CN108168702B - Full-aperture back scattered light measurement system based on scattering plate scattering sampling - Google Patents

Full-aperture back scattered light measurement system based on scattering plate scattering sampling Download PDF

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CN108168702B
CN108168702B CN201711343139.6A CN201711343139A CN108168702B CN 108168702 B CN108168702 B CN 108168702B CN 201711343139 A CN201711343139 A CN 201711343139A CN 108168702 B CN108168702 B CN 108168702B
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measuring
scattering
energy
measurement
spectrum
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CN108168702A (en
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闫亚东
何俊华
许瑞华
齐文博
韦明智
吴冰静
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XiAn Institute of Optics and Precision Mechanics of CAS
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XiAn Institute of Optics and Precision Mechanics of CAS
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412—Scattering spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0295—Constructional arrangements for removing other types of optical noise or for performing calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
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    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
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    • G01—MEASURING; TESTING
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    • G01J1/00—Photometry, e.g. photographic exposure meter
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    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0474—Diffusers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0248—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using a sighting port, e.g. camera or human eye
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J2001/0276—Protection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1213—Filters in general, e.g. dichroic, band
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/10—Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The invention belongs to the technical field of optical measurement, and particularly relates to a full-aperture back scattered light measurement system based on scattering sampling of a scattering plate. The invention adopts a probe group to directly measure diffuse reflection light of the off-axis parabolic scattering plate, and particularly comprises spatial distribution measurement, spectrum measurement, time measurement, energy measurement and the like, thereby remarkably simplifying sampling and measuring light paths, overcoming the defect of huge system volume by adopting a long focal lens, being particularly suitable for the condition of multi-beam laser beam combining targeting and meeting the requirement of full-aperture back scattering diagnosis of a large-scale laser driving device.

Description

Full-aperture back scattered light measurement system based on scattering plate scattering sampling
Technical Field
The invention belongs to the technical field of optical measurement, and particularly relates to a full-aperture back scattered light measurement system based on scattering sampling of a scattering plate.
Background
The laser nuclear fusion is an artificially controllable nuclear fusion which is commonly adopted at present, and has great research significance in civil use and military use: exploring an inexhaustible clean nuclear energy source for human beings; the method is used for developing a 'clean' (no radiation pollution) nuclear weapon and developing a high-energy laser weapon; partial replacement nuclear experiments.
Therefore, laser nuclear fusion is highly valued by the large countries of the world, and the development of high-power laser drivers is successively started in russia, america, sun, law, middley, english and other countries from the last half of the 70 th year of the 20 th century. Research in this area of the united states is leading and formally built into an oversized laser driving device "NIF" containing 192 passes in 2009; the MLF being built in france contains 240 lasers; japan is also planning to build large-scale laser drivers and plan to complete basic technical research applicable to power generation in 2015-2020. China also established a series of laser driving devices (starlight series, nerve light series, etc.), the largest domestic laser driving device "nerve light-iii" that completed construction in 2015 contained 48 laser lines.
However, the ignition of the us NIF in 2010 was unsuccessful, which caused a major shock worldwide. Subsequent studies of NIF found that the theoretical model originally verified on smaller scale laser drivers was no longer applicable on NIF, the back-scattered fraction of NIF targeting laser was greatly exceeded the original expected value, targeting laser energy was greatly diminished, fusion fuel compression symmetry was destroyed, and ignition failure was caused, thus seeing the irreplaceable role of the back-scattered measurement system in the construction of a new laser driver.
Research on backscattering in China starts earlier, and the development of backscattering diagnosis technology is approximately subjected to two stages:
in the first stage, a large-caliber long-focal-length Fresnel lens is adopted to focus the full-aperture back scattered light, and optical measurement is carried out near a focal point. However, the fresnel lens is made of optical plastics, so that the nonlinear effect is serious under the action of strong light, and the application of the fresnel lens is restricted.
And in the second stage, the full-aperture back-scattered light is focused by adopting a large-caliber metal off-axis parabolic reflector, and the light beam is spectrally separated (divided into a Raman scattering spectrum and a Brillouin scattering spectrum) by utilizing a dichroic mirror before the light beam is focused. After separation, respectively performing spatial filtering at focuses of the Raman scattered light beams and the Brillouin scattered light beams to filter interference of stray light; then, the two light beams are respectively collimated and sampled for multiple times, and spatial distribution measurement, spectrum measurement, time measurement and energy measurement are sequentially carried out. According to the scheme, the stray light prevention effect is better through filtering, but the laser damage threshold of the metal off-axis parabolic mirror is not high, and the system is huge. The full-aperture back scattering energy of a future ultra-large scale laser fusion device is higher, and a metal mirror is extremely vulnerable; and the light beam integration level is higher, the space is limited, and the diagnosis equipment with huge volume is difficult to be applicable.
Disclosure of Invention
The invention aims to provide a full-aperture back scattered light measuring system based on scattering sampling of a scattering plate, which solves the technical problems of low damage threshold and huge volume of the existing diagnostic equipment.
The technical scheme of the invention is as follows: a full-aperture back scattered light measuring system based on scattering sampling of a scattering plate is characterized in that: the system comprises an off-axis parabolic scattering plate and a probe group positioned at the focus of the off-axis parabolic scattering plate, wherein the probe group comprises two energy measuring units, two time measuring units, two spectrum measuring units, a calibration probe unit and a space distribution measuring unit; the two energy measuring units are used for measuring long-wave energy and short-wave energy respectively, the two time measuring units are used for measuring long-wave time and short-wave time respectively, and the two spectrum measuring units are used for measuring long-wave spectrum and short-wave spectrum respectively.
Preferably, the energy measuring unit includes an energy measuring bandpass filter, an energy measuring iris, an energy measuring condenser lens, and an energy meter, which are sequentially disposed along the optical path direction.
Further, in the energy measuring unit for measuring the long wave energy, the light transmission bandwidth of the energy measuring bandpass filter is 400-700nm; in the energy measuring unit for short wave energy measurement, the light transmission bandwidth of the energy measuring bandpass filter is 351+ -3 nm.
Preferably, the time measuring unit includes a time measuring bandpass filter, a time measuring coupling lens, and a fast photocell, which are sequentially disposed along the direction of the optical path.
Further, in the time measurement unit for long-wave time measurement, the light transmission bandwidth of the time measurement bandpass filter is 400-700nm; in a time measurement unit for short-wave time measurement, the light transmission bandwidth of the time measurement bandpass filter is 351+ -3 nm.
Preferably, the spectrum measuring unit comprises a spectrum measuring bandpass filter, a spectrum measuring diaphragm, a spectrum measuring coupling lens and a multimode optical fiber which are sequentially arranged along the direction of the light path, and the multimode optical fiber is connected with the spectrometer.
Further, in the spectrum measuring unit for long-wave spectrum measurement, the light transmission bandwidth of the spectrum measuring bandpass filter is 400-700nm; in a spectrum measuring unit for short-wave spectrum measurement, the light transmission bandwidth of a spectrum measuring bandpass filter is 351+/-3 nm.
Preferably, the calibration probe unit comprises an optoelectronic probe and a rotatable protective cover plate.
Preferably, the spatial distribution measurement unit includes a spatial distribution imaging lens and an ICCD camera, and a spatial distribution measurement iris is disposed in the spatial distribution imaging lens.
The invention has the beneficial effects that: the invention provides a full-aperture back scattered light measurement system based on scattering sampling of a scattering plate. The scattering plate has high damage threshold, and the problem of low damage threshold of the existing diagnostic equipment is solved; the diffuse reflection light of the scattering plate is directly measured (particularly comprising spatial distribution measurement, spectrum measurement, time measurement and energy measurement) by adopting one probe group, so that the sampling and measuring light path is obviously simplified, the defect of huge system volume by adopting a long-focus focusing lens is overcome, the method is particularly suitable for the situation of multi-beam laser beam combination targeting, and the requirement of full-aperture back scattering diagnosis of a large-scale laser driving device can be met.
Drawings
Fig. 1 is a schematic diagram of a measurement light path structure of a full-aperture back-scattered light measurement system based on scattering sampling of a scattering plate.
Fig. 2 is a schematic plan view of a probe set according to the present invention.
FIG. 3 is a schematic diagram of the energy measuring unit according to the present invention.
Fig. 4 is a schematic diagram of a time measurement unit according to the present invention.
FIG. 5 is a schematic diagram of a spectrum measuring unit according to the present invention.
FIG. 6 is a schematic diagram of the structure of the calibration probe unit of the present invention.
FIG. 7 is a schematic diagram of a spatial distribution measuring unit according to the present invention.
FIG. 8 is a schematic diagram of the layout of the optical path of the invention applied to eight laser beam combining targeting conditions.
Fig. 9 is a side view of the optical path of fig. 8.
Wherein, the reference numerals are as follows: the device comprises a 1-full aperture back scattering beam, a 2-off-axis parabolic scattering plate, a 3-probe set, a 31-energy measuring unit, a 311-energy measuring bandpass filter, a 312-energy measuring iris diaphragm, a 313-energy measuring condensing lens, a 314-energy meter, a 32-time measuring unit, a 321-time measuring bandpass filter, a 322-time measuring coupling lens, a 323-fast photoelectric tube, a 33-spectrum measuring unit, a 331-spectrum measuring bandpass filter, a 332-spectrum measuring diaphragm, a 333-spectrum measuring coupling lens, a 334-multimode optical fiber, a 34-calibration probe unit, a 341-photoelectric probe, a 342-rotatable protective cover plate, a 343-stepper motor, a 35-spatial distribution measuring unit, a 351-spatial distribution imaging lens, a 352-ICCD camera and a 353-spatial distribution measuring iris diaphragm.
Detailed Description
Referring to fig. 1, the present invention provides a full aperture back-scattered light measuring system based on scattering sampling of a scattering plate, which comprises an off-axis parabolic scattering plate 2 and a probe set 3 positioned at a focus of the off-axis parabolic scattering plate 2, the parabolic design being for reducing time measurement errors, and the off-axis design being for preventing the probe set from blocking an optical path. According to the optical common sense, there is no aberration at the focus of the paraboloid, i.e. the optical paths of the various rays arriving at the focus are equal, and there is no time difference. The approximately parallel full-aperture back-scattered light beam 1 is incident on the off-axis parabolic type scattering plate 2, and the diffuse reflected light of the off-axis parabolic type scattering plate 2 is received by the probe group 3 and is subjected to scattering time measurement, scattered light spatial distribution measurement, scattered energy measurement, scattered spectrum measurement and the like.
Referring to fig. 2, the probe set 3 includes two energy measuring units 31, two time measuring units 32, two spectrum measuring units 33, one calibration probe unit 34, and one spatial distribution measuring unit 35. The two energy measuring units 31 are used for measuring long wave energy and short wave energy, the two time measuring units 32 are used for measuring long wave time and short wave time, and the two spectrum measuring units 33 are used for measuring long wave spectrum and short wave spectrum.
Referring to fig. 3, the energy measuring unit 31 includes an energy measuring bandpass filter 311, an energy measuring iris 312, an energy measuring condenser lens 313, and an energy meter 314, which are sequentially disposed in the optical path direction. When the energy measuring band-pass filter 311 is applied to long-wave measurement, the light transmission bandwidth of the energy measuring band-pass filter 311 is 400-700nm; when the method is applied to short wave measurement, the light transmission bandwidth of the energy measurement bandpass filter 311 is 351+/-3 nm. The energy measurement iris 312 can adjust the amount of light passing to meet the needs of various experiments for different levels of scattering.
Referring to fig. 4, the time measurement unit 32 includes a time measurement bandpass filter 321, a time measurement coupling lens 322, and a fast photodiode 323, which are sequentially disposed in the optical path direction. When the method is applied to long-wave measurement, the light transmission bandwidth of the time measurement band-pass filter 321 is 400-700nm; when the method is applied to short wave measurement, the light transmission bandwidth of the time measurement band-pass filter 321 is 351+/-3 nm. In the scattering time measurement, in order to reduce the time measurement error, the surface shape of the scattering plate is designed as a paraboloid, and the probe group is placed at the focus of the paraboloid, so that the time dispersion at the focus of the paraboloid is zero theoretically, which is very beneficial to the time measurement unit.
Referring to fig. 5, the spectrum measuring unit 33 includes a spectrum measuring bandpass filter 331, a spectrum measuring diaphragm 332, a spectrum measuring coupling lens 333, and a multimode optical fiber 334, which are sequentially disposed in the optical path direction, the multimode optical fiber 334 being connected to a spectrometer. When the spectrum measuring band-pass filter 331 is applied to long-wave measurement, the light transmission bandwidth of the spectrum measuring band-pass filter 331 is 400-700nm; when the method is applied to short wave measurement, the light transmission bandwidth of the spectrum measurement band-pass filter 331 is 351+/-3 nm.
Referring to fig. 6, the calibration probe unit 34 includes an optoelectronic probe 341 and a rotatable protective cover plate 342. The rotatable protective cover 342 can be rotated by the stepper motor 343, and is opened at the time of calibration, and closed after the calibration is finished to protect the photoelectric probe 341.
Referring to fig. 7, the spatial distribution measuring unit 35 includes a spatial distribution imaging lens 351 and an ICCD camera 352, and a spatial distribution measuring iris 353 is provided inside the spatial distribution imaging lens 351. The spatial distribution measurement iris 353 can control the amount of light passing, preventing underexposure or oversaturation of the ICCD camera 352.
Referring to fig. 8 and 9, for the case of 8 beam clustering (8 lasers enclosing a square, at the four corners and the midpoints of the four sides, respectively) targeting, one layout of a full aperture backscatter measurement system is shown in fig. 8. The advantages of this layout are: compact structure, mutually independent and mutually noninterfere.

Claims (9)

1. A full aperture back scattered light measurement system based on scattering sampling of a scattering plate is characterized in that: the system comprises an off-axis parabolic scattering plate and a probe group positioned at the focus of the off-axis parabolic scattering plate, wherein the probe group comprises two energy measuring units, two time measuring units, two spectrum measuring units, a calibration probe unit and a space distribution measuring unit; the two energy measuring units are used for measuring long-wave energy and short-wave energy respectively, the two time measuring units are used for measuring long-wave time and short-wave time respectively, and the two spectrum measuring units are used for measuring long-wave spectrum and short-wave spectrum respectively.
2. The full aperture back scattered light measurement system based on scattering sampling of a scattering plate of claim 1, wherein: the energy measuring unit comprises an energy measuring bandpass filter, an energy measuring iris diaphragm, an energy measuring condensing lens and an energy meter which are sequentially arranged along the direction of the light path.
3. The full aperture back scattered light measurement system based on scattering plate scattering sampling of claim 2, wherein: in the energy measuring unit for measuring the long wave energy, the light transmission bandwidth of the energy measuring bandpass filter is 400-700nm; in the energy measuring unit for short wave energy measurement, the light transmission bandwidth of the energy measuring bandpass filter is 351+ -3 nm.
4. The full aperture back scattered light measurement system based on scattering sampling of a scattering plate of claim 1, wherein: the time measuring unit comprises a time measuring bandpass filter, a time measuring coupling lens and a fast photoelectric tube which are sequentially arranged along the direction of the light path.
5. The full aperture back scattered light measurement system based on scattering plate scattering sampling of claim 4, wherein: in a time measurement unit for measuring long wave time, the light transmission bandwidth of the time measurement bandpass filter is 400-700nm; in a time measurement unit for short-wave time measurement, the light transmission bandwidth of the time measurement bandpass filter is 351+ -3 nm.
6. The full aperture back scattered light measurement system based on scattering sampling of a scattering plate of claim 1, wherein: the spectrum measuring unit comprises a spectrum measuring bandpass filter, a spectrum measuring diaphragm, a spectrum measuring coupling lens and a multimode optical fiber which are sequentially arranged along the direction of the light path, and the multimode optical fiber is connected with the spectrometer.
7. The full aperture back scattered light measurement system based on scattering plate scattering sampling of claim 6, wherein: in a spectrum measuring unit for long-wave spectrum measurement, the light transmission bandwidth of a spectrum measuring bandpass filter is 400-700nm; in a spectrum measuring unit for short-wave spectrum measurement, the light transmission bandwidth of a spectrum measuring bandpass filter is 351+/-3 nm.
8. The full aperture back scattered light measuring system based on scattering sampling of any of claims 1 to 7, wherein: the calibration probe unit comprises a photoelectric probe and a rotatable protective cover plate.
9. The full aperture back scattered light measuring system based on scattering sampling of any of claims 1 to 7, wherein: the spatial distribution measuring unit comprises a spatial distribution imaging lens and an ICCD camera, and a spatial distribution measuring iris diaphragm is arranged in the spatial distribution imaging lens.
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