CN208334190U - terahertz test sample device - Google Patents
terahertz test sample device Download PDFInfo
- Publication number
- CN208334190U CN208334190U CN201820866612.2U CN201820866612U CN208334190U CN 208334190 U CN208334190 U CN 208334190U CN 201820866612 U CN201820866612 U CN 201820866612U CN 208334190 U CN208334190 U CN 208334190U
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- semielliptical
- cover
- sample
- opening
- terahertz
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- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 239000010931 gold Substances 0.000 claims abstract description 7
- 229910052737 gold Inorganic materials 0.000 claims abstract description 7
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000007789 gas Substances 0.000 claims description 31
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 22
- 241000883990 Flabellum Species 0.000 claims description 17
- 210000003437 trachea Anatomy 0.000 claims description 15
- 238000001514 detection method Methods 0.000 claims description 4
- 238000007664 blowing Methods 0.000 claims description 3
- 230000001680 brushing effect Effects 0.000 claims description 3
- 239000011261 inert gas Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 238000010521 absorption reaction Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000004071 biological effect Effects 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000011514 reflex Effects 0.000 description 2
- 241001075561 Fioria Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005404 monopole Effects 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The utility model provides a kind of Terahertz test sample device, is related to test sample device technical field.Terahertz test sample device includes: the first semielliptical cover, and the first semielliptical cover has the first opening and the second opening, and the first opening with terahertz sources device for connecting.Second semielliptical cover, second semielliptical covers on long axis direction and is open with third, also there is the first hole and the second hole near third opening, third opening is detachably connected with the second opening, and the inner surface of the second semielliptical cover and the first semielliptical cover has Gold plated Layer.Sample holding device, sample holding device are set to the inside at the first hole place of the second semielliptical cover.Gas flow when inlet duct, inlet duct are set to the outside located where the second hole of the second semielliptical cover and air inlet is towards at sample place.Terahertz test sample device structure is simple, and function is easy so that sample to the absorption of Terahertz more fully, improve the accuracy of measurement result.
Description
Technical field
The utility model relates to test sample device technical fields, in particular to a kind of Terahertz test sample
It sets.
Background technique
Terahertz refers to frequency band in the electromagnetic radiation as waves of 0.1THz to 10THz.When Terahertz is acted on specific sample,
The accurate amount of radiation of Terahertz interacts action rule corresponding for acquisition with important value with specific sample.
Terahertz quantum cascaded laser (THz QCL) is a kind of based on electron resonance in superlattices or coupling multiple quantum wells
The monopole light source of tunnelling and intersubband transitions, radiation frequency can be regulated and controled by energy band and wave function design, have response
The advantages that speed is high, small in size, convenient for integrating.Based on THz QCL biological effect, in photoelectric conversion effect test macro,
Sample biological effect, the THz wave for being obtained by THz QCL radiation of photoelectric conversion effect and specific sample interact
It generates.
Main source of error during the experiment have THz QCL radiation THz wave beam quality, sample refraction and
Reflection and human factor.THz QCL radiates the beam quality of THz wave by device geometries, operating temperature, operating current
Deng influence can generate the change of certain beam quality.It the refraction of sample, reflection and absorbs and sample surfaces, sample type, too
The collimation of Hertz wave etc. is closely related.The repeatability of factor in terms of the two to different samples, different moments measurement data
Etc. there is larger impact, biggish measurement error is thus generated.
It is existing to complete to measure accordingly based on THz QCL biological effect, the test macro of photoelectric conversion effect, still
There are still some problems:
Sample testing device structure is too simple；
Due to the influence of the variation of THz wave beam quality, sample surfaces refraction and reflection etc., sample is to incident terahertz
Hereby wave cannot fully absorb, and cannot achieve the accuracy of measurement.
Utility model content
The purpose of this utility model is to provide a kind of Terahertz test sample devices, and structure is simple, and function is easy, right
Terahertz has complete absorption, and measurement result is accurate and reliable, and since structure is simple, is moved easily, the place that can be used
More.
The embodiments of the present invention are achieved in that
The embodiments of the present invention provide a kind of Terahertz test sample device, comprising:
First semielliptical cover, first semielliptical cover on long axis direction with the first opening and the second opening, and described the
One opening with terahertz sources device for connecting；
Second semielliptical cover, second semielliptical, which covers on long axis direction, to be had and second opening size matched the
Three openings also have the first hole and the second hole, the second semielliptical cover and described first near third opening
Semielliptical cover on third opening with where second opening at be detachably connected, the second semielliptical cover and described the
The inner surface of one semielliptical cover has Gold plated Layer；
Sample holding device, the sample holding device are set to where first hole of the second semielliptical cover
The inside at place and when holding sample, sample and first opening are opposite；
Inlet duct, the inlet duct are set to the outside at second hole place of the second semielliptical cover
And gas flow when air inlet is towards at where sample.
In addition, the Terahertz test sample device that embodiment according to the present utility model provides, can also have following attached
The technical characteristic added:
In the alternative embodiment of the utility model, it is ellipse that first hole and second hole are located at described the second half
Line, second hole and the line in the center of circle in the same section circle of ball cover, first hole and the center of circle are in 90 ° of angles.
In the alternative embodiment of the utility model, the sample holding device includes pedestal, support column and specimen holder, institute
It states pedestal to connect with the second semielliptical cover, the specimen holder is connect by the support column with the pedestal, the sample
Apparatus for placing has the hollow channel through the pedestal, the support column and the specimen holder, and the hollow channel is used for
Allow detection device test sample performance.
In the alternative embodiment of the utility model, the section of the pedestal and/or the specimen holder is square or justifies
Shape.
In the alternative embodiment of the utility model, the support column is cylinder or prism.
In the alternative embodiment of the utility model, the specimen holder is rotatablely arranged at the support column, the sample
Product apparatus for placing further includes the flabellum for being set to the specimen holder in week, and the inlet duct can brush the flabellum and make described
Specimen holder rotation.
In the alternative embodiment of the utility model, the inlet duct includes tracheae device and sealed connecting component, described
Tracheae device is used to connect with gas supply gas source, and the tracheae device is connected by the sealed connecting component and the second semielliptical cover
It connects and for blowing to sample.
In the alternative embodiment of the utility model, the inlet duct further includes accessory trachea, and the accessory trachea is located at institute
It states in tracheae device and for being connect with gas supply gas source, the gas flow rate of the accessory trachea is greater than the gas stream of the tracheae device
Speed, the sample holding device include pedestal, support column, specimen holder and flabellum, and the pedestal and the second semielliptical cover connect
It connects, the specimen holder is connect by the support column with the pedestal, and the flabellum week is set to the specimen holder, the accessory trachea
For brushing the flabellum and rotating the specimen holder in the support column.
In the alternative embodiment of the utility model, the inlet duct is for being blown into inert gas.
In the alternative embodiment of the utility model, the diameter of first opening of the first semielliptical cover is
The diameter of 15mm, second opening are 104.5mm, and the semi-major axis along the half elliptic cross section of long axis direction is 96mm.
The beneficial effects of the utility model are:
Terahertz test sample device structure is simple, and function is easy, so that sample has the THz QCL THz wave radiated
Complete to absorb, measurement result is accurate and reliable.Measurement particularly suitable for sample biological effect, photoelectric conversion effect etc..
Detailed description of the invention
It, below will be to use required in embodiment in order to illustrate more clearly of the technical solution of the utility model embodiment
Attached drawing be briefly described, it should be understood that the following drawings illustrates only some embodiments of the utility model, therefore should not be by
Regard the restriction to range as, for those of ordinary skill in the art, without creative efforts, may be used also
To obtain other relevant attached drawings according to these attached drawings.
Fig. 1 is the structural schematic diagram for the Terahertz test sample device that the embodiments of the present invention 1 provide；
Fig. 2 is the decomposition diagram of Fig. 1；
Fig. 3 is the schematic diagram that Fig. 2 conceals the first semielliptical cover；
Fig. 4 is the signal for concealing the first semielliptical cover of the Terahertz test sample device of the embodiments of the present invention 2
Figure.
Icon: 100- Terahertz test sample device；10- the first semielliptical cover；11- first is open；13- second is open；
30- the second semielliptical cover；31- third opening；50- sample holding device；51- pedestal；53- support column；55- specimen holder；57- fan
Leaf；70- inlet duct；71- tracheae device；73- sealed connecting component；75- accessory trachea；101- Gold plated Layer；200- sample.
Specific embodiment
It is practical new below in conjunction with this to keep the objectives, technical solutions, and advantages of the embodiments of the present invention clearer
Attached drawing in type embodiment, the technical scheme in the utility model embodiment is clearly and completely described, it is clear that is retouched
The embodiment stated is the utility model a part of the embodiment, instead of all the embodiments.Usually here in attached drawing description and
The component of the utility model embodiment shown can be arranged and be designed with a variety of different configurations.
Therefore, requirement is not intended to limit to the detailed description of the embodiments of the present invention provided in the accompanying drawings below
The scope of the utility model of protection, but it is merely representative of the selected embodiment of the utility model.Based in the utility model
Embodiment, every other embodiment obtained by those of ordinary skill in the art without making creative efforts, all
Belong to the range of the utility model protection.
It should also be noted that similar label and letter indicate similar terms in following attached drawing, therefore, once a certain Xiang Yi
It is defined in a attached drawing, does not then need that it is further defined and explained in subsequent attached drawing.
In the description of the present invention, it should be noted that the orientation or positional relationship of the instructions such as term "inner", "outside"
For be based on the orientation or positional relationship shown in the drawings or the utility model product using when the orientation or position usually put
Relationship is merely for convenience of describing the present invention and simplifying the description, rather than the device or element of indication or suggestion meaning must
There must be specific orientation, be constructed and operated in a specific orientation, therefore should not be understood as limiting the present invention.This
Outside, term " first ", " second " etc. are only used for distinguishing description, are not understood to indicate or imply relative importance.
In the description of the present invention, it should also be noted that, unless otherwise clearly defined and limited, term " is set
Set ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
To be mechanical connection, it is also possible to be electrically connected；It can be directly connected, can also can be indirectly connected through an intermediary
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition
Concrete meaning in utility model.
In the present invention unless specifically defined or limited otherwise, fisrt feature is on or below second feature
It may include that the first and second features directly contact, also may include that the first and second features are not direct contacts but pass through it
Between other characterisation contact.Moreover, fisrt feature is on second feature, top and above include fisrt feature the
Right above two features and oblique upper, or first feature horizontal height is merely representative of higher than second feature.Fisrt feature is in the second spy
Under sign, lower section and fisrt feature included below be directly below and diagonally below the second feature, or be merely representative of fisrt feature level
Height is less than second feature.
Embodiment 1
Fig. 1 to Fig. 3 is please referred to, a kind of Terahertz test sample device 100 is present embodiments provided, comprising:
First semielliptical cover 10, the first semielliptical cover 10 have the first opening 11 and the second opening 13 in long axis direction, the
One opening 11 with terahertz sources device for connecting；
Second semielliptical cover 30, the second semielliptical cover 30 have and the second opening matched third of 13 sizes in long axis direction
Opening 31 also has the first hole and the second hole, the second semielliptical cover 30 and the first semielliptical cover near third opening 31
10 are detachably connected at third opening 31 and the second 13 places of opening, and the second semielliptical cover 30 is interior with the first semielliptical cover 10
There is Gold plated Layer 101 on surface；
Sample holding device 50, sample holding device 50 are set to interior at the first hole place of the second semielliptical cover 30
Side and when holding sample 200, sample 200 and the first opening 11 are opposite；
Inlet duct 70, inlet duct 70 are set to the outside at the second hole place of the second semielliptical cover 30 and air inlet
When gas flow towards sample 200 where.
Wherein, the diameter of the first opening 11 of the first semielliptical cover 10 is 15mm, and the diameter of the second opening 13 is
104.5mm, the semi-major axis along the half elliptic cross section of long axis direction are 96mm.The monnolithic case and ruler of second semielliptical cover 30
It is very little to be adapted with the first semielliptical cover 10.
Second opening 13 is designed with third opening 31 using seam allowance, and threaded connection both can be used and be also possible to be clamped.One
On the one hand the reliability of aspect guarantee connection is also to ensure Terahertz not from junction loss as far as possible.
Wherein, terahertz sources device is referred to existing terahertz sources device, for example time-domain spectroscopy source, high temperature surpass
Terahertz emission source etc. is led, is no longer repeated herein.
Specifically, the first hole and the second hole are located at the same section circle of the second semielliptical cover 30, the first hole and circle
The line of the line of the heart, the second hole and the center of circle is in 90 ° of angles.
Detailed, the same section fenestra that the first hole and the second hole are located at the second semielliptical cover 30 both is to be located at
Same Latitude.90 ° of angles designed by the present embodiment are a kind of preferable angles, and other angles are also that can work, only
Enable to the gas being filled with that the possibility that reaction generates blows away the gas that THz wave has an impact.
In the present embodiment, inlet duct 70 is for being blown into inert gas.Such as common N2、Ar2Such indifferent gas
Body, combustible and oxygen can be prevented to react and burn when high temperature pyrolysis or prevent other may it is dangerous or
The generation of the case where measurement result that has an impact.
Specifically, inlet duct 70 includes tracheae device 71 and sealed connecting component 73, tracheae device 71 is used for and gas supply gas
Source connection, tracheae device 71 are connect with the second semielliptical cover 30 by sealed connecting component 73 and for blowing to sample 200.
Specifically, sample holding device 50 includes pedestal 51, support column 53 and specimen holder 55, pedestal 51 and the second semielliptical
30 connection of cover, specimen holder 55 are connect by support column 53 with pedestal 51, and sample holding device 50, which has, runs through pedestal 51, support column
53 and specimen holder 55 hollow channel, hollow channel is for allowing 200 performance of detection device test sample.
Wherein, detection device can be with reference to existing some Terahertz detectors, such as Terahertz room temperature detector etc., this
Place is no longer repeated.
Detailed, the section of pedestal 51 and/or specimen holder 55 is square or circle.In the present embodiment, 51 He of pedestal
The section of specimen holder 55 is square.
Detailed, support column 53 is cylinder or prism.In the present embodiment, support level is cylinder.
Detailed, the bottom of pedestal 51 is bonded with the inner surface of the second semielliptical cover 30, and the two can be screwed
Or button is fixed.
The principle of the present embodiment is:
First opening 11 and sample 200 are faces, after terahertz sources device transmits Terahertz, incident terahertz
It hereby can directly be acted on sample 200, have benefited from the ellipsoid structure that the first semielliptical cover 10 and the second semielliptical cover 30 are constituted
And internal Gold plated Layer 101, incident Terahertz can effectively be reflected, and be ultimately applied on sample 200, so that sample
Product 200 greatly promote the assimilation effect of Terahertz, even achieve the effect that hypersorption.
So, more accurate is just become for the measurement data of sample 200.
In conjunction with the effect of inlet duct 70, the interference that sample 200 is subject to when absorbing Terahertz can be arranged as much as possible
It removes.
Further ensure the accurate of measurement result.
In addition structure is simple, compared to being more convenient for moving for general Terahertz test sample device 100, thus can
To be used in more places, limitation is smaller, and practicability is more preferable.
The Terahertz test sample device 100 of the present embodiment is made with the structure of its ellipsoid and internal gold-plated design
Obtaining incident Terahertz effectively reflex can greatly promote assimilation effect on sample 200, to improve measurement
Accuracy is improved.Its structure is more simple compared to the prior art, and has good using effect.
Embodiment 2
Referring to figure 4., the present embodiment is also provided that a kind of Terahertz test sample device 100, compared to embodiment 1
Speech, the Terahertz test sample device 100 of the present embodiment are mainly characterized by:
Specimen holder 55 is rotatablely arranged at support column 53, and sample holding device 50 further includes the fan for being set to specimen holder 55 in week
Leaf 57, inlet duct 70 can brush flabellum 57 and specimen holder 55 rotated.
Inlet duct 70 further includes accessory trachea 75, and accessory trachea 75 is located in tracheae device 71 and for connecting with gas supply gas source
It connects, the gas flow rate of accessory trachea 75 is greater than the gas flow rate of tracheae device 71, and accessory trachea 75 is for brushing flabellum 57 and making sample
Product seat 55 is rotated in support column 53.
The other structures and function of Terahertz test sample device 100 can refer to embodiment 1.
The principle of the present embodiment is:
By the way that specimen holder 55 to be designed to rotatably, in conjunction with air-flow and the flabellum 57 on specimen holder 55 of accessory trachea 75
Interaction, sample 200 can be rotated with the rotation of specimen holder 55.
In conjunction with the reflex of Gold plated Layer 101, sample 200 can equally get a promotion for the absorption of Terahertz, absorb
It is comprehensive good, to improve the accuracy of measurement.
The outgassing direction of accessory trachea 75 is towards flabellum 57, and since its air pressure is greater than the air pressure of tracheae device 71, so
The flow velocity of gas faster, can avoid as far as possible by the gases affect of tracheae device 71, to blow flabellum 57.
And it blows due to being in alignment with flabellum 57, accessory trachea 75 will not directly act on sample 200, in gas
After striking flabellum 57, the speed of gas is reduced, and then to loss around, the impact force of gas will not be made to influence sample in this way
200 stability placed.
In conclusion Terahertz test sample 100 structures of device of the utility model are simple, function is easy, so that sample
The absorption of 200 pairs of Terahertzs more fully, improves the accuracy of measurement result.
The above descriptions are merely preferred embodiments of the present invention, is not intended to limit the utility model, for this
For the technical staff in field, various modifications and changes may be made to the present invention.It is all in the spirit and principles of the utility model
Within, any modification, equivalent replacement, improvement and so on should be included within the scope of protection of this utility model.
Claims (10)
1. a kind of Terahertz test sample device characterized by comprising
First semielliptical cover, first semielliptical cover on long axis direction with the first opening and the second opening, and described first opens
Mouth with terahertz sources device for connecting；
Second semielliptical cover, second semielliptical cover on long axis direction have opened with the matched third of the second opening size
Mouthful, in third opening nearby also with the first hole and the second hole, the second semielliptical cover and described the first half ellipse
Ball cover is detachably connected where third opening and second opening, the second semielliptical cover and described the first half
The inner surface of ellipsoid cover has Gold plated Layer；
Sample holding device, the sample holding device are set at first hole place of the second semielliptical cover
Inside and when holding sample, sample and first opening are opposite；
Inlet duct, the inlet duct be set to the outside at where second hole of the second semielliptical cover and into
At where gas flow towards sample when gas.
2. Terahertz test sample device according to claim 1, which is characterized in that first hole and described second
Hole is located at the same section circle of the second semielliptical cover, the line in first hole and the center of circle, second hole with
The line in the center of circle is in 90 ° of angles.
3. Terahertz test sample device according to claim 1, which is characterized in that the sample holding device includes base
Seat, support column and specimen holder, the pedestal are connect with the second semielliptical cover, and the specimen holder passes through the support column and institute
Pedestal connection is stated, the sample holding device has through the hollow logical of the pedestal, the support column and the specimen holder
Road, the hollow channel is for allowing detection device test sample performance.
4. Terahertz test sample device according to claim 3, which is characterized in that the pedestal and/or the sample
The section of seat is square or circle.
5. Terahertz test sample device according to claim 3, which is characterized in that the support column is cylinder or rib
Column.
6. Terahertz test sample device according to claim 3, which is characterized in that the specimen holder can be rotatably set
In the support column, the sample holding device further includes the flabellum for being set to the specimen holder in week, and the inlet duct can be blown
It strokes the flabellum and the specimen holder is rotated.
7. Terahertz test sample device according to claim 1, which is characterized in that the inlet duct includes tracheae dress
It sets and sealed connecting component, the tracheae device is used to connect with gas supply gas source, the tracheae device passes through the sealed connecting component
It is connect with the second semielliptical cover and for blowing to sample.
8. Terahertz test sample device according to claim 7, which is characterized in that the inlet duct further includes secondary gas
Pipe, the accessory trachea are located in the tracheae device and for connecting with gas supply gas source, and the gas flow rate of the accessory trachea is greater than
The gas flow rate of the tracheae device, the sample holding device include pedestal, support column, specimen holder and flabellum, the pedestal
It is connect with the second semielliptical cover, the specimen holder is connect by the support column with the pedestal, and the flabellum week is set to
The specimen holder, the accessory trachea is for brushing the flabellum and rotating the specimen holder in the support column.
9. according to claim 1, Terahertz test sample device described in 7 or 8, which is characterized in that the inlet duct is used for
It is blown into inert gas.
10. Terahertz test sample device according to claim 1, which is characterized in that the institute of the first semielliptical cover
The diameter for stating first opening is 15mm, and the diameter of second opening is 104.5mm, along the half elliptic cross section of long axis direction
Semi-major axis is 96mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820866612.2U CN208334190U (en) | 2018-06-05 | 2018-06-05 | terahertz test sample device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820866612.2U CN208334190U (en) | 2018-06-05 | 2018-06-05 | terahertz test sample device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208334190U true CN208334190U (en) | 2019-01-04 |
Family
ID=64773038
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820866612.2U Expired - Fee Related CN208334190U (en) | 2018-06-05 | 2018-06-05 | terahertz test sample device |
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| Country | Link |
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| CN (1) | CN208334190U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108507970A (en) * | 2018-06-05 | 2018-09-07 | 中国工程物理研究院激光聚变研究中心 | Terahertz test sample device |
| CN112964901A (en) * | 2021-02-07 | 2021-06-15 | 中南大学 | Fluid flow velocity measuring device based on terahertz high-speed echo effect |
-
2018
- 2018-06-05 CN CN201820866612.2U patent/CN208334190U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108507970A (en) * | 2018-06-05 | 2018-09-07 | 中国工程物理研究院激光聚变研究中心 | Terahertz test sample device |
| CN108507970B (en) * | 2018-06-05 | 2024-02-02 | 中国工程物理研究院激光聚变研究中心 | Terahertz test sample device |
| CN112964901A (en) * | 2021-02-07 | 2021-06-15 | 中南大学 | Fluid flow velocity measuring device based on terahertz high-speed echo effect |
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