CN107966277A - Nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank - Google Patents
Nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank Download PDFInfo
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- CN107966277A CN107966277A CN201711341523.2A CN201711341523A CN107966277A CN 107966277 A CN107966277 A CN 107966277A CN 201711341523 A CN201711341523 A CN 201711341523A CN 107966277 A CN107966277 A CN 107966277A
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- 238000005259 measurement Methods 0.000 title claims abstract description 80
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- 238000010168 coupling process Methods 0.000 claims description 16
- 238000005859 coupling reaction Methods 0.000 claims description 16
- 238000003384 imaging method Methods 0.000 claims description 11
- 238000001228 spectrum Methods 0.000 claims description 11
- 239000013307 optical fiber Substances 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 7
- 230000004313 glare Effects 0.000 claims description 5
- 230000031700 light absorption Effects 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 9
- 238000005516 engineering process Methods 0.000 abstract description 4
- 230000002123 temporal effect Effects 0.000 abstract description 4
- 238000013461 design Methods 0.000 abstract description 2
- 238000011160 research Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 5
- 230000004927 fusion Effects 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 230000009897 systematic effect Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
- Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
- Y02A90/10—Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation
Abstract
The invention belongs to field of optical measuring technologies, and in particular to a kind of nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank.The measuring system includes sampler and measuring device, and sampler includes spherical vacuum target chamber and sampling diaphragm, target spot and ellipsoid diffusing reflection blank are provided with spherical vacuum target chamber；The nearly back-scattering light that target practice laser light incident target spot produces produces diffusing reflection along after the scattering of target practice opposite direction by ellipsoid diffusing reflection blank, enters measuring device after the sampled diaphragm sampling that diffuses；Target spot is located in a focus of ellipsoid diffusing reflection blank, and sampling diaphragm center is located in another focus of ellipsoid diffusing reflection blank.The present invention is using the diffusing reflection blank with ellipsoid type as scattering surface, eliminate the system time error introduced by scattering surface diffusing reflection, the temporal resolution of nearly backscattering time measurement system is improved, realizes the zero-time tolerance design of scattering time optical path.
Description
Technical field
The invention belongs to field of optical measuring technologies, and in particular to a kind of near backwards to scattered based on ellipsoid diffusing reflection blank
Penetrate light time measurement system.
Background technology
Laser fusion is a kind of human controllable's nuclear fusion generally used at present, it all has ten on civilian and military
Divide great research significance：A kind of inexhaustible Clear nuclear energy source is explored for the mankind；For developing " clean ", (no radiation is dirty
Dye) nuclear weapon, development high energy laser weapon；Part substitutes nuclear tests.
Therefore, laser fusion is paid much attention to be subject to each nuclear power of the world, since second half the 1970s,
The states such as Russia, U.S., day, method, China and British start the development of high-power laser driver in succession.Research of the U.S. in this field is in neck
First status, and formally built up the ultra-large type laser driving apparatus " NIF " comprising 192 tunnels in 2009；The MLF that France is building
Include 240 road laser；Construction large laser driver is also fermenting in Japan, and plans to complete to apply between 2015-2020
In the basic technology research of power generation.China also establishes a series of laser driving apparatus (starlight series, God Light series etc.),
The laser driving apparatus " Shenguang-Ⅲ " of the largest domestic for completing to build in 2015 includes 48 road laser.
However, U.S. NIF did not succeed in the igniting of 2010, this causes larger shock in world wide.NIF with
Research afterwards finds that the theoretical model verified originally on small-scale laser driver is no longer applicable on NIF, and NIF practices shooting
The backscattering share of laser is well beyond original desired value, and target practice laser energy is significantly slackened, fusion fuel compression
Symmetry is destroyed, and causes loss of ignition, it can be seen that backscattering measuring system is in one new Laser Driven dress of understanding
The irreplaceable effect played during putting.
The domestic research starting to backscattering is also relatively early, and the development of backscattering diagnostic techniques substantially experienced three ranks
Section：
First stage, is measured after being sampled using glass spherical mirror to nearly back-scattering light, but the thing of the program, mirror body
Normal direction, as three necessarily be on straight line, this arrangement mode is excessively stiff, without flexibility；
Second stage, is measured after being focused on using aluminum off-axis ellipsoidal mirror to nearly back-scattering light, by adjusting off-axis
The achievable any light path layout of amount, flexibility ratio are very big, and focusing is very good, but the laser damage threshold of metallic mirror surface is relatively low
(it is less than 1J/cm2), using limited on more extensive laser driving apparatus；
Phase III, using standard white plate of diffuse reflectance to nearly back-scattering light diffusing reflection, to being measured after the sampling that diffuses,
The laser damage threshold of diffusing reflection blank (is more than 1.7J/cm2) it disclosure satisfy that the measurement demand of more extensive laser driving apparatus.
But when carrying out nearly backscattering time measurement after to the sampling that diffuses, due to each point on plane diffusing reflection blank
The light path of the measurements of arrival time that diffuses probe is different, and there are the different degrees of time difference (plane of 2m × 2m between each other
Diffusing reflection plate maximum time difference is up to ns magnitudes, and backscattering time course to be measured is also several ns), time measurement system will be become
The Systematic Errors of system, seriously reduce the temporal resolution of time measurement system.
The content of the invention
It is an object of the present invention to provide a kind of nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank, solution
Determine the technical problem that systematic error is big, temporal resolution is low existing for existing nearly back-scattering light time measurement system.
The present invention technical solution be：A kind of nearly back-scattering light time measurement based on ellipsoid diffusing reflection blank
System, including sampler and measuring device, it is characterized in that：The sampler includes spherical vacuum target chamber and sampling
Diaphragm, is provided with target spot and ellipsoid diffusing reflection blank in the spherical vacuum target chamber；Target practice laser light incident target spot produces near
Back-scattering light produces diffusing reflection along after the scattering of target practice opposite direction by ellipsoid diffusing reflection blank, and the sampled diaphragm that diffuses takes
Enter measuring device after sample；The target spot is located in a focus of ellipsoid diffusing reflection blank, the sampling diaphragm centre bit
In in another focus of ellipsoid diffusing reflection blank.
Further, above-mentioned measuring device includes imaging lens, the shrink beam positive lens set gradually along paths direction
And dichroscope；After the dichroscope separates spectrum, long wave is transmitted anti-into long wave transmission light measurements unit, shortwave
Inject into shortwave reflected light measurement unit.
It is preferred that above-mentioned long wave transmission light measurements unit includes long wave time measurement coupling mirror and the fast light of long wave time measurement
Fulgurite；Long wave transmitted light samples light as the long wave where long wave time measurement coupling mirror images in the fast photoelectric tube of long wave time measurement
In late image planes.
Further, it is provided with long wave light absorbs trap in above-mentioned long wave sampling diaphragm image planes.
Further, long wave spectrum sampling optical fiber is additionally provided with above-mentioned long wave sampling diaphragm image planes.
It is preferred that above-mentioned shortwave reflected light measurement unit includes shortwave time measurement coupling mirror and the fast light of shortwave time measurement
Fulgurite；Shortwave reflected light samples light as the shortwave where shortwave time measurement coupling mirror images in the fast photoelectric tube of shortwave time measurement
In late image planes.
Further, it is provided with short wavelength light absorption trap in above-mentioned shortwave sampling diaphragm image planes.
Further, shortwave spectrum sampling optical fiber is additionally provided with above-mentioned shortwave sampling diaphragm image planes.
It is preferred that above-mentioned imaging lens image in ellipsoid diffusing reflection blank in image planes, in an image planes
It is provided with veiling glare filter.
The beneficial effects of the present invention are：
(1) present invention is eliminated because of scattering surface diffusing reflection using the diffusing reflection blank with ellipsoid type as scattering surface
The system time error of introducing, improves the temporal resolution of nearly backscattering time measurement system, realizes scattering time survey
Measure the zero-time tolerance design of light path.
(2) by the sampling of sampler acquisition, just each point is overflow the present invention on the diffusing reflection face of ellipsoid type diffusing reflection blank
The aggregate of reflected light, 100% all standing is realized in time measurement test surface using the mode of Image relaying by stop imagery
Sampling, measurement result are truer.
Brief description of the drawings
Fig. 1 is the preferred embodiment structure diagram of inventive sampling device.
Fig. 2 is the preferred embodiment structure diagram of measuring device of the present invention.
Wherein, reference numeral is：The spherical vacuum target chambers of 1-, 2- target practice laser, 3- target spots, 4- ellipsoid diffusing reflection blanks,
5- sampling windows, 6- sampling diaphragms, 7- imaging lens, 8- veiling glare filters, 9- shrink beam positive lens, 10- dichroscopes,
11- long wave camera sampling mirrors, 12- long wave time measurement sampling mirrors, 13- long wave time measurement coupling mirrors, 14- long waves sampling diaphragm
Image planes, 15- long wave spectrums sampling optical fiber, the fast photoelectric tube of 16- long wave time measurements, 17- long wave light absorbs traps, 18- shortwave phases
Machine sampling mirror, 19- shortwave time measurement sampling mirrors, 20- shortwave time measurement coupling mirrors, 21- shortwaves sampling diaphragm image planes, 22-
Shortwave spectrum samples optical fiber, the fast photoelectric tube of 23- shortwave time measurements, 24- short wavelength lights absorption trap.
Embodiment
The present embodiment is a kind of nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank, its structure bag
Include sampler and measuring device.
Referring to Fig. 1, sampler includes spherical vacuum target chamber 1 and sampling diaphragm 6, and target is provided with spherical vacuum target chamber 1
Point 3 and ellipsoid diffusing reflection blank 4；The nearly back-scattering light that the incident target spot 3 of target practice laser 2 produces along after target practice backscattering by
Ellipsoid diffusing reflection blank 4 produces diffusing reflection, is passed through again after diffusing through the sampling window 5 set on spherical vacuum target chamber 1
The sampling sampling of diaphragm 6 enters measuring device；Target spot 3 is located in a focus of ellipsoid diffusing reflection blank 4, sampling diaphragm 6
Center is located in another focus of ellipsoid diffusing reflection blank 4.According to the characteristic of ellipsoid, from target spot 3 to sampling light
Each light of door screen 6 is all aplanatic, therefore the sampler realizes no time difference sampling.
Referring to Fig. 2, measuring device includes imaging lens 7, the shrink beam positive lens 9 and two set gradually along paths direction
To Look mirror 10；After dichroscope 10 separates spectrum, long wave is transmitted into long wave transmission light measurements unit, shortwave and is reflected into
Enter shortwave reflected light measurement unit.
As a kind of preferred embodiment, long wave transmission light measurements unit includes long wave camera sampling mirror 11, the long wave time surveys
Measure sampling mirror 12, long wave time measurement coupling mirror 13 and the fast photoelectric tube 16 of long wave time measurement；Long wave transmitted light passes through long wave phase
After machine sampling mirror 11, reflected by long wave time measurement sampling mirror 12, length is then imaged in by long wave time measurement coupling mirror 13 again
In long wave sampling diaphragm image planes 14 where the fast photoelectric tube 16 of ripple time measurement.In long wave transmission light measurements unit, during long wave
Between measurement coupling mirror 13 be incorporated in before imaging lens 7 in light path, 9 three of shrink beam positive lens collectively form one without optical path difference
The imaging system of (i.e. without the time difference), sampling diaphragm 6 is imaged in long wave sampling diaphragm image planes 14.Taken from target spot 3 to long wave
There is no any optical path difference between each light of sample diaphragm image planes 14, just without poor any time yet.Diaphragm is sampled in long wave
Set the fast photoelectric tube 16 of long wave time measurement to be scattered time response measurement at image planes 14, will not be introduced in optical path any
Time difference.
Further, long wave light absorbs trap 17 is provided with long wave sampling diaphragm image planes 14, it is not utilized for absorbing
The long glistening light of waves.Long wave spectrum sampling optical fiber 15 can also be set in long wave sampling diaphragm image planes 14, for carrying out long scattering of wave light
Spectrometry.
As a kind of preferred embodiment, shortwave reflected light measurement unit includes shortwave camera sampling mirror 18, the shortwave time surveys
Measure sampling mirror 19, shortwave time measurement coupling mirror 20 and the fast photoelectric tube 23 of shortwave time measurement；Shortwave reflected light passes through shortwave phase
After machine sampling mirror 18, reflected, then imaged in again by shortwave time measurement coupling mirror 20 short by shortwave time measurement sampling mirror 19
In shortwave sampling diaphragm image planes 21 where the fast photoelectric tube 23 of ripple time measurement.In shortwave reflected light measurement unit, during shortwave
Between measurement coupling mirror 20 be incorporated in before imaging lens 7 in light path, 9 three of shrink beam positive lens collectively form one without optical path difference
The imaging system of (i.e. without the time difference), sampling diaphragm 6 is imaged in shortwave sampling diaphragm image planes 21.Taken from target spot 3 to shortwave
There is no any optical path difference between each light of sample diaphragm image planes 21, just without poor any time yet.Diaphragm is sampled in shortwave
Set the fast photoelectric tube 23 of shortwave time measurement to be scattered time response measurement at image planes 21, will not be introduced in optical path any
Time difference.
Further, short wavelength light absorption trap 24 is provided with shortwave sampling diaphragm image planes 21, it is not utilized for absorbing
Short wavelength light.In shortwave sampling diaphragm image planes 21 shortwave spectrum can also be set to sample optical fiber 22, for carrying out shortwave scattering light
Spectrometry.
It is preferred that imaging lens 7 image in ellipsoid diffusing reflection blank in image planes in the present embodiment, once as
Veiling glare filter 8 can be set on face, for filtering out the veiling glare in other directions, ensure that the light beam for entering test device is equal
The scattering light produced for ellipsoid diffusing reflection blank.
Nearly back-scattering light time measurement system proposed by the present invention based on ellipsoid diffusing reflection blank can avoid because
Scattering surface diffusing reflection introduces the defects of time difference, realizes the scattering time characteristic high-acruracy survey of nearly back-scattering light.
Claims (9)
1. a kind of nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank, including sampler and measurement fill
Put, it is characterised in that：The sampler includes spherical vacuum target chamber and sampling diaphragm, is provided with the spherical vacuum target chamber
Target spot and ellipsoid diffusing reflection blank；Target practice laser light incident target spot produce nearly back-scattering light along target practice opposite direction scatter after by
Ellipsoid diffusing reflection blank produces diffusing reflection, enters measuring device after the sampled diaphragm sampling that diffuses；The target spot is located at
In one focus of ellipsoid diffusing reflection blank, the sampling diaphragm center is located at another focus of ellipsoid diffusing reflection blank
On.
2. the nearly back-scattering light time measurement system according to claim 1 based on ellipsoid diffusing reflection blank, it is special
Sign is：The measuring device includes imaging lens, shrink beam positive lens and the dichroscope set gradually along paths direction；
After the dichroscope separates spectrum, long wave is transmitted into long wave transmission light measurements unit, shortwave and is reflected into shortwave
Reflected light measurement unit.
3. the nearly back-scattering light time measurement system according to claim 2 based on ellipsoid diffusing reflection blank, it is special
Sign is：The long wave transmission light measurements unit includes long wave time measurement coupling mirror and the fast photoelectric tube of long wave time measurement；It is long
Ripple transmitted light samples diaphragm image planes as the long wave where long wave time measurement coupling mirror images in the fast photoelectric tube of long wave time measurement
On.
4. the nearly back-scattering light time measurement system according to claim 3 based on ellipsoid diffusing reflection blank, it is special
Sign is：Long wave light absorbs trap is provided with the long wave sampling diaphragm image planes.
5. the nearly back-scattering light time measurement system according to claim 4 based on ellipsoid diffusing reflection blank, it is special
Sign is：Long wave spectrum sampling optical fiber is additionally provided with the long wave sampling diaphragm image planes.
6. the nearly back-scattering light time measurement system according to claim 2 based on ellipsoid diffusing reflection blank, it is special
Sign is：The shortwave reflected light measurement unit includes shortwave time measurement coupling mirror and the fast photoelectric tube of shortwave time measurement；It is short
Wave reflection light samples diaphragm image planes as the shortwave where shortwave time measurement coupling mirror images in the fast photoelectric tube of shortwave time measurement
On.
7. the nearly back-scattering light time measurement system according to claim 6 based on ellipsoid diffusing reflection blank, it is special
Sign is：Short wavelength light absorption trap is provided with the shortwave sampling diaphragm image planes.
8. the nearly back-scattering light time measurement system according to claim 7 based on ellipsoid diffusing reflection blank, it is special
Sign is：Shortwave spectrum sampling optical fiber is additionally provided with the shortwave sampling diaphragm image planes.
9. according to any nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank in claim 2-8
System, it is characterised in that：The imaging lens image in ellipsoid diffusing reflection blank in image planes, are set in an image planes
It is equipped with veiling glare filter.
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| CN201711341523.2A CN107966277B (en) | 2017-12-14 | 2017-12-14 | Near back scattered light time measurement system based on ellipsoidal diffuse reflection whiteboard |
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