CN207636486U - Nearly backscattering optics measuring system - Google Patents
Nearly backscattering optics measuring system Download PDFInfo
- Publication number
- CN207636486U CN207636486U CN201721746134.3U CN201721746134U CN207636486U CN 207636486 U CN207636486 U CN 207636486U CN 201721746134 U CN201721746134 U CN 201721746134U CN 207636486 U CN207636486 U CN 207636486U
- Authority
- CN
- China
- Prior art keywords
- shortwave
- long wave
- camera
- light
- nearly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The utility model belongs to field of optical measuring technologies, and in particular to a kind of nearly backscattering optics measuring system, including sampler and measuring device, it is characterised in that：The sampler includes spherical vacuum target chamber and system imaging camera lens, and target spot and scatter plate are provided in the spherical vacuum target chamber；The nearly back-scattering light that target practice laser light incident target spot generates generates diffusing reflection after the scattering of target practice negative direction by scatter plate, after the measurement window to diffuse on spherical vacuum target chamber, enters measuring device using system imaging camera lens.The utility model solves existing backscattering diagnostic techniques and there is technical issues that be difficult to meet the nearly back-scattering light of extensive laser driving apparatus because damage threshold is low.
Description
Technical field
The utility model belongs to field of optical measuring technologies, and in particular to a kind of nearly backscattering optics measuring system.
Background technology
Laser fusion is currently widely used a kind of human controllable's nuclear fusion, it all has ten on civilian and military
Divide great research significance：A kind of inexhaustible Clear nuclear energy source is explored for the mankind；For developing " clean ", (no radiation is dirty
Dye) nuclear weapon, development high energy laser weapon；Partial alternative nuclear tests.
Therefore, laser fusion is paid much attention to by each nuclear power of the world, since second half the 1970s,
The states such as Russia, U.S., day, method, China and British start the development of high-power laser driver in succession.Research of the U.S. in this field is in neck
First status, and formally built up the ultra-large type laser driving apparatus " NIF " comprising 192 tunnels in 2009；The MLF that France is building
Including 240 road laser；Construction large laser driver is also fermenting in Japan, and plans to complete to apply between 2015-2020
In the basic technology research of power generation.China also establishes a series of laser driving apparatus (starlight series, God Light series etc.),
The laser driving apparatus " Shenguang-Ⅲ " for completing the largest domestic built in 2015 includes 48 road laser.
However, U.S. NIF did not succeed in igniting in 2010, this causes larger shock in world wide.NIF with
Afterwards the study found that the original theoretical model verified on small-scale laser driver on NIF no longer be applicable in, NIF practice shooting
The backscattering share of laser is well beyond original desired value, and target practice laser energy is substantially slackened, fusion fuel compression
Symmetry is destroyed, and loss of ignition is caused, it can be seen that backscattering measuring system is in one new Laser Driven dress of understanding
Set the irreplaceable role played in the process.
The country is also relatively early to the research starting of backscattering, and the development of backscattering diagnostic techniques substantially experienced two ranks
Section：
First stage is measured after being sampled to nearly back-scattering light using glass spherical mirror, but the object of the program, mirror body
Normal direction, as three necessarily is on straight line, this arrangement mode is excessively stiff, without flexibility；
Second stage is measured after being focused to nearly back-scattering light using aluminum off-axis ellipsoidal mirror, by adjusting off-axis
The achievable arbitrary light path layout of amount, flexibility ratio are very big, and focusing is very ideal, but the laser damage threshold of metallic mirror surface is relatively low
(it is less than 1J/cm2), using limited on more extensive laser driving apparatus.
Utility model content
The utility model aim is to provide a kind of nearly backscattering optics measuring system, solves existing backscattering and examines
Disconnected technology exists to be difficult to meet the technology of the nearly back-scattering light measurement demand of extensive laser driving apparatus because damage threshold is low
Problem.
The technical solution of the utility model is：A kind of nearly backscattering optics measuring system, including sampler and
Measuring device is characterized in that：The sampler includes spherical vacuum target chamber and system imaging camera lens, described spherical true
Air target is provided with target spot and scatter plate in room；The nearly back-scattering light that target practice laser light incident target spot generates is scattered along target practice negative direction
Diffusing reflection is generated by scatter plate afterwards, after the measurement window to diffuse on spherical vacuum target chamber, using system imaging mirror
Head enters measuring device.
Further, above-mentioned measuring device includes the light beam beam-shrinked mirror and dichroic set gradually along paths direction
Mirror；After the dichroscope detaches spectrum, long wave is transmitted into long wave transmission light measurements unit, and shortwave is reflected into short
Wave reflection light measurement unit.
Further, above-mentioned long wave transmission light measurements unit includes being taken along the long wave camera that paths direction is set gradually
Sample mirror, long wave spectral temporal sampling mirror and long wave energy measurement focus lamp；The long wave camera sampling mirror is saturating by a part of long wave
After penetrating light reflection, through long wave camera imaging lens imaging on long wave camera；The long wave spectral temporal sampling mirror is by another portion
After dividing long wave transmission light reflection, measures coupling mirror through long wave spectral temporal and be coupled in long wave spectral temporal measurement image planes, it is described
Long wave spectral temporal, which measures, is provided with the long wave time fast photoelectric tube of measurement and long wave spectrum sampling optical fiber, the long glistening light of waves in image planes
Spectrum sampling optical fiber is connected with spectrometer；Remaining long wave transmitted light is focused on long wave energy by the long wave energy measurement focus lamp
On calorimeter probe；
The shortwave reflected light measurement unit includes the shortwave camera sampling mirror set gradually along paths direction, shortwave
Spectral temporal sampling mirror and shortwave energy measurement focus lamp；The shortwave camera sampling mirror is by a part of shortwave reflected light back
Afterwards, through shortwave camera imaging lens imaging on shortwave camera；The shortwave spectral temporal sampling mirror is anti-by another part shortwave
After penetrating light reflection, measures coupling mirror through shortwave spectral temporal and be coupled in shortwave spectral temporal measurement image planes, the shortwave spectrum
Time, which measures, is provided with the fast photoelectric tube of shortwave time measurement and shortwave spectrum sampling optical fiber in image planes, the shortwave spectrum samples light
Fibre is connected with spectrometer；Remaining shortwave reflected light is focused on shortwave bulk absorption probe by the shortwave energy measurement focus lamp
On.
Further, above-mentioned long wave spectral temporal measures and is provided with long wave light absorption trap in image planes；The shortwave spectrum
Time measures and is provided with short wavelength light absorption trap in image planes.
Further, long wave camera imaging mirror is provided between above-mentioned long wave camera imaging camera lens and long wave camera sampling mirror
Head iris diaphgram；It is variable that shortwave camera imaging camera lens is provided between the shortwave camera imaging camera lens and shortwave camera sampling mirror
Diaphragm.
Preferably, above system imaging lens image in scatter plate in image planes, it is provided in an image planes
Stray light filter.
Further, being provided with measuring system between above system imaging lens and the measurement window of spherical vacuum target chamber can
Become total diaphragm.
Further, above-mentioned scatter plate is the special-shaped scatter plate with target practice laser channeling.
Further, above-mentioned special-shaped scatter plate is ellipsoid diffusing reflection blank, and it is white that the target spot is located at ellipsoid diffusing reflection
In one focus of plate, the center that the measuring system can be changed total diaphragm is located at another focus of ellipsoid diffusing reflection blank
On.
Further, above-mentioned long wave camera and shortwave camera are gate ICCD cameras.
The beneficial effects of the utility model are：
(1) scatter plate is arranged in the utility model between target practice ray and target spot, and closely backwards using scatter plate diffusing reflection
Light is scattered, is measured for subsequent scattering energy measurement, scattering spectrum and scattering time measures.Scatter plate has damage threshold high
The advantages of, it disclosure satisfy that the measurement demand of the nearly back-scattering light of extensive laser driving apparatus.
(2) image planes are arranged in the utility model in sampling light path, are conducive to other with the method removal of space filtering
The stray light in direction.
(3) the utility model utilizes ICCD cameras using the spatial distribution for scattering light on ICCD cameras record scatter plates
Veiling glare except the time shutter shielding scattering period.
(4) the utility model calculates scattering energy using the intensity of ICCD camera epigraphs, and measures energy using energy meter
Amount is mutually veritified.
(5) the utility model can be changed total diaphragm in system front end setting system, being capable of the company of realization for controlling total light flux
Continuous energy attenuation.
(6) the utility model measures same in image planes in the corresponding spectral temporal of long wave measuring unit and shortwave measuring unit
When place spectrum sampling optical fiber and the time measures fast photoelectric tube, a branch realizes two kinds of functions, improves measurement efficiency.
Description of the drawings
Fig. 1 is the preferred embodiment structural schematic diagram of the utility model sampler.
Fig. 2 is the preferred embodiment structural schematic diagram of the utility model measuring device.
Fig. 3 is the long wave transmission light measurements cell mesh structural schematic diagram of the utility model measuring device.
Fig. 4 is the shortwave reflected light measurement cell mesh structural schematic diagram of the utility model measuring device.
Wherein, reference numeral is：The spherical vacuum target chambers of 1-, 2- target practice laser, 3- target spots, the nearly back-scattering lights of 4-, 5- dissipate
Plate is penetrated, 6- diffuses, 7- measurement windows, 8- system imaging camera lenses, and 9- measuring systems can be changed total diaphragm, the filtering of 10- stray lights
Device, 11- light beam beam-shrinked mirrors, 12- dichroscopes, 13- long wave camera sampling mirrors, 14- long wave spectral temporal sampling mirrors, 15- long
Wave energy measurement focus lamp, 16- long wave bulk absorptions probe, 17- long wave camera imaging camera lens iris diaphgrams, 18- long wave cameras
Imaging lens, 19- long wave cameras, 20- long wave spectral temporals measure image planes, and the 21- long wave times measure fast photoelectric tube, 22- long waves
Spectrum sampling optical fiber, 23- long wave light absorption traps, 24- long wave spectral temporals measurement coupling mirror, 25- shortwave camera sampling mirrors,
26- shortwave spectral temporal sampling mirrors, 27- shortwave energy measurement focus lamps, 28- shortwave bulk absorptions probe, 29- short wavelength light time spectrums
Between measure coupling mirror, 30- shortwave spectral temporals measure image planes, 31- short wavelength lights absorption trap, and 32- shortwave spectrum sample optical fiber,
The 33- shortwave times measure fast photoelectric tube, 34- shortwave camera imaging camera lens iris diaphgrams, 35- shortwave cameras, 36- shortwaves camera at
As camera lens.
Specific implementation mode
The present embodiment is a kind of nearly backscattering optics measuring system, and structure includes sampler and measuring device.
Referring to Fig. 1, sampler includes spherical vacuum target chamber 1 and system imaging camera lens 8, is arranged in spherical vacuum target chamber 1
There are target spot 3 and scatter plate 5；The nearly back-scattering light 4 that the incident target spot 3 of target practice laser 2 generates is after the scattering of target practice negative direction by dissipating
It penetrates plate 5 and generates diffusing reflection, after the measurement window 7 that 6 pass through on spherical vacuum target chamber that diffuses, using system imaging camera lens 8
Into measuring device.It is variable total that measuring system is provided between system imaging camera lens 8 and the measurement window 7 of spherical vacuum target chamber 1
Diaphragm 9, for controlling total thang-kng amount.Scatter plate 5 is the special-shaped scatter plate with target practice laser channeling.Preferably, the present embodiment
It can set special-shaped scatter plate to ellipsoid diffusing reflection blank, target spot 3 is located in a focus of ellipsoid diffusing reflection blank,
The center that measuring system can be changed total diaphragm 9 is located in another focus of ellipsoid diffusing reflection blank.According to the characteristic of ellipsoid
It is found that it is all aplanatic for can be changed each light of total diaphragm 9 from target spot 3 to measuring system, therefore no time may be implemented
Difference sampling.
Referring to Fig. 2, system imaging camera lens 8 images in scatter plate in image planes, and stray light is provided in an image planes
Filter 10, the interference light for shielding wall scattering in the target chamber except scatter plate.
Measuring device includes the light beam beam-shrinked mirror 11 set gradually along paths direction and dichroscope 12；Light beam shrink beam
Mirror 11 is for controlling beam size, and dichroscope 12 is for carrying out spectrum separation, long wave (wavelength is the light of 400nm-1000nm)
It is transmitted and enters long wave transmission light measurements unit, shortwave (wavelength is the light of 351nm ± 5nm) is reflected into shortwave and reflects flash ranging
Measure unit.
Referring to Fig. 3, long wave transmission light measurements unit includes the long wave camera sampling mirror set gradually along paths direction
13, long wave spectral temporal sampling mirror 14 and long wave energy measurement focus lamp 15；Long wave camera sampling mirror 13 is saturating by a part of long wave
After penetrating light reflection, it is imaged on long wave camera 19 through long wave camera imaging camera lens 18；Long wave spectral temporal sampling mirror 14 will be another
After the long wave transmission light reflection of part, measures coupling mirror 24 through long wave spectral temporal and be coupled to long wave spectral temporal measurement image planes 20
On, long wave spectral temporal, which measures, is provided with the long wave time fast photoelectric tube 21 of measurement and long wave spectrum sampling optical fiber 22 in image planes 20,
Long wave spectrum sampling optical fiber 22 is connected with spectrometer carries out spectral measurement, and the long wave time measures fast photoelectric tube 21 for carrying out the time
It measures；Long wave energy measurement focus lamp 15 by remaining long wave transmitted light focus on long wave bulk absorption probe 16 on, for into
Row energy measurement.
According to the energy proportion needed for camera, spectral measurement, energy measurement detector, 13 He of long wave camera sampling mirror is utilized
Ratio distribution is fixed in long wave spectral temporal sampling mirror 14.Because the dynamic range of long wave camera 13 is relatively minimal, in order to protect
Camera normal work is demonstrate,proved, long wave camera imaging camera lens is provided between long wave camera imaging camera lens 18 and long wave camera sampling mirror 13
Iris diaphgram 17 further controls luminous flux.
In long wave transmission light measurements unit, system imaging camera lens 8, light beam beam-shrinked mirror 11 and long wave spectral temporal measure
24 three of coupling mirror constitutes an imaging system, and measuring system can be changed total diaphragm 9 and is imaged on long wave spectral temporal measurement picture by it
On face 20, the long wave time measures fast photoelectric tube 21 and the end face of long wave spectrum sampling optical fiber 22 is respectively provided in this image planes, due to
Image planes are larger, and the part long wave light absorption trap 23 not being utilized sponges, and avoids the formation of veiling glare.
Referring to Fig. 4, shortwave reflected light measurement unit includes the shortwave camera sampling mirror set gradually along paths direction
25, shortwave spectral temporal sampling mirror 26 and shortwave energy measurement focus lamp 27；Shortwave camera sampling mirror 25 is anti-by a part of shortwave
After penetrating light reflection, it is imaged on shortwave camera 35 through shortwave camera imaging camera lens 36；Shortwave spectral temporal sampling mirror 26 will be another
After the shortwave reflected light back of part, measures coupling mirror 29 through shortwave spectral temporal and be coupled to shortwave spectral temporal measurement image planes 30
On, shortwave spectral temporal, which measures, is provided with the fast photoelectric tube 33 of shortwave time measurement and shortwave spectrum sampling optical fiber 32 in image planes 30,
Shortwave spectrum sampling optical fiber 32 is connected with spectrometer carries out spectral measurement, and the shortwave time measures fast photoelectric tube 33 for carrying out the time
It measures；Shortwave energy measurement focus lamp 27 by remaining shortwave reflected light focus on shortwave bulk absorption probe 28 on, for into
Row energy measurement.
According to the energy proportion needed for camera, spectral measurement, energy measurement detector, 25 He of shortwave camera sampling mirror is utilized
Ratio distribution is fixed in shortwave spectral temporal sampling mirror 26.Because the dynamic range of shortwave camera 35 is relatively minimal, in order to protect
Camera normal work is demonstrate,proved, shortwave camera imaging camera lens is provided between shortwave camera imaging camera lens 36 and shortwave camera sampling mirror 25
Iris diaphgram 34 further controls luminous flux.
In shortwave transmission light measurements unit, system imaging camera lens 8, light beam beam-shrinked mirror 11 and shortwave spectral temporal measure
29 three of coupling mirror constitutes an imaging system, and measuring system can be changed total diaphragm 9 and is imaged on shortwave spectral temporal measurement picture by it
On face 30, the shortwave time measures fast photoelectric tube 33 and the end face of shortwave spectrum sampling optical fiber 32 is respectively provided in this image planes, due to
Image planes are larger, and the part short wavelength light absorption trap 31 not being utilized sponges, and avoids the formation of veiling glare.
Gate ICCD cameras may be used in long wave camera 13 and shortwave camera 35, and light is scattered on scatter plate for recording
Spatial distribution, and utilize the veiling glare except the time shutter of the camera shielding scattering period.
Claims (10)
1. a kind of nearly backscattering optics measuring system, including sampler and measuring device, it is characterised in that：The sampling dress
It sets including spherical vacuum target chamber and system imaging camera lens, target spot and scatter plate is provided in the spherical vacuum target chamber；It practices shooting and swashs
The nearly back-scattering light that light incidence target spot generates by scatter plate generates diffusing reflection after the scattering of target practice negative direction, diffuse across
After measurement window on spherical vacuum target chamber, enter measuring device using system imaging camera lens.
2. nearly backscattering optics measuring system according to claim 1, it is characterised in that：The measuring device includes edge
The light beam beam-shrinked mirror and dichroscope that paths direction is set gradually；After the dichroscope detaches spectrum, long wave is saturating
It injects into long wave transmission light measurements unit, shortwave is reflected into shortwave reflected light measurement unit.
3. nearly backscattering optics measuring system according to claim 2, it is characterised in that：The long wave transmission light measurements
Unit includes being surveyed along long wave camera sampling mirror, long wave spectral temporal sampling mirror and the long wave energy that paths direction is set gradually
Measure focus lamp；After a part of long wave is transmitted light reflection by the long wave camera sampling mirror, exist through long wave camera imaging lens imaging
On long wave camera；After another part long wave is transmitted light reflection by the long wave spectral temporal sampling mirror, surveyed through long wave spectral temporal
Amount coupling mirror is coupled to long wave spectral temporal and measures in image planes, and the long wave spectral temporal measures and is provided with the long wave time in image planes
Fast photoelectric tube and long wave spectrum sampling optical fiber are measured, the long wave spectrum sampling optical fiber is connected with spectrometer；The long wave energy
Focus lamp is measured to focus on remaining long wave transmitted light on long wave bulk absorption probe；
The shortwave reflected light measurement unit includes the shortwave camera sampling mirror set gradually along paths direction, shortwave spectrum
Time sampling mirror and shortwave energy measurement focus lamp；The shortwave camera sampling mirror is passed through after a part of shortwave reflected light back
Shortwave camera imaging lens imaging is on shortwave camera；The shortwave spectral temporal sampling mirror is anti-by another part shortwave reflected light
After penetrating, measures coupling mirror through shortwave spectral temporal and be coupled in shortwave spectral temporal measurement image planes, the shortwave spectral temporal is surveyed
The fast photoelectric tube of shortwave time measurement and shortwave spectrum sampling optical fiber, the shortwave spectrum sampling optical fiber and light are provided in amount image planes
Spectrometer is connected；The shortwave energy measurement focus lamp focuses on remaining shortwave reflected light on shortwave bulk absorption probe.
4. nearly backscattering optics measuring system according to claim 3, it is characterised in that：The long wave spectral temporal is surveyed
It is provided with long wave light absorption trap in amount image planes；The shortwave spectral temporal measures and is provided with short wavelength light absorption trap in image planes.
5. nearly backscattering optics measuring system according to claim 4, it is characterised in that：The long wave camera imaging mirror
It is provided with long wave camera imaging camera lens iris diaphgram between head and long wave camera sampling mirror；The shortwave camera imaging camera lens with it is short
Shortwave camera imaging camera lens iris diaphgram is provided between wave camera sampling mirror.
6. according to any nearly backscattering optics measuring system in claim 1-5, it is characterised in that：The system at
As camera lens images in scatter plate in image planes, stray light filter is provided in an image planes.
7. nearly backscattering optics measuring system according to claim 6, it is characterised in that：The system imaging camera lens with
It is provided with measuring system between the measurement window of spherical vacuum target chamber and can be changed total diaphragm.
8. nearly backscattering optics measuring system according to claim 7, it is characterised in that：The scatter plate is to carry to beat
The special-shaped scatter plate of target laser channeling.
9. nearly backscattering optics measuring system according to claim 8, it is characterised in that：The abnormity scatter plate is ellipse
Spherical surface diffusing reflection blank, the target spot are located in a focus of ellipsoid diffusing reflection blank, and the measuring system can be changed total light
The center of door screen is located in another focus of ellipsoid diffusing reflection blank.
10. nearly backscattering optics measuring system according to claim 9, it is characterised in that：The long wave camera and short
Wave camera is gate ICCD cameras.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721746134.3U CN207636486U (en) | 2017-12-14 | 2017-12-14 | Nearly backscattering optics measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721746134.3U CN207636486U (en) | 2017-12-14 | 2017-12-14 | Nearly backscattering optics measuring system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207636486U true CN207636486U (en) | 2018-07-20 |
Family
ID=62862886
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721746134.3U Active CN207636486U (en) | 2017-12-14 | 2017-12-14 | Nearly backscattering optics measuring system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207636486U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108333147A (en) * | 2017-12-14 | 2018-07-27 | 中国科学院西安光学精密机械研究所 | Nearly backscattering optics measuring system |
-
2017
- 2017-12-14 CN CN201721746134.3U patent/CN207636486U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108333147A (en) * | 2017-12-14 | 2018-07-27 | 中国科学院西安光学精密机械研究所 | Nearly backscattering optics measuring system |
| CN108333147B (en) * | 2017-12-14 | 2024-04-12 | 中国科学院西安光学精密机械研究所 | Near back scattering optical measurement system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102749184B (en) | Large field-of-view stray light PST (point source transmittance) testing method and device | |
| CN111060289B (en) | High-sensitivity coronagraph stray light detection device | |
| US4215274A (en) | X-ray detector with picosecond time resolution | |
| CN101706548A (en) | Optical detection device for corona discharge | |
| CN110108677A (en) | Biological delayed luminescence detection system | |
| CN102539254B (en) | Digital laser dynamic caustics experiment method and system thereof | |
| CN202710290U (en) | Large visual field stray light PST testing device | |
| CN108693088B (en) | Atmospheric particulate monitoring scanning polarization laser radar system | |
| CN102175431A (en) | Device for measuring point source stray light transmission coefficient in large dynamic range | |
| CN106018346A (en) | Aerosol scattering phase function observing device and method | |
| CN108731805A (en) | Absorption based on mobile intelligent terminal and fluorescence spectrum detecting device | |
| CN207636486U (en) | Nearly backscattering optics measuring system | |
| Froula et al. | Full-aperture backscatter measurements on the National Ignition Facility | |
| CN108333147A (en) | Nearly backscattering optics measuring system | |
| CN110955107A (en) | Ultra-high-speed time resolution camera shooting device and method based on reflection imaging technology | |
| CN207636278U (en) | The nearly backscattering light measurement system of anti-interference of stray light | |
| CN207636277U (en) | Nearly back-scattering light time measurement system based on ellipsoid diffusing reflection blank | |
| CN106645082A (en) | Gating optical fiber Raman spectrometer based on laser ranging automatic focusing | |
| CN206164747U (en) | Measurement device for X ray framing camera exposure time | |
| Kirkwood et al. | Imaging backscattered and near to backscattered light in ignition scale plasmas | |
| CN107991064A (en) | The nearly backscattering light measurement system of anti-interference of stray light | |
| CN110553735A (en) | Stability test system of solar spectrum irradiance monitor | |
| CN207636185U (en) | Full aperture backscattering light measurement system for boundling target practice laser | |
| CN113484292B (en) | Supersonic combustion instantaneous flame structure high-space-time resolution visualization system | |
| CN112040116B (en) | Non-vision field dynamic imaging method and device based on aperture-division gating camera |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |