CN107369663A - A kind of chip of fan-out package structure for possessing front salient point and preparation method thereof - Google Patents
A kind of chip of fan-out package structure for possessing front salient point and preparation method thereof Download PDFInfo
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- CN107369663A CN107369663A CN201710742257.8A CN201710742257A CN107369663A CN 107369663 A CN107369663 A CN 107369663A CN 201710742257 A CN201710742257 A CN 201710742257A CN 107369663 A CN107369663 A CN 107369663A
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- chip
- heat
- fan
- salient point
- package structure
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- 238000002360 preparation method Methods 0.000 title claims abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 67
- 239000010410 layer Substances 0.000 claims abstract description 50
- 229910052802 copper Inorganic materials 0.000 claims abstract description 39
- 239000010949 copper Substances 0.000 claims abstract description 39
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 38
- 239000002184 metal Substances 0.000 claims abstract description 36
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000011241 protective layer Substances 0.000 claims abstract description 10
- 239000000919 ceramic Substances 0.000 claims description 13
- 239000003292 glue Substances 0.000 claims description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 6
- 238000007747 plating Methods 0.000 claims description 4
- 238000002513 implantation Methods 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 17
- 239000000463 material Substances 0.000 description 10
- 238000005516 engineering process Methods 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000005538 encapsulation Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 229920005989 resin Polymers 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 238000005530 etching Methods 0.000 description 2
- 239000013528 metallic particle Substances 0.000 description 2
- 239000005022 packaging material Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical group C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 1
- 239000011469 building brick Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 229920002521 macromolecule Polymers 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000029058 respiratory gaseous exchange Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000004634 thermosetting polymer Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3731—Ceramic materials or glass
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3736—Metallic materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/14—Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0237—Disposition of the redistribution layers
- H01L2224/02379—Fan-out arrangement
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04105—Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/12105—Bump connectors formed on an encapsulation of the semiconductor or solid-state body, e.g. bumps on chip-scale packages
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/14—Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
- H01L2224/141—Disposition
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73267—Layer and HDI connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
This application discloses a kind of chip for the fan-out package structure for possessing front salient point, including heat-radiating substrate, the front of the heat-radiating substrate offers at least one chip slot, chip body is bonded with the chip slot, the front and side of the chip body, the front of the heat-radiating substrate is all covered with dielectric layer, the chip body is positively connected with copper bump, the copper bump is connected to positioned at the positive metal ball of the heat-radiating substrate using by the positive metallic circuit of the dielectric layer, the front of the metallic circuit is provided with protective layer in addition to the position of the metal ball.Above-mentioned chip of fan-out package structure for possessing front salient point and preparation method thereof, the radiating effect of chip can be effectively improved on the basis of low cost, optimize configuration, and without lead frame.
Description
Technical field
The invention belongs to chip encapsulation technology field, more particularly to a kind of fan-out package structure for possessing front salient point
Chip and preparation method thereof.
Background technology
At present, electronic information technology has been deep into the every field of national economy, and the daily life with us ceases manner of breathing
Close.Microelectronics IC chip encapsulation technology refers to each element and chip composition electronic building brick, module, will by defined circuit
Reasonable Arrangement, assembling, bonding, interconnection are asked, and is isolated with external environment condition, so as to reach a kind of comprehensive Design of protection and manufacture skill
Art.Different encapsulation technologies is widely different in manufacturing process and process aspect, to the performance of memory chip self performance after encapsulation
Also function to vital effect.With the rapid development of photoelectricity, micro- electric manufacturing process technology, electronic product is all the time towards more
Small, lighter and less expensive direction is developed, therefore the packing forms of chip component are also continuously available improvement.
In existing chip-packaging structure, chip is wrapped in injection molding body mostly, mainly the gold by being connected with chip
Category carries out heat transfer with extraneous, and heat-sinking capability is limited, and this sufferings can influence the stability of chip operation.A kind of prior art is modeling
Expect that the encapsulation that substrate material is chip bearing bottom plate, particularly ball type array encapsulation more and use plastic base material, but due to modeling
Expect that the heat conductivility of substrate in itself is poor, cause radiating effect bad, also prior art realizes electricity interconnection using metal wire
Encapsulating structure, chip being bonded on loading plate by macromolecule epoxy resin material more, the radiating effect of resin in itself is poor,
Chip mainly passes through the metallic particles added in resin and carries out heat transfer, and metal is selected to reach more preferable radiating effect
The higher synthetic resin of grain proportion, the relative drop of resin ratio is caused, it is viscous between chip, loading plate to reduce it
Power is tied, and then the reliability such as layering caused by the high stress residual that cohesive force is not strong, metallic particles is brought at high proportion occurs
Problem, is also limited and the semiconductor packages of poor heat radiation by the encapsulating structure of itself, also there is the side using high heat conduction plastic packaging material
Formula improves radiating effect, but high heat conduction plastic packaging material is in addition to high cost price itself, the control to product plastic package process
It it is also proposed higher requirement, and radiating effect unobvious.
The content of the invention
To solve the above problems, the invention provides a kind of chip of fan-out package structure for possessing front salient point and its
Preparation method, the radiating effect of chip can be effectively improved on the basis of low cost, optimize configuration, and without lead frame
Frame.
A kind of chip of fan-out package structure for possessing front salient point provided by the invention, including heat-radiating substrate, it is described
The front of heat-radiating substrate offers at least one chip slot, and chip body is bonded with the chip slot, the chip body
Front and side, the front of the heat-radiating substrate are all covered with dielectric layer, and the chip body is positively connected with copper bump, institute
Copper bump is stated to be connected to positioned at the positive metal ball of the heat-radiating substrate using by the positive metallic circuit of the dielectric layer,
The front of the metallic circuit is provided with protective layer in addition to the position of the metal ball.
Preferably, in the chip of the above-mentioned fan-out package structure for possessing front salient point, the heat-radiating substrate is copper-based
Plate or ceramic substrate.
Preferably, in the chip of the above-mentioned fan-out package structure for possessing front salient point, the chip body utilizes
Die-Attach glue is Nian Jie with the chip slot.
Preferably, in the chip of the above-mentioned fan-out package structure for possessing front salient point, the thickness of the heat-radiating substrate
Scope is 0.5 millimeter to 5.0 millimeters.
Preferably, in the chip of the above-mentioned fan-out package structure for possessing front salient point, the dielectric layer be ABF layers,
Bcb layer or PI layers.
Preferably, in the chip of the above-mentioned fan-out package structure for possessing front salient point, the metallic circuit is copper cash
Or silver wire.
A kind of preparation method of the chip of fan-out package structure for possessing front salient point provided by the invention, including:
At least one chip slot is opened up in the front of heat-radiating substrate;
Adhering chip body in the chip slot, in the front implantation copper bump of the chip body;
The front of the chip body and side, the front of the heat-radiating substrate cover dielectric layer;
Metal seed layer, and plating metal circuit are made in the dielectric layer surface;
Need parts to be protected to cover photoresistance film in the metallic circuit, etch away the metal wire for being not required to area to be protected
Road and metal seed layer, and remove the photoresistance film;
Protective layer is set in the front of the metallic circuit, is reserved in the front of the heat-radiating substrate and plants ball region, and
In ball placement region implanted metal ball, the copper bump is connected to position using by the positive metallic circuit of the dielectric layer
In the positive metal ball of the heat-radiating substrate;
Unnecessary dielectric layer is removed, cuts out one single chip.
Preferably, it is described to dissipate in the preparation method of the chip of the above-mentioned fan-out package structure for possessing front salient point
The front of hot substrate opens up at least one chip slot:
At least one chip slot is opened up in the front of copper base or ceramic substrate.
By foregoing description, the chip of the above-mentioned fan-out package structure for possessing front salient point provided by the invention and
Its preparation method, because the chip includes heat-radiating substrate, the front of the heat-radiating substrate offers at least one chip slot, described
Chip body is bonded with chip slot, the front of the chip body and side, the front of the heat-radiating substrate are all covered with being situated between
Electric layer, the chip body are positively connected with copper bump, and the copper bump utilizes the positive metal by the dielectric layer
Connection is to the positive metal ball of the heat-radiating substrate is located at, and the front of the metallic circuit is except the position of the metal ball
Outside be provided with protective layer, therefore the radiating effect of chip can be effectively improved on the basis of low cost, optimize circuit cloth
Office, and without lead frame.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
The embodiment of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis
The accompanying drawing of offer obtains other accompanying drawings.
Fig. 1 is the signal of the chip for the fan-out package structure that the first that the embodiment of the present application provides possesses front salient point
Figure;
Fig. 2 is the making of the chip for the fan-out package structure that the first that the embodiment of the present application provides possesses front salient point
The schematic diagram of method.
Embodiment
The core concept of the present invention is to provide a kind of chip and its system of the fan-out package structure for possessing front salient point
Make method, the radiating effect of chip can be effectively improved on the basis of low cost, optimize configuration, and without lead frame
Frame.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of protection of the invention.
The embodiment of the present application provide the first possess front salient point fan-out package structure chip as shown in figure 1,
Fig. 1 be the embodiment of the present application provide the first possess front salient point fan-out package structure chip schematic diagram, the core
Piece includes heat-radiating substrate 1, and the material of the heat-radiating substrate 1 can be but not limited to copper or ceramics, is dissipated as long as there is sufficiently high
Hot property, the front of the heat-radiating substrate 1 offer at least one chip slot 2, and the chip slot 2 opened up here can be two
More than individual, this is decided according to the actual requirements, and is not intended to limit herein, and the depth and width of chip slot are not intended to limit, described
Chip body 3 is bonded with chip slot 2, this mode that direct adhering chip body is slotted on heat-radiating substrate can be realized more
Good radiating effect, and need to stress, using this programme, it becomes possible to opened up on same substrate with difference
The chip slot of size, so as to place different types of chip body, encapsulated while realizing various chips body, greatly improve envelope
Efficiency is filled, can also reduce the overall volume of encapsulating structure, the front of the chip body 3 and side, the heat-radiating substrate 1 are just
Face is all covered with dielectric layer 4, and the chip body 1 is positively connected with copper bump 5, and the copper bump 5 is using by being given an account of
The positive metallic circuit of electric layer 4 is connected to positioned at the positive metal ball 6 of the heat-radiating substrate 1, the front of the metallic circuit
Protective layer 7 is provided with addition to the position of the metal ball 6, in this case, heat caused by chip body can be with
It is directly transferred on heat-radiating substrate, then outside is transmitted to by heat-radiating substrate, without the resistance of epoxy resin or other heat-barrier materials
Gear, realize more quickly radiating.
By foregoing description, the embodiment of the present application provide the first possess the fan-out package structure of front salient point
Chip, because the front including heat-radiating substrate, the heat-radiating substrate offers at least one chip slot, glued in the chip slot
Chip body is connected to, the front of the chip body and side, the front of the heat-radiating substrate are all covered with dielectric layer, the core
Piece body is positively connected with copper bump, and the copper bump is connected to position using by the positive metallic circuit of the dielectric layer
In the positive metal ball of the heat-radiating substrate, the front of the metallic circuit is provided with addition to the position of the metal ball
Protective layer, therefore the radiating effect of chip can be effectively improved on the basis of low cost, optimize configuration, and without lead
Framework.
The chip for second of fan-out package structure for possessing front salient point that the embodiment of the present application provides, it is above-mentioned the
On the basis of a kind of chip for the fan-out package structure for possessing front salient point, in addition to following technical characteristic:
The heat-radiating substrate is copper base or ceramic substrate.
Because the heat conductivility of copper and ceramics is splendid, therefore using the radiating effect meeting of copper base or ceramic substrate to chip
Greatly improve, and by chip directly placed on copper base or ceramic substrate, it is not necessary to custom lead-frame, and can be according to need
Ask and carry out multiple same cake cores, even more than loading in mixture for different model chip, reduce manufacturing cost, improve the production effect of chip
Rate.
The embodiment of the present application provide the third possess front salient point fan-out package structure chip, be above-mentioned the
On the basis of a kind of chip for the fan-out package structure for possessing front salient point, in addition to following technical characteristic:
The chip body is Nian Jie with the chip slot using Die-Attach glue.
It should be noted that the DA glue (Die-Attach glue) that this preferred scheme uses is chip attachment glue, it is led
It is epoxy resin, silver powder and other additives to want composition, and the effect primarily served is adhering chip and substrate, its conductive and heat conduction
Performance is more preferable, so as to further realize the good radiating effect of chip.
The chip for the 4th kind of fan-out package structure for possessing front salient point that the embodiment of the present application provides, it is above-mentioned the
On the basis of a kind of chip for the fan-out package structure for possessing front salient point, in addition to following technical characteristic:
The thickness range of the heat-radiating substrate is 0.5 millimeter to 5.0 millimeters.
It should be noted that heat-radiating substrate can not be too thick, the stop to heat is thus reduced to greatest extent, can not be too
It is thin, thus guarantee to set chip slot thereon, therefore this scheme is generally preferred to 0.5 millimeter to 5.0 millimeters, takes into account
Radiating and the aspect of processing two.
The chip for the 5th kind of fan-out package structure for possessing front salient point that the embodiment of the present application provides, it is above-mentioned the
On the basis of a kind of chip for the fan-out package structure for possessing front salient point, in addition to following technical characteristic:
The dielectric layer is ABF layers, bcb layer or PI layers.
Wherein, the ABF layers are laminated plates dielectric resin material, and the bcb layer is benzocyclobutene insulating resin material
Material, the PI layers are polyimide composite insulated material.
The chip for the 6th kind of fan-out package structure for possessing front salient point that the embodiment of the present application provides, it is above-mentioned the
In a kind of chip to the 5th kind of fan-out package structure for possessing front salient point it is any on the basis of, in addition to following technology
Feature:
The metallic circuit is copper cash or silver wire.
It should be noted that this copper cash or silver wire have more preferable heat dispersion, thus can be preferably here this two
Kind, the metallic circuit of other kinds of perfect heat-dissipating can also be selected certainly, be not intended to limit herein.
The preparation method that the first of the embodiment of the present application offer possesses the chip of the fan-out package structure of front salient point
As shown in Fig. 2 Fig. 2 is the system of the chip for the fan-out package structure that the first that the embodiment of the present application provides possesses front salient point
Make the schematic diagram of method, this method comprises the following steps:
S1:At least one chip slot is opened up in the front of heat-radiating substrate;
Wherein, chip groove depth is the thickness that chip height adds adhesive glue, and the chip slot opened up here can be two
More than, it is decided according to the actual requirements, there can also be various sizes of chip slot simultaneously, adapts to various sizes of chip sheet
Body, to improve producing efficiency.
S2:Adhering chip body in the chip slot, in the front implantation copper bump of the chip body;
Specifically, being coated in chip slot, DA is viscous and glue, chip body is mounted in chip slot so that chip body
Upper surface and the upper surface flush of heat-radiating substrate.
S3:The front of the chip body and side, the front of the heat-radiating substrate cover dielectric layer;
Specifically, the dielectric layer above copper bump can be removed with laser, expose copper bump.
S4:Metal seed layer, and plating metal circuit are made in the dielectric layer surface;
Metalized is carried out to the upper and lower surface of substrate first, makes metal seed layer so that subsequently it can be entered
Row plating metal circuit, metal seed layer electroplating surface layer of conductive material (such as copper, silver), then covers photoresistance film, is needing
Metallic circuit part up and down to be protected covers one layer of photoresistance film;Unnecessary copper is etched away, is etched away unprotected outside photoresistance film
Metal;Fast-etching metal layer, fast-etching is carried out to substrate surface, removes the metal layer in addition to metallic circuit;
Remove photoresistance film.
S6:Protective layer is set in the front of the metallic circuit, is reserved in the front of the heat-radiating substrate and plants ball region,
And it is connected in ball placement region implanted metal ball, the copper bump using by the positive metallic circuit of the dielectric layer
Positioned at the positive metal ball of the heat-radiating substrate;
It should be noted that this protective layer can be thermosetting polymer, circuit can be carried out and be effectively protected.
S7:Unnecessary dielectric layer is removed, cuts out one single chip.
Material is thus formed one chip product one by one.
The preparation method of the chip for second of fan-out package structure for possessing front salient point that the embodiment of the present application provides,
Be it is above-mentioned the first possess front salient point fan-out package structure chip preparation method on the basis of, it is in addition to as follows
Technical characteristic:
It is described to open up at least one chip slot in the front of heat-radiating substrate and be:
At least one chip slot is opened up in the front of copper base or ceramic substrate.
Because the heat conductivility of copper and ceramics is splendid, therefore using the radiating effect meeting of copper base or ceramic substrate to chip
Greatly improve, and by chip body directly against on copper base or ceramic substrate, it is not necessary to custom lead-frame, and can root
Multiple same cake core bodies are carried out according to demand, even more than loading in mixture for different model chip body, manufacturing cost is reduced, improves
The production efficiency of chip.
The foregoing description of the disclosed embodiments, professional and technical personnel in the field are enable to realize or using the present invention.
A variety of modifications to these embodiments will be apparent for those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, it is of the invention
The embodiments shown herein is not intended to be limited to, and is to fit to and principles disclosed herein and features of novelty phase one
The most wide scope caused.
Claims (8)
- A kind of 1. chip for the fan-out package structure for possessing front salient point, it is characterised in that including heat-radiating substrate, the radiating The front of substrate offers at least one chip slot, and chip body, the front of the chip body are bonded with the chip slot Dielectric layer is all covered with the front of side, the heat-radiating substrate, the chip body is positively connected with copper bump, the copper Salient point is connected to positioned at the positive metal ball of the heat-radiating substrate using by the positive metallic circuit of the dielectric layer, described The front of metallic circuit is provided with protective layer in addition to the position of the metal ball.
- 2. the chip of the fan-out package structure according to claim 1 for possessing front salient point, it is characterised in that described to dissipate Hot substrate is copper base or ceramic substrate.
- 3. the chip of the fan-out package structure according to claim 1 for possessing front salient point, it is characterised in that the core Piece body is Nian Jie with the chip slot using Die-Attach glue.
- 4. the chip of the fan-out package structure according to claim 1 for possessing front salient point, it is characterised in that described to dissipate The thickness range of hot substrate is 0.5 millimeter to 5.0 millimeters.
- 5. the chip of the fan-out package structure according to claim 1 for possessing front salient point, it is characterised in that given an account of Electric layer is ABF layers, bcb layer or PI layers.
- 6. the chip of the fan-out package structure for possessing front salient point according to claim any one of 1-5, its feature exist In the metallic circuit is copper cash or silver wire.
- A kind of 7. preparation method of the chip for the fan-out package structure for possessing front salient point, it is characterised in that including:At least one chip slot is opened up in the front of heat-radiating substrate;Adhering chip body in the chip slot, in the front implantation copper bump of the chip body;The front of the chip body and side, the front of the heat-radiating substrate cover dielectric layer;Metal seed layer, and plating metal circuit are made in the dielectric layer surface;The metallic circuit need parts to be protected cover photoresistance film, etch away be not required to area to be protected metallic circuit and Metal seed layer, and remove the photoresistance film;Protective layer is set in the front of the metallic circuit, is reserved in the front of the heat-radiating substrate and plants ball region, and in institute State and plant ball region implanted metal ball, the copper bump is connected to positioned at institute using by the positive metallic circuit of the dielectric layer State the positive metal ball of heat-radiating substrate;Unnecessary dielectric layer is removed, cuts out one single chip.
- 8. the preparation method of the chip of the fan-out package structure according to claim 7 for possessing front salient point, its feature It is, it is described to open up at least one chip slot in the front of heat-radiating substrate and be:At least one chip slot is opened up in the front of copper base or ceramic substrate.
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Application publication date: 20171121 |