CN107966277B - Near back scattered light time measurement system based on ellipsoidal diffuse reflection whiteboard - Google Patents
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- 238000005259 measurement Methods 0.000 title claims abstract description 58
- 238000005070 sampling Methods 0.000 claims abstract description 79
- 230000008685 targeting Effects 0.000 claims abstract description 10
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- 238000010168 coupling process Methods 0.000 claims description 16
- 238000005859 coupling reaction Methods 0.000 claims description 16
- 238000001228 spectrum Methods 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 11
- 239000013307 optical fiber Substances 0.000 claims description 8
- 230000031700 light absorption Effects 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 abstract description 9
- 238000013461 design Methods 0.000 abstract description 2
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 238000012360 testing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
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Abstract
The invention belongs to the technical field of optical measurement, and particularly relates to a near back scattered light time measurement system based on an ellipsoidal diffuse reflection whiteboard. The measuring system comprises a sampling device and a measuring device, wherein the sampling device comprises a spherical vacuum target chamber and a sampling diaphragm, and a target spot and an ellipsoidal diffuse reflection whiteboard are arranged in the spherical vacuum target chamber; near back scattering light generated by a target incidence spot of the targeting laser is scattered along the targeting reverse direction and then is diffusely reflected by an ellipsoidal diffuse reflection whiteboard, and the diffusely reflected light enters a measuring device after being sampled by a sampling diaphragm; the target point is positioned on one focus of the ellipsoidal diffuse reflection whiteboard, and the center of the sampling diaphragm is positioned on the other focus of the ellipsoidal diffuse reflection whiteboard. The invention adopts the diffuse reflection whiteboard with the ellipsoidal surface as the scattering surface, eliminates the system time error caused by diffuse reflection of the scattering surface, improves the time resolution of the near back scattering time measurement system, and realizes the zero time error design of the scattering time measurement light path.
Description
Technical Field
The invention belongs to the technical field of optical measurement, and particularly relates to a near back scattered light time measurement system based on an ellipsoidal diffuse reflection whiteboard.
Background
The laser nuclear fusion is an artificially controllable nuclear fusion which is commonly adopted at present, and has great research significance in civil use and military use: exploring an inexhaustible clean nuclear energy source for human beings; the method is used for developing a 'clean' (no radiation pollution) nuclear weapon and developing a high-energy laser weapon; partial replacement nuclear experiments.
Therefore, laser nuclear fusion is highly valued by the large countries of the world, and the development of high-power laser drivers is successively started in russia, america, sun, law, middley, english and other countries from the last half of the 70 th year of the 20 th century. Research in this area of the united states is leading and formally built into an oversized laser driving device "NIF" containing 192 passes in 2009; the MLF being built in france contains 240 lasers; japan is also planning to build large-scale laser drivers and plan to complete basic technical research applicable to power generation in 2015-2020. China also established a series of laser driving devices (starlight series, nerve light series, etc.), the largest domestic laser driving device "nerve light-iii" that completed construction in 2015 contained 48 laser lines.
However, the ignition of the us NIF in 2010 was unsuccessful, which caused a major shock worldwide. Subsequent studies of NIF found that the theoretical model originally verified on smaller scale laser drivers was no longer applicable on NIF, the back-scattered fraction of NIF targeting laser was greatly exceeded the original expected value, targeting laser energy was greatly diminished, fusion fuel compression symmetry was destroyed, resulting in ignition failure, and thus it was seen that the back-scattered measurement system played an irreplaceable role in recognizing a new laser driver.
Research on backscattering in China starts earlier, and the development of backscattering diagnosis technology is approximately subjected to three stages:
in the first stage, the glass spherical mirror is adopted to sample the near back scattered light and then the near back scattered light is measured, but the object, the mirror body normal direction and the image of the scheme are necessarily in the same straight line, and the arrangement mode is too hard and has no flexibility;
in the second stage, the aluminum off-axis ellipsoidal mirror is adopted to measure after the near-back scattered light is focused, any light path layout can be realized by adjusting the off-axis quantity, the flexibility is extremely high, the focusing is very ideal, but the laser damage threshold of the metal mirror surface is lower (less than 1J/cm) 2 ) Limited application on larger scale laser driving devices;
in the third stage, the standard diffuse reflection white board is adopted to diffuse reflect the near back scattered light, the diffuse reflection light is sampled and then measured, and the laser damage threshold value (more than 1.7J/cm) 2 ) The measuring requirement of a larger-scale laser driving device can be met. However, when the near back scattering time measurement is performed after the diffuse reflection light is sampled, the time differences of different degrees exist between the diffuse reflection light arrival time measurement probes of each point on the planar diffuse reflection whiteboard due to different optical paths (the maximum time difference of the planar diffuse reflection board of 2m×2m can reach ns order, and the back scattering time process to be measured is also several ns), which becomes a systematic error of the time measurement system, and seriously reduces the time resolution of the time measurement system.
Disclosure of Invention
The invention aims to provide a near back scattered light time measurement system based on an ellipsoidal diffuse reflection whiteboard, which solves the technical problems of large system error and low time resolution of the existing near back scattered light time measurement system.
The technical scheme of the invention is as follows: the utility model provides a nearly back scattered light time measurement system based on ellipsoidal diffuse reflection whiteboard, includes sampling device and measuring device, its special character lies in: the sampling device comprises a spherical vacuum target chamber and a sampling diaphragm, wherein a target point and an ellipsoidal diffuse reflection whiteboard are arranged in the spherical vacuum target chamber; near back scattering light generated by a target incidence spot of the targeting laser is scattered along the targeting reverse direction and then is diffusely reflected by an ellipsoidal diffuse reflection whiteboard, and the diffusely reflected light enters a measuring device after being sampled by a sampling diaphragm; the target point is positioned on one focal point of the ellipsoidal diffuse reflection whiteboard, and the center of the sampling diaphragm is positioned on the other focal point of the ellipsoidal diffuse reflection whiteboard.
Further, the measuring device comprises an imaging lens, a beam shrinking positive lens and a dichroic mirror which are sequentially arranged along the light path propagation direction; after the spectrum of the dichroic mirror is separated, the long wave is transmitted into the long wave transmission light measuring unit, and the short wave is reflected into the short wave reflection light measuring unit.
Preferably, the long-wave transmitted light measuring unit comprises a long-wave time measuring coupling mirror and a long-wave time measuring fast photoelectric tube; the long-wave transmitted light is imaged on the long-wave sampling diaphragm image surface where the long-wave time measurement fast photoelectric tube is located by the long-wave time measurement coupling mirror.
Further, a long-wave light absorption trap is arranged on the long-wave sampling diaphragm image surface.
Further, a long-wave spectrum sampling optical fiber is also arranged on the long-wave sampling diaphragm image surface.
Preferably, the short-wave reflected light measuring unit comprises a short-wave time measuring coupling mirror and a short-wave time measuring fast photoelectric tube; the short-wave reflected light is imaged on the image surface of the short-wave sampling diaphragm where the short-wave time measurement fast photoelectric tube is located by the short-wave time measurement coupling mirror.
Further, a short-wave light absorption trap is arranged on the image plane of the short-wave sampling diaphragm.
Further, the short-wave spectrum sampling optical fiber is further arranged on the image surface of the short-wave sampling diaphragm.
Preferably, the imaging lens images the ellipsoidal diffuse reflection whiteboard on a primary image plane, and a stray light filtering device is arranged on the primary image plane.
The invention has the beneficial effects that:
(1) The invention adopts the diffuse reflection whiteboard with the ellipsoidal surface as the scattering surface, eliminates the system time error caused by diffuse reflection of the scattering surface, improves the time resolution of the near back scattering time measurement system, and realizes the zero time error design of the scattering time measurement light path.
(2) The sampling light obtained by the sampling device is an aggregate of diffuse reflection light of each point on the diffuse reflection surface of the ellipsoidal diffuse reflection whiteboard, and the diaphragm is imaged on the time measurement detection surface in an image transmission mode, so that 100% full coverage sampling is realized, and the measurement result is more real.
Drawings
FIG. 1 is a schematic structural diagram of a sampling device according to a preferred embodiment of the present invention.
FIG. 2 is a schematic structural diagram of a measuring device according to a preferred embodiment of the present invention.
Wherein, the reference numerals are as follows: the device comprises a 1-spherical vacuum target chamber, 2-targeting laser, 3-target, 4-ellipsoidal diffuse reflection whiteboard, 5-sampling window, 6-sampling diaphragm, 7-imaging lens, 8-stray light filter device, 9-beam shrinking positive lens, 10-dichroic mirror, 11-long wave camera sampling mirror, 12-long wave time measurement sampling mirror, 13-long wave time measurement coupling mirror, 14-long wave sampling diaphragm image surface, 15-long wave spectrum sampling optical fiber, 16-long wave time measurement fast photoelectric tube, 17-long wave light absorption trap, 18-short wave camera sampling mirror, 19-short wave time measurement sampling mirror, 20-short wave time measurement coupling mirror, 21-short wave sampling diaphragm image surface, 22-short wave spectrum sampling optical fiber, 23-short wave time measurement fast photoelectric tube and 24-short wave light absorption.
Detailed Description
The embodiment is a near back scattered light time measurement system based on an ellipsoidal diffuse reflection whiteboard, and the structure of the near back scattered light time measurement system comprises a sampling device and a measuring device.
Referring to fig. 1, the sampling device comprises a spherical vacuum target chamber 1 and a sampling diaphragm 6, wherein a target point 3 and an ellipsoidal diffuse reflection whiteboard 4 are arranged in the spherical vacuum target chamber 1; near back scattering light generated by an incidence target 3 of the targeting laser 2 is scattered along the targeting back, then is diffusely reflected by an ellipsoidal diffuse reflection whiteboard 4, and the diffusely reflected light passes through a sampling window 5 arranged on the spherical vacuum target chamber 1 and then enters a measuring device through a sampling diaphragm 6 for sampling; the target point 3 is located at one focal point of the ellipsoidal diffuse reflection whiteboard 4, and the center of the sampling diaphragm 6 is located at the other focal point of the ellipsoidal diffuse reflection whiteboard 4. According to the characteristics of the ellipsoid, each light ray from the target point 3 to the sampling diaphragm 6 is equal in optical path length, so that the sampling device realizes time-difference-free sampling.
Referring to fig. 2, the measuring device includes an imaging lens 7, a beam-condensing positive lens 9, and a dichroic mirror 10, which are disposed in this order along the optical path propagation direction; after spectral separation by the dichroic mirror 10, the long wave is transmitted into the long wave transmission light measuring unit and the short wave is reflected into the short wave reflection light measuring unit.
As a preferred embodiment, the long-wave transmitted light measuring unit includes a long-wave camera sampling mirror 11, a long-wave time measuring sampling mirror 12, a long-wave time measuring coupling mirror 13, and a long-wave time measuring fast photocell 16; after the long-wave transmitted light passes through the long-wave camera sampling mirror 11, the long-wave transmitted light is reflected by the long-wave time measurement sampling mirror 12, and then imaged on the long-wave sampling diaphragm image surface 14 where the long-wave time measurement fast photoelectric tube 16 is located by the long-wave time measurement coupling mirror 13. In the long-wave transmitted light measuring unit, the long-wave time measuring coupling mirror 13 is combined with the imaging lens 7 and the beam shrinking positive lens 9 in the front light path to form an imaging system without optical path difference (namely without time difference), and the sampling diaphragm 6 is imaged on the long-wave sampling diaphragm image surface 14. There is no optical path difference between each light ray from the target point 3 to the long wave sampling diaphragm image plane 14, and there is no time difference. A long-wave time measurement fast photoelectric tube 16 is arranged at the long-wave sampling diaphragm image surface 14 to measure the scattering time characteristics, and no time difference is introduced into a measurement light path.
Further, a long-wave light absorbing trap 17 is provided on the long-wave sampling diaphragm image plane 14 for absorbing the unused long-wave light. A long-wave spectrum sampling optical fiber 15 can be further arranged on the long-wave sampling diaphragm image surface 14 for long-wave scattering spectrum measurement.
As a preferred embodiment, the short-wave reflected light measuring unit includes a short-wave camera sampling mirror 18, a short-wave time measuring sampling mirror 19, a short-wave time measuring coupling mirror 20, and a short-wave time measuring fast photocell 23; after the short-wave reflected light passes through the short-wave camera sampling mirror 18, the short-wave reflected light is reflected by the short-wave time measurement sampling mirror 19, and then imaged on the short-wave sampling diaphragm image surface 21 where the short-wave time measurement fast photoelectric tube 23 is located by the short-wave time measurement coupling mirror 20. In the short-wave reflected light measuring unit, a short-wave time measuring coupling lens 20 is combined with an imaging lens 7 and a beam shrinking positive lens 9 in a front light path to form an imaging system without optical path difference (namely without time difference), and a sampling diaphragm 6 is imaged on a short-wave sampling diaphragm image surface 21. There is no optical path difference between each light ray from the target point 3 to the short wave sampling diaphragm image plane 21, i.e. no time difference. A short-wave time measurement fast photoelectric tube 23 is arranged at the short-wave sampling diaphragm image surface 21 to measure the scattering time characteristics, and no time difference is introduced into a measurement light path.
Further, a shortwave light absorbing trap 24 is disposed on the shortwave sampling diaphragm image plane 21 for absorbing the unutilized shortwave light. The short-wave sampling diaphragm image surface 21 can be further provided with a short-wave spectrum sampling optical fiber 22 for short-wave scattering spectrum measurement.
Preferably, in this embodiment, the imaging lens 7 images the ellipsoidal diffuse reflection whiteboard on the primary image plane, and the stray light filtering device 8 may be disposed on the primary image plane, so as to filter out stray light in other directions, and ensure that the light beams entering the testing device are all scattered light generated by the ellipsoidal diffuse reflection whiteboard.
The near back scattered light time measurement system based on the ellipsoidal diffuse reflection whiteboard provided by the invention can avoid the defect that time difference is introduced due to diffuse reflection of a scattering surface, and realizes high-precision measurement of the scattering time characteristic of near back scattered light.
Claims (8)
1. Near back scattered light time measurement system based on ellipsoidal diffuse reflection whiteboard, including sampling device and measuring device, its characterized in that: the sampling device comprises a spherical vacuum target chamber and a sampling diaphragm, wherein a target point and an ellipsoidal diffuse reflection whiteboard are arranged in the spherical vacuum target chamber; near back scattering light generated by a target incidence spot of the targeting laser is scattered along the targeting reverse direction and then is diffusely reflected by an ellipsoidal diffuse reflection whiteboard, and the diffusely reflected light enters a measuring device after being sampled by a sampling diaphragm; the target point is positioned on one focal point of the ellipsoidal diffuse reflection whiteboard, and the center of the sampling diaphragm is positioned on the other focal point of the ellipsoidal diffuse reflection whiteboard;
the measuring device comprises an imaging lens, a beam shrinking positive lens and a dichroic mirror which are sequentially arranged along the light path propagation direction; after the spectrum of the dichroic mirror is separated, the long wave is transmitted into the long wave transmission light measuring unit, and the short wave is reflected into the short wave reflection light measuring unit.
2. The ellipsometric-diffuse-reflective-whiteboard-based near-back-scattered-light time measurement system according to claim 1, wherein: the long-wave transmission light measuring unit comprises a long-wave time measuring coupling mirror and a long-wave time measuring fast photoelectric tube; the long-wave transmitted light is imaged on the long-wave sampling diaphragm image surface where the long-wave time measurement fast photoelectric tube is located by the long-wave time measurement coupling mirror.
3. The near back-scattered light time measurement system based on an ellipsoidal diffuse reflective whiteboard of claim 2, wherein: and a long-wave light absorption trap is arranged on the long-wave sampling diaphragm image surface.
4. A near back-scattered light time measurement system based on an ellipsoidal diffuse reflective whiteboard according to claim 3, wherein: the long-wave sampling diaphragm image surface is also provided with a long-wave spectrum sampling optical fiber.
5. The ellipsometric-diffuse-reflective-whiteboard-based near-back-scattered-light time measurement system according to claim 1, wherein: the short-wave reflected light measuring unit comprises a short-wave time measuring coupling mirror and a short-wave time measuring fast photoelectric tube; the short-wave reflected light is imaged on the image surface of the short-wave sampling diaphragm where the short-wave time measurement fast photoelectric tube is located by the short-wave time measurement coupling mirror.
6. The ellipsometric-diffuse-reflective-whiteboard-based near-back-scattered-light time measurement system according to claim 5, wherein: and a short-wave light absorption trap is arranged on the image surface of the short-wave sampling diaphragm.
7. The ellipsometric-diffuse-reflective-whiteboard-based near-back-scattered-light time measurement system according to claim 6, wherein: and a short-wave spectrum sampling optical fiber is further arranged on the short-wave sampling diaphragm image surface.
8. The ellipsometric-diffuse-reflective-whiteboard-based near back-scattered-light time measurement system according to any one of claims 1-7, wherein: the imaging lens images the ellipsoidal diffuse reflection whiteboard on a primary image plane, and a stray light filter device is arranged on the primary image plane.
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4156571A (en) * | 1977-09-07 | 1979-05-29 | The Singer Company | Laser mirror scatter and reflectivity measuring system |
| GB8908422D0 (en) * | 1988-05-09 | 1989-06-01 | Spectra Tech Inc | Diffuse reflectance spectroscopy system and method |
| JP2001281097A (en) * | 2000-03-28 | 2001-10-10 | Nikon Corp | Method and apparatus for measuring scattered light |
| WO2003085385A1 (en) * | 2002-04-04 | 2003-10-16 | Lla Instruments Gmbh | Method and spectrometer for spectrometrically measuring the extinction, transmission, diffuse reflection or the reflection of samples |
| WO2009135376A1 (en) * | 2008-05-09 | 2009-11-12 | 清华大学 | Method and device for inspecting object with a forward direction scatter radiation |
| CN103268009A (en) * | 2013-06-07 | 2013-08-28 | 北京师范大学 | Vertical illumination dark-field microscope |
| CN105469837A (en) * | 2015-12-29 | 2016-04-06 | 中国科学院西安光学精密机械研究所 | Laser fusion backscattering light beam simulation device |
| CN105489262A (en) * | 2015-12-29 | 2016-04-13 | 中国科学院西安光学精密机械研究所 | Universal point light source simulation system |
| CN207636277U (en) * | 2017-12-14 | 2018-07-20 | 中国科学院西安光学精密机械研究所 | Near-back scattered light time measuring system based on ellipsoidal diffuse reflection white board |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7528951B2 (en) * | 2006-03-23 | 2009-05-05 | Hach Company | Optical design of a measurement system having multiple sensor or multiple light source paths |
-
2017
- 2017-12-14 CN CN201711341523.2A patent/CN107966277B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4156571A (en) * | 1977-09-07 | 1979-05-29 | The Singer Company | Laser mirror scatter and reflectivity measuring system |
| GB8908422D0 (en) * | 1988-05-09 | 1989-06-01 | Spectra Tech Inc | Diffuse reflectance spectroscopy system and method |
| JP2001281097A (en) * | 2000-03-28 | 2001-10-10 | Nikon Corp | Method and apparatus for measuring scattered light |
| WO2003085385A1 (en) * | 2002-04-04 | 2003-10-16 | Lla Instruments Gmbh | Method and spectrometer for spectrometrically measuring the extinction, transmission, diffuse reflection or the reflection of samples |
| WO2009135376A1 (en) * | 2008-05-09 | 2009-11-12 | 清华大学 | Method and device for inspecting object with a forward direction scatter radiation |
| CN103268009A (en) * | 2013-06-07 | 2013-08-28 | 北京师范大学 | Vertical illumination dark-field microscope |
| CN105469837A (en) * | 2015-12-29 | 2016-04-06 | 中国科学院西安光学精密机械研究所 | Laser fusion backscattering light beam simulation device |
| CN105489262A (en) * | 2015-12-29 | 2016-04-13 | 中国科学院西安光学精密机械研究所 | Universal point light source simulation system |
| CN207636277U (en) * | 2017-12-14 | 2018-07-20 | 中国科学院西安光学精密机械研究所 | Near-back scattered light time measuring system based on ellipsoidal diffuse reflection white board |
Non-Patent Citations (4)
| Title |
|---|
| Backscattering from small-scale breaking wave turbulence structure generated by FLUENT;Luo Gen等;《CHINESE PHYSICS B》;第23卷(第12期);全文 * |
| 基于神光Ⅲ原型的背向散射实验技术研究;王峰;彭晓世;杨冬;李志超;徐涛;魏惠月;刘慎业;;物理学报(第17期);全文 * |
| 基于神光III主机的背向散射光诊断技术;王峰;彭晓世;闫亚东;徐涛;魏惠月;理玉龙;李楠;;中国激光(第09期);全文 * |
| 近背向散射测量系统中漫反射板的特性研究;韩洋;何俊华;闫亚东;吴冰静;;红外与激光工程(第09期);全文 * |
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