CN109256072B - Lighting test system of display device - Google Patents
Lighting test system of display device Download PDFInfo
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- CN109256072B CN109256072B CN201811094515.7A CN201811094515A CN109256072B CN 109256072 B CN109256072 B CN 109256072B CN 201811094515 A CN201811094515 A CN 201811094515A CN 109256072 B CN109256072 B CN 109256072B
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- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The application discloses display device's test system of lighting a lamp includes: the system comprises a micro-control module, a clock module, a processing module and a bridge conversion module; the clock module comprises a clock distinguishing unit, a first clock unit and a second clock unit, wherein the clock distinguishing unit comprises a preset value, when the frequency of the pixel clock signal exceeds the preset value, the clock distinguishing unit configures the first clock unit to generate a first clock signal, and the second clock unit generates the pixel clock signal according to the first clock signal. Through the combination of the clock judging unit in the clock module and the first clock unit and the second clock unit, the lighting test system of the display device has a wider applicable frequency range than the original system, so that the problem that the display device cannot be normally lighted to finish the test when the frequency of the clock signal required by lighting exceeds the extreme value of the original clock module is solved.
Description
Technical Field
The invention relates to the technical field of display devices, in particular to a lighting test system of a liquid crystal display device.
Background
Liquid Crystal Display (LCD) devices have many advantages such as low power consumption, light weight, and low radiation, and thus have been used to replace conventional Cathode Ray Tube (CRT) displays. Liquid crystal display devices are widely used in electronic devices such as high-definition digital televisions, desktop computers, notebook computers, tablet computers, mobile phones, digital cameras, and the like.
The liquid crystal display devices must be subjected to a lighting test before they are shipped from a factory. The lighting test is to input a timing signal of the liquid crystal display device, and gray scale voltages and data signals of red, green and blue pixels into the liquid crystal display device to check whether the liquid crystal display device can normally operate. Fig. 1 is a schematic diagram of a lighting test system of a display device in the prior art, which mainly includes a micro-control module 110, a clock module 120, a processing module 130, a bridge conversion module 140, and a display device 150. The micro-control module 110 is, for example, an arm (acorn RISC machine) processor, and is configured to provide mode information and parameter information according to the test requirement, and send the mode information and parameter information to the processing module 130, and configure the clock module 120. The clock module 120 uses a cdce706 chip, and the cdce706 chip can generate a clock signal with a certain frequency. The processing module 130 is, for example, a Field-Programmable Gate Array (FPGA). The processing module 130 converts the received signal and sends the converted signal to the bridge conversion module 140. The Bridge conversion module 140 converts the received signal into a Mobile Industry Processor Interface (MIPI) signal or an Embedded Display Port (EDP) signal recognizable by the Display device 150, and sends the converted signal to the Display device 150 to complete the lighting test of the Display device 150, where the Bridge conversion module 140 may use a Bridge chip (Bridge IC).
However, in the lighting test system 100 of the display device of the related art, when the frequency of the clock signal required for lighting the display device 150 exceeds the upper frequency limit of the cdce706 chip, the display device 150 cannot be lit or the display device 150 exhibits abnormal screen, and the display device 150 cannot be effectively detected. The traditional solution is to replace the chip of the clock module 120 with a high-level chip with a higher upper frequency limit or replace the FPGA in the processing module 130 with a higher-level FPGA chip, which not only causes a large increase in cost and a waste of hardware resources, but also can only test the display device with specific specification parameters because the processing module 130 generates clock signals by itself and cannot realize dynamic adjustment, and the application range is narrow and the compatibility is poor.
Disclosure of Invention
In view of this, the present invention provides a lighting test system for a display device, so as to solve the problem that the test system cannot normally complete the test due to the too high frequency of the clock signal required by the display device, control the cost of the test system, avoid the waste of hardware resources, and achieve the dynamic adjustment of the clock signal at a high frequency.
The present invention provides a lighting test system for a display device, comprising:
the micro control module provides parameter information required by the display device according to the test requirement;
the clock module generates a pixel clock signal according to the parameter information;
the processing module generates a dot screen signal and a synchronous signal according to the parameter information and the pixel clock signal;
the bridge connection conversion module is used for converting the point screen signal into a format required by the display device;
the clock module comprises a clock distinguishing unit, a first clock unit and a second clock unit, wherein the clock distinguishing unit comprises a preset value, the preset value is the upper limit value of the frequency of a clock signal which can be generated by the first clock unit, when the frequency of the pixel clock signal exceeds the preset value, the clock distinguishing unit configures the first clock unit to generate the first clock signal, the frequency of the first clock signal is in a preset proportion with the frequency of the pixel clock signal, and the second clock unit generates the pixel clock signal according to the first clock signal.
Preferably, the second clock unit is bidirectionally connected to the processing module, and performs corresponding frequency multiplication processing on the first clock signal according to the setting of the processing module to obtain the pixel clock signal.
Preferably, when the frequency of the required pixel clock signal is less than or equal to the preset value, the first clock signal generated by the first clock unit can meet the frequency requirement of the required pixel clock signal, and the first clock signal as the pixel clock signal passes through the second clock unit to be transmitted to the processing module.
Preferably, the clock discrimination unit configures the first clock unit via an I2C bus.
Preferably, the preset ratio is
Wherein n is an integer of 1 or more.
Preferably, the first clock unit includes a clock chip, and the second clock unit includes a clock signal generation circuit.
Preferably, the lighting test system further includes a power monitoring module, and the power monitoring module is connected to the micro control module and is configured to monitor the power of the display device while performing the lighting test.
Preferably, the micro-control module comprises an ARM microprocessor, and the processing module is a field programmable gate array.
Preferably, the lighting test system further comprises a prompt module, wherein the prompt module is connected with the micro control module and used for reminding workers when the lighting test is finished.
Preferably, the bridge conversion module is configured to convert the dot screen signal generated by the processing module into any one of a mobile industry processor interface signal, an embedded display port signal, and a low voltage differential signal.
The invention has the beneficial effects that:
the lighting test system of the display device improves the clock module, has wider applicable frequency range than the original one through the combination of the clock discrimination unit in the clock module and the first clock unit and the second clock unit, solves the problem that the display device cannot be normally lighted to finish the test when the frequency of the required clock signal exceeds the extreme value of the original clock module, saves the cost to a great extent, realizes the dynamic regulation of the clock signal in a wider range, improves the applicable range of the lighting test system of the display device, and provides convenience for users.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:
fig. 1 is a schematic diagram illustrating a lighting test system of a display device in the prior art.
Fig. 2 is a schematic diagram illustrating a lighting test system of a display device according to an embodiment of the invention.
Fig. 3 is a schematic view illustrating a lighting test system of a display device according to another embodiment of the invention.
Detailed Description
The present invention will be described below based on examples, but the present invention is not limited to only these examples. In the following detailed description of the present invention, certain specific details are set forth. It will be apparent to one skilled in the art that the present invention may be practiced without these specific details. Well-known methods, procedures, components and circuits have not been described in detail so as not to obscure the present invention.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 2 is a schematic diagram of a lighting test system of a display device according to an embodiment of the invention. As shown in fig. 2, the lighting test system 200 of the display device of the present invention includes a micro control module 210, a clock module 220, a processing module 230, and a bridge conversion module 240. The clock module 220 includes a clock discriminating unit 221, a first clock unit 222, and a second clock unit 223.
The micro control module 210 is, for example, an arm (acorn RISC machine) processor, and is configured to provide mode information and parameter information according to a test requirement, and transmit the mode information and the parameter information to the processing module 230 through Serial Peripheral Interface (SPI) communication. The parameter information includes a resolution of the display device, a frequency of a pixel clock signal, a refresh rate, and the like.
The clock module 220 is connected to the micro control module 210, and is configured to generate a pixel clock signal required to light the display device 250; the clock determination unit 221 includes a preset value, for example, an upper limit value of the frequency of the clock signal that can be generated by the first clock unit 222, and the clock determination unit 221 determines whether the frequency of the pixel clock signal required by the clock determination unit exceeds the preset value according to the parameter information provided by the micro control module 210.
When the frequency of the pixel clock signal is not greater than the predetermined value, the first clock signal generated by the first clock unit 222 can satisfy the frequency requirement of the pixel clock signal, and the first clock signal as the pixel clock signal passes through the second clock unit 223 and then is transmitted to the processing module 230.
When the frequency of the pixel clock signal exceeds the predetermined value, the clock discrimination unit 221 configures the first clock unit 222 to generate a first clock signal, where the frequency of the first clock signal is in a predetermined ratio with respect to the frequency of the pixel clock signal. Such as one-half, one-quarter, one-eighth … … 2 to the nth power or other proportion of the pixel clock signal frequency. And outputting the generated first clock signal to the second clock unit 223, where the second clock unit 223 includes a clock signal generating circuit and is bidirectionally connected to the processing module 230, so as to perform corresponding frequency multiplication or other processing on the first clock signal according to the setting of the processing module 230, thereby obtaining a pixel clock signal. The frequency of the pixel clock signal meets the requirement of the display device 250, and the pixel clock signal is output to the processing module 230 to generate a dot screen signal and a synchronization signal, so as to light the display device 250 to be tested.
The processing module 230 is, for example, a Field-Programmable Gate Array (FPGA). The processing module 230 generates corresponding logic data according to the mode information and the parameter information transmitted from the micro control module 210, wherein the logic data includes image data and timing signals. The processing module 230 configures the second clock unit 223 according to the timing signal.
The Bridge conversion module 240 is configured to convert the image data into Display data that can be recognized by the Display device 250, and specifically includes a Mobile Industry Processor Interface (MIPI) signal or an Embedded Display Port (EDP) signal, where the Bridge conversion module 240 may use a Bridge chip (Bridge IC), and the Bridge conversion module 240 receives a digital signal in a TTL format, converts the digital signal in the TTL format into an MIPI signal or an EDP signal corresponding to an Interface of the Display device 250, and sends a converted clock signal to the Display device 250, so as to complete a lighting test on the Display device 250. It should be noted that, in this embodiment, the micro control module 210 is an ARM processor, the clock module 220 includes a first clock unit 222 and a second clock unit 223, the first clock unit 222 and the second clock unit 223 are, for example, 2 clock generation chips with different upper frequency limits, and the upper clock frequency limit of the second clock unit 223 is greater than the upper clock frequency limit of the first clock unit 222. Preferably, the second clock unit 223 may also be a phase-locked loop, and frequency-multiplies the first clock signal generated by the first clock unit 222, so as to obtain a pixel clock signal with a frequency meeting the requirement of the display device 250. The processing module 230 is a field programmable gate array, and the bridge conversion module 240 is a bridge chip that can convert digital signals in TTL format into MIPI signals or EDP signals.
The micro control module 210 is connected to the clock module 220 and the processing module 230, and controls the bridge conversion module 240 to operate. The processing module 230 is connected to the clock module 220 and the bridge conversion module 240.
Fig. 3 is a schematic diagram of a lighting test system of a display device according to another embodiment of the present invention, and further, the lighting test system 200 may further include a power monitoring module 260 and a prompting module 270, where the power monitoring module 260 is connected to the micro control module 210, and is used for monitoring the power of the display device 250 while performing a lighting test. The prompt module 270 is also connected to the micro control module 210, and is configured to remind a worker when the lighting test is finished, and the prompt module 270 may remind the worker in a manner of sound or a prompt lamp.
The display device lighting test system provided by the invention improves the clock module, and has a wider applicable frequency range than the original one through the combination of the clock discrimination unit in the clock module and the first clock unit and the second clock unit, so that the problem that the display device cannot be normally lighted to finish the test when the frequency of the required clock signal exceeds the extreme value of the original clock module is solved, the cost is saved to a great extent, the dynamic adjustment of the clock signal in a wider range is realized, the applicable range of the display device lighting test system is improved, and convenience is provided for users.
Further, those of ordinary skill in the art will appreciate that the drawings provided herein are for illustrative purposes and are not necessarily drawn to scale. It should be noted that the use of particular terminology when describing certain features or aspects of the invention should not be taken to imply that the terminology is being redefined herein to be restricted to include any specific characteristics of the features or aspects of the invention with which that terminology is associated.
Also, it should be understood that the example embodiments are provided so that this disclosure will be thorough and will fully convey the scope to those skilled in the art. Numerous specific details are set forth in order to provide a thorough understanding of the present disclosure. Those skilled in the art will understand that specific details need not be employed, that example embodiments may be embodied in many different forms and that example embodiments should not be construed as limiting the scope of the disclosure. In some example embodiments, well-known device structures and well-known technologies are not described in detail.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. A lighting test system for a display device, comprising:
the micro control module provides parameter information required by the display device according to the test requirement;
the clock module generates a pixel clock signal according to the parameter information;
the processing module generates a dot screen signal and a synchronous signal according to the parameter information and the pixel clock signal;
the bridge connection conversion module is used for converting the point screen signal into a format required by the display device;
wherein the parameter information at least includes a frequency of a pixel clock signal required by the display device, the clock module includes a clock discrimination unit, a first clock unit and a second clock unit, the clock discrimination unit includes a preset value, the preset value is an upper limit value of a frequency of a clock signal that can be generated by the first clock unit, when the frequency of the required pixel clock signal exceeds the preset value, the clock discrimination unit configures the first clock unit to generate a first clock signal, the frequency of the first clock signal is in a preset proportion to the frequency of the pixel clock signal, the second clock unit generates the pixel clock signal according to the first clock signal, the second clock unit is bidirectionally connected with the processing module and performs corresponding frequency multiplication processing on the first clock signal according to the setting of the processing module, obtaining the pixel clock signal; when the frequency of the required pixel clock signal is less than or equal to the preset value, the first clock signal generated by the first clock unit can meet the frequency requirement of the required pixel clock signal, and the first clock signal as the pixel clock signal passes through the second clock unit to be transmitted to the processing module.
2. The lighting test system of the display device according to claim 1, wherein the clock discrimination unit configures the first clock unit through an I2C bus.
3. The lighting test system of claim 1, wherein the predetermined ratio is
Wherein n is an integer of 1 or more.
4. The lighting test system of the display device according to claim 1, wherein the first clock unit includes a clock chip, and the second clock unit includes a clock signal generating circuit.
5. The lighting test system of claim 1, further comprising a power monitoring module, connected to the micro control module, for monitoring the power of the display device while performing the lighting test.
6. The lighting test system of claim 1, wherein the micro-control module comprises an ARM microprocessor, and the processing module is a field programmable gate array.
7. The lighting test system of claim 1, further comprising a prompt module, wherein the prompt module is connected to the micro control module and is configured to prompt a worker when the lighting test is finished.
8. The lighting test system of claim 1, wherein the bridge conversion module is configured to convert the dot screen signal generated by the processing module into any one of a mobile industry processor interface signal, an embedded display port signal and a low voltage differential signal.
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| CN201811094515.7A CN109256072B (en) | 2018-09-19 | 2018-09-19 | Lighting test system of display device |
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| CN201811094515.7A CN109256072B (en) | 2018-09-19 | 2018-09-19 | Lighting test system of display device |
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| CN109872666B (en) * | 2019-02-28 | 2022-05-17 | 昆山龙腾光电股份有限公司 | Lighting test device, lighting test system and lighting test method for display device |
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