CN107870593A - A kind of high speed large dynamic range infrared simulation signal acquisition circuit - Google Patents
A kind of high speed large dynamic range infrared simulation signal acquisition circuit Download PDFInfo
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- CN107870593A CN107870593A CN201711186624.7A CN201711186624A CN107870593A CN 107870593 A CN107870593 A CN 107870593A CN 201711186624 A CN201711186624 A CN 201711186624A CN 107870593 A CN107870593 A CN 107870593A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24215—Scada supervisory control and data acquisition
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- Automation & Control Theory (AREA)
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Abstract
The present invention relates to a kind of high speed large dynamic range infrared simulation signal acquisition circuit, including signal conditioning circuit, filter network and D/A converting circuit；In whole signal chains, the modules such as the load matched for exporting faint analog signal, ADC drivings, small-signal conversion, Digital Signal Processing, power supply are contained.The advantages of the design and innovation are that this circuit can be suitably used for the collection of state-of-the art high-performance refrigeration mode focus planar detector output analog signal, the high s/n ratio index of circuit can significantly reduce the noise introduced in analog-digital conversion process, the accurate poor digital quantity that is converted to of analog quantity for detector output provides safeguard, and this will be helpful to the detection range and small objects resolution capability that improve infrared imaging component.
Description
Technical field
The invention belongs to small-signal acquisition technique, is related to a kind of high speed large dynamic range infrared simulation signal acquisition electricity
Road.
Background technology
Because the particularity of infrared detector output analog voltage (has the spies such as high speed, Larger Dynamic scope, weak output signal
Point), it is necessary to which one kind is suitable for such signal acquisition AD sample circuits, the quality of sampling circuit samples effect affects imaging group
For part to small and distant object detectivity, the sample circuit, which has, introduces small noisiness, low in energy consumption, small volume, general
The advantages that output data interface, thermal adaptability is strong, can be in wide warm (- 55 DEG C~+70 DEG C) condition normal work.Can be wide
It is general to be used for the fields such as Aeronautics and Astronautics, there is very strong practicality and functional expansionary.
The content of the invention
Technical problems to be solved
In order to avoid the shortcomings of the prior art, the present invention proposes that a kind of high speed large dynamic range infrared simulation signal is adopted
Collector.
Technical scheme
A kind of high speed large dynamic range infrared simulation signal acquisition circuit, it is characterised in that including signal conditioning circuit, filter
Wave network and D/A converting circuit；The signal conditioning circuit includes operational amplifier A DA4899, chip LT6403, resistance
R1, R2, R3, R4, RG1, RG2, RF1 and RF2, electric capacity C1, C2, C3, C4 and C5；Signal input part is made up of R1, R2 and C1
T-shaped network connection ADA4899 positive input terminal, ADA4899 output ends connect chip by the resistance R4 of series connection with RG1
LT6403 positive input terminal, electric capacity C3 are connected chip LT6403 positive input terminal and negative output with resistance RF1 parallel circuit
End, electric capacity C4 are connected chip LT6403 negative input end and positive output end with resistance RF2 parallel circuit；Electric capacity C2 connections are put
Big device ADA4899 output ends and negative input end, the output end of resistance R3 connections amplifier ADA4899 negative input ends and resistance R4；
Chip LT6403 negative input end is grounded by resistance RG2, output plus terminal Von, negative output terminal Vop, respectively with filtering net
The input connection of network；The filter network includes the π type filter networks of R11, R14, C41, C43 and C44 composition, LT6403
The signal of anode output enter R11, enter R14 from the signal of LT6403 negative terminals output, and C41, C43, C44 coordinate into
Row filtering, output connection D/A converting circuit；Analog-digital conversion circuit as described include chip LT2216 and partially installing capacitor C23, C24,
C25, C26, C27, C28, C29, C30, C31, C32, C33, C34, C35, C36, C37, C38 and C42, resistance R10, R12,
R15, R16, R17, R18, magnetic bead L3 and L4；The signal of filter network output enters R12 and R15, subsequently into 6 pipes of chip
Pin and 7 pins carry out analog-to-digital conversion, and resistance R16, R17, R18 complete the configuration to LT2216, and the signal for sampling completion is 16 tunnels
Data signal, by D0 to D15 totally 16 tunnel signal outputs.
In the operational amplifier A DA4899 biasing circuits：Resistance R1 resistance values are 75ohm~150ohm, R2 resistance values
For 75ohm, R3 resistance values are 1kohm, and R4 resistance values are 10ohm, and electric capacity C1 capacitances are 12pF, and C2 capacitances are 2.2pF.
In the chip LT6403 biasing circuits：Resistance RF1, RF2 resistance are 510ohm, and electric capacity C3 and C4 capacitance is
2.2pF。
In the filter network：Electric capacity C41, C43, C44 capacitance are 10pF, and resistance R11 and R14 resistance are 33ohm.
It is characterized in that：Described resistance R1, R2, R3, R4, RF1, RF2, R11 and R14 are the carbon film electricity that precision is 1%
Resistance.
Described electric capacity C1, C2, C3, C4, C41, C43, C44 are the ceramic condenser of precision 5%.
Beneficial effect
A kind of high speed large dynamic range infrared simulation signal acquisition circuit proposed by the present invention, in order to gather three generations's refrigeration mode
The faint analog signal of high speed large dynamic range of infrared focal plane detector output, while realize high s/n ratio index, the design
Circuit is set from collected signal analysis, chip type selecting, impedance matching, amplitude scaling, common-mode voltage adjustment etc.
Meter.In whole signal chains, the load matched for exporting faint analog signal, ADC drivings, small-signal conversion, numeral are contained
The modules such as signal transacting, power supply.The advantages of the design and innovation are that this circuit can be suitably used for state-of-the art high-performance system
Cold mould focus planar detector exports the collection of analog signal, and the high s/n ratio index of circuit can significantly reduce analog-to-digital conversion mistake
The noise introduced in journey, the accurate poor digital quantity that is converted to of analog quantity for detector output are provided safeguard, and this will be helped
In the detection range and small objects resolution capability that improve infrared imaging component.
The design can carry out high s/n ratio, low distortion turn in collection refrigeration mode Long Wave Infrared Probe output analog signal
Change, imaging effect is good；The actual measurement of plate level signal to noise ratio is up to 74.6dBFS；Can be in the normal work of wide warm (- 50 DEG C+70 DEG C) scope
Make；It can realize that DVI formatted datas export；Strong environmental adaptability, it is low in energy consumption, have a wide range of application.
Brief description of the drawings
Fig. 1 is that high speed large dynamic range infrared simulation signal acquisition circuit forms structured flowchart
Fig. 2 is the signal conditioning circuit of high speed large dynamic range infrared simulation signal acquisition circuit
Fig. 3 is filtering and the analog to digital conversion circuit of high speed large dynamic range infrared simulation signal acquisition circuit
Embodiment
In conjunction with embodiment, accompanying drawing, the invention will be further described：
The technical scheme of the present embodiment：
1 uses chip ADA4899 to realize the impedance matching for the faint analog signal that detector exports and drives demand；
Characteristic is interconnected as shown in Fig. 2 operational amplifier A DA4899 and its peripheral circuit realize detector output signal
Impedance matching；
R1 uses 75ohm-150ohm fixed carbon resister, precision 1%, and realization matches with detector output impedance；
The fixed carbon resister that R2 uses resistance value to be 1% for 75ohm, precision is realized and rear end amplifier ADA4899 input impedance
Matching；
C1 use capacitance 12pF, precision for 5% ceramic condenser, it is therefore an objective to reduce pixel signal, especially bad member, dead
The stabilization time of point；
R3 uses the fixed carbon resister that resistance value is 1% for 1kohm, precision, and R4 uses the resistance value to be for 10ohm, precision
1% fixed carbon resister, C2 use the ceramic condenser that capacitance is 5% for 2.2pF, precision, and three forms the backfeed loop of amplifier,
Play stabilizing circuit and filtering；
2 realize data level displacement and common-mode voltage matching using chip LT6403, are believed with the difference for causing amplifier to export
It number can match ADC best transition workspace；
LT interconnection architecture is as shown in Figure 2；
RF1, RG1, RF1, RG1 are made up of the fixed carbon resister that resistance is 510ohm, precision is 1%, and C3, C4 are by capacitance
2.2pF, the ceramic condenser that precision is 5% form, and form the backfeed loop that gain is 1；
3 realize the analog-digital conversion of data using low noise modulus conversion chip LTC2216；
16 are used to form signal acquisition for sampling depth, the LT2216 of 80MHz sampling rates and ADA4899 and LTC6403
Circuit, ADC peripheral circuit are as shown in Figure 3；
4 filter out high-frequency noise using capacitance-resistance filter network, eliminate influence of the mixing to circuit；
Capacitance-resistance filter network structure is as shown in figure 3, electric capacity C41, C43, C44 use the capacitance to be for 10pF, precision in figure
5% ceramic condenser composition, resistance R11, R12, R14, R15 are 33ohm by resistance, and the fixed carbon resister that precision is 1% forms；
Annexation：
Signal conditioning circuit include operational amplifier A DA4899, chip LT6403, resistance R1, R2, R3, R4, RG1,
RG2, RF1 and RF2, electric capacity C1, C2, C3, C4 and C5；The T-shaped network connection that signal input part is made up of R1, R2 and C1
ADA4899 positive input terminal, ADA4899 output ends connect chip LT6403 positive input by the resistance R4 of series connection with RG1
End, electric capacity C3 are connected chip LT6403 positive input terminal and negative output terminal, electric capacity C4 and resistance with resistance RF1 parallel circuit
RF2 parallel circuit connection chip LT6403 negative input end and positive output end；Electric capacity C2 connection amplifiers ADA4899 is exported
End and negative input end, the output end of resistance R3 connections amplifier ADA4899 negative input ends and resistance R4；Chip LT6403's is negative
Input is grounded by resistance RG2, output plus terminal Von, negative output terminal Vop, and the input with filter network connects respectively
Connect；The filter network includes the π type filter networks of R11, R14, C41, C43 and C44 composition, LT6403 anode output
Signal enters R11, enters R14 from the signal of LT6403 negative terminals output, and C41, C43, C44 cooperation are filtered, and are exported
Connect D/A converting circuit；Analog-digital conversion circuit as described include chip LT2216 and partially installing capacitor C23, C24, C25, C26,
C27, C28, C29, C30, C31, C32, C33, C34, C35, C36, C37, C38 and C42, resistance R10, R12, R15, R16,
R17, R18, magnetic bead L3 and L4；The signal of filter network output enters R12 and R15, subsequently into 6 pins and 7 pins of chip
Analog-to-digital conversion is carried out, resistance R16, R17, R18 complete the configuration to LT2216, and the signal for sampling completion is 16 railway digital signals,
By D0 to D15 totally 16 tunnel signal outputs.
The course of work：The analog signal of infrared detector output is by impedance matching, single-ended transfer difference, level shift, filter
After ripple, analog-to-digital conversion, the digital quantity of output is ranked up in FPGA, then inputs CameraLink chips, and be converted to
Camera link forms export；
The annexation of signal in a link：Such as Fig. 3, the analog signal of detector input enters R2, Ran Houjin by R1
Enter the in-phase input end to amplifier ADA4899, ADA4899 output signal enters RG1 by R4, fed back to simultaneously
ADA489 reverse input end；Signal into RG1 flows into LT6403, while the input/output terminal of difference amplifier (LT6403)
Fed back to by RF1, C3, RF2, C4 with mutually and inverting input, output difference signal are Vop and Von, this stage corresponding diagram 3
In signal condition part；As Fig. 3, Vop and Von are respectively connected to OUT1+ and OUT1-, into by C41, C43, C44, R11,
The filter network of R14 compositions, LT2216 AIN+ and AIN- pins, Ran Hou are connected to after R12 and R15 outputs
Analog-to-digital conversion is completed in LT2216.
In the present invention, impedance and the load matched demand of detector output analog signal are realized using chip ADA4899；
The driving function of AD sampling A/D chips is realized using chip LTC6403, while analog signal is nursed one's health, is in it most suitable
Preferably gather the state of conversion；Analog-digital conversion is carried out using low noise, low distortion analog-digital converter LT2216；Using
EP3C55U484I7 and DS90CR285 realizes the output of signal DVI formatted datas, and output data form is versatile；Can be
Wide temperature (- 55 DEG C~+70 DEG C) scope normal work.
Claims (6)
1. a kind of high speed large dynamic range infrared simulation signal acquisition circuit, it is characterised in that including signal conditioning circuit, filtering
Network and D/A converting circuit；The signal conditioning circuit include operational amplifier A DA4899, chip LT6403, resistance R1,
R2, R3, R4, RG1, RG2, RF1 and RF2, electric capacity C1, C2, C3, C4 and C5；The T that signal input part is made up of R1, R2 and C1
Type network connection ADA4899 positive input terminal, ADA4899 output ends connect chip LT6403 with RG1 by the resistance R4 of series connection
Positive input terminal, electric capacity C3 is connected chip LT6403 positive input terminal and negative output terminal, electric capacity C4 with resistance RF1 parallel circuit
Chip LT6403 negative input end and positive output end are connected with resistance RF2 parallel circuit；Electric capacity C2 connection amplifiers ADA4899
Output end and negative input end, the output end of resistance R3 connections amplifier ADA4899 negative input ends and resistance R4；Chip LT6403's
Negative input end is grounded by resistance RG2, output plus terminal Von, negative output terminal Vop, and the input with filter network connects respectively
Connect；The filter network includes the π type filter networks of R11, R14, C41, C43 and C44 composition, the letter of LT6403 anode output
Number R11 is entered, enter R14 from the signal of LT6403 negative terminals output, and C41, C43, C44 coordinate and are filtered, output connects
D/A converting circuit；Analog-digital conversion circuit as described include chip LT2216 and partially installing capacitor C23, C24, C25, C26, C27, C28,
C29, C30, C31, C32, C33, C34, C35, C36, C37, C38 and C42, resistance R10, R12, R15, R16, R17, R18, magnetic bead
L3 and L4；The signal of filter network output enters R12 and R15, and 6 pins and 7 pins subsequently into chip carry out analog-to-digital conversion,
Resistance R16, R17, R18 complete the configuration to LT2216, and the signal for sampling completion is 16 railway digital signals, is total to by D0 to D15
16 tunnel signal outputs.
2. high speed large dynamic range infrared simulation signal acquisition circuit according to claim 1, it is characterised in that：The computing
In amplifier ADA4899 biasing circuits：Resistance R1 resistance values are 75ohm~150ohm, and R2 resistance values are 75ohm, R3 resistance values
For 1kohm, R4 resistance values are 10ohm, and electric capacity C1 capacitances are 12pF, and C2 capacitances are 2.2pF.
3. high speed large dynamic range infrared simulation signal acquisition circuit according to claim 1, it is characterised in that：The chip
In LT6403 biasing circuits：Resistance RF1, RF2 resistance are 510ohm, and electric capacity C3 and C4 capacitance are 2.2pF.
4. high speed large dynamic range infrared simulation signal acquisition circuit according to claim 1, it is characterised in that：The filtering
In network：Electric capacity C41, C43, C44 capacitance are 10pF, and resistance R11 and R14 resistance are 33ohm.
5. according to the 1 or 2 or 3 or 4 high speed large dynamic range infrared simulation signal acquisition circuit of claim, its feature exists
In：Described resistance R1, R2, R3, R4, RF1, RF2, R11 and R14 are the fixed carbon resister that precision is 1%.
6. according to the 1 or 2 or 3 or 4 high speed large dynamic range infrared simulation signal acquisition circuit of claim, its feature exists
In：Described electric capacity C1, C2, C3, C4, C41, C43, C44 are the ceramic condenser of precision 5%.
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| CN201711186624.7A CN107870593A (en) | 2017-11-24 | 2017-11-24 | A kind of high speed large dynamic range infrared simulation signal acquisition circuit |
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| CN201711186624.7A CN107870593A (en) | 2017-11-24 | 2017-11-24 | A kind of high speed large dynamic range infrared simulation signal acquisition circuit |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108833790A (en) * | 2018-08-14 | 2018-11-16 | 烟台艾睿光电科技有限公司 | A kind of Acquisition Circuit of analog signal, method and device |
| CN109036039A (en) * | 2018-07-05 | 2018-12-18 | 宁波大学 | A kind of Digital Circuit Experiment System |
| CN111257273A (en) * | 2020-03-18 | 2020-06-09 | 长沙开元仪器有限公司 | Coal quality analyzer and coal quality detection circuit thereof |
| CN113008384A (en) * | 2021-02-26 | 2021-06-22 | 上海航天控制技术研究所 | Low-noise sampling circuit applied to infrared detector |
| CN113114253A (en) * | 2021-05-28 | 2021-07-13 | 西北核技术研究所 | Analog signal conditioning system applied to ultra-high speed data acquisition system |
| CN113720364A (en) * | 2021-08-11 | 2021-11-30 | 北京波谱华光科技有限公司 | Infrared analog signal conditioning and collecting circuit |
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| CN113720364B (en) * | 2021-08-11 | 2022-12-20 | 北京波谱华光科技有限公司 | Infrared analog signal conditioning and collecting circuit |
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