CN107525988A - A kind of general microwave components aging test equipment - Google Patents
A kind of general microwave components aging test equipment Download PDFInfo
- Publication number
- CN107525988A CN107525988A CN201710710741.2A CN201710710741A CN107525988A CN 107525988 A CN107525988 A CN 107525988A CN 201710710741 A CN201710710741 A CN 201710710741A CN 107525988 A CN107525988 A CN 107525988A
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- Prior art keywords
- evaporator
- temperature
- heat sink
- control system
- refrigerant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B1/00—Compression machines, plants or systems with non-reversible cycle
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B21/00—Machines, plants or systems, using electric or magnetic effects
- F25B21/02—Machines, plants or systems, using electric or magnetic effects using Peltier effect; using Nernst-Ettinghausen effect
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Thermal Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of general microwave components aging test equipment, it includes：Casing, temperature control platform, refrigeration unit and control system；Wherein, the temperature control platform is arranged on the platform structure of the casing, it is connected respectively by conductive structure with the refrigeration unit being arranged in casing, it is connected by conductive structure with control system, and for being heated or being radiated so that the temperature of temperature control platform is maintained in default scope according to the instruction of control system；The refrigeration unit is used to according to the instruction of control system be freezed to distribute heat in external environment condition.The equipment be applied to multiple power microwave components aging test, can short form test flow, improve test efficiency simultaneously reduce cost, meet a variety of microwave components aging test demands for having occurred or being likely to occur.
Description
Technical field
The present invention relates to microwave components and active phase array antenna technical field, more particularly to a kind of general microwave components are old
Refine testing equipment.
Background technology
Microwave components are the key components in active phase array antenna, for example, T/R components (Transmitter and
) etc. Receiver circuit, power supply, ripple control, feed, antenna, structure and the multiple professional techniques of radiating are included.It is directed to a large amount of
Active electronic device, such as radio frequency chip, power modulation chip, analog-digital chip and its support circuit device.
It is known that electronic product reliability change has certain rule, its indicatrix is as shown in figure 1, be generally referred to as
For " tub curve ".As can be seen from the figure electronic product has a failure high-incidence season, referred to as earlier failure period in early stage.
Product is set to enter stable random failure period by means such as amendment design, modified technique, aging devices, at this moment product tends to be steady
It is fixed.And wherein aging device is the effective measure for making product rapidly enter stationary phase.The product of electric ageing is in specific work temperature
Degree or work shell temperature, the operating voltage as defined in defined working condition or application are kept for the regular hour reach rejecting device
The purpose of early defect.
Application publication number is that CN106569187A Chinese invention patent application discloses a kind of agingtable that is based on to T/R groups
The system that part carries out automatic monitoring, its object is to reduce the dependence to tester, improve the standard of ageing properties test
True property.However, the system can not be applied to various microwave components.The microwave components power that usual same company develops simultaneously
Species is more, from tens watts to several kilowatts.If a kind of or a limited number of kind of existing aging test equipment pair is used only
The microwave components of various power carry out aging test under defined operating temperature or work shell temperature, then may make part microwave
There are hot burnout problems in component, does not only result in testing efficiency lowly and causes production cost to raise.If for various power
Microwave components are respectively adopted different aging test equipment and tested respectively, although being smoothed out for test can be ensured,
It is that aging test fixture is various, poor universality, experimentation cost remains high, and experiment process is complicated, and test efficiency is relatively low.
The content of the invention
An object of the present invention at least that, for how to overcome the above-mentioned problems of the prior art, there is provided a kind of
General microwave components aging test equipment, it is applied to the aging test of the microwave components of multiple power, being capable of short form test stream
Journey, improve test efficiency and reduce cost, meet a variety of microwave components aging test demands for having occurred or being likely to occur.
Equipment to achieve these goals, the technical solution adopted by the present invention include following aspects.
A kind of general microwave components aging test equipment, it includes：Casing, temperature control platform, refrigeration unit and control
System processed；
Wherein, the temperature control platform is arranged on the platform structure of the casing, respectively by conductive structure with setting
The refrigeration unit connection in casing is put, is connected by conductive structure with control system, and for the instruction according to control system
Heated or radiated so that the temperature of temperature control platform is maintained in default scope；The refrigeration unit is used for basis
The instruction of control system is freezed to distribute heat in external environment condition.
Preferably, the temperature control platform includes heat sink, thermal energy converter and installing plate；
Wherein, the heat sink is arranged on the platform structure of the casing, is connected by conductive structure with refrigeration unit
To carry out heat transfer；The thermal energy converter is arranged between heat sink and installing plate, is connected by conductor wire with control system,
For being heated or being freezed according to the instruction of control system；It is empty that multiple receivings for being used to fix microwave components are provided with installing plate
Between.
Preferably, the thermal energy converter is the TEC TEC of laminated structure.
Preferably, the temperature control platform includes the TEC of multiple installing plates and corresponding multiple laminated structures to be formed
Multiple independent temperature-controlled zones, each region are used to be respectively heated or radiate according to the instruction of control system.
Preferably, the temperature control platform further comprises thermal insulation board, its be filled between heat sink and installing plate and
Around the thermal energy converter.
Preferably, the aluminium alloy radiator structure that the heat sink and conductive structure are formed in one.
Preferably, the runner for coolant circulation is provided with the heat sink, and by being arranged on heat sink end face
Coolant inlet and the corresponding coolant connection of cooling liquid outlet and refrigeration unit be in fluid communication.
Preferably, the refrigeration unit includes：Compressor, condenser, expansion valve and evaporator；
Wherein, the input of compressor is connected with evaporator, and output end is connected with condenser, and compressor is used for according to control
The instruction of system is compressed to refrigerant to improve its pressure and temperature；Condenser is used to distribute heat by cross-ventilation
Into external environment condition to reduce the temperature of refrigerant；Expansion valve is used to input refrigerant in evaporator and reduces the pressure of refrigerant
Power is to absorb heat in evaporator；
Part of the aluminium alloy radiator structure of heat sink through evaporator and in evaporator, which has, to be used to increase and freeze
The structure of agent contact area is to improve the speed distributed heat in evaporator.
Preferably, the refrigeration unit includes：Compressor, condenser, expansion valve, evaporator, coolant pump and cooling
Liquid container；
Wherein, the input of compressor is connected with evaporator, and output end is connected with condenser, and compressor is used for according to control
The instruction of system is compressed to refrigerant to improve its pressure and temperature；Condenser is used to distribute heat by cross-ventilation
Into external environment condition to reduce the temperature of refrigerant；Expansion valve is used to input refrigerant in evaporator and reduces the pressure of refrigerant
Power is to absorb heat in evaporator；
The cooling liquid outlet of heat sink accesses cooling liquid container by the first coolant duct via evaporator；First cooling
Part of the liquid pipe in evaporator has to be used to increase distributes heat to evaporation with the structure of refrigerant contact area to improve
Speed in device；Cooling liquid container by the second coolant duct via the coolant inlet of coolant pump and heat sink connect with
By in the coolant input heat sink by evaporator cooling.
Preferably, the TEC of laminated structure maximum voltage is 15.4V, maximum current 3A, and maximum refrigerating capacity is
7.8W, maximum temperature difference are 100 DEG C.
In summary, by adopting the above-described technical solution, the present invention at least has the advantages that：
Temperature control platform is connected by conductive structure with the refrigeration unit being arranged in casing respectively, passes through conductive structure
It is connected with control system, and for being heated or being radiated so that the temperature of temperature control platform according to the instruction of control system
It is maintained in default scope, refrigeration unit is used to according to the instruction of control system be freezed to distribute heat to external rings
In border, so as to realize the accurate control of aging test device temperature, improve test efficiency and reduce cost.
Brief description of the drawings
Fig. 1 is the reliability variation characteristic curve synoptic diagram of electronic product.
Fig. 2 is the structural representation of general microwave components aging test equipment according to an embodiment of the invention.
Fig. 3 is the structural representation of temperature control platform according to an embodiment of the invention.
Fig. 4 is the structural representation of general microwave components aging test equipment according to another embodiment of the present invention.
Fig. 5 is the structural representation according to the general microwave components aging test equipment of further embodiment of this invention.
Embodiment
Below in conjunction with the accompanying drawings and embodiment, the present invention will be described in further detail, so that the purpose of the present invention, technology
Scheme and advantage are more clearly understood.It should be appreciated that specific embodiment described herein is only to explain the present invention, and do not have to
It is of the invention in limiting.
As shown in Fig. 2 a kind of general microwave components aging test equipment according to an embodiment of the invention includes：Casing 1,
Temperature control platform 2, refrigeration unit 3 and control system 4.
Wherein, temperature control platform 2 is arranged on the platform structure of casing 1, respectively by conductive structure with being arranged on case
Refrigeration unit 3 in body 1 connects, and is connected by conductive structure with control system 4, and for being entered according to the instruction of control system 4
Row heating is radiated so that the temperature of temperature control platform is maintained in default scope；Refrigeration unit 3 is used for according to control
The instruction of system is freezed to distribute heat in external environment condition.
In the embodiment shown in Figure 2, control system 4 is arranged at the side of casing 1.In other examples, control
System 4 can be arranged on casing 1 other and be easy to the position of test operation, such as be arranged on the side of temperature control platform 2, or
Person can also be separately positioned independently of casing 1, such as wireless communication interface is only set on casing, and control system 4 is arranged to
Electronic installation (for example, remote control, smart mobile phone, computer etc.) with wireless communication module is to carry out remote control.
As shown in figure 3, temperature control platform according to an embodiment of the invention include heat sink 21, thermal energy converter 23,
And four installing plates (24,25,26,27).
Wherein, the heat sink 21 is arranged on the platform structure of casing 1, is connected by conductive structure with refrigeration unit 3
To carry out heat transfer；Thermal energy converter 23 is arranged between heat sink 21 and installing plate (24,25,26,27), by conductor wire with
Control system 4 connects, for being heated or being freezed according to the instruction of control system 4；Installing plate is provided with (24,25,26,27)
Multiple receiving spaces for being used to fix microwave components.The receiving space can be the combination of multiple different size through holes or counterbore,
Such as the diameter of 9*9 matrix arrangements is 3.2mm screw.
In the fig. 3 embodiment, temperature control platform 2 includes four installing plates (24,25,26,27) and corresponding four
To form four independent temperature-controlled zones, each region is used to be distinguished according to the instruction of control system the TEC of laminated structure
Heated or radiated.Due to setting multiple microwave components receiving spaces in temperature control platform and zonal control can be carried out
Temperature, thus region corresponding to can accurately being selected while various sizes of microwave components are fixed heated or
Person is radiated, and so as to improve the versatility of experiment with short form test flow, improving test efficiency simultaneously reduces cost, meet it is a variety of gone out
Microwave components aging test demand that is existing or being likely to occur.
In a preferred embodiment, thermal energy converter can select the TEC TEC of laminated structure
(Thermoelectric cooler), it is arranged between installing plate and heat sink, can be carried out according to the instruction of control system
Heating or refrigeration.In a preferred embodiment, the TEC of laminated structure maximum voltage is 15.4V, maximum current 3A, most
Big refrigerating capacity is 7.8W, and maximum temperature difference is 100 DEG C.As shown in figure 3, temperature control platform also includes thermal insulation board 22, it is filled in
Between heat sink 21 and installing plate (24,25,26,27) and around the thermal energy converter.Thermal insulation board 22 can be resistance to
High temperature insulating material is made, by reducing the contact between TEC and external environment condition, it is possible to increase the temperature control of temperature control platform
Precision processed, so as to realize that the accurate temperature that temperature control precision is ± 1 DEG C controls.
Fig. 4 shows the structural representation of general microwave components aging test equipment according to another embodiment of the present invention.
Temperature control platform 2 that the equipment of the embodiment includes being arranged on casing, refrigeration unit 3, control system 4 and for set
The power supply 6 of each device power supply in standby.Wherein, temperature control platform 2 includes heat sink 21, thermal energy converter 23 and installation
Plate (24,25,26,27), the runner for coolant circulation is provided with heat sink 21, and by being arranged on the end face of heat sink 21
Coolant inlet 28 and the corresponding coolant connection of cooling liquid outlet 29 and refrigeration unit 3 be in fluid communication.Installing plate (24,25,
26th, 27) on be provided with one or more temperature sensor 41, the real time temperature Data Concurrent for obtaining installing plate gives control
System 4 processed.
Refrigeration unit 3 includes：Compressor 31, condenser 32, expansion valve 33, evaporator 34, coolant pump 35 and cooling
Liquid container 36；Wherein, the input of compressor 31 is connected with evaporator 34, and output end is connected with condenser 32, and compressor 31 is used
Refrigerant is compressed in the instruction according to control system 4 to improve its pressure and temperature；Condenser 32 can pass through pipeline
The position (such as outdoor) of testing equipment is arranged far from, for being distributed heat to by cross-ventilation in external environment condition to drop
The temperature of low refrigerant；The pressure that expansion valve 33 is used to input in evaporator 34 refrigerant and reduce refrigerant is evaporated with absorbing
Heat in device 34.
The cooling liquid outlet 29 of heat sink 21 accesses cooling liquid container by the first coolant duct 71 via evaporator 34
36；Part of first coolant pipe 71 in evaporator 34 have be used to increasing with the S types structure 72 of refrigerant contact area with
Improve the speed distributed heat in evaporator 34；Cooling liquid container 36 is by the second coolant duct 73 via coolant pump
In the 35 coolant input heat sinks 21 for being connected by evaporator 34 to cool with the coolant inlet 28 of heat sink 21.
Fig. 5 shows the structural representation of the general microwave components aging test equipment according to further embodiment of this invention.
Distributed different from the heat sink of above-described embodiment using coolant progress rapid heat, heat sink 21 and heat conduction knot shown in Fig. 5
The aluminium alloy radiator structure that structure 81 is formed in one.Aluminium alloy radiator structure runs through evaporator 34 and the part in evaporator 34
With for increasing the speed distributed heat to the S types structure 82 of refrigerant contact area with raising in evaporator 34.
It is described above, the only detailed description of the specific embodiment of the invention, rather than limitation of the present invention.Correlation technique
The technical staff in field is not in the case where departing from the principle and scope of the present invention, various replacements, modification and the improvement made
It should be included in the scope of the protection.
Claims (10)
1. a kind of general microwave components aging test equipment, it is characterised in that the equipment includes：Casing, temperature control platform,
Refrigeration unit and control system；
Wherein, the temperature control platform is arranged on the platform structure of the casing, respectively by conductive structure with being arranged on
Refrigeration unit connection in casing, is connected by conductive structure with control system, and for being carried out according to the instruction of control system
Heating is radiated so that the temperature of temperature control platform is maintained in default scope；The refrigeration unit is used for according to control
The instruction of system is freezed to distribute heat in external environment condition.
2. equipment according to claim 1, it is characterised in that the temperature control platform includes heat sink, thermal energy exchange
Device and installing plate；
Wherein, the heat sink is arranged on the platform structure of the casing, is connected by conductive structure with refrigeration unit to enter
Row heat transfer；The thermal energy converter is arranged between heat sink and installing plate, is connected, is used for control system by conductor wire
Heated or freezed according to the instruction of control system；Multiple receiving spaces for being used to fix microwave components are provided with installing plate.
3. equipment according to claim 2, it is characterised in that the thermal energy converter is the TEC of laminated structure
TEC。
4. equipment according to claim 3, it is characterised in that the temperature control platform is including multiple installing plates and correspondingly
Multiple laminated structures TEC to form multiple independent temperature-controlled zones, each region is used for the finger according to control system
Order is respectively heated or radiated.
5. equipment according to claim 1, it is characterised in that the temperature control platform further comprises thermal insulation board, its
It is filled between heat sink and installing plate and around the thermal energy converter.
6. equipment according to claim 2, it is characterised in that the aluminium that the heat sink and conductive structure are formed in one closes
Golden radiator structure.
7. equipment according to claim 2, it is characterised in that the stream for coolant circulation is provided with the heat sink
Road, and coolant inlet and cooling liquid outlet the coolant connection stream corresponding with refrigeration unit by being arranged on heat sink end face
Body connects.
8. equipment according to claim 6, it is characterised in that the refrigeration unit includes：Compressor, condenser, expansion
Valve and evaporator；
Wherein, the input of compressor is connected with evaporator, and output end is connected with condenser, and compressor is used for according to control system
Instruction refrigerant is compressed to improve its pressure and temperature；Condenser is outer for being distributed heat to by cross-ventilation
To reduce the temperature of refrigerant in portion's environment；Expansion valve be used to inputting in evaporator refrigerant and reduce the pressure of refrigerant with
Absorb heat in evaporator；
Part of the aluminium alloy radiator structure of heat sink through evaporator and in evaporator has to be used to increase to be connect with refrigerant
The structure of contacting surface product is to improve the speed distributed heat in evaporator.
9. equipment according to claim 7, it is characterised in that the refrigeration unit includes：Compressor, condenser, expansion
Valve, evaporator, coolant pump and cooling liquid container；
Wherein, the input of compressor is connected with evaporator, and output end is connected with condenser, and compressor is used for according to control system
Instruction refrigerant is compressed to improve its pressure and temperature；Condenser is outer for being distributed heat to by cross-ventilation
To reduce the temperature of refrigerant in portion's environment；Expansion valve be used to inputting in evaporator refrigerant and reduce the pressure of refrigerant with
Absorb heat in evaporator；
The cooling liquid outlet of heat sink accesses cooling liquid container by the first coolant duct via evaporator；First coolant pipe
Part in evaporator has to be used to increase to be distributed heat in evaporator with the structure of refrigerant contact area with improving
Speed；Cooling liquid container is connected with will be through by the second coolant duct via the coolant inlet of coolant pump and heat sink
In the coolant input heat sink of pervaporation device cooling.
10. equipment according to claim 3, it is characterised in that the TEC of laminated structure maximum voltage is 15.4V,
Maximum current is 3A, and maximum refrigerating capacity is 7.8W, and maximum temperature difference is 100 DEG C.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710710741.2A CN107525988A (en) | 2017-08-18 | 2017-08-18 | A kind of general microwave components aging test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710710741.2A CN107525988A (en) | 2017-08-18 | 2017-08-18 | A kind of general microwave components aging test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107525988A true CN107525988A (en) | 2017-12-29 |
Family
ID=60681496
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710710741.2A Pending CN107525988A (en) | 2017-08-18 | 2017-08-18 | A kind of general microwave components aging test equipment |
Country Status (1)
| Country | Link |
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| CN (1) | CN107525988A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110161334A (en) * | 2019-05-24 | 2019-08-23 | 上海航天电子通讯设备研究所 | It is a kind of for transmitting and receiving the ageing system of component |
| CN111509827A (en) * | 2020-05-29 | 2020-08-07 | 广东工业大学 | Charging device for low-power-consumption peripheral |
| CN113820152A (en) * | 2021-08-24 | 2021-12-21 | 上海精密计量测试研究所 | Automatic testing and evaluating system for microwave device electrothermal stress application |
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| CN1922501A (en) * | 2004-02-27 | 2007-02-28 | 威尔斯-Cti股份有限公司 | Aging testing apparatus and method |
| CN101858957A (en) * | 2010-05-27 | 2010-10-13 | 北京新润泰思特测控技术有限公司 | Ageing test box |
| CN202102048U (en) * | 2011-02-25 | 2012-01-04 | 杭州可靠性仪器厂 | Platinotron device testing system |
| CN203112966U (en) * | 2013-03-12 | 2013-08-07 | 铜陵市晶顺电子有限责任公司 | Ageing oven for crystal detection |
| CN204989343U (en) * | 2015-08-25 | 2016-01-20 | 贵州航天计量测试技术研究所 | Microwave device developments ageing tests system |
| CN205404082U (en) * | 2016-02-29 | 2016-07-27 | 倍科电子技术服务（深圳）有限公司 | Multilayer liquid cooling equipment of ageing suitable for miniwatt LED lamp pearl |
| CN106569187A (en) * | 2016-10-21 | 2017-04-19 | 北京无线电测量研究所 | Aging platform-based automatic monitoring system |
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| CN1922501A (en) * | 2004-02-27 | 2007-02-28 | 威尔斯-Cti股份有限公司 | Aging testing apparatus and method |
| CN101858957A (en) * | 2010-05-27 | 2010-10-13 | 北京新润泰思特测控技术有限公司 | Ageing test box |
| CN202102048U (en) * | 2011-02-25 | 2012-01-04 | 杭州可靠性仪器厂 | Platinotron device testing system |
| CN203112966U (en) * | 2013-03-12 | 2013-08-07 | 铜陵市晶顺电子有限责任公司 | Ageing oven for crystal detection |
| CN204989343U (en) * | 2015-08-25 | 2016-01-20 | 贵州航天计量测试技术研究所 | Microwave device developments ageing tests system |
| CN205404082U (en) * | 2016-02-29 | 2016-07-27 | 倍科电子技术服务（深圳）有限公司 | Multilayer liquid cooling equipment of ageing suitable for miniwatt LED lamp pearl |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110161334A (en) * | 2019-05-24 | 2019-08-23 | 上海航天电子通讯设备研究所 | It is a kind of for transmitting and receiving the ageing system of component |
| CN110161334B (en) * | 2019-05-24 | 2021-08-17 | 上海航天电子通讯设备研究所 | Burn-in system for sending and receiving assembly |
| CN111509827A (en) * | 2020-05-29 | 2020-08-07 | 广东工业大学 | Charging device for low-power-consumption peripheral |
| CN113820152A (en) * | 2021-08-24 | 2021-12-21 | 上海精密计量测试研究所 | Automatic testing and evaluating system for microwave device electrothermal stress application |
| CN113820152B (en) * | 2021-08-24 | 2023-08-11 | 上海精密计量测试研究所 | Automatic test and evaluation system for applying electrothermal stress of microwave device |
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| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 610093 Shiyang Industrial Park, No.288, Yixin Avenue, hi tech Zone, Chengdu, Sichuan Province Applicant after: Chengdu lightning Micro Power Technology Co., Ltd Address before: 610213 Shiyang Industrial Park, hi tech Zone, Chengdu, Sichuan Applicant before: RML TECHNOLOGY Co.,Ltd. |
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| RJ01 | Rejection of invention patent application after publication | ||
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Application publication date: 20171229 |