CN202502213U - Semiconductor laser aging and life test protection system - Google Patents
Semiconductor laser aging and life test protection system Download PDFInfo
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- CN202502213U CN202502213U CN 201120566815 CN201120566815U CN202502213U CN 202502213 U CN202502213 U CN 202502213U CN 201120566815 CN201120566815 CN 201120566815 CN 201120566815 U CN201120566815 U CN 201120566815U CN 202502213 U CN202502213 U CN 202502213U
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Abstract
The utility model provides a semiconductor laser aging and life test protection system. The system comprises a semiconductor laser working platform, a liquid cooling channel, a temperature detection device, and a computer processing system. If a semiconductor laser temperature abnormal situation is monitored by a computer, then the computer is used to cause a driving power supply to stop working. The maximum flow and the minimum flow of a flowmeter are set through the computer, when the actual flow is higher than the set maximum flow or lower than the set minimum flow, an alarm will issued by the system, and the computer is used to cause the driving power supply to stop outputting. According to the utility model, the real-time monitoring of states of each semiconductor laser in a semiconductor laser aging and life test process is realized, a plurality of important monitoring indexes are set, the cooling system is adjusted timely, and a targeted end of the aging and life test work of a semiconductor laser is performed when necessary in order to avoid the accidental death of the semiconductor laser in the aging and life test process.
Description
Technical field
The utility model relates to a kind of semiconductor laser ageing and life test protection system.
Background technology
High-power semiconductor laser is used widely in many fields such as communication, military affairs, medical treatment.Its reliability is more and more paid attention to by people as the important indicator of weighing the laser instrument product.This mainly due to:
(1), can judge the inefficacy mechanism of semiconductor laser accurately through the reliability consideration of semiconductor laser.
(2) the real work life time of measuring semiconductor laser instrument.
(3) the aging research for semiconductor laser provides foundation.
(4) for improving the reliability that designs and technology improve semiconductor laser.
Yet; Because the life test of high-power semiconductor laser often need be under the laser works state; Timing and the long-term multiple laser performance parameter of measurement not only need testing apparatus to have advantages of higher stability and repeatability, and need lot of data statistics and analysis.For many years, how tame unit does a lot of work in the semiconductor laser life test both at home and abroad.Wherein, the LRS-9420/LRS9422 type laser device reliability test macro of American I LX Light wave company Development and Production in 2003.The Range of measuring temp of this system is that 40 ℃ of-150 ℃ of temperature control accuracy are ± 0.5 ℃ for ± 1 ℃ of temperature stability; Maximum drive current 500mA; The laser wavelength scope of surveying is 600nm to 1800nm, and constant working current (ACC, constant optical power (APC), luminous power--electric current--voltage parameter test (LIV) three kinds of test patterns can be provided.The means of the life test of domestic laser instrument product and method also are in theoretical research stage.Utilize electric derivative method of testing like propositions such as Lee of Jilin University red rocks.Utilize electric derivative (V～I concerns the product of first order derivative and electric current I) can be used for studying the semiconductor laser structure parameter attribute, a voltage saturation characteristic etc., and according to life-span of these parameter prediction Laser Devices.
Yet existing laser life-span test macro is generally lower to the measured power scope of laser instrument, and the domestic laser life-span test macro of developing, majority concentrates on manual measurement, or the theoretical derivation stage.The accuracy that this mode is difficult to guarantee to test is with stable, and when especially testing to powerful laser instrument, its data are difficult to reflect course of work true lifetime of laser instrument.
Each semiconductor laser all need just can make its serviceability reach stable through overaging; The laser instrument of each type all must be through life test before producing in enormous quantities.Yet except the laser performance problem with the life-span weak point, other factor also may cause the laser instrument unexpected death in aging and life.If unexpected death in aging formation, occurs, will cause a large amount of losses.Death could make whole life test all that has been achieved is spoiled if in the life test process, meet accident, and loss can't be estimated!
At present, Shang Weijian is about systematically being directed against the device of monitoring and protecting of semiconductor laser ageing and life test.
The utility model content
For solving the problem that exists in the background technology; The utility model provides a kind of semiconductor laser ageing and life test protection system; Protect in the whole process of the aging and life test of this system's noise spectra of semiconductor lasers, to avoid semiconductor laser unexpected death in aging and the life test process.
The technical scheme of the utility model is following:
Semiconductor laser ageing and life test protection system is characterized in that: comprise semiconductor laser workbench, liquid cooling passage, temperature-detecting device and computer processing system; Said temperature-detecting device comprises a plurality of temp probes and in order to gather the temperature collect module of multi way temperature probe signal simultaneously, wherein, said a plurality of temp probes are one by one corresponding to the semiconductor laser on the semiconductor laser workbench; The output terminal of said temperature collect module is connected with the temperature data input end of computer processing system, and the control signal end of computer processing system is told the on-off circuit that the multiple signals line is connected to corresponding each semiconductor laser drive power respectively.
Above-mentioned liquid cooling passage can be the current cooling circuit, and this current cooling circuit comprises cooling-water machine and flowmeter, and computer processing system is formed in order to regulate the feedback control loop of cooling-water machine aquifer yield through flow threshold is set.Like this, can realize current and temperature protection more in real time reliably simultaneously.
Above-mentioned flowmeter can adopt the flow system that has turbine or impeller.
The said temperature probe is contact probe (the contact probe can be plugged on the platform).
Above-mentioned each semiconductor laser can also be provided with overcurrent protection and overvoltage protection.In the process in laser ageing or life-span; The working current of computer real-time acquisition laser instrument and WV; If monitor abnormal conditions; For example: electric current surpasses or is lower than the setting electric current, and voltage surpasses or is lower than 80% of WV, then stops output through the computer control driving power.
During the work of driving power control semiconductor laser; Each semiconductor laser installing has hygrosensor; Each hygrosensor all is connected on the temperature collect module; The output terminal of temperature collect module is connected with the real time temperature that computing machine is used to export each semiconductor laser, if computer monitoring is unusual to wherein there being the semiconductor laser actuator temperature to occur, will quit work through the computer control driving power.
When carrying out semiconductor laser ageing and life test; Semiconductor laser is positioned on the workbench; The work of driving power control semiconductor laser; Liquid in the cooling-water machine reaches workbench after through the flow system that has turbine or impeller and freezes to semiconductor laser, and then flows into cooling-water machine and circulate.Through the upper limit flow and the lower limit flow of computer settings flowmeter, when actual flow was higher than the upper limit flow of setting, system alarm stopped output through the computer control driving power; When should actual flow being lower than the lower limit flow of setting, system alarm stops output through the computer control driving power, and driving power quits work, and then semiconductor laser quits work, and semiconductor laser is release heat no longer.
In feedback control loop, flow system can change into the rotating speed of turbine current signal (as flowmeter), the corresponding a certain flow of a certain current signal, and computing machine reads current value through data collecting card or digital multimeter.
The utility model has been realized the state of each semiconductor laser in real-time monitoring semiconductor laser ageing and the life test process; A plurality of important monitoring indexes are set; Can comprehensively embody the running status of semiconductor laser; In time cooling system is regulated, the aging and life test work that stops certain semiconductor laser to ground is arranged in case of necessity, avoided semiconductor laser unexpected death in aging and the life test process.
Description of drawings
Fig. 1 is the system architecture schematic diagram of the utility model.
Fig. 2 is a temperature protection part synoptic diagram in the utility model system.
Fig. 3 is a current cooling circuit synoptic diagram in the utility model system.
Wherein 1 is semiconductor laser; 2 is hygrosensor; 3 is workbench.
Embodiment
In view of the importance of semiconductor laser ageing and life test protection, the protection scheme that the utility model proposes is made up of current protection, temperature protection.
Fig. 1 is the current temperature protection systematic schematic diagram of the utility model.Can realize current and temperature protection simultaneously.
Semiconductor laser needs liquid refrigerating in operate as normal, in order all to take away the heat that laser instrument produces, need the flow of monitoring liquid.If the flow of liquid is excessive, then fluid pressure is bigger, and interface unit bears incessantly big pressure, if fluid flow is less, then can not take away heat.When fluid flow was greater than or less than range of set value, system alarm stopped output through the software control power supply.
Liquid is through having the flow system of turbine or impeller, and this system can change into the rotating speed of turbine current signal (as flowmeter), the corresponding a certain flow of a certain current signal, and computing machine reads current value through data collecting card or digital multimeter.
As shown in Figure 1; When carrying out semiconductor laser ageing and life test; Semiconductor laser 1 is positioned on the workbench 3; 1 work of driving power control semiconductor laser, the water in the cooling-water machine reach workbench after through flowmeter and give semiconductor laser 1 refrigeration, and then flow into cooling-water machine and circulate.Through the upper limit flow and the lower limit flow of computer settings flowmeter, when actual flow was higher than the upper limit flow of setting, system alarm stopped output through the computer control driving power; When should actual flow being lower than the lower limit flow of setting, system alarm stops output through the computer control driving power, and driving power quits work, and then semiconductor laser 1 quits work, and semiconductor laser 1 is release heat no longer.
During 1 work of driving power control semiconductor laser; Each semiconductor laser 1 is equipped with hygrosensor 2; Each hygrosensor 2 all is connected on the temperature collect module; The output terminal of temperature collect module is connected with the real time temperature that computing machine is used to export each semiconductor laser 1, if computer monitoring is unusual to wherein there being semiconductor laser 1 temperature to occur, will quit work through the computer control driving power.
Also can in current temperature protection system, overcurrent protection and overvoltage protection be set simultaneously; In the process in laser ageing or life-span; The working current of computer real-time acquisition laser instrument and WV, if monitor abnormal conditions, for example: electric current is above perhaps being lower than the setting electric current; Voltage surpasses or is lower than 80% of WV, then stops output through the computer control driving power.
Fig. 2 is the utility model temperature protection synoptic diagram.
Temperature protection: in the process of semiconductor laser ageing or life test; Because semiconductor laser self reason or external cause possibly cause the semiconductor laser heating; When certain semiconductor laser appearance temperature is unusual in the aging perhaps life-span system; Computer monitoring will quit work through the computer control driving power to temperature anomaly is arranged.
Temperature protection system in the utility model comprises computing machine, temperature collect module, hygrosensor 2, workbench 3, semiconductor laser 1.1 work of driving power control semiconductor laser; Each semiconductor laser 1 is equipped with hygrosensor 2; Each hygrosensor 2 all is connected on the temperature collect module; The output terminal of temperature collect module is connected with the real time temperature that computing machine is used to export each semiconductor laser 1, if computer monitoring is unusual to wherein there being semiconductor laser 1 temperature to occur, will quit work through controlling this driving power.
Each semiconductor laser 1 is equipped with the temperature that hygrosensor 2 is used for monitoring in real time semiconductor laser 1; Hygrosensor 2 sends the temperature that monitors to temperature collect module; Temperature collect module can realize that multi way temperature gathers simultaneously; The output terminal of temperature collect module connects on computers, and the real time temperature of exportable each semiconductor laser 1 of computing machine is in the process of laser ageing or life test; Because product self reason or external cause possibly cause laser generates heat; When certain semiconductor laser 1 appearance temperature is unusual in the aging perhaps life-span system, computer monitoring will quit work through driving power to temperature anomaly is arranged.
Fig. 3 is the utility model current protection synoptic diagram.
The current protection: semiconductor laser needs the service water refrigeration in operate as normal, in order all to take away the heat that laser instrument produces, needs the flow of monitoring water.If the flow of water is excessive, then water pressure is bigger, and interface unit bears incessantly big pressure, if discharge is less, then can not take away heat.When discharge was greater than or less than range of set value, system alarm stopped output through the computer control driving power.
The utility model current protection system as shown in Figure 3 comprises computing machine, cooling-water machine, flowmeter, workbench 3, semiconductor laser 1.Water in the cooling-water machine reaches workbench after through flowmeter and freezes to semiconductor laser, and then flows into cooling-water machine and circulate.Through the upper limit flow and the lower limit flow of computer settings flowmeter, when actual flow was higher than the upper limit flow of setting, system alarm stopped output through the soft controlling and driving power supply of computing machine; When should actual flow being lower than the lower limit flow of setting, system alarm stops output through the computer control driving power
Described flowmeter is the flow system that has turbine or impeller, and this system can change into current signal with the rotating speed of turbine, the corresponding a certain flow of a certain current signal, and computing machine reads current value through data collecting card or digital multimeter.
Claims (5)
1. semiconductor laser ageing and life test protection system is characterized in that: comprise semiconductor laser workbench, liquid cooling passage, temperature-detecting device and computer processing system; Said temperature-detecting device comprises a plurality of temp probes and in order to gather the temperature collect module of multi way temperature probe signal simultaneously, wherein, said a plurality of temp probes are one by one corresponding to the semiconductor laser on the semiconductor laser workbench; The output terminal of said temperature collect module is connected with the temperature data input end of computer processing system, and the control signal end of computer processing system is told the on-off circuit that the multiple signals line is connected to corresponding each semiconductor laser drive power respectively.
2. semiconductor laser ageing according to claim 1 and life test protection system; It is characterized in that: said liquid cooling passage is the current cooling circuit; This current cooling circuit comprises cooling-water machine and flowmeter, and computer processing system is formed in order to regulate the feedback control loop of cooling-water machine aquifer yield through flow threshold is set.
3. semiconductor laser ageing according to claim 2 and life test protection system is characterized in that: described flowmeter is the flow system that has turbine or impeller.
4. semiconductor laser ageing according to claim 1 and life test protection system is characterized in that: said temp probe is the contact probe.
5. semiconductor laser ageing according to claim 1 and life test protection system is characterized in that: each semiconductor laser is provided with overvoltage protection and overcurrent protection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120566815 CN202502213U (en) | 2011-12-20 | 2011-12-20 | Semiconductor laser aging and life test protection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120566815 CN202502213U (en) | 2011-12-20 | 2011-12-20 | Semiconductor laser aging and life test protection system |
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| Publication Number | Publication Date |
|---|---|
| CN202502213U true CN202502213U (en) | 2012-10-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201120566815 Expired - Fee Related CN202502213U (en) | 2011-12-20 | 2011-12-20 | Semiconductor laser aging and life test protection system |
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| Country | Link |
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| CN (1) | CN202502213U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245486A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院苏州生物医学工程技术研究所 | Aging and life testing system for QCW semiconductor laser |
-
2011
- 2011-12-20 CN CN 201120566815 patent/CN202502213U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103245486A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院苏州生物医学工程技术研究所 | Aging and life testing system for QCW semiconductor laser |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 710077 Xi'an hi tech Zone 56, Xi'an, Shaanxi Province, No. 56 Patentee after: FOCUSLIGHT TECHNOLOGIES INC. Address before: 710119 Third Floor, Building 10, 17 Information Avenue, New Industrial Park, Xi'an High-tech Zone, Shaanxi Province Patentee before: Xi'an Focuslight Technology Co., Ltd. |
|
| CP03 | Change of name, title or address | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121024 Termination date: 20181220 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |