CN107389585B - 一种气体分析仪及气体分析方法 - Google Patents
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- CN107389585B CN107389585B CN201710720122.1A CN201710720122A CN107389585B CN 107389585 B CN107389585 B CN 107389585B CN 201710720122 A CN201710720122 A CN 201710720122A CN 107389585 B CN107389585 B CN 107389585B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N21/3518—Devices using gas filter correlation techniques; Devices using gas pressure modulation techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/37—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N2021/3545—Disposition for compensating effect of interfering gases
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Abstract
Description
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Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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CN201710720122.1A CN107389585B (zh) | 2017-08-21 | 2017-08-21 | 一种气体分析仪及气体分析方法 |
PCT/CN2018/100767 WO2019037648A1 (zh) | 2017-08-21 | 2018-08-16 | 一种气体分析仪及气体分析方法 |
EP18847361.5A EP3674689B1 (en) | 2017-08-21 | 2018-08-16 | Gas analyzer and gas analyzing method |
US16/832,020 US11079322B2 (en) | 2017-08-21 | 2020-03-27 | Gas analyzer and gas analyzing method |
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CN201710720122.1A CN107389585B (zh) | 2017-08-21 | 2017-08-21 | 一种气体分析仪及气体分析方法 |
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CN107389585A CN107389585A (zh) | 2017-11-24 |
CN107389585B true CN107389585B (zh) | 2019-11-15 |
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CN201710720122.1A Active CN107389585B (zh) | 2017-08-21 | 2017-08-21 | 一种气体分析仪及气体分析方法 |
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Country | Link |
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US (1) | US11079322B2 (zh) |
EP (1) | EP3674689B1 (zh) |
CN (1) | CN107389585B (zh) |
WO (1) | WO2019037648A1 (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107389585B (zh) * | 2017-08-21 | 2019-11-15 | 湖北锐意自控系统有限公司 | 一种气体分析仪及气体分析方法 |
CN107941734A (zh) * | 2017-09-20 | 2018-04-20 | 国网辽宁省电力有限公司检修分公司 | 一种具有多功能sf6检测技术的综合分析平台及方法 |
CN109507140B (zh) * | 2018-10-16 | 2020-04-10 | 四方光电股份有限公司 | 一种高精度红外气体传感器及气体分析方法 |
CN109406532B (zh) * | 2018-10-24 | 2021-01-05 | 广州海狮软件科技有限公司 | 一种适用于小管径管材的表面缺陷的低成本视觉检测装置及方法 |
CN113767274A (zh) * | 2019-08-23 | 2021-12-07 | 西门子股份公司 | 气体分析仪 |
CN110806403B (zh) * | 2019-11-28 | 2024-05-10 | 北京永安多谱检测科技有限公司 | 一种便携式一体化过氧化物检测装置及其检测方法 |
CN112666108B (zh) * | 2020-11-27 | 2023-07-25 | 广西电网有限责任公司电力科学研究院 | 一种涉及红外光谱对环保气体热解后混合气体检测方法 |
CN112816377B (zh) * | 2020-12-30 | 2024-03-15 | 杭州谱育科技发展有限公司 | 基于ftir技术的烟气检测方法 |
CN113567385A (zh) * | 2021-07-08 | 2021-10-29 | 浙江焜腾红外科技有限公司 | 激光红外气体传感器 |
CN113612859B (zh) * | 2021-09-18 | 2023-04-18 | 中国科学院长春光学精密机械与物理研究所 | 矿井环境监测系统及其监测方法 |
CN114136912B (zh) * | 2021-12-01 | 2023-10-20 | 河南森斯科传感技术有限公司 | 一种双光可调式红外气体传感器的校准方法 |
CN114441717B (zh) * | 2022-02-11 | 2023-04-21 | 华北电力大学(保定) | 一种生物气溶胶快速测量装置及方法 |
CN116242795B (zh) * | 2023-05-12 | 2023-07-18 | 山东益来环保科技有限公司 | 一种紫外烟气分析仪及其使用方法 |
Citations (1)
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CN207147966U (zh) * | 2017-08-21 | 2018-03-27 | 湖北锐意自控系统有限公司 | 气体分析仪 |
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US2924713A (en) * | 1956-01-18 | 1960-02-09 | Beckman Instruments Inc | Instruments |
JPS5014139B1 (zh) * | 1969-08-29 | 1975-05-26 | ||
US3770974A (en) * | 1972-06-29 | 1973-11-06 | Mine Safety Appliances Co | Non-dispersive infrared fluid analyzer with compensation for absorptive and mechanical effects of ambient conditions |
JPS58190743A (ja) | 1982-04-30 | 1983-11-07 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
JPS6011122A (ja) * | 1983-07-01 | 1985-01-21 | Shimadzu Corp | 非分散型赤外分析法における干渉補償方法 |
JPS6117654U (ja) * | 1984-07-07 | 1986-02-01 | 株式会社 堀場製作所 | 赤外線ガス分析計 |
JPH0480642A (ja) * | 1990-07-23 | 1992-03-13 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
DE19732470C2 (de) * | 1997-07-28 | 1999-11-18 | Siemens Ag | Nichtdispersiver Infrarot-Gasanalysator |
JP2000002657A (ja) * | 1998-06-12 | 2000-01-07 | Horiba Ltd | 赤外線ガス分析計における水分干渉補正方法 |
JP2004061207A (ja) * | 2002-07-26 | 2004-02-26 | Shimadzu Corp | 赤外線ガス分析計 |
DE102004031643A1 (de) * | 2004-06-30 | 2006-02-02 | Abb Patent Gmbh | Nichtdispersiver Infrarot-Gasanalysator |
DE102009059962B4 (de) | 2009-12-22 | 2011-09-01 | Siemens Aktiengesellschaft | NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators |
DE102011108941B4 (de) | 2011-07-29 | 2013-02-28 | Abb Technology Ag | Optische Gasanalysatoreinrichtung mit Mitteln zum Verbessern der Selektivität bei Gasgemischanalysen |
JP2013096889A (ja) * | 2011-11-02 | 2013-05-20 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
CN102590126A (zh) * | 2011-12-28 | 2012-07-18 | 武汉四方光电科技有限公司 | 一种长寿命的微流红外so2传感器 |
CN102809546B (zh) * | 2012-08-21 | 2015-04-22 | 南京埃森环境技术有限公司 | 一种低浓度烟气红外分析仪及检测方法 |
CN102980870B (zh) * | 2012-12-10 | 2014-10-29 | 武汉四方光电科技有限公司 | 一种高精度微流红外气体传感器及其测量方法 |
CN104089918A (zh) * | 2014-07-03 | 2014-10-08 | 中国人民解放军后勤工程学院 | 一种基于非分光红外法的油气在线检测装置 |
CN107389585B (zh) * | 2017-08-21 | 2019-11-15 | 湖北锐意自控系统有限公司 | 一种气体分析仪及气体分析方法 |
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2017
- 2017-08-21 CN CN201710720122.1A patent/CN107389585B/zh active Active
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2018
- 2018-08-16 WO PCT/CN2018/100767 patent/WO2019037648A1/zh unknown
- 2018-08-16 EP EP18847361.5A patent/EP3674689B1/en active Active
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2020
- 2020-03-27 US US16/832,020 patent/US11079322B2/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN207147966U (zh) * | 2017-08-21 | 2018-03-27 | 湖北锐意自控系统有限公司 | 气体分析仪 |
Also Published As
Publication number | Publication date |
---|---|
EP3674689A1 (en) | 2020-07-01 |
CN107389585A (zh) | 2017-11-24 |
US11079322B2 (en) | 2021-08-03 |
EP3674689A4 (en) | 2021-07-28 |
EP3674689B1 (en) | 2023-12-13 |
US20200225150A1 (en) | 2020-07-16 |
WO2019037648A1 (zh) | 2019-02-28 |
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