CN108507970B - Terahertz test sample device - Google Patents
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- CN108507970B CN108507970B CN201810570340.6A CN201810570340A CN108507970B CN 108507970 B CN108507970 B CN 108507970B CN 201810570340 A CN201810570340 A CN 201810570340A CN 108507970 B CN108507970 B CN 108507970B
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- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 238000007747 plating Methods 0.000 claims abstract description 7
- 239000010931 gold Substances 0.000 claims abstract description 6
- 229910052737 gold Inorganic materials 0.000 claims abstract description 6
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 5
- 238000007664 blowing Methods 0.000 claims description 9
- 238000007789 sealing Methods 0.000 claims description 7
- 239000007789 gas Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 230000000694 effects Effects 0.000 description 9
- 238000010521 absorption reaction Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 230000004071 biological effect Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/37—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection
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- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention provides a terahertz test sample device, and relates to the technical field of test sample devices. The terahertz test sample device includes: the first half-ellipsoidal cover is provided with a first opening and a second opening, and the first opening is used for being connected with the terahertz transmitting device. The second semi-ellipsoidal cover is provided with a third opening in the long axis direction, a first hole and a second hole are further formed near the third opening, the third opening is detachably connected with the second opening, and gold plating layers are arranged on the inner surfaces of the second semi-ellipsoidal cover and the first semi-ellipsoidal cover. The sample containing device is arranged on the inner side of the first hole of the second semi-ellipsoidal cover. And the air inlet device is arranged at the outer side of the second hole of the second semi-ellipsoidal cover, and the air flow direction during air inlet is towards the position of the sample. The terahertz test sample device is simple in structure and easy to operate in function, so that the sample can absorb terahertz more comprehensively, and the accuracy of a measurement result is improved.
Description
Technical Field
The invention relates to the technical field of test sample devices, in particular to a terahertz test sample device.
Background
Terahertz refers to electromagnetic radiation waves having a frequency in the range of 0.1THz to 10 THz. When terahertz acts on a specific sample, the interaction of the accurate radiation quantity of the terahertz and the specific sample has important value for obtaining a corresponding action rule.
The terahertz quantum cascade laser (THz QCL) is a unipolar light source based on electron resonance tunneling and intersubband transition in a superlattice or a coupled multi-quantum well, the radiation frequency of the terahertz quantum cascade laser can be regulated and controlled through energy band and wave function design, and the terahertz quantum cascade laser has the advantages of high response speed, small volume, convenience in integration and the like. In the biological effect and photoelectric conversion effect test system based on THz QCL, the sample biological effect and the photoelectric conversion effect are obtained by the interaction of terahertz waves radiated by the THz QCL and a specific sample.
The main sources of errors in the experimental process are the beam quality of terahertz waves radiated by the THz QCL, the refraction and reflection of the sample, and artifacts. The beam quality of THz QCL radiated terahertz waves is affected by the device geometry, operating temperature, operating current, etc., which results in a certain beam quality change. The refraction, reflection and absorption of the sample are closely related to the sample surface, the sample type, the collimation degree of terahertz waves, and the like. Factors in these two aspects have a large influence on the repeatability of measurement data of different samples, different moments, etc., thereby generating a large measurement error.
The existing test system based on THz QCL biological effect and photoelectric conversion effect can complete corresponding measurement, but still has some problems:
the structure of the sample testing device is too simple;
because of the influence of terahertz wave beam quality change, sample surface refraction and reflection and the like, the sample cannot completely absorb the incident terahertz wave, and the measurement accuracy cannot be realized.
Disclosure of Invention
The invention aims to provide a terahertz test sample device which has the advantages of simple structure, easy function, complete absorption of terahertz, accurate and reliable measurement result, and more usable places due to the simple structure and convenient movement.
Embodiments of the invention is realized as follows:
an embodiment of the present invention provides a terahertz test sample device, including:
the terahertz transmitter comprises a first semi-ellipsoidal cover, a second semi-ellipsoidal cover and a terahertz transmitter, wherein the first semi-ellipsoidal cover is provided with a first opening and a second opening in the long axis direction, and the first opening is used for being connected with the terahertz transmitter;
the second semi-ellipsoidal cover is provided with a third opening matched with the second opening in size in the long axis direction, a first hole and a second hole are further formed near the third opening, the second semi-ellipsoidal cover and the first semi-ellipsoidal cover are detachably connected at the positions of the third opening and the second opening, and gold plating layers are arranged on the inner surfaces of the second semi-ellipsoidal cover and the first semi-ellipsoidal cover;
the sample containing device is arranged on the inner side of the first hole of the second semi-ellipsoidal cover and is opposite to the first opening when the sample is contained;
and the air inlet device is arranged on the outer side of the position of the second hole of the second semi-ellipsoidal cover, and the air flow direction during air inlet is towards the position of the sample.
In addition, the terahertz test sample device provided by the embodiment of the invention can also have the following additional technical characteristics:
in an alternative embodiment of the present invention, the first hole and the second hole are located in a same cross-section circle of the second semi-ellipsoidal cover, and an included angle of 90 ° is formed between a connection line between the first hole and the circle center and a connection line between the second hole and the circle center.
In an alternative embodiment of the present invention, the sample containing device includes a base, a support column, and a sample holder, the base is connected to the second semi-ellipsoidal cover, the sample holder is connected to the base through the support column, and the sample containing device has a hollow channel penetrating the base, the support column, and the sample holder, and the hollow channel is used for allowing the detection device to detect sample properties.
In an alternative embodiment of the invention, the cross-section of the base and/or the sample holder is square or circular.
In an alternative embodiment of the present invention, the support columns are cylinders or prisms.
In an alternative embodiment of the present invention, the sample holder is rotatably disposed on the support column, the sample holding device further includes a fan blade of the sample holder Zhou Sheyu, and the air inlet device can blow the fan blade and rotate the sample holder.
In an alternative embodiment of the invention, the air inlet means comprises an air pipe means for connection to an air supply source and a sealing connection, the air pipe means being connected to the second semi-ellipsoidal cover by means of the sealing connection and being adapted to blow air towards the sample.
In an alternative embodiment of the present invention, the air inlet device further includes an auxiliary air pipe, the auxiliary air pipe is located in the air pipe device and is used for being connected with an air supply air source, the air flow rate of the auxiliary air pipe is greater than the air flow rate of the air pipe device, the sample containing device includes a base, a support pillar, a sample seat and a fan blade, the base is connected with the second semi-ellipsoidal cover, the sample seat is connected with the base through the support pillar, the fan blade Zhou Sheyu is used for blowing the fan blade and enabling the sample seat to rotate on the support pillar.
In an alternative embodiment of the invention, the gas inlet means is for blowing in an inert gas.
In an alternative embodiment of the present invention, the diameter of the first opening of the first semi-elliptical shield is 15mm, the diameter of the second opening is 104.5mm, and the semi-major axis of the semi-elliptical cross section along the major axis direction is 96mm.
The beneficial effects of the invention are as follows:
the terahertz test sample device has a simple structure and an easy function, so that the terahertz waves radiated by the THz QCL are completely absorbed by the sample, and the measurement result is accurate and reliable. The method is particularly suitable for measuring biological effects, photoelectric conversion effects and the like of samples.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of a terahertz test sample apparatus provided in embodiment 1 of the present invention;
FIG. 2 is an exploded view of FIG. 1;
FIG. 3 is a schematic view of the first semi-elliptical shield of FIG. 2 with the first semi-elliptical shield removed;
fig. 4 is a schematic view of the terahertz test sample apparatus of embodiment 2 of the present invention with the first semi-ellipsoidal cover removed.
Icon: a 100-terahertz test sample device; 10-a first semi-ellipsoidal cover; 11-a first opening; 13-a second opening; 30-a second semi-ellipsoidal cover; 31-a third opening; 50-sample holding means; 51-a base; 53-support columns; 55-sample holder; 57-flabellum; 70-an air intake device; 71-tracheal device; 73-sealing the connection; 75-auxiliary air pipe; 101-gold plating; 200-sample.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
In the description of the present invention, it should be noted that, the azimuth or positional relationship indicated by the terms "inner", "outer", etc. are based on the azimuth or positional relationship shown in the drawings, or the azimuth or positional relationship in which the inventive product is conventionally put in use, are merely for convenience of describing the present invention and simplifying the description, and are not indicative or implying that the apparatus or element to be referred to must have a specific azimuth, be configured and operated in a specific azimuth, and therefore, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like, are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
In the description of the present invention, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed", "connected" and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In the present invention, unless expressly stated or limited otherwise, a first feature may include first and second features directly contacting each other, either above or below a second feature, or through additional features contacting each other, rather than directly contacting each other. Moreover, the first feature being above, over, and on the second feature includes the first feature being directly above and obliquely above the second feature, or simply that the first feature level is higher than the second feature level. The first feature being below, beneath, and beneath the second feature includes the first feature being directly below and obliquely below the second feature, or simply indicates that the first feature is less level than the second feature.
Example 1
Referring to fig. 1 to 3, the present embodiment provides a terahertz test sample apparatus 100, which includes:
a first semi-ellipsoidal cover 10, the first semi-ellipsoidal cover 10 having a first opening 11 and a second opening 13 in a long axis direction, the first opening 11 being for connection with a terahertz transmitting device;
the second semi-ellipsoidal cover 30, the second semi-ellipsoidal cover 30 has a third opening 31 with a size matched with the second opening 13 in the long axis direction, a first hole and a second hole are further formed near the third opening 31, the second semi-ellipsoidal cover 30 and the first semi-ellipsoidal cover 10 are detachably connected at the positions of the third opening 31 and the second opening 13, and the inner surfaces of the second semi-ellipsoidal cover 30 and the first semi-ellipsoidal cover 10 are provided with a gold plating layer 101;
the sample containing device 50, wherein the sample containing device 50 is arranged at the inner side of the first hole of the second semi-ellipsoidal cover 30 and is opposite to the first opening 11 when the sample 200 is contained;
the air inlet device 70, the air inlet device 70 is disposed outside the second hole of the second semi-ellipsoidal cover 30, and the air flow direction during air inlet is toward the sample 200.
The first opening 11 of the first semi-elliptical shield 10 has a diameter of 15mm, the second opening 13 has a diameter of 104.5mm, and the semi-major axis of the semi-elliptical cross section along the major axis direction is 96mm. The second semi-ellipsoidal cover 30 has an overall shape and size that is compatible with the first semi-ellipsoidal cover 10.
The second opening 13 and the third opening 31 adopt a spigot design, and can be connected by screw threads or clamped. On the one hand, the reliability of connection is guaranteed, and on the other hand, terahertz is guaranteed not to escape from the connection place as far as possible.
The terahertz emission device can refer to the existing terahertz emission device, such as a time-domain spectrum source, a superconductive terahertz radiation source, and the like, and will not be described herein.
Specifically, the first hole and the second hole are located in the same cross-section circle of the second semi-ellipsoidal cover 30, and an included angle of 90 ° is formed between the connection line of the first hole and the circle center and the connection line of the second hole and the circle center.
In detail, the first hole and the second hole are located in the same cross-sectional circle of the second semi-ellipsoidal cover 30, that is, they are located at the same latitude. The 90 ° included angle designed in this embodiment is a preferred angle, and other angles can also function, as long as the gas that can cause the reaction to generate gas that may affect the terahertz wave can be blown away.
In the present embodiment, the gas inlet means 70 is used for blowing in inert gas. Such as common N 2 、Ar 2 Such an inert gas can prevent the combustible substance from reacting with oxygen to burn or otherwise possibly being dangerous or affecting the measurement result during pyrolysis.
Specifically, the air inlet device 70 includes an air pipe device 71 and a sealing connector 73, the air pipe device 71 is used for being connected with an air supply source, and the air pipe device 71 is connected with the second semi-ellipsoidal cover 30 through the sealing connector 73 and used for blowing air to the sample 200.
Specifically, the sample containing device 50 includes a base 51, a support column 53 and a sample holder 55, the base 51 is connected with the second semi-ellipsoidal cover 30, the sample holder 55 is connected with the base 51 through the support column 53, the sample containing device 50 has a hollow channel penetrating through the base 51, the support column 53 and the sample holder 55, and the hollow channel is used for allowing the detection device to detect the performance of the sample 200.
The detection device may refer to some existing terahertz detectors, such as a terahertz normal-temperature detector, and the like, and will not be described herein.
In detail, the base 51 and/or the sample holder 55 has a square or circular cross section. In this embodiment, both the base 51 and the sample holder 55 are square in cross-section.
In detail, the support column 53 is a cylinder or a prism. In this embodiment, the support is cylindrical.
In detail, the bottom of the base 51 is attached to the inner surface of the second semi-ellipsoidal cover 30, and the two can be fixed by screws or buttons.
The principle of this embodiment is:
the first opening 11 and the sample 200 are opposite, after the terahertz is emitted by the terahertz emitting device, the incident terahertz can directly act with the sample 200, and due to the ellipsoidal structure formed by the first semi-ellipsoidal cover 10 and the second semi-ellipsoidal cover 30 and the inner gold-plated layer 101, the incident terahertz can be effectively reflected and finally act on the sample 200, so that the terahertz absorption effect of the sample 200 is greatly improved, and even the full absorption effect is achieved.
In this way, the measurement data for the sample 200 becomes more accurate.
In combination with the action of the air inlet device 70, the disturbance to the sample 200 in absorbing terahertz can be eliminated as much as possible.
Further guaranteeing the accuracy of the measurement result.
In addition, the device has a simple structure, and is more convenient to move compared with the general terahertz test sample device 100, so that the device can be used in more places, has smaller limitation and better practicability.
The terahertz test sample device 100 of this embodiment, with its ellipsoidal structure and the design of gold plating inside, enables incident terahertz to effectively reflect and act on the sample 200, greatly improving the absorption effect, thereby improving the measurement accuracy. Compared with the prior art, the structure is simpler, and has good use effect.
Example 2
Referring to fig. 4, the present embodiment also provides a terahertz test sample device 100, and compared with embodiment 1, the terahertz test sample device 100 of the present embodiment is mainly characterized in that:
the sample holder 55 is rotatably disposed on the support 53, the sample holding device 50 further includes a fan blade 57 of the sample holder 55 of Zhou Sheyu, and the air inlet device 70 can blow the fan blade 57 and rotate the sample holder 55.
The air inlet device 70 further comprises a secondary air pipe 75, the secondary air pipe 75 is located in the air pipe device 71 and is used for being connected with an air supply source, the air flow rate of the secondary air pipe 75 is larger than that of the air pipe device 71, and the secondary air pipe 75 is used for blowing the fan blades 57 and enabling the sample holder 55 to rotate on the supporting column 53.
Other structures and functions of the terahertz test sample apparatus 100 can be referred to in embodiment 1.
The principle of this embodiment is:
by designing the sample holder 55 to be rotatable, the sample 200 can be rotated with the rotation of the sample holder 55 in combination with the interaction of the air flow of the secondary air tube 75 with the fan blades 57 on the sample holder 55.
By combining the reflection effect of the gold-plating layer 101, the terahertz absorption of the sample 200 can be improved, and the absorption comprehensiveness is good, so that the measurement accuracy is improved.
The secondary air tube 75 is provided with an air outlet direction toward the fan blade 57, and since the air pressure is greater than that of the air tube device 71, the flow rate of the air is faster, and the air is prevented from being influenced by the air of the air tube device 71 as much as possible, thereby blowing the fan blade 57.
And because the fan blade 57 is blown, the auxiliary air pipe 75 does not directly act on the sample 200, and after the air hits the fan blade 57, the speed of the air is reduced and then the air escapes to the periphery, so that the impact force of the air does not influence the placement stability of the sample 200.
In summary, the terahertz test sample device 100 of the invention has simple structure and easy function, so that the sample 200 can absorb terahertz more comprehensively, and the accuracy of the measurement result is improved.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. A terahertz test sample device, characterized by comprising:
the terahertz transmitter comprises a first semi-ellipsoidal cover, a second semi-ellipsoidal cover and a terahertz transmitter, wherein the first semi-ellipsoidal cover is provided with a first opening and a second opening in the long axis direction, and the first opening is used for being connected with the terahertz transmitter;
the second semi-ellipsoidal cover is provided with a third opening matched with the second opening in size in the long axis direction, a first hole and a second hole are further formed near the third opening, the second semi-ellipsoidal cover and the first semi-ellipsoidal cover are detachably connected at the positions of the third opening and the second opening, and gold plating layers are arranged on the inner surfaces of the second semi-ellipsoidal cover and the first semi-ellipsoidal cover;
the sample containing device is arranged on the inner side of the first hole of the second semi-ellipsoidal cover and is opposite to the first opening when the sample is contained;
the air inlet device is arranged on the outer side of the position where the second hole of the second semi-ellipsoidal cover is located, and the air flow direction during air inlet is towards the position where the sample is located, the first hole and the second hole are located on the same cross-section circle of the second semi-ellipsoidal cover, and an included angle of 90 degrees is formed between the connecting line of the first hole and the circle center and the connecting line of the second hole and the circle center;
the sample containing device comprises a base, a support column and a sample seat, wherein the base is connected with the second semi-ellipsoidal cover, the sample seat is connected with the base through the support column, the sample containing device is provided with a hollow channel penetrating through the base, the support column and the sample seat, and the hollow channel is used for enabling the detection device to detect sample performance.
2. The terahertz test sample device according to claim 1, wherein the base and/or the sample holder is square or circular in cross section.
3. The terahertz test sample device according to claim 1, wherein the support column is a cylinder or a prism.
4. The terahertz test sample device according to claim 1, wherein the sample holder is rotatably disposed on the support column, the sample holding device further comprises a fan blade of the sample holder Zhou Sheyu, and the air inlet device can blow the fan blade and rotate the sample holder.
5. The terahertz test sample device according to claim 1, wherein the air intake device includes an air pipe device for connection with an air supply source and a sealing connection, the air pipe device being connected with the second semi-ellipsoidal cover through the sealing connection and for blowing air toward the sample.
6. The terahertz test sample apparatus according to claim 5, wherein the air intake apparatus further comprises a secondary air pipe located in the air pipe apparatus and used for being connected with an air supply source, the air flow rate of the secondary air pipe is larger than that of the air pipe apparatus, the sample holding apparatus comprises a base, a support column, a sample seat and a fan blade, the base is connected with the second semi-ellipsoidal cover, the sample seat is connected with the base through the support column, the fan blade Zhou Sheyu is used for blowing the fan blade and enabling the sample seat to rotate at the support column.
7. The terahertz test sample device according to claim 1, 5 or 6, wherein the gas inlet device is for blowing in inert gas.
8. The terahertz test sample device according to claim 1, wherein the diameter of the first opening of the first semi-ellipsoidal cover is 15mm, the diameter of the second opening is 104.5mm, and the semi-major axis of the semi-elliptical cross section along the major axis direction is 96mm.
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| CN201810570340.6A CN108507970B (en) | 2018-06-05 | 2018-06-05 | Terahertz test sample device |
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| CN201810570340.6A CN108507970B (en) | 2018-06-05 | 2018-06-05 | Terahertz test sample device |
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