CN108139205B - 光学元件特性测定装置 - Google Patents

光学元件特性测定装置 Download PDF

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Publication number
CN108139205B
CN108139205B CN201680059885.XA CN201680059885A CN108139205B CN 108139205 B CN108139205 B CN 108139205B CN 201680059885 A CN201680059885 A CN 201680059885A CN 108139205 B CN108139205 B CN 108139205B
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optical element
light
inspected
lens
annular
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CN201680059885.XA
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Chinese (zh)
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CN108139205A (zh
Inventor
桂光广
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Cachino Photoelectric System Ltd By Share Ltd
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Cachino Photoelectric System Ltd By Share Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201680059885.XA 2015-10-23 2016-07-04 光学元件特性测定装置 Active CN108139205B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2015-209258 2015-10-23
JP2015209258 2015-10-23
JP2016091259 2016-04-28
JP2016-091259 2016-04-28
PCT/JP2016/069774 WO2017068813A1 (fr) 2015-10-23 2016-07-04 Dispositif de mesure de caractéristiques d'élément optique

Publications (2)

Publication Number Publication Date
CN108139205A CN108139205A (zh) 2018-06-08
CN108139205B true CN108139205B (zh) 2020-01-03

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ID=58557193

Family Applications (1)

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CN201680059885.XA Active CN108139205B (zh) 2015-10-23 2016-07-04 光学元件特性测定装置

Country Status (5)

Country Link
JP (1) JP6218261B2 (fr)
KR (1) KR102587880B1 (fr)
CN (1) CN108139205B (fr)
TW (1) TWI649535B (fr)
WO (1) WO2017068813A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102198274B1 (ko) * 2019-06-27 2021-01-04 주식회사 엠아이텍 곡면 및 평면 틸트 측정이 가능한 오토콜리메이터와 이를 이용한 핸드폰용 카메라 렌즈 구동검사기
US20230236085A1 (en) * 2022-01-26 2023-07-27 Oren Aharon Non Rotating Lens Centering Device
CN114894712B (zh) * 2022-03-25 2023-08-25 业成科技（成都）有限公司 光学量测设备及其校正方法
CN116793231B (zh) * 2023-07-03 2024-06-07 深圳市易显传感技术有限公司 镜片厚度检测方法和装置

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568081Y2 (fr) * 1978-11-24 1981-02-23
JPS6370110A (ja) * 1986-09-12 1988-03-30 Canon Inc 距離測定装置
JPS6370110U (fr) * 1986-10-27 1988-05-11
JPH0674968B2 (ja) 1988-03-15 1994-09-21 三菱電機株式会社 光学式測定装置
EP0561178B1 (fr) * 1992-03-14 1997-10-29 Roke Manor Research Limited Mesure de la curvature d'une surface
GB9205655D0 (en) * 1992-03-14 1992-04-29 Roke Manor Research Improvements in or relating to surface curvature measurement
JPH09101116A (ja) * 1995-10-05 1997-04-15 Hitachi Ltd 自動焦点合わせ方法及びその装置並びにパターン検出方法及びその装置
JP3799708B2 (ja) 1996-12-24 2006-07-19 松下電工株式会社 光学式変位測定システム
JP3374736B2 (ja) * 1997-12-16 2003-02-10 ミノルタ株式会社 レンズ調整装置
JP4307764B2 (ja) * 2001-07-27 2009-08-05 パイオニア株式会社 光ピックアップ装置
JP2005090962A (ja) * 2003-09-11 2005-04-07 Ricoh Co Ltd 光学素子の測定方法および測定装置
US7667829B2 (en) * 2004-08-09 2010-02-23 Nikon Corporation Optical property measurement apparatus and optical property measurement method, exposure apparatus and exposure method, and device manufacturing method
JP2007206031A (ja) 2006-02-06 2007-08-16 Paerl Optical Industry Co Ltd 透過式偏心測定装置
JP4774332B2 (ja) 2006-06-06 2011-09-14 富士フイルム株式会社 偏芯量測定方法
JP5084327B2 (ja) * 2007-04-04 2012-11-28 オリンパス株式会社 偏心検査装置及び偏心調整装置
JP4943946B2 (ja) 2007-06-04 2012-05-30 富士フイルム株式会社 偏芯量測定装置
CN201096611Y (zh) * 2007-11-08 2008-08-06 西安工业大学 一种非球面透镜的偏心测量装置
KR100947464B1 (ko) * 2008-02-13 2010-03-17 에스엔유 프리시젼 주식회사 두께 측정장치
JP2009229144A (ja) * 2008-03-19 2009-10-08 Olympus Corp 偏心測定機
JP5540614B2 (ja) * 2009-09-08 2014-07-02 コニカミノルタ株式会社 オートコリメータを用いた光学素子の偏心調整方法及び偏心測定方法、並びにレンズ加工方法
CN101788271A (zh) * 2010-03-17 2010-07-28 北京理工大学 共焦透镜中心厚度测量方法与装置
CN102822656B (zh) * 2010-04-13 2016-05-11 柯尼卡美能达先进多层薄膜株式会社 偏心量测量方法
CN101922919B (zh) * 2010-09-07 2013-06-19 西安工业大学 一种光学零件几何参数非接触测量方法及其测量装置
JP6087754B2 (ja) * 2013-07-09 2017-03-01 シャープ株式会社 レンズチルト検出装置
KR101537854B1 (ko) * 2013-09-23 2015-07-21 에스엔유 프리시젼 주식회사 두께 측정 장치 및 이를 이용한 두께 측정 방법

Also Published As

Publication number Publication date
KR20180071249A (ko) 2018-06-27
TWI649535B (zh) 2019-02-01
WO2017068813A1 (fr) 2017-04-27
CN108139205A (zh) 2018-06-08
JP6218261B2 (ja) 2017-10-25
JPWO2017068813A1 (ja) 2017-10-19
KR102587880B1 (ko) 2023-10-10
TW201728870A (zh) 2017-08-16

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