CN107871518A - Logical-arithmetic unit based on variable-resistance memory unit and the method that dyadic Boolean logical operation is realized using it - Google Patents

Logical-arithmetic unit based on variable-resistance memory unit and the method that dyadic Boolean logical operation is realized using it Download PDF

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CN107871518A
CN107871518A CN201610858694.1A CN201610858694A CN107871518A CN 107871518 A CN107871518 A CN 107871518A CN 201610858694 A CN201610858694 A CN 201610858694A CN 107871518 A CN107871518 A CN 107871518A
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write
logical
variable
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separately input
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CN107871518B (en
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高双
李润伟
刘钢
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Ningbo Institute of Material Technology and Engineering of CAS
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Ningbo Institute of Material Technology and Engineering of CAS
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/20Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits characterised by logic function, e.g. AND, OR, NOR, NOT circuits

Abstract

The invention provides a kind of logical-arithmetic unit based on variable-resistance memory unit, is formed by a variable-resistance memory unit and a switch by series connection.The logical-arithmetic unit is simple in construction, it is ingenious in design, low manufacture cost, pass through design logic operation rule, all 16 kinds of dyadic Boolean logical operations can be completed in the case where being not more than write operation three times, and logic operation result can be stored in variable-resistance memory unit automatic and non-volatilely, thus data processing and store function can be integrated, the practicalization of resistance-variable storing device base logic circuit can be greatly promoted, the development to resistance-variable storing device base logic circuit is significant.

Description

Logical-arithmetic unit based on variable-resistance memory unit and realize dyadic Boolean logic using it The method of computing
Technical field
The present invention relates to logical-arithmetic unit technical field, more particularly to a kind of logical operation based on variable-resistance memory unit Device, and the method for realizing using the logical-arithmetic unit dyadic Boolean logical operation.
Background technology
Logic circuit is the core component that current computer carries out data processing.Logic circuit based on traditional cmos process The physics limit of its miniaturization is up to, and it is complicated, function is single, and energy consumption is higher.Therefore, based on new material, new knot The new logic circuit of structure and new device is by the growing concern of people.
Resistance-variable storing device is a kind of promising nonvolatile memory of future generation, have it is simple in construction, be easily integrated, wipe The advantages such as writing rate is fast, operation power consumption is low so that resistance-variable storing device base logic circuit is better than traditional CMOS in combination property Logic circuit.Importantly, having benefited from the intrinsic non-volatile of resistance-variable storing device, associated logical circuitry can collect data processing Be stored in one, be expected to break through for a long time limit computer actual motion speed " von Neumann bottleneck ", to calculating The performance of machine brings qualitative leap.
Currently, the core of this area correlative study work is the implementation method for exploring resistance-variable storing device base logical operation, Simple Devices and the multi-functional logic realization method of circuit structure are based particularly on, to simplify circuit knot in practical application Structure, integration density is improved, reduce and prepare cost.Although the variable-resistance memory unit based on single twin voltage polar operation realizes part The universal method of dyadic logical operation has been suggested and proved, but there has been no based on single any variable-resistance memory unit so far Realize that the universal method of all 16 kinds of dyadic Boolean logical operations is reported, hinder the practicality of resistance-variable storing device base logic circuit Change process.
The content of the invention
In view of the above-mentioned problems, the present invention is intended to provide a kind of logical-arithmetic unit based on variable-resistance memory unit, logic fortune It is simple in construction to calculate device, a variety of dyadic Boolean logical operations can be realized.
To realize above-mentioned technical purpose, the present inventor opens a variable-resistance memory unit M and one after exploratory development S is closed to be cascaded, can be ingenious by controlling the size of variable-resistance memory unit M input driving voltages and switching S folding Realize all 16 kinds of dyadic Boolean logical operations in ground.
The technical scheme is that:A kind of logical-arithmetic unit based on variable-resistance memory unit, by a resistance-change memory list First (M) and switch (S) composition;
Described variable-resistance memory unit is resistor-type random memory unit, including first electrode (T1), second electrode (T2) And intermediate layer, intermediate layer is between first electrode and second electrode, in the case where writing voltage drive, the variable-resistance memory unit table Reveal the transformation between high low resistance state and memory characteristic, it is V to define write-in voltage corresponding to high-impedance stateH, write corresponding to low resistance state It is V to enter voltageL
During working condition, write-in voltage is applied to T1 ends, and loop is formed after T2 ends series connection S;
Using the write-in voltage at T1 ends and S folding condition as two logic input terminals, high low resistance state using M is as patrolling Output end is collected, input logic value and output logic value definition are as follows:
The input logic value at T1 ends and the corresponding relation of write-in voltage:The corresponding write-in voltage V of input logic value 0H, input patrols Collect the corresponding write-in voltage V of value 1L
S input logic value and the corresponding relation of its physical state:The corresponding S closures of input logic value 0, input logic value 1 Corresponding S disconnects;
Export the corresponding relation of logical value and M high low resistance state:The corresponding M of logical value 0 high-impedance state is exported, exports logical value 1 corresponding M low resistance state.
According to the relation that polarity of voltage is write between high low resistance state, variable-resistance memory unit can be divided into following two class:
The first kind:The write-in polarity of voltage of high low resistance state is identical, as shown in Fig. 2 the referred to as resistive of single voltage polarity operation Memory cell, wherein Vreset≤VH< Vset, VL≥Vset, VsetIt is the threshold voltage that low resistance state is converted to by high-impedance state, VresetIt is The threshold voltage of high-impedance state is converted to by low resistance state.
Second class:The write-in polarity of voltage of high low resistance state is on the contrary, as shown in figure 3, the referred to as resistive of twin voltage polar operation Memory cell, wherein VH≤Vreset, VL≥Vset, VsetIt is the threshold voltage that low resistance state is converted to by high-impedance state, VresetIt is by low Resistance state is converted to the threshold voltage of high-impedance state.
No matter variable-resistance memory unit belongs to the first kind or the second class, when S is closed, applies V at T1 endsLIt can be written into To low resistance state, and apply V at T1 endsHHigh-impedance state can be written into;Conversely, when S disconnects, apply V at T1 endsLAnd VHNot The current resistance states of memory cell can be changed.Therefore, in the present invention, described variable-resistance memory unit both can be univoltage pole Property operation variable-resistance memory unit, can be again twin voltage polar operation variable-resistance memory unit.
Utilize the logical-arithmetic unit of the present invention, setting logical operation rule, you can complete by being not more than write operation three times Into all 16 kinds of dyadic Boolean logical operations, and the logic operation result can be stored in M automatic and non-volatilely, thus Data processing and store function can be integrated, the development to resistance-variable storing device base logic circuit is significant.
Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends.
Described write operation three times can be expressed as first time write operation (W1), second of write operation (W2) and Third time write operation (W3).
In W1, W2 and W3, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 Or 1,Symbol represents inversion operation, i.e.,
As shown in table 1 below, 16 kinds of described dyadic Boolean logical operations are True, False, p, q, NOT p, NOT respectively q、p AND q、p NAND q、p OR q、p NOR q、p IMP q、p NIMP q、p RIMP q、p RNIMP q、p XOR Q, and p XNOR q.
Wherein, True, False, p, q, NOT p and NOT q computings only need W1 to can be achieved.Preferably, such as table 1 below institute Show, logical operation rule is as follows:
(1)True:
In W1,0 and 1 is separately input to S and T1 ends;
(2)False:
In W1,0 and 0 is separately input to S and T1 ends;
(3)p:
In W1,0 and p is separately input to S and T1 ends;
(4)q:
In W1,0 and q is separately input to S and T1 ends;
(5)NOT p:
In W1,0 HeIt is separately input to S and T1 ends;
(6)NOT q:
In W1,0 HeIt is separately input to S and T1 ends;
Wherein, p AND q, p NAND q, p OR q, p NOR q, p IMP q, p NIMP q, p RIMP q and p RNIMP q computings need to carry out W1 and W2 write operations successively and can be achieved.Preferably, as shown in table 1 below, logical operation rule It is then as follows:
(7)p AND q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2,S and T1 ends are separately input to q;
(8)p NAND q:
In W1,0 and 1 is separately input to S and T1 ends;
In W2,WithIt is separately input to S and T1 ends;
(9)p OR q:
In W1,0 and 1 is separately input to S and T1 ends;
In W2, p and q are separately input to S and T1 ends;
(10)p NOR q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2, p andIt is separately input to S and T1 ends;
(11)p IMP q:
In W1,0 and 1 is separately input to S and T1 ends;
In W2,S and T1 ends are separately input to q;
(12)p NIMP q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2,WithIt is separately input to S and T1 ends;
(13)p RIMP q:
In W1,0 and 1 is separately input to S and T1 ends;
In W2, p andIt is separately input to S and T1 ends;
(14)p RNIMP q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2, p and q are separately input to S and T1 ends;
And p XOR q and p XNOR q computings then need to carry out W1, W2 and W3 write operation successively to realize.As excellent Choosing, as shown in table 1 below, logical operation rule is as follows:
(15)p XOR q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2, p and q are separately input to S and T1 ends;
In W3, q and p are separately input to S and T1 ends;
(16)p XNOR q:
In W1,0 and 0 is separately input to S and T1 ends;
In W2, p andIt is separately input to S and T1 ends;
In W3,S and T1 ends are separately input to p.
Table 1:The operation rule of all 16 kinds of dyadic Boolean logics in the present invention
In summary, the present invention is based on a variable-resistance memory unit and a switch, and by connecting, one logic of formation is transported Device is calculated, is had the advantages that:
(1) it is simple in construction, ingenious in design, low manufacture cost;
(2) by design logic operation rule, all 16 kinds of binary cloth can be completed in the case where being not more than write operation three times That logical operation, and logic operation result can be stored in variable-resistance memory unit automatic and non-volatilely, thus number can be collected According to processing and store function in one, the practicalization of resistance-variable storing device base logic circuit can be greatly promoted, to resistive The development of memory base logic circuit is significant.
Brief description of the drawings
Fig. 1 is the structural representation of the logical-arithmetic unit of the invention based on variable-resistance memory unit;
Fig. 2 is the V-I cycle characteristics curve maps of the variable-resistance memory unit of single voltage polarity operation;
Fig. 3 is the V-I cycle characteristics curve maps of the variable-resistance memory unit of twin voltage polar operation.
Embodiment
The present invention is described in further detail below in conjunction with drawings and examples, it should be pointed out that reality as described below Apply example to be intended to be easy to the understanding of the present invention, and do not play any restriction effect to it.
Embodiment 1:
In the present embodiment, variable-resistance memory unit includes first electrode (T1), second electrode (T2) and intermediate layer, intermediate layer position Between T1 and T2.T1 materials are Ta, and T2 materials are Pt, intermediate layer material Ta2O5, form Ta/Ta2O5/ Pt trilamellar membrane devices Part, its preparation process are as follows:
First, using radio-frequency magnetron sputter method in Pt (120nm)/Ti/SiO2Ta thick/Si deposition on substrate 10nm2O5It is thin Film., it is necessary to shelter from sub-fraction substrate in deposition process, so that the part is not by Ta2O5Film covers, and gives over to follow-up survey Second electrode is served as during examination.
Secondly, in Ta2O5One layer of photoresist of spin coating on film, in conjunction with uv-exposure and developing process, on photoresist layer Obtain multiple a diameter of 50 μm of hole.
Finally, the thick Ta films of 60nm are deposited using direct current magnetron sputtering process, acetone soak sample is recycled, to peel off Ta films on photoresist, the Ta films at hole are only left, first electrode is served as when giving over to follow-up test.
Using semiconductor devices analyzer (Agilent B1500A) to the Ta/Ta of above-mentioned preparation2O5/ Pt trilamellar membrane devices Carry out change resistance performance test.Test temperature is room temperature, and external voltage is applied to the Ta/Ta by the first tungsten tipped probe2O5/ Pt trilamellar membranes The T1 ends (i.e. Ta electrodes) of device, T2 ends (i.e. Pt electrodes) are grounded by the second tungsten tipped probe.Test result shows, the Ta/Ta2O5/ Pt trilamellar membrane devices have resistive characteristic as shown in Figure 3, VsetAnd VresetRespectively 0.75V and -1V, high-impedance state resistance are 1600 Ω, corresponding to output logical zero, low resistance state resistance is 120 Ω, corresponding to output logic 1.
Utilize the Ta/Ta2O5/ Pt trilamellar membrane device construction logic arithmetic units, it is specially:External voltage passes through the first tungsten tipped probe It is applied to the Ta/Ta2O5The T1 ends (i.e. Ta electrodes) of/Pt trilamellar membrane devices, T2 ends (i.e. Pt electrodes) are connect by the second tungsten tipped probe Ground, and by the second tungsten tipped probe T2 ends are contacted and left to realize switch S closed and disconnected.Using semiconductor devices analyzer (Agilent B1500A) carries out logic testing, and test temperature is room temperature.
Set the V in Fig. 3LAnd VHRespectively 1V and -2V.By the Ta/Ta2O5The write-in electricity at the T1 ends of/Pt trilamellar membrane devices Pressure and S folding condition are as two logic input terminals, by the Ta/Ta2O5The high low resistance state of/Pt trilamellar membrane devices is used as and patrolled Output end is collected, input logic value and output logic value definition are as follows:
The input logic value at T1 ends and the corresponding relation of write-in voltage:The corresponding write-in voltage V of input logic value 0H, input patrols Collect the corresponding write-in voltage V of value 1L
S input logic value and the corresponding relation of its physical state:The corresponding S closures of input logic value 0, input logic value 1 Corresponding S disconnects;
Export the corresponding relation of logical value and M high low resistance state:Output logical zero corresponds to M high-impedance state, and output logic 1 is right Answer M low resistance state.
Using in table 1 logical operation rule, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 Or 1, q=0 or 1,Symbol represents inversion operation, i.e.,All 16 kinds of dyadic Booleans can be achieved to patrol Collect computing.It is described in detail below by taking p NAND q and p NOR q computings as an example:
(1) p NAND q
In W1 write operations, 0 and 1 is separately input to S and T1 ends so that and S is closed, and 1V external voltages are applied to Ta electrodes, By Ta/Ta2O5/ Pt devices are written to low resistance state.
In W2 write operations,WithS and T1 ends are separately input to, according to p and q actual numerical value, four kinds can be divided into Situation:
(1) p=0, q=0, can obtainSo that S disconnects, 1V external voltages are applied on Ta electrodes.Because S breaks Open, device configuration will not be influenceed by external voltage, be rested on low resistance state (120 Ω, corresponding to export logic 1), be realized logical operation p NAND q=0NAND 0=1.
(2) p=0, q=1, can obtainSo that S disconnects, -2V external voltages are applied on Ta electrodes.Because S breaks Open, device configuration will not be influenceed by external voltage, be rested on low resistance state (120 Ω, corresponding to export logic 1), be realized logical operation p NAND q=0NAND 1=1.
(3) p=1, q=0, can obtainSo that S is closed, 1V external voltages are applied on Ta electrodes, can not still changed Become device resistance state, that is, rest on low resistance state (120 Ω, corresponding to export logic 1), realize logical operation p NAND q=1 NAND 0=1.
(4) p=1, q=1, can obtainSo that S is closed, -2V external voltages are applied on Ta electrodes, by device High-impedance state (1600 Ω, corresponding to export logical zero) is converted to by low resistance state, realizes logical operation p NAND q=1 NAND 1= 0。
(2) p NOR q:
In W1 write operations, 0 and 0 is separately input to S and T1 ends so that switch S closures, -2V external voltages are applied to Ta Electrode, by Ta/Ta2O5/ Pt devices are written to high-impedance state.
In W2 write operations, p andS and T1 ends are separately input to, according to p and q actual numerical value, four kinds of feelings can be divided into Condition:
(1) p=0, q=0, can obtainSo that S is closed, 1V external voltages are applied on Ta electrodes, device by high-impedance state Low resistance state (120 Ω, corresponding to export logic 1) is converted to, realizes logical operation p NORq=0NOR0=1.
(2) p=0, q=1, can obtainSo that S is closed, -2V external voltages are applied on Ta electrodes, it is impossible to change device Resistance state, that is, high-impedance state (1600 Ω, corresponding to export logical zero) is rested on, realizes logical operation p NORq=0NOR1=0.
(3) p=1, q=0, can obtainSo that S disconnects, 1V external voltages are applied on Ta electrodes.Because S disconnects, device Resistance state will not be influenceed by external voltage, be rested on high-impedance state (1600 Ω, corresponding to export logical zero), be realized logical operation p NORq =1 NOR0=0.
(4) p=1, q=1, can obtainSo that S disconnects, -2V external voltages are applied on Ta electrodes.Because S disconnects, device Part resistance state will not be influenceed by external voltage, be rested on high-impedance state (1600 Ω, corresponding to export logical zero), be realized logical operation p NORq=1 NOR1=0.
The various embodiments described above are merely to illustrate the present invention, wherein the structure of each part, connected mode and manufacture craft etc. are all It can be varied from, every equivalents carried out on the basis of technical solution of the present invention and improvement, should not exclude Outside protection scope of the present invention.
Technical scheme is described in detail embodiment described above, it should be understood that it is described above only For the specific embodiment of the present invention, it is not intended to limit the invention, all any modifications made in the spirit of the present invention, Supplement or similar fashion replacement etc., should be included in the scope of the protection.

Claims (10)

1. a kind of logical-arithmetic unit based on variable-resistance memory unit, it is characterized in that:Opened by a variable-resistance memory unit (M) and one Close (S) composition;
Described variable-resistance memory unit includes first electrode (T1), second electrode (T2) and intermediate layer, and intermediate layer is positioned at the first electricity Between pole and second electrode;In the case where writing voltage drive, the variable-resistance memory unit shows the transformation between high low resistance state and note Recall characteristic, it is V to define write-in voltage corresponding to high-impedance stateH, write-in voltage is V corresponding to low resistance stateL
During working condition, write-in voltage is applied to T1 ends, and loop is formed after T2 ends series connection S;
It is using the write-in voltage at T1 ends and S folding condition as two logic input terminals, M high low resistance state is defeated as logic Go out end, input logic value and output logic value definition are as follows:
The input logic value at T1 ends and the corresponding relation of write-in voltage:The corresponding write-in voltage V of input logic value 0H, input logic value 1 Corresponding write-in voltage VL
S input logic value and the corresponding relation of its physical state:The corresponding S closures of input logic value 0,1 corresponding S of input logic value Disconnect;
Export the corresponding relation of logical value and M high low resistance state:The corresponding M of logical value 0 high-impedance state is exported, output logical value 1 is right Answer M low resistance state.
2. the logical-arithmetic unit based on variable-resistance memory unit as claimed in claim 1, it is characterized in that:Described resistance-change memory list Member both can be the variable-resistance memory unit of single voltage polarity operation, can be the variable-resistance memory unit of twin voltage polar operation again.
3. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation True operation rule is:
In first time write operation (W1), 0 and 1 is separately input to S and T1 ends;
Preferably, logical operation False operation rule is:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends.
4. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation p operation rule is:
In first time write operation (W1), 0 and p is separately input to S and T1 ends;
Preferably, logical operation q operation rule is:
In first time write operation (W1), 0 and q is separately input to S and T1 ends.
5. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation NOT p rule is as follows:
In W1,0 HeIt is separately input to S and T1 ends;
Preferably, logical operation NOT q rule is as follows:
In W1,0 HeIt is separately input to S and T1 ends.
6. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation p AND q rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2),S and T1 ends are separately input to q;
Preferably, logical operation p NAND q rule is as follows:
In first time write operation (W1), 0 and 1 is separately input to S and T1 ends;
In second of write operation (W2),WithIt is separately input to S and T1 ends.
7. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation p OR q rule is as follows:
In first time write operation (W1), 0 and 1 is separately input to S and T1 ends;
In second of write operation (W2), p and q are separately input to S and T1 ends;
Preferably, logical operation p NOR q rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2), p andIt is separately input to S and T1 ends.
8. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation p IMP q rule is as follows:
In first time write operation (W1), 0 and 1 is separately input to S and T1 ends;
In second of write operation (W2),S and T1 ends are separately input to q;
Preferably, logical operation p NIMP q rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2),WithIt is separately input to S and T1 ends.
9. the side of dyadic Boolean logical operation is realized using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
Logical operation p RIMP q rule is as follows:
In first time write operation (W1), 0 and 1 is separately input to S and T1 ends;
In second of write operation (W2), p andIt is separately input to S and T1 ends;
Preferably, logical operation p RNIMP q rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2), p and q are separately input to S and T1 ends.
10. realize dyadic Boolean logical operation using the logical-arithmetic unit based on variable-resistance memory unit described in claim 1 Method, it is characterized in that:Write-once operation (W) includes S disconnection or closure and the voltage write-in at T1 ends;
Write-once operation in, setting 0,1, p,Q orFor the input logic value at S and T1 ends, p=0 or 1, q=0 or Person 1,Symbol represents inversion operation, i.e.,
P XOR q logical operation rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2), p and q are separately input to S and T1 ends;
In third time write operation (W3), q and p are separately input to S and T1 ends;
Preferably, p XNOR q logical operation rule is as follows:
In first time write operation (W1), 0 and 0 is separately input to S and T1 ends;
In second of write operation (W2), p andIt is separately input to S and T1 ends;
In third time write operation (W3),S and T1 ends are separately input to p.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109814837A (en) * 2019-01-15 2019-05-28 北京大学深圳研究生院 LFSR circuit and its pseudo-random data sequence production method based on resistive formula memory
CN109994139A (en) * 2019-03-15 2019-07-09 北京大学 A kind of complete non-volatile logic implementation method and its application based on unipolarity memristor
CN111061454A (en) * 2019-12-18 2020-04-24 北京大学 Logic implementation method based on bipolar memristor
CN112002365A (en) * 2020-08-21 2020-11-27 中国科学技术大学 Parallel logic operation method based on multi-bit nonvolatile memory and full adder

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102412827A (en) * 2011-11-02 2012-04-11 北京大学 Method for realizing logic operation by utilizing RRAM devices
US8471598B2 (en) * 2011-06-16 2013-06-25 Taiwan Semiconductor Manufacturing Company, Ltd. Magnetic logic device
CN103456341A (en) * 2012-06-04 2013-12-18 三星电子株式会社 Sense amplifier circuitry for resistive type memory
CN104124960A (en) * 2014-06-20 2014-10-29 华中科技大学 Nonvolatile Boolean logic operational circuit and operation method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8471598B2 (en) * 2011-06-16 2013-06-25 Taiwan Semiconductor Manufacturing Company, Ltd. Magnetic logic device
CN102412827A (en) * 2011-11-02 2012-04-11 北京大学 Method for realizing logic operation by utilizing RRAM devices
CN103456341A (en) * 2012-06-04 2013-12-18 三星电子株式会社 Sense amplifier circuitry for resistive type memory
CN104124960A (en) * 2014-06-20 2014-10-29 华中科技大学 Nonvolatile Boolean logic operational circuit and operation method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109814837A (en) * 2019-01-15 2019-05-28 北京大学深圳研究生院 LFSR circuit and its pseudo-random data sequence production method based on resistive formula memory
CN109994139A (en) * 2019-03-15 2019-07-09 北京大学 A kind of complete non-volatile logic implementation method and its application based on unipolarity memristor
CN109994139B (en) * 2019-03-15 2020-11-03 北京大学 Complete non-volatile logic implementation method based on unipolar memristor and application thereof
CN111061454A (en) * 2019-12-18 2020-04-24 北京大学 Logic implementation method based on bipolar memristor
CN111061454B (en) * 2019-12-18 2022-02-11 北京大学 Logic implementation method based on bipolar memristor
CN112002365A (en) * 2020-08-21 2020-11-27 中国科学技术大学 Parallel logic operation method based on multi-bit nonvolatile memory and full adder

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