CN108152302A - A kind of detection device and method of curved optical device beauty defects - Google Patents
A kind of detection device and method of curved optical device beauty defects Download PDFInfo
- Publication number
- CN108152302A CN108152302A CN201711450040.6A CN201711450040A CN108152302A CN 108152302 A CN108152302 A CN 108152302A CN 201711450040 A CN201711450040 A CN 201711450040A CN 108152302 A CN108152302 A CN 108152302A
- Authority
- CN
- China
- Prior art keywords
- imaging
- imaging lens
- camera
- optical device
- visible light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
Abstract
The invention discloses a kind of detection devices of curved optical device beauty defects, including lighting system and imaging system, lighting source is equipped in the lighting system, the imaging system includes imaging lens, imaging device and the processor being connect with imaging device signal, the lighting source is equipped on the outside of imaging lens, the imaging device includes at least a coaxial imaging mechanism or side imaging mechanism, the beneficial effects of the invention are as follows:The present invention is based on the scattering principles of light, lighting source uniform irradiation is on curved optical device surface, imaging system is imaged it above curved optical device and is detected, the curved optical device of different curvature radius can be detected, it solves the problems, such as that curved optical device beauty defects can not detect automatically, has the advantages that at low cost, simple in structure.
Description
Technical field
The present invention relates to technical field of optical detection, the detection device of specifically a kind of curved optical device beauty defects and
Method.
Background technology
In the precision optical systems such as illumination, projection, digital camera, curved optic lens, including spherical surface and aspherical light
It learns lens to be widely used, element surface has still had point, cut, open bubble etc. after the polished processing of these optical lenses
Defect, these beauty defects can influence the stability of system, make the accuracy of system reduce, therefore, to curved optical device
Surface defects detection just seems very necessary.
With the development of science and technology, requirement of the precision optical system to optical element surface defect is also higher and higher, it is domestic right
Optical element surface flaw inspection is mainly artificial visual detection method, and detection easily generates visual fatigue to human eye for a long time, causes to sentence
Disconnected standard differs, it is difficult to rational judgment.Existing much optical detection schemes based on machine vision technique at present, but both for
The technical solution of planar optical elements.Therefore a kind of system and method for the detection of curved optical device beauty defects are needed.
Invention content
The purpose of the present invention is to provide a kind of detection device and method of curved optical device beauty defects, in solution
State the problem of being proposed in background technology.
To achieve the above object, the present invention provides following technical solution:
A kind of detection device of curved optical device beauty defects, including lighting system and imaging system, in the lighting system
Equipped with lighting source, the imaging system includes imaging lens, imaging device and the processor being connect with imaging device signal,
It is characterized in that, the lighting source is equipped on the outside of imaging lens, the imaging device includes at least a coaxial imager
Structure or side imaging mechanism, the coaxial imaging mechanism be a camera sensor coaxial with imaging lens, the side imager
Structure includes a camera sensor intersected with imaging lens axis and is arranged on the visible light part reflection of axis intersection
Mirror, minute surface of the visible light part speculum close to imaging lens side is coated surface.
As further embodiment of the present invention:The lighting source is the annular LED light being arranged on the outside of imaging lens
Source.
As further embodiment of the present invention:The camera sensor is equipped with that camera sensor is made to move along axis
Actuating unit.
As further embodiment of the present invention:Camera sensor axis hangs down with imaging lens axis in the side imaging mechanism
Directly, the horizontal sextant angle of the visible light part speculum is located at imaging lens axis for 45 ° and visible light part mirror center
On.
As further embodiment of the present invention:The reflectivity of the visible light part speculum along imaging lens outward successively
It is incremented by and make the scattering light light intensity that all camera sensors receive identical.
As further embodiment of the present invention:It is described that detection method includes the following steps:
1) curved surface elements upper surface to be measured is regarded as by the identical layering of thickness on N number of vertical direction according to the depth of field of imaging lens
It is formed by stacking, and the thickness of all layerings is equal to the depth of field of imaging lens.
2) N group imaging mechanisms are equipped with above imaging lens, and by the camera sensor in all imaging mechanisms and processing
Device carries out signal connection.
3) optical element to be measured is placed on suitable position below imaging lens and opens lighting source.
4) position of each camera sensor is adjusted respectively, makes the imaged camera lens of corresponding layering and visible light part reflection
Can be presented on camera sensor after mirror clearly as.
5) sharply defined image being respectively layered presented on all camera sensors is spliced by processor, then passes through figure
Shape processing can be detected curved optical device surface.
Compared with prior art, the beneficial effects of the invention are as follows:The present invention is based on the scattering principle of light, lighting source is uniform
Curved optical device surface is radiated at, imaging system is imaged it above curved optical device and is detected, can be to difference
The curved optical device of radius of curvature is detected, and solves the problems, such as that curved optical device beauty defects can not detect automatically, tool
There is at low cost, advantages of simple structure and simple.
Description of the drawings
Fig. 1 is the principle schematic diagram of the present invention.
Fig. 2 is one fundamental diagram of the embodiment of the present invention.
Fig. 3 is two fundamental diagram of the embodiment of the present invention.
In figure:1- camera sensors, 2- visible light parts speculum, 3- imaging lens, 4- lighting sources, 5- processors,
6- optical elements to be measured.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
Embodiment one
Please refer to Fig.1-2, in the embodiment of the present invention, a kind of detection device of curved optical device beauty defects is including illumination
System and imaging system, interior be equipped with of imaging system include imaging lens 3, imaging device and the processing being connect with imaging device signal
Device 3, imaging device are equipped with three groups, including one group of coaxial imaging mechanism and two groups of side imaging mechanisms, axial imaging mechanism packet
It includes one and is located at 3 top of imaging lens and the third camera sensor coaxial with imaging lens 3, side imaging mechanism includes being arranged on
The first camera sensor on 3 right side of imaging lens and the second camera sensor for being arranged on 3 left side of imaging lens, first camera pass
Sensor axis intersects vertically with 3 axis of imaging lens and in the first visible light part that joint is equipped with horizontal sextant angle is 45 °
Speculum, and the reflectivity of the first visible light part speculum be 33.3%, second camera sensor axis to 3 axis of imaging lens
It is 135 ° of the first visible light part speculum, and the first visible ray portion that line, which intersects vertically and is equipped in joint with horizontal sextant angle,
The reflectivity for dividing speculum is 50%.
When in use, the upper surface of curved optical device 6 can regard S as to the present embodiment1, S2, S3The superposition of three layerings,
And S1, S2, tri- layers of distances in the vertical direction of S3 are identical, and imaging lens 3 are placed in the surface of curved optical device 6, the depth of field
Equal to each layering S1, S2, S3Vertical direction on distance, lighting source 4 is also placed in the surface of curved optical device 1, is distributed
In the surrounding of imaging lens 3, then start lighting source 4, make illumination light uniform irradiation on curved optical device 6, S1Layering
On the imaged camera lenses 3 of any point A, using the first visible light part speculum reflect after image in first camera sensor
On, the distance of first camera sensor and the first visible light part speculum is adjusted, A point blur-free imagings, S can be made2In layering
B imaged camera lenses 3 in any point through the first visible light part speculum, are reflected using the second visible light part speculum
After image on second camera sensor, adjust the distance of second camera sensor and the second visible light part speculum, B can be made
Point blur-free imaging, S3The imaged camera lenses 3 of any point C in layering, then can through the first visible light part speculum and first
Imaged on third camera sensor after seeing light partially reflecting mirror, adjust third camera sensor distance, can make C points clearly into
Picture, whole system share an imaging lens, ensure each layering S1, S2, S3Imaging enlargement ratio it is consistent, then pass through processing
Device 5 will be layered S1, S2, S3Then institute can pass through the bright spot and dim spot in analysis imaging into clearly as being orderly stitched together
Carry out the beauty defects of analytic surface optical element.
Embodiment two
Referring to Fig. 3, the present embodiment, compared with embodiment one, the basic difference for measuring curved optical device sets one group of axial direction
Imaging mechanism and one group of side imaging mechanism, and the reflectivity of the visible light part speculum 2 in the imaging mechanism of side is 50%, remaining
Structure and detection process are identical with embodiment one.
It is obvious to a person skilled in the art that the present invention is not limited to the details of above-mentioned exemplary embodiment, Er Qie
In the case of without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Profit requirement rather than above description limit, it is intended that all by what is fallen within the meaning and scope of the equivalent requirements of the claims
Variation is included within the present invention.Any reference numeral in claim should not be considered as to the involved claim of limitation.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped
Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should
It considers the specification as a whole, the technical solutions in each embodiment can also be properly combined, forms those skilled in the art
The other embodiment being appreciated that.
Claims (6)
1. a kind of detection device of curved optical device beauty defects, including lighting system and imaging system, the lighting system
Interior to be equipped with lighting source (4), the imaging system includes imaging lens (3), imaging device and is connect with imaging device signal
Processor (5), which is characterized in that the lighting source (4) is equipped on the outside of the imaging lens (3), and the imaging device is at least
Including a coaxial imaging mechanism or side imaging mechanism, the coaxial imaging mechanism is a phase coaxial with imaging lens (3)
Machine sensor (1), the side imaging mechanism include a camera sensor (1) intersected with imaging lens (3) axis and set
The visible light part speculum (2) in axis intersection is put, the visible light part speculum (2) is close to 3 side of imaging lens
The equal coated surface of minute surface.
2. one kind according to claim 1, which is characterized in that the lighting source (4) is is arranged on imaging lens (3) outside
The annular LED lamp source of side.
3. one kind according to claim 1, which is characterized in that the camera sensor (1) is equipped with to pass camera
The actuating unit that sensor is moved along axis.
4. one kind according to claim 1, which is characterized in that in the side imaging mechanism camera sensor (1) axis with
Imaging lens (3) axis is vertical, and the horizontal sextant angle of the visible light part speculum (2) is 45 ° and visible light part speculum
(2) center is located on imaging lens (3) axis.
5. one kind according to claim 1, which is characterized in that the reflectivity of the visible light part speculum (2) along into
As the scattering light light intensity that camera lens (3) is incremented by successively outward and receives all camera sensors (1) is identical.
A kind of 6. detection method of curved optical device beauty defects as described in claim 1, which is characterized in that the detection
Method includes the following steps:
1) curved surface elements upper surface to be measured is regarded as by thickness on N number of vertical direction identical according to the depth of field of imaging lens (3)
Layering is formed by stacking, and the thickness of all layerings is equal to the depth of field of imaging lens (3);
2) N group imaging mechanisms are equipped with above imaging lens (3), and by the camera sensor (1) in all imaging mechanisms with locating
It manages device and carries out signal connection;
3) optical element to be measured is placed on suitable position below imaging lens (3) and opens lighting source (4);
4) position of each camera sensor (1) is adjusted respectively, makes the imaged camera lens (3) of corresponding layering and visible light part anti-
Penetrate mirror (2) can be presented on camera sensor (1) afterwards clearly as;
5) sharply defined image being respectively layered presented on all camera sensors (1) is spliced by processor (5), then passed through
Graphics process can be detected curved optical device surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711450040.6A CN108152302A (en) | 2017-12-27 | 2017-12-27 | A kind of detection device and method of curved optical device beauty defects |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711450040.6A CN108152302A (en) | 2017-12-27 | 2017-12-27 | A kind of detection device and method of curved optical device beauty defects |
Publications (1)
Publication Number | Publication Date |
---|---|
CN108152302A true CN108152302A (en) | 2018-06-12 |
Family
ID=62462296
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201711450040.6A Pending CN108152302A (en) | 2017-12-27 | 2017-12-27 | A kind of detection device and method of curved optical device beauty defects |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108152302A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109490313A (en) * | 2018-11-09 | 2019-03-19 | 中国科学院光电技术研究所 | A kind of heavy caliber curved optical device surface defect automatic detection device and method |
CN113933026A (en) * | 2021-09-17 | 2022-01-14 | 南京森林警察学院 | Lens surface flaw detection device and method based on transmission and reflection mixed illumination |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08285791A (en) * | 1995-04-19 | 1996-11-01 | Ikegami Tsushinki Co Ltd | Visual inspection apparatus for inner surface of deep object |
JPH10505155A (en) * | 1994-08-26 | 1998-05-19 | プレスコ テクノロジー インコーポレーテッド | Integral field lens illumination for image inspection |
JP2000002514A (en) * | 1998-06-17 | 2000-01-07 | Nikon Corp | Film thickness measuring apparatus, alignment sensor and alignment apparatus |
US20070147821A1 (en) * | 2005-12-23 | 2007-06-28 | Joachim Gaessler | Device and method for optically inspecting a surface |
US20100150584A1 (en) * | 2008-12-16 | 2010-06-17 | Canon Kabushiki Kaisha | Detection apparatus and toner detection apparatus using the same |
CN103226001A (en) * | 2013-04-16 | 2013-07-31 | 上海大学 | Measuring device and measuring method for tiny surface defect through post-magnification digital holographic microscopy |
CN103293162A (en) * | 2013-06-17 | 2013-09-11 | 浙江大学 | Lighting system and method used for dark field detection of defect in spherical optical element surface |
CN103575748A (en) * | 2013-11-15 | 2014-02-12 | 上海交通大学 | System for optical detection on micro-aperture workpiece inner wall |
US20140346328A1 (en) * | 2012-11-19 | 2014-11-27 | Shenzhen University | Extended depth of field three-dimensional nano-resolution imaging method, optical component, and imaging system |
CN104198501A (en) * | 2014-09-18 | 2014-12-10 | 中国科学院光电技术研究所 | Method for positioning reflector with flaw on reflecting surface |
CN104215646A (en) * | 2014-09-18 | 2014-12-17 | 浙江大学 | System and method for detecting surface defects of large-caliber spherical optical element |
CN105092607A (en) * | 2015-08-27 | 2015-11-25 | 浙江大学 | Method for evaluating surface defects of spherical optical components |
CN205538737U (en) * | 2015-12-30 | 2016-08-31 | 中国工程物理研究院激光聚变研究中心 | High depth of field surface defect detecting device of optical element of reflection -type dual wavelength holography |
CN106338524A (en) * | 2016-08-23 | 2017-01-18 | 中国科学院自动化研究所 | Microscopic scanning imaging acquisition device for vertical optical element surface damage and method thereof |
CN208091948U (en) * | 2017-12-27 | 2018-11-13 | 合肥知常光电科技有限公司 | A kind of detection device of curved optical device beauty defects |
-
2017
- 2017-12-27 CN CN201711450040.6A patent/CN108152302A/en active Pending
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10505155A (en) * | 1994-08-26 | 1998-05-19 | プレスコ テクノロジー インコーポレーテッド | Integral field lens illumination for image inspection |
JPH08285791A (en) * | 1995-04-19 | 1996-11-01 | Ikegami Tsushinki Co Ltd | Visual inspection apparatus for inner surface of deep object |
JP2000002514A (en) * | 1998-06-17 | 2000-01-07 | Nikon Corp | Film thickness measuring apparatus, alignment sensor and alignment apparatus |
US20070147821A1 (en) * | 2005-12-23 | 2007-06-28 | Joachim Gaessler | Device and method for optically inspecting a surface |
US20100150584A1 (en) * | 2008-12-16 | 2010-06-17 | Canon Kabushiki Kaisha | Detection apparatus and toner detection apparatus using the same |
US20140346328A1 (en) * | 2012-11-19 | 2014-11-27 | Shenzhen University | Extended depth of field three-dimensional nano-resolution imaging method, optical component, and imaging system |
CN103226001A (en) * | 2013-04-16 | 2013-07-31 | 上海大学 | Measuring device and measuring method for tiny surface defect through post-magnification digital holographic microscopy |
CN103293162A (en) * | 2013-06-17 | 2013-09-11 | 浙江大学 | Lighting system and method used for dark field detection of defect in spherical optical element surface |
CN103575748A (en) * | 2013-11-15 | 2014-02-12 | 上海交通大学 | System for optical detection on micro-aperture workpiece inner wall |
CN104198501A (en) * | 2014-09-18 | 2014-12-10 | 中国科学院光电技术研究所 | Method for positioning reflector with flaw on reflecting surface |
CN104215646A (en) * | 2014-09-18 | 2014-12-17 | 浙江大学 | System and method for detecting surface defects of large-caliber spherical optical element |
CN105092607A (en) * | 2015-08-27 | 2015-11-25 | 浙江大学 | Method for evaluating surface defects of spherical optical components |
CN205538737U (en) * | 2015-12-30 | 2016-08-31 | 中国工程物理研究院激光聚变研究中心 | High depth of field surface defect detecting device of optical element of reflection -type dual wavelength holography |
CN106338524A (en) * | 2016-08-23 | 2017-01-18 | 中国科学院自动化研究所 | Microscopic scanning imaging acquisition device for vertical optical element surface damage and method thereof |
CN208091948U (en) * | 2017-12-27 | 2018-11-13 | 合肥知常光电科技有限公司 | A kind of detection device of curved optical device beauty defects |
Non-Patent Citations (2)
Title |
---|
张彬;刘缠牢;: "球面光学元件表面疵病的自动检测技术研究", 光学仪器 * |
王科;刘缠牢;: "球面光学元件表面疵病检测技术研究", 光学仪器 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109490313A (en) * | 2018-11-09 | 2019-03-19 | 中国科学院光电技术研究所 | A kind of heavy caliber curved optical device surface defect automatic detection device and method |
CN113933026A (en) * | 2021-09-17 | 2022-01-14 | 南京森林警察学院 | Lens surface flaw detection device and method based on transmission and reflection mixed illumination |
CN113933026B (en) * | 2021-09-17 | 2023-08-18 | 南京森林警察学院 | Lens surface flaw detection device and method based on transmission and reflection mixed illumination |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9423245B2 (en) | Arrangement for optical measurements and related method | |
KR101317947B1 (en) | Apparatus for inspecting cylinder | |
CN107000334B (en) | To composite construction in X -ray inspection X | |
CN105549231B (en) | Liquid crystal display defect detecting device and method | |
CN101561347B (en) | Binocular visual axis deviation detection device and method of video spectacles | |
US9239237B2 (en) | Optical alignment apparatus and methodology for a video based metrology tool | |
CN103575748A (en) | System for optical detection on micro-aperture workpiece inner wall | |
US10337977B1 (en) | Systems and methods for glass particle detection | |
KR20180012616A (en) | Multi focus image acquisition apparatus and sample surface inspection system | |
CN110073203A (en) | The method and apparatus for checking the defect in transparent substrate | |
CN208833689U (en) | Detection device | |
KR20150058051A (en) | Device for acquisition and measurement of geometric data of at least one motif associated with a spectacle frame glass and associated method | |
CN107727665A (en) | Appearance inspection device and appearance inspection method | |
CN108152302A (en) | A kind of detection device and method of curved optical device beauty defects | |
CN102144187A (en) | Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image | |
ES2921155T3 (en) | Device and method for optical measurement of an inner contour of an eyeglass frame | |
TWI622764B (en) | An automatic optical inspecting system for particle inspection from the surface | |
US5523836A (en) | Method and apparatus for orienting a lens' refractive characteristics and lay-out properties | |
KR101732460B1 (en) | The Inspection Apparatus for Contact Lens | |
CN208091948U (en) | A kind of detection device of curved optical device beauty defects | |
CN110044849A (en) | Semi-enclosed cavity Inner Defect Testing device | |
TWM528423U (en) | External appearance inspection apparatus and inspection system | |
JP2006220603A (en) | Imaging apparatus | |
CN103439812A (en) | Liquid crystal glass substrate 45-degree inspection method | |
KR101447857B1 (en) | Particle inspectiing apparatus for lens module |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |