CN108655086A - The regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor - Google Patents

The regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor Download PDF

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Publication number
CN108655086A
CN108655086A CN201810306112.8A CN201810306112A CN108655086A CN 108655086 A CN108655086 A CN 108655086A CN 201810306112 A CN201810306112 A CN 201810306112A CN 108655086 A CN108655086 A CN 108655086A
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China
Prior art keywords
quartz
insulator ring
cleaning
quartz insulator
drm
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Pending
Application number
CN201810306112.8A
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Chinese (zh)
Inventor
范银波
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Suzhou Kai Kai Technology Co Ltd
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Suzhou Kai Kai Technology Co Ltd
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Priority to CN201810306112.8A priority Critical patent/CN108655086A/en
Publication of CN108655086A publication Critical patent/CN108655086A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • B08B3/12Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations

Abstract

The invention discloses a kind of regeneration methods of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor, include the following steps:1) quartz insulator ring is taken, is soaked in water for cleaning 20 ~ 30 minutes;2) quartz insulator ring is taken out, first round ultrasonic cleaning is carried out;3) the second wheel ultrasonic cleaning is carried out;4) third round ultrasonic cleaning is carried out;5) high pressure cleaning showers are carried out to quartz insulator ring;6) it is sent into baking oven, quartz insulator ring is toasted 5 ~ 10 minutes;7) by being sent directly into cryogenic freezing room after being taken out in baking oven, rapid freezing, freezing duration 30 ~ 60 minutes are carried out to quartz insulator ring;8) quartz insulator ring is taken out, quartz insulator ring surface is beaten, warms naturally to room temperature, completes the regeneration to the quartz insulator ring.The regeneration method does not use any chemical reagents, passes through the physics principle to expand with heat and contract with cold, you can realizes to the cleaning of quartz insulator ring, regeneration, regeneration cost is low, energy conservation and environmental protection, environmentally friendly, pollution-free.

Description

The regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor
Technical field
The invention belongs to quartz insulator ring technical field of regeneration, specifically, being related to a kind of 8 cun of crystal round etching processing procedures of semiconductor The regeneration method of TD/DRM art quartz dead rings.
Background technology
Wafer(Wafer), it is the carrier for producing used in integrated circuits, refers to monocrystalline silicon wafer more.Monocrystalline silicon wafer is by common Silica sand refines, and polysilicon is made by dissolving, purification, distillation a series of measures, polysilicon is again through melting, monocrystalline nucleus lifting system At the silicon single crystal rod with certain crystalline orientation, silicon single crystal rod just becomes wafer after polishing, slice.Wafer is Most common semi-conducting material, by its diameter be divided into 4 inches, 5 inches, 6 inches, 8 inches, 12 inches 14 inches, 15 inches, 16 Inch ... 20 inches with first-class.Wafer is bigger, and producible IC is more on same disk, can reduce cost, but to material The requirement higher of technology and production technology.
For computer product, where chip can be described as its marrow, the grade of chip also just determines production after all The extra factors such as the performance and power consumption of product, calorific value, as the predecessor of chip, the quality and processing procedure of wafer, which just become, to disappear The person of expense and institute of manufacturer common concern.
During silicon wafer process, including etch process, that is, utilize photoetching technique and ion etching technology, retain barrier from Silicon nitride layer above layer.
It is wherein to have a weight based on the quartz insulator ring of 8 cun of crystal round etching processing procedure TD/DRM technique productions of semiconductor Product is wanted, in recent years, since production capacity does not catch up with the growth rate of demand so that the regeneration and recycling of quartz insulator ring, Gradually cause the concern of people.
The material of quartz insulator ring is based on quartz, and cleaning, regeneration for quartz, the current country is primarily present following special Sharp document:
China Patent Publication No.:102249522A discloses a kind of cleaning method of the quartz piece for photovoltaic production comprising Following steps:A)The temperature in stove is adjusted to 1150 DEG C~1200 DEG C first;B)It is inputted simultaneously into the furnace chamber of diffusion furnace The phosphorus oxychloride and flow that nitrogen that flow is 25-50L/min, flow are 0.5~2.5L/min are 0.8~3.4 The oxygen of L/min, input time are 120~300 minutes, and above-mentioned nitrogen, phosphorus oxychloride, the import of oxygen from diffusion furnace are defeated Enter, is exported again from the outlet of diffusion furnace by way of quartz piece, this kind of cleaning method is not only advantageous to keep the safety in production, but also can reduce Production cost.However, the cleaning method that the patent is provided, can clean quartz piece, be regenerated using various chemical reagent, The use of excessive chemical reagent, can cause environment the pollution for being difficult to reverse.
Invention content
Above-mentioned to solve the problems, such as, the purpose of the present invention is to provide a kind of 8 cun of crystal round etching processing procedure TD/ of semiconductor The regeneration method of DRM art quartz dead rings, the regeneration method do not use any chemical reagents, pass through the physics to expand with heat and contract with cold Learn principle, you can realize to the cleaning of quartz insulator ring, regeneration, regeneration cost is low, energy conservation and environmental protection, environmentally friendly, pollution-free.
In order to achieve the above objectives, the technical scheme is that:
A kind of regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor, the method includes as follows Step:
1) quartz insulator ring is taken, is positioned in rinse bath, is soaked in water for cleaning 20 ~ 30 minutes;
2) quartz insulator ring is taken out, the first supersonic wave cleaning machine is sent into, carries out first round ultrasonic cleaning, ultrasonic power 80 ~100KHz;
3) quartz insulator ring is taken out, the second supersonic wave cleaning machine is sent into, carries out the second wheel ultrasonic cleaning, ultrasonic power is 150~200KHz;
4) quartz insulator ring is taken out, third supersonic wave cleaning machine is sent into, carries out third round ultrasonic cleaning, ultrasonic power is 300~400KHz;
5) quartz insulator ring is taken out, high-pressure spraying machine is sent into, high pressure cleaning showers are carried out to quartz insulator ring;
6) the quartz insulator ring after high pressure cleaning showers is sent into baking oven, 700 ~ 800 DEG C of oven temperature is set, by quartz insulator ring Baking 5 ~ 10 minutes so that the fusing of quartz insulator ring surface attachment, liquefaction;
7) by the quartz insulator ring after high-temperature baking by being sent directly into cryogenic freezing room after being taken out in baking oven, with 40 ~ 50 DEG C/min Cooling rate be cooled to -30 ~ -20 DEG C, rapid freezing, freezing duration 30 ~ 60 minutes so that quartz are carried out to quartz insulator ring Insulating ring surface attachment lumps;
8) quartz insulator ring is taken out, beats quartz insulator ring surface so that surface attachments are crushed, fall off, and warm naturally to room Temperature completes the regeneration to the quartz insulator ring.
Further, the step 1) water for cleaning is deionized water.
Further, ultrasonic cleaning with water is ultra-pure water in step 2), 60 ~ 70 DEG C of water temperature, cleaning duration 4 ~ 6 minutes.
Further, ultrasonic cleaning with water is deionized water in step 3), and water temperature is 60 ~ 80 DEG C, when cleaning a length of 5 ~ 10 minutes.
Further, ultrasonic cleaning with water is ultra-pure water in step 4), 70 ~ 80 DEG C of water temperature, and when cleaning is 8 ~ 12 points a length of Clock.
Further, step 5) carries out high pressure cleaning showers, high-pressure nozzle injection using high-pressure nozzle to quartz insulator ring Pressure is 0.5 ~ 2MPa.
Further, quartz insulator ring is cooled to -30 ~ -20 DEG C by step 7) using dry ice or liquid nitrogen.
Further, quartz insulator ring set is set on a shaft, shaft table by step 5) during high pressure cleaning showers Face is provided with the supporting rod for being used to support quartz insulator ring, shaft average rate rotation so that fully sprayed quartz insulator ring periphery Leaching cleaning.
The invention has the advantages that:
The regeneration method carries out ultrasonication first by three-wheel ultrasonic cleaning to quartz insulator ring surface attachment, Then it is toasted at a high temperature of 700 ~ 800 DEG C, then uses dry ice or liquid nitrogen by quartz insulator ring rapid cooling to -30 ~ -20 DEG C, It can be effectively peeled off the attachment for being attached to quartz insulator ring surface, whole process does not use any chemical reagents, passes through heat expansion The physics principle of shrinkage, you can realize to the cleaning of quartz insulator ring, regeneration, regeneration cost is low, energy conservation and environmental protection, to environment friend It is good, pollution-free.
Specific implementation mode
With reference to specific embodiment, the present invention is described in detail.Following embodiment will be helpful to the technology of this field Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that the ordinary skill of this field For personnel, without departing from the inventive concept of the premise, various modifications and improvements can be made.These belong to the present invention Protection domain.
A kind of regeneration side of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor provided by the present invention Method, described method includes following steps:
1) quartz insulator ring is taken, is positioned in rinse bath, is soaked in water for cleaning 20 ~ 30 minutes;
2) quartz insulator ring is taken out, the first supersonic wave cleaning machine is sent into, carries out first round ultrasonic cleaning, ultrasonic power 80 ~100KHz;
3) quartz insulator ring is taken out, the second supersonic wave cleaning machine is sent into, carries out the second wheel ultrasonic cleaning, ultrasonic power is 150~200KHz;
4) quartz insulator ring is taken out, third supersonic wave cleaning machine is sent into, carries out third round ultrasonic cleaning, ultrasonic power is 300~400KHz;
5) quartz insulator ring is taken out, high-pressure spraying machine is sent into, high pressure cleaning showers are carried out to quartz insulator ring;
6) the quartz insulator ring after high pressure cleaning showers is sent into baking oven, 700 ~ 800 DEG C of oven temperature is set, by quartz insulator ring Baking 5 ~ 10 minutes so that the fusing of quartz insulator ring surface attachment, liquefaction;
7) by the quartz insulator ring after high-temperature baking by being sent directly into cryogenic freezing room after being taken out in baking oven, with 40 ~ 50 DEG C/minute The cooling rate of clock is cooled to -30 ~ -20 DEG C, and rapid freezing, freezing duration 30 ~ 60 minutes so that stone are carried out to quartz insulator ring English insulating ring surface attachment lumps;
8) quartz insulator ring is taken out, beats quartz insulator ring surface so that surface attachments are crushed, fall off, and warm naturally to room Temperature completes the regeneration to the quartz insulator ring.
Further, the step 1) water for cleaning is deionized water.
Further, ultrasonic cleaning with water is ultra-pure water in step 2), 60 ~ 70 DEG C of water temperature, cleaning duration 4 ~ 6 minutes.
Further, ultrasonic cleaning with water is deionized water in step 3), and water temperature is 60 ~ 80 DEG C, when cleaning a length of 5 ~ 10 minutes.
Further, ultrasonic cleaning with water is ultra-pure water in step 4), 70 ~ 80 DEG C of water temperature, and when cleaning is 8 ~ 12 points a length of Clock.
Further, step 5) carries out high pressure cleaning showers, high-pressure nozzle injection using high-pressure nozzle to quartz insulator ring Pressure is 0.5 ~ 2MPa.
Further, quartz insulator ring is cooled to -30 ~ -20 DEG C by step 7) using dry ice or liquid nitrogen.
Further, quartz insulator ring set is set on a shaft, shaft table by step 5) during high pressure cleaning showers Face is provided with the supporting rod for being used to support quartz insulator ring, shaft average rate rotation so that fully sprayed quartz insulator ring periphery Leaching cleaning.
It should be noted that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting.Although with reference to compared with Good embodiment describes the invention in detail, it will be understood by those of ordinary skill in the art that, it can be to the technology of invention Scheme is modified or replaced equivalently, and without departing from the range of technical solution of the present invention, should all cover the power in the present invention In sharp claimed range.

Claims (8)

1. a kind of regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor, which is characterized in that described Method includes the following steps:
1) quartz insulator ring is taken, is positioned in rinse bath, is soaked in water for cleaning 20 ~ 30 minutes;
2) quartz insulator ring is taken out, the first supersonic wave cleaning machine is sent into, carries out first round ultrasonic cleaning, ultrasonic power 80 ~100KHz;
3) quartz insulator ring is taken out, the second supersonic wave cleaning machine is sent into, carries out the second wheel ultrasonic cleaning, ultrasonic power is 150~200KHz;
4) quartz insulator ring is taken out, third supersonic wave cleaning machine is sent into, carries out third round ultrasonic cleaning, ultrasonic power is 300~400KHz;
5) quartz insulator ring is taken out, high-pressure spraying machine is sent into, high pressure cleaning showers are carried out to quartz insulator ring;
6) the quartz insulator ring after high pressure cleaning showers is sent into baking oven, 700 ~ 800 DEG C of oven temperature is set, by quartz insulator ring Baking 5 ~ 10 minutes so that the fusing of quartz insulator ring surface attachment, liquefaction;
7) by the quartz insulator ring after high-temperature baking by being sent directly into cryogenic freezing room after being taken out in baking oven, with 40 ~ 50 DEG C/min Cooling rate be cooled to -30 ~ -20 DEG C, rapid freezing, freezing duration 30 ~ 60 minutes so that quartz are carried out to quartz insulator ring Insulating ring surface attachment lumps;
8) quartz insulator ring is taken out, beats quartz insulator ring surface so that surface attachments are crushed, fall off, and warm naturally to room Temperature completes the regeneration to the quartz insulator ring.
2. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, the step 1) water for cleaning is deionized water.
3. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, ultrasonic cleaning with water is ultra-pure water in step 2), and 60 ~ 70 DEG C of water temperature, cleaning duration 4 ~ 6 minutes.
4. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, ultrasonic cleaning with water is deionized water in step 3), water temperature is 60 ~ 80 DEG C, and when cleaning is 5 ~ 10 minutes a length of.
5. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, ultrasonic cleaning with water is ultra-pure water in step 4), 70 ~ 80 DEG C of water temperature, when cleaning is 8 ~ 12 minutes a length of.
6. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, step 5) carries out high pressure cleaning showers using high-pressure nozzle to quartz insulator ring, high-pressure nozzle injection pressure is 0.5~2MPa。
7. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, quartz insulator ring is cooled to -30 ~ -20 DEG C by step 7) using dry ice or liquid nitrogen.
8. the regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor according to claim 1, It is characterized in that, during high pressure cleaning showers, quartz insulator ring set is set on a shaft for step 5), axle surface setting It is useful for the supporting rod of support quartz insulator ring, shaft average rate rotation so that quartz insulator ring periphery obtains abundant cleaning showers.
CN201810306112.8A 2018-04-08 2018-04-08 The regeneration method of 8 cun of crystal round etching processing procedure TD/DRM art quartz dead rings of semiconductor Pending CN108655086A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112845397A (en) * 2020-12-31 2021-05-28 河南科技大学第一附属医院 Dry cleaning type cleaner for glass cutting pipe

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3948679A (en) * 1974-11-27 1976-04-06 Halliburton Company Cleaning liquid systems including controlled heating and cooling of the liquid
US4777804A (en) * 1987-08-26 1988-10-18 Texas Instruments Incorporated Method and apparatus for easing surface particle removal by size increase
JPH03152928A (en) * 1989-11-09 1991-06-28 Sony Corp Cleaning up process
US6341997B1 (en) * 2000-08-08 2002-01-29 Taiwan Semiconductor Manufacturing Company, Ltd Method for recycling a polishing pad conditioning disk
CN1850360A (en) * 2005-12-02 2006-10-25 北京北方微电子基地设备工艺研究中心有限责任公司 Washing method for removing polymer film adhered on surface of anode alumimium-oxide part
CN101204706A (en) * 2006-12-21 2008-06-25 北京北方微电子基地设备工艺研究中心有限责任公司 Cleaning method of quartz material parts
CN101439341A (en) * 2007-11-19 2009-05-27 北京北方微电子基地设备工艺研究中心有限责任公司 Method for cleaning components of semi-conductor processing equipment
CN101651085A (en) * 2008-08-14 2010-02-17 中芯国际集成电路制造(北京)有限公司 Device and method for cleaning chip
CN101695696A (en) * 2009-09-23 2010-04-21 镇江市港南电子有限公司 Method for cleaning silicon chip
CN102674372A (en) * 2012-05-04 2012-09-19 武汉理工大学 Purification method for high-purity quartz with ultra-low metal elements
CN103464412A (en) * 2012-06-05 2013-12-25 株式会社电装 Washing method and apparatus for removing contaminations from article
CN105177614A (en) * 2015-08-19 2015-12-23 苏州吴江春宇电子股份有限公司 High-temperature degreasing tank for cleaning production line
CN106269713A (en) * 2015-05-19 2017-01-04 四平维克斯换热设备有限公司 The hot setting seal gasket of heat-exchangers of the plate type and the separation method of plate
CN107171652A (en) * 2017-05-24 2017-09-15 广东惠伦晶体科技股份有限公司 A kind of change stone roller technique of quartz wafer
CN107364870A (en) * 2017-08-30 2017-11-21 宁晋松宫电子材料有限公司 A kind of efficient impurity removal crushing process of fritting bottom seed crystal
CN107460489A (en) * 2017-07-04 2017-12-12 河池桂嘉知识产权服务有限公司 The method for removing steel surface rusty stain

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3948679A (en) * 1974-11-27 1976-04-06 Halliburton Company Cleaning liquid systems including controlled heating and cooling of the liquid
US4777804A (en) * 1987-08-26 1988-10-18 Texas Instruments Incorporated Method and apparatus for easing surface particle removal by size increase
JPH03152928A (en) * 1989-11-09 1991-06-28 Sony Corp Cleaning up process
US6341997B1 (en) * 2000-08-08 2002-01-29 Taiwan Semiconductor Manufacturing Company, Ltd Method for recycling a polishing pad conditioning disk
CN1850360A (en) * 2005-12-02 2006-10-25 北京北方微电子基地设备工艺研究中心有限责任公司 Washing method for removing polymer film adhered on surface of anode alumimium-oxide part
CN101204706A (en) * 2006-12-21 2008-06-25 北京北方微电子基地设备工艺研究中心有限责任公司 Cleaning method of quartz material parts
CN101439341A (en) * 2007-11-19 2009-05-27 北京北方微电子基地设备工艺研究中心有限责任公司 Method for cleaning components of semi-conductor processing equipment
CN101651085A (en) * 2008-08-14 2010-02-17 中芯国际集成电路制造(北京)有限公司 Device and method for cleaning chip
CN101695696A (en) * 2009-09-23 2010-04-21 镇江市港南电子有限公司 Method for cleaning silicon chip
CN102674372A (en) * 2012-05-04 2012-09-19 武汉理工大学 Purification method for high-purity quartz with ultra-low metal elements
CN103464412A (en) * 2012-06-05 2013-12-25 株式会社电装 Washing method and apparatus for removing contaminations from article
CN106269713A (en) * 2015-05-19 2017-01-04 四平维克斯换热设备有限公司 The hot setting seal gasket of heat-exchangers of the plate type and the separation method of plate
CN105177614A (en) * 2015-08-19 2015-12-23 苏州吴江春宇电子股份有限公司 High-temperature degreasing tank for cleaning production line
CN107171652A (en) * 2017-05-24 2017-09-15 广东惠伦晶体科技股份有限公司 A kind of change stone roller technique of quartz wafer
CN107460489A (en) * 2017-07-04 2017-12-12 河池桂嘉知识产权服务有限公司 The method for removing steel surface rusty stain
CN107364870A (en) * 2017-08-30 2017-11-21 宁晋松宫电子材料有限公司 A kind of efficient impurity removal crushing process of fritting bottom seed crystal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112845397A (en) * 2020-12-31 2021-05-28 河南科技大学第一附属医院 Dry cleaning type cleaner for glass cutting pipe

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Application publication date: 20181016