CN109211907A - A kind of fitting device detecting silver ion migration - Google Patents
A kind of fitting device detecting silver ion migration Download PDFInfo
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- CN109211907A CN109211907A CN201811240492.6A CN201811240492A CN109211907A CN 109211907 A CN109211907 A CN 109211907A CN 201811240492 A CN201811240492 A CN 201811240492A CN 109211907 A CN109211907 A CN 109211907A
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- layer
- turntable
- support frame
- frame base
- silver ion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
Abstract
A kind of fitting device detecting silver ion migration, including turntable and support frame base；The turntable includes four-layer structure, and first layer is circular ring shape, and the second layer is semi-cylindrical shaped, and third layer is circular ring shape, and the 4th layer is hemispherical, first layer, the second layer, third layer and the 4th layer of sequential connection of the turntable；Support frame as described above pedestal is stepped cylinder shape, and the center of support frame base is equipped with through-hole；The 4th layer of the turntable is detachably arranged in the through-hole of support frame base；The diameter of 4th layer of hemisphere of the turntable is greater than the diameter of the through-hole of support frame base；The turntable can rotate horizontally on support frame base or Sloped rotating or a combination of both rotation.
Description
Technical field
The present invention relates to a kind of fitting devices for detecting silver ion migration, belong to optical sensor field.
Background technique
Infrared earth sensor is the important component of each series of satellites of space flight high orbit, its working principle is that generating photoelectricity
Stream, for incuding the grating signal for receiving Scan Architecture and generating, therefore infrared earth sensor is to ensure that each series of high orbit is defended
The critical component of star.
OP604 device (phototriode) is the important devices of infrared earth sensor, one for space product field
Kind photoelectric device, the device have the characteristics that packaging density is high, small in size, structure is complicated, detection difficulty is big, and shape is cylinder
Shape, diameter 1.47mm, two electrode surface of phototriode are covered with Gold plated Layer, there is one layer of very thin insulation between electrodes
Layer, thickness of insulating layer is between 0.46mm~0.51mm.This device is 890nm infrared as the gallium aluminum arsenide of packing forms using PILL
Triode, the difference with other triodes are cylindrical ontology, and respectively there are a small pin in the two sides that shine, and size is only
0.33mm.This device required precision is higher, and the requirement to inspection also correspondinglys increase.
C-E dark current occurs in use and becomes larger Problem of Failure by OP604, this is because device inside is starched using Ag
Adhering chip, the silver ion migration phenomenon (dendrite) occurred under the action of steam, electric field and ion pickup, so as to cause device
Failure.Through internal moisture diffusion test job, Bu Neng can not be carried out according to the analysis, the encapsulating structure due to the device is special
Such ineffective part is effectively rejected before Denso.The prior art is that the device microscopy in test stage, after increasing screening test is wanted
It asking, the OP604 device after screening test is checked using optical microscopy, the OP604 that Problem of Failure will be present is rejected, but
Since device volume is small, is not easy directly to grip.
For the detection of silver ion migration phenomenon, need to detect OP604 inside chip using optical microscopy.It was detecting
Cheng Zhong, circuit board, which belongs to irregular structure, to be smoothly placed on objective table, therefore reviewer can only hold circuit board
Frame detection, that there are problems is as follows for hand-held detection:
When a. holding frame detection, on microscopical lit transmissive to device inside chip, due to inside chip depth of field journey
It spends different, needs to adjust the angle at any time, increase detection difficulty.
B. it watches under high magnification microscope, is difficult to focus as long as there is slight jitter to will lead to camera lens；It is smaller for spacing
Device, shake the phenomenon that will cause repetition detection or leak detection, to product, there are hidden danger of quality.
C. after detecting silver ion migration phenomenon, two people are needed to cooperate link operation of completing to take pictures, in higher magnification
It takes pictures under microscope to transport phenomena, has slight jitter since testing staff holds circuit board frame, cause to be difficult to catch
Grasp clear pictures.
Summary of the invention
The technical problem to be solved by the present invention is having overcome the deficiencies of the prior art and provide a kind of detection silver ion migration
Fitting device, for detecting infrared earth sensor OP604 device, it is smaller and not that tooling of the present invention is mainly used for fixed dimension
Convenient for the circuit board of grasping, so that get a promotion to the detection effect of OP604 device, the tooling high reliablity, operability
By force.
The object of the invention is achieved by the following technical programs:
A kind of fitting device detecting silver ion migration, including turntable and support frame base；The turntable includes four
Layer structure, first layer is circular ring shape, and the second layer is semi-cylindrical shaped, and third layer is circular ring shape, and the 4th layer is hemispherical, the rotation
First layer, the second layer, third layer and the 4th layer of sequential connection of platform；
Support frame as described above pedestal is stepped cylinder shape, and the center of support frame base is equipped with through-hole；The of the turntable
Four layers are detachably arranged in the through-hole of support frame base；The diameter of 4th layer of hemisphere of the turntable is greater than support frame bottom
The diameter of the through-hole of seat；The turntable can rotate horizontally on support frame base or Sloped rotating or a combination of both rotation.
The fitting device of above-mentioned detection silver ion migration, the semicircle of the annulus axis of the turntable first layer, the second layer
Cylinder axis, the annulus axis of third layer and the 4th layer of normal perpendicular to hemispherical plane and the centre of sphere excessively are overlapped.
All seamed edges of the fitting device of above-mentioned detection silver ion migration, the turntable and support frame base are blunt
(0.2mm~0.40mm) × (40 °~50 °).
The fitting device of above-mentioned detection silver ion migration, the height of the second layer of turntable are 16mm~20mm.
The first layer of the fitting device of above-mentioned detection silver ion migration, the turntable is equipped with threaded hole, is used for and outside
Circuit board connection.
The fitting device of above-mentioned detection silver ion migration, after the turntable is mounted on support frame base, the inspection
The total height for surveying the fitting device of silver ion migration is not less than 45mm.
The fitting device of above-mentioned detection silver ion migration, the diameter and support frame base of the 4th layer of hemisphere of the turntable
Through-hole diameter ratio be 1.08~1.2.
The interior diameter of the fitting device of above-mentioned detection silver ion migration, the first layer annulus of the turntable is not less than
10mm。
The fitting device of above-mentioned detection silver ion migration, the first layer of turntable, the second layer, third layer and the 4th layer are one
It is body formed.
The fitting device of above-mentioned detection silver ion migration, the turntable and support frame base are all made of titanium alloy and are made.
The present invention has the following beneficial effects: compared with the prior art
(1) tooling of the invention can be improved the detection operability of OP604 device, which improves after improving
Detect the efficiency of silver ion migration phenomenon；
(2) tooling of the invention can effective fixing circuit board frame, avoid harness damage, solder joint stress, realize 360 °
Rotation detection, and can be realized 0 °~30 ° gap tilt effect testing requirements, it solves the hand-held circuit board frame of testing staff and slightly trembles
It is dynamic cause can not blur-free imaging the problem of；
(3) tooling of the invention can be avoided adjacent OP604 device and repeat to detect in the detection process to show with leak detection
As solving testing staff and watching difficulty under Powerful Light Microscope, guarantee that each device 100% can detect；
(4) tooling of the invention can be effectively prevented from the collision of circuit board and optical microphotograph lens head in the detection process by
Damage, improves the safety coefficient of product and detection device；
(5) tooling of the invention is able to achieve one man operation, saves testing staff's cost, ensure that product quality.
Detailed description of the invention
Fig. 1 is the top view of turntable；
Fig. 2 is the cross-sectional view of turntable；
Fig. 3 is the main view of support frame base；
Fig. 4 is the cross-sectional view of support frame base；
Fig. 5 is the top view of support frame base.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with attached drawing to implementation of the invention
Mode is described in further detail.
A kind of fitting device detecting silver ion migration, including turntable and support frame base.
Turntable includes four-layer structure, and first layer structure 1 is circular ring shape, and second layer structure 2 is semi-cylindrical shaped, third layer knot
Structure 3 is circular ring shape, and four-layer structure 4 is hemispherical, the first layer structure 1 of turntable, second layer structure 2,3 and of third layer structure
Four-layer structure 4 is linked in sequence；The annulus axis of turntable first layer structure 1, the semicircular cylinder axis of second layer structure 2, third
The annulus axis and four-layer structure 4 of layer structure 3 are overlapped perpendicular to the normal of hemispherical plane and the centre of sphere excessively.The first of turntable
Layer structure 1 is equipped with threaded hole, for connecting with the external circuit board.The interior diameter of 1 annulus of first layer structure of turntable is not less than
10mm.The semicircular cylinder height of turntable second layer structure 2 is 16mm~20mm.
Support frame base is stepped cylinder shape, and the center of support frame base is equipped with through-hole；The four-layer structure 4 of turntable
It is detachably arranged in the through-hole of support frame base, the diameter of 4 hemisphere of four-layer structure of turntable is greater than support frame base
Through-hole diameter, the diameter ratio of the through-hole of the diameter and support frame base of 4 hemisphere of four-layer structure of specific turntable
It is 1.08~1.2；Turntable can rotate horizontally on support frame base or Sloped rotating or a combination of both rotation.Work as turntable
4 hemisphere of four-layer structure diameter and support frame base through-hole diameter ratio less than 1.08 when, turntable is in support frame
It is capable of the angle very little of Sloped rotating on pedestal, gap tilt effect is unobvious, while tilt angle is too small, in turntable self gravity
Under the influence of, turntable may be horizontal in situ there is a phenomenon where rotating back to automatically, i.e., it is restored to 0 ° of inclination from some tilt angle,
It is easy to cause entire tooling to shake, or even circuit-under-test plate is caused to damage；When the diameter of 4 hemisphere of four-layer structure of turntable
When being greater than 1.2 with the diameter ratio of the through-hole of support frame base, 3 annulus of one side third layer structure be easy with outside support frame base
The lesser part of radius interferes, and is unable to reach maximum inclination effect and makes when the tilt angle of another aspect turntable is excessive
Centre-of gravity shift at entire turntable and circuit-under-test plate is excessive, is easy to cause entire tooling to shake or even topple over, jeopardizes
The safety of circuit-under-test plate.The diameter of the through-hole of the diameter and support frame base of 4 hemisphere of four-layer structure of turntable of the present invention
The ratio between, it is to consider turntable gap tilt effect, tilt stability, tooling stability, assembly process process, circuit-under-test plate safety
Property and tooling structure size and material on the basis of determine.
After turntable is mounted on support frame base, the total height for detecting the fitting device of silver ion migration is not less than
45mm。
All seamed edges of turntable and support frame base blunt (0.2mm~0.4mm) × (40 °~50 °).Turntable and
Support frame base is all made of titanium alloy and is made.
Embodiment 1:
A kind of fitting device detecting silver ion migration, including turntable and support frame base.Turntable and support frame bottom
Seat is formed using titanium alloy material, and it is excellent that titanium alloy has that density is low, specific strength is high, corrosion resistance is good, processing performance is good etc.
Point is ideal aerospace engineering structural material.Fig. 1 is the top view of turntable；Fig. 2 is the cross-sectional view of turntable；Fig. 3 is
The main view of support frame base；Fig. 4 is the cross-sectional view of support frame base；Fig. 5 is the top view of support frame base.
Spinning stage design is hollow four-layer structure up and down, and the annulus that the top first layer structure 1 is diameter phi 30mm is flat
Platform, there are three threaded holes for ring part design, and to cooperate the installation of the external circuit board, aperture is φ 2mm, one of them is hole
The blind hole of deep 6mm, two are through-hole.The top of turntable, for being horizontally mounted external circuit board, screw fastening means is convenient
The installation and removal of circuit board.
1 centre of turntable first layer structure is designed as the through-hole of center bore φ 12mm, for circuit board harness
It is pierced by, blunt 0.3mm × 45 ° of all seamed edges of tooling of the present invention avoid the abrasion of harness.
The second layer structure 2 of turntable is semi-cylindrical shaped, and semi-cylindrical shaped is conducive to the cabling of circuit board harness, half drum
Internal diameter is also φ 12mm.The height of semicircular cylinder is 17mm, it is therefore an objective to which circuit board harness solder joint does not stress.
The third layer structure 3 of turntable is the circular platform that diameter is φ 51mm, grasps tooling when facilitating detection, avoids
Contact circuit board causes device damage.
The four-layer structure 4 of turntable, i.e. bottom structure are designed as hemispherical, spherical radius R12.5mm, cooperation branch
Support pedestal can realize 360 ° of rotation process, and can be realized 0 °~30 ° gap tilt effect testing requirements.
The support frame base is designed as stepped cylinder shape pedestal, and the total height of support frame base is 13mm, ladder
The center of shape cylindrical base is equipped with through-hole, and the diameter of through-hole is φ 23mm, is used to support the rotation operation of turntable.Turntable
The through-hole that the hemispheric diameter of four-layer structure 4 has to be larger than support frame base is just able to achieve the rotation process of turntable, together
When turntable four-layer structure 4 hemispheric diameter cannot be excessive, hemispheric diameter crosses the center of gravity that senior general causes turntable
Shakiness, also resulting in inclined precision reduces.The stepped cylinder biggish section diameter of shape pedestal outer circle is φ 52mm, with a thickness of
4mm preferably supports turntable, keeps the stabilization of entire tooling for increasing the contact area of tooling Yu detection device table top,
The stepped cylinder lesser part of shape pedestal outer circle is used to install the four-layer structure 4 of turntable, while to guarantee that turntable inclines
Tiltedly when rotation turntable third layer structure 3, and the lesser part of stepped cylinder shape pedestal outer circle does not interfere, ladder
The outer diameter of the lesser part of shape cylindrical base outer circle has carried out edge using chamfer design, chamfer dimesion R1.5mm.
Device is closer with distance of camera lens when due to detection, easily breaks camera lens, the turntable, support frame base and circuit
Height 45mm after plate installation is the minimum range (keeping safe distance) cooperated between objective table and optical microphotograph lens head.
Guarantee when detecting OP604 device, can observe and understand silver ion migration phenomenon and damage circuit board and optical microscopy
Camera lens.
The present invention detect silver ion migration fitting device use process is as follows:
Testing staff by circuit board be screwed on 1 platform of first layer structure of turntable, make circuit board harness from
It is pierced by the through-hole of centre.It is placed on optical microscope stage, adjusts after turntable is placed on support frame base
Amplification factor observes OP604 device inside chip pattern in eyepiece, and focusing makes imaging clearly under eyepiece, slowly rotates
Turntable realizes 360 ° of inspection inside chip silver ion migration phenomenons.
Testing staff take pictures keeping on file to problematic chip, and turntable, which is placed, to be consolidated, and " image switching pull rod " is drawn
Out, clearly image can be observed in " OLYCAIA m3 Metallographic Analysis " system.
1 centre aperture original design of turntable first layer structure is φ 8mm, but the size influences circuit board harness
It is pierced by, through test of many times, final adjustment is φ 12mm, guarantees that harness can be smoothly pierced by.1 annulus platform of turntable first layer structure
Diameter original design is φ 28mm, it is contemplated that the distributed areas of circuit board mounting hole are relatively large in diameter, but the original of the size sets
Count it is less than normal cause circuit board installation aperture be located at 1 annulus platform of first layer structure edge or be located at 1 annulus of first layer structure put down
Except platform, final adjustment is φ 30mm after testing, and ensure that the installation of circuit board.Half drum of turntable second layer structure 2
Height original design be 12mm, but the size will cause lead stress, through test of many times, final adjustment 17mm, Ke Yibao
Card harness solder joint does not stress.And the original design of support frame base center cylindrical hole height is 21mm, when turntable compounding practice
Due to hanging height, cause placement not firm enough, is 13mm through test final adjustment, support effect has been better achieved.Turntable
The hemispherical diameter original design of four-layer structure 4 is R10mm, which is less than or equal to the radius of support frame base central through hole,
Therefore turntable can only carry out 360 ° of horizontal rotations on support frame base, can not achieve the angle tilt of turntable, through multiple
Test, half radius of a ball of final four-layer structure 4 are adjusted to R12.5mm, can be realized 360 ° of rotates effes and 0~30 ° of inclination
The detection demand of angle.
OP604 device needs are detected under Powerful Light Microscope, and the prior art is examined by hand-held circuit board frame
Survey, due to hold it is unstable make to be easy to appear circuit board shake or offset in detection process, and there are multiple on same circuit board
Adjacent OP604 device, thus easily cause OP604 device adjacent on same circuit board in the detection process repeat detection and
Leak detection, furthermore shaking and deviating also will affect the reduction detection efficiency such as focusing.Tooling of the invention can it is effective horizontal or
Fixing circuit board is tilted, OP604 device adjacent caused by shaking or deviate because of circuit board is avoided to repeat to detect in the detection process
And leak detection, while solving testing staff and watching difficulty under Powerful Light Microscope, guarantee that each device 100% can
It detects, improves detection efficiency.
The content that description in the present invention is not described in detail belongs to the well-known technique of those skilled in the art.
Claims (10)
1. a kind of fitting device for detecting silver ion migration, it is characterised in that: including turntable and support frame base；The rotation
Platform includes four-layer structure, and first layer is circular ring shape, and the second layer is semi-cylindrical shaped, and third layer is circular ring shape, and the 4th layer is hemispherical,
First layer, the second layer, third layer and the 4th layer of sequential connection of the turntable；
Support frame as described above pedestal is stepped cylinder shape, and the center of support frame base is equipped with through-hole；The 4th layer of the turntable
It is detachably arranged in the through-hole of support frame base；The diameter of 4th layer of hemisphere of the turntable is greater than support frame base
The diameter of through-hole；The turntable can rotate horizontally on support frame base or Sloped rotating or a combination of both rotation.
2. a kind of fitting device for detecting silver ion migration according to claim 1, it is characterised in that: the turntable the
One layer of annulus axis, the semicircular cylinder axis of the second layer, the annulus axis of third layer and the 4th layer are perpendicular to hemispherical plane and mistake
The normal of the centre of sphere is overlapped.
3. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
All seamed edges of platform and support frame base blunt (0.2mm~0.4mm) × (40 °~50 °).
4. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: turntable
The height of the second layer is 16mm~20mm.
5. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
The first layer of platform is equipped with threaded hole, for connecting with the external circuit board.
6. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
After platform is mounted on support frame base, the total height of the fitting device of the detection silver ion migration is not less than 45mm.
7. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
The diameter ratio of the through-hole of the diameter and support frame base of 4th layer of hemisphere of platform is 1.08~1.2.
8. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
The interior diameter of the first layer annulus of platform is not less than 10mm.
9. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: turntable
First layer, the second layer, third layer and the 4th layer are integrally formed.
10. a kind of fitting device for detecting silver ion migration according to claim 1 or 2, it is characterised in that: the rotation
Platform and support frame base are all made of titanium alloy and are made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811240492.6A CN109211907B (en) | 2018-10-24 | 2018-10-24 | Tool device for detecting silver ion migration |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811240492.6A CN109211907B (en) | 2018-10-24 | 2018-10-24 | Tool device for detecting silver ion migration |
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| Publication Number | Publication Date |
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| CN109211907A true CN109211907A (en) | 2019-01-15 |
| CN109211907B CN109211907B (en) | 2022-01-04 |
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| Application Number | Title | Priority Date | Filing Date |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111398097A (en) * | 2020-04-02 | 2020-07-10 | 西安宏星电子浆料科技股份有限公司 | Silver migration testing method of silver conductor slurry for sheet resistor |
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| Publication number | Publication date |
|---|---|
| CN109211907B (en) | 2022-01-04 |
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