CN108918425A - Mueller matrix measuring system and method - Google Patents
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Abstract
The invention provides a novel Mueller matrix measuring system and method, which can measure a Mueller matrix of a target efficiently and accurately. The measurement system includes: the system comprises a light source system, a polarizing system, a target to be detected, a polarization analyzing system and a computer processing system which are sequentially arranged along a light path; the polarizing system comprises a vertical linear polarizer, a first liquid crystal phase retarder and a second liquid crystal phase retarder which are sequentially arranged along an incident light path, wherein the included angles between the fast axes of the two liquid crystal phase retarders and the horizontal direction are respectively 45 degrees and 90 degrees; the polarization analysis system is a polarization camera for simultaneously detecting full polarization states of the sub-apertures, and the light source system meets the following requirements: finally, all light channels of the polarization camera are covered by the polarized light emitted by the target to be detected; and the computer processing system is used for controlling the voltages loaded on the two liquid crystal phase retarders to realize the modulation of the polarization state of the light incident on the target to be measured, storing an intensity diagram acquired by the camera and calculating the Mueller matrix according to the light intensity value.
Description
Technical field
The invention belongs to Polarization Detection fields, are related to a kind of for measuring the system and measurement of Muller (Mueller) matrix
Method.
Background technique
Stokes vector (S0, S1, S2, S3)TIt is used to describe the polarization state of light as an one-dimensional vector.When a branch of use
When the light of Stokes vector description is radiated on object, the emergent light (including reflected light and transmitted light) of object is modulated, thus
The polarization characteristic of emergent light is described with a new Stokes vector, this incident transformation between outgoing Stokes vector is closed
System is called Muller (Mueller) matrix.Mueller matrix is one 4 × 4 real number matrix, each element in Mueller matrix
Or element group all has different practical significances, completely characterizes object to the modulating characteristic of emergent light, including dichroic
Property, phase delay and scattering depolarization.Therefore, the Mueller matrix for how efficiently and accurately measuring target is detected in polarization imaging
Aspect seems most important.
Stokes vector (S0, S1, S2, S3)TIt is made of four components, the expression formula of each component is as follows：
S0Indicate total light intensity, i.e. the sum of horizontal polarisation component and vertical polarisation component, S1Indicate horizontal polarisation component and vertical
The difference of polarized component, S2Indicate the difference of 45 ° and 135 ° polarized components, S3Indicate the difference of right-hand circular polarization and Left-hand circular polarization component.
By four components in (1), we can completely describe the polarization state of light beam, including partial poolarized light.
The form of Mueller matrix is as follows：
Mueller matrix meets following as the transformation matrix between incidence Stokes vector sum outgoing Stokes vector
Formula：
So=MSi
In formula, SiIndicate the Stokes vector of incident light；SoIndicate the Stokes vector of emergent light.
The measurement method of Mueller matrix array elements can modulate the polarization of incident light and emergent light there are many selection in experiment
State is to measure the basic skills of Mueller matrix, generally uses wave plate rotary process.Measurement Mueller matrix majority uses at present
Dual rotary wave plate formula polarimeter, construction are as shown in Figure 1：System is polarized by polarizing film P1With quarter wave plate C1Composition, referred to as PSG
(Polarization State Generator), analyzing system is by polarizing film P2With quarter wave plate C2Composition, referred to as PSA
(Polarization State Analyzer).Laser beam is irradiated in target sample by PSG, is passed through after PSA
CCD detection exiting light beam intensity.In measurement process, two quarter wave plate C1And C2With 1:5 angle synchronous rotary change incident light and
The polarization state of emergent light.Every change output intensity of angle measurement.Different output intensities are corresponding about mmnNot Tongfang
Journey.It since Mueller matrix has 16 elements, that is, needs to solve 16 unknown numbers, therefore at least needs rotationally-varying 16 angles
Degree realizes the complete Mueller matrix of 16 kinds of available samples of polarization combinations.The National University of Defense technology is completed with 36 kinds of combinations
Measurement to liquid backscattering Mueller matrix, Fujian Normal University with polarizer slice and checking bias slice be adjusted to respectively it is horizontal,
Vertically, 45 ° of lines are partially and 16 kinds of combinations in right-hand circular polarization direction have obtained the Mueller matrix image of liquid.Such methods need
More than ten groups of even tens groups of cumbersome experimental implementations, time consumption of experimental process are wanted, and are adjusted each time to detection result accuracy
Influence and record asynchronism so that measuring accuracy decline.In addition such methods need experimental implementation many times, this
Timesharing, so that it is suitable for measuring the Mueller matrix of stable target, it is difficult to the unstable dielectric object of precise measurement
Mueller matrix.Changchun University of Science and Technology proposes a kind of method for dividing amplitude type measurement smog medium Mueller matrix, saves
A large amount of experimentation, but used 4 detector systems huge, structure is complicated, aberration existing for optical system and each
The difference of parameter can all lead to the error of measurement result between detector, involve great expense.
Sanaz Alali et al. proposes a kind of Muller for using two light ball modulators respectively on incident and emitting light path
Matrix measuring system, James C.Gladish et al. propose one kind and use two liquid crystal respectively on incident and emitting light path
The Muller matrix measuring system of phase delay device, compared to dual rotary wave plate formula Muller matrix measuring system, though both methods
The step of so avoiding optical element in mechanicalness rotation-measuring system, however, there remains at least change in 4 input paths
Load on the voltage and 4 emitting light paths on light ball modulator or liquid crystal phase retardation device load in light ball modulator or
Voltage on liquid crystal phase retardation device, i.e. 16 voltage adjustment, realize the polarization state combination of 16 kinds of emergent lights.
Summary of the invention
The present invention proposes a kind of new Muller matrix measuring system and method, can efficiently and accurately measure target
Mueller matrix.
Solution of the invention is as follows：
The Muller matrix measuring system includes：The light source that sets gradually along optical path is polarized system, object to be measured and analyzing
System and computer processing system；The system that is polarized includes the perpendicular linear polarization piece set gradually along input path, the first liquid
Brilliant phase delay device and the second liquid crystal phase retardation device, the fast axle and horizontal direction angle of two liquid crystal phase retardation devices are distinguished
For 45 ° and 90 °；The analyzing system be the full polarization state in point aperture and meanwhile detection polarization camera (i.e. the polarization camera divide it is more
A optical channel corresponds respectively to four kinds of different polarization states), the light source meets：The polarised light being finally emitted through object to be measured covers
Build whole optical channels of the polarization camera；The computer processing system is for controlling load in two liquid crystal phase retardation devices
On voltage to realize the modulation for the polarization state for being incident on object to be measured glazing, and save the collected intensity map of camera, according to
Light intensity value calculates Muller matrix.
Based on above scheme, the present invention has also further made following optimization：
The incident beam of above-mentioned object to be measured is preferably collimated light beam.For ordinary light source, it specifically can be being polarized and be
The light issued before system to light source collimates, and is also possible to be collimated (such as setting collimating mirror) after being polarized system.When
So, for the purposes of the present invention, it is not required for being necessary for collimated light beam in fact, as long as and finally through object to be measured outgoing
Whole optical channels of polarised light covering polarization camera.
Further, the preferable laser light source of above-mentioned light-source system, and it is configured with beam-expanding system, to meet finally through to be measured
The polarised light of target outgoing covers whole optical channels of the polarization camera.In addition to this, other light sources can also be used, configure phase
The optical shaping system answered.
Using above-mentioned Muller matrix measuring system, primary voltage is loaded to two liquid crystal phase retardation devices, polarizes camera
The different intensity image of four width polarization states can be obtained simultaneously, pass through four of the voltage to load on two liquid crystal phase retardation devices
The change of four incident light polarization states is realized in secondary adjusting, corresponding to obtain totally 16 width polarization image, i.e. 16 groups of light intensity values, is carried out
Resolving obtains the Muller matrix of object to be measured.
The present invention has the following advantages that：
Movable part is not present in the Mueller matrix measuring system, does not need multiple rotary polarizing film or wave plate.?
One kind is polarized under polarization state while obtaining four width polarization images (0 °, 45 °, 90 °, right-hand circular polarization), and existing at least 16 times are grasped
It is reduced to 4 operations (changing the voltage of liquid crystal retarder), laboratory operating procedures is greatly reduced, realizes target Muller square
Quick, the accurate measurement of battle array.
Detailed description of the invention
Fig. 1 is the schematic diagram of dual rotary wave plate formula Mueller matrix measuring system；In figure, 1- light-source system, 2-, which is polarized, is
System, 201- polarizing film P1, 202-1/4 plectrum C1, 3- object to be measured, 4- analyzing system, 401- polarizing film P2, 402-1/4 plectrum
C2, 5- detector.
Fig. 2 is based on the system schematic for dividing aperture to polarize camera measurement Mueller matrix.
Fig. 3 is a kind of confocal face polarisation distribution schematic diagram of polarization camera for dividing aperture to polarize while detecting entirely；In figure, 1-
Light-source system, 2- beam-expanding system, 3- perpendicular linear polarization piece, 4-LCVR1,5-LCVR2,6- object to be measured, 7- polarize camera.
Specific embodiment
Below in conjunction with attached drawing, the invention will be further described：
Mueller matrix measuring system of the invention is as shown in Fig. 2, a He-Ne laser is expanded as light source in figure
The light that system comes out laser expands, a perpendicular linear polarization piece and two liquid crystal phase retardation devices LCVR1 and LCVR2
Composition is polarized system, and perpendicular linear polarization piece, which is used to modulated light source emergent light, becomes perpendicular linear polarization light, is existed by modulation load
Voltage on LCVR1 and LCVR2 realizes the modulation for being incident on the polarization state of target glazing, and the light intensity after target reflects is by a point hole
Polarization camera that the full polarization state of diameter detects simultaneously (i.e. the polarization camera divide multiple optical channels correspond respectively to four kinds it is different inclined
Polarization state) detection.
Scheme shown in Chinese patent ZL 201510777564.0 can be used in the specific design of above-mentioned polarization camera, can also be with
There is the polarization camera for dividing the full polarization state in aperture while detecting function using other.
For the scheme shown in the Chinese patent ZL 201510777564.0, Fig. 3 gives the confocal face polarization point of polarization camera
Cloth schematic diagram.Its Optical System Design is：Incident light is divided into four road light by one group of rhombic prism, and polarizing film is fixed on rhombic prism
The plane of incidence on, four road polarizing films are respectively 0 ° of azimutal polarization piece, 45 ° of azimutal polarization pieces, 90 ° of azimutal polarization pieces and a left side
Rounding polarizing film；It is focused by the full symmetric focusing system in four roads, and conjunction beam is carried out by another group of rhombic prism；Most
Afterwards, in four quadrants of a detector at corresponding four width polarization images.The four width polarization images cutting once obtained is registrated,
Obtain four width polarization images.
Principle based on present invention measurement Mueller matrix：
According to Fig.2, the emergent light Stokes vector S that CCD detection arrives after target reflectsoIt can be expressed as：
So(i)=Mp(i)MsMLCVR2MLCVR1Si (4)
MLCVR1And MLCVR2The respectively Mueller matrix of liquid crystal phase retardation device LCVR1 and LCVR2, Mp(i)To polarize phase
The Mueller matrix of the i-th channel (i=1,2,3,4) polarizing film, M in machinesFor object to be measured Mueller matrix, SiFor incident light
Stokes vector.
In measurement process, LCVR1 and LCVR2 fast axle and horizontal direction angle are respectively 45 ° and 90 °, due to incident light
It is modulated by a perpendicular linear polarization piece, therefore incident Stokes vector Sin=[1-100]T.Therefore from LCVR2 emergent light this
Lentor vector SLCVR2It can be expressed as
Wherein δ1And δ2It is the phase delay of two liquid crystal phase retardation devices respectively.It can be calculated from formula (5)
SLCVR2And δ1、δ2Relationship, and then obtain the polarization state SOP from LCVR2 emergent lightLCVR2, such as following table
1 SOP of tableLCVR2,SLCVR2,δ1, and δ2Relationship
16 elements of Mueller matrix in order to obtain at least need 16 groups of output intensities, and conventional method needs 16 times only
Vertical measurement obtains this 16 groups of light intensity.The polarization camera for being polarized while being detected entirely using above-mentioned point of aperture, can once obtain four
Width polarization image (0 °, 45 °, 90 ° and right-hand circular polarization), that is to say, that only need to adjust load on two phase delay devices
Voltage, realize incident light 4 polarization states change.
In conjunction with equation (4) and (5), the emergent light Stokes vector of detector detection is represented by
The Mueller matrix of known 0 ° of polarizing film, 45 ° of polarizing films, 90 ° of polarizing films and circular polarizing disk is respectively
Required 16 groups of intensity values are as shown in table 2.
2 16 groups of measurement intensity values of table
It is calculated using the 16 groups of light intensity detected, it is as follows to obtain target Mueller matrix
As can be seen that this method solves Mueller matrix each element convenience of calculation, expression formula is simple.
Since movable part being not present in the Mueller matrix measuring system, multiple rotary polarizing film or wave are not needed
Piece only needs the voltage of 4 change liquid crystal retarders, realizes the change of 4 incident light polarization states, therefore measurement result is more smart
Really.
Claims (4)
1. a kind of Muller matrix measuring system, which is characterized in that including：The light-source system that is set gradually along optical path, be polarized system,
Object to be measured and analyzing system and computer processing system；
The system that is polarized includes the perpendicular linear polarization piece set gradually along input path, the first liquid crystal phase retardation device and
Two liquid crystal phase retardation devices, the fast axle and horizontal direction angle of two liquid crystal phase retardation devices are respectively 45 ° and 90 °；
The analyzing system is the polarization camera of the full polarization state in point aperture while detection, and the light-source system meets：It is final through to
The polarised light for surveying target outgoing covers whole optical channels of the polarization camera；
The computer processing system be used to control voltage of the load on two liquid crystal phase retardation devices with realize be incident on to
The modulation of the polarization state of target glazing is surveyed, and saves the collected intensity map of camera, Muller matrix is calculated according to light intensity value.
2. Muller matrix measuring system according to claim 1, it is characterised in that：The incident beam of object to be measured is collimation
Light beam.
3. Muller matrix measuring system according to claim 2, it is characterised in that：The light-source system uses laser light
Source, and it is configured with beam-expanding system, to meet whole light that the polarised light being finally emitted through object to be measured covers the polarization camera
Channel.
4. a kind of measurement method of Muller matrix, it is characterised in that：Using Muller matrix measuring system described in claim 1,
Primary voltage is loaded to two liquid crystal phase retardation devices, polarization phase function obtains the different intensity image of four width polarization states simultaneously,
By four adjustings of the voltage to load on two liquid crystal phase retardation devices, that is, realize changing for four incident light polarization states
Become, it is corresponding to obtain totally 16 width polarization image, i.e. 16 groups of light intensity values, resolved the Muller matrix for obtaining object to be measured.
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| CN110261319A (en) * | 2019-06-24 | 2019-09-20 | 西安理工大学 | The device and measurement method of Mueller matrix spectrum are measured based on four times |
| CN110470399A (en) * | 2019-08-13 | 2019-11-19 | 天津大学 | Full Stokes self-calibration measuring method based on polarization camera intensity collection twice |
| CN110567883A (en) * | 2019-09-23 | 2019-12-13 | 西安理工大学 | System for measuring Mueller matrix spectrum in real time and measuring method thereof |
| CN110631806A (en) * | 2019-09-10 | 2019-12-31 | 中国科学院上海技术物理研究所 | Device and method for rapidly measuring phase delay amount of broadband wave plate |
| CN111323378A (en) * | 2020-04-10 | 2020-06-23 | 武汉万屏电子科技有限公司 | Mueller matrix polarization imaging system for pathological detection |
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| CN113624690A (en) * | 2021-07-19 | 2021-11-09 | 清华大学深圳国际研究生院 | Polarizer capable of realizing modulation of any polarization state and optimization method thereof |
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