CN108076340B - CCD/CMOS parameter detection system - Google Patents

CCD/CMOS parameter detection system Download PDF

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Publication number
CN108076340B
CN108076340B CN201810009930.1A CN201810009930A CN108076340B CN 108076340 B CN108076340 B CN 108076340B CN 201810009930 A CN201810009930 A CN 201810009930A CN 108076340 B CN108076340 B CN 108076340B
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light
ccd
cmos
led lamp
platform
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CN108076340A (en
Inventor
谭勇
辛敏思
贾强
赵猛
陈新邑
蔡红星
刘立欣
张赤军
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Changchun University of Science and Technology
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Changchun University of Science and Technology
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps

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  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Studio Devices (AREA)

Abstract

The invention provides a CCD/CMOS parameter detection system, comprising: the hardware detection device comprises a working platform, an integrating sphere and an optical darkroom are arranged on the working platform, three light sources, an illuminometer probe and a light outlet are arranged on the integrating sphere, an identification rate plate is arranged at the light outlet, a zoom adjusting mechanism, an optical lens precise adjusting platform, a CCD/CMOS precise adjusting clamp, a zoom lens group and a CCD/COMS to be tested are arranged in the optical darkroom, and the CCD/COMS to be tested, the zoom lens group and a second light outlet form a straight line; an industrial personal computer, an illuminometer, a driving power supply of three light sources and a CCD/CMOS power supply are arranged in the working platform; the control device comprises a power controller and a multifunctional acquisition card, wherein the power controller is respectively connected with the industrial personal computer and three driving power supplies, and the multifunctional acquisition card is inserted in the industrial personal computer and is connected with the CCD/COMS to be tested through a data line. The invention is not interfered by external light source, and can simulate the testing of CCD/CMOS under natural light.

Description

CCD/CMOS parameter detection system
Technical Field
The invention relates to the technical field of CCD/CMOS detection, in particular to a CCD/CMOS multiparameter detection system.
Background
At present, CCD/CMOS is widely applied in fields of digital photography, aerospace, astronomical detection, spectrum telescope and the like, and is industrially used for measuring size, acquiring images and detecting high temperature. The CCD/CMOS can directly convert the optical signals into digital electric signals, so as to realize the acquisition, storage, transmission, processing and reproduction of the images. The method is characterized in that: 1. the volume is small and the weight is light; 2. the power consumption is low, the working voltage is low, the impact resistance and vibration are realized, the performance is stable, and the service life is long; 3. the sensitivity is high, the noise is low, and the dynamic range is large; 4. the response speed is high, the self-scanning function is realized, the image distortion is small, and no residual image exists; 5. and the pixel is produced by using a very large scale integrated circuit process technology, the pixel integration level is high, the size is accurate, and the commercial production cost is low. Accordingly, many instruments for measuring outer diameters optically use CCD/CMOS as the photo-receiver.
However, in the prior art, the parameter detection mode of the CCD/CMOS is complex, the data parameters are unreliable, the detection data are single, the interference from the external environment is serious, a plurality of CCD/CMOS output modes are not supported, and the batch detection of the CCD/CMOS parameters is not facilitated.
Disclosure of Invention
In view of the above problems, the present invention is to provide a CCD/CMOS parameter detection system, so as to solve the problems that the existing CCD/CMOS parameter detection method does not support multiple CCD/CMOS output modes and the parameter detection is unreliable.
The CCD/CMOS parameter detection system provided by the invention comprises: hardware detection means and control means; the hardware detection device comprises a working platform, an integrating sphere and an optical darkroom are arranged on the working platform, a first light inlet, a second light inlet, a third light inlet, a first light outlet, a second light outlet and a third light outlet are arranged on the integrating sphere, a weak light LED lamp is arranged at the first light inlet, an attenuation sheet is arranged on the weak light LED lamp, a strong light LED lamp is arranged at the second light inlet, a strong light halogen lamp is arranged at the third light inlet, the third light outlet is positioned in the optical darkroom, an identification rate plate is arranged at the third light outlet, a zoom adjustment mechanism is arranged at the indoor bottom of the optical darkroom, an optical lens precise adjustment platform and a CCD/CMOS precise adjustment clamp are arranged on the zoom adjustment mechanism, a CCD/CMOS precise adjustment clamp is clamped with a CCD/COMS to be detected, and the zoom lens group and the third light outlet form a straight line; an industrial personal computer, a strong light illuminometer, a weak light LED lamp and strong light halogen lamp driving power supply, a strong light LED lamp driving power supply and a CCD/CMOS power supply are arranged in the working platform, the strong light illuminometer is connected with a strong light illuminometer probe, the strong light illuminometer probe is arranged on the first light outlet, the weak light illuminometer is connected with the weak light illuminometer probe, the weak light illuminometer probe is arranged on the second light outlet, the strong light LED lamp driving power supply is electrically connected with the strong light LED lamp, the weak light LED lamp and the strong light halogen lamp driving power supply are electrically connected with the weak light LED lamp and the strong light halogen lamp, and the CCD/CMOS power supply is electrically connected with the CCD/COMS to be tested; the control device comprises a power controller and a multifunctional acquisition card, wherein the power controller is respectively connected with the industrial personal computer, the low-light LED lamp, the high-light halogen lamp driving power supply and the high-light LED lamp driving power supply, and the multifunctional acquisition card is inserted into the industrial personal computer; the industrial personal computer comprises a data processing module, wherein the data processing module comprises a data interface for connecting a data line, and the multifunctional acquisition card is connected with the CCD/COMS to be tested through the data line.
Further, the preferred structure is that the data interface includes a Cameralink camera interface, a Basler GenlcamSource camera interface, a USB2.0, and a USB3.0 interface.
In addition, the CCD/CMOS parameter detection system also comprises a display, and the display is connected with the industrial personal computer through a video wire.
Furthermore, the zoom adjusting mechanism is preferably a linear sliding table, the linear sliding table comprises a guide rail and a sliding block arranged on the guide rail, and the optical lens precise adjusting platform and the CCD/CMOS precise adjusting clamp are respectively fixed on the sliding block.
In addition, the optical lens fine adjustment platform preferably comprises a first horizontal movement platform, a first longitudinal movement platform is arranged on the first horizontal movement platform, a first pitching adjustment platform is arranged on the first longitudinal movement platform, and a first rotary displacement platform is arranged on the first pitching adjustment platform.
In addition, the preferred structure is that the first horizontal moving platform and the first longitudinal moving platform are both linear sliding tables, and the first longitudinal moving platform is fixed with an L-shaped sliding block of the first horizontal moving platform.
Furthermore, the preferred structure is that the first pitch adjustment platform includes an arc-shaped groove and an arc-shaped block, the arc-shaped block slides in the arc-shaped groove, the top surface of the arc-shaped block is a plane, the first rotary displacement platform is fixed on the top surface of the arc-shaped block, and the zoom lens group is fixed on the first rotary displacement platform.
In addition, the CCD/CMOS precision adjusting jig preferably includes a second horizontal moving platform on which a second longitudinal moving platform is provided, a second pitch adjusting platform on which a second rotary displacement platform is provided, and a second vertical moving platform on which a second rotary displacement platform is provided.
In addition, the preferred structure is that the second horizontal moving platform and the second longitudinal moving platform are both linear platforms, and the second longitudinal moving platform is fixed with an L-shaped sliding block of the second horizontal moving platform.
Furthermore, the preferred structure is that the second pitch adjustment platform comprises an arc-shaped groove and an arc-shaped block, the arc-shaped block slides in the arc-shaped groove, the top surface of the arc-shaped block is a plane, and the second rotary displacement platform is fixed on the top surface of the arc-shaped block.
Compared with the prior art, the invention can obtain the following technical effects:
1. the three light sources of the weak light LED lamp, the strong light LED lamp and the strong light halogen lamp are adopted, natural light is simulated through spectral line correction and combination, and the intensity of light intensity is regulated, so that the reliability of CCD/CMOS parameter detection is realized.
2. The data processing module supports a camera interface, a Basler Genlcam Source camera interface, a USB2.0 interface and a USB3.0 interface, and can realize detection of multiple output modes of CCD/CMOS.
3. The optical darkroom can realize the testing of the parameters of CCD/CMOS under the full darkness, and the lowest illuminance reaches 0.0001lx under the combined state with the low light LED.
4. The device has the functions of measuring the definition, sensitivity, frame frequency, frame leakage rate, defects, signal-to-noise ratio, non-uniformity, dynamic range and the like of the CCD/CMOS.
5. The optical lens precise adjustment platform and the CCD/CMOS precise adjustment clamp realize the up-down, front-back, left-right, yaw and pitch adjustment of the optical lens and the CCD/CMOS, and meet the CCD/CMOS full-width measurement requirements of various resolutions on the premise that the third light outlet, the optical lens and the CCD/CMOS form a straight line.
Drawings
Other objects and attainments together with a more complete understanding of the invention will become apparent and appreciated by referring to the following description taken in conjunction with the accompanying drawings. In the drawings:
FIG. 1 is a schematic diagram showing the overall structure of a CCD/CMOS parameter detection system according to an embodiment of the present invention;
fig. 2 is a schematic diagram showing an assembly relationship between a zoom adjustment mechanism and an optical lens fine adjustment platform and a CCD/CMOS fine adjustment jig according to an embodiment of the present invention.
Wherein reference numerals include: 1-display, 2-integrating sphere, 3-optical darkroom, 4-dim light LED lamp, 5-first light inlet, 6-attenuation sheet, 7-bright light LED lamp, 8-second light inlet, 9-bright light halogen lamp, 10-third light inlet, 11-bright light illuminometer probe, 12-first light outlet, 13-second light outlet, 14-dim light illuminometer probe, 15-discrimination board, 16-third light outlet, 17-zoom lens group, 18-optical lens precise adjustment platform, 181-first horizontal movement platform, 182-first longitudinal movement platform, 183-first pitching adjustment platform 1831-arc groove, 1832-arc block, 184-first rotary displacement platform, 19-CCD/COMS to be measured, 20-CCD/CMOS precise adjustment clamp, 201-second horizontal movement platform, 202-second longitudinal movement platform, 203-second pitching adjustment platform, 2031-arc groove, 2032-arc block, 204-second rotary displacement platform, 21-zoom adjustment mechanism, 22-industrial personal computer, 23-strong light illuminometer, 24-weak light illuminometer, 25-working platform, 26-weak light LED lamp and strong light halogen lamp driving power supply, 27-strong light LED lamp driving power supply and 28-CCD/CMOS power supply.
Detailed Description
In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident, however, that such embodiment(s) may be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form in order to facilitate describing one or more embodiments.
Fig. 1 shows the overall structure of a CCD/CMOS parameter detection system according to an embodiment of the present invention.
As shown in fig. 1, a CCD/CMOS parameter detection system provided in an embodiment of the present invention includes: hardware detection means and control means; the hardware detection device comprises an integrating sphere 2, an optical darkroom 3 and a working platform 25, wherein the integrating sphere 2 and the optical darkroom 3 are arranged on the working platform 25.
The invention discloses a CCD/CMOS parameter detection device, which comprises an integrating sphere 2, wherein a first light inlet 5, a second light inlet 8, a third light inlet 10, a first light outlet 12, a second light outlet 13 and a third light outlet 16 are formed in the integrating sphere 2, a weak light LED lamp 4 is arranged at the first light inlet, an attenuation sheet 6 is arranged on the weak light LED lamp 4, the attenuation sheet 6 plays a role in attenuating the light intensity of the weak light LED lamp 4, a strong light LED lamp 7 is arranged at the second light inlet, a strong light halogen lamp 9 is arranged at the third light inlet, an identification rate plate 15 is arranged at the third light outlet 16, and the identification rate plate 15 plays an imaging role.
The indoor bottom of the optical darkroom 3 is provided with a zoom adjusting mechanism 21, the zoom adjusting mechanism 21 is provided with an optical lens precise adjusting platform 18 and a CCD/CMOS precise adjusting clamp 20, the optical lens precise adjusting platform 18 and the CCD/CMOS precise adjusting clamp 20 can move on the zoom adjusting mechanism 21, the optical lens precise adjusting platform 18 is provided with a zoom lens group 17, the zoom lens group 17 is fixed on the optical lens precise adjusting platform 18 and realizes three-dimensional position and three-dimensional angle adjustment through the optical lens precise adjusting platform 18, the CCD/CMOS precise adjusting clamp 20 is clamped with a CCD/COMS19 to be detected, the CCD/CMOS precise adjusting clamp 20 can realize three-dimensional position and three-dimensional angle adjustment of the CCD/COMS19 to be detected, the CCD/CMOS19 to be detected and the zoom lens group 17 form a straight line with the third light outlet 16, the aim is to enable the zoom lens group 17 and the CCD/CMOS19 to be detected to be aligned with the third light outlet 16, and an image formed by the identification rate plate 15 is shot into the CCD/CMOS19 to be detected through the zoom lens group 17.
FIG. 2 is an assembly relationship between a zoom adjustment mechanism and an optical lens precision adjustment stage, CCD/CMOS precision adjustment fixture according to an embodiment of the present invention.
As shown in fig. 2, the zoom adjustment mechanism 21 is a linear sliding table, the linear sliding table includes a guide rail and a sliding block disposed on the guide rail, the optical lens precise adjustment platform 18 and the CCD/CMOS precise adjustment fixture 20 are respectively fixed on the sliding block, and the zoom adjustment mechanism 21 is used for realizing lateral movement of the optical lens precise adjustment platform 18 and the CCD/CMOS precise adjustment fixture 20, that is, realizing overall lateral movement of the CCD/CMOS19 to be measured and the zoom lens group 17.
The optical lens precise adjustment platform 18 comprises a first horizontal movement platform 181, a first longitudinal movement platform 182 is arranged on the first horizontal movement platform 181, a first pitching adjustment platform 183 is arranged on the first longitudinal movement platform 182, a first rotary displacement platform 184 is arranged on the first pitching adjustment platform 183, the first horizontal movement platform 181 and the first longitudinal movement platform 182 are both linear sliding tables, the first longitudinal movement platform 182 is fixed with an L-shaped sliding block of the first horizontal movement platform 181, the zoom lens group 17 is fixed on the first rotary displacement platform 184, the first rotary displacement platform 184 is used for realizing horizontal rotation of the zoom lens group 17, the first pitching adjustment platform 183 is used for realizing pitching angle adjustment of the zoom lens group 17, the first longitudinal movement platform 182 is used for realizing lifting adjustment of the zoom lens group 17, and the first horizontal movement platform 181 is used for realizing horizontal displacement adjustment of the zoom lens group 17.
The first pitch adjustment stage 183 includes an arc-shaped groove 1831 and an arc-shaped block 1832, the arc-shaped block 1832 slides in the arc-shaped groove 1831, the top surface of the arc-shaped block 1832 is a plane, and the first rotary displacement stage 184 is fixed on the top surface of the arc-shaped block 1832, and the arc-shaped block 1832 slides in the arc-shaped groove 1831 by pushing the arc-shaped block 1832, so as to realize pitch angle adjustment of the zoom lens group 17.
The CCD/CMOS precision adjusting jig 20 includes a second horizontal moving platform 201, a second longitudinal moving platform 202 is disposed on the second horizontal moving platform 201, a second pitch adjusting platform 203 is disposed on the second longitudinal moving platform 202, a second rotary displacement platform 204 is disposed on the second pitch adjusting platform 203, the second horizontal moving platform 201 and the second longitudinal moving platform 202 are both linear platforms, the second longitudinal moving platform 202 is fixed with an L-shaped slider of the second horizontal moving platform 201, the CCD/CMOS19 to be measured is fixed on the second rotary displacement platform 204, the second rotary displacement platform 204 is used for realizing horizontal rotation of the CCD/CMOS19 to be measured, the second pitch adjusting platform 203 is used for realizing pitch angle adjustment of the CCD/CMOS19 to be measured, the second longitudinal moving platform 202 is used for realizing lifting adjustment of the CCD/CMOS19 to be measured, and the second horizontal moving platform 201 is used for realizing horizontal displacement adjustment of the CCD/CMOS19 to be measured.
The second pitching adjustment platform 203 comprises an arc-shaped groove 2031 and an arc-shaped block 2032, the arc-shaped block 2032 slides in the arc-shaped groove 2031, the top surface of the arc-shaped block 2032 is a plane, the second rotary displacement platform 204 is fixed on the top surface of the arc-shaped block 2032, and the arc-shaped block 2032 slides in the arc-shaped groove 2031 by pushing the arc-shaped block 2032, so that pitching angle adjustment of the CCD/COMS19 to be measured is realized.
By comparison, the CCD/CMOS precise adjustment fixture 20 and the optical lens precise adjustment platform 18 have the same structure and are symmetrically arranged on the zoom adjustment mechanism 21, so that the distance between the lens of the zoom lens group 17 and the CCD/COMS19 to be measured can be reduced, and imaging can be adjusted for different types of cameras.
The optical darkroom 3 can be adjusted to a full darkness mode, so that the detection of interference parameters of an external light source is avoided, the temperature in the darkroom can be changed, and the influence of the parameter performance of the CCD/CMOS19 to be detected at different temperatures is simulated.
The working platform 25 is internally provided with an industrial personal computer 22, a strong light illuminometer 23, a weak light illuminometer 24, a weak light LED lamp, a strong light halogen lamp driving power supply 26, a strong light LED lamp driving power supply 27 and a CCD/CMOS power supply 28, wherein the strong light illuminometer probe 11 and the weak light illuminometer probe 14 are respectively arranged on the first light outlet 12 and the second light outlet 13, the strong light illuminometer 23 is used for detecting the light intensity of an integrating sphere when the light intensity is higher than 2000lx, and the light intensity comprises the light intensity emitted by the combination of the strong light LED lamp 7, the strong light halogen lamp 9 and the weak light LED lamp 4; the dim light illuminometer 24 is used for detecting the light intensity of the integrating sphere between 0.0001 and 2000lx, and comprises the light intensity emitted by the strong light LED lamp 7 under lower current and the light intensity emitted by the dim light LED lamp 4; the strong light LED lamp driving power supply 27 is electrically connected with the strong light LED lamp 7 and is used for supplying power to the strong light LED lamp 7, the weak light LED lamp and the strong light halogen lamp driving power supply 26 are electrically connected with the weak light LED lamp 4 and the strong light halogen lamp 9, and the CCD/CMOS power supply 22 is electrically connected with the CCD/COMS13 to be tested.
The illuminance of the outgoing light is changed by adjusting the voltages of the strong light LED lamp driving power supply 27, the weak light LED lamp, and the strong light halogen lamp driving power supply 26 and adjusting the rotation angle of the attenuation sheet 6.
The control device comprises a power controller and a multifunctional acquisition card, wherein the power controller is respectively connected with the industrial personal computer 22, the low-light LED lamp, the strong-light halogen lamp driving power supply 26 and the strong-light LED lamp driving power supply 27, and sends control signals to the power controller through the industrial personal computer 22 to control the low-light LED lamp 4, the strong-light LED lamp 7 and the strong-light halogen lamp 9 to be opened or closed, and the multifunctional acquisition card is inserted in the industrial personal computer 22.
The industrial personal computer 22 comprises a data processing module, the data processing module supports a data interface such as a camera interface, a BaslerGenlcam Source camera interface, a USB2.0 interface and a USB3.0 interface, the data interface is matched with a corresponding data line for use, and the multifunctional acquisition card is connected with the CCD/COMS13 to be detected through the data line to acquire detection data of the CCD/COMS13 to be detected.
The CCD/CMOS parameter detection system further comprises a display 1, wherein the display 1 is connected with the industrial personal computer 22 through a video line and is used for displaying the processing analysis result of the detection data of the CCD/COMS13 to be detected.
When the invention works, firstly, the industrial personal computer 22 is started, the optical darkroom 3 is opened, and the CCD/CMOS19 to be tested is clamped by the CCD/CMOS precise regulating clamp 20; then, an optical lens precise adjustment platform 18, a CCD/CMOS precise adjustment clamp 20 and a zoom adjustment mechanism 21 are adjusted to enable the CCD/CMOS19 to be detected to be positioned at a proper detection position; and then, the optical darkroom 3 is closed, the dim light LED lamp 4, the bright light LED lamp 7 or the bright light halogen lamp 9 is opened, and the industrial personal computer 22 can integrally control, receive, process and analyze the detection data of the CCD/CMOS19 to be detected, so as to generate a CCD/CMOS parameter detection report.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (3)

1. A CCD/CMOS parameter detection system, comprising: hardware detection means and control means; the hardware detection device comprises a working platform (25), an integrating sphere (2) and an optical darkroom (3) are arranged on the working platform (25), a first light inlet (5), a second light inlet (8), a third light inlet (10), a first light outlet (12), a second light outlet (13) and a third light outlet (16) are arranged on the integrating sphere (2), a weak light LED lamp (4) is arranged at the first light inlet, an attenuation sheet (6) is arranged on the weak light LED lamp (4), a strong light LED lamp (7) is arranged at the second light inlet (8), a strong light halogen lamp (9) is arranged at the third light inlet (10), the third light outlet (16) is arranged in the optical darkroom (3), a discrimination plate (15) is arranged at the third light outlet (16), a zoom adjustment mechanism (21) is arranged at the indoor bottom of the optical darkroom (3), a CCD lens (18) is arranged on a CCD (CMOS) precision adjustment clamp (19), a CCD (18) precision adjustment clamp (CMOS (19) is arranged on the CCD precision adjustment Clamp (CMOS) precision adjustment platform (20), and a CMOS precision adjustment clamp (19) is arranged on the CMOS precision adjustment platform (CMOS precision adjustment clamp (20) to be tested The zoom lens group (17) and the third light outlet (16) form a straight line; an industrial personal computer (22), a strong light illuminometer (23), a weak light illuminometer (24), a weak light LED lamp and strong light halogen lamp driving power supply (26), a strong light LED lamp driving power supply (27) and a CCD/CMOS power supply (28) are arranged in the working platform (25), the strong light illuminometer (23) is connected with a strong light illuminometer probe (11), the strong light illuminometer probe (11) is arranged on the first light outlet (12), the weak light illuminometer (24) is connected with a weak light illuminometer probe (14), the weak light illuminometer probe (14) is arranged on the second light outlet (13), the strong light LED lamp driving power supply (27) is electrically connected with the strong light LED lamp (7), the weak light LED lamp and the strong light halogen lamp driving power supply (26) is electrically connected with the strong light halogen lamp (9) and the weak light LED lamp (4), and the CCD/CMOS power supply (28) is electrically connected with the CCD/COMS (19) to be tested;
the control device comprises a power controller and a multifunctional acquisition card, wherein the power controller is respectively connected with the industrial personal computer (22), the low-light LED lamp, the high-light halogen lamp driving power supply (26) and the high-light LED lamp driving power supply (27), and the multifunctional acquisition card is inserted into the industrial personal computer (22); the industrial personal computer (22) comprises a data processing module, the data processing module comprises a data interface for connecting data wires, and the multifunctional acquisition card is connected with the CCD/COMS (19) to be tested through the data wires.
2. The CCD/CMOS parameter sensing system of claim 1, wherein the data interface comprises a Cameralink camera interface, a Basler Genlcam Source camera interface, a USB2.0, and a USB3.0 interface.
3. The CCD/CMOS parameter detection system according to claim 1, further comprising a display (1), said display (1) being connected to said industrial control computer (22) by means of a video line.
CN201810009930.1A 2018-01-05 2018-01-05 CCD/CMOS parameter detection system Active CN108076340B (en)

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Application Number Priority Date Filing Date Title
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CN108076340B true CN108076340B (en) 2023-09-01

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CN112799035A (en) * 2019-11-13 2021-05-14 浙江舜宇智能光学技术有限公司 Consistency detection device and method for multi-line laser radar

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Publication number Priority date Publication date Assignee Title
KR20040095027A (en) * 2003-05-06 2004-11-12 김두근 lighting apparatus which diffuse infrared rays
JP2006017689A (en) * 2004-07-04 2006-01-19 Ccs Inc Light source device
CN204831751U (en) * 2015-07-29 2015-12-02 合肥埃科光电科技有限公司 Colored camera colour response test of industry and correcting unit
CN206714740U (en) * 2016-10-19 2017-12-08 湖北器长光电股份有限公司 A kind of polarized light source and LCD modulate skin detectors

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040095027A (en) * 2003-05-06 2004-11-12 김두근 lighting apparatus which diffuse infrared rays
JP2006017689A (en) * 2004-07-04 2006-01-19 Ccs Inc Light source device
CN204831751U (en) * 2015-07-29 2015-12-02 合肥埃科光电科技有限公司 Colored camera colour response test of industry and correcting unit
CN206714740U (en) * 2016-10-19 2017-12-08 湖北器长光电股份有限公司 A kind of polarized light source and LCD modulate skin detectors

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