CN109211907B - Tool device for detecting silver ion migration - Google Patents
Tool device for detecting silver ion migration Download PDFInfo
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- CN109211907B CN109211907B CN201811240492.6A CN201811240492A CN109211907B CN 109211907 B CN109211907 B CN 109211907B CN 201811240492 A CN201811240492 A CN 201811240492A CN 109211907 B CN109211907 B CN 109211907B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
Abstract
A tool device for detecting silver ion migration comprises a rotating table and a support frame base; the turntable comprises a four-layer structure, wherein the first layer is annular, the second layer is semi-cylindrical, the third layer is annular, the fourth layer is hemispherical, and the first layer, the second layer, the third layer and the fourth layer of the turntable are sequentially connected; the support frame base is in a stepped cylindrical shape, and a through hole is formed in the center of the support frame base; the fourth layer of the rotating platform is detachably arranged in the through hole of the support frame base; the diameter of the fourth layer of hemisphere of the rotating table is larger than that of the through hole of the support frame base; the rotating platform can rotate horizontally or obliquely or rotate on the base of the supporting frame in a combined manner.
Description
Technical Field
The invention relates to a tool device for detecting silver ion migration, and belongs to the field of optical sensors.
Background
The infrared earth sensor is an important part of each series of spaceflight high orbit satellites, and the working principle of the infrared earth sensor is to generate photocurrent for sensing and receiving grating signals generated by a scanning structure, so that the infrared earth sensor is a key part for guaranteeing each series of high orbit satellites.
The OP604 device (phototriode) is an important device of an infrared earth sensor, is used for a photoelectric device in the field of aerospace products, has the characteristics of high packaging density, small volume, complex structure and high detection difficulty, is cylindrical in shape, has the diameter of 1.47mm, is coated with gold-plated layers on the surfaces of two electrodes of the phototriode, and is provided with a very thin insulating layer with the thickness of 0.46-0.51 mm. The device is an 890nm gallium aluminum arsenic infrared triode with PILL as a packaging form, and is different from other triodes in that a cylindrical body is provided, and two small pins are arranged on two light-emitting sides of the triode respectively, and the size of the triode is only 0.33 mm. The device has higher precision requirement and correspondingly improves the requirement on inspection.
The OP604 has the problem of C-E dark current increase and failure in the use process, which is caused by the silver ion migration phenomenon (dendritic crystal) generated by the Ag paste adhered chip in the device under the action of water vapor, electric field and ion adhesion, thereby causing the device failure. Analysis shows that the device cannot test the internal water vapor content due to the special packaging structure, and the invalid devices cannot be effectively removed before electric mounting. In the prior art, in the inspection link, the device microscopic inspection requirement after the screening test is increased, and the OP604 device after the screening test is inspected by using an optical microscope, so that the OP604 device with failure problem is removed, but the device is small in size and difficult to directly clamp and fix.
For the detection of the silver ion migration phenomenon, the OP604 internal chip needs to be detected using an optical microscope. In the testing process, the circuit board belongs to the unable steady objective table of placing of irregular structure, therefore the inspection personnel can only hand the detection of circuit board frame, and handheld detection problem exists as follows:
a. when the frame is held by hand for detection, the light source of the microscope is transmitted to the internal chip of the device, and the angle needs to be adjusted at any time due to different depth of field of the internal chip, so that the detection difficulty is increased.
b. When the lens is viewed under a high power microscope, the lens is difficult to focus as long as slight jitter exists; for devices with small spacing, the jitter can cause the phenomenon of repeated detection or detection omission, and hidden quality danger exists for products.
c. After the silver ion migration phenomenon is detected, two persons are required to cooperate to complete the photographing link operation, the migration phenomenon is photographed under a microscope with a high magnification, and a circuit board frame held by a detection person slightly shakes, so that a clear picture is difficult to capture.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the tooling device is mainly used for fixing a circuit board which is small in size and inconvenient to grasp, so that the detection effect of the OP604 device is improved, and the tooling device is high in reliability and strong in operability.
The purpose of the invention is realized by the following technical scheme:
a tool device for detecting silver ion migration comprises a rotating table and a support frame base; the turntable comprises a four-layer structure, wherein the first layer is annular, the second layer is semi-cylindrical, the third layer is annular, the fourth layer is hemispherical, and the first layer, the second layer, the third layer and the fourth layer of the turntable are sequentially connected;
the support frame base is in a stepped cylindrical shape, and a through hole is formed in the center of the support frame base; the fourth layer of the rotating platform is detachably arranged in the through hole of the support frame base; the diameter of the fourth layer of hemisphere of the rotating table is larger than that of the through hole of the support frame base; the rotating platform can rotate horizontally or obliquely or rotate on the base of the supporting frame in a combined manner.
Above-mentioned tool equipment that detects silver ion migration, the ring axis on the first layer of revolving stage, the semicircle tube axis on second floor, the ring axis and the fourth floor perpendicular to hemisphere plane of third layer just cross the normal of centre of sphere and all coincide.
According to the tool device for detecting silver ion migration, all edges of the rotating platform and the support frame base are blunt (0.2-0.40 mm) multiplied by (40-50 degrees).
According to the tooling device for detecting silver ion migration, the height of the second layer of the rotating platform is 16-20 mm.
Above-mentioned tool equipment who detects silver ion migration, the first layer of revolving stage is equipped with the screw hole for be connected with outside circuit board.
Above-mentioned detect tool equipment of silver ion migration, after the revolving stage was installed on the support frame base, the total height of detecting tool equipment of silver ion migration is not less than 45 mm.
Above-mentioned detect tool equipment of silver ion migration, the diameter ratio of the diameter of the fourth layer hemisphere of revolving stage and the through-hole of support frame base is 1.08 ~ 1.2.
According to the tooling device for detecting silver ion migration, the inner diameter of the first layer of the ring of the rotating table is not less than 10 mm.
Above-mentioned tool equipment that detects silver ion migration, the first layer, the second floor, the third layer and the fourth layer of revolving stage are integrated into one piece.
Above-mentioned tool equipment that detects silver ion migration, revolving stage and support frame base all adopt titanium alloy to make.
Compared with the prior art, the invention has the following beneficial effects:
(1) the tool can improve the detection operability of the OP604 device, and the efficiency of detecting the silver ion migration phenomenon is improved after the detection skill is improved;
(2) the tool can effectively fix the circuit board frame, avoids wire harness damage and welding spot stress, realizes 360-degree rotation detection, can realize detection requirements on 0-30-degree inclination effect, and solves the problem that clear imaging cannot be realized due to slight shake of the circuit board frame held by a detector;
(3) the tool can avoid the phenomena of repeated detection and missing detection of adjacent OP604 devices in the detection process, solves the problem that a detector is difficult to watch under a high-power optical microscope, and ensures that 100 percent of each device can be detected;
(4) the tool can effectively avoid the collision damage of the circuit board and the optical microscope lens in the detection process, and improves the safety coefficient of products and detection equipment;
(5) the tool can be operated by one person, so that the cost of detection personnel is saved, and the product quality is ensured.
Drawings
FIG. 1 is a top view of a turntable;
FIG. 2 is a cross-sectional view of the turntable;
FIG. 3 is a front view of the base of the support stand;
FIG. 4 is a cross-sectional view of the base of the stand;
fig. 5 is a top view of the base of the support stand.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
The utility model provides a detect tool equipment of silver ion migration, includes revolving stage and support frame base.
The rotary table comprises four layers of structures, wherein the first layer of structure 1 is in a ring shape, the second layer of structure 2 is in a semi-cylindrical shape, the third layer of structure 3 is in a ring shape, the fourth layer of structure 4 is in a hemispherical shape, and the first layer of structure 1, the second layer of structure 2, the third layer of structure 3 and the fourth layer of structure 4 of the rotary table are sequentially connected; the circular axis of the first layer structure 1 of the rotating table, the semi-cylindrical axis of the second layer structure 2, the circular axis of the third layer structure 3 and the normal of the fourth layer structure 4 perpendicular to the hemispherical plane and passing through the center of the sphere are all coincided. The first layer structure 1 of the rotary table is provided with a threaded hole for connecting with an external circuit board. The inner diameter of the ring of the first layer structure 1 of the rotating table is not less than 10 mm. The height of the semi-cylinder of the second layer structure 2 of the rotating platform is 16 mm-20 mm.
The support frame base is in a step-shaped cylindrical shape, and a through hole is formed in the center of the support frame base; the fourth layer structure 4 of the rotating table is detachably arranged in the through hole of the support frame base, the diameter of the hemisphere of the fourth layer structure 4 of the rotating table is larger than that of the through hole of the support frame base, and the ratio of the diameter of the hemisphere of the fourth layer structure 4 of the rotating table to that of the through hole of the support frame base is 1.08-1.2; the rotating platform can rotate horizontally or obliquely or rotate on the base of the supporting frame in a combined manner. When the ratio of the diameter of the hemisphere of the fourth layer structure 4 of the rotating table to the diameter of the through hole of the support frame base is smaller than 1.08, the rotating table can rotate obliquely on the support frame base by a small angle, the tilting effect is not obvious, and meanwhile, the tilting angle is too small, so that the rotating table can automatically rotate back to the horizontal original position under the influence of the gravity of the rotating table, namely the rotating table is restored to tilt 0 degrees from a certain tilting angle, the whole tool is easy to shake, and even the circuit board to be tested is damaged; when the ratio of the diameter of the 4 hemispheres of the fourth layer structure of the rotating table to the diameter of the through hole of the support frame base is greater than 1.2, on one hand, the 3 rings of the third layer structure easily interfere with the smaller part of the outer radius of the support frame base, the maximum inclination effect cannot be achieved, and on the other hand, when the inclination angle of the rotating table is too large, the gravity center offset of the whole rotating table and a tested circuit board is too large, so that the whole tool is easily shaken or even toppled over, and the safety of the tested circuit board is endangered. The ratio of the diameter of the hemisphere of the fourth layer structure 4 of the rotating platform to the diameter of the through hole of the support frame base is determined on the basis of considering the tilting effect of the rotating platform, the tilting stability, the stability of a tool, the assembly manufacturability, the safety of a circuit board to be tested and the structural size and the material of the tool.
After the revolving stage was installed on the support frame base, the total height of the tool equipment that detects silver ion migration was not less than 45 mm.
All edges of the rotating platform and the supporting frame base are blunt (0.2 mm-0.4 mm) x (40-50 degrees). The rotating platform and the support frame base are both made of titanium alloy.
Example 1:
the utility model provides a detect tool equipment of silver ion migration, includes revolving stage and support frame base. The rotating platform and the support frame base are both made of titanium alloy materials, and the titanium alloy has the advantages of low density, high specific strength, good corrosion resistance, good process performance and the like, and is an ideal structural material for aerospace engineering. FIG. 1 is a top view of a turntable; FIG. 2 is a cross-sectional view of the turntable; FIG. 3 is a front view of the base of the support stand; FIG. 4 is a cross-sectional view of the base of the stand; fig. 5 is a top view of the base of the support stand.
The revolving stage design is four layer structure about hollow, and the first layer structure 1 on the top is the ring platform of diameter phi 30mm, and the ring part design has three screw hole to the installation of cooperation external circuit board, the aperture is phi 2mm, and one of them is the blind hole of hole depth 6mm, and two are the through-hole. The top of revolving stage for the outside circuit board of horizontal installation, the installation and the dismantlement of circuit board are made things convenient for to the screw fastening mode.
The center part of the first layer structure 1 of the rotating table is designed into a through hole with the central aperture phi of 12mm and is used for penetrating out the wiring harness of the circuit board, all edges of the tool are blunt by 0.3mm multiplied by 45 degrees, and the abrasion of the wiring harness is avoided.
The second layer structure 2 of the rotating platform is in a semi-cylindrical shape, the semi-cylindrical shape is beneficial to wiring of circuit board wiring harnesses, and the inner diameter of the semi-cylindrical shape is phi 12 mm. The height of the semi-cylinder is 17mm, so that the wiring harness welding points of the circuit board are not stressed.
The third layer structure 3 of the rotating platform is a circular ring-shaped platform with the diameter of phi 51mm, so that the tool is conveniently grasped during detection, and the damage of devices caused by contact with a circuit board is avoided.
The fourth layer structure 4 of revolving stage, bottom layer structural design is the hemisphere promptly, and spherical radius is R12.5mm, and 360 rotatory operations can be realized to cooperation support frame base, and can realize 0 ~ 30 slope effect detection requirements.
The support frame base design be the cylindrical base of echelonment, the total height of support frame base is 13mm, the center of the cylindrical base of echelonment is equipped with the through-hole, the diameter of through-hole is phi 23mm for support the rotation operation of revolving stage. The hemispherical diameter of the fourth layer structure 4 of the rotating platform must be larger than the through hole of the base of the support frame to realize the rotating operation of the rotating platform, and meanwhile, the hemispherical diameter of the fourth layer structure 4 of the rotating platform cannot be too large, so that the gravity center of the rotating platform is unstable due to the too large hemispherical diameter, and meanwhile, the inclined precision is reduced. The diameter of the larger part of the outer circle of the stepped cylindrical base is phi 52mm, the thickness of the stepped cylindrical base is 4mm, the stepped cylindrical base is used for increasing the contact area of a tool and the table surface of detection equipment, the rotating table is supported better, the stability of the whole tool is kept, the smaller part of the outer circle of the stepped cylindrical base is used for installing the fourth layer structure 4 of the rotating table, meanwhile, in order to ensure that the third layer structure 3 of the rotating table does not interfere with the smaller part of the outer circle of the stepped cylindrical base when the rotating table rotates obliquely, the outer diameter of the smaller part of the outer circle of the stepped cylindrical base is subjected to edge chamfering design, and the chamfering size is R1.5mm.
Because the device is nearer with the camera lens distance during the detection, easily bump bad camera lens, revolving stage, support frame base and circuit board installation after highly 45mm, be the minimum distance (keep safe distance) between cooperation objective table and the optical microscope camera lens. The method can not only observe the silver ion migration phenomenon clearly, but also can not damage a circuit board and an optical microscope lens when detecting the OP604 device.
The tool device for detecting silver ion migration has the following use process:
the circuit board is fixed on the platform of the first layer structure 1 of the rotating platform by the detection personnel through screws, so that the circuit board wire harness penetrates out of the through hole of the central part. The rotary table is placed on the support frame base and then placed on an optical microscope objective table, the magnification factor is adjusted, the appearance of an internal chip of an OP604 device is observed in an ocular lens, the imaging under the ocular lens is clear by adjusting the focal length, and the rotary table is slowly rotated to realize 360-degree inspection of the silver ion migration phenomenon of the internal chip.
The inspection personnel take a picture to the chip that has the problem and leave the end, and the revolving stage is placed firmly, will "image switching pull rod" pull out, can observe clear image in "OLYCAIA m3 metallographic analysis" system.
The aperture of the central part of the first layer structure 1 of the rotating platform is originally designed to be phi 8mm, but the size influences the penetration of the wiring harness of the circuit board, and the wiring harness is finally adjusted to be phi 12mm through multiple tests, so that the wiring harness can be smoothly penetrated out. The diameter of the circular platform of the first layer structure 1 of the rotating platform is originally designed to be phi 28mm, considering that the diameter of a distribution area of circuit board mounting holes is larger, but the original design of the size is smaller, so that the mounting aperture of the circuit board is positioned at the edge of the circular platform of the first layer structure 1 or positioned outside the circular platform of the first layer structure 1, and finally adjusted to be phi 30mm after testing, and the mounting of the circuit board is ensured. The height of the semi-barrel of the second layer structure 2 of the rotating table is originally designed to be 12mm, but the lead is stressed due to the size, and the final adjustment is 17mm through multiple tests, so that the stress of a wire harness welding point can be avoided. And the original design of support frame base center cylinder hole height is 21mm, because the suspension is high during revolving stage cooperation operation, leads to placing firm inadequately, is 13mm through experimental final adjustment, has realized the support effect better. The original design of the hemisphere diameter of revolving stage fourth layer structure 4 is R10mm, and this size less than or equal to support frame base center through-hole's radius, therefore the revolving stage can only carry out 360 horizontal rotation on the support frame base, can not realize the angle slope of revolving stage, and through many times of experiments, the hemisphere radius adjustment of final fourth layer structure 4 is R12.5mm, can realize 360 rotatory effects and 0 ~ 30 inclination's detection demand.
The OP604 device needs to be detected under a high-power optical microscope, in the prior art, the frame of the circuit board is detected by a handheld circuit board, the shaking or deviation of the circuit board is easy to occur in the detection process due to the unstable handheld state, and a plurality of adjacent OP604 devices exist on the same circuit board, so that the repeated detection and the detection omission of the adjacent OP604 devices on the same circuit board are easily caused in the detection process, and in addition, the shaking and the deviation can also influence the focusing and the like to reduce the detection efficiency. The tool can effectively fix the circuit board horizontally or obliquely, avoids repeated detection and missing detection of adjacent OP604 devices in the detection process caused by jitter or deviation of the circuit board, solves the problem of difficulty in observation under a high-power optical microscope by a detector, ensures that each device can be detected by 100 percent, and improves the detection efficiency.
Those skilled in the art will appreciate that those matters not described in detail in the present specification are well known in the art.
Claims (5)
1. The utility model provides a detect tool equipment of silver ion migration which characterized in that: comprises a rotating platform and a supporting frame base; the turntable comprises a four-layer structure, wherein the first layer is annular, the second layer is semi-cylindrical, the third layer is annular, the fourth layer is hemispherical, and the first layer, the second layer, the third layer and the fourth layer of the turntable are sequentially connected;
the support frame base is in a stepped cylindrical shape, and a through hole is formed in the center of the support frame base; the fourth layer of the rotating platform is detachably arranged in the through hole of the support frame base; the diameter of the fourth layer of hemisphere of the rotating table is larger than that of the through hole of the support frame base; the rotating platform can rotate horizontally or obliquely or rotate on the base of the supporting frame in a combined manner;
all edges of the rotating platform and the supporting frame base are blunt (0.2 mm-0.4 mm) × (40-50 °);
the height of the second layer of the rotating platform is 16 mm-20 mm;
after the rotating platform is arranged on the support frame base, the total height of the tool device for detecting silver ion migration is not less than 45 mm;
the ratio of the diameter of the hemisphere at the fourth layer of the rotating table to the diameter of the through hole of the support frame base is 1.08-1.2;
the fourth layer of hemisphere is matched with the base of the support frame to realize 360-degree rotation operation and is used for realizing the requirement of 0-30-degree inclination;
the outer diameter of the smaller part of the outer circle of the stepped cylindrical base of the support frame base is subjected to edge chamfering;
the inner diameter of the first layer of circular ring of the rotating platform is not less than 10 mm.
2. The tooling device for detecting silver ion migration according to claim 1, characterized in that: the axis of the ring on the first layer of the rotating table, the axis of the semi-cylinder on the second layer, the axis of the ring on the third layer and the normal of the fourth layer perpendicular to the hemispherical plane and passing through the center of the sphere are all overlapped.
3. The tooling device for detecting silver ion migration according to claim 1 or 2, characterized in that: the first layer of revolving stage is equipped with the screw hole for be connected with outside circuit board.
4. The tooling device for detecting silver ion migration according to claim 1 or 2, characterized in that: the first layer, the second layer, the third layer and the fourth layer of the rotating platform are integrally formed.
5. The tooling device for detecting silver ion migration according to claim 1 or 2, characterized in that: the rotating platform and the support frame base are both made of titanium alloy.
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| CN201811240492.6A CN109211907B (en) | 2018-10-24 | 2018-10-24 | Tool device for detecting silver ion migration |
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| CN201811240492.6A CN109211907B (en) | 2018-10-24 | 2018-10-24 | Tool device for detecting silver ion migration |
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| CN109211907A CN109211907A (en) | 2019-01-15 |
| CN109211907B true CN109211907B (en) | 2022-01-04 |
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| CN111398097A (en) * | 2020-04-02 | 2020-07-10 | 西安宏星电子浆料科技股份有限公司 | Silver migration testing method of silver conductor slurry for sheet resistor |
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