CN108444682A - Semiconductor laser automatic functional testing system - Google Patents
Semiconductor laser automatic functional testing system Download PDFInfo
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- CN108444682A CN108444682A CN201810583920.9A CN201810583920A CN108444682A CN 108444682 A CN108444682 A CN 108444682A CN 201810583920 A CN201810583920 A CN 201810583920A CN 108444682 A CN108444682 A CN 108444682A
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- light
- semiconductor laser
- power
- workbench
- testing system
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
Abstract
A kind of semiconductor laser automatic functional testing system, including：Workbench；Luminous power detection components, luminous power detection components include light power meter probe and power harvester；Light power meter probe generates corresponding power electric signal power collector according to the power of laser beam to power electrical signal collection；Spectral detection component, spectral detection component include spectrum light-conductive optic fibre and the spectrometer that is coupled with spectrum light-conductive optic fibre；Driving power is used for semiconductor laser output current；And data processing equipment, spectrometer export spectral detection data to data processing equipment；Data processing equipment controls the output current of driving power.The output current of driving power is controlled by data processing equipment, make being changed by predetermined rule by electric current for semiconductor laser, in conjunction with luminous power detection components and the detection data of spectral detection component, so as to automatically calculate out the luminous power current characteristic curve and spectrum current characteristic curve of semiconductor laser.
Description
Technical field
The present invention relates to semiconductor laser measuring technologies, more particularly to a kind of semiconductor laser automatic functional testing
System.
Background technology
Semiconductor laser tube has the characteristics that small, efficient, easy to use, thus is widely used.Root
According to semiconductor laser tube characteristic it is found that semiconductor laser tube Output optical power and spectrum with laser tube driving current size and
The variation of operating temperature and change.To provide a user the complete information of semiconductor laser, semiconductor laser in exploitation or
Production phase needs to carry out the test of power current characteristic and the test of spectral characteristic；However, traditional technical solution is general
By manual adjustment electric current and luminous power, spectral information record are carried out, the luminous power current characteristics of semiconductor laser is caused to be surveyed
Examination and spectrum current characteristics are tested less efficient.
Invention content
Based on this, it is necessary to the efficiency of current characteristics test and spectrum current characteristics test for semiconductor laser power
Relatively low problem provides a kind of semiconductor laser automatic functional testing system.
A kind of semiconductor laser automatic functional testing system, including：
Workbench；
Luminous power detection components, the luminous power for noise spectra of semiconductor lasers output are detected；The luminous power detection
Component includes being mounted on light power meter probe and power harvester on the workbench；The light power meter probe is according to
The power for the laser beam that semiconductor laser is sent out and generate corresponding power electric signal, and export to the power collecting
Device；The power harvester is acquired power electric signal；
The spectrum of spectral detection component, the laser for being exported to the semiconductor laser is detected；The spectrum
Detection components include spectrum light-conductive optic fibre and the spectrometer that is coupled with the spectrum light-conductive optic fibre；The spectrum light-conductive optic fibre
Input terminal is arranged on the workbench, and is correspondingly arranged with light power meter probe；
Driving power is used for the semiconductor laser output current；And
Data processing equipment, the spectrometer export spectral detection data to the data processing equipment；The power
Collector is by power electric signal output to the data processing equipment；Output of the data processing equipment to the driving power
Electric current is controlled.
Above-mentioned semiconductor laser automatic functional testing system controls the output electricity of driving power by data processing equipment
Stream, makes being changed by predetermined rule by electric current for semiconductor laser, in conjunction with luminous power detection components and spectral detection group
The detection data of part, so as to automatically calculate out the luminous power current characteristic curve and spectrum current characteristics of semiconductor laser
Curve.
The light power meter probe includes the detection main body being mounted on the workbench in one of the embodiments,；
The detection main body includes shell and the detection module being arranged in the shell；The shell is equipped with light inlet；The spy
It surveys module and is equipped with induction part；The induction part of the detection module is corresponding with the light inlet of the shell；The spectrum light-conductive optic fibre
Input terminal be correspondingly arranged with the light inlet.
The light power meter probe further includes the grip slipper for connecting the shell in one of the embodiments,；The folder
It holds seat and is equipped with holding tank；The holding tank is correspondingly arranged with the light inlet.
The grip slipper includes the first extension board for connecting the shell, connection described the in one of the embodiments,
Second extension board of one extension board and the guide pad of connection second extension board.
The spectral detection component further includes the second supporting rack in one of the embodiments, the spectrum light-conductive optic fibre
It is mounted on the workbench by second supporting rack；The spectral detection component further includes being mounted on described second to support
Attenuator on frame；The port of the attenuator and the spectrum light-conductive optic fibre is correspondingly arranged.
Further include spot detection component in one of the embodiments, the spot detection component includes monitoring camera, institute
It states monitoring camera to be mounted on the workbench, the camera shooting mouth of the monitoring camera is corresponding with the detection induction part of module.
Further include temperature control component in one of the embodiments, the temperature control component includes being used for bearing semiconductor laser
The thermoregulator of device, and the adjusting driver of the thermoregulator is connected, the adjusting driver adjusts the temperature
Device is controlled by size of current and current direction.
Further include the isolation seat being mounted on the workbench in one of the embodiments, be arranged in the isolation seat
4th supporting rack of side, the bootstrap block being slidably connected with the 4th supporting rack, the handle group for connecting the 4th supporting rack
Part, the push rod being threaded through on the 4th supporting rack, several guide posts being threaded through on the bootstrap block, the connection guide post
Pressing plate and the spring part that is set in the guide post；The bootstrap block is connect with the lower end of the push rod, the handle group
Part is connect with the upper end of the push rod；The spring part is arranged between the bootstrap block and the pressing plate；The temperature is adjusted
Device is mounted on the isolation seat.
The workbench is equipped with fiber fixed frame in one of the embodiments, and the fiber fixed frame includes connection
The foundation of the workbench, the support plate of the connection foundation and the fibre clip being arranged in the support plate；The support plate
The height of the relatively described table surface is correspondingly arranged with light power meter probe.
The workbench is equipped with the case that is in the light in one of the embodiments, and the case that is in the light includes several interconnections
Side plate and renovate；The side plate is vertically arranged on the workbench, and described renovate connect with wherein one side plate；Institute
Light power meter probe, the input terminal of the spectrum light-conductive optic fibre and semiconductor laser setting is stated to be in the light in case described.
Description of the drawings
Fig. 1 is the stereoscopic schematic diagram of the semiconductor laser automatic functional testing system of the preferred embodiment of the present invention；
Fig. 2 is stereoscopic schematic diagram of the semiconductor laser automatic functional testing device shown in FIG. 1 in another angle；
Fig. 3 is the structural schematic diagram of semiconductor laser automatic functional testing device shown in FIG. 1；
Fig. 4 is the stereoscopic schematic diagram after light power meter probe, spectrum light-conductive optic fibre and stationary fixture are installed on workbench；
Fig. 5 is after light power meter probe, spectrum light-conductive optic fibre and stationary fixture are installed on workbench in another angle
Stereoscopic schematic diagram；
Fig. 6 is the stereoscopic schematic diagram of light power meter shown in Fig. 3 probe；
Fig. 7 is the enlarged drawing at the circle A of light power meter shown in fig. 6 probe；
Fig. 8 is the fiting relation figure for monitoring camera and light power meter probe；
Fig. 9 is the stereoscopic schematic diagram that semiconductor laser automatic functional testing system shown in FIG. 1 is added after the case that is in the light.
Specific implementation mode
It to facilitate the understanding of the present invention, below will be to invention is more fully described.But the present invention can be to be permitted
Mostly different form is realized, however it is not limited to embodiment described herein.Make on the contrary, purpose of providing these embodiments is
It is more thorough and comprehensive to the understanding of the disclosure.
Unless otherwise defined, all of technologies and scientific terms used here by the article and belong to the technical field of the present invention
The normally understood meaning of technical staff is identical.Used term is intended merely to description tool in the description of the invention herein
The purpose of the embodiment of body, it is not intended that in the limitation present invention.
It please refers to Fig.1 to Fig. 9, for the semiconductor laser automatic functional testing system of a better embodiment of the invention
100, power current characteristic test for detecting and generating semiconductor laser automatically and spectrum current characteristic curve.The semiconductor
Laser automatic functional testing system 100 includes
Workbench 10；
Luminous power detection components 20, the luminous power exported for noise spectra of semiconductor lasers 900 are detected；The luminous power is examined
It includes being mounted on light power meter probe 21 and power harvester 22 on workbench 10 to survey component 20；Light power meter 21 bases of probe
The power for the laser beam that semiconductor laser 900 is sent out and generate corresponding power electric signal, and export to power harvester
22；Power harvester 22 is acquired power electric signal；
The spectrum of spectral detection component 30, the laser for the output of noise spectra of semiconductor lasers 900 is detected；Spectral detection
Component 30 includes spectrum light-conductive optic fibre 31 and the spectrometer 32 coupled with spectrum light-conductive optic fibre 31；Spectrum light-conductive optic fibre 31 it is defeated
Enter end to be arranged on workbench 10, and is correspondingly arranged with light power meter probe 21；
Driving power 40 is used for 900 output current of semiconductor laser；And
Data processing equipment 50, spectrometer 32 export spectral detection data to data processing equipment 50；Power harvester
22 by power electric signal output to data processing equipment 50；Data processing equipment 50 controls the output current of driving power 40
System；
The output current of driving power 40 is controlled by data processing equipment 50, make semiconductor laser 900 passes through electricity
Stream is changed by predetermined rule, in conjunction with luminous power detection components 20 and the detection data of spectral detection component 30, so as to certainly
The luminous power current characteristic curve and spectrum current characteristic curve of semiconductor laser 900 are calculated dynamicly.
Fig. 6 to Fig. 8 is please referred to, in a wherein embodiment, to realize spectrum light-conductive optic fibre 31 and semiconductor laser
Device 900 exports the coupling of laser, and light power meter probe 21 includes the detection main body 23 being mounted on workbench 10；Detect main body 23
Including shell 231 and the detection module 232 being arranged in shell 231；Shell 231 is equipped with light inlet 233；Detect module 232
Equipped with induction part 234；The induction part 234 for detecting module 232 is corresponding with the light inlet 233 of shell 231；Spectrum light-conductive optic fibre 31
Input terminal is correspondingly arranged with light inlet 233.Specifically, after on laser light irradiation to detection module 232, module 232 is detected
Corresponding power electric signal is generated according to heat caused by laser beam, and is exported to power harvester 22.
Specifically, semiconductor laser 900 is conducted by output optical fibre, to export laser, swashing emitted by output optical fibre
After illumination is mapped on the induction part 234 of detection module 232, diffusing reflection, the irreflexive light in part occur on induction part 234 for laser
Line back through light inlet 233 is simultaneously irradiated on the input terminal of spectrum light-conductive optic fibre 31, is irradiated to the input of spectrum light-conductive optic fibre 31
Laser on end is transmitted to spectrometer 32 through spectrum light-conductive optic fibre 31, to realize that semiconductor laser 900 exports the light of laser
Spectrum detection.
In a wherein embodiment, to realize that output optical fibre is accurate corresponding with the induction part 234 for detecting module 232,
Light power meter probe 21 further includes the grip slipper 24 of connected with outer casing 231；Grip slipper 24 is equipped with holding tank 240；Holding tank 240 with
Light inlet 233 is correspondingly arranged.
In a wherein embodiment, grip slipper 24 includes the first extension board 241 of connected with outer casing 231, connection first
Second extension board 242 of extension board 241 and the guide pad 243 for connecting the second extension board 242；Specifically, the first extension board 241
Be provided with being vertically arranged on one side for light inlet 233 on shell 231, be provided with light inlet on the second extension board 242 and shell 231
233 are arranged in parallel on one side, guide pad 243 be provided with being vertically arranged on one side for light inlet 233 on shell 231, so as to logical
The length for overregulating the first extension board 241 and the second extension board 242 enables guide pad 243 corresponding with light inlet 233；To avoid
One extension board 241 causes to block to monitoring camera 61, and the first extension board 241 is located at 233 lower section of light inlet；Optionally, holding tank
240 are arranged on guide pad 243.
To make the first extension board 241 and shell 231 be reliably connected, while the first extension board 241 being avoided to make light inlet 233
At blocking, the first extension board 241 is extended with two mounting bars 248 close to the side of shell 231, and two mounting bars 248 are distributed in entering light
The both sides of mouth 233, mounting bar 248 are fixedly connected with shell 231.
To accelerate the radiating rate of laser output optical fibre, while high heat dispersion material is saved, grip slipper 24 further includes
Radiating block 244, radiating block 244 are mounted on guide pad 243, and holding tank 240 is arranged on radiating block 244；Specifically, holding tank
240 along linear extension, the induction part 234 of the extending direction sensing module 232 of holding tank 240；To ensure semiconductor laser
The radiation direction that the output optical fibre of device 900 projects is accurate, and 240 width of holding tank and the output optical fibre of semiconductor laser 900 are straight
Diameter corresponds to；Preferably, radiating block 244 is oxygen-free copper material.
It rotates and sets to make the output optical fibre of semiconductor laser 900 reliably be fitted in holding tank 240, on radiating block 244
It is equipped with tabletting 245, the side opposite with holding tank 240 of tabletting 245 is connected with cushion 246, and cushion 246 is corresponding with holding tank 240
Setting；In wherein a kind of embodiment, active side and the radiating block 244 of tabletting 245 are fastened and connected, and work as semiconductor laser
After the endpiece of 900 output optical fibre is placed into holding tank 240, while tabletting 245 fastens on radiating block 244, cushion 246 is right
The output optical fibre of semiconductor laser 900 generates squeezing action, to make the output optical fibre of semiconductor laser 900 reliably be bonded
In holding tank 240, make the extending direction one of the outgoing light direction and holding tank 240 of the output optical fibre of semiconductor laser 900
It causes.
Service life to promote tabletting 245 realizes radiating block in another realization embodiment by way of magnetic
244 with the connection of magnetic sheet 247；Specifically, radiating block 244 is equipped with several magnetic sheets 247, the active side of magnetic sheet 247 and tabletting 245
It is correspondingly arranged；Tabletting 245 is ferromagnetic.
Further, for convenience of the height and angle of detection main body 23 is adjusted, light power meter probe 21 further includes first
Support 25, the first supporting rack 25 include the branch that substrate 251, the sleeve 252 of connecting substrate 251 and part are threaded through in sleeve 252
Bar 253；Connector (not shown) is equipped on sleeve 252；253 connected with outer casing 231 of strut；By the elastic of connector and adjust
Depth in 253 insertion sleeve 252 of strut, it is convenient to which the height and angle for adjusting detection 23 opposing substrate 251 of main body can have
Effect reduces the bending of output optical fibre；Specifically, substrate 251 is mounted on workbench 10.
Fig. 4 and Fig. 5 is please referred to, in a wherein embodiment, spectral detection component 30 further includes the second supporting rack 33,
Spectrum light-conductive optic fibre 31 is mounted on by the second supporting rack 33 on workbench 10；To avoid being irradiated to the end of spectrum light-conductive optic fibre 31
The intensity of light on mouth is excessive, influences spectral detection effect, and spectral detection component 30 further includes being mounted on the second supporting rack 33
On attenuator 34；Attenuator 34 and the port of spectrum light-conductive optic fibre 31 are correspondingly arranged；Specifically, spectral detection component 30 also wraps
35 sleeve 252 of fixes sleeve is included, attenuator 34 is mounted on by 35 sleeve 252 of fixes sleeve on the second supporting rack 33.By declining
Subtract piece 34 to partially absorb laser beam, be cut to make to be incident on the laser intensity of port of spectrum light-conductive optic fibre 31
Weak, the case where avoiding light intensity from being saturated, ensures spectral detection effect.
Referring to Fig. 8, in a wherein embodiment, to avoid the tail of the output optical fibre because of semiconductor laser 900
The finish of end face is poor, enables the breech face of output optical fibre to laser energy absorption and generates high temperature, causes output optical fibre may
The fortuitous event burnt, semiconductor laser automatic functional testing system 100 further include spot detection component 60, hot spot inspection
It includes monitoring camera 61 to survey component 60, and monitoring camera 61 is mounted on workbench 10, monitors the camera shooting mouth and detection mould of camera 61
The induction part 234 of group 232 corresponds to.
Laser facula is detected on induction part 234 of the monitoring camera 61 to detecting module 232 and output image is believed outward
Number, it can determine whether that whether bright and clean the output optical fibre of laser is smooth according to the shape of hot spot, to can avoid because of output optical fibre end
Face problem and generate the case where optical fiber is burnt.
To avoid the first extension board 241 from causing to block to monitoring camera 61, the first extension board 241 is located under light inlet 233
Side.
For convenience of the height and angle of monitoring camera 61 is adjusted, spot detection component 60 further includes third supporting rack 62, the
Three supporting racks 62 include the transverse arm 64 of upright bar 63 and connecting upright pole 63；Upright bar 63 is equipped with sliding slot 65, and monitoring camera 61 fixes peace
Mounted in one end of transverse arm 64；Connector (not shown) is connect after passing through sliding slot 65 with the other end of transverse arm 64；It is connected by unclamping
Part, the rotatable or opposite sliding slot 65 of transverse arm 64 slide, and so as to which the height and angle that monitor camera 61 are adjusted, make monitoring
The camera shooting mouth of camera 61 is accurate corresponding with the induction part 234 for detecting module 232.In wherein a kind of embodiment, connector is
Screw.
Fig. 2 and Fig. 4 is please referred to, in a wherein embodiment, it is steady testing condition, makes semiconductor laser 900
It running at a predetermined temperature, the spectrum to avoid the output laser of temperature change noise spectra of semiconductor lasers 900 impacts, and half
Conductor laser automatic functional testing system 100 further includes temperature control component 70, and temperature control component 70 includes swashing for bearing semiconductor
The thermoregulator 71 of light device 900, and the adjusting driver 72 of thermoregulator 71 is connected, it adjusts driver 72 and temperature is adjusted
Device 71 is controlled by size of current and current direction.
Specifically, thermoregulator 71 is semiconductor cooler, and temperature detecting element is equipped in thermoregulator 71, and (figure is not
Show), temperature detecting element exports temperature detection signal to adjusting driver after being detected to the temperature of thermoregulator 71
72, adjust the electric current that driver 72 adjusts thermoregulator 71 according to the comparison of temperature detection signal and preset temperature value；It can
Selection of land, preset temperature value can directly adjust driver 72 on be arranged, also can from data processing equipment 50 to adjust driver 72
Input.
Referring to Fig. 4 and Fig. 5, in a wherein embodiment, to make semiconductor laser 900 reliably be bonded
Onto thermoregulator 71, while 900 surface equilibrium of semiconductor laser being made to be pressurized, semiconductor laser automatic functional testing system
System 100 further includes the isolation seat 81 being mounted on workbench 10, is arranged in the 4th supporting rack 82 of 81 side of isolation seat and the 4th
The Handleset 84 of bootstrap block 83, the 4th supporting rack 82 of connection that supporting rack 82 is slidably connected is threaded through on the 4th supporting rack 82
Push rod 85, several guide posts 86 being threaded through on bootstrap block 83, connect guide post 86 pressing plate 87 and be set in guide post 86
On spring part 88；Bootstrap block 83 is connect with the lower end of push rod 85, and Handleset 84 is connect with the upper end of push rod 85；Spring part 88
It is arranged between bootstrap block 83 and pressing plate 87；Thermoregulator 71 is mounted on isolation seat 81.
Specifically, stationary fixture 80 further includes vertical guide rail 89, and bootstrap block 83 passes through vertical guide rail 89 and the 4th supporting rack
82 are slidably connected；The upper end of guide post 86 is fastened on 83 top of bootstrap block, is pressed so that bootstrap block 83 can be promoted by guide post 86
Plate 87；The lower end of guide post 86 is fixedly connected with pressing plate 87；Pass through switching Handleset 84, under lever principle effect, push rod
85 promotion bootstrap blocks 83 move down, and enable spring part 88 generate compression by bootstrap block 83, since the deformation quantity of each spring part 88 is consistent,
Each position being connect with guide post 86 is by identical pressure to making on pressing plate 87, to make 900 table of semiconductor laser
Face equilibrium is pressurized；Preferably, guide post 86 is uniformly distributed on pressing plate 87.
In a wherein embodiment, to avoid the output optical fibre of semiconductor laser 900 that overflexing occurs, make defeated
The transmission quality for going out optical fiber declines, and workbench 10 is equipped with fiber fixed frame 11, and fiber fixed frame 11 includes connecting working table
Foundation 12, the support plate 13 for connecting foundation 12 and the fibre clip 14 being arranged in support plate 13；Support plate 13 is with respect to workbench 10
The height on surface is correspondingly arranged with light power meter probe 21.By the way that the output fiber bundle of semiconductor laser 900 is placed into branch
On fagging 13, so as to reduce the bending of output optical fibre, the transmission quality of output optical fibre is avoided to decline.Specifically, support plate 13
The height on opposite 10 surface of workbench is correspondingly arranged with grip slipper 24, thermoregulator 71.
Referring to Fig. 9, in a wherein embodiment, to avoid the output laser of semiconductor laser 900 to operation
Personnel damage, and workbench 10 is equipped with the case 15 that is in the light, and the case 15 that is in the light includes the side plate 16 of several interconnections and renovates
17；Side plate 16 is vertically arranged on workbench 10, is renovated 17 and is connect with wherein side plate 16；Light power meter probe 21, spectrum are led
Input terminal and semiconductor laser 900 setting of light optical fiber 31 are being in the light in case 15.
Specifically, in other embodiments, it further includes the second supporting rack 33, fixes sleeve to be arranged being in the light in case 15
35 sleeves 252, spot detection component 60, thermoregulator 71, stationary fixture 80 and fiber fixed frame 11.
Further, it is to be powered in semiconductor laser 900 when finding that optical fiber, which occurs, to be burnt by monitoring camera 61
In the case of hot spot on induction part 234 disappear, avoid laser to being in the light case 15 or other components for being in the light in case 15 damage,
Driving power 40 is connected with emergency stop switch 41, and emergency stop switch 41, which is mounted on, to be in the light on case 15；By pressing emergency stop switch 41, can make
Driving power 40 stops, to 900 output current of semiconductor laser, to make semiconductor laser 900 stop output laser, keeping away
Exempt from laser to being in the light case 15 or other components for being in the light in case 15 damage.
Semiconductor laser 900 is first installed to work by semiconductor laser automatic functional testing system 100 before operation
On platform 10；Specifically, semiconductor laser 900 is mounted on thermoregulator 71；Then by semiconductor laser 900 by defeated
Go out optical fiber to dock with light power meter probe 21.
Referring to Fig. 3, semiconductor laser automatic functional testing system 100 is at runtime, data processing equipment 50 controls
The electric current of driving power 40 exports, and driving power 40 is according to the control signal of data processing equipment 50, in time t output current I
(t)；Power harvester 22 is acquired power electric signal caused by light power meter probe 21 and generates data processing equipment
50 readable data types, to make data processing equipment 50 obtain semiconductor laser 900 time t luminous power P (t),
Correspondence according to luminous power P (t) and by electric current I (t) in time, to generate the light work(of semiconductor laser 900
Rate current characteristic curve；Specifically, the output current I (t) of driving power 40 is stepped up in operational process, to can get not
With the luminous power under current value；In 40 output current I (t) change procedures of driving power, spectrometer 32 is to passing through spectrum leaded light
The laser that optical fiber 31 inputs carries out spectral detection, and spectral detection data are exported to data processing equipment 50, so as to make number
The spectrum current relationship characteristic for generating semiconductor laser 900 can be synchronized according to processing unit 50.
Specifically, data processing equipment 50 is mounted on side on workbench 10；Further, it is directly to operating personnel's exhibition
Show that the curve characteristic figure of generation, semiconductor laser automatic functional testing system 100 further include display, data processing equipment
50 export image information corresponding with 900 luminous power current characteristics of semiconductor laser, spectrum current relationship characteristic to display.
In the present embodiment, the output current of driving power is controlled by data processing equipment, makes the logical of semiconductor laser
Overcurrent is changed by predetermined rule, in conjunction with luminous power detection components and the detection data of spectral detection component, so as to certainly
The luminous power current characteristic curve and spectrum current characteristic curve of semiconductor laser are calculated dynamicly.
Each technical characteristic of embodiment described above can be combined arbitrarily, to keep description succinct, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, it is all considered to be the range of this specification record.
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of semiconductor laser automatic functional testing system, which is characterized in that including：
Workbench；
Luminous power detection components, the luminous power for noise spectra of semiconductor lasers output are detected；The luminous power detection components
Including being mounted on light power meter probe and power harvester on the workbench；The light power meter probe is partly led according to described
The power for the laser beam that body laser is sent out and generate corresponding power electric signal, and export to the power harvester；Institute
Power harvester is stated to be acquired power electric signal；
The spectrum of spectral detection component, the laser for being exported to the semiconductor laser is detected；The spectral detection
Component includes spectrum light-conductive optic fibre and the spectrometer that is coupled with the spectrum light-conductive optic fibre；The input of the spectrum light-conductive optic fibre
End is arranged on the workbench, and is correspondingly arranged with light power meter probe；
Driving power is used for the semiconductor laser output current；And
Data processing equipment, the spectrometer export spectral detection data to the data processing equipment；The power collecting
Device is by power electric signal output to the data processing equipment；Output current of the data processing equipment to the driving power
It is controlled.
2. semiconductor laser automatic functional testing system according to claim 1, which is characterized in that the light power meter
Probe includes the detection main body being mounted on the workbench；The detection main body includes shell and is arranged in the shell
Detection module；The shell is equipped with light inlet；The detection module is equipped with induction part；It is described detection module induction part with
The light inlet of the shell corresponds to；The input terminal of the spectrum light-conductive optic fibre is correspondingly arranged with the light inlet.
3. semiconductor laser automatic functional testing system according to claim 2, which is characterized in that the light power meter
Probe further includes the grip slipper for connecting the shell；The grip slipper is equipped with holding tank；The holding tank and the light inlet
It is correspondingly arranged.
4. semiconductor laser automatic functional testing system according to claim 3, which is characterized in that the grip slipper packet
The first extension board for connecting the shell, the second extension board of connection first extension board and connection described second is included to extend
The guide pad of plate.
5. semiconductor laser automatic functional testing system according to claim 2, which is characterized in that the spectral detection
Component further includes the second supporting rack, and the spectrum light-conductive optic fibre is mounted on by second supporting rack on the workbench；Institute
It further includes the attenuator being mounted on second supporting rack to state spectral detection component；The attenuator and the spectrum leaded light light
Fine port is correspondingly arranged.
6. semiconductor laser automatic functional testing system according to claim 2, which is characterized in that further include hot spot inspection
Component is surveyed, the spot detection component includes monitoring camera, and the monitoring camera is mounted on the workbench, the monitoring phase
The camera shooting mouth of machine is corresponding with the detection induction part of module.
7. semiconductor laser automatic functional testing system according to claim 1, which is characterized in that further include temperature control group
Part, the temperature control component include the thermoregulator for bearing semiconductor laser, and connect the tune of the thermoregulator
Save driver, adjusting driver the controlling by size of current and current direction to the thermoregulator.
8. semiconductor laser automatic functional testing system according to claim 7, which is characterized in that further include being mounted on
Isolation seat on the workbench is arranged in the 4th supporting rack of the isolation seat side, with the 4th supporting rack sliding and connects
The bootstrap block that connects, connection the 4th supporting rack Handleset, be threaded through on the 4th supporting rack push rod, several wear
The pressing plate of guide post, the connection guide post on the bootstrap block and the spring part being set in the guide post；It is described
Bootstrap block is connect with the lower end of the push rod, and the Handleset is connect with the upper end of the push rod；The spring part setting exists
Between the bootstrap block and the pressing plate；The thermoregulator is mounted on the isolation seat.
9. semiconductor laser automatic functional testing system according to claim 8, which is characterized in that on the workbench
Equipped with fiber fixed frame, the fiber fixed frame include the foundation for connecting the workbench, the support plate of the connection foundation and
Fibre clip in the support plate is set；The height of the relatively described table surface of the support plate is visited with the light power meter
Head is correspondingly arranged.
10. semiconductor laser automatic functional testing system according to claim 1, which is characterized in that the workbench
It is equipped with the case that is in the light, the case that is in the light includes the side plate of several interconnections and renovates；The side plate is vertically arranged in the work
Make on platform, described renovate connect with wherein one side plate；The input of the light power meter probe, the spectrum light-conductive optic fibre
End and semiconductor laser setting are in the light described in case.
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| CN201810583920.9A CN108444682B (en) | 2018-06-08 | 2018-06-08 | Automatic function test system for semiconductor laser |
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| CN201810583920.9A CN108444682B (en) | 2018-06-08 | 2018-06-08 | Automatic function test system for semiconductor laser |
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| CN108444682B CN108444682B (en) | 2023-10-03 |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108827603A (en) * | 2018-09-03 | 2018-11-16 | 深圳市杰普特光电股份有限公司 | Semiconductor laser numerical aperture automatic test equipment and method |
| CN109115469A (en) * | 2018-09-20 | 2019-01-01 | 深圳市摩西尔电子有限公司 | The point-by-point device for fast detecting of light source |
| CN109141834A (en) * | 2018-10-30 | 2019-01-04 | 深圳市杰普特光电股份有限公司 | Laser detector and laser detection control method |
| CN110017970A (en) * | 2019-05-21 | 2019-07-16 | 深圳市杰普特光电股份有限公司 | Laser bar detection system |
| CN110530611A (en) * | 2019-08-30 | 2019-12-03 | Oppo广东移动通信有限公司 | Calibration method, Laser emission mould group, depth camera and electronic equipment |
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| CN111366884A (en) * | 2018-12-26 | 2020-07-03 | 西安西电高压开关有限责任公司 | Active electronic current transformer and laser service life evaluation method and device thereof |
| CN112254931A (en) * | 2020-09-30 | 2021-01-22 | 武汉衡易科技有限公司 | Automatic test equipment for laser |
| CN112871725A (en) * | 2019-11-29 | 2021-06-01 | 山东华光光电子股份有限公司 | Automatic test marking system and method for semiconductor laser |
| CN114964726A (en) * | 2022-07-27 | 2022-08-30 | 北京凯普林光电科技股份有限公司 | Laser subassembly high temperature automatic test carrier |
| CN117589428A (en) * | 2024-01-19 | 2024-02-23 | 中国工程物理研究院激光聚变研究中心 | Device and method for evaluating pumping characteristics of semiconductor laser |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002139405A (en) * | 2000-11-06 | 2002-05-17 | Furukawa Electric Co Ltd:The | Measuring method of semiconductor laser module |
| JP2003016686A (en) * | 2001-07-02 | 2003-01-17 | Sony Corp | Inspecting device and inspecting method for mispositioning of cap of semiconductor laser device |
| CN2624203Y (en) * | 2003-06-26 | 2004-07-07 | 惠州市中科光电有限公司 | Semiconductor laser photoelectric testing arrangement |
| CN102062675A (en) * | 2010-12-16 | 2011-05-18 | 西安炬光科技有限公司 | Device for testing life of semiconductor laser |
| CN102109571A (en) * | 2010-12-16 | 2011-06-29 | 西安炬光科技有限公司 | Characteristic testing system of semiconductor laser |
| CN103311797A (en) * | 2012-03-16 | 2013-09-18 | 山东华光光电子有限公司 | Fixture for sintering semiconductor device and sintering method for plurality of tube cores of semiconductor laser |
| CN103308159A (en) * | 2013-06-15 | 2013-09-18 | 威海北洋电气集团股份有限公司 | Automatic test set and method for power and wavelength characteristics of semiconductor laser tubes |
| CN203606109U (en) * | 2013-12-09 | 2014-05-21 | 长春理工大学 | High-power semiconductor laser device test system |
| CN104934851A (en) * | 2015-06-19 | 2015-09-23 | 郑州大学 | Fixture for packaging stack array of semiconductor laser |
| CN207263849U (en) * | 2017-09-14 | 2018-04-20 | 深圳市杰普特光电股份有限公司 | Laser ageing test equipment |
| CN208283041U (en) * | 2018-06-08 | 2018-12-25 | 深圳市杰普特光电股份有限公司 | Semiconductor laser automatic functional testing system |
-
2018
- 2018-06-08 CN CN201810583920.9A patent/CN108444682B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002139405A (en) * | 2000-11-06 | 2002-05-17 | Furukawa Electric Co Ltd:The | Measuring method of semiconductor laser module |
| JP2003016686A (en) * | 2001-07-02 | 2003-01-17 | Sony Corp | Inspecting device and inspecting method for mispositioning of cap of semiconductor laser device |
| CN2624203Y (en) * | 2003-06-26 | 2004-07-07 | 惠州市中科光电有限公司 | Semiconductor laser photoelectric testing arrangement |
| CN102062675A (en) * | 2010-12-16 | 2011-05-18 | 西安炬光科技有限公司 | Device for testing life of semiconductor laser |
| CN102109571A (en) * | 2010-12-16 | 2011-06-29 | 西安炬光科技有限公司 | Characteristic testing system of semiconductor laser |
| CN103311797A (en) * | 2012-03-16 | 2013-09-18 | 山东华光光电子有限公司 | Fixture for sintering semiconductor device and sintering method for plurality of tube cores of semiconductor laser |
| CN103308159A (en) * | 2013-06-15 | 2013-09-18 | 威海北洋电气集团股份有限公司 | Automatic test set and method for power and wavelength characteristics of semiconductor laser tubes |
| CN203606109U (en) * | 2013-12-09 | 2014-05-21 | 长春理工大学 | High-power semiconductor laser device test system |
| CN104934851A (en) * | 2015-06-19 | 2015-09-23 | 郑州大学 | Fixture for packaging stack array of semiconductor laser |
| CN207263849U (en) * | 2017-09-14 | 2018-04-20 | 深圳市杰普特光电股份有限公司 | Laser ageing test equipment |
| CN208283041U (en) * | 2018-06-08 | 2018-12-25 | 深圳市杰普特光电股份有限公司 | Semiconductor laser automatic functional testing system |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108827603A (en) * | 2018-09-03 | 2018-11-16 | 深圳市杰普特光电股份有限公司 | Semiconductor laser numerical aperture automatic test equipment and method |
| CN109115469A (en) * | 2018-09-20 | 2019-01-01 | 深圳市摩西尔电子有限公司 | The point-by-point device for fast detecting of light source |
| CN109141834A (en) * | 2018-10-30 | 2019-01-04 | 深圳市杰普特光电股份有限公司 | Laser detector and laser detection control method |
| CN111366884A (en) * | 2018-12-26 | 2020-07-03 | 西安西电高压开关有限责任公司 | Active electronic current transformer and laser service life evaluation method and device thereof |
| CN110017970A (en) * | 2019-05-21 | 2019-07-16 | 深圳市杰普特光电股份有限公司 | Laser bar detection system |
| CN110530611A (en) * | 2019-08-30 | 2019-12-03 | Oppo广东移动通信有限公司 | Calibration method, Laser emission mould group, depth camera and electronic equipment |
| CN110530611B (en) * | 2019-08-30 | 2021-07-09 | Oppo广东移动通信有限公司 | Calibration method, laser emission module, depth camera and electronic equipment |
| CN112871725A (en) * | 2019-11-29 | 2021-06-01 | 山东华光光电子股份有限公司 | Automatic test marking system and method for semiconductor laser |
| CN111122120A (en) * | 2019-12-31 | 2020-05-08 | 深圳市杰普特光电股份有限公司 | Adjusting device and method for fast and efficient coupling of space light |
| CN111122120B (en) * | 2019-12-31 | 2021-09-17 | 深圳市杰普特光电股份有限公司 | Adjusting device and method for fast and efficient coupling of space light |
| CN112254931A (en) * | 2020-09-30 | 2021-01-22 | 武汉衡易科技有限公司 | Automatic test equipment for laser |
| CN114964726A (en) * | 2022-07-27 | 2022-08-30 | 北京凯普林光电科技股份有限公司 | Laser subassembly high temperature automatic test carrier |
| CN114964726B (en) * | 2022-07-27 | 2022-10-21 | 北京凯普林光电科技股份有限公司 | Laser subassembly high temperature automatic test carrier |
| CN117589428A (en) * | 2024-01-19 | 2024-02-23 | 中国工程物理研究院激光聚变研究中心 | Device and method for evaluating pumping characteristics of semiconductor laser |
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