CN107546142B - Continuous silicon chip or battery piece detection and classification device - Google Patents

Continuous silicon chip or battery piece detection and classification device Download PDF

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Publication number
CN107546142B
CN107546142B CN201610488991.1A CN201610488991A CN107546142B CN 107546142 B CN107546142 B CN 107546142B CN 201610488991 A CN201610488991 A CN 201610488991A CN 107546142 B CN107546142 B CN 107546142B
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conveyor
detection
discharging
feeding
box
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CN107546142A (en
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徐�明
张弛
王志刚
孙小俊
王四海
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Nanjing Topstek Automation Equipment Co ltd
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Nanjing Topstek Automation Equipment Co ltd
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Abstract

The invention discloses a continuous silicon wafer or battery piece detection and classification device which comprises a feeding frame, a detection frame and a discharging frame, wherein a discharging box, a jacking device, a telescopic conveyor and a feeding conveyor are arranged in the feeding frame, detection equipment, a detection conveyor and a PLC (programmable logic controller) are arranged in the detection frame, and a collecting box, a discharging conveyor and a feeding conveyor are arranged in the discharging frame. According to the invention, the silicon chip or the battery piece is automatically sucked, the automation of feeding is realized, the uninterrupted operation of feeding and detection is realized by matching with the uninterrupted detection technology, the continuous production capacity of the improved equipment is increased from the past 3600pcs/h to the present 5400pcs/h, the intellectualization is further realized, and the increase of the manual use capacity is reduced obviously.

Description

Continuous silicon chip or battery piece detection and classification device
Technical Field
The invention relates to the technical field of material conveying detection, in particular to a continuous silicon wafer or battery piece detection and classification device.
Background
The silicon wafer or the battery piece used in the solar photovoltaic industry has the characteristics of light weight, thinness, fragility and the like, and the characteristics determine that the silicon wafer or the battery piece needs to be taken and put lightly in the process of inspection and transportation, so that the breakage is prevented.
In the solar photovoltaic industry, the conveying of the silicon wafers or the battery pieces is discontinuous, the silicon wafers or the battery pieces are sucked and placed on a flat belt for conveying, and then the silicon wafers or the battery pieces are detected, color selected and the like through intermediate processes. Once because of technical limitations, continuous and uninterrupted detection, color selection and other processes cannot be realized, and only discharging, detection, waiting and material taking can be realized, so that the productivity of products is seriously influenced. With the progress of technology, the intermediate detection process including detection and color selection can be judged continuously and uninterruptedly, and the product performance detection information can be subjected to instantaneous reaction through PLC processing, so that the method is quick in starting and quick in reaction; but automatic equipment material loading and rear end unloading process still do not realize continuous transportation, can only pass through artifical blowing at present, detect and finish a batch of material, then shut down the retooling, the material that detects enters into different partial shipment tracks, and the rethread is artifical to collect, and the manual work of direct use is two at least, and the problem of bringing is direct influence equipment productivity.
At present, the photovoltaic automation industry is known, and no manufacturer can realize automatic feeding and discharging, so that continuous conveying and continuous detection are realized; in order to solve the problem and meet the demands of customers, the applicant develops continuous silicon wafer or battery piece detection feeding and discharging conveying equipment.
Disclosure of Invention
The invention aims to: aiming at the defects in the prior art, the invention aims to provide a continuous silicon wafer or battery piece detection and classification device so as to solve the problem that the silicon wafer or battery piece cannot be automatically fed and discharged for detection and middle detection.
The technical scheme is as follows: the continuous silicon wafer or battery piece detection and classification device comprises a feeding rack, a detection rack and a discharging rack, wherein a discharging box, a jacking device, a telescopic conveyor and a feeding conveyor are arranged in the feeding rack, a corresponding discharging box jacking device is arranged below the discharging box, one discharging box jacking device controls one discharging box, and a silicon wafer or battery piece to be detected is placed in the discharging box; the detection rack is internally provided with detection equipment, a detection conveyor and a PLC controller; a plurality of collecting boxes, a discharging conveyor and a feeding conveyor are arranged in the discharging frame, corresponding collecting box jacking devices are arranged below the collecting boxes, one collecting box jacking device controls one collecting box, and silicon chips or battery pieces which are detected and classified are placed in the collecting boxes.
The feeding conveyor is a belt conveyor, the discharging box is arranged below the feeding conveyor, a silicon wafer or a battery piece to be detected in the discharging box is conveyed to the lower part of the belt of the feeding conveyor through the telescopic conveyor, and an air suction module is arranged at a gap between the belt of the lower surface of the feeding conveyor and the belt. Through the air suction module, the silicon wafer or the battery piece to be detected is adsorbed on a lower surface belt of the feeding conveyor and is carried forward. The feeding conveyor and the detection conveyor are positioned on an upper plane and a lower plane, the space positions of the feeding conveyor and the detection conveyor are overlapped, and when a silicon wafer or a battery piece to be detected adsorbed by a belt on the lower surface of the feeding conveyor reaches the upper part of the detection conveyor, an air suction module of the feeding conveyor is disconnected, and the silicon wafer or the battery piece to be detected falls on the upper surface of the detection conveyor.
The detection equipment is any detection module combination of a size detection module, an appearance detection module, an electrical performance detection module and a flatness detection module. The detection equipment is located above the detection conveyor, continuously detects the silicon wafer or the battery piece to be detected on the upper surface of the detection conveyor, and transmits the detection result to the PLC, and the PLC gives a conveying instruction of the blanking conveyor.
The blanking conveyor and the detection conveyor are positioned on an upper plane and a lower plane, the space positions of the blanking conveyor and the detection conveyor are overlapped, the blanking conveyor is also a belt conveyor, an air suction module is arranged at a gap between a belt on the lower surface of the blanking conveyor and the belt, and when a silicon wafer or a battery piece which is detected on the upper surface of the detection conveyor reaches the lower part of the blanking conveyor, the silicon wafer or the battery piece is adsorbed by the belt on the lower surface of the blanking conveyor and is carried forward.
The collection box is arranged below the blanking conveyor, and the detected silicon chips or battery pieces on the blanking conveyor are conveyed to the corresponding collection box through the feeding conveyor according to the detection result given by the PLC.
Further, the N discharging boxes are divided into two groups for operation, and the silicon wafers or the battery pieces to be detected in one discharging box are completely taken out by the telescopic conveyor, so that the telescopic conveyor above the other discharging box works. The discharging boxes descend according to the distance (N jacking moves up and down along with the corresponding discharging boxes respectively) so that the silicon wafers or the battery pieces are continuously output, when the silicon wafers or the battery pieces in the first discharging boxes are discharged out of the last piece, the telescopic conveyor of the second discharging boxes immediately takes out the silicon wafers or the battery pieces in the other discharging boxes, the first discharging boxes are replaced with full discharging boxes after enough time is manually left, and after the second discharging boxes are taken out, the silicon wafers or the battery pieces are taken out of the first discharging boxes, so that continuous uninterrupted conveying of the silicon wafers or the battery pieces is realized.
Still further, when feeding conveyer is carrying silicon chip or battery piece to the collection box, the collection box jack-up promotes the collection box, prevents that silicon chip or battery piece from dropping too big distance that drops, takes place cracked.
Further, the number of the discharging boxes is larger than 2.
Still further, the loading conveyor is continuously operated.
Further, the blanking conveyor is continuously operated.
The beneficial effects are that: compared with the prior art, the invention has the following advantages,
1. according to the invention, the silicon chip or the battery piece is automatically sucked, the automation of feeding is realized, the uninterrupted operation of feeding and detection is realized by matching with the uninterrupted detection technology, the continuous production capacity of the improved equipment is increased from the past 3600pcs/h to the present 5400pcs/h, and the capacity is obviously increased;
2. the invention adopts the intelligent control system to realize automatic sorting and automatic collection of the detected silicon chips or battery chips, has high sorting precision and high speed, is also uninterruptedly sorted and split-packed, further realizes the intellectualization and reduces the manual use;
3. the invention sets up corresponding jacking under the discharging box and the collecting box, and the jacking automatically adjusts the height of the self according to the thickness of the silicon chip or the battery piece in the box, thereby preventing the phenomenon of product fragmentation.
Drawings
Fig. 1 is a front view of the structure of the present invention.
Fig. 2 is a top view of the structure of the present invention.
Detailed Description
The following describes the present technical solution in detail by means of a preferred embodiment in combination with the accompanying drawings.
As shown in fig. 1, a continuous silicon wafer or battery piece detection and classification device comprises a feeding rack 1, a detection rack 2 and a discharging rack 3, wherein a discharging box 4, a jacking device, a telescopic conveyor 6 and a feeding conveyor 7 are arranged in the feeding rack 1, the number of the discharging boxes 4 is an even number not less than 4, 4 discharging boxes 4 are arranged in the embodiment, a corresponding discharging box jacking device 5 is arranged below the discharging boxes 4, one discharging box jacking device 5 controls one discharging box 4, and silicon wafers or battery pieces to be detected are placed in the discharging boxes 4; a detection device 8, a detection conveyor 9 and a PLC are arranged in the detection rack 2; a plurality of collecting boxes 10, a discharging conveyor 11 and a feeding conveyor 12 are arranged in the discharging frame 3, corresponding collecting box jacking devices 13 are arranged below the collecting boxes 10, one collecting box jacking device 13 controls one collecting box 10, and silicon chips or battery pieces which are detected and classified are placed in the collecting boxes 10.
As shown in fig. 2, the feeding conveyor 7 is a belt conveyor, and the feeding conveyor runs continuously, and the invention compares that the feeding conveyor and the discharging conveyor in the prior art have pauses and cannot realize continuous conveying, and the feeding conveyor and the discharging conveyor in the invention are continuous conveying, so that the productivity can be greatly improved.
The discharging box 4 is arranged below the feeding conveyor 7, a silicon wafer or a battery piece to be detected in the discharging box 4 is conveyed to the lower part of a belt of the feeding conveyor 7 through the telescopic conveyor 6, and an air suction module is arranged at a gap between the belt of the lower surface of the feeding conveyor 7 and the belt. By means of the suction module, the silicon wafer or the battery piece to be detected is adsorbed on the lower surface belt of the feeding conveyor 7 and is carried forward. The feeding conveyor 7 and the detecting conveyor 9 are located in an upper plane and a lower plane, and as can be seen from the figure, the plane of the discharging conveyor 11 is located above the plane of the detecting conveyor 9, the space positions of the feeding conveyor 7 and the detecting conveyor 9 are overlapped, when the silicon wafer or the battery piece to be detected adsorbed by the belt on the lower surface of the feeding conveyor 7 reaches the upper side of the detecting conveyor 9, the air suction module of the feeding conveyor 7 is disconnected, and the silicon wafer or the battery piece to be detected falls on the upper surface of the detecting conveyor 9.
The detection device 8 is any combination of detection modules of a size detection module, an appearance detection module, an electrical performance detection module and a flatness detection module, and the detection devices are all detection modules commonly used in the field, and a specific technical scheme belongs to the prior art and can be selected by a person skilled in the art according to specific conditions. The detection equipment 8 is located above the detection conveyor 9, continuously detects a silicon wafer or a battery piece to be detected on the upper surface of the detection conveyor 9, and transmits a detection result to the PLC, and the PLC gives a conveying instruction of the blanking conveyor 11.
The blanking conveyor 11 and the detection conveyor 9 are positioned on an upper plane and a lower plane, the blanking conveyor 11 and the detection conveyor 9 are in an overlapped part in space, the blanking conveyor 11 is also a belt conveyor, the blanking conveyor also continuously runs all the time, an air suction module is arranged at a gap between a belt on the lower surface of the blanking conveyor 11 and a belt, and when a silicon wafer or a battery piece which is detected by the upper surface of the detection conveyor 9 reaches the lower side of the blanking conveyor 11, the silicon wafer or the battery piece is adsorbed by the belt on the lower surface of the blanking conveyor 11 and is carried forward.
The collection boxes 10 are arranged below the blanking conveyor 11, and the detected silicon chips or battery pieces on the blanking conveyor 11 are sent to the corresponding collection boxes 10 through the feeding conveyor 12 according to the detection result given by the PLC.
The 4 discharging boxes 4 are divided into two groups for operation, and the silicon wafers or battery pieces to be detected in one discharging box 4 are completely taken out by the telescopic conveyor 6, so that the telescopic conveyor 6 above the other discharging box 4 works. The discharging boxes 4 descend according to the distance (the jacking 1, the jacking 2, the jacking 3 and the jacking 4 move up and down along with the corresponding discharging boxes 4 respectively) so that the silicon wafers or the battery pieces are continuously output, when the silicon wafers or the battery pieces in the first discharging boxes 4 are discharged out of the last piece, the telescopic conveyor 6 of the second discharging boxes 4 immediately takes out the silicon wafers or the battery pieces in the other discharging boxes 4, the first discharging boxes 4 are replaced by full discharging boxes after enough time is manually provided, and the silicon wafers or the battery pieces are continuously conveyed by taking the pieces from the first discharging boxes 4 after the second discharging boxes 4 are taken out.
When the silicon wafers or the battery pieces are conveyed to the collecting box 10 by the feeding conveyor 12, the collecting box 10 is lifted by lifting the collecting box 10, so that the falling and falling distance of the silicon wafers or the battery pieces is prevented from being too large, and the breakage occurs.
The foregoing is only a preferred embodiment of the invention, it being noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the present invention, and such modifications and adaptations are intended to be comprehended within the scope of the invention.

Claims (2)

1. The continuous silicon wafer or battery piece detection and classification device comprises a feeding rack (1), a detection rack (2) and a discharging rack (3), and is characterized in that a discharging box (4), a jacking device, a telescopic conveyor (6) and a feeding conveyor (7) are arranged in the feeding rack (1), a corresponding discharging box jacking device (5) is arranged below the discharging box (4), one discharging box jacking device (5) controls one discharging box (4), and a silicon wafer or battery piece to be detected is placed in the discharging box (4); a detection device (8), a detection conveyor (9) and a PLC are arranged in the detection rack (2); a plurality of collecting boxes (10), a discharging conveyor (11) and a feeding conveyor (12) are arranged in the discharging frame (3), corresponding collecting box jacking devices (13) are arranged below the collecting boxes (10), one collecting box jacking device (13) controls one collecting box (10), and silicon chips or battery pieces which are detected and classified are placed in the collecting boxes (10); the feeding conveyor (7) is a belt conveyor, the discharging box (4) is arranged below the feeding conveyor (7), silicon chips or battery pieces to be detected in the discharging box (4) are conveyed below the belt of the feeding conveyor (7) through the telescopic conveyor (6), an air suction module is arranged at a gap between the belt on the lower surface of the feeding conveyor (7) and the belt, the feeding conveyor (7) and the detecting conveyor (9) are located on two different planes, and the space positions of the feeding conveyor (7) and the detecting conveyor (9) are overlapped; the blanking conveyor (11) and the detection conveyor (9) are positioned on an upper plane and a lower plane, the blanking conveyor (11) and the detection conveyor (9) are in an overlapped part in space, the blanking conveyor (11) is also a belt conveyor, an air suction module is arranged at a gap between a belt and a belt on the lower surface of the blanking conveyor (11), the collecting box (10) is arranged below the blanking conveyor (11), and detected silicon chips or battery chips on the blanking conveyor (11) are conveyed to the corresponding collecting box (10) through the feeding conveyor (12) according to a detection result given by the PLC; the number of the discharging boxes (4) is more than 2; the discharging boxes (4) are divided into two groups for operation, and the silicon wafers or the battery pieces to be detected in one group of discharging boxes (4) are completely taken out by the telescopic conveyor (6), so that the telescopic conveyor (6) above the other group of discharging boxes (4) works.
2. The continuous silicon wafer or battery piece detection and classification device according to claim 1, wherein the detection equipment (8) is any combination of size detection modules, appearance detection modules, electrical performance detection modules and flatness detection modules.
CN201610488991.1A 2016-06-28 2016-06-28 Continuous silicon chip or battery piece detection and classification device Active CN107546142B (en)

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Families Citing this family (5)

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Publication number Priority date Publication date Assignee Title
CN108198912B (en) * 2018-02-24 2020-01-31 常州亿晶光电科技有限公司 Automatic solar cell slicing equipment
CN108745921B (en) * 2018-03-26 2021-06-15 江苏金晖光伏有限公司 Sorting and testing method for single and polycrystalline silicon wafers cut by diamond wire saw
CN110491804A (en) * 2019-08-05 2019-11-22 马鞍山致青工业设计有限公司 Continuous detection apparatus is used in a kind of processing of silicon wafer
CN115360113A (en) * 2022-08-29 2022-11-18 深圳市易达凯电子有限公司 Semi-automatic detection equipment for metal oxide semiconductor chip processing production
CN115831797B (en) * 2022-12-26 2023-10-13 徐州市沂芯微电子有限公司 Chip detector with self-feeding installation function

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6290945A (en) * 1986-09-26 1987-04-25 Oki Electric Ind Co Ltd Conveying method for wafer
TW520546B (en) * 2001-03-06 2003-02-11 Samsung Electronics Co Ltd Plate assembly and a processing apparatus having the same
JP2005335956A (en) * 2004-05-27 2005-12-08 Quanta Display Inc Base board carrying device
WO2009096142A1 (en) * 2008-01-28 2009-08-06 Panasonic Corporation Substrate detecting apparatus and substrate transfer apparatus
CN101545948A (en) * 2008-03-24 2009-09-30 未来产业株式会社 Apparatus for transferring packaged chips, test handler and method for manufacturing packaged chips
KR100931323B1 (en) * 2009-02-20 2009-12-11 (주)큐엠씨 Led chip classifying apparatus
CN101971320A (en) * 2008-03-16 2011-02-09 约纳斯雷德曼自动化技术有限公司 Method and conveyor belt system having at least one conveyor belt for transporting flat transport goods
WO2012118447A1 (en) * 2011-03-02 2012-09-07 Rokko Systems Pte Ltd Improved system for substrate processing
CN102723300A (en) * 2012-06-26 2012-10-10 江苏爱动力自动化设备有限公司 Automatic charging device for solar cells
CN103199150A (en) * 2013-03-05 2013-07-10 哲为(上海)仪器科技有限公司 Composite type conveying and detecting mechanism for solar cell slices
JP2014115238A (en) * 2012-12-12 2014-06-26 Yasunaga Corp Wafer defect inspection device
CN103949405A (en) * 2014-04-02 2014-07-30 中国电子科技集团公司第四十八研究所 Blanking system for detecting and sorting silicon chip or cell
CN104259109A (en) * 2014-07-28 2015-01-07 中国电子科技集团公司第四十八研究所 Stepping silicon wafer quality sorting system
CN104919582A (en) * 2013-01-09 2015-09-16 东京毅力科创株式会社 Probe apparatus and wafer transfer system
CN204905217U (en) * 2015-08-31 2015-12-23 苏州大学 Sun energy level polycrystalline silicon piece quality automatic classification device
CN206194697U (en) * 2016-06-28 2017-05-24 南京卓胜自动化设备有限公司 Type silicon chip or battery piece detect sorter in succession

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9793148B2 (en) * 2011-06-22 2017-10-17 Asm Japan K.K. Method for positioning wafers in multiple wafer transport

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6290945A (en) * 1986-09-26 1987-04-25 Oki Electric Ind Co Ltd Conveying method for wafer
TW520546B (en) * 2001-03-06 2003-02-11 Samsung Electronics Co Ltd Plate assembly and a processing apparatus having the same
JP2005335956A (en) * 2004-05-27 2005-12-08 Quanta Display Inc Base board carrying device
WO2009096142A1 (en) * 2008-01-28 2009-08-06 Panasonic Corporation Substrate detecting apparatus and substrate transfer apparatus
CN101971320A (en) * 2008-03-16 2011-02-09 约纳斯雷德曼自动化技术有限公司 Method and conveyor belt system having at least one conveyor belt for transporting flat transport goods
CN101545948A (en) * 2008-03-24 2009-09-30 未来产业株式会社 Apparatus for transferring packaged chips, test handler and method for manufacturing packaged chips
KR100931323B1 (en) * 2009-02-20 2009-12-11 (주)큐엠씨 Led chip classifying apparatus
WO2012118447A1 (en) * 2011-03-02 2012-09-07 Rokko Systems Pte Ltd Improved system for substrate processing
CN102723300A (en) * 2012-06-26 2012-10-10 江苏爱动力自动化设备有限公司 Automatic charging device for solar cells
JP2014115238A (en) * 2012-12-12 2014-06-26 Yasunaga Corp Wafer defect inspection device
CN104919582A (en) * 2013-01-09 2015-09-16 东京毅力科创株式会社 Probe apparatus and wafer transfer system
CN103199150A (en) * 2013-03-05 2013-07-10 哲为(上海)仪器科技有限公司 Composite type conveying and detecting mechanism for solar cell slices
CN103949405A (en) * 2014-04-02 2014-07-30 中国电子科技集团公司第四十八研究所 Blanking system for detecting and sorting silicon chip or cell
CN104259109A (en) * 2014-07-28 2015-01-07 中国电子科技集团公司第四十八研究所 Stepping silicon wafer quality sorting system
CN204905217U (en) * 2015-08-31 2015-12-23 苏州大学 Sun energy level polycrystalline silicon piece quality automatic classification device
CN206194697U (en) * 2016-06-28 2017-05-24 南京卓胜自动化设备有限公司 Type silicon chip or battery piece detect sorter in succession

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
录放像机机芯自动装配线介绍;贺相;组合机床与自动化加工技术(08);21-25 *

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