CN108039191A - A kind of memory analog detection method - Google Patents
A kind of memory analog detection method Download PDFInfo
- Publication number
- CN108039191A CN108039191A CN201711381728.3A CN201711381728A CN108039191A CN 108039191 A CN108039191 A CN 108039191A CN 201711381728 A CN201711381728 A CN 201711381728A CN 108039191 A CN108039191 A CN 108039191A
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- China
- Prior art keywords
- memory
- detection method
- analog detection
- embedded software
- region
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The present invention provides a kind of memory analog detection method, is related to data test technical field, a kind of memory analog detection method, comprises the following steps：S1：It is test zone to select at least one region on memory；S2：This region is subjected to invalid flag；S3：Burning embedded software is to the memory；S4：Judge embedded software whether normal operation；If embedded software can be can use with normal operation, memory.A kind of memory analog detection method of the present invention is simple and practical, and test is accurate, can effectively find failure area, and can effectively judge to test whether memory still can use.
Description
Technical field
The present invention relates to data test technical field,
Especially, the present invention relates to a kind of memory analog detection method.
Background technology
Data recording technique is always home and abroad in one of key technologies of area research such as Aeronautics and Astronautics, navigation.It is real
, it is necessary to the high-speed real-time that will be collected in the application of border（Such as high resolution image data）Record in real time so as to thing
Post processing.With gathered data precision raising and recording parameters increase, it is necessary to the data volume recorded sharply increase, data
Transmission rate is also higher and higher.This makes recording equipment become hot spot in the research of real-time, vast capacity, reliability etc.,
This just needs to use various types of memory.
But the data that can not be read and write before occur after long in memory usage time, but it is commonly stored device and does not have
There is damage, only the data of wherein some region write-in can not be read out, it is only necessary to found out the region, carried out no criterion
Note, data so far can not smoothly use memory again in write-in when using memory in region.
But this memory failure area is found without ripe corresponding analog detection method, often memory data
Abnormal no corresponding solution.
The content of the invention
Can be with Validity Test memory whether still it is an object of the invention to overcome the deficiencies of the prior art and provide one kind
It can use, failure area finds accurate memory analog detection method.
The purpose of the present invention is be achieved through the following technical solutions：
A kind of memory analog detection method, comprises the following steps：
S1：It is test zone to select at least one region on memory；
S2：This region is subjected to invalid flag；
S3：Burning embedded software is to the memory；
S4：Judge embedded software whether normal operation；, will if embedded software can be can use with normal operation, memory
This region carries out permanent invalid flag.
Preferably, before performing step S1, data on memory are all wiped.
Preferably, when performing step S2, the data of marked region are written as null value.
Preferably, when performing step S3, during burning embedded software, skip flag region carries out burning.
Preferably, perform step S4 when, if embedded software cannot normal operation, change a regional choice for survey
Region is tried, repeats step S1 to step S4.
Preferably, if all areas make choice mark, embedded software still cannot normal operation, then store
Device thoroughly damages.
Preferably, when performing step S1, selection region is one or more memory blocks.
Preferably, when performing step S4, if embedded software can be with normal operation, and test zone is selected to be deposited to be multiple
Block is stored up, then return to step S1, successively by each block in this region successively selected marker, perform step S1 to step S4.
Preferably, when performing step S1, selection region is a memory block.
Preferably, when performing step S4, if embedded software can be can use with normal operation, memory, this is stored
Block carries out permanent invalid flag.
A kind of memory analog detection method beneficial effect of the present invention is：Simple and practical, test is accurate, can effectively seek
Failure area is looked for, and can effectively judge to test whether memory still can use.
Brief description of the drawings
Fig. 1 is the flow diagram of one embodiment of the invention；
Fig. 2 is another flow diagram of one embodiment of the invention.
Embodiment
It is the specific embodiment of the present invention below, technical scheme is further described, but the present invention is simultaneously
It is not limited to these embodiments.
Carry out the various exemplary embodiments of detailed description of the present invention now with reference to attached drawing.It should be noted that：Unless in addition have
Body illustrates that the module and the positioned opposite and step of step otherwise illustrated in these embodiments does not limit the scope of the invention.
At the same time, it should be appreciated that for the ease of description, the flow in attached drawing is not merely individually to carry out, but multiple steps
The rapid progress that intersects.
Embodiment one：
As shown in Figure 1, 2, be only one of embodiment of the present invention, in order to preferably to the memory that can not work normally into
Row test, and failure area is found rapidly, judge to test whether memory still can use according to this, the present invention proposes a kind of memory
Analog detection method, comprises the following steps：
S1：It is test zone to select at least one region on memory；
Memory is with block（block）For unit, block（block）As long as upper have a page（page）It can not read and write, then whole
Block（block）It is able to not will read and write, a memory that can not be worked normally, it may be possible to quality impairment, it may be possible to some block
Damage, then at least one region on selection memory, can effectively include the damage block of error.
Of course, it is possible to once select a block, the region of multiple pieces of compositions can also be once selected, according on memory
Space size, makes corresponding selection and change.
S2：This region is subjected to invalid flag；
In order to eliminate the bad influence of this damage, the region of mark is subjected to ineffective treatment, it is no longer written and read, that is to say
As there is no this region in memory.
S3：Burning embedded software is to the memory；
In order to test whether memory effectively can carry out data write-in and reading, it is necessary to which write-in can be surveyed clearly on a memory
Examination whether the data that can be read, embedded software is written to memory, and operation embedded software is reading process, convenient letter
It is single.
S4：Judge embedded software whether normal operation；If embedded software can with normal operation, memory
With by the permanent invalid flag of this region progress.
Run embedded software, that is, to memory carry out digital independent, if embedded software can with normal operation,
Illustrate that memory still can illustrate that memory does not have quality or hardware damage with normal read data, be only selected marker
Region in can not carry out normal reading and writing data on some block, this region is subjected to permanent invalid flag, memory
It can recover operative condition again.
Certainly also have another situation, that is, when performing step S4, if embedded software cannot normal operation,
It is test zone that a regional choice should so be changed this when, repeats step S1 to step S4.
There are two kinds of possibility again in the case of this：
The first is possible, and region can be with normal operation as test zone, embedded software once or several times for replacement, then still
Illustrate that memory can use.
Second may, if all areas make choice mark, embedded software remain unchanged cannot normal operation, then
Illustrate it is not factor that memory intra block can not carry out reading and writing data, but this memory thoroughly damages.
It should be noted that the damage of general memory need not carry out the simulation test of too many time, only repeat step
S1 to step S4 is several times it may determine that whether memory can use.
A kind of memory analog detection method of the present invention can effectively and quickly judge whether memory can use, Er Qiecao
Make simple and convenient, be adapted to carry out qualified detection to the old and new's memory.
Embodiment two：
Only one of embodiment of the invention, the above method can effectively find memory failure area, and judge to deposit
Whether reservoir is still available, but during partial memory test, embedded software write-in or other step implementation processes are not enough advised
Model, causes embedded software can not be successfully and is tested, and causes the inconvenience of detection, or even detection error.
Memory is tested using the above method, it is necessary to which data on memory are all wiped before performing step S1.Prevent
Original data and the embedded software data of burning produce interference, the consequence for causing test result to be not allowed in memory.
In the above method, when performing step S2, the data of marked region are written as null value.By the data in the region of mark
All write as 0x00, complete the making of an invalid flag, can not write data in the region of mark, can not also read data.
In the above method, when performing step S3, during burning embedded software, skip flag region carries out burning.
The region of skip flag carries out burning, that is, skips next region that the data in the region are written to the region by the region
In.
, can be when performing step S1 in order to accurately faster carry out bad block lookup, selection region is one
Or multiple memory blocks.
Like that, when performing step S4, if embedded software can be with normal operation, and test zone is selected to be deposited to be multiple
Block is stored up, then return to step S1, successively by each block in this region successively selected marker, perform step S1 to step S4.
In this way, the lookup speed of bad block can be accelerated, one time invalid flag polylith memory block is tested, if looked for
To bad block between this region, then slowly reduce the scope again, the block until finding accurately that damage.
The memory block of this damage is subjected to permanent invalid flag, memory can recover operative condition again.
Certainly, also there is slow, but the test mode of more convenient operation
When exactly performing step S1, selection region is a memory block.Then repeat step S1 to step S4, successively mark one
Memory block is invalid block.
So when performing step S4, if embedded software can be can use with normal operation, memory, by this memory block
Carry out permanent invalid flag.
A kind of memory analog detection method of the present invention is simple and practical, and test is accurate, can effectively find failure area, and
It can effectively judge to test whether memory still can use.
The present invention is not limited to above-mentioned specific embodiment, and the invention may be variously modified and varied.Every foundation
The technical spirit of the present invention should be included in the present invention to embodiment of above any modification, equivalent replacement, improvement and so on
Protection domain.
Claims (10)
1. a kind of memory analog detection method, it is characterised in that comprise the following steps：
S1：It is test zone to select at least one region on memory；
S2：This region is subjected to invalid flag；
S3：Burning embedded software is to the memory；
S4：Judge embedded software whether normal operation；If embedded software can be can use with normal operation, memory.
A kind of 2. memory analog detection method according to claim 1, it is characterised in that：, will before performing step S1
Data are all wiped on memory.
A kind of 3. memory analog detection method according to claim 1, it is characterised in that：When performing step S2, it will mark
The data in note region are written as null value.
A kind of 4. memory analog detection method according to claim 1, it is characterised in that：When performing step S3, burning
During embedded software, skip flag region carries out burning.
A kind of 5. memory analog detection method according to claim 1, it is characterised in that：When performing step S4, if
Embedded software cannot normal operation, then it is test zone to change a regional choice, repeats step S1 to step S4.
A kind of 6. memory analog detection method according to claim 5, it is characterised in that：If all areas carry out
Selected marker, embedded software still cannot normal operation, then memory thoroughly damage.
A kind of 7. memory analog detection method according to claim 1, it is characterised in that：When performing step S1, selection
Region is one or more memory blocks.
A kind of 8. memory analog detection method according to claim 7, it is characterised in that：When performing step S4, if
Embedded software can be with normal operation, and it is multiple memory blocks to select test zone, then return to step S1, every by this region successively
A block selected marker successively, performs step S1 to step S4.
A kind of 9. memory analog detection method according to claim 1, it is characterised in that：When performing step S1, selection
Region is a memory block.
A kind of 10. memory analog detection method according to claim 9, it is characterised in that：When performing step S4, if
Embedded software can be with normal operation, then memory can use, this memory block is carried out permanent invalid flag.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711381728.3A CN108039191A (en) | 2017-12-20 | 2017-12-20 | A kind of memory analog detection method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711381728.3A CN108039191A (en) | 2017-12-20 | 2017-12-20 | A kind of memory analog detection method |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101399075A (en) * | 2007-09-28 | 2009-04-01 | 智多星电子科技有限公司 | Electronic data flash memory card with flash memory bad block management |
| CN101681281A (en) * | 2007-06-07 | 2010-03-24 | 美光科技公司 | Emerging bad block detection |
| CN101727989A (en) * | 2008-10-16 | 2010-06-09 | 付建云 | NAND FLASH memory chip test system |
| US20170148530A1 (en) * | 2014-03-17 | 2017-05-25 | Seagate Technology Llc | Manufacturer self-test for solid-state drives |
| CN107357696A (en) * | 2017-06-22 | 2017-11-17 | 上海斐讯数据通信技术有限公司 | A kind of bad block method of testing of nonvolatile storage and system |
-
2017
- 2017-12-20 CN CN201711381728.3A patent/CN108039191A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101681281A (en) * | 2007-06-07 | 2010-03-24 | 美光科技公司 | Emerging bad block detection |
| CN101399075A (en) * | 2007-09-28 | 2009-04-01 | 智多星电子科技有限公司 | Electronic data flash memory card with flash memory bad block management |
| CN101727989A (en) * | 2008-10-16 | 2010-06-09 | 付建云 | NAND FLASH memory chip test system |
| US20170148530A1 (en) * | 2014-03-17 | 2017-05-25 | Seagate Technology Llc | Manufacturer self-test for solid-state drives |
| CN107357696A (en) * | 2017-06-22 | 2017-11-17 | 上海斐讯数据通信技术有限公司 | A kind of bad block method of testing of nonvolatile storage and system |
Non-Patent Citations (1)
| Title |
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| 郭荣佐: "《嵌入式系统原理》", 31 December 2008, 北京航空航天大学出版社 * |
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Application publication date: 20180515 |