CN104748858A - InGaAs shortwave infrared detector signal processing system - Google Patents
InGaAs shortwave infrared detector signal processing system Download PDFInfo
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Abstract
The invention discloses an InGaAs shortwave infrared detector signal processing system. The InGaAs shortwave infrared detector signal processing system comprises an InGaAs shortwave infrared detector, a signal input end, a differential single-end converting circuit, a signal modulating and filtering circuit, an analog-digital conversion circuit, and a data processing circuit. Through the differential single-end converting circuit, the system realizes the signal impedance matching, amplification, and supporting of main backup interfaces; through being treated by the signal modulating and filtering circuit, the signal enters the analog-digital conversion circuit and outputs digital-form data; finally, the data is transmitted to the data processing circuit. Compared with the traditional InGaAs shortwave infrared detector signal processing system, the InGaAs shortwave infrared detector signal processing system is low in circuit leading noise, main backup in an input end supporting system, strong in anti-jamming ability, and so on.
Description
Technical field
The present invention relates to a kind of signal processing system, particularly a kind of InGaAs short-wave infrared detector signal disposal system, belongs to signal transacting field.
Background technology
InGaAs short-wave infrared detector is emerging a kind of linear array non-refrigerated infrared detector in recent years, compared to traditional refrigeration mode infrared device, when possessing similar performance, having the features such as volume is little, cost is low, low in energy consumption concurrently, being particularly suitable for being applied in military surveillance and spacer remote sensing field.The output signal of InGaAs short-wave infrared detector has following features: 1) export internal resistance large, usually require less load capacitance and larger pull-up resistor; 2) higher circuit noise index request; 3) the general employing difference analogue way of output; 4) each pixel signal keeps a fixing level value afterwards in foundation.For above-mentioned signal output characteristic, it is very crucial for how designing a set of signal processing system that can meet the demands for the desirable imaging effect that reaches of imaging circuit.
Traditional InGaAs short-wave infrared detector signal disposal system, usual employing is penetrated the signal of grade follow circuit to each passage and is realized impedance matching respectively, then through differential operational amplifier, the analog difference signal exported directly is being amplified and filtering, finally sending into analog to digital converter and carry out analog to digital conversion.This processing mode has some weak point following: 1) adopt and penetrate grade follow circuit and carry out impedance matching respectively to two passages, can due to the parameter differences of two channel circuits, particularly the parameter differences of operational amplifier causes differential signal unbalance, is equivalent to introduce differential mode noise; 2) adopt the mode of design follow circuit, two passages are comparatively large on DC level signal impact due to device drift, and the view data of imaging system can be caused unstable; 3) mode of design follow circuit is adopted by being placed in the rear class of analog signal channel to the amplifying element of simulating signal, the suppression to whole system circuit noise can only to be unfavorable for; 4) two passages adopt two panels operational amplifiers to form and penetrate a grade follow circuit, can increase extra power consumption compared to monolithic device, simultaneously also can the area that takies of increasing circuit; 5) support issue of the main backup interface of simulating signal is not all considered in traditional design, and this limits systematic difference scope undoubtedly, is unfavorable for the lifting of system reliability.
Summary of the invention
Technology of the present invention is dealt with problems and is: overcome the deficiencies in the prior art, provide a kind of InGaAs short-wave infrared detector signal disposal system, solve that two channel signals existing for traditional homogeneous system are unbalance, signal amplifying element is positioned at signalling channel rear class and introduces the problem that extra circuit noise and legacy system do not support the active and standby interface of input end.
Technical solution of the present invention is: a kind of InGaAs short-wave infrared detector signal disposal system, comprising: InGaAs short-wave infrared detector, signal input part, the single-ended change-over circuit of difference, signal condition filtering circuit, analog to digital conversion circuit, data processing circuit; Wherein InGaAs short-wave infrared detector, is responsible for that the light signal detected is converted to differential electric signal and delivers to signal input part; Signal input part comprises the first source side resistance R1 and the second source side resistance R2;
Signal input part, by differential electric signal after the first source side resistance R1 and the second source side resistance R2 mates, export the differential electric signal of mating with the single-ended change-over circuit of difference, as the input of the single-ended change-over circuit of difference, one end of first source side resistance R1 and the second source side resistance R2 is connected to InGaAs short-wave infrared detector signal output terminal respectively, and the other end of the first source side resistance R1 and the second source side resistance R2 is as the input of the single-ended change-over circuit of difference;
The single-ended change-over circuit of difference, the differential signal of input is converted to single-ended signal and delivers to signal condition filtering circuit, and impedance matching is realized to the differential signal of input, amplified by the differential signal of input, the single-ended change-over circuit of difference is also as the interface of the active and standby part of system simultaneously;
Signal condition filtering circuit, carries out filtering and conditioning to the single-ended signal that the single-ended change-over circuit of difference is sent here, obtains the analog difference signal in analog to digital conversion circuit input dynamic range, deliver to analog to digital conversion circuit;
Analog to digital conversion circuit, is converted to parallel digital signal by the analog difference signal that signal condition filtering circuit is sent here, delivers to data processing circuit;
Data processing circuit, the digital signal sent here analog to digital conversion circuit realizes digital filtering and then carries out parallel-serial conversion, obtains corresponding serial data, and these data are packaged into required data layout.
The present invention's advantage is compared with prior art:
(1) the present invention adopts the difference single end operational amplifier possessing power-off zero output characteristic in the single-ended change-over circuit of difference, can support the main backup interface of input signal.
(2) amplifying element of simulating signal is placed in system prime by the present invention, namely in the single-ended change-over circuit of difference, effectively can avoid amplification late-class circuit being introduced to noise.
(3) impedance matching circuit that in the single-ended change-over circuit of difference of the present invention, difference single end operational amplifier used is formed possesses better circuit symmetrical characteristic than penetrating a grade follow circuit.
(4) each several part circuit that the present invention adopts has less element, less area occupied and less power consumption.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of signal processing system of the present invention;
Fig. 2 is the single-ended change-over circuit schematic diagram of difference of the present invention;
Fig. 3 is signal condition filtering circuit schematic diagram of the present invention;
The imaging circuit signal to noise ratio (S/N ratio) measured drawing that Fig. 4 realizes for the present invention.
Embodiment
Thinking of the present invention is: according to the feature of InGaAs short-wave infrared detector output signal, first by difference single-ended change-over circuit the differential signal that detector exports is converted to single-ended signal and signal is amplified, then conditioning filtering carried out to signal and complete analog to digital conversion, data the most at last after conversion carry out digital filtering, parallel-serial conversion, are packaged into required data layout afterwards; Simultaneously according to the power-off zero output feature of selected difference single end operational amplifier, realize the support to the main backup interface of input signal.
Below in conjunction with accompanying drawing, the present invention is described in detail.
As shown in Figure 1, for the schematic diagram of a kind of InGaAs short-wave infrared of the present invention detector signal disposal system, comprise InGaAs short-wave infrared detector, signal input part, the single-ended change-over circuit of difference, signal condition filtering circuit, analog to digital conversion circuit, data processing circuit, wherein data processing circuit adopts programmable logic device (PLD) to realize.The light signal detected is converted to differential electric signal and delivers to signal input part by InGaAs short-wave infrared detector; Signal input part comprises the first source side resistance R1 and the second source side resistance R2;
Signal input part, by differential electric signal after the first source side resistance R1 and the second source side resistance R2 mates, export the differential electric signal of mating with the single-ended change-over circuit of difference, as the input of the single-ended change-over circuit of difference, one end of first source side resistance R1 and the second source side resistance R2 is connected to InGaAs short-wave infrared detector signal output terminal respectively, and the other end of the first source side resistance R1 and the second source side resistance R2 is as the input of the single-ended change-over circuit of difference;
The single-ended change-over circuit of difference, the differential signal of input is converted to single-ended signal and delivers to signal condition filtering circuit, and impedance matching is realized to the differential signal of input, amplified by the differential signal of input, the single-ended change-over circuit of difference is also as the interface of the active and standby part of system simultaneously;
Signal condition filtering circuit, carries out filtering and conditioning to the single-ended signal that the single-ended change-over circuit of difference is sent here, obtains the analog difference signal in analog to digital conversion circuit input dynamic range, deliver to analog to digital conversion circuit;
Analog to digital conversion circuit, is converted to parallel digital signal by the analog difference signal that signal condition filtering circuit is sent here, delivers to data processing circuit;
Data processing circuit, the digital signal sent here analog to digital conversion circuit realizes digital filtering and then carries out parallel-serial conversion, obtains corresponding serial data, and these data are packaged into required data layout.
As shown in Figure 1, first source side resistance R1, the second source side resistance R2 form low-pass filter circuit with the equivalent input capacitance of difference single end operational amplifier 221 in the single-ended change-over circuit of difference, and the two ends of the first source side resistance R1, the second source side resistance R2 are connected to the output terminal of InGaAs short-wave infrared detector and input end Vi+, Vi-of difference single end operational amplifier 221 respectively.The selection of the resistance of the first source side resistance R1, the second source side resistance R2 need meet following requirement: 1) the signal symmetry requirement of differential signal, i.e. R1=R2; 2) requirement of source coupling, generally chooses R1=R2<50 Ω.First source side resistance R1 and the second source side resistance R2 uses mainly as the source build-out resistor of input interface, and object is the signal reflex preventing circuit.
The single-ended change-over circuit of difference mainly realizes the impedance matching of differential electric signal, the amplification of differential electric signal and the main backup interface of system support function, its schematic diagram as shown in Figure 2, comprise the first resistance R3, second resistance R4, 3rd resistance R5 and difference single end operational amplifier 211, difference single end operational amplifier 221 comprises differential input end 1+, differential input end 1-, differential input end 2+, differential input end 2-, output terminal Vs and equivalent input capacitance, differential input end 1+, differential input end 1-connects one end of the first source side resistance R1 and the second source side resistance R2 respectively, first source side resistance R1 is also connected with the equivalent input capacitance of difference single end operational amplifier 221 with one end of the second source side resistance R2 simultaneously.First resistance R3 mono-end is connected to the input end 2+ of difference single end operational amplifier 221, the other end is connected to circuit ground, second resistance R4 mono-end is connected to the input end 2-of difference single end operational amplifier 221, the other end is connected to circuit ground, 3rd resistance R5 mono-end is connected to the input end 2-of difference single end operational amplifier 221, and the other end is connected with the output terminal Vs of difference single end operational amplifier 221.Differential signal is converted to single-ended signal by the single-ended change-over circuit of difference, mainly in order to remove common mode DC level contained in differential electric signal, signal amplifying element is placed in system foremost by the single-ended change-over circuit of difference, in order to avoid the circuit noise of rear class is amplified, take into account the function of impedance matching simultaneously, difference single end operational amplifier 211 is greater than 750k Ω for input impedance, input capacitance is less than 15pF and possesses the device of power-off zero output characteristic, wherein high input impedance, low input capacitance characteristic is to meet the coupling exporting differential electric signal with InGaAs short-wave infrared detector, power-off zero output characteristic is then the support in order to realize main backup interface, for ensureing circuit balancing, first resistance R3, second resistance R4, the value of the 3rd resistance R5 should meet R3=R4//R5, the circuit gain of the single-ended change-over circuit of difference is
Signal condition filtering circuit, comprises single-ended transfer difference circuit and low-pass filter circuit two parts, and as shown in Figure 3, single-ended transfer difference circuit comprises differential operational amplifier 231, the 4th resistance R6, the 5th resistance R7, the 6th resistance R8, the 7th resistance R9 to schematic diagram; Low-pass filter circuit comprises the 8th resistance R10, the 9th resistance R11 and electric capacity C1; Differential operational amplifier 231 comprises in-phase input end, inverting input, in the same way output terminal, reversed-phase output, common mode input end V
vCM; One end of the 4th resistance R6 is connected to the output terminal V of difference single end operational amplifier 221
sthe other end of the 4th resistance R6 is connected to the in-phase input end of differential operational amplifier 231, the one termination circuit ground of the 5th resistance R7, the other end of the 5th resistance R7 is connected to the inverting input of differential operational amplifier 231, the two ends of the 6th resistance R8 are connected to in-phase input end and the reversed-phase output of differential operational amplifier 231 respectively, and the two ends of the 7th resistance R9 are connected to inverting input and the in-phase output end of differential operational amplifier 231 respectively; The common mode input end V of differential operational amplifier 231
vCMbe connected with analog to digital conversion circuit; 8th resistance R10 one end is connected to the reversed-phase output of differential operational amplifier 231, the other end is on the one hand as the inverting input of analog to digital conversion circuit, connect one end of electric capacity C1 on the other hand, 9th resistance R11 one end is connected to the in-phase output end of differential operational amplifier 231, the other end, on the one hand as the in-phase input end of analog to digital conversion circuit, connects the other end of electric capacity C1 on the other hand; Due to the requirement of single-ended transfer difference circuit balancing characteristic, the resistance of the 4th resistance R6, the 5th resistance R7, the 6th resistance R8, the 7th resistance R9 should meet R6=R7=R8=R9=510 Ω, the 8th resistance R10 in same low-pass filter circuit, the 9th resistance R11 also should meet the requirement of difference channel equilibrium response, i.e. R10=R11.Low-pass filter circuit can play the high frequency noise of a filtering part before signal enters analog to digital conversion circuit, but in order to ensure that the differential electric signal signal that detector exports can not lose effective information, the cutoff frequency f of wave filter
pthe output pixel clock frequency f of InGaAs short-wave infrared detector should be greater than
s5 times, namely
single-ended signal is converted to differential signal by signal condition filtering circuit, mainly in order to meet the interface requirement with rear class analog to digital conversion circuit, and filtering noise interference as much as possible before signal carries out analog to digital conversion simultaneously.
The analog difference signal that signal condition filtering circuit exports, analog to digital conversion is carried out through the high resolving power (N=14bit) of analog to digital conversion circuit, at a high speed (80MSPS) difference A/D converter, parallel data are outputted to data processing circuit by analog to digital conversion circuit afterwards, the digital signal that the simulation that analog to digital conversion circuit is sent here by data processing circuit walks abreast carries out digital filtering, parallel-serial conversion, afterwards the data after process is packaged into required data layout.
Such as: InGaAs short-wave infrared detector pixel speed is 10Mhz, certain the pixel simulating signal exported is Vi+=1.7V, Vi-=1.3V, if establish gain G=5 of the single-ended change-over circuit of difference, then the output of the single-ended change-over circuit of difference is Vs=2V, signal condition filtering circuit V
vcm=1V, the then output V+=2V of signal condition filtering circuit, V-=0V, if the dynamic range of analog to digital conversion circuit is-2.5V ~+2.5V, then after changing, the corresponding digital signal quantized is 6554, and every pixel can repeated sampling 8 times, after carrying out digital filtering, every pixel reverts to corresponding 14bits data, then is packaged into required data layout through parallel-serial conversion, and the data of above-mentioned pixel just can be transferred to corresponding terminal and carry out display and further analysis.
According to the InGaAs short-wave infrared detector signal disposal system of the present invention's design, when detector output signal is full scale 80%, actual system signal noise ratio test result as shown in Figure 4.Fig. 4 ordinate is signal to noise ratio (S/N ratio), and horizontal ordinate is pixel position, and solid line is system signal noise ratio measured result, and dotted line is the theoretical signal to noise ratio (S/N ratio) of analog to digital converter, and this numerical value does not comprise the impact of other circuit noise of system, is also the maximal value of Systems Theory signal to noise ratio (S/N ratio).As shown in Figure 4, the actual measurement signal to noise ratio (S/N ratio) based on the InGaAs short-wave infrared detector signal disposal system major part pixel of the present invention's design can reach 70dB, close to the signal-to-noise theory value 74dB of analog to digital converter.
The content be not described in detail in instructions of the present invention belongs to the known technology of those skilled in the art.
Claims (10)
1. an InGaAs short-wave infrared detector signal disposal system, is characterized in that comprising: InGaAs short-wave infrared detector, signal input part, the single-ended change-over circuit of difference, signal condition filtering circuit, analog to digital conversion circuit, data processing circuit; Wherein InGaAs short-wave infrared detector, is responsible for that the light signal detected is converted to differential electric signal and delivers to signal input part; Signal input part comprises the first source side resistance R1 and the second source side resistance R2;
Signal input part, by differential electric signal after the first source side resistance R1 and the second source side resistance R2 mates, export the differential electric signal of mating with the single-ended change-over circuit of difference, as the input of the single-ended change-over circuit of difference, one end of first source side resistance R1 and the second source side resistance R2 is connected to InGaAs short-wave infrared detector signal output terminal respectively, and the other end of the first source side resistance R1 and the second source side resistance R2 is as the input of the single-ended change-over circuit of difference;
The single-ended change-over circuit of difference, the differential signal of input is converted to single-ended signal and delivers to signal condition filtering circuit, and impedance matching is realized to the differential signal of input, amplified by the differential signal of input, the single-ended change-over circuit of difference is also as the interface of the active and standby part of system simultaneously;
Signal condition filtering circuit, carries out filtering and conditioning to the single-ended signal that the single-ended change-over circuit of difference is sent here, obtains the analog difference signal in analog to digital conversion circuit input dynamic range, deliver to analog to digital conversion circuit;
Analog to digital conversion circuit, is converted to parallel digital signal by the analog difference signal that signal condition filtering circuit is sent here, delivers to data processing circuit;
Data processing circuit, the digital signal sent here analog to digital conversion circuit realizes digital filtering and then carries out parallel-serial conversion, obtains corresponding serial data, and these data are packaged into required data layout.
2. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 1, it is characterized in that: the single-ended change-over circuit of described difference comprises resistance first resistance R3, second resistance R4, 3rd resistance R5 and difference single end operational amplifier (221), difference single end operational amplifier (221) comprises differential input end 1+, differential input end 1-, differential input end 2+, differential input end 2-, output terminal Vs and equivalent input capacitance, differential input end 1+, differential input end 1-connects one end of the first source side resistance R1 and the second source side resistance R2 respectively, first source side resistance R1 is also connected with the equivalent input capacitance of difference single end operational amplifier (221) with one end of the second source side resistance R2 simultaneously,
First resistance R3 mono-end is connected to the input end 2+ of difference single end operational amplifier (221), the other end is connected to circuit ground, second resistance R4 mono-end is connected to the input end 2-of difference single end operational amplifier (221), the other end is connected to circuit ground, 3rd resistance R5 mono-end is connected to the input end 2-of difference single end operational amplifier (221), and the other end is connected with the output terminal Vs of difference single end operational amplifier (221).
3. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 2, it is characterized in that: described difference single end operational amplifier (221) for input impedance be greater than 750k Ω, input capacitance is less than 15pF, and possess the device of power-off zero output characteristic, difference single end operational amplifier (221) comprises built-in equivalent input capacitance, and the first source side resistance R1, the second source side resistance R2 form a low-pass filter circuit with the input capacitance of difference single end operational amplifier (221).
4. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 1, it is characterized in that: the resistance of the first described source side resistance R1, the second source electricity R2 is less than or equal to 50 Ω, in order to ensure circuit balancing, the resistance of the first source side resistance R1 and the second source electricity R2 is equal.
5. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 2, is characterized in that: the value that the value relatable of the first described resistance R3, the second resistance R4, the 3rd resistance R5 need meet R3 equals R4 and R5 value in parallel.
6. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 2, is characterized in that: the gain of the single-ended change-over circuit of described difference is
7. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 1, is characterized in that: described signal condition filtering circuit comprises single-ended transfer difference circuit and low-pass filter circuit two parts;
Single-ended transfer difference circuit comprises differential operational amplifier (231), the 4th resistance R6, the 5th resistance R7, the 6th resistance R8, the 7th resistance R9;
Low-pass filter circuit comprises the 8th resistance R10, the 9th resistance R11 and electric capacity C1;
Differential operational amplifier (231) comprises in-phase input end, inverting input, in the same way output terminal, reversed-phase output, common mode input end V
vCM;
One end of the 4th resistance R6 is connected to the output terminal V of difference single end operational amplifier (221)
sthe other end of the 4th resistance R6 is connected to the in-phase input end of differential operational amplifier (231), the one termination circuit ground of the 5th resistance R7, the other end of the 5th resistance R7 is connected to the inverting input of differential operational amplifier (231), the two ends of the 6th resistance R8 are connected to in-phase input end and the reversed-phase output of differential operational amplifier (231) respectively, and the two ends of the 7th resistance R9 are connected to inverting input and the in-phase output end of differential operational amplifier (231) respectively; The common mode input end V of differential operational amplifier (231)
vCMbe connected with analog to digital conversion circuit;
8th resistance R10 one end is connected to the reversed-phase output of differential operational amplifier (231), the other end is on the one hand as the inverting input of analog to digital conversion circuit, connect one end of electric capacity C1 on the other hand, 9th resistance R11 one end is connected to the in-phase output end of differential operational amplifier (231), the other end, on the one hand as the in-phase input end of analog to digital conversion circuit, connects the other end of electric capacity C1 on the other hand.
8. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 7, is characterized in that: described resistance R6=R7=R8=R9=510 Ω.
9. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 7, is characterized in that: the cutoff frequency f of described low-pass filter circuit
pbe greater than the output pixel clock frequency f of InGaAs short-wave infrared detector
s5 times, namely
and R10=R11.
10. a kind of InGaAs short-wave infrared detector signal disposal system according to claim 1, it is characterized in that: described analog to digital conversion circuit comprises high resolving power, high-speed-differential analog to digital converter, i.e. resolution, N=14bits, the switching rate of high-speed-differential analog to digital converter is 80MSPS.
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| CN106568230A (en) * | 2016-10-18 | 2017-04-19 | 中国电子科技集团公司第五十五研究所 | InGaAs photoelectric cathode refrigeration device based on semiconductor refrigeration piece |
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| CN109587398A (en) * | 2018-12-13 | 2019-04-05 | 中国科学院西安光学精密机械研究所 | A kind of spaceborne short-wave infrared signal processing circuit and processing method |
| CN109587398B (en) * | 2018-12-13 | 2023-12-08 | 中国科学院西安光学精密机械研究所 | Satellite-borne short-wave infrared signal processing circuit and processing method |
| CN111030670A (en) * | 2019-12-20 | 2020-04-17 | 中国科学院长春光学精密机械与物理研究所 | Infrared imaging processing circuit and infrared detection system |
| CN113114253A (en) * | 2021-05-28 | 2021-07-13 | 西北核技术研究所 | Analog signal conditioning system applied to ultra-high speed data acquisition system |
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