CN108076340A - CCD/CMOS parameter detecting systems - Google Patents
CCD/CMOS parameter detecting systems Download PDFInfo
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- CN108076340A CN108076340A CN201810009930.1A CN201810009930A CN108076340A CN 108076340 A CN108076340 A CN 108076340A CN 201810009930 A CN201810009930 A CN 201810009930A CN 108076340 A CN108076340 A CN 108076340A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
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- Health & Medical Sciences (AREA)
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- General Health & Medical Sciences (AREA)
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Abstract
The present invention provides a kind of CCD/CMOS parameter detecting systems, including：Hardware detection device, control device, hardware detection device includes workbench, integrating sphere and optical dark room are provided on workbench, it is set on integrating sphere there are three light source, illumination photometer is popped one's head in and light-emitting window, resolution chart is provided at light-emitting window, it is provided with Zoom regulating mechanism, optical lens fine adjustment platform, CCD/CMOS fine adjustments fixture, variable focus lens package, CCD/COMS to be measured in optical dark room, CCD/COMS to be measured, variable focus lens package and the second light-emitting window are in alignment；Industrial personal computer, illumination photometer, the driving power of three light sources, CCD/CMOS power supplies are provided in workbench；Control device includes power-supply controller of electric and multi-function data acquisition card, and power-supply controller of electric is connected respectively with industrial personal computer, three driving powers, and multi-function data acquisition card is inserted in industrial personal computer, is connected by data cable with CCD/COMS to be measured.It is disturbed using the present invention from external light source, additionally it is possible to simulate the test of CCD/CMOS under natural light.
Description
Technical field
The present invention relates to CCD/CMOS detection technique fields, more specifically, are related to a kind of inspection of CCD/CMOS multi-parameters
Examining system.
Background technology
CCD/CMOS is widely used in the fields such as digital photography, aerospace, astrosurveillance, frequency spectrum telescope at present,
Industrial CCD/CMOS is used to measure size, gathers image, detection high temperature.CCD/CMOS can directly convert optical signals into number
Word electric signal realizes acquisition, storage, transmission, processing and the reproduction of image.Its distinguishing feature is：1. small in volume；2. work(
Consume small, operating voltage is low, and shock resistance and vibrations, performance are stablized, long lifespan；3. high sensitivity, noise is low, dynamic range is big；4.
Fast response time has self-scanning function, and pattern distortion is small, no image retention；5. the technology production of application super large-scale integration,
The degree of integration of pixel is high, accurate size, and merchandized handling is at low cost.Therefore, many instruments using optical method for measuring outer diameter,
CCD/CMOS is as photelectric receiver.
But in existing technology, the parameter detecting mode of CCD/CMOS is more complicated, and data parameters are unreliable, inspection
Measured data is single, serious by external environmental interference, does not support a variety of CCD/CMOS output modes, and is unfavorable for the progress of batch
CCD/CMOS parameter detectings.
The content of the invention
In view of the above problems, it is existing to solve the object of the present invention is to provide a kind of CCD/CMOS parameter detecting systems
The parameter detecting mode of CCD/CMOS does not support a variety of CCD/CMOS output modes, the insecure problem of parameter detecting.
CCD/CMOS parameter detecting systems provided by the invention, including：Hardware detection device and control device；Wherein, firmly
Part detection device includes workbench, and integrating sphere and optical dark room are provided on workbench, and the is provided on integrating sphere
One light inlet, the second light inlet, the 3rd light inlet, the first light-emitting window, the second light-emitting window and the 3rd light-emitting window, in the first light inlet
Place is provided with dim light LED light, and attenuator is provided in dim light LED light, and strong light LED light is provided at the second light inlet,
Strong light halogen lamp is provided at 3rd light inlet, the 3rd light-emitting window is located in optical dark room, and mirror is provided at the 3rd light-emitting window
Not rate plate is provided with Zoom regulating mechanism in the indoor bottom of optical dark room, optical lens is provided on Zoom regulating mechanism
Fine adjustment platform and CCD/CMOS fine adjustment fixtures, variable focus lens package is provided on optical lens fine adjustment platform,
Accompany CCD/COMS to be measured on CCD/CMOS fine adjustment fixtures, CCD/COMS to be measured, variable focus lens package and the 3rd light-emitting window
It is in alignment；Be provided in workbench industrial personal computer, intense light irradiation degree meter, dim light illumination photometer, strong light halogen lamp driving power source,
Strong light LED light driving power, CCD/CMOS power supplies and dim light LED light driving power, intense light irradiation degree meter and intense light irradiation degree meter
Probe connection, intense light irradiation degree meter probe are arranged on the first light-emitting window, and dim light illumination photometer is connected with dim light illumination photometer probe, dim light
Illumination photometer probe is arranged on the second light-emitting window, and strong light LED light driving power is electrically connected with strong light LED light, dim light LED and halogen
Optical drive power supply is electrically connected with strong light halogen lamp, and weak LED light and halogen light driving power are electrically connected with dim light LED light, dim light LED
Lamp driving power source is electrically connected with dim light LED light, and CCD/CMOS power supplies are electrically connected with CCD/COMS to be measured；Control device includes
Power-supply controller of electric and multi-function data acquisition card, power-supply controller of electric respectively with industrial personal computer, dim light LED and halogen light driving power, Qiang Guang
LED light driving power is connected with dim light LED light driving power, and multi-function data acquisition card is inserted in industrial personal computer；Industrial personal computer includes data
Processing module, data processing module include for data cable connection data-interface, multi-function data acquisition card by data cable with it is to be measured
CCD/COMS connections.
Furthermore it is preferred that structure be, data-interface include Cameralink camera interfaces, Basler Genlcam
Source camera interfaces, USB2.0 and USB3.0 interfaces.
Additionally, it is preferred that structure be that CCD/CMOS parameter detecting systems further include display, display by video line with
Industrial personal computer connects.
Furthermore preferred structure is, Zoom regulating mechanism is straight line slide unit, and straight line slide unit includes guide rail and is arranged on guide rail
On sliding block, optical lens fine adjustment platform and CCD/CMOS fine adjustment fixtures are separately fixed on sliding block.
Furthermore it is preferred that structure be, optical lens fine adjustment platform include first level mobile platform, in first level
First longitudinal direction mobile platform is provided on mobile platform, the first pitch regulation platform is provided on first longitudinal direction mobile platform,
The first swing offset platform is provided on the first pitch regulation platform.
Additionally, it is preferred that structure be that first level mobile platform and first longitudinal direction mobile platform are straight line slide unit, first
Longitudinal mobile platform and the L-shaped sliding block of first level mobile platform are fixed.
Furthermore preferred structure is, the first pitch regulation platform includes arc groove and arc block, and arc block is in arc groove
It slides, the top surface of arc block is plane, and the first swing offset platform is fixed on the top surface of arc block, and variable focus lens package is fixed on
On first swing offset platform.
Furthermore it is preferred that structure be that CCD/CMOS fine adjustments fixture includes the second horizontal shifting platform, it is horizontal second
Second longitudinal direction mobile platform is provided on mobile platform, the second pitch regulation platform is provided on second longitudinal direction mobile platform,
The second swing offset platform is provided on the second pitch regulation platform.
Additionally, it is preferred that structure be that the second horizontal shifting platform and second longitudinal direction mobile platform are linear platform, second
Longitudinal mobile platform and the L-shaped sliding block of the second horizontal shifting platform are fixed.
Furthermore preferred structure is, the second pitch regulation platform includes arc groove and arc block, and arc block is in arc groove
It slides, the top surface of arc block is plane, and the second swing offset platform is fixed on the top surface of arc block.
Compared with prior art, the present invention can obtain following technique effect：
1st, using dim light LED light, three kinds of light sources of strong light LED light and strong light halogen lamp are corrected with combine analog certainly by spectrum line
Right light adjusts light intensity power, to realize the credibility of CCD/CMOS parameter detectings.
2nd, data processing module support Cameralink camera interfaces, Basler Genlcam Source camera interfaces,
USB2.0 and USB3.0 interfaces can realize a variety of output modes detection of CCD/CMOS.
3rd, optical dark room, it can be achieved that complete dark lower test CCD/CMOS parameter, it is minimum and under dim light LED combination state
Illumination reaches 0.0001lx.
4th, multi-parameter one test function, the present apparatus possess the clarity for measuring CCD/CMOS, sensitivity, frame frequency, leakage frame
The functions such as rate, fault, signal-to-noise ratio, heterogeneity, dynamic range.
5th, optical lens fine adjustment platform and CCD/CMOS fine adjustment fixtures, realization optical lens and CCD/CMOS's
Up and down, around, yaw and pitch regulation, in the 3rd light-emitting window, optical lens and CCD/CMOS premises in alignment
Under, meeting the CCD/CMOS of various resolution ratio expires width measurement request.
Description of the drawings
By reference to the explanation below in conjunction with attached drawing, and with the present invention is more fully understood, of the invention is other
Purpose and result will be more apparent and should be readily appreciated that.In the accompanying drawings：
Fig. 1 is the overall structure diagram according to the CCD/CMOS parameter detecting systems of the embodiment of the present invention；
Fig. 2 is according to the Zoom regulating mechanism of the embodiment of the present invention and optical lens fine adjustment platform, the accurate tune of CCD/CMOS
Save the assembly relation schematic diagram between fixture.
Reference numeral therein includes：1- displays, 2- integrating spheres, 3- optical dark rooms, 4- dim lights LED light, 5- first into
The strong light LED light of optical port, 6- attenuators, 7-, the second light inlets of 8-, 9- halogen light sources, the 3rd light inlets of 10-, 11- intense light irradiation degree meters
Probe, the first light-emitting windows of 12-, the second light-emitting windows of 13-, 14- dim lights illumination photometer probe, 15- resolution charts, the 3rd light-emitting windows of 16-,
17- variable focus lens packages, 18- optical lens fine adjustments platform, 181- first levels mobile platform, the movement of 182- first longitudinal directions are flat
Platform, the first pitch regulations of 183- platform, 1831- arc grooves, 1832- arc blocks, the first swing offsets of 184- platform, 19- are to be measured
CCD/COMS, 20-CCD/CMOS fine adjustment fixture, the second horizontal shifting platforms of 201-, 202- second longitudinal directions mobile platform,
The second pitch regulations of 203- platform, 2031- arc grooves, 2032- arc blocks, the second swing offsets of 204- platform, 21- zooming adjustments
Mechanism, 22- industrial personal computers, 23- intense light irradiation degree meter, 24- dim lights illumination photometer, 25- workbenches, 26- dim lights LED and halogen lamp driving
The strong light LED light driving power of power supply, 27-, 28-CCD/CMOS power supplies.
Specific embodiment
In the following description, for purposes of illustration, in order to provide the comprehensive understanding to one or more embodiments, explain
Many details are stated.It may be evident, however, that these embodiments can also be realized without these specific details.
In other examples, one or more embodiments for ease of description, well known structure and equipment are shown in block form an.
Fig. 1 shows the overall structure of CCD/CMOS parameter detecting systems according to embodiments of the present invention.
As shown in Figure 1, CCD/CMOS parameter detecting systems provided in an embodiment of the present invention, including：Hardware detection device and
Control device；Wherein, hardware detection device includes integrating sphere 2, optical dark room 3 and workbench 25, integrating sphere 2 and optical dark room
3 are arranged on workbench 25.
The first light inlet 5, the second light inlet 8, the 3rd light inlet 10, the first light-emitting window 12, are provided on integrating sphere 2
Two light-emitting windows 13 and the 3rd light-emitting window 16, are provided with dim light LED light 4 at the first light inlet, are provided in dim light LED light 4
Attenuator 6, attenuator 6 play the role of 4 light intensity of dim light LED light that decays, strong light LED light 7 are provided at the second light inlet,
Halogen light source 9 is provided at 3rd light inlet, resolution chart 15 is provided at the 3rd light-emitting window 16, resolution chart 15 is played into
The effect of picture, the present invention is by setting dim light LED light 4, strong light LED light 7 and strong 9 these three light sources of light halogen lamp that can simulate certainly
Right light, to realize the credibility of CCD/CMOS parameter detectings.
The indoor bottom of optical dark room 3 is provided with Zoom regulating mechanism 21, light is provided on Zoom regulating mechanism 21
Learn camera lens fine adjustment platform 18 and CCD/CMOS fine adjustments fixture 20, optical lens fine adjustment platform 18 and CCD/CMOS
Fine adjustment fixture 20 can move on Zoom regulating mechanism 21, and it is saturating to be provided with zoom on optical lens fine adjustment platform 18
Microscope group 17, variable focus lens package 17 are fixed on optical lens fine adjustment platform 18, and pass through optical lens fine adjustment platform 18
It realizes the adjusting of three-dimensional position and three-dimensional perspective, accompanies CCD/COMS19 to be measured on CCD/CMOS fine adjustments fixture 20, treat
It surveys CCD/COMS19 to be fixedly clamped by CCD/CMOS fine adjustments fixture 20, CCD/CMOS fine adjustments fixture 20, which can be realized, to be treated
The three-dimensional position and three-dimensional perspective for surveying CCD/COMS19 are adjusted, CCD/COMS19 to be measured, 17 and the 3rd light-emitting window of variable focus lens package
16 is in alignment, it is therefore intended that variable focus lens package 17 and CCD/CMOS19 to be measured is made to be directed at the 3rd light-emitting window 16, resolution chart
15 imagings inject CCD/CMOS19 to be measured by variable focus lens package 17.
Fig. 2 is according to the Zoom regulating mechanism of the embodiment of the present invention and optical lens fine adjustment platform, CCD/CMOS essences
Assembly relation between close alignment jig.
As shown in Fig. 2, Zoom regulating mechanism 21 is straight line slide unit, straight line slide unit includes guide rail and the cunning being arranged on guide rail
Block, optical lens fine adjustment platform 18 and CCD/CMOS fine adjustments fixture 20 are separately fixed on sliding block, zooming adjustment machine
Structure 21 is used to implement the transverse shifting of optical lens fine adjustment platform 18 and CCD/CMOS fine adjustments fixture 20, that is, realizes and treat
Survey CCD/COMS19 and the whole transverse shifting of variable focus lens package 17.
Optical lens fine adjustment platform 18 includes first level mobile platform 181, on first level mobile platform 181
First longitudinal direction mobile platform 182 is provided with, the first pitch regulation platform 183 is provided on first longitudinal direction mobile platform 182,
The first swing offset platform 184, first level mobile platform 181 and first longitudinal direction are provided on first pitch regulation platform 183
Mobile platform 182 is straight line slide unit, and first longitudinal direction mobile platform 182 and the L-shaped sliding block of first level mobile platform 181 are consolidated
Fixed, variable focus lens package 17 is fixed on the first swing offset platform 184, and it is saturating that the first swing offset platform 184 is used to implement zoom
Microscope group 17 horizontally rotates, and the pitch angle that the first pitch regulation platform 183 is used to implement variable focus lens package 17 is adjusted, and first is vertical
The lift adjustment of variable focus lens package 17 is used to implement to mobile platform 182, it is saturating that first level mobile platform 181 is used to implement zoom
The horizontal displacement of microscope group 17 is adjusted.
First pitch regulation platform 183 includes arc groove 1831 and arc block 1832, and arc block 1832 is in arc groove 1831
Interior slip, the top surface of arc block 1832 is plane, and the first swing offset platform 184 is fixed on the top surface of arc block 1832, is led to
Promotion arc block 1832 is crossed, arc block 1832 is made to be slided in arc groove 1831, so as to fulfill the pitch angle of variable focus lens package 17
Degree is adjusted.
CCD/CMOS fine adjustments fixture 20 includes the second horizontal shifting platform 201, on the second horizontal shifting platform 201
Second longitudinal direction mobile platform 202 is provided with, the second pitch regulation platform 203 is provided on second longitudinal direction mobile platform 202,
The second swing offset platform 204, the second horizontal shifting platform 201 and second longitudinal direction are provided on second pitch regulation platform 203
Mobile platform 202 is linear platform, and second longitudinal direction mobile platform 202 and the L-shaped sliding block of the second horizontal shifting platform 201 are consolidated
Fixed, CCD/COMS19 to be measured is fixed on the second swing offset platform 204, and the second swing offset platform 204 is used to implement to be measured
CCD/COMS19's horizontally rotates, and the pitch angle that the second pitch regulation platform 203 is used to implement CCD/COMS19 to be measured is adjusted,
Second longitudinal direction mobile platform 202 is used to implement the lift adjustment of CCD/COMS19 to be measured, and the second horizontal shifting platform 201 is for real
The horizontal displacement of existing CCD/COMS19 to be measured is adjusted.
Second pitch regulation platform 203 includes arc groove 2031 and arc block 2032, and arc block 2032 is in arc groove 2031
Interior slip, the top surface of arc block 2032 is plane, and the second swing offset platform 204 is fixed on the top surface of arc block 2032, is led to
Promotion arc block 2032 is crossed, arc block 2032 is made to be slided in arc groove 2031, so as to fulfill the pitching of CCD/COMS19 to be measured
Angular adjustment.
Pass through comparison, the structure phase of CCD/CMOS fine adjustments fixture 20 and optical lens fine adjustment platform 18
Together, it is symmetricly set on Zoom regulating mechanism 21, can reduces between the camera lens of variable focus lens package 17 and CCD/COMS19 to be measured
Spacing, for different types of camera, can be adjusted to picture.
Adjusting can be helped dark pattern by optical dark room 3, avoid the detection of external light source interference parameter, can also be changed dark
Indoor temperature, simulation at different temperatures influence the performance parameters of CCD/CMOS19 to be measured.
Industrial personal computer 22, intense light irradiation degree meter 23, dim light illumination photometer 24, dim light LED and halogen are provided in workbench 25
Lamp driving power source 26, strong light LED light driving power 27, CCD/CMOS power supplies 28, the probe 11 of intense light irradiation degree meter 23 with it is weak
The probe 14 of illuminometer 23 is separately positioned on the first light-emitting window 12,13 on the second light-emitting window, and intense light irradiation degree meter 23 is for detecting
Light intensity in integrating sphere in more than 2000lx includes the light intensity of strong light LED7, halogen light source 9 and dim light LED4 combination transmitting；
Light intensity when dim light illumination photometer 24 is used to detect in integrating sphere between 0.0001 ~ 2000lx, including strong light LED7 in relatively low electricity
Flow down the low light intensity of transmitting and the light intensity of dim light LED4 combination transmittings；Strong light LED light driving power 27 is electrically connected with strong light LED light 7
It connects, for powering for strong light LED light 7, dim light LED and halogen lamp driving power source 26 are electrically connected with strong light halogen lamp 9, dim light LED
And halogen lamp driving power source 26 is electrically connected with dim light LED light 4, CCD/CMOS power supplies 22 are electrically connected with CCD/COMS13 to be measured
It connects.
By adjusting the voltage of strong light LED light driving power 27, dim light LED and halogen lamp driving power source 26 and adjustment attenuation
The rotation angle of piece 6 changes the illumination of emergent light.
Control device include power-supply controller of electric and multi-function data acquisition card, power-supply controller of electric respectively with industrial personal computer 22, dim light LED
And halogen lamp driving power source 26, strong light LED light driving power 27, control signal is sent to power-supply controller of electric by industrial personal computer 22,
Opening or closing for dim light LED light 4, strong light LED light 7 and strong light halogen lamp 9 is controlled, multi-function data acquisition card is inserted in industrial personal computer 22.
Industrial personal computer 22 includes data processing module, and data processing module supports Cameralink camera interfaces, Basler
The data-interfaces such as Genlcam Source camera interfaces, USB2.0 and USB3.0 interfaces, data-interface are matched somebody with somebody with corresponding data cable
Set uses, and multi-function data acquisition card is connected by data cable with CCD/COMS13 to be measured, gathers the testing number of CCD/COMS13 to be measured
According to.
CCD/CMOS parameter detecting systems further include display 1, and display 1 is connected by video line with industrial personal computer 22, use
In the processing analysis result for the detection data for showing CCD/COMS13 to be measured.
When the present invention works, first, industrial personal computer 22 is opened, open optical dark room 3, CCD/CMOS19 to be measured is passed through
CCD/CMOS fine adjustments fixture 20 steps up；Then, optical lens fine adjustment platform 18, CCD/CMOS fine adjustments folder are adjusted
Tool 20, Zoom regulating mechanism 21, make CCD/CMOS19 to be measured be located at appropriate test position；Afterwards, optical dark room 3 is closed, is beaten
Dim light LED light 4, strong light LED light 7 or strong light halogen lamp 9 are opened, it is to be measured that industrial personal computer 22 can receive processing analysis with overall-in-one control schema
The detection data of CCD/CMOS19, generation CCD/CMOS parameter detecting reports.
The above description is merely a specific embodiment, but protection scope of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can readily occur in change or replacement, should all contain
Lid is within protection scope of the present invention.Therefore, protection scope of the present invention described should be subject to the protection scope in claims.
Claims (3)
1. a kind of CCD/CMOS parameter detecting systems, which is characterized in that including：Hardware detection device and control device；Wherein,
The hardware detection device includes workbench（25）, in the workbench（25）On be provided with integrating sphere（2）And light
Learn darkroom（3）, in the integrating sphere（2）On be provided with the first light inlet（5）, the second light inlet（8）, the 3rd light inlet（10）、
First light-emitting window（12）, the second light-emitting window（13）With the 3rd light-emitting window（16）, dim light LED is provided at first light inlet
Lamp（4）, in the dim light LED light（4）On be provided with attenuator（6）, in second light inlet（8）Place is provided with strong light LED
Lamp（7）, in the 3rd light inlet（10）Place is provided with strong light halogen lamp（9）, the 3rd light-emitting window（16）Positioned at the light
Learn darkroom（3）It is interior, in the 3rd light-emitting window（16）Place is provided with resolution chart（15）, in the optical dark room（3）Interior
Bottom is provided with Zoom regulating mechanism（21）, in the Zoom regulating mechanism（21）On be provided with optical lens fine adjustment platform
（18）With CCD/CMOS fine adjustment fixtures（20）, in the optical lens fine adjustment platform（18）On be provided with zoom lens
Group（17）, in the CCD/CMOS fine adjustments fixture（20）On accompany CCD/COMS to be measured（19）, the CCD/COMS to be measured
（19）, the variable focus lens package（17）With the 3rd light-emitting window（16）It is in alignment；In the workbench（25）Inside set
It is equipped with industrial personal computer（22）, intense light irradiation degree meter（23）, dim light illumination photometer（24）, strong light halogen lamp driving power source（26）, strong light LED light
Driving power（27）, CCD/CMOS power supplies（28）With dim light LED light driving power（26）, the intense light irradiation degree meter（23）With
The intense light irradiation degree meter probe（11）Connection, the intense light irradiation degree meter probe（11）It is arranged on first light-emitting window（12）On,
The dim light illumination photometer（24）It pops one's head in dim light illumination photometer（14）Connection, the dim light illumination photometer probe（14）It is arranged on described
Two light-emitting windows（13）On, the strong light LED light driving power（27）With the strong light LED light（7）Electrical connection, the dim light LED
And halogen light driving power（26）With the strong light halogen lamp（9）Electrical connection, the weak LED light and halogen light driving power（26）
With the dim light LED light（4）Electrical connection, the dim light LED light driving power（23）With the dim light LED light（4）Electrical connection, institute
State CCD/CMOS power supplies（28）With the CCD/COMS to be measured（19）Electrical connection；
The control device include power-supply controller of electric and multi-function data acquisition card, the power-supply controller of electric respectively with the industrial personal computer
（22）, the dim light LED and halogen light driving power（26）, the strong light LED light driving power（27）With the dim light LED light
Driving power（26）Connection, the multi-function data acquisition card are inserted in the industrial personal computer（22）It is interior；
The industrial personal computer（22）Including data processing module, the data processing module includes connecing for the data of data cable connection
Mouthful, the multi-function data acquisition card passes through the data cable and the CCD/COMS to be measured（19）Connection.
2. CCD/CMOS parameter detecting systems as described in claim 1, which is characterized in that the data-interface includes
Cameralink camera interfaces, Basler Genlcam Source camera interfaces, USB2.0 and USB3.0 interfaces.
3. CCD/CMOS parameter detecting systems as described in claim 1, which is characterized in that further include display（1）, it is described aobvious
Show device（1）Pass through video line and the industrial personal computer（22）Connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810009930.1A CN108076340B (en) | 2018-01-05 | 2018-01-05 | CCD/CMOS parameter detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810009930.1A CN108076340B (en) | 2018-01-05 | 2018-01-05 | CCD/CMOS parameter detection system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108076340A true CN108076340A (en) | 2018-05-25 |
| CN108076340B CN108076340B (en) | 2023-09-01 |
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ID=62156454
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| Application Number | Title | Priority Date | Filing Date |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112799035A (en) * | 2019-11-13 | 2021-05-14 | 浙江舜宇智能光学技术有限公司 | Consistency detection device and method for multi-line laser radar |
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| KR20040095027A (en) * | 2003-05-06 | 2004-11-12 | 김두근 | lighting apparatus which diffuse infrared rays |
| JP2006017689A (en) * | 2004-07-04 | 2006-01-19 | Ccs Inc | Light source device |
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| CN112799035A (en) * | 2019-11-13 | 2021-05-14 | 浙江舜宇智能光学技术有限公司 | Consistency detection device and method for multi-line laser radar |
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| CN108076340B (en) | 2023-09-01 |
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