CN108288653B - 一种具有参考电容的传感器件及其制造方法 - Google Patents
一种具有参考电容的传感器件及其制造方法 Download PDFInfo
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- CN108288653B CN108288653B CN201810023097.6A CN201810023097A CN108288653B CN 108288653 B CN108288653 B CN 108288653B CN 201810023097 A CN201810023097 A CN 201810023097A CN 108288653 B CN108288653 B CN 108288653B
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000003990 capacitor Substances 0.000 title abstract description 10
- 239000000758 substrate Substances 0.000 claims description 46
- 229920005989 resin Polymers 0.000 claims description 33
- 239000011347 resin Substances 0.000 claims description 33
- 239000004840 adhesive resin Substances 0.000 claims description 10
- 229920006223 adhesive resin Polymers 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 9
- 239000011521 glass Substances 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 4
- 238000005553 drilling Methods 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 238000001020 plasma etching Methods 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims description 3
- 239000000126 substance Substances 0.000 claims description 3
- 238000010030 laminating Methods 0.000 claims description 2
- 230000017525 heat dissipation Effects 0.000 abstract description 6
- 238000004806 packaging method and process Methods 0.000 abstract description 2
- 230000003071 parasitic effect Effects 0.000 abstract description 2
- 230000003213 activating effect Effects 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02002—Arrangements for conducting electric current to or from the device in operations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/024—Arrangements for cooling, heating, ventilating or temperature compensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810023097.6A CN108288653B (zh) | 2018-01-10 | 2018-01-10 | 一种具有参考电容的传感器件及其制造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810023097.6A CN108288653B (zh) | 2018-01-10 | 2018-01-10 | 一种具有参考电容的传感器件及其制造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108288653A CN108288653A (zh) | 2018-07-17 |
CN108288653B true CN108288653B (zh) | 2020-01-21 |
Family
ID=62835014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810023097.6A Active CN108288653B (zh) | 2018-01-10 | 2018-01-10 | 一种具有参考电容的传感器件及其制造方法 |
Country Status (1)
Country | Link |
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CN (1) | CN108288653B (zh) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08213760A (ja) * | 1995-02-02 | 1996-08-20 | Shinko Electric Ind Co Ltd | キャパシタ内蔵基板 |
SE510455C2 (sv) * | 1997-06-06 | 1999-05-25 | Ericsson Telefon Ab L M | Förfarande för att anordna en begravd kondensator och en begravd kondensator anordnad enligt förfarandet |
JP2002170739A (ja) * | 2000-11-29 | 2002-06-14 | Murata Mfg Co Ltd | 積層セラミックコンデンサモジュール |
US6967416B2 (en) * | 2002-07-11 | 2005-11-22 | International Business Machines Corporation | Shared on-chip decoupling capacitor and heat-sink devices |
US7068490B2 (en) * | 2004-04-16 | 2006-06-27 | Kemet Electronics Corporation | Thermal dissipating capacitor and electrical component comprising same |
DE102016106284A1 (de) * | 2016-04-06 | 2017-10-12 | Epcos Ag | Modul |
CN106409856B (zh) * | 2016-11-24 | 2019-09-20 | 江苏天楹之光光电科技有限公司 | 一种制造具有参考电容的传感器的方法 |
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2018
- 2018-01-10 CN CN201810023097.6A patent/CN108288653B/zh active Active
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Publication number | Publication date |
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CN108288653A (zh) | 2018-07-17 |
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PB01 | Publication | ||
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TA01 | Transfer of patent application right |
Effective date of registration: 20191125 Address after: 314100 102, building d6-2, No. 555, Chuangye Road, Dayun Town, Jiashan County, Jiaxing City, Zhejiang Province Applicant after: JIASHAN PINZHILIAN TECHNOLOGY Co.,Ltd. Address before: 262500 Shandong city of Weifang province Qingzhou city yunmenshan Road No. 9888 Lishan College of Shandong Normal University Applicant before: Sun Peili |
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TR01 | Transfer of patent right |
Effective date of registration: 20231114 Address after: 218, 2nd Floor, Building 209, Lize Xiyuan, Chaoyang District, Beijing, 100020 Patentee after: Pinzhenmei Catering Management (Beijing) Co.,Ltd. Address before: Building 102, D6-2, No. 555 Chuangye Road, Dayun Town, Jiashan County, Jiaxing City, Zhejiang Province, 314100 Patentee before: JIASHAN PINZHILIAN TECHNOLOGY Co.,Ltd. |
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TR01 | Transfer of patent right |