CN208283042U - Semiconductor laser test platform - Google Patents
Semiconductor laser test platform Download PDFInfo
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- CN208283042U CN208283042U CN201820893773.0U CN201820893773U CN208283042U CN 208283042 U CN208283042 U CN 208283042U CN 201820893773 U CN201820893773 U CN 201820893773U CN 208283042 U CN208283042 U CN 208283042U
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- test platform
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Abstract
A kind of semiconductor laser test platform, comprising: bearing panel；Light power meter probe, light power meter probe are mounted on bearing panel；Light power meter probe includes detection main body and grip slipper；Detection main body includes the detection mould group of shell and setting inside the shell；Shell is equipped with light inlet；It detects mould group and is equipped with induction part；The induction part for detecting mould group is corresponding with the light inlet of shell；Grip slipper connected with outer casing；Grip slipper is equipped with holding tank；Holding tank is corresponding with light inlet；And monitoring camera, monitoring camera are mounted on bearing panel, the camera shooting mouth for monitoring camera is corresponding with the detection induction part of mould group.It is accurately irradiated on the induction part of detection mould group by the laser for enabling output optical fibre to project, monitoring camera detects laser facula on the induction part of detection mould group and exports picture signal outward, it can determine whether that whether bright and clean the output optical fibre of laser is smooth according to the shape of hot spot, to can avoid generating the case where optical fiber is burnt because of output optical fibre end face problem.
Description
Technical field
The utility model relates to semiconductor laser detection techniques, test more particularly to a kind of semiconductor laser flat
Platform.
Background technique
Semiconductor laser product is in design, production and application process, it is often necessary to the laser issued to laser
Optical power measures；When the laser to optical fiber output carries out measuring light power, due to the tail end of the output optical fibre of laser
The finish in face may be poor, makes the breech face of output optical fibre to laser energy absorption and generates high temperature, causes output optical fibre can
The fortuitous event that can be burnt；In the case where generation optical fiber is burnt, it is possible to cause laser impaired, in addition, laser
Outbound course may change because optical fiber is blown, and cause other equipment or component that may be damaged due to by laser irradiation；
Existing laser power detection device can not generally burn up fine problem to laser output light fibre and be monitored.
Utility model content
Based on this, provide it is a kind of can monitoring burn up the semiconductor laser test platform of fine situation.
A kind of semiconductor laser test platform, comprising:
Bearing panel；
Light power meter probe, the light power meter probe are mounted on the bearing panel；The light power meter probe packet
Include the grip slipper of detection main body and the connection detection main body；The detection main body includes shell and is arranged in the shell
Detection mould group；The shell is equipped with light inlet；The detection mould group is equipped with induction part；It is described detection mould group induction part with
The light inlet of the shell is corresponding；The grip slipper connects the shell；The grip slipper is equipped with holding tank；The holding tank
It is corresponding with the light inlet；And
Monitor camera, the monitoring camera is mounted on the bearing panel, the camera shooting mouth for monitoring camera with it is described
The induction part for detecting mould group is corresponding.
Above-mentioned semiconductor laser test platform, by the way that the output optical fibre of semiconductor laser is placed on holding tank,
Holding tank starts guiding role to the laser that output optical fibre tail end projects, and the laser for enabling output optical fibre to project accurately is irradiated to spy
It surveys on the induction part of mould group, monitoring camera detect to laser facula on the induction part of detection mould group and output image is believed outward
Number, it can determine whether that whether bright and clean the output optical fibre of laser is smooth according to the shape of hot spot, to can avoid because of output optical fibre end
Face problem and generate the case where optical fiber is burnt.
The grip slipper includes the first extension board for connecting the shell, connection described the in one of the embodiments,
Second extension board of one extension board and the guide pad of connection second extension board.
First extension board is extended with two mounting bars close to the side of the shell in one of the embodiments, and two
The mounting bar is distributed in the two sides of the light inlet；The mounting bar is fixedly connected with the shell.
The grip slipper further includes radiating block in one of the embodiments, and the radiating block is mounted on the guide pad
On, the holding tank is arranged on the radiating block.
Rotation is provided with tabletting, the tabletting and the holding tank phase on the radiating block in one of the embodiments,
Pair side be connected with cushion, the cushion is correspondingly arranged with the holding tank.
The radiating block is equipped with several magnetic sheets, the activity of the magnetic sheet and the tabletting in one of the embodiments,
Side is correspondingly arranged.
It in one of the embodiments, further include support base, the support base includes the set of substrate, the connection substrate
Cylinder and part are threaded through the strut in the sleeve；Connector is equipped on the sleeve；The strut connects the shell.
It in one of the embodiments, further include the first support frame, first support frame includes described in upright bar and connection
The transverse arm of upright bar；The upright bar is equipped with sliding slot, and the monitoring camera is fixedly mounted on one end of the transverse arm；Connector passes through
It is connect after the sliding slot with the other end of the transverse arm.
It in one of the embodiments, further include the second support frame being mounted on the bearing panel and setting in institute
State the spectrum light-conductive optic fibre on the second support frame；The port of the spectrum light-conductive optic fibre is arranged towards the light inlet of the shell.
The spectral detection component further includes the fixation being mounted on second support frame in one of the embodiments,
Sleeve and the attenuator being arranged in the fixes sleeve；The attenuator is corresponding with the port of the spectrum light-conductive optic fibre to be set
It sets.
Detailed description of the invention
Fig. 1 is the stereoscopic schematic diagram of the semiconductor laser test platform of a preferred embodiment of the utility model；
Fig. 2 is stereoscopic schematic diagram of the semiconductor laser test platform shown in FIG. 1 in another angle；
Fig. 3 is the operation schematic diagram of semiconductor laser test platform shown in FIG. 1；
Fig. 4 is the stereoscopic schematic diagram of the light power meter probe in Fig. 1；
Fig. 5 is the enlarged drawing at the circle A of light power meter shown in Fig. 4 probe；
Fig. 6 is the stereoscopic schematic diagram of the semiconductor laser test platform of another embodiment；
Fig. 7 is stereoscopic schematic diagram of the semiconductor laser test platform shown in fig. 6 in another angle.
Specific embodiment
The utility model will be described more fully below for the ease of understanding the utility model,.But this is practical
It is novel to realize in many different forms, however it is not limited to embodiment described herein.On the contrary, providing these implementations
The purpose of example is to make the understanding of the disclosure of the utility model more thorough and comprehensive.
Unless otherwise defined, all technical and scientific terms used herein are led with the technology for belonging to the utility model
The normally understood meaning of the technical staff in domain is identical.Terminology used in the description of the utility model herein only be
The purpose of description specific embodiment, it is not intended that in limitation the utility model.
Fig. 1 to Fig. 7 is please referred to, is the semiconductor laser test platform 100 of one better embodiment of the utility model, uses
It is detected in the output power of semiconductor laser.The semiconductor laser test platform 100 includes
Bearing panel 10；
Light power meter probe 20, light power meter probe 20 are mounted on bearing panel 10；Light power meter probe 20 includes
Detect the grip slipper 22 of main body 21 and connecting detection main body 21；Main body 21 is detected to include shell 211 and be arranged in shell 211
Detection mould group 212；Shell 211 is equipped with light inlet 213；It detects mould group 212 and is equipped with induction part 214；Detect the sense of mould group 212
Answer portion 214 corresponding with the light inlet 213 of shell 211；22 connected with outer casing 211 of grip slipper；Grip slipper 22 is equipped with holding tank 220；
Holding tank 220 is corresponding with light inlet 213；And
Camera 30 is monitored, monitoring camera 30 is mounted on bearing panel 10, monitors the camera shooting mouth and detection mould group of camera 30
212 induction part 214 is corresponding.
By the way that the output optical fibre of semiconductor laser to be placed on holding tank 220, holding tank 220 is to output optical fibre tail end
The laser of injection starts guiding role, and the laser for enabling output optical fibre to project accurately is irradiated to the induction part 214 of detection mould group 212
On, it monitors laser facula on the induction part 214 of 30 pairs of camera detection mould groups 212 and is detected and export picture signal, root outward
It can determine whether that whether bright and clean the output optical fibre of laser is smooth according to the shape of hot spot, to can avoid because of output optical fibre end face problem
And generate the case where optical fiber is burnt.
Fig. 4 and Fig. 5 is please referred to, grip slipper 22 includes the first extension board 221 of connected with outer casing 211, the first extension board of connection
221 the second extension board 222 and the guide pad 223 for connecting the second extension board 222；Specifically, the first extension board 221 and shell
It is provided with being vertically arranged on one side for light inlet 213 on 211, is provided with light inlet 213 on the second extension board 222 and shell 211
It is arranged in parallel on one side, is provided with being vertically arranged on one side for light inlet 213 on guide pad 223 and shell 211, adjusted so as to pass through
The length of first extension board 221 and the second extension board 222 enables guide pad 223 corresponding with light inlet 213；To avoid the first extension
221 pairs of monitoring cameras 30 of plate cause to block, and the first extension board 221 is located at 213 lower section of light inlet；A kind of embodiment wherein
In, holding tank 220 is arranged on guide pad 223.
To be reliably connected the first extension board 221 and shell 211, while the first extension board 221 being avoided to make light inlet 213
At blocking, the first extension board 221 is extended with two mounting bars 224 close to the side of shell 211, and two mounting bars 224 are distributed in entering light
The two sides of mouth 213, mounting bar 224 are fixedly connected with shell 211.
To accelerate the radiating rate of laser output light fibre, while high heat dispersion material is saved, grip slipper 22 further includes
Radiating block 225, radiating block 225 are mounted on guide pad 223, and holding tank 220 is arranged on radiating block 225；Specifically, holding tank
220 along linear extension, the induction part 214 of the extending direction sensing mould group 212 of holding tank 220；To ensure that laser exports
The radiation direction that optical fiber projects is accurate, and 220 width of holding tank is corresponding with laser output light fibre diameter；Preferably, radiating block 225
For oxygen-free copper material.
To make laser output light is fine to be reliably fitted in holding tank 220, rotation is provided with tabletting 226 on radiating block 225,
The side opposite with holding tank 220 of tabletting 226 is connected with cushion 227, and cushion 227 is correspondingly arranged with holding tank 220；Wherein one
In kind embodiment, active side and the radiating block 225 of tabletting 226 are fastened and connected, when the endpiece of laser output light fibre is placed into
In holding tank 220, while after tabletting 226 fastens on radiating block 225, cushion 227, which generates laser output light fibre to squeeze, to be made
With to make laser output light is fine to be reliably fitted in holding tank 220, make the outgoing light direction of laser output light fibre and hold
Receive slot 220 extending direction it is consistent.
Radiating block is realized by way of magnetic in another realization embodiment to promote the service life of tabletting 226
225 with the connection of magnetic sheet 228；Specifically, radiating block 225 is equipped with several magnetic sheets 228, the active side of magnetic sheet 228 and tabletting 226
It is correspondingly arranged；Tabletting 226 is ferromagnetic.
Further, for convenience of the height and angle for adjusting detection main body 21, light power meter probe 20 further includes support base
23, support base 23 includes the strut 233 that substrate 231, the sleeve 232 of connecting substrate 231 and part are threaded through in sleeve 232；Set
Connector (not shown) is equipped on cylinder 232；233 connected with outer casing 211 of strut；By the elastic of connector and adjust strut 233
The depth being inserted into sleeve 232, it is convenient to which the height and angle for adjusting detection 21 opposing substrate 231 of main body can effectively reduce
The bending of laser output light fibre.
Fig. 1 and Fig. 2 is please referred to, for convenience of the height and angle for adjusting monitoring camera 30, semiconductor laser test platform
100 further include the first support frame 40, and the first support frame 40 includes the transverse arm 42 of upright bar 41 and connecting upright pole 41；It is set in upright bar 41
There is sliding slot 43, monitoring camera 30 is fixedly mounted on one end of transverse arm 42；Connector (not shown) pass through sliding slot 43 after with transverse arm 42
The other end connection；By unclamping connector, the rotatable or opposite sliding slot 43 of transverse arm 42 is slided, so as to monitoring camera 30
Height and angle are adjusted, and keep the camera shooting mouth for monitoring camera 30 accurate corresponding with the induction part 214 for detecting mould group 212.At it
In a kind of middle embodiment, connector is screw.
Fig. 6 and Fig. 7 is please referred to, be while realizing that semiconductor laser exports the spectral detection of laser, semiconductor laser
Test platform 100 further includes the second support frame 51 being mounted on bearing panel 10 and the light being arranged on the second support frame 51
Compose light-conductive optic fibre 52；The light inlet 213 that the port of spectrum light-conductive optic fibre 52 faces out shell 211 is arranged；The output optical fibre of laser
After in emitted laser irradiation to the induction part 214 of detection mould group 212, diffusing reflection, part occur on induction part 214 for laser
Irreflexive light back through light inlet 213 is simultaneously irradiated on the port of spectrum light-conductive optic fibre 52, is irradiated to spectrum light-conductive optic fibre
Laser on 52 ports is transmitted to external spectrometer through spectrum light-conductive optic fibre 52, to can realize that semiconductor laser exports laser
Spectral detection.
Further, the intensity of the light on the port to avoid being irradiated to spectrum light-conductive optic fibre 52 is excessive, influences spectrum
Detection effect, spectral detection component 50 further include that 53 sleeve 232 of fixes sleeve being mounted on the second support frame 51 and setting exist
Attenuator in 53 sleeve 232 of fixes sleeve；The port of attenuator and spectrum light-conductive optic fibre 52 is correspondingly arranged；Pass through attenuator pair
Laser beam partially absorbs, so that the laser intensity for the port for being incident on spectrum light-conductive optic fibre 52 be made to be weakened, avoids light
Spectrum detection effect is affected.
Further, to avoid the output optical fibre of semiconductor laser that overflexing occurs, make the transmission matter of output optical fibre
Amount decline, semiconductor laser test platform 100 further include third support frame 60, and third support frame 60 includes connection bearing panel
10 foundation 61, the support plate 62 for connecting foundation 61 and the fibre clip 63 being arranged in support plate 62；Support plate 62 is opposite to be carried
The height of panel 10 is correspondingly arranged with grip slipper 22.By the way that the output fiber bundle of semiconductor laser is placed into support plate 62
On, so as to reduce the bending of output optical fibre, the transmission quality of output optical fibre is avoided to decline.
Referring to Fig. 3, when using semiconductor laser test platform 100, first by the endpiece of the output optical fibre of laser
It is accommodated in holding tank 220, holding tank 220 generates guiding role to the output laser of laser output light fibre, keeps laser defeated
The laser that optical fiber projects out is accurately mapped on the induction part 214 of detection mould group 212, repeatedly so as to avoid optical fiber hold assembly
It adjusts.In the present embodiment, detection mould group 212 is that thermoelectric pile detects mould group, to provide reference environment temperature to detection mould group 212
Degree, detection main body 21 further includes heat sink 215, and detection mould group 212 is connect with heat sink 215；Laser light irradiation to detection mould group 212
After upper, detect the heat according to caused by laser beam of mould group 212 and generate corresponding electric signal, and be output to the outside, meanwhile,
Laser facula is detected and exports picture signal outward on the induction part 214 of 30 pairs of camera detection mould groups 212 of monitoring.Specifically
Ground, when semiconductor laser test platform 100 is switched on and runs, if discovery is occurred by the light spot shape that monitoring camera 30 detects
It is abnormal, then stop the operation of semiconductor laser test platform 100 immediately, and weight is carried out to the tail end of the output optical fibre of laser
New cutting can avoid generating the case where optical fiber is burnt because of output optical fibre end face problem.In addition, according to whether camera 30 is monitored
Detect that hot spot can determine whether that the case where output optical fibre is burnt has occurred because of other reasons.
In the present embodiment, by the way that the output optical fibre of semiconductor laser to be placed on holding tank, holding tank is to output light
The laser that fine tail end projects starts guiding role, and the laser for enabling output optical fibre to project accurately is irradiated to the induction part of detection mould group
On, monitoring camera detects laser facula on the induction part of detection mould group and exports picture signal outward, according to hot spot
Shape can determine whether that whether bright and clean the output optical fibre of laser is smooth, to can avoid generating light because of output optical fibre end face problem
The case where fibre is burnt.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (10)
1. a kind of semiconductor laser test platform characterized by comprising
Bearing panel；
Light power meter probe, the light power meter probe are mounted on the bearing panel；The light power meter probe includes inspection
Survey the grip slipper of main body and the connection detection main body；The spy that the detection main body includes shell and is arranged in the shell
Survey mould group；The shell is equipped with light inlet；The detection mould group is equipped with induction part；It is described detection mould group induction part with it is described
The light inlet of shell is corresponding；The grip slipper connects the shell；The grip slipper is equipped with holding tank；The holding tank and institute
It is corresponding to state light inlet；And
Camera is monitored, the monitoring camera is mounted on the bearing panel, the camera shooting mouth of the monitoring camera and the detection
The induction part of mould group is corresponding.
2. semiconductor laser test platform according to claim 1, which is characterized in that the grip slipper includes connection institute
State the guiding of the first extension board of shell, the second extension board of connection first extension board and connection second extension board
Block.
3. semiconductor laser test platform according to claim 2, which is characterized in that first extension board is close to institute
The side for stating shell is extended with two mounting bars, and two mounting bars are distributed in the two sides of the light inlet；The mounting bar and institute
Shell is stated to be fixedly connected.
4. semiconductor laser test platform according to claim 2, which is characterized in that the grip slipper further includes heat dissipation
Block, on the guide pad, the holding tank is arranged on the radiating block for the radiating block installation.
5. semiconductor laser test platform according to claim 4, which is characterized in that rotate setting on the radiating block
There is tabletting, the tabletting side opposite with the holding tank is connected with cushion, and the cushion is correspondingly arranged with the holding tank.
6. semiconductor laser test platform according to claim 5, which is characterized in that the radiating block is equipped with several
Magnetic sheet, the magnetic sheet and the active side of the tabletting are correspondingly arranged.
7. semiconductor laser test platform according to claim 1, which is characterized in that it further include support base, the branch
Support seat includes the strut that substrate, the sleeve of the connection substrate and part are threaded through in the sleeve；It is equipped on the sleeve
Connector；The strut connects the shell.
8. semiconductor laser test platform according to claim 7, which is characterized in that further include the first support frame, institute
State the transverse arm that the first support frame includes upright bar and the connection upright bar；The upright bar is equipped with sliding slot, and the monitoring camera is fixed
It is mounted on one end of the transverse arm；Connector is connect after passing through the sliding slot with the other end of the transverse arm.
9. semiconductor laser test platform according to claim 1, which is characterized in that further include being mounted on the carrying
The second support frame on panel and the spectrum light-conductive optic fibre being arranged on second support frame；The spectrum light-conductive optic fibre
Port is arranged towards the light inlet of the shell.
10. semiconductor laser test platform according to claim 9, which is characterized in that the spectral detection component is also
Including the fixes sleeve being mounted on second support frame and the attenuator being arranged in the fixes sleeve；The decaying
The port of piece and the spectrum light-conductive optic fibre is correspondingly arranged.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820893773.0U CN208283042U (en) | 2018-06-08 | 2018-06-08 | Semiconductor laser test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820893773.0U CN208283042U (en) | 2018-06-08 | 2018-06-08 | Semiconductor laser test platform |
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| Publication Number | Publication Date |
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| CN208283042U true CN208283042U (en) | 2018-12-25 |
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ID=64698769
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| Application Number | Title | Priority Date | Filing Date |
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| CN201820893773.0U Active CN208283042U (en) | 2018-06-08 | 2018-06-08 | Semiconductor laser test platform |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109467009A (en) * | 2018-12-30 | 2019-03-15 | 上海昂丰矿机科技有限公司 | A kind of crane displaying device |
| CN110657951A (en) * | 2019-10-07 | 2020-01-07 | 深圳妙格投资控股集团有限公司 | Laser diode focal length and spectrum testing device |
| CN113588210A (en) * | 2021-07-15 | 2021-11-02 | 深圳市南方联合科技有限公司 | Network optical fiber defect detection device and method |
-
2018
- 2018-06-08 CN CN201820893773.0U patent/CN208283042U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109467009A (en) * | 2018-12-30 | 2019-03-15 | 上海昂丰矿机科技有限公司 | A kind of crane displaying device |
| CN110657951A (en) * | 2019-10-07 | 2020-01-07 | 深圳妙格投资控股集团有限公司 | Laser diode focal length and spectrum testing device |
| CN113588210A (en) * | 2021-07-15 | 2021-11-02 | 深圳市南方联合科技有限公司 | Network optical fiber defect detection device and method |
| CN113588210B (en) * | 2021-07-15 | 2022-05-03 | 深圳市南方联合科技有限公司 | Network optical fiber defect detection device and method |
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