal and generates the pixel clock signal.
2. the lighting test system of display device according to claim 1, which is characterized in that the second clock unit with
The processing module is bi-directionally connected, and according to the setting of the processing module, carries out corresponding times to first clock signal
Frequency is handled, and obtains the pixel clock signal.
3. the lighting test system of display device according to claim 1, which is characterized in that when required pixel clock signal
Frequency when being less than or equal to the preset value, the first clock signal that first clock unit generates can meet required picture
The frequency requirement of plain clock signal, the first clock signal are transmitted as the pixel clock signal across the second clock unit
To the processing module.
4. the lighting test system of display device according to claim 1, which is characterized in that the clock judgement unit is logical
I2C bus is crossed to configure first clock unit.
5. the lighting test system of display device according to claim 1, which is characterized in that the preset ratio is
Wherein n is the integer more than or equal to 1.
6. the lighting test system of display device according to claim 1, which is characterized in that the first clock unit packet
Clock chip is included, the second clock unit includes clock signal generating circuit.
7. the lighting test system of display device according to claim 1, which is characterized in that the lighting test system is also
Including power monitoring module, the power monitoring module is connected with the micro-control module, for carrying out lighting test
The power of the display device is monitored simultaneously.
8. the lighting test system of display device according to claim 1, which is characterized in that the micro-control module includes
ARM microprocessor, the processing module are field programmable gate array.
9. the lighting test system of display device according to claim 1, which is characterized in that the lighting test system is also
Including cue module, the cue module is connected with the micro-control module, for reminding work at the end of lighting test
Personnel.
10. the lighting test system of display device according to claim 1, which is characterized in that the bridge joint conversion module
Point screen signal for generating processing module is converted into mobile industry processor interface signal, embedded display port signal
With any one in low-voltage differential signal.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811094515.7A CN109256072B (en) | 2018-09-19 | 2018-09-19 | Lighting test system of display device |
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| CN201811094515.7A CN109256072B (en) | 2018-09-19 | 2018-09-19 | Lighting test system of display device |
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Cited By (1)
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| CN109872666A (en) * | 2019-02-28 | 2019-06-11 | 昆山龙腾光电有限公司 | Lighting test device, lighting test system and the lighting test method of display device |
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| CN109256072B (en) | 2022-03-25 |
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