CN107957237B - 具有闪光对准的激光投影仪 - Google Patents

具有闪光对准的激光投影仪 Download PDF

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CN107957237B
CN107957237B CN201710964912.4A CN201710964912A CN107957237B CN 107957237 B CN107957237 B CN 107957237B CN 201710964912 A CN201710964912 A CN 201710964912A CN 107957237 B CN107957237 B CN 107957237B
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K·D·鲁博
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Veltec Vision International Ltd
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Abstract

本申请涉及具有闪光对准的激光投影仪。提供了一种对准用于将激光图像投影到工作表面上的激光投影仪的方法。方该法包括提供具有激光源、次级光源和摄影测量设备的激光投影仪组件，所述激光源用于将激光图像投影到工作表面上，所述次级光源用于照明工作表面，以及所述摄影测量设备用于生成工作表面的图像。所述方法还包括将反射目标附加到工作表面上并且从次级光源朝着工作表面发射光以及朝着摄影测量设备反射光。所述方法还包括用由激光源生成的激光束扫描目标，用于朝着激光传感器反射激光束并且根据反射激光束计算用于在工作表面上投影激光图像的定位。

Description

具有闪光对准的激光投影仪
先前申请
本申请要求于2016年10月17日提交的美国临时专利申请No.62/408,944的优先权，该美国临时申请的内容通过引用包括到本文。
技术领域
本发明一般而言涉及用于投影激光模板的改进方法。更具体地，本发明涉及将激光投影仪与在其上投影激光模板的三维工作表面进行对准的改进方法。
背景技术
不断增加的加工公差已经要求制造技术上的改进。一种这样的改进是将激光模板投影到工作表面上用于指导制造过程。这种技术已经允许以之前不可实现的公差制造产品。但是，对现有技术的约束限制了激光投影图像在工业应用中的更广泛的使用。例如，由于在制造环境中操作的同时不能够快速地识别三维工作表面以及不能以精确的方式将激光束聚焦到三维工作表面上，因此将模板投影到三维表面上已经被证明是困难的。
将模板图案准确投影到三维工作表面上需要精确校准工作表面和激光投影仪之间的相对位置。最初，这通过以下的方式实现：将反射目标定位在工作表面上、测量相对于工作表面的三维坐标系的目标坐标、以及然后使用计算投影仪的位置的处理来定位投影仪相对于工作表面的位置，其中到目标的已知激光投影通过已知三维目标坐标。周期性地，模板扫描序列停止并且目标被定位，以检查由于投影仪相对于工具的位置的改变引起的投影图案位置的变化，或者补偿其他因素，诸如例如由于环境中温度变化引起的漂移。当检测到变化时，目标被重定位，新的模板扫描序列被计算并且重新由激光投影仪发射。
已经证明与使用常规激光投影仪扫描目标位置相关联的时间是慢的和低效的。因此，评估投影漂移只是间歇地执行并且校正投影图案导致可见图案模板的明显中断。
因此，期望开发相对于激光投影仪定位三维工作表面的更有效的方法，以提高激光模板投影的准确性和质量。
发明内容
公开了一种对准用于将激光图像投影到工作表面上的激光投影仪的方法。激光投影仪组件提供有激光源，用于将激光图像投影到工作表面上。次级光源照明工作表面并且摄影测量设备生成工作表面的图像。反射目标附加到工作表面。从次级光源朝着工作表面发射的光朝着摄影测量设备反射，用于确定三维坐标系中工作表面的定位。在确定三维坐标系中工作表面的定位后，用由激光源生成的激光束扫描目标，用于朝着激光传感器反射激光束。激光传感器信号通知处理器根据反射激光束计算用于将激光图像投影到工作表面上的定位。
朝着工作表面闪光的次级光源与工件的组合以及附接到工件的激光反射目标都增强了快速识别用于扫描工作表面上的激光模板的准确定位的能力。这种方法通过显著地减少在漂移或动态移动的情况下重定位工作表面所需的时间量来提高激光模板的质量。此外，摄影测量设备在同时识别工作表面的三维配置的同时信号通知处理器附接到工件的目标的一般定位。这个消除激光扫描器独立地定位目标的需求的步骤进一步减少了对准时间。
附图说明
当结合附图考虑，通过参考以下的具体实施方式更好地理解本发明时，将容易认识本发明的其他优点，其中：
图1示出本发明的激光投影仪的相关部分的示意图；
图2示出次级光源朝工件发射光；
图3示出来自次级光源的光被反射到激光投影仪的摄影测量组件；
图4示出激光投影仪朝附接到工件的反射目标投影的激光束；
图5示出从附接到工件的反射目标朝激光投影仪反射的激光束；以及
图6示出具有从激光投影仪组件投影的激光模板的工件的透视图。
具体实施方式
在图1以10一般地示出用于实践本发明的方法的激光投影仪组件的示意图。组件10包括以已知方式生成激光束14的激光源12。激光束14通过聚焦透镜16朝着分束器18投影。分束器18将激光束14朝着检流计组件20重定向。分束器18允许激光束14的一部分通过光传感器22。
光传感器22通过闭环处理的方式提供可靠的功率输出控制。照此，光传感器22通过用于生成功率控制环路的模拟电路连接到处理器24。基于来自光传感器22的输入，处理器将必须的功率调整定向到激光源12以在处理的同时保持期望的激光图像清晰度。以这样的方式，分束器18朝着检流计组件20定向具有期望的激光功率的激光束14。
检流计组件20包括第一检流计马达30和第二检流计马达32。第一检流计马达30向第一检流计镜34提供枢转运动，并且第二检流计马达32向第二检流计镜36提供枢转运动。应当理解的是，虽然本申请中描述两个检流计马达30、32，但是额外的检流计马达和检流计镜组件也在本发明的范围内，使得检流计组件20可以包括三个、四个或更多个检流计马达和检流计镜对。
如下文将进一步解释的，第一检流计镜34和第二检流计镜36通过输出光阑26将激光束14朝着工件38重定向(图1-4)。第一检流计马达30和第二检流计马达32与处理器24电连接，使得处理器24能够连续地计算第一检流计镜34和第二检流计镜36的朝向，用于识别通过输出光阑26投影激光束14的方向。
第一检流计镜34和第二检流计镜36通过分束器18将反射激光束40重定向到反射激光传感器42上。反射激光传感器42也电连接到处理器24，使得处理器24在反射激光束40接触反射激光传感器42时计算第一检流计镜34和第二检流计镜36的朝向。以这样的方式，如将在下文进一步解释的，处理器24确定反射激光束发出的方向。
摄影测量组件44包括第一相机46，用于生成工件38的工作表面48的图像。第一相机46电连接到处理器24，用于传输工件38的图像。在替代的实施例中，第二相机50也电连接到处理器24，用于生成工作表面48的立体图像。在这种实施例中，第一相机46和第二相机50被封闭在组件外壳28内，使得完整的激光组件10自包含(self-contained)为单个模块。但是应当理解的是，摄影测量组件44不论由一个相机46或两个相机46、50都不需要附加在组件外壳28内，而是可以独立地定位。但是，期望的是摄影测量组件44被布置在相对于激光投影仪28的已知定位中。
激光源12的次级光源52向工件38和工作表面48提供次级光照54。在一种实施例中，次级光源52是接近第一相机46和第二相机50的每一个定位的LED闪光阵列。但是，次级光源52靠近相机46、50的任一个定位不是关键的。此外，相对于检流计组件20在刚性框架56上定位相机46、50减少了准确地识别相机46、50与激光组件10之间的相对定位的需要，尽管其他方法在美国专利No.9,200,899中公开，该美国专利的内容通过引用结合到本文。但是如果期望的话，这些方法也可以被结合到本申请的对准的方法中，用于额外的尺寸验证。
参考图2-5，现在将解释准确地将激光模板56投影到工作表面48上的方法。反射目标58被附加到工件38的工作表面48。在一种实施例中，目标58被附加到三维工作表面48的有关基准，使得工作表面48的三维特征可以根据目标58的定位被精确地计算。多个目标58可以以间隔排列的位置被附接到工作表面48。在一种实施例中，四个目标提供准确地计算工作表面48的三维轮廓的足够的反射信息。可以基于具体应用选择更多或更少的目标58。
在对准周期的开始处，次级光源52朝工件38发射次级光54。次级光源闪光次级光54，而不是投射次级光54达延长的时间段。摄影测量组件44接收从工件38的工作表面48反射以及也从目标58反射的次级光54。在相对于工作表面48的已知位置(诸如例如在基准上)定位目标58允许摄影测量组件44使用目标58的配置来定位工件38的三维配置，用于最终确定三维表面48在三维坐标系中的定位。以这样的方式，摄影测量组件44信号通知处理器24计算限定三维工作表面48的轮廓中的改变。
如上所述，摄影测量组件44还检测从目标58反射的次级光54。当由摄影测量组件44信号通知时，处理器24还确定目标58在三维坐标系中的一般定位。基于目标58相距次级光54的坐标，检流计马达30、32定向由激光源12生成的激光束14以用激光束14直接地扫描目标58。由此，处理器24辨别目标54的图案并且计算用激光束14扫描目标58所需的位置，用于计算工作表面48上激光模板56的准确定位。
一旦计算了目标58的坐标，激光束14如图4所示由激光源12投影到目标58上。图5示出通过输出开口26从目标58朝投影仪组件10反射回的激光束14。通过回射的方式，返回的激光束40由第一检流计镜34和第二检流计镜36通过分束器18重定向到反射激光传感器42上。在这时，反射激光传感器42接收反射激光束40，第一检流计马达30和第二检流计马达32信号通知处理器返回的激光束40所源自的位置。使用检流计马达30、32的朝向，处理器24计算目标58的确切定位，并且因此能够如图6所示准确地投影激光模板56。
每一个相机46、50包括COMS传感器，或者依赖于特定应用的需要替代地包括CCD传感器。在一种实施例中，传感器包括电连接到处理器24的多兆像素传感器。在一种实施例中，5兆像素传感器提供足够的图像质量。每一个相机46、50不论是单独地使用还是立体地使用包括大约60度到80度之间的视角，以提供广阔的光学视场。但是，取决于工件38的大小或组件10与工件38之间的距离，替代的视角可以是期望的。更具体地，视场被预期是水平方向75度并且在竖直方向更少。激光束14和次级光54包括相同或相似的波长也在本发明的范围内。但是，在替代的实施例中，激光束14和次级光54可以包括不同波长。例如，还预期次级光54可以是红外光或者仅由摄影测量组件44可检测的其他不可见光。
如在共同未决美国专利申请No.61/757,412中所公开的，本发明的投影仪组件10还能够识别工件38和组件10之间的动态运动或移动，该美国专利申请的内容通过引用结合到本文。但是，提供用于监控目标58和工作表面48的定位的次级光源52的间歇闪光使得组件能够识别工件38、组件10或者甚至激光束14的任一者的漂移。一旦检测到漂移，处理器24重启动识别工件表面相对于激光投影仪10的定位的序列。
本发明已经以说明性的方式进行描述，并且应当理解的是，术语已经用作旨在是说明性的而不是限制性的。显然的是，本发明的许多修改和变型在上述教导的启示下都是可能的。因此应当理解的是，在说明书中，附图标记仅是为了方便而不是以任何方式限制，因为可以以特定描述的以外的其他方式实践本发明。

Claims (12)

1.一种用于对准激光投影仪以将激光图像投影到工作表面上的方法，包括以下步骤：
提供具有激光源、次级光源、摄影测量设备和激光传感器的激光投影仪组件，所述激光源用于将激光图像投影到工作表面上，所述次级光源用于照明工作表面，所述摄影测量设备用于生成工作表面的图像，以及所述激光传感器用于感测激光束；
将反射目标附加到工作表面上；
从次级光源朝着工作表面发射光并且从反射目标朝着摄影测量设备反射光，从而在三维坐标系中识别反射目标在工作表面上的图案；以及
在三维坐标系中识别反射目标在工作表面上的图案后，用由激光源生成的激光束按照所识别出的反射目标的图案的引导来扫描反射目标并且根据反射激光束计算反射目标的精确定位，以用于将激光投影仪定向到在工作表面上投影激光图像的位置，所述反射目标用于朝着激光传感器反射激光束。
2.如权利要求1所述的方法，其中提供摄影测量设备的步骤进一步通过提供用于通过三角测量确定反射目标的定位的立体相机来限定。
3.如权利要求1所述的方法，其中用摄影测量设备确定反射目标在三维坐标系中的定位的步骤进一步通过提供与多兆像素传感器互连的处理器来限定。
4.如权利要求2所述的方法，还包括以下步骤：立体相机每一个提供60到80度之间的视角的光学视场。
5.如权利要求1所述的方法，其中从次级光源发射光的步骤进一步通过从次级光源发射间歇光闪光来限定。
6.如权利要求1所述的方法，还包括以下步骤：激光源和次级光源以相同波长发射光。
7.如权利要求1所述的方法，还包括以下步骤：摄影测量设备检测工件的位置和附接到工作表面的反射目标的图案，用于根据摄影测量设备相对于激光投影仪组件的固定位置朝着各个反射目标定向激光束。
8.如权利要求1所述的方法，还包括根据从反射目标朝着摄影测量设备反射的来自次级光源的光测量工作表面的漂移。
9.如权利要求1所述的方法，还包括以下步骤：从反射目标向摄影测量设备反射来自次级光源的光，用于确定工作表面的位置。
10.如权利要求1所述的方法，其中提供摄影测量设备的步骤进一步通过提供用于生成工作表面的图像的单个相机来限定。
11.如权利要求1所述的方法，其中识别反射目标的图案的步骤进一步通过识别反射目标在工作表面上的一般定位来限定。
12.如权利要求1所述的方法，其中将反射目标附加到工作表面上的步骤进一步通过在相对于工作表面的已知位置处将反射目标附加到工作表面上来限定。
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