CN108010841B - Method for manufacturing a diode and the resulting diode - Google Patents
Method for manufacturing a diode and the resulting diode Download PDFInfo
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- CN108010841B CN108010841B CN201711248776.5A CN201711248776A CN108010841B CN 108010841 B CN108010841 B CN 108010841B CN 201711248776 A CN201711248776 A CN 201711248776A CN 108010841 B CN108010841 B CN 108010841B
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 24
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000003466 welding Methods 0.000 claims abstract description 80
- 239000013078 crystal Substances 0.000 claims abstract description 49
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims abstract description 39
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims abstract description 26
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims abstract description 26
- 238000005554 pickling Methods 0.000 claims abstract description 24
- 239000002253 acid Substances 0.000 claims abstract description 19
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims abstract description 13
- 229910017604 nitric acid Inorganic materials 0.000 claims abstract description 13
- 238000004140 cleaning Methods 0.000 claims abstract description 10
- 238000002360 preparation method Methods 0.000 claims abstract description 10
- 238000011049 filling Methods 0.000 claims abstract description 5
- 229910000679 solder Inorganic materials 0.000 claims description 42
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 25
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 19
- 239000008367 deionised water Substances 0.000 claims description 19
- 229910021641 deionized water Inorganic materials 0.000 claims description 19
- 229910052710 silicon Inorganic materials 0.000 claims description 19
- 239000010703 silicon Substances 0.000 claims description 19
- 238000005476 soldering Methods 0.000 claims description 16
- 238000005336 cracking Methods 0.000 claims description 15
- 230000003667 anti-reflective effect Effects 0.000 claims description 14
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 12
- 238000003756 stirring Methods 0.000 claims description 12
- 238000005520 cutting process Methods 0.000 claims description 11
- 238000010438 heat treatment Methods 0.000 claims description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 10
- 239000003292 glue Substances 0.000 claims description 8
- 238000001816 cooling Methods 0.000 claims description 7
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 4
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 claims description 3
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 3
- 235000011114 ammonium hydroxide Nutrition 0.000 claims description 3
- 230000004907 flux Effects 0.000 claims description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 3
- 235000021110 pickles Nutrition 0.000 claims description 3
- 239000002994 raw material Substances 0.000 claims description 3
- 239000007921 spray Substances 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen(.) Chemical compound [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims 1
- 239000011148 porous material Substances 0.000 abstract description 10
- 238000004806 packaging method and process Methods 0.000 abstract 1
- 230000008901 benefit Effects 0.000 description 3
- 230000002860 competitive effect Effects 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
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Abstract
本发明公开了一种二极管的制造方法及由此制得的二极管,本发明的制造方法包括二极管晶粒制备、填装、焊接、清洗封装步骤,本发明利用晶粒和焊片在高温下不同的热膨胀系数及形变,焊接前无需提前对正晶粒,即可实现焊接后晶粒自动拉正,气孔面积大大减小,提高焊接质量,经由氢氟酸:醋酸:硫酸:硝酸的体积比=8.8:13:5.6:9.2制得的混合酸酸洗后的晶粒电性良率高。The invention discloses a method for manufacturing a diode and a diode obtained therefrom. The method of the invention includes the steps of diode crystal grain preparation, filling, welding, cleaning and packaging. The coefficient of thermal expansion and deformation, without aligning the grains in advance before welding, the grains can be automatically straightened after welding, the pore area is greatly reduced, and the welding quality is improved. Through the volume ratio of hydrofluoric acid: acetic acid: sulfuric acid: nitric acid = 8.8:13:5.6:9.2 The prepared mixed acid has a high yield rate of grain electrical properties after pickling.
Description
技术领域technical field
本发明属于高压硅堆领域,尤其涉及一种二极管的制造方法及由此制得的二极管。The invention belongs to the field of high-voltage silicon stacks, and in particular relates to a method for manufacturing a diode and the diode produced therefrom.
背景技术Background technique
当前晶粒制造的一般方法是采用整片硅片焊接堆积后再切开的工艺,焊接夹具笨重复杂,并且由于整片硅片在之前扩散工艺造成的形变,大片焊片高温熔化后分布不均匀,导致切割过程破损率高,切开后的小单元还要二次装填以焊接引线,二次焊接造成晶粒二次损伤,焊接次数越多损伤越严重。如上工艺不仅过程复杂,设备庞杂,而且成本高,成品率低(80%左右)。The current general method of grain manufacturing is to use the process of welding and stacking the whole silicon wafer and then cutting it. The welding fixture is bulky and complicated, and due to the deformation caused by the diffusion process of the whole silicon wafer before, the distribution of the large silicon wafer is not uniform after high temperature melting. , leading to a high breakage rate during the cutting process, and the small units after cutting have to be refilled with welding leads. The second welding causes secondary damage to the grains, and the more welding times, the more serious the damage. The above process is not only complicated in process and complex in equipment, but also high in cost and low in yield (about 80%).
一般的晶粒生产,容易导致晶粒的极性反转,极性不一致,因此在焊接之前需要将晶粒的极性进行挑选和验证,这给后续正确的焊接带来极大的麻烦。General grain production can easily lead to polarity reversal and inconsistent polarity. Therefore, the polarity of grains needs to be selected and verified before welding, which brings great trouble to subsequent correct welding.
常规的晶粒焊接,没有人对于焊片与晶粒之间的尺寸比例关系进行详细和认真的研究,因此一直没能对于晶粒焊接的对正问题作出贡献。For conventional grain welding, no one has conducted detailed and serious research on the size ratio relationship between the solder piece and the grain, so it has not been able to contribute to the alignment problem of grain welding.
而且行业内普遍采用硅堆焊接的温度为大于350℃的,在小于350℃的时,会出现焊接不良的情况,当温度达到350℃~380℃才能实现良好的焊接,但高温导致焊接出的硅堆焊接气孔大,气孔面积一般在8~20%,良品率低(小于90%),而且浪费能源。Moreover, the temperature of silicon surfacing welding generally used in the industry is greater than 350°C. When the temperature is less than 350°C, poor welding will occur. When the temperature reaches 350°C to 380°C, good welding can be achieved, but the high temperature leads to welding out. Silicon surfacing welding has large pores, the area of pores is generally 8-20%, the yield rate is low (less than 90%), and energy is wasted.
酸洗是对焊接后的二极管,在上白胶之前进行的一个关键步骤和工艺,用酸洗掉晶粒切割时造成的pn结切割面毛糙,避免酸洗可能导致的表面腐蚀坑,简单有效去除铜、铅等不易冲洗物质,可以提高电性良率,提升酸洗工艺品质。Pickling is a key step and process for soldered diodes before applying white glue. It is simple and effective to remove the roughness of the pn junction cut surface caused by grain cutting and avoid surface corrosion pits that may be caused by pickling. Removing copper, lead and other difficult-to-wash substances can improve the electrical yield and improve the quality of the pickling process.
许多的二极管经常在60℃以上的环境中工作,芯片的结温常常会达到125℃以上,因此,提高产品的高温反偏能力是非常有意义的。用传统工艺生产,它们的高温反偏合格率只能达到60%左右,为使产品更加有竞争优势,产品的质量和高温环境下的可靠性得以提高,提高产品的高温反偏筛选合格率的工艺技术一直没有突破。Many diodes often work in an environment above 60°C, and the junction temperature of the chip often reaches above 125°C. Therefore, it is very meaningful to improve the high temperature reverse bias capability of the product. Produced by traditional technology, their high-temperature reverse-bias pass rate can only reach about 60%. In order to make the product more competitive, the product quality and reliability under high-temperature environment can be improved, and the high-temperature reverse-bias screening pass rate of the product can be improved. There has been no breakthrough in technology.
当前混酸的常规配方,出现部分产品酸洗后表面毛糙,而且会造成相当比例的表面腐蚀坑。In the current conventional formula of mixed acid, the surface of some products is rough after pickling, and a considerable proportion of surface corrosion pits will be caused.
发明内容Contents of the invention
鉴于已有技术存在的缺陷,本发明提供了一种二极管的制造方法及由此制得的二极管,由本发明制作方法生产的二极管反向耐压高,而正向电压小,本发明只需一次装填焊接即可将晶粒通过焊接自动对正,而且焊接气孔面积小,良品率高。本发明的酸洗工艺能够最大程度洗净切割面毛糙,有效避免了酸洗可能导致的表面腐蚀坑,提高了产品的电性良率。In view of the defects in the prior art, the present invention provides a method for manufacturing a diode and the resulting diode. The diode produced by the method of the present invention has a high reverse withstand voltage and a small forward voltage. The present invention only needs one Filling and welding can automatically align the grains through welding, and the area of welding pores is small, and the yield rate is high. The pickling process of the present invention can clean the roughness of the cutting surface to the greatest extent, effectively avoid surface corrosion pits that may be caused by pickling, and improve the electrical yield of products.
本发明要解决的技术问题的技术方案是:The technical scheme of the technical problem to be solved in the present invention is:
一种二极管的制造方法,包括如下步骤:A method of manufacturing a diode, comprising the steps of:
步骤1:二极管晶粒的制备Step 1: Preparation of Diode Die
1.1、在硅晶片的厚度方向预切割,形成不完全切开的方形的二极管晶粒,硅晶片的切割深度为硅晶片总厚度的3/5~4/5。1.1. Pre-cut in the thickness direction of the silicon wafer to form incompletely cut square diode crystal grains. The cutting depth of the silicon wafer is 3/5 to 4/5 of the total thickness of the silicon wafer.
1.2、将在厚度方向预切割的硅晶片N面朝上放在晶粒裂解纸上,切割刀口方向朝上,轻压,使得不完全切开的二极管晶粒完全裂解。1.2. Place the pre-cut silicon wafer in the thickness direction with the N side up on the grain cracking paper, with the cutting edge facing upwards, and press lightly to completely crack the incompletely cut diode grains.
步骤2:装填Step 2: Filling
2.1、将下引线装入下焊接舟。2.1. Put the lower lead into the lower welding boat.
2.2、将焊片放入焊片吸盘,并移入焊接舟,焊片落在引线之上;二极管晶粒放入焊接舟,落在焊片之上,二极管晶粒上放置焊片,在焊接舟表面均匀喷洒助焊剂,最后合上载有上引线的上焊接舟。2.2. Put the solder tab into the solder tab sucker and move it into the soldering boat. The solder tab falls on the lead wire; the diode die is placed in the solder boat and falls on the solder tab. Place the solder tab on the diode die and place it on the solder boat Spray flux evenly on the surface, and finally close the upper soldering boat carrying the upper lead.
二极管晶粒可以任意角度放入,无需刻意调整晶粒放入的角度,焊片放入时也无需刻意调整位。Diode chips can be put in at any angle, and there is no need to deliberately adjust the angle of the chips, and there is no need to deliberately adjust the position when the solder piece is put in.
2.3、焊片大小与方形晶粒大小之间遵循严格的尺寸比例关系,焊片过大,方形晶粒无法拉正,焊片过小,方形晶粒间接触不良,47、55、90、134mil尺寸的方形晶粒分别对应的焊片尺寸为是:Φ1.30mm、厚度0.05mm;Φ1.70mm、厚度0.05mm;Φ2.80mm、厚度0.05mm;Φ3.56mm,厚度0.10mm。2.3. The size of the solder tab and the size of the square grain follow a strict size ratio relationship. If the solder tab is too large, the square grain cannot be straightened. If the solder tab is too small, the contact between the square grains is poor. 47, 55, 90, 134mil The dimensions of the square grains corresponding to the solder pieces are: Φ1.30mm, thickness 0.05mm; Φ1.70mm, thickness 0.05mm; Φ2.80mm, thickness 0.05mm; Φ3.56mm, thickness 0.10mm.
步骤3:焊接Step 3: Soldering
装填好的焊接舟,放入焊接炉进行焊接,形成二极管焊接件,焊接温度和时间为:The loaded welding boat is put into the welding furnace for welding to form a diode welding piece. The welding temperature and time are:
在常温下,以16.5±0.5℃/min的升温斜率加热焊接温度至310~320℃,焊接温度维持时间:5~10min;再以7.0±0.5℃/min的降温斜率降温至70±5℃,最后自然降至室温。At room temperature, heat the welding temperature to 310~320℃ with a heating slope of 16.5±0.5℃/min, and maintain the welding temperature for 5~10min; then cool down to 70±5℃ with a cooling slope of 7.0±0.5℃/min. Finally, let it cool down to room temperature naturally.
步骤4:清洗Step 4: Cleaning
包括如下步骤:Including the following steps:
4.1:用混和酸在常温下对焊接后的二极管焊接件酸洗150秒,然后用去离子水冲洗二极管焊接件60秒。4.1: Use a mixed acid to pickle the diode welded parts after welding at room temperature for 150 seconds, and then rinse the diode welded parts with deionized water for 60 seconds.
4.2:将浓度为85±1%的磷酸:浓度35±1%的双氧水:纯水按照体积比为1:1:3混合搅拌8~10分钟制得酸洗液,将制得的酸洗液加热至60℃,二极管焊接件在此酸洗液中清洗60秒,然后用去离子水冲洗二极管焊接件60秒。4.2: Mix phosphoric acid with a concentration of 85±1%: hydrogen peroxide with a concentration of 35±1%: pure water according to the volume ratio of 1:1:3 and stir for 8 to 10 minutes to obtain a pickling solution. Heating to 60°C, cleaning the diode soldering parts in this pickling solution for 60 seconds, and then rinsing the diode soldering parts with deionized water for 60 seconds.
4.3:将浓度25%~28%的氨水、浓度为35±1%的双氧水和纯水按照体积比为9:1:9比例混合均匀制得酸洗液,使用常温的此酸洗液将二极管焊接件清洗60秒,然后用去离子水冲洗二极管焊接件60秒。4.3: Mix ammonia water with a concentration of 25% to 28%, hydrogen peroxide with a concentration of 35±1%, and pure water in a volume ratio of 9:1:9 to prepare a pickling solution. Use this pickling solution at room temperature to clean the diode The weldment was rinsed for 60 seconds, and then the diode weldment was rinsed with deionized water for 60 seconds.
4.4:清洗后的二极管焊接件在去离子水超声或者兆声清洗3分钟,然后用50~60℃的去离子水冲洗二极管焊接件60秒。4.4: Clean the diode welded parts in deionized water ultrasonically or megasonically for 3 minutes, and then rinse the diode welded parts with 50-60°C deionized water for 60 seconds.
4.5:二极管焊接件放入异丙醇浸泡5~8分钟。4.5: Soak the diode welding parts in isopropanol for 5-8 minutes.
4.6:将二极管焊接件在170~210℃温度下烘干一小时。4.6: Dry the diode weldment at 170-210°C for one hour.
步骤5:对清洗烘干后的二极管焊接件上白胶,然后进行固化,二极管封装成型。Step 5: Apply white glue to the cleaned and dried diode welding parts, and then cure, and the diode is packaged and formed.
更好的,所述步骤3中焊片的组份为:铅:92.5%,锡:5%,银:2.5%。More preferably, the components of the solder sheet in step 3 are: lead: 92.5%, tin: 5%, silver: 2.5%.
更好的,所述步骤3中晶粒在焊接炉加热焊接过程中通以氮气或氢气保护,焊接温度为315℃,焊接温度维持时间为7分钟。More preferably, in the step 3, the crystal grains are protected by nitrogen or hydrogen during heating and welding in a welding furnace, the welding temperature is 315° C., and the welding temperature is maintained for 7 minutes.
更好的,所述步骤4中的混合酸由氢氟酸、醋酸、硫酸和硝酸组成,所述氢氟酸:醋酸:硫酸:硝酸的体积比=8.8:13:5.6:9.2,所述氢氟酸的浓度为48.5~49.5%,醋酸的浓度为99.6~99.9%,硫酸的浓度为97.6~98.6%,硝酸的浓度为67.5~68.5%。Better, the mixed acid in the step 4 is composed of hydrofluoric acid, acetic acid, sulfuric acid and nitric acid, the volume ratio of hydrofluoric acid: acetic acid: sulfuric acid: nitric acid=8.8:13:5.6:9.2, the hydrogen The concentration of hydrofluoric acid is 48.5-49.5%, the concentration of acetic acid is 99.6-99.9%, the concentration of sulfuric acid is 97.6-98.6%, and the concentration of nitric acid is 67.5-68.5%.
更好的,所述混合酸如下步骤制得:Better, the mixed acid is prepared in the following steps:
在温度25±5℃时,按照以下顺序加入原料When the temperature is 25±5℃, add raw materials in the following order
步骤1:在容器中加入浓度为99.6~99.9%的醋酸,然后加入浓度为49±0.05%的氢氟酸,搅拌10~15分钟。Step 1: Add acetic acid with a concentration of 99.6-99.9% into the container, then add hydrofluoric acid with a concentration of 49±0.05%, and stir for 10-15 minutes.
步骤2:再加入浓度为68±0.5%的硝酸,搅拌15分钟。Step 2: Add nitric acid with a concentration of 68±0.5%, and stir for 15 minutes.
步骤3:最后加入浓度为98.1±0.5%的硫酸,混合后搅拌2~3小时。Step 3: Finally add sulfuric acid with a concentration of 98.1±0.5%, mix and stir for 2-3 hours.
更好的,所述步骤4.2、4.3中,使用去离子水的温度为50~60度。More preferably, in the steps 4.2 and 4.3, the temperature of the deionized water used is 50-60 degrees.
更好的,所述步骤1二极管晶粒的制备还包括如下步骤:More preferably, the preparation of the diode grain in step 1 also includes the following steps:
第一、将透明防反罩放置于晶粒裂解纸下方,吸盘开口一侧扣在晶粒裂解纸的二极管晶粒上,然后将透明防反罩、晶粒裂解纸、方形晶粒、吸盘整体水平方向反转,防反罩和晶粒吸盘适当用力夹紧,防止在反转时晶粒相对移动,使得二极管晶粒整体移入吸盘内;吸盘在下,吸盘之上依次为二极管晶粒、晶粒裂解纸和透明防反罩。First, place the transparent anti-reflection cover under the chip cracking paper, buckle the opening side of the suction cup on the diode crystal of the chip cracking paper, and then place the transparent anti-reflection cover, chip cracking paper, square crystal grains, and the suction cup as a whole The horizontal direction is reversed, and the anti-reverse cover and the die suction cup are properly clamped to prevent the relative movement of the die during the reversal, so that the diode die is moved into the suction cup as a whole; the suction cup is below, and the diode die, die Cracked paper and transparent anti-reflection cover.
第二、拿起透明防反罩,移除透明防反罩和晶粒裂解纸,再在方形晶粒上方重新扣上透明防反罩,透明防反罩与晶粒吸盘之间的间距小于二极管晶粒边长,防止晃盘时翻转。Second, pick up the transparent anti-reflective cover, remove the transparent anti-reflective cover and chip cracking paper, and then re-fasten the transparent anti-reflective cover on the square die, the distance between the transparent anti-reflective cover and the chip sucker is smaller than the diode The side of the crystal grain is long to prevent it from turning over when the plate is shaken.
第三、晃动吸盘,吸盘开始吸附二极管晶粒,确保吸盘的每一吸孔都吸附二极管晶粒,并且吸盘的吸孔内二极管晶粒方向一致无反转。Third, shake the suction cup, the suction cup starts to absorb the diode crystal grains, ensure that each suction hole of the suction cup absorbs the diode crystal grains, and the direction of the diode crystal grains in the suction holes of the suction cup is consistent without reversal.
第四、打开真空开关,把吸盘孔的二极管晶粒吸住,多余少量方形晶粒倒出它用。Fourth, turn on the vacuum switch, suck the diode crystal grains in the suction cup hole, and pour out a small amount of square crystal grains for other use.
本发明还公开了一种以上步骤生产的二极管,所述二极管包括两端引线和位于两端引线之间的二极管晶粒,所述二极管晶粒通过焊片焊接与两端引线电性连接,焊接后的二极管晶粒的外围设有保护白胶,所述白胶外围设有塑封环氧树脂层,所述二极管晶粒依权利要求1-7任一进行制造。The invention also discloses a diode produced by the above steps. The diode includes lead wires at both ends and diode crystal grains located between the lead wires at both ends. The diode crystal grains are electrically connected to the lead wires at both ends through welding. The outer periphery of the final diode crystal grain is provided with a protective white glue, and the outer periphery of the white glue is provided with a plastic sealing epoxy resin layer, and the diode crystal grain is manufactured according to any one of claims 1-7.
本发明的优异效果:Excellent effect of the present invention:
1、晶粒生产过程中极性一致,因此在焊接之前无需将晶粒的极性进行挑选和验证,提高了生产效率,保证了产品质量。1. The polarity of the crystal grains is consistent during the production process, so there is no need to select and verify the polarity of the grains before welding, which improves production efficiency and ensures product quality.
2、本发明利用晶粒和焊片在高温下不同的热膨胀系数及形变,焊接前无需提前对正晶粒,按照引线—焊片—晶粒—焊片—引线的顺序装填,可实现焊接后晶粒自动拉正。本发明实现了在310℃~320℃的较低温度下,气孔面积大大减小(气孔面积小于10%),良品率95~100%,有效避免焊接不密集牢固的问题,而且节约了能源。2. The present invention utilizes the different thermal expansion coefficients and deformations of crystal grains and solder tabs at high temperatures. It is not necessary to align the crystal grains in advance before welding, and it is loaded in the order of lead-solder tab-grain-solder tab-lead wire, which can realize post-soldering The grains are automatically straightened. The invention realizes that at a relatively low temperature of 310°C to 320°C, the pore area is greatly reduced (the pore area is less than 10%), and the good product rate is 95% to 100%, effectively avoiding the problem of not dense and firm welding, and saving energy.
3、采用本发明的混合酸用于二极管生产工艺的酸洗步骤,可以实现高性能酸洗,通过提高pn的电性良率,提高产品高温下的可靠性,特别是能够有效改善二极管高温反偏和高温存储两个可靠性指标,产品更加有竞争优势。3. Using the mixed acid of the present invention for the pickling step of the diode production process can realize high-performance pickling, improve the reliability of the product at high temperature by improving the electrical yield of pn, and especially effectively improve the high-temperature reflection of the diode. Bias and high temperature storage are two reliability indicators, and the product has a more competitive advantage.
具体实施方式Detailed ways
以下通过特定的具体实施例说明本发明的技术内容,本领域的技术人员可由本说明书揭示的内容轻易地了解本发明的其它优点和功效。本发明亦可通过其它不同的具体实施例加以施行或应用,本说明书中的各项细节亦可基于不同的观点和应用,在不违背本发明的精神下进行各种修饰和变更。The technical content of the present invention is described below through specific specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
一种二极管的制造方法,包括如下步骤:A method of manufacturing a diode, comprising the steps of:
步骤1:二极管晶粒的制备Step 1: Preparation of Diode Die
1.1、在硅晶片的厚度方向预切割,形成不完全切开的方形的二极管晶粒,硅晶片的切割深度为硅晶片总厚度的3/5~4/5。1.1. Pre-cut in the thickness direction of the silicon wafer to form incompletely cut square diode crystal grains. The cutting depth of the silicon wafer is 3/5 to 4/5 of the total thickness of the silicon wafer.
1.2、将在厚度方向预切割的硅晶片N面朝上放在晶粒裂解纸上,切割刀口方向朝上,轻压,使得不完全切开的二极管晶粒完全裂解。1.2. Place the pre-cut silicon wafer in the thickness direction with the N side up on the grain cracking paper, with the cutting edge facing upwards, and press lightly to completely crack the incompletely cut diode grains.
步骤2:装填Step 2: Filling
2.1、将下引线装入下焊接舟。2.1. Put the lower lead into the lower welding boat.
2.2、将焊片放入焊片吸盘,并移入焊接舟,焊片落在引线之上;二极管晶粒放入焊接舟,落在焊片之上,二极管晶粒上放置焊片,在焊接舟表面均匀喷洒助焊剂,最后合上载有上引线的上焊接舟。2.2. Put the solder tab into the solder tab sucker and move it into the soldering boat. The solder tab falls on the lead wire; the diode die is placed in the solder boat and falls on the solder tab. Place the solder tab on the diode die and place it on the solder boat Spray flux evenly on the surface, and finally close the upper soldering boat carrying the upper lead.
二极管晶粒可以任意角度放入,无需刻意调整晶粒放入的角度,焊片放入时也无需刻意调整位。Diode chips can be put in at any angle, and there is no need to deliberately adjust the angle of the chips, and there is no need to deliberately adjust the position when the solder piece is put in.
2.3、焊片大小与方形晶粒大小之间遵循严格的尺寸比例关系,焊片过大,方形晶粒无法拉正,焊片过小,方形晶粒间接触不良,47、55、90、134mil尺寸的方形晶粒分别对应的焊片尺寸为是:Φ1.30mm、厚度0.05mm;Φ1.70mm、厚度0.05mm;Φ2.80mm、厚度0.05mm;Φ3.56mm,厚度0.10mm。2.3. The size of the solder tab and the size of the square grain follow a strict size ratio relationship. If the solder tab is too large, the square grain cannot be straightened. If the solder tab is too small, the contact between the square grains is poor. 47, 55, 90, 134mil The dimensions of the square grains corresponding to the solder pieces are: Φ1.30mm, thickness 0.05mm; Φ1.70mm, thickness 0.05mm; Φ2.80mm, thickness 0.05mm; Φ3.56mm, thickness 0.10mm.
步骤3:焊接Step 3: Soldering
装填好的焊接舟,放入焊接炉进行焊接,形成二极管焊接件,焊接温度和时间为:The loaded welding boat is put into the welding furnace for welding to form a diode welding piece. The welding temperature and time are:
在常温下,以16.5±0.5℃/min的升温斜率加热焊接温度至310~320℃,焊接温度维持时间:5~10min;再以7.0±0.5℃/min的降温斜率降温至70±5℃,最后自然降至室温。At room temperature, heat the welding temperature to 310~320℃ with a heating slope of 16.5±0.5℃/min, and maintain the welding temperature for 5~10min; then cool down to 70±5℃ with a cooling slope of 7.0±0.5℃/min. Finally, let it cool down to room temperature naturally.
一种较佳的实施例为,所述步骤4中晶粒在焊接炉加热焊接过程中通以氮气或氢气保护,焊接温度为焊接炉加热区缓冲区及降温区的结构比例,是实现低温焊接的关键。优选的,可选焊接炉11m长,加热区长度3.4m,缓冲区长度1m,其余是降温区。并且,所述焊接炉两端设有上下对应氮气风帘,氮气流量都是1.2立方米/h,加热区氮气流量是4立方米/h。A preferred embodiment is that in the step 4, the crystal grains are protected by nitrogen or hydrogen during the heating and welding process of the welding furnace. key. Preferably, the length of the optional welding furnace is 11m, the length of the heating zone is 3.4m, the length of the buffer zone is 1m, and the rest is the cooling zone. Moreover, the two ends of the welding furnace are provided with nitrogen air curtains corresponding to the upper and lower sides, the nitrogen flow rate is 1.2 cubic meters/h, and the nitrogen flow rate in the heating zone is 4 cubic meters/h.
目前在半导体制造行业中,绝大多数使用隧道式焊接炉完成半导体材料与引线焊接工作,在焊接过程中其焊接温度范围和降温阶段的温度变化速率、精度均会对后续成品质量造成无法弥补的影响。现有工艺中一般控制焊接温度控制在350~380℃,降温速率控制不精确,或开炉初期降温速率存在一些失控现象,会直接影响了成品质量。另外,高温导致焊接出的硅堆焊接气孔大,气孔面积一般在8~20%,良品率低(小于90%),而且浪费能源,现有技术如果温度低于350℃,会出现焊接不良。At present, in the semiconductor manufacturing industry, most of the semiconductor materials and lead wires are welded using tunnel-type welding furnaces. During the welding process, the welding temperature range and the temperature change rate and accuracy in the cooling stage will cause irreparable damage to the quality of subsequent products. influences. In the existing process, the welding temperature is generally controlled at 350-380°C, and the cooling rate is not controlled accurately, or there are some out-of-control phenomena in the cooling rate at the initial stage of furnace opening, which will directly affect the quality of the finished product. In addition, the high temperature leads to large pores in the welded silicon surfacing, and the pore area is generally 8-20%, the yield rate is low (less than 90%), and energy is wasted. If the temperature is lower than 350°C in the prior art, poor welding will occur.
采用如上本发明所述的温控曲线,可在310℃~320℃的较低温度下实现焊接,气孔面积大大减小(气孔面积小于10%),良品率95~100%,有效避免焊接不密集牢固的问题,而且节约了能源。优选的,焊接温度为315℃,焊接温度维持时间为7分钟。Using the temperature control curve as described in the present invention, welding can be realized at a relatively low temperature of 310°C to 320°C, the pore area is greatly reduced (the pore area is less than 10%), and the good product rate is 95% to 100%, effectively avoiding welding failure. Intensive solid problem, but also saves energy. Preferably, the welding temperature is 315° C., and the holding time of the welding temperature is 7 minutes.
步骤4:清洗Step 4: Cleaning
包括如下步骤:Including the following steps:
4.1:用混和酸在常温下对焊接后的二极管焊接件酸洗150秒,然后用去离子水冲洗二极管焊接件60秒。4.1: Use a mixed acid to pickle the diode welded parts after welding at room temperature for 150 seconds, and then rinse the diode welded parts with deionized water for 60 seconds.
4.2:将浓度为85±1%的磷酸:浓度35±1%的双氧水:纯水按照体积比为1:1:3混合搅拌8~10分钟制得酸洗液,将制得的酸洗液加热至60℃,二极管焊接件在此酸洗液中清洗60秒,然后用去离子水冲洗二极管焊接件60秒。更好的,使用去离子水的温度为50~60度。4.2: Mix phosphoric acid with a concentration of 85±1%: hydrogen peroxide with a concentration of 35±1%: pure water according to the volume ratio of 1:1:3 and stir for 8 to 10 minutes to obtain a pickling solution. Heating to 60°C, cleaning the diode soldering parts in this pickling solution for 60 seconds, and then rinsing the diode soldering parts with deionized water for 60 seconds. More preferably, the temperature of the deionized water used is 50-60 degrees.
4.3:将浓度25%~28%的氨水、浓度为35±1%的双氧水和纯水按照体积比为9:1:9比例混合均匀制得酸洗液,使用常温的此酸洗液将二极管焊接件清洗60秒,然后用去离子水冲洗二极管焊接件60秒。更好的,使用去离子水的温度为50~60度。4.3: Mix ammonia water with a concentration of 25% to 28%, hydrogen peroxide with a concentration of 35±1%, and pure water in a volume ratio of 9:1:9 to prepare a pickling solution. Use this pickling solution at room temperature to clean the diode The weldment was rinsed for 60 seconds, and then the diode weldment was rinsed with deionized water for 60 seconds. More preferably, the temperature of the deionized water used is 50-60 degrees.
4.4:清洗后的二极管焊接件在去离子水超声或者兆声清洗3分钟,然后用50~60℃的去离子水冲洗二极管焊接件60秒。4.4: Clean the diode welded parts in deionized water ultrasonically or megasonically for 3 minutes, and then rinse the diode welded parts with 50-60°C deionized water for 60 seconds.
4.5:二极管焊接件放入异丙醇浸泡5~8分钟。4.5: Soak the diode welding parts in isopropanol for 5-8 minutes.
4.6:将二极管焊接件在170~210℃温度下烘干1小时。4.6: Dry the diode weldment at 170-210°C for 1 hour.
洗净的标准是污染粒子不影响二极管电性。The cleaning standard is that the pollutant particles do not affect the diode electrical properties.
经过上述酸洗的二极管焊接件,pn结周边光洁,有质感,可以提高电性良率的指标,此外,采用本发明所述的混合酸和基于该混合酸的二极管清洗方法,使用77支二极管做高温反偏实验,实测采用本发明所述的混合酸和基于该混合酸的二极管清洗方法生产的77支二极管,没有出现失效的情况。After the above-mentioned acid-washed diode welded parts, the periphery of the pn junction is smooth and has texture, which can improve the index of electrical yield. In addition, using the mixed acid of the present invention and the diode cleaning method based on the mixed acid, 77 diodes are used A high-temperature reverse bias experiment was carried out, and 77 diodes produced by using the mixed acid of the present invention and the diode cleaning method based on the mixed acid were measured, and no failure occurred.
步骤5:对清洗烘干后的二极管焊接件上白胶,然后进行固化,二极管封装成型。Step 5: Apply white glue to the cleaned and dried diode welding parts, and then cure, and the diode is packaged and formed.
所述步骤5中的混合酸由氢氟酸、醋酸、硫酸和硝酸组成,所述氢氟酸:醋酸:硫酸:硝酸的体积比=8.8:13:5.6:9.2,所述氢氟酸的浓度为48.5~49.5%,醋酸的浓度为99.6~99.9%,硫酸的浓度为97.6~98.6%,硝酸的浓度为67.5~68.5%。The mixed acid in described step 5 is made up of hydrofluoric acid, acetic acid, sulfuric acid and nitric acid, described hydrofluoric acid: acetic acid: sulfuric acid: the volume ratio of nitric acid=8.8:13:5.6:9.2, the concentration of described hydrofluoric acid 48.5-49.5%, the concentration of acetic acid is 99.6-99.9%, the concentration of sulfuric acid is 97.6-98.6%, and the concentration of nitric acid is 67.5-68.5%.
上述用于对二极管焊接件进行酸洗的混和酸,具有优异的效果,采用本发明的混合酸用于二极管生产工艺的酸洗步骤,可以实现高性能酸洗,通过提高pn的电性良率,进而提高产品质量,节约劳动成本。同时,经混和酸酸洗的二极管焊接件,能够提高二极管焊接件产品高温下的可靠性,特别是能够有效改善二极管高温反偏和高温存储两个可靠性指标,产品更加有竞争优势。The above-mentioned mixed acid used for pickling the diode welded parts has excellent effect, and the mixed acid of the present invention is used in the pickling step of the diode production process, which can realize high-performance pickling, by improving the electrical yield of pn , thereby improving product quality and saving labor costs. At the same time, the diode welded parts pickled by mixed acid can improve the reliability of diode welded parts at high temperature, especially the two reliability indicators of high temperature reverse bias and high temperature storage of diodes can be effectively improved, and the product has more competitive advantages.
下面详述上述混和酸的配比和制作步骤。The proportioning and preparation steps of the above-mentioned mixed acid are described in detail below.
在温度25±5℃时,按照以下顺序加入原料When the temperature is 25±5℃, add raw materials in the following order
步骤1:在容器中加入浓度为99.6~99.9%的醋酸,然后加入浓度为49±0.05%的氢氟酸,搅拌10~15分钟。Step 1: Add acetic acid with a concentration of 99.6-99.9% into the container, then add hydrofluoric acid with a concentration of 49±0.05%, and stir for 10-15 minutes.
步骤2:再加入浓度为68±0.5%的硝酸,搅拌15分钟。Step 2: Add nitric acid with a concentration of 68±0.5%, and stir for 15 minutes.
步骤3:最后加入浓度为98.1±0.5%的硫酸,混合后搅拌2~3小时。Step 3: Finally add sulfuric acid with a concentration of 98.1±0.5%, mix and stir for 2-3 hours.
常规的二极管晶粒制造过程中,二极管晶粒可能混为一团,不便区分晶粒的极性,进而可能影响产品质量,降低生产效率,因此本发明还公开了二极管晶粒的制备的创新性的步骤。上述步骤中,是对二极管晶粒的制备的粗略概况步骤,更加细节的步骤还有如下的几个步骤,优选的几个细节步骤如下:In the conventional manufacturing process of diode crystal grains, the diode crystal grains may be mixed together, which is inconvenient to distinguish the polarity of the crystal grains, which may affect product quality and reduce production efficiency. Therefore, the invention also discloses the innovativeness of the preparation of diode crystal grains A step of. In the above steps, it is a rough overview of the preparation of the diode crystal grains. The more detailed steps include the following steps, and the preferred several detailed steps are as follows:
更好的,所述步骤1二极管晶粒的制备还包括如下步骤:More preferably, the preparation of the diode grain in step 1 also includes the following steps:
1、将透明防反罩放置于晶粒裂解纸下方,吸盘开口一侧扣在晶粒裂解纸的二极管晶粒上,然后将透明防反罩、晶粒裂解纸、方形晶粒、吸盘整体水平方向反转,防反罩和晶粒吸盘适当用力夹紧,防止在反转时晶粒相对移动,使得二极管晶粒整体移入吸盘内;吸盘在下,吸盘之上依次为二极管晶粒、晶粒裂解纸和透明防反罩,1. Place the transparent anti-reflection cover under the crystal cracking paper, buckle the opening side of the suction cup on the diode crystal of the crystal cracking paper, and then place the transparent anti-reflection cover, crystal cracking paper, square crystal grains, and suction cups in an overall level The direction is reversed, and the anti-reverse cover and the die sucker are properly clamped to prevent the relative movement of the die during the reversal, so that the diode die is moved into the sucker as a whole; paper and transparent anti-reflective cover,
2、拿起透明防反罩,移除透明防反罩和晶粒裂解纸,再在方形晶粒上方重新扣上透明防反罩,透明防反罩与晶粒吸盘之间的间距小于二极管晶粒边长,防止晃盘时翻转,2. Pick up the transparent anti-reflective cover, remove the transparent anti-reflective cover and chip cracking paper, and then re-fasten the transparent anti-reflective cover on the square die. The distance between the transparent anti-reflective cover and the die sucker is smaller than that of the diode crystal The side of the grain is long to prevent turning over when the plate is shaken,
3、晃动吸盘,吸盘开始吸附二极管晶粒,确保吸盘的每一吸孔都吸附二极管晶粒,并且吸盘的吸孔内二极管晶粒方向一致无反转;3. Shake the suction cup, the suction cup starts to absorb the diode crystal grains, ensure that each suction hole of the suction cup absorbs the diode crystal grains, and the direction of the diode crystal grains in the suction holes of the suction cup is consistent without reversal;
4、打开真空开关,把吸盘孔的二极管晶粒吸住,多余少量方形晶粒倒出它用。4. Turn on the vacuum switch, suck the diode grains in the suction cup hole, and pour out a small amount of square grains for other use.
采用如上的完善步骤,可以保证晶粒的生产极性一致,减少后续不必要的麻烦,使得晶粒生产节约人力成本和提高正确率。Using the above perfect steps can ensure that the production polarity of the grains is consistent, reduce unnecessary troubles in the follow-up, and save labor costs and improve the accuracy rate of grain production.
本发明还公开了一种以上步骤生产的二极管,所述二极管包括两端引线和位于两端引线之间的二极管晶粒,所述二极管晶粒通过焊片焊接与两端引线电性连接,焊接后的二极管晶粒的外围设有保护白胶,所述白胶外围设有塑封环氧树脂层,所述二极管晶粒依权利要求1-7任一进行制造。The invention also discloses a diode produced by the above steps. The diode includes lead wires at both ends and diode crystal grains located between the lead wires at both ends. The diode crystal grains are electrically connected to the lead wires at both ends by welding. The outer periphery of the final diode crystal grain is provided with a protective white glue, and the outer periphery of the white glue is provided with a plastic sealing epoxy resin layer, and the diode crystal grain is manufactured according to any one of claims 1-7.
尽管已经示出和描述了本发明的实施例,本领域的普通技术人员可以理解:在不脱离本发明的原理和宗旨的情况下可以对这些实施例进行多种变化、修改、替换和变型,本发明的范围由权利要求及其等同物限定。Although the embodiments of the present invention have been shown and described, those skilled in the art can understand that various changes, modifications, substitutions and modifications can be made to these embodiments without departing from the principle and spirit of the present invention. The scope of the invention is defined by the claims and their equivalents.
Claims (7)
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