CN107966277B - Near back scattered light time measurement system based on ellipsoidal diffuse reflection whiteboard - Google Patents
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Abstract
Description
技术领域Technical field
本发明属于光学测量技术领域，具体涉及一种基于椭球面漫反射白板的近背向散射光时间测量系统。The invention belongs to the technical field of optical measurement, and specifically relates to a near backscattered light time measurement system based on an ellipsoidal diffuse reflection white board.
背景技术Background technique
激光核聚变是目前普遍采用的一种人工可控核聚变，它在民用和军事上都具有十分重大的研究意义：为人类探索一种取之不尽的清洁核能源；用来研制“干净”(无放射污染)的核武器、发展高能激光武器；部分替代核实验。Laser nuclear fusion is a commonly used artificial controllable nuclear fusion. It has very important research significance in both civilian and military applications: it can explore an inexhaustible clean nuclear energy for mankind; it can be used to develop "clean" nuclear energy. (without radioactive contamination) nuclear weapons, develop high-energy laser weapons; partially replace nuclear experiments.
因此，激光核聚变受到世界各核大国的高度重视，从20世纪70年代后半叶开始，俄、美、日、法、中、英等国相继开始高功率激光驱动器的研制。美国在此领域的研究处于领先地位，并于2009年正式建成包含192路的超大型激光驱动装置“NIF”；法国正在建设的MLF包含240路激光；日本也在酝酿建造大型激光驱动器，并计划在2015-2020年间完成可应用于发电的基础技术研究。中国也建立了一系列的激光驱动装置(星光系列、神光系列等)，2015年完成建设的国内最大的激光驱动装置“神光－Ⅲ”包含48路激光。Therefore, laser nuclear fusion has received great attention from the world's nuclear powers. Since the second half of the 1970s, Russia, the United States, Japan, France, China, the United Kingdom and other countries have successively begun the development of high-power laser drivers. The United States is in the leading position in research in this field, and in 2009 it officially built the ultra-large laser driver "NIF" containing 192 channels; France is building an MLF containing 240 laser channels; Japan is also planning to build a large laser driver and plans to Complete basic technology research that can be applied to power generation between 2015 and 2020. China has also established a series of laser drive devices (Starlight series, Shenguang series, etc.). The largest domestic laser drive device "Shenguang-III" completed in 2015 contains 48 lasers.
然而，美国NIF在2010年的点火没有成功，这在世界范围引起了较大的震惊。NIF随后的研究发现，原来在较小规模激光驱动器上验证的理论模型在NIF上不再适用，NIF打靶激光的背向散射份额大大超出了原来的预期值，打靶激光能量被大幅消弱，聚变燃料压缩对称性遭到破坏，导致点火失败，由此可见背向散射测量系统在认识一个新的激光驱动装置过程中起到的不可替代的作用。However, the U.S. NIF failed to ignite in 2010, which caused great shock around the world. NIF's subsequent research found that the theoretical model originally verified on smaller-scale laser drivers was no longer applicable to NIF. The backscattering share of NIF's targeting laser greatly exceeded the original expected value, and the energy of the targeting laser was greatly weakened. Fusion The symmetry of fuel compression is destroyed, resulting in ignition failure. This shows that the backscatter measurement system plays an irreplaceable role in understanding a new laser drive device.
国内对背向散射的研究起步也较早，背向散射诊断技术的发展大致经历了三个阶段：Domestic research on backscattering also started early. The development of backscattering diagnostic technology has roughly gone through three stages:
第一阶段，采用玻璃球面镜对近背向散射光取样后进行测量，但该方案的物、镜体法向、像三者必须处于一条直线上，这种排布方式过于生硬，没有灵活性；In the first stage, a glass spherical mirror is used to sample the near backscattered light and measure it. However, in this plan, the object, mirror normal direction, and image must be in a straight line. This arrangement is too rigid and inflexible;
第二阶段，采用铝质离轴椭球镜对近背向散射光聚焦后进行测量，通过调整离轴量可实现任意光路布局、灵活度极大，且聚焦十分理想，但金属镜面的激光损伤阈值较低(小于1J/cm2)，在更大规模激光驱动装置上应用受限；In the second stage, an aluminum off-axis ellipsoid mirror is used to focus the near backscattered light for measurement. By adjusting the amount of off-axis, any optical path layout can be achieved, with great flexibility and ideal focusing. However, laser damage to the metal mirror surface The threshold is low (less than 1J/cm 2 ), and its application in larger-scale laser driving devices is limited;
第三阶段，采用标准漫反射白板对近背向散射光漫反射，对漫反射光取样后测量，漫反射白板的激光损伤阈值(大于1.7J/cm2)能够满足更大规模激光驱动装置的测量需求。但是，在对漫反射光取样后进行近背向散射时间测量时，由于平面型漫反射白板上各点的漫反射光到达时间测量探头的光程不同，相互之间存在不同程度的时间差(2m×2m的平面漫反射板最大时间差可达ns量级，而待测背向散射时间过程也是数ns)，将成为时间测量系统的系统性误差，严重降低了时间测量系统的时间分辨率。In the third stage, a standard diffuse reflection white board is used to diffusely reflect the near backscattered light. The diffuse reflection light is sampled and measured. The laser damage threshold of the diffuse reflection white board (greater than 1.7J/cm 2 ) can meet the requirements of larger-scale laser driving devices. Measurement needs. However, when measuring the near backscattering time after sampling the diffuse reflection light, due to the different optical path lengths of the diffuse reflection light arrival time measurement probes at each point on the flat diffuse reflection whiteboard, there are varying degrees of time differences between them (2m The maximum time difference of a ×2m planar diffuse reflection plate can reach the order of ns, and the backscattering time process to be measured is also several ns), which will become a systematic error of the time measurement system and seriously reduce the time resolution of the time measurement system.
发明内容Contents of the invention
本发明目的是提供一种基于椭球面漫反射白板的近背向散射光时间测量系统，解决了现有的近背向散射光时间测量系统存在的系统误差大、时间分辨率低的技术问题。The purpose of the invention is to provide a near backscattered light time measurement system based on an ellipsoidal diffuse reflection white board, which solves the technical problems of large system errors and low time resolution in existing near backscattered light time measurement systems.
本发明的技术解决方案是：一种基于椭球面漫反射白板的近背向散射光时间测量系统，包括取样装置和测量装置，其特殊之处在于：所述取样装置包括球状真空靶室和取样光阑，所述球状真空靶室内设置有靶点和椭球面漫反射白板；打靶激光入射靶点产生的近背向散射光沿打靶反方向散射后由椭球面漫反射白板产生漫反射，漫反射光经取样光阑取样后进入测量装置；所述靶点位于椭球面漫反射白板的一个焦点上，所述取样光阑中心位于椭球面漫反射白板的另一个焦点上。The technical solution of the present invention is: a near backscattered light time measurement system based on an ellipsoidal diffuse reflection white plate, including a sampling device and a measuring device. The special feature is that the sampling device includes a spherical vacuum target chamber and a sampling device. Diaphragm, the spherical vacuum target chamber is provided with a target point and an ellipsoidal surface diffuse reflection white board; the near backscattered light generated by the target laser incident on the target point is scattered along the opposite direction of the target and is diffusely reflected by the ellipsoid surface diffuse reflection white board. The light enters the measurement device after being sampled by the sampling aperture; the target point is located at one focus of the ellipsoidal diffuse reflection whiteboard, and the center of the sampling aperture is located at the other focus of the ellipsoidal diffuse reflection whiteboard.
进一步地，上述测量装置包括沿光路传播方向依次设置的成像镜头、缩束正透镜和二向色镜；所述二向色镜将光谱分离后，长波被透射进入长波透射光测量单元，短波被反射进入短波反射光测量单元。Further, the above-mentioned measurement device includes an imaging lens, a positive beam reducing lens and a dichroic mirror arranged in sequence along the propagation direction of the optical path; after the dichroic mirror separates the spectrum, the long wave is transmitted into the long wave transmitted light measurement unit, and the short wave is transmitted into the long wave transmitted light measurement unit. The reflection enters the shortwave reflected light measurement unit.
较佳地，上述长波透射光测量单元包括长波时间测量耦合镜和长波时间测量快光电管；长波透射光由长波时间测量耦合镜成像于长波时间测量快光电管所在的长波取样光阑像面上。Preferably, the above-mentioned long-wavelength transmitted light measurement unit includes a long-wavelength time measurement coupling mirror and a long-wavelength time measurement fast photoelectric tube; the long-wavelength transmitted light is imaged by the long-wavelength time measurement coupling mirror on the image surface of the long-wave sampling aperture where the long-wavelength time measurement fast photoelectric tube is located. .
进一步地，上述长波取样光阑像面上设置有长波光吸收陷阱。Further, a long-wave light absorption trap is provided on the image surface of the long-wave sampling diaphragm.
进一步地，上述长波取样光阑像面上还设置有长波光谱取样光纤。Furthermore, a long-wave spectrum sampling optical fiber is also provided on the image surface of the long-wave sampling diaphragm.
较佳地，上述短波反射光测量单元包括短波时间测量耦合镜和短波时间测量快光电管；短波反射光由短波时间测量耦合镜成像于短波时间测量快光电管所在的短波取样光阑像面上。Preferably, the above-mentioned short-wave reflected light measurement unit includes a short-wave time measurement coupling mirror and a short-wave time measurement fast photoelectric tube; the short-wave reflected light is imaged by the short-wave time measurement coupling mirror on the image surface of the short-wave sampling diaphragm where the short-wave time measurement fast photoelectric tube is located. .
进一步地，上述短波取样光阑像面上设置有短波光吸收陷阱。Further, a shortwave light absorption trap is provided on the image surface of the shortwave sampling aperture.
进一步地，上述短波取样光阑像面上还设置有短波光谱取样光纤。Furthermore, a shortwave spectrum sampling optical fiber is also provided on the image surface of the shortwave sampling diaphragm.
较佳地，上述成像镜头将椭球面漫反射白板成像于一次像面上，所述一次像面上设置有杂散光滤波装置。Preferably, the above-mentioned imaging lens images the ellipsoidal diffuse reflection whiteboard on a primary image surface, and a stray light filtering device is provided on the primary image surface.
本发明的有益效果在于：The beneficial effects of the present invention are:
(1)本发明采用具有椭球面型的漫反射白板作为散射面，消除了因散射面漫反射引入的系统时间误差，提升了近背向散射时间测量系统的时间分辨率，实现了散射时间测量光路的零时间误差设计。(1) The present invention uses a diffuse reflection white board with an ellipsoidal surface as the scattering surface, which eliminates the system time error introduced by the diffuse reflection of the scattering surface, improves the time resolution of the near backscattering time measurement system, and realizes scattering time measurement. Zero time error design of optical path.
(2)本发明由取样装置获得的取样光是椭球面型漫反射白板的漫反射面上各点漫反射光的集合体，利用像传递的方式将光阑成像于时间测量探测面，实现了100％的全覆盖取样，测量结果更真实。(2) The sampling light obtained by the sampling device in the present invention is the aggregate of the diffuse reflection light from each point on the diffuse reflection surface of the ellipsoid-type diffuse reflection white board. The aperture is imaged on the time measurement detection surface by means of image transfer, thereby achieving 100% full coverage sampling, the measurement results are more realistic.
附图说明Description of the drawings
图1为本发明取样装置的较佳实施例结构示意图。Figure 1 is a schematic structural diagram of a preferred embodiment of the sampling device of the present invention.
图2为本发明测量装置的较佳实施例结构示意图。Figure 2 is a schematic structural diagram of a preferred embodiment of the measuring device of the present invention.
其中，附图标记为：1-球状真空靶室，2-打靶激光，3-靶点，4-椭球面漫反射白板，5-取样窗口，6-取样光阑，7-成像镜头，8-杂散光滤波装置，9-缩束正透镜，10-二向色镜，11-长波相机取样镜，12-长波时间测量取样镜，13-长波时间测量耦合镜，14-长波取样光阑像面，15-长波光谱取样光纤，16-长波时间测量快光电管，17-长波光吸收陷阱，18-短波相机取样镜，19-短波时间测量取样镜，20-短波时间测量耦合镜，21-短波取样光阑像面，22-短波光谱取样光纤，23-短波时间测量快光电管，24-短波光吸收陷阱。Among them, the reference numbers are: 1-spherical vacuum target chamber, 2-targeting laser, 3-target point, 4-ellipsoid diffuse reflection white board, 5-sampling window, 6-sampling aperture, 7-imaging lens, 8- Stray light filter device, 9-beam-reducing positive lens, 10-dichroic mirror, 11-long-wave camera sampling mirror, 12-long-wave time measurement sampling mirror, 13-long-wave time measurement coupling mirror, 14-long-wave sampling diaphragm image surface , 15-long-wave spectrum sampling fiber, 16-long-wave time measurement fast photoelectric tube, 17-long-wave light absorption trap, 18-short-wave camera sampling mirror, 19-short-wave time measurement sampling mirror, 20-short-wave time measurement coupling mirror, 21-short wave Sampling diaphragm image plane, 22-short-wave spectrum sampling fiber, 23-short-wave time measurement fast photoelectric tube, 24-short-wave light absorption trap.
具体实施方式Detailed ways
本实施例为一种基于椭球面漫反射白板的近背向散射光时间测量系统，其结构包括取样装置和测量装置。This embodiment is a near backscattered light time measurement system based on an ellipsoidal diffuse reflection white plate, and its structure includes a sampling device and a measuring device.
参见图1，取样装置包括球状真空靶室1和取样光阑6，球状真空靶室1内设置有靶点3和椭球面漫反射白板4；打靶激光2入射靶点3产生的近背向散射光沿打靶反向散射后由椭球面漫反射白板4产生漫反射，漫反射光穿过球状真空靶室1上设置的取样窗口5后再经取样光阑6取样进入测量装置；靶点3位于椭球面漫反射白板4的一个焦点上，取样光阑6的中心位于椭球面漫反射白板4的另一个焦点上。根据椭球面的特性可知，从靶点3至取样光阑6的每一根光线都是等光程的，因此该取样装置实现了无时间差取样。Referring to Figure 1, the sampling device includes a spherical vacuum target chamber 1 and a sampling aperture 6. The spherical vacuum target chamber 1 is provided with a target point 3 and an ellipsoid diffuse reflection white board 4; the near backscattering produced by the targeting laser 2 incident on the target point 3 After the light is backscattered along the target, it is diffusely reflected by the ellipsoidal diffuse reflection white plate 4. The diffusely reflected light passes through the sampling window 5 set on the spherical vacuum target chamber 1 and then enters the measurement device through the sampling aperture 6. The target point 3 is located at At one focus of the ellipsoidal diffuse reflection whiteboard 4, the center of the sampling aperture 6 is located at the other focus of the ellipsoidal diffuse reflection whiteboard 4. According to the characteristics of the ellipsoid, every light ray from the target point 3 to the sampling aperture 6 has the same optical path, so the sampling device realizes sampling without time difference.
参见图2，测量装置包括沿光路传播方向依次设置的成像镜头7、缩束正透镜9和二向色镜10；二向色镜10将光谱分离后，长波被透射进入长波透射光测量单元，短波被反射进入短波反射光测量单元。Referring to Figure 2, the measurement device includes an imaging lens 7, a positive beam reducing lens 9 and a dichroic mirror 10 arranged in sequence along the propagation direction of the optical path; after the dichroic mirror 10 separates the spectrum, the long wavelength is transmitted into the long wave transmitted light measurement unit. The shortwave is reflected into the shortwave reflected light measurement unit.
作为一种优选实施例，长波透射光测量单元包括长波相机取样镜11、长波时间测量取样镜12、长波时间测量耦合镜13和长波时间测量快光电管16；长波透射光透过长波相机取样镜11后，由长波时间测量取样镜12反射，然后再由长波时间测量耦合镜13成像于长波时间测量快光电管16所在的长波取样光阑像面14上。在长波透射光测量单元中，长波时间测量耦合镜13结合在前光路中的成像镜头7、缩束正透镜9三者共同构成一个无光程差(即无时间差)的成像系统，将取样光阑6成像在长波取样光阑像面14上。从靶点3至长波取样光阑像面14的每一根光线之间没有任何光程差，也就没有任何时间差。在长波取样光阑像面14处设置长波时间测量快光电管16进行散射时间特性测量，测量光路中不会引入任何时间差。As a preferred embodiment, the long-wave transmitted light measurement unit includes a long-wave camera sampling mirror 11, a long-wave time measurement sampling mirror 12, a long-wave time measurement coupling mirror 13 and a long-wave time measurement fast photoelectric tube 16; the long-wave transmitted light passes through the long-wave camera sampling mirror 11, it is reflected by the long-wavelength time measurement sampling mirror 12, and then is imaged by the long-wavelength time measurement coupling mirror 13 on the long-wavelength sampling aperture image plane 14 where the long-wavelength time measurement fast photoelectric tube 16 is located. In the long-wave transmitted light measurement unit, the long-wave time measurement coupling lens 13 is combined with the imaging lens 7 and the beam-shrinking positive lens 9 in the front optical path to form an imaging system with no optical path difference (that is, no time difference). The sampled light The aperture 6 is imaged on the image surface 14 of the long-wave sampling aperture. There is no optical path difference between each light ray from the target point 3 to the long-wave sampling diaphragm image plane 14, and there is no time difference. A long-wave time measurement fast photoelectric tube 16 is set at the long-wave sampling diaphragm image plane 14 to measure the scattering time characteristics without introducing any time difference in the measurement optical path.
进一步地，长波取样光阑像面14上设置有长波光吸收陷阱17，用于吸收未被利用的长波光。长波取样光阑像面14上还可以设置长波光谱取样光纤15，用于进行长波散射光谱测量。Furthermore, a long-wave light absorption trap 17 is provided on the long-wave sampling diaphragm image surface 14 for absorbing unused long-wave light. A long-wave spectrum sampling optical fiber 15 can also be provided on the long-wave sampling diaphragm image surface 14 for long-wave scattering spectrum measurement.
作为一种优选实施例，短波反射光测量单元包括短波相机取样镜18、短波时间测量取样镜19、短波时间测量耦合镜20和短波时间测量快光电管23；短波反射光透过短波相机取样镜18后，由短波时间测量取样镜19反射，然后再由短波时间测量耦合镜20成像于短波时间测量快光电管23所在的短波取样光阑像面21上。在短波反射光测量单元中，短波时间测量耦合镜20结合在前光路中的成像镜头7、缩束正透镜9三者共同构成一个无光程差(即无时间差)的成像系统，将取样光阑6成像在短波取样光阑像面21上。从靶点3至短波取样光阑像面21的每一根光线之间没有任何光程差，也就没有任何时间差。在短波取样光阑像面21处设置短波时间测量快光电管23进行散射时间特性测量，测量光路中不会引入任何时间差。As a preferred embodiment, the shortwave reflected light measurement unit includes a shortwave camera sampling mirror 18, a shortwave time measurement sampling mirror 19, a shortwave time measurement coupling mirror 20 and a shortwave time measurement fast photoelectric tube 23; the shortwave reflected light passes through the shortwave camera sampling mirror 18, it is reflected by the short-wave time measurement sampling mirror 19, and then is imaged by the short-wave time measurement coupling mirror 20 on the short-wave sampling aperture image surface 21 where the short-wave time measurement fast photoelectric tube 23 is located. In the short-wave reflected light measurement unit, the short-wave time measurement coupling mirror 20 is combined with the imaging lens 7 and the beam-shrinking positive lens 9 in the front optical path to form an imaging system with no optical path difference (that is, no time difference). The sampled light The aperture 6 is imaged on the image surface 21 of the shortwave sampling aperture. There is no optical path difference between each light ray from the target point 3 to the shortwave sampling diaphragm image plane 21, and there is no time difference. A short-wave time measurement fast photoelectric tube 23 is set at the short-wave sampling diaphragm image plane 21 to measure the scattering time characteristics without introducing any time difference in the measurement optical path.
进一步地，短波取样光阑像面21上设置有短波光吸收陷阱24，用于吸收未被利用的短波光。短波取样光阑像面21上还可以设置短波光谱取样光纤22，用于进行短波散射光谱测量。Furthermore, a shortwave light absorption trap 24 is provided on the shortwave sampling diaphragm image surface 21 for absorbing unused shortwave light. A shortwave spectrum sampling optical fiber 22 can also be provided on the shortwave sampling diaphragm image surface 21 for shortwave scattering spectrum measurement.
较佳地，本实施例中成像镜头7将椭球面漫反射白板成像于一次像面上，在一次像面上可以设置杂散光滤波装置8，用于滤出其他方向的杂散光，保证进入测试装置的光束均为椭球面漫反射白板产生的散射光。Preferably, in this embodiment, the imaging lens 7 images the ellipsoid diffuse reflection whiteboard on the primary image plane. A stray light filter device 8 can be provided on the primary image plane to filter out stray light in other directions to ensure that it enters the test. The light beams of the device are all scattered light generated by the ellipsoidal diffuse reflection whiteboard.
本发明提出的基于椭球面漫反射白板的近背向散射光时间测量系统能够避免因散射面漫反射引入时间差的缺陷，实现了近背向散射光的散射时间特性高精度测量。The near backscattered light time measurement system proposed by the present invention based on the ellipsoid surface diffuse reflection white board can avoid the defect of time difference caused by the diffuse reflection of the scattering surface, and achieves high-precision measurement of the scattering time characteristics of the near backscattered light.
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