CN108089955A - A kind of PCIE signal measurement jig and test method based on OCuLink interfaces - Google Patents

A kind of PCIE signal measurement jig and test method based on OCuLink interfaces Download PDF

Info

Publication number
CN108089955A
CN108089955A CN201711243801.0A CN201711243801A CN108089955A CN 108089955 A CN108089955 A CN 108089955A CN 201711243801 A CN201711243801 A CN 201711243801A CN 108089955 A CN108089955 A CN 108089955A
Authority
CN
China
Prior art keywords
oculink
interfaces
measurement jig
signal
pcie
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711243801.0A
Other languages
Chinese (zh)
Inventor
贾永涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhengzhou Yunhai Information Technology Co Ltd
Original Assignee
Zhengzhou Yunhai Information Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhengzhou Yunhai Information Technology Co Ltd filed Critical Zhengzhou Yunhai Information Technology Co Ltd
Priority to CN201711243801.0A priority Critical patent/CN108089955A/en
Publication of CN108089955A publication Critical patent/CN108089955A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

The PCIE signal measurement jig and test method of the present application OCuLink interfaces, it is that OCuLink male connectors and SMP female interfaces are reserved on measurement jig, OCuLink male connectors are for the connection of measurement jig and tested interface, and SMP females are for connection of the measurement jig by SMP cables and oscillograph.By the measurement jig and test method can easily carry out OCuLink interfaces PCIE signal test, operation flexibly, conveniently, and can eliminate with probe directly put measuring tape come test error, improve measuring accuracy.

Description

A kind of PCIE signal measurement jig and test method based on OCuLink interfaces
Technical field
The present invention relates to server testing fields, and in particular to a kind of PCIE signal test based on OCuLink interfaces is controlled Tool and test method.
Background technology
With the continuous improvement of server board density, the size of component package is less and less on board.OCuLink makees More and more extensive use is obtained for the connector of a kind of high density, small size.Oculink connectors are high-speed datas of new generation Signal connector is widely used in the fields such as server, interchanger, storage device and work station, is used for transmission 24G SAS data Signal.The signal pins density of OCuLink interfaces is higher and is all wrapped, and the PCIE (Peripheral of OCuLink interfaces Component Interface Express buses and interface standard) signal be high speed signal, it is necessary to carry out signal integrity survey Examination.
For the PCIE signal integrity test of OCuLink interfaces, if can only not use and pop one's head at a high speed by measurement jig A survey is directly carried out on OCuLink interfaces, still, is surveyed if put with probe directly on OCuLink interfaces, such operation Can be potentially encountered can not normally touch signal pins or the unstable situation of contact, so as to cause can not normally, accurately into Row test, testing efficiency and measuring accuracy can not ensure.
For this problem, the present application is a kind of based on the PCIE signal measurement jig of OCuLink interfaces and test side Method.
The content of the invention
The problem to be solved in the present invention be carry out OCuLink interfaces PCIE signal integrity test when, if with spy Head directly point, which is surveyed can be potentially encountered, can not normally touch signal pins or the unstable situation of contact, so as to cause can not be just Often, the problem of accurately being tested.
As shown in Figure 1, test philosophy of the invention is to lead to the PCIE clock signals and data-signal of OCuLink interfaces It crosses SMP females to extract, other any devices need not be added on signal transmission path, to ensure to draw the authenticity of signal.
The purposes of signal testing gauge in the present invention is for testing, therefore first has to ensure biography of the signal on gauge It is defeated signal to be had an impact.In order to achieve this, it needs from plate, trace width, cable run distance, resistance requirements etc. Stringent emulation is carried out, and then makes rational wiring rule.
The wiring rule formulated according to signal simulation requirement carries out Layout wires designs, after the completion of Layout wires designs It re-packs.
The tests such as impedance, Loss verification is carried out after the completion of re-packing, it is ensured that gauge meets design requirement.
The connection of tested interface and measurement jig is carried out shown in 2 with reference to the accompanying drawings.
The connection of measurement jig and oscillograph is carried out shown in 3 with reference to the accompanying drawings, test can be carried out after the completion of connection.
Specifically, a kind of PCIE signal measurement jig based on OCuLink interfaces is claimed in the application, and feature exists In the signal testing gauge specifically includes:OCuLink male connectors and SMP female interfaces, wherein, OCuLink male connectors are controlled for testing The connection of tool and tested interface, SMP females are used for connection of the measurement jig by SMP cables and oscillograph.
PCIE signal measurement jig based on OCuLink interfaces as described above is further characterized in that, which controls Tool is made of an OCuLink male connector, 5 pairs of PCB traces and 5 pairs of SMP females.
PCIE signal measurement jig based on OCuLink interfaces as described above, is further characterized in that, PCB trace is used for Signal is led into SMP female interfaces.
PCIE signal measurement jig based on OCuLink interfaces as described above, is further characterized in that, in 5 pairs of PCB traces One group be difference PCIE reference clock signals, remaining four groups be difference PCIE data-signals.
Specifically, the application also asks a kind of PCIE signal test method based on OCuLink interfaces, which is characterized in that The test method carries out signal testing using PCIE signal measurement jig as described in claim 1, and specific testing procedure is:
By the connection of tested interface and measurement jig described in claim 1;
Measurement jig described in claim 1 with oscillograph is attached, is tested after the completion of connection.
PCIE signal test method based on OCuLink interfaces as described above is further characterized in that, which controls Tool is made of an OCuLink male connector, 5 pairs of PCB traces and 5 pairs of SMP females.
PCIE signal test method based on OCuLink interfaces as described above, is further characterized in that, PCB trace is used for Signal is led into SMP female interfaces.
PCIE signal test method based on OCuLink interfaces as described above, is further characterized in that, in 5 pairs of PCB traces One group be difference PCIE reference clock signals, remaining four groups be difference PCIE data-signals.
PCIE signal test method based on OCuLink interfaces as described above, is further characterized in that, PCIE signal test When need simultaneously test clock signal and data-signal.
Description of the drawings
Fig. 1, measurement jig schematic diagram
Fig. 2, measurement jig and tested interface connection diagram
Fig. 3, measurement jig pass through SMP cables and oscillograph connection diagram
Specific embodiment
Clearly to illustrate the realization situation of test method of the present invention, below in conjunction with the accompanying drawings 1, attached drawing 2, attached drawing 3 illustrate Realize step.It is specific as follows:
OCuLink male connectors and SMP female interfaces are reserved on measurement jig, OCuLink male connectors are used for measurement jig and quilt The connection of interface is surveyed, SMP females are used for connection of the measurement jig by SMP cables and oscillograph.
As shown in Figure 1, gauge is made of an OCuLink male connector, 5 pairs of PCB traces and 5 pairs of SMP females.OCuLink Male connector is used for the connection of measurement jig and tested interface;PCB trace is used to signal leading to SMP female interfaces;SMP females are used for With the connection of SMP cables.
In attached drawing 1, CLK+, CLK- are the PCIE reference clock signals of one group of difference;
TX0+, TX0-, TX1+, TX1-, TX2+, TX2-, TX3+, TX3- are the PCIE data-signals of four groups of difference;It can be with It is connected by SMP cables with oscillograph, so as to easily carry out PCIE signal integrity test.
Attached drawing 2 is measurement jig and tested interface connection diagram.
Attached drawing 3 is measurement jig and oscillograph connection diagram.
It should be noted that:Needed when PCIE signal is tested simultaneously test clock signal (CLK) and data-signal (TX0, TX1, TX2 or TX3), the present embodiment is exemplified by testing TX2.
It should be evident that illustrated above is only the specific embodiment of the present invention, for the common skill in this field For art personnel, without creative efforts, other technical solutions can also be obtained according to above-described embodiment, And the equivalent variations made in the scope of protection of the invention should all be fallen within the scope of protection of the present invention, and belong to the present invention The scope of protection.
In conclusion the PCIE signal measurement jig and test method of the present application OCuLink interfaces, are controlled in test OCuLink male connectors and SMP female interfaces are reserved on tool, OCuLink male connectors are for the connection of measurement jig and tested interface, SMP Female is used for connection of the measurement jig by SMP cables and oscillograph.It can be convenient by the measurement jig and test method The PCIE signal test of OCuLink interfaces is carried out, the gauge and test method can realize the company by SMP cables and oscillograph Connect, operation flexibly, conveniently, and can eliminate with probe directly put measuring tape come test error, improve measuring accuracy and survey Try efficiency.

Claims (9)

1. a kind of PCIE signal measurement jig based on OCuLink interfaces, which is characterized in that the signal testing gauge specifically wraps It includes:OCuLink male connectors and SMP female interfaces, wherein, OCuLink male connectors are for the connection of measurement jig and tested interface, SMP Female is used for connection of the measurement jig by SMP cables and oscillograph.
2. the PCIE signal measurement jig based on OCuLink interfaces as described in claim 1, is further characterized in that, the signal Measurement jig is made of an OCuLink male connector, 5 pairs of PCB traces and 5 pairs of SMP females.
3. the PCIE signal measurement jig based on OCuLink interfaces as claimed in claim 2, is further characterized in that, PCB trace For signal to be led to SMP female interfaces.
4. the PCIE signal measurement jig based on OCuLink interfaces as claimed in claim 3, is further characterized in that, 5 couples of PCB Have in cabling one group be difference PCIE reference clock signals, remaining four groups be difference PCIE data-signals.
5. a kind of PCIE signal test method based on OCuLink interfaces, which is characterized in that the test method uses right such as will The PCIE signal measurement jig described in 1 is asked to carry out signal testing, specific testing procedure is:
By the connection of tested interface and measurement jig described in claim 1;
Measurement jig described in claim 1 with oscillograph is attached, is tested after the completion of connection.
6. the PCIE signal test method based on OCuLink interfaces as claimed in claim 5, is further characterized in that, the signal Measurement jig is made of an OCuLink male connector, 5 pairs of PCB traces and 5 pairs of SMP females.
7. the PCIE signal test method based on OCuLink interfaces as claimed in claim 6, is further characterized in that, PCB trace For signal to be led to SMP female interfaces.
8. the PCIE signal test method based on OCuLink interfaces as claimed in claim 7, is further characterized in that, 5 couples of PCB Have in cabling one group be difference PCIE reference clock signals, remaining four groups be difference PCIE data-signals.
9. the PCIE signal test method based on OCuLink interfaces as claimed in claim 8, is further characterized in that, PCIE letters Number test when need simultaneously test clock signal and data-signal.
CN201711243801.0A 2017-11-30 2017-11-30 A kind of PCIE signal measurement jig and test method based on OCuLink interfaces Pending CN108089955A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711243801.0A CN108089955A (en) 2017-11-30 2017-11-30 A kind of PCIE signal measurement jig and test method based on OCuLink interfaces

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711243801.0A CN108089955A (en) 2017-11-30 2017-11-30 A kind of PCIE signal measurement jig and test method based on OCuLink interfaces

Publications (1)

Publication Number Publication Date
CN108089955A true CN108089955A (en) 2018-05-29

Family

ID=62173345

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711243801.0A Pending CN108089955A (en) 2017-11-30 2017-11-30 A kind of PCIE signal measurement jig and test method based on OCuLink interfaces

Country Status (1)

Country Link
CN (1) CN108089955A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109375002A (en) * 2018-09-21 2019-02-22 郑州云海信息技术有限公司 A kind of M.2 interface signal test equipment
CN109884552A (en) * 2019-03-20 2019-06-14 浪潮商用机器有限公司 Power supply test method and system
CN111579825A (en) * 2020-05-28 2020-08-25 浪潮电子信息产业股份有限公司 PCIE signal test fixture and test cable auxiliary supporting tool thereof
CN112380103A (en) * 2020-11-11 2021-02-19 深圳市广和通无线股份有限公司 System log acquisition device, system, method and storage medium
CN113281583A (en) * 2021-04-21 2021-08-20 深圳市精泰达科技有限公司 PCIe test fixture and PCIe test method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102684932A (en) * 2011-03-09 2012-09-19 神讯电脑(昆山)有限公司 Local area network interface test device
CN106129695A (en) * 2016-08-31 2016-11-16 安费诺电子装配(厦门)有限公司 A kind of Oculink adapter of band reversing catch
CN106546777A (en) * 2016-11-04 2017-03-29 郑州云海信息技术有限公司 A kind of 10G ethernet signal measurement jigs based on RJ45 interfaces
CN107145416A (en) * 2017-05-05 2017-09-08 郑州云海信息技术有限公司 A kind of PCIE signal method of testing and measurement jig system for supporting OCP interfaces
US20170337069A1 (en) * 2016-05-23 2017-11-23 Baidu Usa Llc Concurrent testing of pci express devices on a server platform

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102684932A (en) * 2011-03-09 2012-09-19 神讯电脑(昆山)有限公司 Local area network interface test device
US20170337069A1 (en) * 2016-05-23 2017-11-23 Baidu Usa Llc Concurrent testing of pci express devices on a server platform
CN106129695A (en) * 2016-08-31 2016-11-16 安费诺电子装配(厦门)有限公司 A kind of Oculink adapter of band reversing catch
CN106546777A (en) * 2016-11-04 2017-03-29 郑州云海信息技术有限公司 A kind of 10G ethernet signal measurement jigs based on RJ45 interfaces
CN107145416A (en) * 2017-05-05 2017-09-08 郑州云海信息技术有限公司 A kind of PCIE signal method of testing and measurement jig system for supporting OCP interfaces

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109375002A (en) * 2018-09-21 2019-02-22 郑州云海信息技术有限公司 A kind of M.2 interface signal test equipment
CN109884552A (en) * 2019-03-20 2019-06-14 浪潮商用机器有限公司 Power supply test method and system
CN111579825A (en) * 2020-05-28 2020-08-25 浪潮电子信息产业股份有限公司 PCIE signal test fixture and test cable auxiliary supporting tool thereof
CN112380103A (en) * 2020-11-11 2021-02-19 深圳市广和通无线股份有限公司 System log acquisition device, system, method and storage medium
CN113281583A (en) * 2021-04-21 2021-08-20 深圳市精泰达科技有限公司 PCIe test fixture and PCIe test method
CN113281583B (en) * 2021-04-21 2022-09-30 深圳市精泰达科技有限公司 PCIe test fixture and PCIe test method

Similar Documents

Publication Publication Date Title
CN108089955A (en) A kind of PCIE signal measurement jig and test method based on OCuLink interfaces
CN106546777A (en) A kind of 10G ethernet signal measurement jigs based on RJ45 interfaces
CN108107237A (en) The SATA signal testings gauge and test method of a kind of Slimline interfaces
CN107145416A (en) A kind of PCIE signal method of testing and measurement jig system for supporting OCP interfaces
CN108153630A (en) A kind of signal-testing apparatus
CN201251780Y (en) Internal memory test tool
CN203365483U (en) Detector for detecting Goldfinger of circuit board
CN109828872A (en) Signal-testing apparatus and method
CN102735945A (en) Signal testing device
CN202694326U (en) Test device
CN108255652B (en) Signal testing device
CN102650677B (en) PCI-E signal-testing apparatus
CN209927982U (en) M.2 PCIE signal test fixture
CN102141952B (en) Device for testing system management bus
CN105486970A (en) Pogopin module performance test system and method
CN102567167A (en) Testing card and testing system for mSATA (serial advanced technology attachment) interface
CN207008598U (en) A kind of PCIE signal measurement jig of PCIE device
CN104280639B (en) Test device and method of high-speed video bus connectors
CN114706718A (en) PCIe signal integrity verification method, device, equipment and medium
CN105652088B (en) The test device of external interface contact impedance
CN204302384U (en) The testing arrangement of external interface contact impedance
CN112601235A (en) Test system and test method of WLAN interface
CN207586904U (en) A kind of onboard interface signal measurement jig and the signal testing jig that Insertion Loss can be surveyed
CN214201561U (en) Movable measuring device for metering automatic test equipment
CN113268390A (en) Testing jig, system and method for mSATA interface

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20180529

RJ01 Rejection of invention patent application after publication