CN107808817B - 用于空间微小碎片和微流星体成分探测的飞行时间质谱计 - Google Patents
用于空间微小碎片和微流星体成分探测的飞行时间质谱计 Download PDFInfo
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- CN107808817B CN107808817B CN201711005545.1A CN201711005545A CN107808817B CN 107808817 B CN107808817 B CN 107808817B CN 201711005545 A CN201711005545 A CN 201711005545A CN 107808817 B CN107808817 B CN 107808817B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/061—Ion deflecting means, e.g. ion gates
Abstract
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CN201711005545.1A CN107808817B (zh) | 2017-10-25 | 2017-10-25 | 用于空间微小碎片和微流星体成分探测的飞行时间质谱计 |
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CN201711005545.1A CN107808817B (zh) | 2017-10-25 | 2017-10-25 | 用于空间微小碎片和微流星体成分探测的飞行时间质谱计 |
Publications (2)
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CN107808817A CN107808817A (zh) | 2018-03-16 |
CN107808817B true CN107808817B (zh) | 2019-06-14 |
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CN201711005545.1A Expired - Fee Related CN107808817B (zh) | 2017-10-25 | 2017-10-25 | 用于空间微小碎片和微流星体成分探测的飞行时间质谱计 |
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Families Citing this family (4)
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DE102019124397B4 (de) | 2019-09-11 | 2021-11-18 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Erfassungssystem |
CN111595738B (zh) * | 2020-06-03 | 2022-08-23 | 北京卫星环境工程研究所 | 超高速颗粒直径分布探测装置 |
CN112304365B (zh) * | 2020-09-25 | 2022-07-05 | 北京空间飞行器总体设计部 | 一种在轨微小空间碎片多参数测量探头及测量方法 |
CN114184531B (zh) * | 2021-11-18 | 2023-05-12 | 中煤科工集团西安研究院有限公司 | 用于截水帷幕位置优选及效果评价的试验装置及试验方法 |
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JP2004502276A (ja) * | 2000-06-28 | 2004-01-22 | ザ ジョンズ ホプキンズ ユニバーシティ | 飛行時間型質量分析計配列装置 |
JP5530531B2 (ja) * | 2010-11-19 | 2014-06-25 | 株式会社日立ハイテクノロジーズ | 質量分析装置および質量分析方法 |
GB201110662D0 (en) * | 2011-06-23 | 2011-08-10 | Thermo Fisher Scient Bremen | Targeted analysis for tandem mass spectrometry |
GB201201403D0 (en) * | 2012-01-27 | 2012-03-14 | Thermo Fisher Scient Bremen | Multi-reflection mass spectrometer |
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SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Jiang Lixiang Inventor after: Jiao Zilong Inventor after: Li Tao Inventor after: Zheng Huiqi Inventor after: Tian Chuan Inventor after: Tang Zhenyu Inventor after: Dou Renchao Inventor after: Sun Jipeng Inventor after: Peng Yuchuan Inventor before: Jiang Lixiang Inventor before: Jiao Zilong Inventor before: Li Tao Inventor before: Zheng Huiqi Inventor before: Tang Zhenyu Inventor before: Dou Renchao Inventor before: Sun Jipeng Inventor before: Peng Yuchuan |
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GR01 | Patent grant | ||
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190614 Termination date: 20211025 |