CN203606109U - High-power semiconductor laser device test system - Google Patents
High-power semiconductor laser device test system Download PDFInfo
- Publication number
- CN203606109U CN203606109U CN201320802774.7U CN201320802774U CN203606109U CN 203606109 U CN203606109 U CN 203606109U CN 201320802774 U CN201320802774 U CN 201320802774U CN 203606109 U CN203606109 U CN 203606109U
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- refrigerator
- semiconductor laser
- power semiconductor
- laser device
- temperature controller
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Abstract
The utility model provides a high-power semiconductor laser device test system, and belongs to the field of a high-power semiconductor laser device test device. The system comprises a noise detection unit, a monochrometer, an optical power meter, an LD driving power supply, a refrigerator, a control unit, a refrigerator driving unit, an RS232, a PC, a temperature controller and a temperature acquisition unit. The noise detection unit, the monochrometer, the optical power meter, the LD driving power supply and the refrigerator are respectively connected with a high-power semiconductor laser device. The control unit is respectively connected with the noise detection unit, the monochrometer, the optical power meter, the LD driving power supply, the refrigerator, the RS232 and the refrigerator driving unit. The refrigerator driving unit is connected with the refrigerator. The PC is respectively connected with the RS232 and the temperature controller. The temperature acquisition unit is respectively connected with the high-power semiconductor laser device and the temperature controller. According to the test system, the temperature controller is adopted so that performance indexes, such as noise, spectrum, optical power, etc., of the laser device can be accurately measured in real time under the situation that temperature changes when the laser device is in use.
Description
Technical field
The utility model belongs to high-power semiconductor laser proving installation field, is specifically related to a kind of high-power semiconductor laser test macro.
Background technology
The performance test of high-power semiconductor laser mainly refers to noise, spectrum, the luminous power index test to high-power semiconductor laser under normal operating conditions.But, existing high power semiconductor laser device reliability detection method is only confined to the measurement to photoelectric characteristics such as laser noise, spectrum, luminous power indexs conventionally, but its content measurement the is not comprised in temperature control system impact on laser instrument while normally working.
Utility model content
Conventionally be only confined to the measurement to photoelectric characteristics such as laser noise, spectrum, luminous power indexs in order to solve existing high power semiconductor laser device reliability detection method, but the technical matters of the impact on laser instrument while normally working that its content measurement is not comprised in temperature control system, the utility model provides a kind of high-power semiconductor laser test macro.
The technical scheme that the utility model technical solution problem is taked is as follows:
High-power semiconductor laser test macro comprises noise detection unit, monochromator, light power meter, LD driving power, refrigerator, control module, refrigerator driver element, RS232, PC, temperature controller and temperature collecting cell, it is characterized in that, described noise detection unit, monochromator, light power meter, LD driving power, refrigerator is connected with high-power semiconductor laser respectively, described control module respectively with noise detection unit, monochromator, light power meter, LD driving power, refrigerator, RS232, refrigerator driver element is connected, described refrigerator driver element is connected with refrigerator, described PC respectively with RS232, temperature controller is connected, described temperature collecting cell respectively with high-power semiconductor laser, temperature controller is connected.
The beneficial effects of the utility model are: this high-power semiconductor laser test macro is owing to adopting temperature controller, so can be in the time of laser works temperature variation in the situation that, accurately measure the performance index such as noise, spectrum, luminous power of laser instrument in real time.
Accompanying drawing explanation
Fig. 1 is the structured flowchart of the utility model high-power semiconductor laser test macro.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further details.
As shown in Figure 1, high-power semiconductor laser test macro of the present utility model comprises noise detection unit, monochromator, light power meter, LD driving power, refrigerator, control module, refrigerator driver element, RS232, PC, temperature controller and temperature collecting cell, described noise detection unit, monochromator, light power meter, LD driving power, refrigerator is connected with high-power semiconductor laser respectively, described control module respectively with noise detection unit, monochromator, light power meter, LD driving power, refrigerator, RS232, refrigerator driver element is connected, described refrigerator driver element is connected with refrigerator, described PC respectively with RS232, temperature controller is connected, described temperature collecting cell respectively with high-power semiconductor laser, temperature controller is connected.
Wherein, the low frequency 1/f noise test macro 9812D that noise detection unit adopts Gai Lun Electronic Science and Technology Co., Ltd. to release, monochromator adopts the SSM series monochromator of the Chinese light of standing upright, light power meter adopts the TAM8712PON type light power meter of east, Qingdao Jia Xun Photoelectric Co., Ltd., LD driving power is selected Beijing wante board 12v accumulator, control module adopts PIC16F59 type PIC single-chip microcomputer, refrigerator driver element adopts the special MAX1968 of TEC to drive chip, RS232 serial ports is selected STD-60241 type serial ports, the model that refrigerator adopts the Arctic Ocean, Hainan electronic cooling technology company limited to produce is TESI-4903P semiconductor cooler, temperature collecting cell is selected Pt100 thermistor, and temperature controller adopts PIC single-chip microcomputer.
When concrete application high-power semiconductor laser test macro of the present utility model, first set a reference temperature numerical value to temperature controller; LD driving power provides electric energy to high-power semiconductor laser under the control of control module, light power meter, monochromator and noise detection unit are respectively used to measure luminous power, frequency spectrum and the noise of high-power semiconductor laser, and measurement result is passed to control module.Temperature collecting cell is for measuring the real time temperature value of high-power semiconductor laser, and real time temperature value signal is passed to temperature controller, temperature controller compares the reference temperature numerical value of the real time temperature value signal of receiving and setting, and drawing temperature control signals, temperature controller is passed to control module by PC and RS232 serial ports by temperature control signals more in turn.The temperature control signals control refrigerator driver element that control module transmits according to temperature controller, the driving signal that refrigerator is sent according to refrigerator driver element heats or refrigeration control in real time to high-power semiconductor laser.PC can also receive optical power value, spectrum value, noise figure and the temperature value signal sent by control module, and shows in real time by the display of self.
Claims (1)
1. high-power semiconductor laser test macro, comprise noise detection unit, monochromator, light power meter, LD driving power, refrigerator, control module, refrigerator driver element, RS232, PC, temperature controller and temperature collecting cell, it is characterized in that, described noise detection unit, monochromator, light power meter, LD driving power, refrigerator is connected with high-power semiconductor laser respectively, described control module respectively with noise detection unit, monochromator, light power meter, LD driving power, refrigerator, RS232, refrigerator driver element is connected, described refrigerator driver element is connected with refrigerator, described PC respectively with RS232, temperature controller is connected, described temperature collecting cell respectively with high-power semiconductor laser, temperature controller is connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320802774.7U CN203606109U (en) | 2013-12-09 | 2013-12-09 | High-power semiconductor laser device test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320802774.7U CN203606109U (en) | 2013-12-09 | 2013-12-09 | High-power semiconductor laser device test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203606109U true CN203606109U (en) | 2014-05-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320802774.7U Expired - Fee Related CN203606109U (en) | 2013-12-09 | 2013-12-09 | High-power semiconductor laser device test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203606109U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108444682A (en) * | 2018-06-08 | 2018-08-24 | 深圳市杰普特光电股份有限公司 | Semiconductor laser automatic functional testing system |
| CN109211524A (en) * | 2018-12-10 | 2019-01-15 | 中国人民解放军国防科技大学 | Parameter integrated synchronous testing device for high-power optical fiber laser |
| CN112147490A (en) * | 2020-11-26 | 2020-12-29 | 上海菲莱测试技术有限公司 | Method and system for laser chip integration test |
-
2013
- 2013-12-09 CN CN201320802774.7U patent/CN203606109U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108444682A (en) * | 2018-06-08 | 2018-08-24 | 深圳市杰普特光电股份有限公司 | Semiconductor laser automatic functional testing system |
| CN108444682B (en) * | 2018-06-08 | 2023-10-03 | 深圳市杰普特光电股份有限公司 | Automatic function test system for semiconductor laser |
| CN109211524A (en) * | 2018-12-10 | 2019-01-15 | 中国人民解放军国防科技大学 | Parameter integrated synchronous testing device for high-power optical fiber laser |
| CN112147490A (en) * | 2020-11-26 | 2020-12-29 | 上海菲莱测试技术有限公司 | Method and system for laser chip integration test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140521 Termination date: 20151209 |
|
| EXPY | Termination of patent right or utility model |