CN104658852B - 一种多离子源飞行时间质谱仪 - Google Patents
一种多离子源飞行时间质谱仪 Download PDFInfo
- Publication number
- CN104658852B CN104658852B CN201310582870.XA CN201310582870A CN104658852B CN 104658852 B CN104658852 B CN 104658852B CN 201310582870 A CN201310582870 A CN 201310582870A CN 104658852 B CN104658852 B CN 104658852B
- Authority
- CN
- China
- Prior art keywords
- ion
- ion source
- source
- mass spectrometer
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/24—Vacuum systems, e.g. maintaining desired pressures
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310582870.XA CN104658852B (zh) | 2013-11-19 | 2013-11-19 | 一种多离子源飞行时间质谱仪 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310582870.XA CN104658852B (zh) | 2013-11-19 | 2013-11-19 | 一种多离子源飞行时间质谱仪 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104658852A CN104658852A (zh) | 2015-05-27 |
CN104658852B true CN104658852B (zh) | 2017-02-01 |
Family
ID=53249842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310582870.XA Active CN104658852B (zh) | 2013-11-19 | 2013-11-19 | 一种多离子源飞行时间质谱仪 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN104658852B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105304455B (zh) * | 2015-09-25 | 2017-03-29 | 中国工程物理研究院核物理与化学研究所 | 一种真空弧离子源飞行时间质谱仪 |
CN107240543B (zh) * | 2017-07-26 | 2023-06-27 | 合肥美亚光电技术股份有限公司 | 一种带有双场加速区的飞行时间质谱仪 |
CN110706999A (zh) * | 2018-07-24 | 2020-01-17 | 宁波海歌电器有限公司 | 一种双通道飞行时间质量分析器 |
CN109887833B (zh) * | 2019-03-06 | 2020-12-25 | 杭州蔚领知谱检测技术有限公司 | 一种复合式离子源双极性线性离子阱质量分析器 |
CN114256054B (zh) * | 2021-12-28 | 2023-07-04 | 广州禾信仪器股份有限公司 | 一种飞行时间质谱仪及检测系统 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040079881A1 (en) * | 2002-09-18 | 2004-04-29 | Fischer Steven M. | Multimode ionization source |
CN1749749A (zh) * | 2004-09-13 | 2006-03-22 | 安捷伦科技有限公司 | 用于质谱仪离子源的多入口取样设备 |
-
2013
- 2013-11-19 CN CN201310582870.XA patent/CN104658852B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040079881A1 (en) * | 2002-09-18 | 2004-04-29 | Fischer Steven M. | Multimode ionization source |
CN1749749A (zh) * | 2004-09-13 | 2006-03-22 | 安捷伦科技有限公司 | 用于质谱仪离子源的多入口取样设备 |
Also Published As
Publication number | Publication date |
---|---|
CN104658852A (zh) | 2015-05-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104658852B (zh) | 一种多离子源飞行时间质谱仪 | |
AU2013374169B2 (en) | Multi-reflection high-resolution time of flight mass spectrometer | |
CN105070631B (zh) | 具有增强的灵敏度和质量分辨能力的四极质谱仪 | |
CN108063083A (zh) | 用于质谱仪的高动态范围离子检测器 | |
Osborn et al. | Breaking through the false coincidence barrier in electron–ion coincidence experiments | |
WO2004085992A3 (en) | Distance of flight spectrometer for ms and simultaneous scanless ms/ms | |
US9006678B2 (en) | Non-radioactive ion source using high energy electrons | |
US20160071714A1 (en) | Ion guiding device and ion guiding method | |
Jones et al. | Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS | |
CN103871829A (zh) | 具有质量过滤功能的反射式飞行时间质谱仪及使用方法 | |
Jeromel et al. | Development of mass spectrometry by high energy focused heavy ion beam: MeV SIMS with 8 MeV Cl7+ beam | |
Bellm et al. | Fully Differential Molecular-Frame Measurements for the Electron-Impact Dissociative Ionization of H 2 | |
CN112635293A (zh) | 一种无机质谱仪 | |
US8354635B2 (en) | Mass spectrometer | |
CN107808817B (zh) | 用于空间微小碎片和微流星体成分探测的飞行时间质谱计 | |
CN102778498B (zh) | 用于质谱和光谱分析的高分辨离子选择性光解离装置与方法 | |
US5898173A (en) | High resolution ion detection for linear time-of-flight mass spectrometers | |
Wang et al. | Fragmentation dynamics of CS2 in collisions with 1.0 keV electrons | |
CN103745909B (zh) | 选择性离子筛除飞行时间质量分析器及其实现方法与应用 | |
Miller et al. | Orthogonal time-of-flight mass spectrometry of an ion beam with a broad kinetic energy profile | |
CN108089064A (zh) | 一种测量脉冲离子束脉冲宽度的装置及方法 | |
JP5553308B2 (ja) | 軽元素分析装置及び分析方法 | |
De et al. | A setup for probing ion–molecule collision dynamics | |
CN110911264A (zh) | 一种用于飞行时间质谱仪的离子信号检测装置和方法 | |
CN210897194U (zh) | 一种用于飞行时间质谱仪的离子信号检测装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20211208 Address after: 213000 9, Yang Road, West Taihu science and technology industry, Changzhou, Jiangsu Patentee after: CHANGZHOU PANNUO APPARATUS CO.,LTD. Address before: 215123 b2-2f, No. 99, Ren'ai Road, Suzhou Industrial Park, Jiangsu Province Patentee before: SUZHOU MEISHI SPECIAL MASS SPECTROMETER Co.,Ltd. |
|
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: A multi ion source time of flight mass spectrometer Effective date of registration: 20220628 Granted publication date: 20170201 Pledgee: Shanghai Rural Commercial Bank Co.,Ltd. Jiading sub branch Pledgor: CHANGZHOU PANNUO APPARATUS CO.,LTD. Registration number: Y2022310000098 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20230706 Granted publication date: 20170201 Pledgee: Shanghai Rural Commercial Bank Co.,Ltd. Jiading sub branch Pledgor: CHANGZHOU PANNUO APPARATUS CO.,LTD. Registration number: Y2022310000098 |