CN108333850A - The laser projection module and its detection method of damage, depth camera and electronic device - Google Patents

The laser projection module and its detection method of damage, depth camera and electronic device Download PDF

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Publication number
CN108333850A
CN108333850A CN201810162417.6A CN201810162417A CN108333850A CN 108333850 A CN108333850 A CN 108333850A CN 201810162417 A CN201810162417 A CN 201810162417A CN 108333850 A CN108333850 A CN 108333850A
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CN
China
Prior art keywords
laser
diffraction
projection module
conductive electrode
electric signal
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CN201810162417.6A
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Chinese (zh)
Inventor
白剑
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Guangdong Oppo Mobile Telecommunications Corp Ltd
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Guangdong Oppo Mobile Telecommunications Corp Ltd
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Priority to CN201810162417.6A priority Critical patent/CN108333850A/en
Publication of CN108333850A publication Critical patent/CN108333850A/en
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B15/00—Special procedures for taking photographs; Apparatus therefor
    • G03B15/02—Illuminating scene
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

The invention discloses a kind of laser projection modules.Laser projection module includes barrel assembly, light source, collimating element, diffraction optical element, laser distribution probe assembly and processor.Light source, collimating element, diffraction optical element and laser distribution probe assembly are arranged in barrel assembly.Laser distribution probe assembly is used to emit light source and is converted into the first electric signal output at least through the optical signal after collimating element.Processor is connect with laser distribution probe assembly.Processor is for obtaining the first electric signal, judging whether the first electric signal determines the damage of laser projection module in the first preset range and when the first electric signal is not in the first preset range.In this way, can detect laser projection module damage when be not turned on laser projection module, to avoid to user body or eyes generate harm.In addition, the invention also discloses detection method, depth camera and the electronic devices of a kind of damage of laser projection module.

Description

The laser projection module and its detection method of damage, depth camera and electronic device
Technical field
The present invention relates to technical field of imaging, more particularly to a kind of laser projection module, laser projection module damage inspection Survey method, depth camera and electronic device.
Background technology
Structure light video camera head emits laser using light source, to assist infrared camera to obtain structure light image.Positive reason Under condition, the laser of light source transmitting, will not be to people by optical system (such as collimating element, diffraction optical element) energy attenuation afterwards Body damages.However, optical system is usually made of glass or other frangible components, once situations such as dropping is encountered, light System ruptures, and laser will be emitted directly, irradiate the body or eyes of user, cause serious safety problem.
Invention content
Embodiment of the present invention provide a kind of laser projection module, the damage of laser projection module detection method, depth phase Machine and electronic device.
The laser projection module of embodiment of the present invention include barrel assembly and the light source being arranged in the barrel assembly, Collimating element, diffraction optical element, laser distribution probe assembly and processor, the light source is for emitting laser；The collimation Element is for collimating the laser；Laser of the diffraction optical element for after collimating element collimation described in diffraction is sharp to be formed Light pattern；The laser distribution probe assembly is for emitting the light source and at least through the optical signal after the collimating element It is converted into the first electric signal output；Processor is connect with laser distribution probe assembly, and the processor is described for obtaining First electric signal judges whether first electric signal is not located in the first preset range and in first electric signal The laser projection module damage is determined when in first preset range.
The detection method of the laser projection module damage of embodiment of the present invention, the laser projection module includes lens barrel group Part and the light source being arranged in the barrel assembly, collimating element, diffraction optical element, laser distribution probe assembly, the light Source is for emitting laser, and the collimating element is for collimating the laser, and the diffraction optical element described in diffraction for collimating For laser after element collimation to form laser pattern transparency conducting film transparency conducting film, the laser distribution probe assembly is used for will The light source emits and is converted into the first electric signal output at least through the optical signal after the collimating element；The detection method Including：Obtain the first electric signal of the laser distribution probe assembly output；Judge whether first electric signal is in first In preset range；With laser projection module damage is determined when first electric signal is not in first preset range It is bad.
The depth camera of embodiment of the present invention includes that laser projection module, the image described in any of the above-described embodiment are adopted Storage and processor, described image collector be used to acquire projected from the laser projection module into object space it is described sharp Light pattern；The processor is for handling the laser pattern to obtain depth image.
The electronic device of embodiment of the present invention includes the depth camera described in shell and any of the above-described embodiment, described Depth camera setting is exposed to obtain the depth image on the housing and from the shell.
The laser projection module of embodiment of the present invention, detection method, depth camera and the electricity of the damage of laser projection module Sub-device is distributed probe assembly by the laser being arranged in barrel assembly and converts the optical signal that light source emits to electric signal, To judge whether laser projection module damages.In this way, can be when detecting the damage of laser projection module, selection is not turned on laser Module is projected, after being damaged to avoid laser projection module, the energy for the laser that laser projection module projects is excessively high, to user's Body or eyes, which are led to the problem of, to be endangered, and the safety that user uses is promoted.
The additional aspect and advantage of embodiment of the present invention will be set forth in part in the description, partly will be from following Become apparent in description, or practice through the invention is recognized.
Description of the drawings
The above-mentioned and/or additional aspect and advantage of the present invention can be from the description in conjunction with following accompanying drawings to embodiment It will be apparent and be readily appreciated that, wherein：
Fig. 1 to Fig. 3 is the structural schematic diagram of the laser projection module of certain embodiments of the present invention；
Fig. 4 to Fig. 5 is the sectional view of the diffraction optical element of certain embodiments of the present invention；
Fig. 6 to Figure 13 is the conspectus of the conductive electrode of the diffraction optical element of certain embodiments of the present invention；
Figure 14 is the structural schematic diagram of the diffraction optical element of certain embodiments of the present invention；
Figure 15 is the conspectus of the conductive electrode of the diffraction optical element of certain embodiments of the present invention；
Figure 16 is the structural schematic diagram of the diffraction optical element of certain embodiments of the present invention；
Figure 17 to Figure 18 is the structural schematic diagram of the collimating element of certain embodiments of the present invention；
Figure 19 to Figure 26 is the conspectus of the conductive electrode of the collimating element of certain embodiments of the present invention；
Figure 27 is the structural schematic diagram of the collimating element of certain embodiments of the present invention；
Figure 28 is the conspectus of the conductive electrode of the collimating element of certain embodiments of the present invention；
Figure 29 is the structural schematic diagram of the collimating element of certain embodiments of the present invention；
Figure 30 to Figure 32 is the part-structure schematic diagram of the laser projection module of certain embodiments of the present invention；
Figure 33 is the structural schematic diagram of the depth camera of certain embodiments of the present invention；
Figure 34 is the structural schematic diagram of the electronic device of certain embodiments of the present invention；
Figure 35 to Figure 36 is the flow diagram of the detection method of certain embodiments laser projection module damage of the present invention.
Specific implementation mode
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached The embodiment of figure description is exemplary, it is intended to for explaining the present invention, and is not considered as limiting the invention.
Also referring to Fig. 1 to Fig. 3, the laser projection module 100 of embodiment of the present invention includes barrel assembly 50, light source 10, collimating element 20, diffraction optical element (diffractive optical elements, DOE) 30, laser are distributed detection group Part 90 and processor 40.Light source 10, collimating element 20, diffraction optical element 30 and laser distribution probe assembly 90 are arranged at mirror In cartridge module 50.Light source 10 is for emitting laser.Collimating element 20 is used for collimation laser.Diffraction optical element 30 is accurate for diffraction Laser after the straight collimation of element 20 is to form laser pattern.Laser distribution probe assembly 90 is used to emit light source 10 and at least pass through The optical signal crossed after collimating element 20 is converted into the first electric signal output.Processor 40 is connect with laser distribution probe assembly 90. Whether processor 40 is for obtaining the first electric signal, judging the first electric signal in the first preset range and in the first electricity Signal determines that laser projection module 100 damages when being not in the first preset range.
The laser projection module 100 of embodiment of the present invention is distributed detection group by the laser being arranged in barrel assembly 50 Part 90 converts the optical signal that light source 10 emits to electric signal, to judge whether laser projection module 100 damages.In this way, can When detecting that laser projection module 100 damages, selection is not turned on laser projection module 100, to avoid laser projection module 100 After damage, the energy for the laser that laser projection module 100 projects is excessively high, and the body or eyes to user generate asking for harm Topic promotes the safety that user uses.
Specifically, when whether detection laser projection module 100 damages, before the work of laser projection module 100, light source 10 The optical signal whether damaged for detecting laser projection module 100 emitted, wherein the intensity of the optical signal can be less than light source 10 The intensity of the optical signal emitted when normal work, to reduce energy consumption and improve the safety in detection process.Laser distribution detection Component 90 converts the optical signal received to the first electric signal (current or voltage etc.) output again.Certainly, laser distribution detection Component 90 can also convert the optical signal received to the first electric signal (electric current or electricity when laser projection module 100 works Pressure etc.) output, in this way, the optical signal whether damaged for detecting laser projection module 100 in addition emitted without light source 10.At this In the case of, when detecting that laser projection module 100 damages, may be selected to close laser projection module 100 in time or reduce to swash The luminous power of light projection module 100, to avoid to user body or eyes generate harm.
When laser projection module 100 is in serviceable condition, since collimating element 20 and diffraction optical element 30 are intact, light The laser that source 10 emits is larger by energy attenuation after collimating element 20 and/or diffraction optical element 30, and laser is distributed detection group The optical signal that part 90 receives is weaker, so that the first electric signal that processor 40 is got is also weaker.And work as laser projection module 100 damages, such as when collimating element 20 and/or the rupture of diffraction optical element 30, the laser that light source 10 emits will be from rupture location Place directly emits or reflexes to laser distribution probe assembly 90, and energy attenuation is smaller, and laser distribution probe assembly 90 receives Optical signal is stronger, so that the first electric signal that processor 40 is got is also stronger.Therefore, it can in real time be obtained according to processor 40 To the first electric signal and laser projection module 100 be between the first electric signal that processor 40 is got under serviceable condition Size of the difference judges whether laser projection module 100 damages.It is further possible to be according to laser projection module 100 The first electric signal that processor 40 is got under serviceable condition determines first preset range [Emin, Emax], works as processor When 40 the first electric signals got in real time are not in first preset range, determine that laser projection module 100 damages.
In some embodiments, it is formed with transparency conducting film 21/31 on collimating element 20 and/or diffraction optical element 30 (Fig. 4 and Figure 17 shown in), wherein can only be formed with transparent conductive film 21 on collimating element 20 (shown in Figure 17)；Or only It is formed on diffraction optical element 30 on transparent conductive film 31 (as shown in Figure 4) or collimating element 20 and is formed with electrically conducting transparent Film 21, while transparent conductive film 31 is formed on diffraction optical element 30.Transparency conducting film 21 is equipped with 22 (Figure 17 of conductive electrode It is shown), transparency conducting film 31 is equipped with conductive electrode 32 (shown in Fig. 4), and conductive electrode 22 and conductive electrode 32 can be defeated after being powered Go out the second electric signal.Processor 40 is connect with conductive electrode 22 and conductive electrode 32, and processor 40 is additionally operable to obtain the second telecommunications Number, judge whether the second electric signal is not in the second preset range and in the second electric signal in the second preset range When determine that collimating element 20 and/or diffraction optical element 30 rupture.Wherein, the second preset range can phase with the first preset range It is same or different.
Specifically, it is formed with transparency conducting film 21 on collimating element 20, when collimating element 20 is in serviceable condition, light transmission The resistance of conductive film 21 is smaller, and the conductive electrode 22 given in this case on transparency conducting film 21 is powered, that is, applies a certain size Voltage, then the electric current that processor 40 is got at this time conductive electrode 22 exports is larger.And when collimating element 20 ruptures, shape At the transparency conducting film 21 on collimating element 20 also can fragmentation, the resistance of the transparency conducting film 21 at fragmentation position at this time Approach infinity gives the conductive electrode 22 on transparency conducting film 21 to be powered in this case, the conduction electricity that processor 40 is got The electric current that pole 22 exports is smaller.Therefore, first way：It can not be broken with collimating element 20 according to the second electric signal (i.e. electric current) Difference size is split between the second electric signal (i.e. electric current) detected under state to judge whether transparency conducting film 21 ruptures, into one Step ground, can judge whether collimating element 20 ruptures according to the state of transparency conducting film 21, that is, if transparency conducting film 21 ruptures, Then show that collimating element 20 also ruptures；If transparency conducting film 21 does not rupture, show that collimating element 20 does not also rupture.Second of side Formula：The second electric signal exported after being powered according to conductive electrode 22 on collimating element 20 directly judges whether collimating element 20 breaks It splits, specifically, when collimating element 20 does not rupture, the second electric signal that conductive electrode 22 exports is not in the second preset range when It determines that transparency conducting film 21 ruptures, and then judges that collimating element 20 also ruptures；If the second electric signal that conductive electrode 22 exports exists It determines that transparency conducting film 21 does not rupture when in the second preset range, and then judges that collimating element 20 does not also rupture.
Similarly, it is also formed with transparency conducting film 31 on diffraction optical element 30, when diffraction optical element 30 is in intact When state, the resistance of transparency conducting film 31 is smaller, and the conductive electrode 32 given in this case on transparency conducting film 31 is powered, that is, applies Add a certain size voltage, then the electric current that the conductive electrode 32 that processor 40 is got at this time exports is larger.And work as diffraction optics When element 30 ruptures, be formed in transparency conducting film 31 on diffraction optical element 30 also can fragmentation, it is saturating at fragmentation position at this time The resistance approach infinity of light guide electrolemma 31 gives the conductive electrode 32 on transparency conducting film 31 to be powered, place in this case The electric current that the conductive electrode 32 that reason device 40 is got exports is smaller.Therefore, first way：It can be according to the second electric signal (i.e. Electric current) and 30 non-state of rupture of diffraction optical element under between the second electric signal (i.e. electric current) for detecting difference size judge Whether transparency conducting film 31 ruptures, and further, whether can sentence diffraction optical element 30 according to the state of transparency conducting film 31 Rupture, that is, if transparency conducting film 31 ruptures, show that diffraction optical element 30 also ruptures；If transparency conducting film 31 does not rupture, Show that diffraction optical element 30 does not also rupture.The second way：After being powered according to conductive electrode 32 on diffraction optical element 30 Second electric signal of output directly judges whether diffraction optical element 30 ruptures, specifically, when diffraction optical element 30 does not rupture, It determines that transparency conducting film 31 ruptures when the second electric signal that conductive electrode 32 exports is not in the second preset range, and then judges Diffraction optical element 30 also ruptures；Light transmission is determined that when if the second electric signal that conductive electrode 32 exports is in the second preset range Conductive film 31 does not rupture, and then judges that diffraction optical element 30 does not also rupture.
When being formed with transparency conducting film 21 on collimating element 20, while transparency conducting film is formed on diffraction optical element 30 When 31, processor 40 can distinguish transparency conducting film 21 and transparency conducting film 31, be collimating element 20 thus, it is possible to tell Rupture or be diffraction optical element 30 rupture or be that collimating element 20 is ruptured with diffraction optical element 30.
In addition, transparency conducting film 21 can be formed in the surface of collimating element 20, transparency conducting film by modes such as plating 31 can also be formed in the surface of diffraction optical element 30 by modes such as plating.Transparency conducting film 21, transparency conducting film 31 Material can be any one in tin indium oxide (Indium tin oxide, ITO), silver nanowire, metal silver wire.Indium oxide Tin, silver nanowire, metal silver wire all have good light transmittance and electric conductivity, it can be achieved that the second electric signal after being powered is defeated Go out, at the same will not the light extraction light path generation of collimation element 20 and diffraction optical element 30 block.
The laser projection module 100 of embodiment of the present invention on collimating element 20 by being arranged transparency conducting film 21 and leading Electrode 22, and/or setting transparency conducting film 31 and conductive electrode 32 on diffraction optical element 30, further according to conductive electrode 22, and/or conductive electrode 32 export the second electric signal judge whether collimating element 20 and/or diffraction optical element 30 rupture. In this way, can detect that whether laser projection module 100 is intact, and when detecting that laser projection module 100 ruptures, may be selected not It opens laser projection module 100 or closes the laser of 100 projection of laser projection module in time or reduce laser projection mould The energy of the luminous power of group 100, the laser projected after being ruptured to avoid laser projection module 100 is excessively high, to the eye of user Eyeball, which is led to the problem of, to be endangered, and the safety that user uses is promoted.
It should be pointed out that light source 10 is sent out above by the laser distribution probe assembly 90 being arranged in barrel assembly 50 The optical signal penetrated is converted into electric signal, to judge mode (the first detection mode) that whether laser projection module 100 damages, It is arranged with by setting transparency conducting film 21 and the conductive electrode 22 on collimating element 20, and/or on diffraction optical element 30 Transparency conducting film 31 and conductive electrode 32, to judge mode (second of detection side that whether laser projection module 100 damages Formula), it can be carried out at the same time, to improve accuracy of detection；Or the first detection mode is first carried out, to primarily determine laser projection mould Whether group 100 is damaged, and when laser projection module 100 damages, then carries out second of detection mode, to further determine that collimation member Whether part 20 and/or diffraction optical element 30 rupture.It should be pointed out that when being carried out at the same time the first detection mode and second When detection mode, if one of which detection mode detects that laser projection module 100 damages, you can selection is not turned on laser projection Module 100 or the luminous work(for closing laser or reduction laser projection module 100 that laser projection module 100 projects in time Rate, to ensure safety property.
Referring to Fig. 1, in some embodiments, barrel assembly 50 includes the lens barrel 51 for offering host cavity 54. Light source 10, collimating element 20 and diffraction optical element 30 are housed in host cavity 54.It includes conduction that laser, which is distributed probe assembly 90, Element 91 and the photodetector 92 being arranged on conducting element 91.The lens barrel side wall 512 in lens barrel 51 is arranged in conducting element 91 On.
Specifically, lens barrel 51 includes lens barrel roof 511 and the lens barrel side wall 512 from the extension of lens barrel roof 511.Conducting element Position just corresponding with collimating element 20 on 91 setting lens barrel side walls 512, or position corresponding with the top of collimating element 20, Or position corresponding with the lower section of collimating element 20, this is not restricted.In some embodiments, on lens barrel side wall 512 Lens barrel lateral through aperture 514 can be opened up, conducting element 91 is connected by the circuit across lens barrel lateral through aperture 514 with circuit board assemblies 60 It connects, and then by electric signal transmission to processor 40.
When collimating element 20 and/or diffraction optical element 30 rupture, the laser that light source 10 emits is sent out at rupture location Raw reflection or unreasonable diffraction, refraction etc. cause the laser being arranged on lens barrel side wall 512 distribution probe assembly 90 that can connect Receive optical signal, or compared to 100 serviceable condition of laser projection module for, laser distribution probe assembly 90 receives light letter Number it is stronger, in this way, processor 40 can according to laser be distributed probe assembly 90 convert the first electric signal judge laser projection Whether module 100 damages.
Referring to Fig. 2, in some embodiments, barrel assembly 50 includes protective cover 52 and offers the mirror of host cavity 54 Cylinder 51.Light source 10, collimating element 20 and diffraction optical element 30 are housed in host cavity 54.Lens barrel 51 includes lens barrel roof 511 And the lens barrel side wall 512 of the annular extended from lens barrel roof 511.Protective cover 52 is arranged on lens barrel roof 511, and protective cover 52 wraps Include the protective cover side wall 522 for the annular that the protective cover roof 521 for offering light extraction through-hole 523 and self-insurance shield roof 521 extend. Diffraction optical element 30 is carried on lens barrel roof 511 and is housed in protective cover 52, and laser distribution probe assembly 90 includes leading Electric device 91 and the photodetector 92 being arranged on conducting element 91, conducting element 91 are arranged on protective cover side wall 522, light Detecting element 92 is corresponding with diffraction optical element 30.
Specifically, position just corresponding with diffraction optical element 30 on protective cover side wall 522 is arranged in conducting element 91, or Position corresponding with the top of diffraction optical element 30, or position corresponding with the lower section of diffraction optical element 30, herein not It is restricted.In some embodiments, protective cover lateral through aperture 515 can be opened up on protective cover side wall 522, conducting element 91 passes through Circuit across protective cover lateral through aperture 515 is connect with circuit board assemblies 60, and then by electric signal transmission to processor 40.
Similarly, when collimating element 20 and/or diffraction optical element 30 rupture, the laser that light source 10 emits is in rupture location Reflection or unreasonable diffraction, refraction etc. occur for place, and the laser being arranged on protective cover side wall 522 is caused to be distributed probe assembly 90 Can receive optical signal, or compared to 100 serviceable condition of laser projection module for, laser is distributed probe assembly 90 and receives To the stronger of optical signal, judge to swash in this way, processor 40 can be distributed the first electric signal that probe assembly 90 converts according to laser Whether light projection module 100 damages.For example, when the first electric signal that processor 40 is got in real time is more than Emax, and handle The first electric signal that device 40 is got in real time be in range (Emax, E1] when, processor 40 determine collimating element 20 rupture；Work as place The first electric signal for getting in real time of reason device 40 be in range (E1, E2] when, the determination diffraction optical element 30 of processor 40 is also broken It splits, wherein E2 ＞ E1 ＞ Emax.
Further, the quantity of laser distribution probe assembly 90 can be one, photodetector 92 and collimating element 20 Corresponding (as shown in Figure 1)；Or the quantity of laser distribution probe assembly 90 is one, photodetector 92 and diffraction optical element 30 correspond to (as shown in Figure 2)；Or the quantity of laser distribution probe assembly 90 is two, two laser distribution probe assemblies 90 divide It is not corresponding respectively with collimating element 20 and diffraction optical element 30.Certainly, the quantity of laser distribution probe assembly 90 may be Multiple (being more than two), multiple laser distribution probe assemblies 90 are evenly distributed on lens barrel side wall 512 and/or protective cover side wall On 522.It should be pointed out that when the quantity that laser is distributed probe assembly 90 is two or more, swashed due to two or more The position that light distribution probe assembly 90 is arranged is different, when collimating element 20 and/or the rupture of diffraction optical element 30, two or more The intensity that a laser distribution probe assembly 90 can receive optical signal is different, therefore, is distributed and detects with two or more laser 90 corresponding first preset range of component can be different.
In some embodiments, the quantity of laser distribution probe assembly 90 can be one, and photodetector 92 is two A, two photodetectors 92 are arranged on conducting element 91, two photodetectors 92 respectively with collimating element 20 not It is corresponding or corresponding with the different location of diffraction optical element 30 respectively with position.Certainly, the quantity of photodetector 92 also may be used Think multiple (being more than two), multiple photodetectors 92 are evenly distributed on conducting element 91.It should be pointed out that working as light When the quantity of detecting element 92 is two or more, since the position that two or more photodetectors 92 are arranged is different, work as standard When straight element 20 and/or diffraction optical element 30 rupture, two or more photodetectors 92 can receive the strong of optical signal Degree is different, and therefore, first preset range corresponding with two or more photodetectors 92 can be different.
Referring to Fig. 3, in some embodiments, laser projection module 100 further includes circuit board assemblies 60.Laser is distributed Probe assembly 90 includes the photodetector 92 being arranged on circuit board assemblies 60.In this way, laser distribution probe assembly 90 is not necessarily to Additional setting conducting element 91, saves cost and space.
Similarly, when collimating element 20 and/or diffraction optical element 30 rupture, the laser that light source 10 emits is in rupture location Reflection or unreasonable diffraction, refraction etc. occur for place, and the laser being arranged on circuit board assemblies 60 is caused to be distributed probe assembly 90 Can receive optical signal, or compared to 100 serviceable condition of laser projection module for, laser is distributed probe assembly 90 and receives To the stronger of optical signal, judge to swash in this way, processor 40 can be distributed the first electric signal that probe assembly 90 converts according to laser Whether light projection module 100 damages.
It may be noted that be, in practical applications, may be used it is above-mentioned be arranged on lens barrel side wall 512 conducting element 91 and The mode of photodetector 92 is set on conducting element 91, conducting element 91 and in conductive element is set on protective cover side wall 522 The mode of photodetector 92 is set on part 91 and appointing in the mode of photodetector 92 is set on circuit board assemblies 60 It anticipates one or more, to detect whether laser projection module 100 damages.
In some embodiments, conducting element 91 is any one in board structure of circuit and sheets of conductive membrane structure Kind.Conducting element 91 is electrically connected with processor 40.Photodetector 92 can be photodiode (Photo-Diode, PD), Photodetector 92 can convert the optical signal that light source 10 emits to electric signal (current or voltage etc.), and electric signal is conducted To conducting element 91, conducting element 91 is again by the electric signal by line transmission to processor 40, so that processor 40 can Determine whether laser projection module 100 damages according to the electric signal.
Also referring to Fig. 4 and Fig. 5, in some embodiments, diffraction optical element 30 includes that opposite diffraction is incident Face 301 and diffraction exit facet 302.When being formed with transparency conducting film 31 on diffraction optical element 30, transparency conducting film 31 is single Layer, transparency conducting film 31 can be arranged on the diffraction plane of incidence 301 (as shown in Figure 4), can also be arranged in diffraction exit facet 302 Upper (as shown in Figure 5).Due to the diffraction plane of incidence 301 of diffraction optical element 30 be it is rough, by transparency conducting film 31 manufacture crafts that are arranged on diffraction exit facet 302 are relatively simple.In addition, the diffraction plane of incidence 301 of diffraction optical element 30 It is formed with diffraction grating, diffraction grating may cause the laser energy of outgoing too strong and endanger the eyes of user when rupturing, but There is a situation where that the laser energy of outgoing is relatively low, and due to the rupture of diffraction grating, the laser figure of 30 diffraction of diffraction optical element Case has changed, and laser projection module 100 can not normal use at this time.Therefore, transparency conducting film 31 can be also arranged On the diffraction plane of incidence 301, transparency conducting film 31 is made to be in direct contact diffraction grating, to promote 30 Safety check-up of diffraction optical element Accuracy.
Further, also referring to Fig. 6 to Fig. 9, transparency conducting film 31 is single layer, is arranged in diffraction optical element 30 On the diffraction plane of incidence 301 or diffraction exit facet 302.The conductive electrode 32 being arranged on transparency conducting film 31 is single, conductive electrode 32 include diffraction input terminal 321 and diffraction output end 322, and diffraction input terminal 321 and diffraction output end 322 are connect with processor 40 And form galvanic circle.Wherein, there are many arrangement modes of conductive electrode 32：For example, diffraction input terminal 321 and diffraction output end 322 line direction (being the extending direction of conductive electrode 32) is the length direction (as shown in Figure 6) of transparency conducting film 31, or The line direction of person's diffraction input terminal 321 and diffraction output end 322 is the width direction (as shown in Figure 7) of transparency conducting film 31, Or the line direction of diffraction input terminal 321 and diffraction output end 322 be transparency conducting film 31 diagonal (such as Fig. 8 and Shown in Fig. 9).No matter the arrangement mode of conductive electrode 32 is above-mentioned which kind of mode, and conductive electrode 32 can cross over entire light transmission Conductive film 31 can relatively accurately detect whether transparency conducting film 31 ruptures.
Alternatively, also referring to Figure 10 to Figure 13, transparency conducting film 31 is single layer, and spreading out in diffraction optical element 30 is arranged It penetrates on the plane of incidence 301 or diffraction exit facet 302.The conductive electrode 32 being arranged on transparency conducting film 31 is a plurality of, a plurality of conductive electricity Pole 32 is mutually disjointed, and every conductive electrode 32 includes diffraction input terminal 321 and diffraction output end 322.Each diffraction input terminal 321 It is connect with each diffraction output end 322 with processor 40 to form a galvanic circle, as a result, the diffraction of a plurality of conductive electrode 32 Input terminal 321 and diffraction output end 322 are connect respectively with processor 40 to form a plurality of galvanic circle.Wherein, a plurality of conductive electricity There are many arrangement modes of pole 32：For example, the line direction of each diffraction input terminal 321 and each diffraction output end 322 (is The extending direction of conductive electrode 32) be transparency conducting film 31 length direction, a plurality of conductive electrode 32 is along transparency conducting film 31 (as shown in Figure 10) is arranged in length direction parallel interval；Alternatively, each diffraction input terminal 321 and each diffraction output end 322 Line direction is the width direction of transparency conducting film 31, width direction parallel of a plurality of conductive electrode 32 along transparency conducting film 31 Every setting (as shown in figure 11)；Alternatively, the line direction of each diffraction input terminal 321 and each diffraction output end 322 is light transmission The diagonal of conductive film 31, a plurality of conductive electrode 32 are arranged (such as along the diagonal parallel interval of transparency conducting film 31 Shown in Figure 12 and Figure 13).No matter the arrangement mode of conductive electrode 32 is above-mentioned which kind of form, compared to the conductive electricity of setting single For pole 32, a plurality of conductive electrode 32 can occupy the more area of transparency conducting film 31, can correspondingly export more Second electric signal.When since single conductive electrode 32 is only arranged, it is possible to the position ruptured there are diffraction optical element 30 and list The position of conductive electrode 32 is separated by very remote, and is influenced less on single conductive electrode 32, what which exported Situation of second electric signal still in the second preset range, accuracy in detection be not high.And in present embodiment, a plurality of conductive electrode 32 occupy the more area of transparency conducting film 31, can correspondingly export more second electric signals, and processor 40 can basis The second more electric signal more precisely judges whether transparency conducting film 31 ruptures, and further judges diffraction optical element 30 Whether rupture, promotes the accuracy of 30 Safety check-up of diffraction optical element.
Alternatively, also referring to Figure 14 and Figure 15, transparency conducting film 31 is the bridging structure of single layer, is arranged in diffraction optics In 302 (not shown) of the diffraction plane of incidence 301 (as shown in figure 14) or diffraction exit facet of element 30.Specifically, conductive electrode 32 Including a plurality of first diffraction conductive electrode 323 disposed in parallel, a plurality of second diffraction conductive electrode 324 disposed in parallel and a plurality of Bridge formation diffraction conductive electrode 325.A plurality of first diffraction conductive electrode 323 and a plurality of second diffraction conductive electrode 324 are crisscross, Every first diffraction conductive electrode 323 is continuous uninterrupted, and every second diffraction conductive electrode 324 spreads out with corresponding a plurality of first The staggered place for penetrating conductive electrode 323 disconnects and is not turned on a plurality of first diffraction conductive electrode 323.The conductive electricity of every bridge formation diffraction The gap of corresponding second diffraction conductive electrode 324 is connected for pole 325.Bridge formation diffraction conductive electrode 325 is led with the first diffraction The intervening portion of electrode 323 is equipped with diffraction insulator 326.The both ends of every first diffraction conductive electrode 323 and processor 40 To form a galvanic circle, the both ends of every second diffraction conductive electrode 324 are connect with processor 40 to form one for connection Galvanic circle, as a result, the both ends of a plurality of first diffraction conductive electrode 323 respectively connect with processor 40 to form a plurality of conduction The both ends in circuit, a plurality of second diffraction conductive electrode 324 are respectively connect with processor 40 to form a plurality of galvanic circle.Its In, the material of diffraction insulator 326 can be the organic material with good translucency and insulating properties, and diffraction insulator 326 can It is made of the modes such as silk-screen or yellow light processing procedure.Transparency conducting film 31 herein can be a plurality of, a plurality of transparency conducting film 31 Single layer is constituted, and corresponding with conductive electrode 32 respectively, transparency conducting film 31 is a plurality of, and 31 parallel interval of a plurality of transparency conducting film is set It sets, conductive electrode 32 forms the first diffraction conductive electrode 323 and the conductive electricity of the second diffraction through being arranged in transparency conducting film 31 Pole 324.A plurality of first diffraction conductive electrode 323 with a plurality of second diffraction conductive electrode 324 is crisscross refers to a plurality of first Diffraction conductive electrode 323 is mutually perpendicular to interlock with a plurality of second diffraction conductive electrode 324, i.e. the first diffraction conductive electrode 323 with The angle of second diffraction conductive electrode 324 is 90 degree.Certainly, in other embodiments, a plurality of first diffraction conductive electrode 323 With a plurality of second diffraction conductive electrode 324 is crisscross can also be that a plurality of first diffraction conductive electrode 323 spreads out with a plurality of second Conductive electrode 324 is penetrated to be mutually inclined staggeredly.In use, processor 40 can be simultaneously to a plurality of first diffraction conductive electrode, 323 He A plurality of second diffraction conductive electrode 324 is powered to obtain multiple second electric signals, alternatively, processor 40 can be successively to a plurality of first Diffraction conductive electrode 323 and a plurality of second diffraction conductive electrode 324 are powered to obtain multiple second electric signals, then, processor 40 judge whether transparency conducting film 31 ruptures further according to the second electric signal.Incorporated by reference to Figure 14, when detecting that number is 1. For second electric signal of one diffraction conductive electrode 323 output not in the second preset range, number is the conductive electricity of the second diffraction 3. When the second electric signal that pole 324 exports is not in the second preset range, illustrate that transparency conducting film 31 in number is first spreading out 1. It is that 324 staggered place of the second diffraction conductive electrode 3. ruptures that conductive electrode 323, which is penetrated, with number, then diffraction optical element 30 and light transmission The corresponding position of 31 rupture location of conductive film also ruptures.In this way, can be more by the transparency conducting film 31 of the single layer of bridging structure To accurately detect the specific location whether diffraction optical element 30 ruptures and rupture.
Also referring to Figure 15 and Figure 16, in some embodiments, diffraction optical element 30 enters including opposite diffraction Penetrate face 301 and diffraction exit facet 302.When being formed with transparency conducting film 31 on diffraction optical element 30, transparency conducting film 31 includes The first diffraction conductive film 311 being arranged on the diffraction plane of incidence 301 and the second diffraction being arranged on diffraction exit facet 302 are conductive Film 312.A plurality of the first parallel diffraction conductive electrode 323, the second diffraction conductive film are provided on first diffraction conductive film 311 A plurality of the second parallel diffraction conductive electrode 324 is provided on 312.First diffraction conductive electrode 323 is on diffraction exit facet 302 Projection and the second diffraction conductive electrode 324 it is crisscross, the both ends of every first diffraction conductive electrode 323 connect with processor 40 It connects to form a galvanic circle, the both ends of every second diffraction conductive electrode 324 are connect with processor 40 is led with forming one Electrical circuit, the both ends of a plurality of first diffraction conductive electrode 323 are respectively connect with processor 40 as a result, is returned with forming a plurality of conduction The both ends on road, a plurality of second diffraction conductive electrode 324 are respectively connect with processor 40 to form a plurality of galvanic circle.Wherein, Projection of the first diffraction conductive electrode 323 on diffraction exit facet 302 with the second diffraction conductive electrode 324 is crisscross refers to A plurality of first diffraction conductive electrode 323 is spatially mutually perpendicular to interlock with a plurality of second diffraction conductive electrode 324, i.e., first spreads out It is 90 degree to penetrate projection and the angle of second diffraction conductive electrode 324 of the conductive electrode 323 on diffraction exit facet 302.Certainly, exist In other embodiment, projection of a plurality of first diffraction conductive electrode 323 on diffraction exit facet 302 is led with a plurality of second diffraction Electrode 324 is crisscross to can also be a plurality of first diffraction conductive electrode 323 with a plurality of second diffraction conductive electrode 324 in sky Between on be mutually inclined staggeredly.In use, processor 40 can simultaneously spread out to a plurality of first diffraction conductive electrode 323 and a plurality of second It penetrates conductive electrode 324 to be powered to obtain multiple second electric signals, alternatively, processor 40 can be successively to the conductive electricity of a plurality of first diffraction Pole 323 and a plurality of second diffraction conductive electrode 324 are powered to obtain multiple second electric signals, and then, processor 40 is further according to the Two electric signals judge whether transparency conducting film 31 ruptures, and further judge whether diffraction optical element 30 ruptures.Ibid, according to A plurality of first diffraction conductive electrode 323 and the second electric signal of a plurality of second diffraction conductive electrode 324 output can be examined accurately Survey the specific location whether diffraction optical element 30 ruptures and rupture.
Also referring to Figure 17 and Figure 18, in some embodiments, collimating element 20 includes opposite collimated incident face 201 and collimation exit facet 202.When being formed with transparency conducting film 21 on collimating element 20, transparency conducting film 21 is single layer, light transmission Conductive film 21 can be arranged on collimated incident face 201 (as shown in figure 17), can also be arranged on collimation exit facet 202 (such as Shown in Figure 18).
Further, also referring to Figure 19 to Figure 22, transparency conducting film 21 is single layer, and the standard in collimating element 20 is arranged On the straight plane of incidence 201 or collimation exit facet 202.The conductive electrode 22 being arranged on transparency conducting film 21 is single, conductive electrode 22 Including collimation input terminal 221 and collimation output end 222, collimates input terminal 221 and collimation output end 222 is connect simultaneously with processor 40 Form galvanic circle.Wherein, there are many arrangement modes of conductive electrode 22：For example, collimation input terminal 221 and collimation output end 222 line direction (being the extending direction of conductive electrode 22) is the length direction (as shown in figure 19) of transparency conducting film 21, Or collimation input terminal 221 and collimate output end 222 line direction for transparency conducting film 21 width direction (such as Figure 20 institutes Show), or the diagonal that the line direction of collimation input terminal 221 and collimation output end 222 is transparency conducting film 21 is (as schemed Shown in 21 and Figure 22).No matter the arrangement mode of conductive electrode 22 is above-mentioned which kind of mode, and conductive electrode 22 can be crossed over entire Transparency conducting film 21 can relatively accurately detect whether transparency conducting film 21 ruptures.
Alternatively, also referring to Figure 23 to Figure 26, transparency conducting film 21 is single layer, and the collimation being arranged in collimating element 20 enters It penetrates on face 201 or collimation exit facet 202.The conductive electrode 22 being arranged on transparency conducting film 21 is a plurality of, a plurality of conductive electrode 22 It mutually disjoints, every conductive electrode 22 includes collimation input terminal 221 and collimation output end 222.Each collimation input terminal 221 with it is every A collimation output end 222 is connect with processor 40 to form a galvanic circle, as a result, the collimation input of a plurality of conductive electrode 22 End 221 and collimation output end 222 are connect respectively with processor 40 to form a plurality of galvanic circle.Wherein, a plurality of conductive electrode 22 Arrangement mode there are many：For example, each the line direction of collimation input terminal 221 and each collimation output end 222 (is conduction The extending direction of electrode 22) be transparency conducting film 21 length direction, length of a plurality of conductive electrode 22 along transparency conducting film 21 Direction parallel interval setting (as shown in figure 23)；Alternatively, each collimation input terminal 221 and each line of collimation output end 222 Direction is the width direction of transparency conducting film 21, and a plurality of conductive electrode 22 is set along the width direction parallel interval of transparency conducting film 21 It sets (as shown in figure 24)；Alternatively, each the line direction of collimation input terminal 221 and each collimation output end 222 is light transmitting electro-conductive (such as Figure 25 is arranged along the diagonal parallel interval of transparency conducting film 21 in the diagonal of film 21, a plurality of conductive electrode 22 Shown in Figure 26).No matter the arrangement mode of conductive electrode 22 is above-mentioned that mode, compared to setting single conductive electrode 22 For, a plurality of conductive electrode 22 can occupy the more area of transparency conducting film 21, can correspondingly export more second electricity Signal.When since single conductive electrode 22 is only arranged, it is possible to the position ruptured there are collimating element 20 and single conductive electrode 22 position is separated by very far, and is influenced less on single conductive electrode 22, the second electric signal of the single conductive electrode 22 output The situation in the second preset range is thrown away, accuracy in detection is not high.And in present embodiment, a plurality of conductive electrode 22 occupies light transmission The more area of conductive film 21, can correspondingly export more second electric signals, and processor 40 can be according to more second Electric signal more precisely judges whether transparency conducting film 21 ruptures, and further judges whether collimating element 20 ruptures, and is promoted The accuracy of 20 Safety check-up of collimating element.
Alternatively, also referring to Figure 27 and Figure 28, transparency conducting film 21 is the bridging structure of single layer, is arranged in collimating element On 20 collimated incident face 201 (as shown in figure 27) or collimation 202 (not shown) of exit facet.Specifically, conductive electrode 22 includes A plurality of first collimation conductive electrode 223, a plurality of second collimation conductive electrode 224 disposed in parallel and a plurality of bridge formation disposed in parallel Collimate conductive electrode 225.A plurality of first collimation conductive electrode 223 and a plurality of second collimation conductive electrode 224 are crisscross, every First collimation conductive electrode 223 is continuous uninterrupted, and every second collimation conductive electrode 224 is led with corresponding a plurality of first collimation The staggered place of electrode 223 disconnects and is not turned on a plurality of first collimation conductive electrode 223.Every collimation conductive electrode of building bridge 225 gaps that conductive electrode 224 is collimated corresponding second are connected.The collimation collimation of conductive electrode 225 and first of building bridge is conductive The intervening portion of electrode 223 is equipped with collimation insulator 226.The both ends of every first collimation conductive electrode 223 connect with processor 40 It connects to form a galvanic circle, the both ends processor 40 of every second collimation conductive electrode 224 is connected to form a conduction Circuit, the both ends of a plurality of first collimation conductive electrode 223 are respectively connect with processor 40 as a result, is returned with forming a plurality of conduction The both ends on road, a plurality of second collimation conductive electrode 224 respectively 40 are connect to form a plurality of galvanic circle with processor 40.Its In, the material for collimating insulator 226 can be the organic material with good translucency and insulating properties, and collimation insulator 226 can It is made of the modes such as silk-screen or yellow light processing procedure.Transparency conducting film 21 herein can be a plurality of, a plurality of transparency conducting film 21 Single layer is constituted, and corresponding with conductive electrode 22 respectively, transparency conducting film 21 is a plurality of, and 21 parallel interval of a plurality of transparency conducting film is set It sets, conductive electrode 22 forms the first collimation conductive electrode 223 and second and collimate conductive electrode through being arranged in transparent conductive film 224.A plurality of first collimation conductive electrode 223 collimates that conductive electrode 224 is crisscross to refer to that a plurality of first is accurate with a plurality of second Straight conductive electrode 223 collimates conductive electrode 224 with a plurality of second and is mutually perpendicular to interlock, i.e., first collimates conductive electrode 223 and the The angle of two collimation conductive electrodes 224 is 90 degree.Certainly, in other embodiments, it is a plurality of first collimation conductive electrode 223 with A plurality of second collimation conductive electrode 224 is crisscross to can also be that a plurality of first collimation conductive electrode 223 is collimated with a plurality of second Conductive electrode 224 is mutually inclined staggeredly.In use, processor 40 can be simultaneously to a plurality of first collimation conductive electrode 223 and more Item second collimates conductive electrode 224 and is powered to obtain multiple second electric signals, alternatively, processor 40 can be accurate to a plurality of first successively Straight conductive electrode 223 and a plurality of second collimation conductive electrode 224 are powered to obtain multiple second electric signals, then, processor 40 Judge whether transparency conducting film 21 ruptures further according to the second electric signal.Incorporated by reference to Figure 27, when detecting that number is first 1. The second electric signal of the output of conductive electrode 223 is collimated not in the second preset range, number is the second collimation conductive electrode 3. When second electric signal of 224 outputs is not in the second preset range, illustrate transparency conducting film 21 in 1. the first collimation that number is Conductive electrode 223 and number are the second 224 staggered place of collimation conductive electrode rupture 3., then collimating element 20 and transparency conducting film The corresponding position of 21 rupture locations also ruptures.In this way, can be more precisely by the transparent conductive film of the single layer of bridging structure The specific location whether detection collimating element 20 ruptures and rupture.
Also referring to Figure 28 and Figure 29, in some embodiments, collimating element 20 includes opposite collimated incident face 201 and collimation exit facet 202.When being formed with transparency conducting film 21 on collimating element 20, transparency conducting film 21 includes being arranged in standard First on the straight plane of incidence 201 the second collimation conductive film 212 for collimating conductive film 211 and being arranged on collimation exit facet 202.The A plurality of first collimation conductive electrode 223 disposed in parallel is provided on one collimation conductive film 211, second collimates on conductive film 212 It is provided with a plurality of second collimation conductive electrode 224 disposed in parallel.First collimation conductive electrode 223 is on collimation exit facet 202 Projection and the second collimation conductive electrode 224 it is crisscross, both ends and the processor 40 of every first collimation conductive electrode 223 connect It connects to form a galvanic circle, the both ends of every second collimation conductive electrode 224 are connect with processor 40 is led with forming one Electrical circuit, the both ends of a plurality of first collimation conductive electrode 223 are respectively connect with processor 40 as a result, is returned with forming a plurality of conduction The both ends on road, a plurality of second collimation conductive electrode 224 are respectively connect with processor 40 to form a plurality of circuit.Wherein, first Collimate projection of the conductive electrode 223 on diffraction exit facet 302 with second collimate conductive electrode 224 it is crisscross refer to it is a plurality of First collimation conductive electrode 223 is spatially mutually perpendicular to interlock with a plurality of second collimation conductive electrode 224, i.e., the first collimation is led Projection of the electrode 223 on diffraction exit facet 302 and the angle of the second collimation conductive electrode 224 are 90 degree.Certainly, at other In embodiment, projection of a plurality of first collimation conductive electrode 223 on diffraction exit facet 302 and a plurality of conductive electricity of second collimation Pole 224 is crisscross to can also be that a plurality of first collimation conductive electrode 223 collimates conductive electrode 224 spatially with a plurality of second It is mutually inclined staggeredly.In use, processor 40 can simultaneously lead a plurality of first collimation conductive electrode 223 and a plurality of second collimation Electrode 224 is powered to obtain multiple second electric signals, alternatively, processor 40 can be successively to a plurality of first collimation conductive electrode 223 and a plurality of second collimate the energization of conductive electrode 224 to obtain multiple second electric signals, and then, processor 40 is further according to second Electric signal judges whether transparency conducting film 21 ruptures, and further judges whether collimating element 20 ruptures.Ibid, according to a plurality of The second electric signal that first collimation conductive electrode 223 and a plurality of second collimation conductive electrode 224 export can accurately detect standard The specific location whether straight element 20 ruptures and rupture.
Referring to Fig. 1, in some embodiments, laser projection module 100 includes circuit board assemblies 60, barrel assembly 50, light source 10, collimating element 20, diffraction optical element 30 and protective cover 52.
Circuit board assemblies 60 include substrate 61 and circuit board 62.Circuit board 62 is arranged on substrate 61, circuit board 62 and light Source 10 connects, and circuit board 62 can be hardboard, soft board or Rigid Flex.In the embodiment shown in fig. 1, on circuit board 62 Through-hole 621 is offered, light source 10 is fixed on substrate 61 and is electrically connected with circuit board 62.Heat emission hole can be offered on substrate 61 611, light source 10 or circuit board 62 work generate heat can be shed by heat emission hole 611, can also fill and lead in heat emission hole 611 Hot glue, to further increase the heat dissipation performance of circuit board assemblies 60.
Barrel assembly 50 is fixedly connected with circuit board assemblies 60, and barrel assembly 50 is formed with host cavity 54, barrel assembly 50 The lens barrel side wall 512 of the annular extended including lens barrel roof 511 and from lens barrel roof 511, lens barrel side wall 512 are arranged in circuit board On component 60, lens barrel roof 511 offers the light hole 513 being connected to host cavity 54.Lens barrel side wall 512 can be with circuit board 62 It is connected by viscose glue.
Protective cover 52 is arranged on lens barrel roof 511.Protective cover 52 includes the protective cover roof for offering light extraction through-hole 523 521 and self-insurance shield roof 521 extend ring protection cover side wall 522.
Light source 10 is arranged at collimating element 20 in host cavity 54, and diffraction optical element 30 is mounted on barrel assembly 50 On, collimating element 20 is successively set on diffraction optical element 30 in the luminous light path of light source 10.Collimating element 20 is to light source 10 The laser sent out is collimated, and laser is then passed through diffraction optical element 30 to form laser pattern after passing through collimating element 20.
Light source 10 can be vertical cavity surface emitting laser (Vertical Cavity Surface Emitting Laser, VCSEL) or edge-emitting laser (edge-emitting laser, EEL), in the embodiment shown in fig. 1, Light source 10 is edge-emitting laser, and specifically, light source 10 can be distributed feedback laser (Distributed Feedback Laser, DFB).Light source 10 into host cavity 54 for emitting laser.Incorporated by reference to Figure 30, light source 10 is whole to be in the form of a column, light source 10 An end face far from circuit board assemblies 60 forms light-emitting surface 11, and laser is sent out from light-emitting surface 11, and light-emitting surface 11 is first towards collimation Part 20.Light source 10 is fixed on circuit board assemblies 60, and specifically, light source 10 can be bonded in circuit board assemblies 60 by sealing 63 On, such as the opposite with light-emitting surface 11 of light source 10 be bonded on one side on circuit board assemblies 60.Incorporated by reference to Fig. 1 and Figure 31, light source 10 side 12 can also be bonded on circuit board assemblies 60, and sealing 63 wraps the side 12 of surrounding, can also only adherent side Some face in face 12 and circuit board assemblies 60 or certain several face of bonding and circuit board assemblies 60.Sealing at this time 63 can be heat conduction Glue conducts the heat that the work of light source 10 generates into circuit board assemblies 60.
Referring to Fig. 1, diffraction optical element 30 is carried on lens barrel roof 511 and is housed in protective cover 52.Diffraction light The opposite both sides for learning element 30 are contradicted with protective cover 52 and lens barrel roof 511 respectively, and protective cover roof 521 includes close to light hole 513 resistance surface 53, diffraction optical element 30 are contradicted with resistance surface 53.
Specifically, diffraction optical element 30 includes opposite the diffraction plane of incidence 301 and diffraction exit facet 302.Diffraction optics Element 30 is carried on lens barrel roof 511, the surface of diffraction exit facet 302 and the close light hole 513 of protective cover roof 521 (resistance surface 53) contradicts, and the diffraction plane of incidence 301 is contradicted with lens barrel roof 511.Light hole 513 is aligned with host cavity 54, and light extraction is logical Hole 523 is aligned with light hole 513.Lens barrel roof 511, the protective cover side wall 522 of annular and protective cover roof 521 and diffraction optics Element 30 contradicts, to prevent diffraction optical element 30 from falling off out of protective cover 52 along light direction.In some embodiments, Protective cover 52 is pasted onto by glue 70 on lens barrel roof 511.
The light source 10 of above-mentioned laser projection module 100 use edge-emitting laser, one side edge-emitting laser compared with The temperature drift of VCSEL array is smaller, on the other hand, since edge-emitting laser is single-point light emitting structure, is not necessarily to array of designs structure, It makes simply, 10 cost of light source of laser projection module 100 is relatively low.
The laser of distributed feedback laser obtains the gain of power by the feedback of optical grating construction when propagating.It carries The power of high distributed feedback laser is needed by increasing Injection Current and/or increasing the length of distributed feedback laser, Since increase Injection Current can make the power consumption of distributed feedback laser increase and serious problem of generating heat occurs, In order to ensure that distributed feedback laser can work normally, the length for increasing distributed feedback laser is needed, causes to be distributed Feedback laser is generally in elongate strip structure.When the light-emitting surface 11 of edge-emitting laser is towards collimating element 20, edge emitting Laser is placed in vertical, since edge-emitting laser is in elongate strip structure, edge-emitting laser be susceptible to fall, shift or Shaking etc. is unexpected, therefore can be fixed edge-emitting laser by the way that sealing 63 is arranged, and prevents edge-emitting laser from falling Fall, displacement or shaking etc. it is unexpected.
It please refers to Fig.1 and Figure 32, in some embodiments, light source 10 can also use fixed form as shown in figure 32 It is fixed on circuit board assemblies 60.Specifically, laser projection module 100 includes multiple supporting blocks 64, and supporting block 64 can fix On circuit board assemblies 60, light source 10 can be directly installed on more by 64 common ambient light source 10 of multiple supporting blocks when mounted Between a supporting block 64.In one example, light source 10 is clamped in multiple supporting blocks 64 jointly, to further prevent light source 10 to occur It shakes.
In some embodiments, protective cover 52 can be omitted, and diffraction optical element 30 can be arranged in host cavity at this time In 54, the diffraction exit facet 302 of diffraction optical element 30 can offset with roof 511, after laser passes through diffraction optical element 30 It is pierced by light hole 513 again.In this way, diffraction optical element 30 is not easily to fall off.In some embodiments, substrate 61 can save, Light source 10 is directly anchored on circuit board 62 to reduce the integral thickness of laser projection module 100.
Figure 33 is please referred to, the depth camera 1000 of embodiment of the present invention includes the laser of any one of the above embodiment Project module 100,40 (not shown) of image acquisition device 200 and processor.Image acquisition device 200 is for acquiring by laser projection mould The laser pattern that group 100 is projected into object space.Processor 40 respectively with laser projection module 100 and image acquisition device 200 Connection, processor 40 is for handling laser pattern to obtain depth image.
Specifically, laser projection module 100 projects laser pattern into object space by projecting window 801, and image is adopted Storage 200 is acquired by acquisition window 802 by the modulated laser pattern of target object.Image acquisition device 200 can be infrared phase Machine, processor 40 calculate each picture corresponding with reference pattern of each pixel in the laser pattern using image matching algorithm The deviation value of vegetarian refreshments further obtains the depth image of the laser pattern further according to deviation value.Wherein, image matching algorithm can be Digital picture correlation (Digital Image Correlation, DIC) algorithm.It is of course also possible to use other images match are calculated Method replaces DIC algorithms.
Figure 34 is please referred to, the electronic device 3000 of embodiment of the present invention includes that shell 2000 and any one of the above are implemented The depth camera 1000 of mode, depth camera 1000 are mounted on shell 2000 and are exposed from shell 2000 to obtain laser figure Case.Electronic device 3000 includes mobile phone, tablet computer, laptop, Intelligent bracelet, smartwatch, intelligent helmet, Brilliant Eyes Mirror etc..
It please refers to Fig.1 and Figure 35, the detection method of the laser projection module damage of embodiment of the present invention is thrown for laser Penetrate module 100.Laser projection module 100 includes barrel assembly 50, light source 10, collimating element 20, diffraction optical element 30 and swashs Light distribution probe assembly 90.Light source 10, collimating element 20, diffraction optical element 30 and laser distribution probe assembly 90 are arranged at In barrel assembly 50.Light source 10 is for emitting laser.Collimating element 20 is used for collimation laser.Diffraction optical element 30 is used for diffraction Laser after the collimation of collimating element 20 is to form laser pattern transparency conducting film transparency conducting film.Laser is distributed probe assembly 90 and uses In light source 10 is emitted and is converted into the first electric signal output at least through the optical signal after collimating element 20.Detection method packet It includes：S10：Obtain the first electric signal that laser distribution probe assembly 90 exports；S20：Judge whether the first electric signal is in first In preset range；And S30：Determine that laser projection module 100 is damaged when the first electric signal is not in the first preset range.
In some embodiments, processor 40 can be used for executing the method in S10, S20 and S30.In other words, it handles Device 40 can be used for obtaining the first electric signal that laser distribution probe assembly 90 exports；Judge whether the first electric signal is pre- in first If in range；Determine that laser projection module 100 is damaged when the first electric signal is not in the first preset range.
Also referring to Fig. 1, Fig. 5, Figure 17 and Figure 36, in some embodiments, collimating element 20 and/or diffraction optics Transparency conducting film 21/31 is formed on element 30.Transparency conducting film 21/31 is equipped with conductive electrode 22/32, conductive electrode 22/ For exporting the second electric signal after 32 energizations.Detection method further includes：S40：Obtain the second telecommunications that conductive electrode 22/32 exports Number；S50：Judge the second electric signal whether in the second preset range；And S60：It is default it to be not at second in the second electric signal Determine that collimating element 20 and/or diffraction optical element 30 rupture when in range.
In some embodiments, processor 40 can be used for executing the method in S40, S50 and S60.In other words, it handles Device 40 can be used for obtaining the second electric signal of conductive electrode output；Judge the second electric signal whether in the second preset range； Determine that collimating element 20 and/or diffraction optical element 30 are ruptured when the second electric signal is not in the second preset range.
It should be pointed out that the above-mentioned explanation book to laser projection module 100 is equally applicable to embodiment party of the present invention The detection method of the laser projection module damage of formula, is no longer described in detail herein.
One of ordinary skill in the art will appreciate that realizing all or part of flow in above-described embodiment method, being can be with Relevant hardware is instructed to complete by computer program, the program can be stored in that a non-volatile computer is readable to be deposited In storage media, the program is when being executed, it may include such as the flow of the embodiment of above-mentioned each method.Wherein, the storage medium Can be magnetic disc, CD, read-only memory (Read-Only Memory, ROM) etc..
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously Cannot the limitation to the application the scope of the claims therefore be interpreted as.It should be pointed out that for those of ordinary skill in the art For, under the premise of not departing from the application design, various modifications and improvements can be made, these belong to the guarantor of the application Protect range.Therefore, the protection domain of the application patent should be determined by the appended claims.

Claims (18)

1. a kind of laser projection module, which is characterized in that the laser projection module includes：
Barrel assembly；
Light source in the barrel assembly is set, and the light source is for emitting laser；
Collimating element in the barrel assembly is set, and the collimating element is for collimating the laser；
Diffraction optical element in the barrel assembly is set, and the diffraction optical element is accurate for collimating element described in diffraction Laser after straight is to form laser pattern；
The laser distribution probe assembly being arranged in the barrel assembly, the laser distribution probe assembly are used for the light source Emit and is converted into the first electric signal output at least through the optical signal after the collimating element；With
The processor being connect with laser distribution probe assembly, the processor is for obtaining first electric signal, judging Whether first electric signal is in the first preset range and is not at the described first default model in first electric signal The laser projection module damage is determined when enclosing interior.
2. laser projection module according to claim 1, which is characterized in that
Transparency conducting film is formed on the collimating element and/or the diffraction optical element, the transparency conducting film is equipped with Conductive electrode, the conductive electrode are used to export the second electric signal after being powered；
The processor is connect with the conductive electrode, and the processor is additionally operable to obtain described in second electric signal, judgement Whether the second electric signal is not in the second preset range and in second electric signal in second preset range When determine the collimating element and/or the diffraction optical element rupture.
3. laser projection module according to claim 2, which is characterized in that the barrel assembly includes offering host cavity Lens barrel, the light source, the collimating element and the diffraction optical element be housed in the host cavity, the laser point Cloth probe assembly includes conducting element and the photodetector that is arranged on the conducting element, and the conducting element is arranged in institute It states on the lens barrel side wall of lens barrel.
4. laser projection module according to claim 2, which is characterized in that the barrel assembly includes protective cover and opens up There are the lens barrel of host cavity, the light source, the collimating element and the diffraction optical element to be housed in the host cavity, institute It includes that lens barrel roof and the lens barrel side wall of the annular extended from the lens barrel roof, the protective cover are arranged in the mirror to state lens barrel On cylinder roof, the protective cover includes the annular for offering the protective cover roof of light extraction through-hole and extending from the protective cover roof Protective cover side wall, the diffraction optical element is carried on the lens barrel roof and is housed in the protective cover, described to swash Light distribution probe assembly includes conducting element and the photodetector that is arranged on the conducting element, the conducting element setting On the protective cover side wall, the photodetector is corresponding with the diffraction optical element.
5. laser projection module according to claim 2, which is characterized in that the quantity of laser distribution probe assembly is One, the laser distribution probe assembly is corresponding with the collimating element；Or the laser is distributed probe assembly and the diffraction Optical element corresponds to.
6. laser projection module according to claim 2, which is characterized in that the laser distribution probe assembly includes two A, two laser distribution probe assemblies are corresponding respectively with the collimating element and the diffraction optical element respectively.
7. laser projection module according to claim 2, which is characterized in that the laser projection module further includes circuit board Component, the laser distribution probe assembly includes the photodetector being arranged on the circuit board assemblies.
8. laser projection module according to claim 3 or 4, which is characterized in that the conducting element is board structure of circuit And any one in sheets of conductive membrane structure.
9. laser projection module according to claim 2, which is characterized in that the diffraction optical element includes opposite spreads out The plane of incidence and diffraction exit facet are penetrated, when being formed with transparency conducting film on the diffraction optical element, the transparency conducting film is set It sets on the diffraction plane of incidence or the diffraction exit facet.
10. laser projection module according to claim 2, which is characterized in that the collimating element includes opposite collimation The plane of incidence and collimation exit facet, when being formed with transparency conducting film on the collimating element, the transparency conducting film is arranged in institute It states on collimated incident face or the collimation exit facet.
11. laser projection module according to claim 1, which is characterized in that the light source includes that vertical-cavity surface-emitting swashs Light device.
12. laser projection module according to claim 1, which is characterized in that the light source includes edge-emitting laser.
13. laser projection module according to claim 12, which is characterized in that the light source is distributed feedback laser Device.
14. laser projection module according to claim 12 or 13, which is characterized in that the light source includes light-emitting surface, institute Light-emitting surface is stated towards the collimating element.
15. a kind of detection method of laser projection module damage, which is characterized in that the laser projection module includes barrel assembly It is distributed probe assembly, the light source with light source, collimating element, diffraction optical element, the laser being arranged in the barrel assembly For emitting laser, the collimating element is for collimating the laser, and the diffraction optical element is for collimating member described in diffraction To form laser pattern transparency conducting film transparency conducting film, the laser distribution probe assembly is used for institute laser after part collimation Light source is stated to emit and be converted into the first electric signal output at least through the optical signal after the collimating element；The detection method packet It includes：
Obtain the first electric signal of the laser distribution probe assembly output；
Judge first electric signal whether in the first preset range；With
The laser projection module damage is determined when first electric signal is not in first preset range.
16. detection method according to claim 15, which is characterized in that the collimating element and/or the diffraction optics Transparency conducting film is formed on element, the transparency conducting film is equipped with conductive electrode, and the conductive electrode is used for defeated after being powered Go out the second electric signal；The detection method further includes：
Obtain the second electric signal of the conductive electrode output；
Judge second electric signal whether in the second preset range；With
The collimating element and/or the diffraction light are determined when second electric signal is not in second preset range Learn element fracture.
17. a kind of depth camera, which is characterized in that the depth camera includes：
Laser projection module described in claim 1-14 any one；
Image acquisition device, described image collector is for described in acquiring and being projected into object space from the laser projection module Laser pattern；With
The processor is for handling the laser pattern to obtain depth image.
18. a kind of electronic device, which is characterized in that the electronic device includes：
Shell；With
Depth camera described in claim 17, depth camera setting expose on the housing and from the shell with Obtain the depth image.
CN201810162417.6A 2018-02-27 2018-02-27 The laser projection module and its detection method of damage, depth camera and electronic device Pending CN108333850A (en)

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