CN109166936A - 一种高阻AlGaN基光导开关器件及其制备方法 - Google Patents
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- 229910002704 AlGaN Inorganic materials 0.000 title claims abstract description 27
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- 229910052594 sapphire Inorganic materials 0.000 claims description 6
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Abstract
本专利公布了一种高阻AlGaN基光导开关器件及其制备方法,高阻AlGaN基光导开关器件包括:衬底、SiO2层、阳极1、阳极2、阴极1、阴极2,高阻AlGaN基光导开关器件制备方法包括:制作衬底、制作电极2、制作SiO2层、制作电极1。本发明主要是解决衬底材料生长、电极制作的问题,本发明采用AlGaN衬底,化学气相沉积法形成SiO2层,电极分为两段,本发明提供一种可靠性高、响应更为迅速、性能更为优越的高阻AlGaN基光导开关器件及其制备方法。
Description
技术领域
本发明涉及半导体感光器件技术领域,尤其涉及高阻AlGaN基光导开关器件及其制备方法。
背景技术
光导开关是一种利用半导体电阻随外界条件会发生极大变化的特性,而制作成的固体开关。当其受到光照时其电阻会迅速减小,没有光照的黑暗环境中其电阻又极大,且电阻变化的响应时间又极短,是皮秒甚至亚皮秒量级的。
自1972年S.Jayaraman等人发现,光电半导体收到皮秒两极光脉冲作用时,其做出响应的时间也是皮秒量级起,光导开关便收到人们的普遍关注,不断对其进行研究,并取得了一定的研究成果。
1975年,Auston等人使用Si为材料成功制造出第一代的光导开关,并在此后的一端时间内Si单晶半导体占据了光导开关的主要市场地位,但因其电阻率、载流子寿命、热导率等的影响使其出现了不少缺陷;随着人们对光电开关技术研究的不断加深,第二代半导体出现,其以砷化镓为制作材料,其载流子寿命短、迁移率高,解决了第一代半导体中存在的一些问题;随着各领域应用要求的提高,目前光电开关已进入第三代半导体材料SiC器件的新时代。
目前的光导开关由于其构造简单、性能稳定、电磁等难以干扰、故障率低、响应速度快的优点,受到许多领域的青睐,光导开关在军事、脉冲功率、超快瞬态电子学、医疗、通讯等领域有普遍应用。
随着光导开关技术的不断研究与开发,起初光电开关中存在的载流子寿命、迁移率、电阻率的问题均在第三代半导体材料SiC中得到解决,虽然先有的光电开关技术解决了以往的许多问题,具备许多优点,但其仍存以下缺点:(1)SiC材料本身缺陷和设计不合理使得其未达击穿电压,提前被击穿;(2)大尺寸高质量半绝缘衬底材料生长存在问题;(3)制备低比接触电阻率欧姆电极困难;(4)开关结构对性能存在不良影响。
发明内容
本发明的目的是解决现有光导开关中存在的衬底材料生长、电极制作的问题,提供一种可靠性高、响应更为迅速、性能更为优越的高阻AlGaN基光导开关器件及其制备方法。
本发明所采用的技术方案:一种高阻AlGaN基光导开关器件,包括:衬底、SiO2层、阳极1、阳极2、阴极1、阴极2,所述阳极1和阳极2共同组成光导开关的电极阳极;所述阴极1和阴极2共同组成光导开关的电极阴极;所述衬底由高阻AlGaN材料制备,位于整个器件底部;所述SiO2层位于衬底上方;所述阳极1位于SiO2层上方,与阳极2相连,阳极1对外连接外部线路;所述阳极2介于衬底与SiO2层之间,与阳极1相连,二者共同组成阳极;所述阴极1位于SiO2层上方,与阴极2相连,阴极1对外连接外部线路;所述阴极2介于衬底与SiO2层之间,与阴极1相连,二者共同组成阴极。
本发明的高阻AlGaN基光导开关器件制备方法如下:
制作衬底:衬底所用材料为AlGaN,其制备是在蓝宝石衬底上,通过金属有机化合物化学气相淀积法制成,在1100℃条件下,AlN缓冲层外延出非故意掺杂的Al0.4Ga0.6N,然后利用激光剥离或蚀刻将蓝宝石衬底与其分离,再对AlGaN进行抛光,然后在300℃下快速退火3分钟,最终得到制作所需的AlGaN衬底。
制作电极2:使用光刻制作叉指电极,将阳极2和阴极2通过电子束蒸发和自剥离工艺进行沉淀,再在850℃的条件下,进行30s快速退火,最后形成欧姆接触。
制作SiO2层:为缓和器件表面的闪络效应,利用化学气相沉积法制成SiO2层。
制作电极1:SiO2层制成后,在其表面利用光刻使得阳极2和阴极2的边缘部分能够露出SiO2层的覆盖,再利用光刻和电子蒸发淀积的方法安装阳极1和阴极1。
本发明的有益效果:(1)采用快速退火,优化器件,性能更加优异;(2)结构简单,不易出错,因此可靠性更强;(3)优化了制备工艺,优选制备材料,使得器件电阻变化迅速,响应时间极短。
附图说明
图1是本发明剖面结构示意图。
图2是本发明俯视结构示意图。
图中:1—衬底,2—SiO2层,3—阳极1,4—阳极2,5—阴极1,6—阴极2。
具体实施方式
下面结合附图与具体实例对本发明进行详细说明。
如图1所示,本发明所采用的技术方案:本发明的装置包括:衬底(1)、SiO2层(2)、阳极1(3)、阳极2(4)、阴极1(5)、阴极2(6),所述阳极1(3)和阳极2(4)共同组成光导开关的电极阳极;所述阴极1(5)和阴极2(6)共同组成光导开关的电极阴极;所述衬底(1)由高阻AlGaN材料制备,位于整个器件底部;所述SiO2层(2)位于衬底(1)上方;所述阳极1(3)位于SiO2层(2)上方,与阳极2(4)相连,所述阳极1(3)对外连接外部线路;所述阳极2(4)介于衬底(1)与SiO2层(2)之间,与阳极1(3)相连,二者共同组成阳极;所述阴极1(5)位于SiO2层(2)上方,与阴极2(6)相连,阴极1(5)对外连接外部线路;所述阴极2(6)介于衬底(1)与SiO2层(2)之间,与阴极1(5)相连,二者共同组成阴极。
一种高阻AlGaN基光导开关器件的制备方法,包括如下步骤:制作衬底(1):衬底(1)所用材料为AlGaN,其制备是在蓝宝石衬底上,通过改进后的金属有机化合物化学气相淀积法制成,利用高温AlN缓冲层外延出非故意掺杂的Al0.4Ga0.6N,然后利用激光剥离或蚀刻将蓝宝石衬底与其分离,再对AlGaN进行抛光,然后在300℃下快速退火3分钟,最终得到制作所需的AlGaN衬底。
制作电极2:使用光刻制作叉指电极,将阳极2(4)和阴极2(6)通过电子束蒸发和自剥离工艺进行沉淀,再在850℃的高温下进行30s快速退火,最后形成欧姆接触。
制作SiO2层(2):为缓和器件表面的闪络效应,利用化学气相沉积法形成SiO2层(2)。
制作电极1:SiO2层(2)形成后,在其表面利用光刻使得阳极2(4)和阴极2(6)的边缘部分能够露出SiO2层(2)的覆盖,再利用光刻和电子蒸发淀积的方法安装阳极1(3)和阴极1(5)。
Claims (3)
1.一种高阻AlGaN基光导开关器件,包括:衬底(1)、SiO2层(2)、阳极1(3)、阳极2(4)、阴极1(5)、阴极2(6);所述阳极1(3)和阳极2(4)共同组成光导开关的电极阳极;所述阴极1(5)和阴极2(6)共同组成光导开关的电极阴极;所述衬底(1)位于整个器件底部;所述SiO2层(2)位于衬底(1)上方;所述阳极1(3)位于SiO2层(2)上方,与阳极2(4)相连,阳极1(3)对外连接外部线路;所述阳极2(4)介于衬底(1)与SiO2层(2)之间,与阳极1(3)相连,二者共同组成阳极;所述阴极1(5)位于SiO2层(2)上方,与阴极2(6)相连,阴极1(5)对外连接外部线路;所述阴极2(6)介于衬底(1)与SiO2层(2)之间,与阴极1(5)相连,二者共同组成阴极。
2.根据权利要求1所述的一种高阻AlGaN基光导开关器件,其特征在于:所述衬底(1)由高阻AlGaN材料制成。
3.一种高阻AlGaN基光导开关器件制备方法,其特征在于:
制作衬底(1):衬底(1)所用材料为AlGaN,其制备是在蓝宝石衬底上,通过金属有机化合物化学气相淀积法制成,利用高温AlN缓冲层外延出非故意掺杂的Al0.4Ga0.6N,然后利用激光剥离或蚀刻将蓝宝石衬底与其分离,再对AlGaN进行抛光,然后在300℃下快速退火3分钟,最终得到制作所需的AlGaN衬底;
制作电极2:使用光刻定义插指电极,将阳极2(4)和阴极2(6)通过电子束蒸发和自剥离工艺进行沉淀,再在850℃的高温下进行30s快速退火,最后形成欧姆接触;
制作SiO2层(2):利用化学气相沉积法形成SiO2层(2);
制作电极1:SiO2层(2)形成后,在其表面利用光刻的方法使阳极2(4)和阴极2(6)的边缘部分暴露出来,再利用光刻和电子蒸发淀积的方法安装阳极1(3)和阴极1(5)。
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