CN108010832B - SiGe材料及其制备方法 - Google Patents
SiGe材料及其制备方法 Download PDFInfo
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- CN108010832B CN108010832B CN201711243402.4A CN201711243402A CN108010832B CN 108010832 B CN108010832 B CN 108010832B CN 201711243402 A CN201711243402 A CN 201711243402A CN 108010832 B CN108010832 B CN 108010832B
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- 239000000463 material Substances 0.000 title claims abstract description 44
- 229910000577 Silicon-germanium Inorganic materials 0.000 title claims abstract description 30
- 238000002360 preparation method Methods 0.000 title abstract description 9
- 239000000758 substrate Substances 0.000 claims abstract description 58
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 24
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000010703 silicon Substances 0.000 claims abstract description 22
- 238000002425 crystallisation Methods 0.000 claims abstract description 9
- 230000008025 crystallization Effects 0.000 claims abstract description 9
- 239000010410 layer Substances 0.000 claims description 88
- 238000000034 method Methods 0.000 claims description 66
- 229910006990 Si1-xGex Inorganic materials 0.000 claims description 34
- 229910007020 Si1−xGex Inorganic materials 0.000 claims description 34
- 230000008569 process Effects 0.000 claims description 31
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 19
- 239000011241 protective layer Substances 0.000 claims description 15
- 238000000151 deposition Methods 0.000 claims description 12
- 229910052681 coesite Inorganic materials 0.000 claims description 11
- 229910052906 cristobalite Inorganic materials 0.000 claims description 11
- 239000000377 silicon dioxide Substances 0.000 claims description 11
- 229910052682 stishovite Inorganic materials 0.000 claims description 11
- 229910052905 tridymite Inorganic materials 0.000 claims description 11
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 9
- 230000008021 deposition Effects 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 4
- 239000013077 target material Substances 0.000 claims description 4
- 238000001312 dry etching Methods 0.000 claims description 3
- 230000005764 inhibitory process Effects 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 claims 1
- 238000001953 recrystallisation Methods 0.000 abstract description 25
- 238000005516 engineering process Methods 0.000 abstract description 9
- 239000010408 film Substances 0.000 description 7
- 230000008901 benefit Effects 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 230000003746 surface roughness Effects 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 229910052732 germanium Inorganic materials 0.000 description 3
- 238000005499 laser crystallization Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000004377 microelectronic Methods 0.000 description 3
- 238000002679 ablation Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000011031 large-scale manufacturing process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H01L21/02675—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using laser beams
- H01L21/02683—Continuous wave laser beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02694—Controlling the interface between substrate and epitaxial layer, e.g. by ion implantation followed by annealing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/161—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table including two or more of the elements provided for in group H01L29/16, e.g. alloys
- H01L29/165—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table including two or more of the elements provided for in group H01L29/16, e.g. alloys in different semiconductor regions, e.g. heterojunctions
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201711243402.4A CN108010832B (zh) | 2017-11-30 | 2017-11-30 | SiGe材料及其制备方法 |
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CN201711243402.4A CN108010832B (zh) | 2017-11-30 | 2017-11-30 | SiGe材料及其制备方法 |
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CN108010832A CN108010832A (zh) | 2018-05-08 |
CN108010832B true CN108010832B (zh) | 2020-10-30 |
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CN201711243402.4A Expired - Fee Related CN108010832B (zh) | 2017-11-30 | 2017-11-30 | SiGe材料及其制备方法 |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85103942A (zh) * | 1985-05-16 | 1986-12-24 | 中国科学院上海冶金所 | 绝缘层上多晶硅的激光加热再结晶方法 |
US5225371A (en) * | 1992-03-17 | 1993-07-06 | The United States Of America As Represented By The Secretary Of The Navy | Laser formation of graded junction devices |
DE19839718A1 (de) * | 1998-09-01 | 2000-03-02 | Strunk Horst P | Kristallisation von Halbleiterschichten mit gepulster Laserstrahlung durch Belichtung mit einer Zweistrahlmethode |
CN107046086A (zh) * | 2017-05-17 | 2017-08-15 | 厦门科锐捷半导体科技有限公司 | 发光二极管 |
CN206610820U (zh) * | 2016-12-30 | 2017-11-03 | 陕西学前师范学院 | GaAs单结太阳能电池 |
CN206650094U (zh) * | 2016-12-30 | 2017-11-17 | 西安科锐盛创新科技有限公司 | GaInP2/GaAs/Ge三结太阳能电池 |
-
2017
- 2017-11-30 CN CN201711243402.4A patent/CN108010832B/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85103942A (zh) * | 1985-05-16 | 1986-12-24 | 中国科学院上海冶金所 | 绝缘层上多晶硅的激光加热再结晶方法 |
US5225371A (en) * | 1992-03-17 | 1993-07-06 | The United States Of America As Represented By The Secretary Of The Navy | Laser formation of graded junction devices |
DE19839718A1 (de) * | 1998-09-01 | 2000-03-02 | Strunk Horst P | Kristallisation von Halbleiterschichten mit gepulster Laserstrahlung durch Belichtung mit einer Zweistrahlmethode |
CN206610820U (zh) * | 2016-12-30 | 2017-11-03 | 陕西学前师范学院 | GaAs单结太阳能电池 |
CN206650094U (zh) * | 2016-12-30 | 2017-11-17 | 西安科锐盛创新科技有限公司 | GaInP2/GaAs/Ge三结太阳能电池 |
CN107046086A (zh) * | 2017-05-17 | 2017-08-15 | 厦门科锐捷半导体科技有限公司 | 发光二极管 |
Non-Patent Citations (2)
Title |
---|
C. Y. Ong 等.Laser annealing induced high Ge concentration epitaxial SiGe layer.《APPLIED PHYSICS LETTERS》.2008,(第93期),1-3页. * |
Laser annealing induced high Ge concentration epitaxial SiGe layer;C. Y. Ong 等;《APPLIED PHYSICS LETTERS》;20081231(第93期);第1-3页 * |
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Effective date of registration: 20200930 Address after: 343000 Industrial Park West area of Ji'an County, Ji'an City, Jiangxi Province (within Dafeng Industrial Co., Ltd.) Applicant after: Ji'an Grade Environmental Protection Technology Co.,Ltd. Address before: 710065 No. 86 Leading Times Square (Block B), No. 2, Building No. 1, Unit 22, Room 12202, No. 51, High-tech Road, Xi'an High-tech Zone, Shaanxi Province Applicant before: XI'AN CREATION KEJI Co.,Ltd. |
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