CN107507753B - 一种研究离子光激发后产物的装置 - Google Patents
一种研究离子光激发后产物的装置 Download PDFInfo
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- CN107507753B CN107507753B CN201710683214.7A CN201710683214A CN107507753B CN 107507753 B CN107507753 B CN 107507753B CN 201710683214 A CN201710683214 A CN 201710683214A CN 107507753 B CN107507753 B CN 107507753B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
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- Chemical Kinetics & Catalysis (AREA)
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- Engineering & Computer Science (AREA)
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
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CN201710683214.7A CN107507753B (zh) | 2017-08-02 | 2017-08-02 | 一种研究离子光激发后产物的装置 |
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CN201710683214.7A CN107507753B (zh) | 2017-08-02 | 2017-08-02 | 一种研究离子光激发后产物的装置 |
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CN107507753A CN107507753A (zh) | 2017-12-22 |
CN107507753B true CN107507753B (zh) | 2019-01-11 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109300769B (zh) * | 2018-08-09 | 2023-06-20 | 金华职业技术学院 | 一种研究大分子电荷量的方法 |
CN112526585A (zh) * | 2020-11-02 | 2021-03-19 | 中国科学院国家空间科学中心 | 一种原位测量轨道中性气体粒子速度的探测器及探测方法 |
CN112582249B (zh) * | 2020-12-02 | 2022-03-15 | 上海科技大学 | 高动能高分辨复合电子离子速度成像装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010145142A (ja) * | 2008-12-17 | 2010-07-01 | Hitachi Ltd | 試料分析装置及び試料分析方法 |
CN103558628A (zh) * | 2013-10-09 | 2014-02-05 | 中国科学院大连化学物理研究所 | 一种新型双反射式飞行时间质谱光电子速度成像仪 |
CN106896089A (zh) * | 2015-12-17 | 2017-06-27 | 中国科学院大连化学物理研究所 | 一种基于电喷雾离子源的光电子成像装置 |
CN207052566U (zh) * | 2017-08-02 | 2018-02-27 | 金华职业技术学院 | 一种研究离子光激发后产物的装置 |
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2017
- 2017-08-02 CN CN201710683214.7A patent/CN107507753B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010145142A (ja) * | 2008-12-17 | 2010-07-01 | Hitachi Ltd | 試料分析装置及び試料分析方法 |
CN103558628A (zh) * | 2013-10-09 | 2014-02-05 | 中国科学院大连化学物理研究所 | 一种新型双反射式飞行时间质谱光电子速度成像仪 |
CN106896089A (zh) * | 2015-12-17 | 2017-06-27 | 中国科学院大连化学物理研究所 | 一种基于电喷雾离子源的光电子成像装置 |
CN207052566U (zh) * | 2017-08-02 | 2018-02-27 | 金华职业技术学院 | 一种研究离子光激发后产物的装置 |
Non-Patent Citations (1)
Title |
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用于二元合金团簇负离子研究的光电子能谱仪;邢小鹏 等;《化学物理学报》;20040731;第17卷(第3期);全文 |
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CB03 | Change of inventor or designer information |
Inventor after: Zhang Wenying Inventor after: Huang Huimin Inventor after: Zhang Xiangping Inventor after: Zhao Yongjian Inventor before: Huang Huimin Inventor before: Zhang Xiangping Inventor before: Zhao Yongjian |
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Effective date of registration: 20220817 Address after: 1st Floor, No. 12, Haitai Development 2nd Road, Huayuan Industrial Zone (Huanwai), High-tech Industrial Development Zone, Binhai New Area, Tianjin 300000 Patentee after: TIANJIN ACT MEASUREMENT & CONTROL TECHNOLOGY Co.,Ltd. Address before: 321017 Zhejiang province Jinhua Wuzhou Street No. 1188 Patentee before: JINHUA College OF PROFESSION AND TECHNOLOGY |
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