CN107367648B - Microwave monolithic circuit immunity test fixture - Google Patents
Microwave monolithic circuit immunity test fixture Download PDFInfo
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- CN107367648B CN107367648B CN201710487535.XA CN201710487535A CN107367648B CN 107367648 B CN107367648 B CN 107367648B CN 201710487535 A CN201710487535 A CN 201710487535A CN 107367648 B CN107367648 B CN 107367648B
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- 238000012360 testing method Methods 0.000 title claims abstract description 68
- 230000036039 immunity Effects 0.000 title claims abstract description 51
- 239000002184 metal Substances 0.000 claims abstract description 37
- 229910052751 metal Inorganic materials 0.000 claims abstract description 37
- 230000005855 radiation Effects 0.000 claims description 21
- 230000005670 electromagnetic radiation Effects 0.000 abstract description 30
- 230000008878 coupling Effects 0.000 abstract description 8
- 238000010168 coupling process Methods 0.000 abstract description 8
- 238000005859 coupling reaction Methods 0.000 abstract description 8
- 238000009434 installation Methods 0.000 abstract description 6
- ZHBBDTRJIVXKEX-UHFFFAOYSA-N 1-chloro-2-(3-chlorophenyl)benzene Chemical compound ClC1=CC=CC(C=2C(=CC=CC=2)Cl)=C1 ZHBBDTRJIVXKEX-UHFFFAOYSA-N 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000004806 packaging method and process Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 3
- 229910001369 Brass Inorganic materials 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000004484 Briquette Substances 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention provides a microwave single-chip circuit immunity test fixture which is used for clamping a microwave single-chip circuit and performing immunity test and comprises a base main body, a PCB (printed Circuit Board), a positioning block, a metal box cover detachably connected to the base main body, and a pressing block arranged on the metal box cover and used for pressing and fixing the microwave single-chip circuit. The clamp for testing the immunity of the microwave single-chip circuit provided by the invention has the advantages of simple and accurate positioning and convenient installation, can effectively eliminate the test noise of line coupling signals, realize the electromagnetic radiation immunity test of the microwave single-chip circuit, and improve the test accuracy.
Description
Technical Field
The invention belongs to the technical field of electromagnetic radiation immunity testing devices, and particularly relates to a microwave single-chip circuit immunity testing clamp.
Background
Electromagnetic compatibility is to study and solve the problems of electromagnetic interference generated by various electronic and electric equipment in operation to surrounding equipment and personnel and electromagnetic interference generated by the surrounding equipment, and is applied to the electronic industries such as national defense, aerospace, transportation, industry, civil use and the like.
As an important component in a communication system, a microwave monolithic circuit (microwave monolithic integrated circuit) is widely applied to wireless communication, mobile phones, satellite communication networks, global Positioning Systems (GPS), direct broadcast satellite reception (DBS), microwave millimeter wave automatic collision avoidance systems for automobiles and traffic control, and the like. With the increasing development of electromagnetic environments and the increasing complexity of contemporary electronic devices, microwave monolithic circuits in communication systems are inevitably exposed to various complex electromagnetic radiation environments where the electric or magnetic fields will temporarily or catastrophically fail the function and performance of the electronic device.
In order to test the reliability of the microwave monolithic circuit in the electromagnetic radiation environment, the electromagnetic radiation immunity test of the microwave monolithic circuit needs to be carried out. By detecting the anti-interference capability of the microwave monolithic circuit to the surrounding electromagnetic environment, the electromagnetic compatibility design of the microwave monolithic circuit can be guided and improved, and necessary electromagnetic compatibility protection measures can be adopted in use. Therefore, the electromagnetic radiation immunity test of the packaged microwave single-chip circuit is an important test for researching the reliability of the microwave single-chip circuit.
The electromagnetic radiation immunity test of the microwave monolithic circuit firstly adopts a function generator, a microwave signal generator and other instruments to cooperate to generate electromagnetic radiation signals meeting test requirements, then uses a matched power amplifier to amplify power, and uses a coupler and the like to radiate by a radiation antenna, thus forming electromagnetic radiation fields required by the test in open fields, GTEM chambers or reverberation chambers. And then, a test circuit for simulating actual functions and layout is built according to the established functional design of the microwave monolithic circuit. When the microwave monolithic circuit is exposed in an electromagnetic radiation field, the working state of the microwave monolithic circuit is determined by monitoring the change of sensitive parameters such as microwave characteristic parameters or direct current parameters of a measured piece, and the electromagnetic radiation immunity characteristic of the microwave monolithic circuit is obtained.
The QFN (quad flat non-leaded) package is square or rectangular, a large-area exposed bonding pad is arranged at the central position of the bottom of the package for conducting heat, and conductive bonding pads for realizing electrical connection are arranged around the periphery of the package with the large bonding pad.
When the microwave monolithic circuit packaged by the QFN is subjected to electromagnetic radiation immunity test, as the clamp, the direct current power supply circuit and the microwave circuit are both in a radiation field, electromagnetic signals are coupled and conducted into the microwave monolithic circuit by the circuits in the clamp and the direct current power supply circuit. Since the electromagnetic radiation immunity test of the microwave monolithic circuit only examines the sensitivity degree of the microwave monolithic circuit to electromagnetic radiation, the circuit coupling can have a great influence on the test result.
Disclosure of Invention
The invention aims to provide a microwave single-chip circuit immunity test fixture, which aims to solve the problem that circuit coupling in the prior art can greatly influence a test result.
In order to achieve the above purpose, the invention adopts the following technical scheme: the utility model provides a microwave monolithic circuit immunity test fixture for centre gripping microwave monolithic circuit carries out immunity test, be in including base main part, setting be in on the base main part and be used for placing microwave monolithic circuit's PCB circuit board, set up on the PCB circuit board and the suit is in the locating piece of microwave monolithic circuit periphery, detachable connection are in metal box lid on the base main part, set up on the metal box lid and be used for pressing to fix microwave monolithic circuit's briquetting, be equipped with on the locating piece and be used for the location microwave monolithic circuit locating hole of microwave monolithic circuit, be equipped with on the briquetting with the second electromagnetic compatibility signal radiation signal hole that the microwave monolithic circuit corresponds, be equipped with on the metal box lid with the first electromagnetic compatibility signal radiation signal hole that the second electromagnetic compatibility signal radiation signal hole corresponds, PCB circuit board and power electric connection.
Further, the pressing block is in sliding connection with the metal box cover, a limiting piece used for limiting the pressing block is arranged on the metal box cover, and an elastic piece used for providing elastic force for the pressing block is arranged between the metal box cover and the pressing block.
Further, the limiting piece is a limiting screw.
Further, the elastic piece is a spring.
Further, a first spring positioning hole for installing the spring is formed in the metal box cover, and a second spring positioning hole for installing the spring is formed in the pressing block.
Further, the metal box cover is connected with the base body through screws.
Further, the second electromagnetic compatible signal radiation signal hole is an inverted quadrangular frustum pyramid-shaped through hole.
Further, an SMA connector connected with the PCB is arranged on the base body, and the SMA connector is electrically connected with a power supply.
Further, an anti-rotation edge is arranged on the pressing block, and an anti-rotation table matched with the anti-rotation edge is arranged on the metal box cover.
Further, a plugboard which is in plug-in fit with the box cover is arranged on the periphery of the box edge of the base body.
The microwave monolithic circuit immunity test fixture provided by the invention has the beneficial effects that: compared with the prior art, the microwave single-chip circuit immunity test fixture has the advantages that the microwave single-chip circuit is arranged on the PCB, the microwave single-chip circuit is positioned through the positioning block, the microwave single-chip circuit is arranged in the positioning hole of the microwave single-chip circuit, the positioning block is used for sleeving and fixing the microwave single-chip circuit, the pressing block is used for pressing the microwave single-chip circuit to be positioned, the microwave single-chip circuit can be sealed, electromagnetic radiation signals can be monitored from the first electromagnetic compatible signal radiation signal hole and the second electromagnetic compatible signal radiation signal hole, the use positioning is simple and accurate, the installation is convenient, electromagnetic radiation sensitive electrical parameters of a tested piece in an electromagnetic radiation field can be monitored in real time, line coupling signal test noise can be effectively eliminated, the electromagnetic radiation immunity test of the microwave single-chip circuit is realized, and the test accuracy is improved.
Drawings
FIG. 1 is a schematic diagram of a split structure of a clamp for testing immunity of a microwave monolithic circuit according to an embodiment of the present invention;
FIG. 2 is a front cross-sectional view of FIG. 1;
fig. 3 is a schematic top view structure of a microwave monolithic noise immunity test fixture according to an embodiment of the present invention;
FIG. 4 is a cross-sectional view taken along line A-A of FIG. 3;
FIG. 5 is a schematic view of a metal lid according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a briquette structure used in an embodiment of the present invention;
FIG. 7 is a schematic structural diagram of a positioning block according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a PCB circuit board according to an embodiment of the present invention;
fig. 9 is a schematic structural diagram of a base body according to an embodiment of the present invention.
In the figure, 1, a metal box cover; 2. briquetting; 3. a positioning block; 4. a microwave monolithic circuit; 5. a base body; 6. a PCB circuit board; 7. an SMA joint; 8. a limit screw; 9. a spring; 11. SMA joint insertion holes; 121. a first screw via; 122 a first screw mounting hole; 13. a second screw mounting hole; 14. positioning holes; 15. a microwave monolithic circuit positioning hole; 16. a second screw via; 171. a first spring positioning hole; 172. a second spring positioning hole; 181. a first electromagnetic compatibility signal radiation signal hole; 182. a second electromagnetic compatibility signal radiation signal hole; 19. anti-rotation edges; 20. an ohmic line; 21. a PCB insulating channel not covered with copper; 22. a grounding copper-clad area; 23. a through hole; 24, a step of detecting the position of the base; and a limit screw mounting hole.
Detailed Description
0022. In order to make the technical problems, technical schemes and beneficial effects to be solved more clear, the invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
0023. It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
0024. It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are merely for convenience in describing and simplifying the description based on the orientation or positional relationship shown in the drawings, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus are not to be construed as limiting the invention.
0025. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
0026. Referring to fig. 1 to 3, a description will now be given of a microwave monolithic noise immunity test fixture according to the present invention. The microwave monolithic circuit immunity test fixture is used for clamping the microwave monolithic circuit 4 and performing immunity test, and is characterized in that: the microwave monolithic circuit comprises a base body 5, a PCB (printed circuit board) 6 arranged on the base body 5 and used for placing a microwave monolithic circuit 4, a positioning block 3 arranged on the PCB 6 and sleeved on the periphery of the microwave monolithic circuit 4, a metal box cover 1 detachably connected to the base body 5, and a pressing block 2 arranged on the metal box cover 1 and used for pressing and fixing the microwave monolithic circuit 4, wherein a microwave monolithic circuit positioning hole 15 used for positioning the microwave monolithic circuit 4 is arranged on the positioning block 3, a second electromagnetic compatibility signal radiation signal hole 182 corresponding to the microwave monolithic circuit 4 is arranged on the pressing block 2, a first electromagnetic compatibility signal radiation signal hole 181 corresponding to the second electromagnetic compatibility signal radiation signal hole 182 is arranged on the metal box cover 1, and the PCB 6 is electrically connected with a power supply.
0027. Compared with the prior art, the microwave single-chip circuit immunity test fixture provided by the invention has the advantages that the microwave single-chip circuit 4 is arranged on the PCB 6, the microwave single-chip circuit 4 is positioned through the positioning block 3, the microwave single-chip circuit 4 is placed in the microwave single-chip circuit positioning hole 15, the positioning block 3 is used for sleeving and fixing the microwave single-chip circuit 4, the pressing block 2 is used for pressing and positioning the microwave single-chip circuit 4, the microwave single-chip circuit 4 can be closed, electromagnetic radiation signals are monitored from the first electromagnetic compatible signal radiation signal hole 181 and the second electromagnetic compatible signal radiation signal hole 182, the positioning is simple and accurate, the installation is convenient, the electromagnetic radiation sensitive electrical parameters of a tested piece in an electromagnetic radiation field can be monitored in real time, the line coupling signal test noise can be effectively eliminated, the electromagnetic radiation immunity test of the microwave single-chip circuit 4 is realized, and the test accuracy is improved.
0028. Further, referring to fig. 1 to 5, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the invention, a pressing block 2 is slidably connected with a metal box cover 1, a limiting member for limiting the pressing block 2 is arranged on the metal box cover 1, and an elastic member for providing elastic force for the pressing block 2 is arranged between the metal box cover 1 and the pressing block 2. The pressing block 2 can be provided with elastic pressing force through the combined action of the limiting piece and the elastic piece, so that the stability and the accuracy of positioning are ensured, and the positioning is simple and the use is convenient.
0029. Further, the positioning block 3 is connected to the base body 5 through a screw, a second screw through hole 16 is formed in the positioning block 3, and a second screw mounting hole 13 corresponding to the second screw through hole 16 is formed in the base body 5.
0030. Further, referring to fig. 1 to 3, as a specific embodiment of the microwave monolithic circuit immunity test fixture provided by the present invention, the limiting member is a limiting screw 8. The metal box cover 1 is provided with a limit screw mounting hole 24 for mounting the limit screw 8, and the pressing block 2 is provided with a limit table matched with the limit screw 8.
0031. Further, referring to fig. 1 to 5, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the present invention, the elastic member is a spring 9. Or the elastic piece is a spring piece or rubber, preferably a spring 9, and the cost is low and the purchase is easy.
0032. Further, referring to fig. 1 to 6, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the present invention, a metal box cover 1 is provided with a first spring positioning hole 171 for installing a spring 9, and a pressing block 2 is provided with a second spring positioning hole 172 for installing the spring 9. Or the metal box cover is provided with a first spring 9 positioning table for installing the spring 9, and the pressing block 2 is provided with a second spring positioning table for installing the spring 9, or the spring 9 positioning table and the spring positioning hole are combined for use.
0033. Further, referring to fig. 1 to 5, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the present invention, a metal box cover 1 is connected to a base body by a screw. The metal box cover 1 is provided with a first screw through hole 121 for installing a screw, and the base body is provided with a first screw installation hole 122 corresponding to the first screw through hole 121.
0034. Further, referring to fig. 2, 4 and 6, as a specific embodiment of the microwave monolithic circuit immunity test fixture provided by the present invention, the second electromagnetic compatibility signal radiation signal hole 182 is an inverted quadrangular frustum pyramid-shaped through hole. The sealing of the microwave single-chip circuit 4 can be effectively ensured, and the accuracy of the test is improved.
0035. Further, referring to fig. 1 to 9, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the present invention, the base main body 5 is provided with an SMA connector 7 connected to the PCB 6, and the SMA connector 7 is electrically connected to a power supply. The base body 5 is provided with SMA joint 7 receptacles for mounting SMA joints 7.
0036. Further, referring to fig. 1 to 6, as a specific embodiment of the microwave monolithic circuit immunity testing fixture provided by the present invention, an anti-rotation edge is disposed on the pressing block 2, and an anti-rotation table matched with the anti-rotation edge is disposed on the metal box cover 1. The pressing block 2 can be prevented from rotating through the cooperation of the anti-rotating edge and the anti-rotating table, and the installation precision is ensured.
0037. Further, referring to fig. 1 to 3, as a specific embodiment of the microwave monolithic circuit immunity testing fixture provided by the present invention, a plugboard in plug-in fit with the box cover is arranged on the periphery of the box edge of the base body 5. The plugging fit can prevent the radiation signal from leaking to the outside.
0038. Further, referring to fig. 1 to 3, as a specific embodiment of the microwave monolithic circuit noise immunity test fixture provided by the present invention, an ohmic line 20, a PCB insulation channel 21 without copper coating, a grounding copper coating area 22 and a through hole 23 are provided on a PCB circuit board 6, the PCB circuit board 6 is positioned with a base body 5 by a positioning pin, and a positioning hole 14 for positioning the PCB circuit board 6 is provided on the base body 5.
0039. Specifically, the device can be applied to the immunity test of the microwave monolithic circuit.
0040. The base can make the microwave monolithic circuit well grounded and play a supporting role.
0041 the pcb 6 can be designed to build a test circuit simulating the actual function and layout for a given function of the microwave monolithic circuit.
0042. The positioning block 3 and the pressing block 2 are utilized to realize the positioning, installation and pressing of the microwave monolithic circuit, and simultaneously, the internal circuit of the clamp is shielded, so that the coupling noise is eliminated. The base main body 5 is made of metal copper, all direct current channels and microwave channels are made of SMA connectors 7 (specifically, SMA female connectors), and a cable matched with the clamp is an electromagnetic shielding cable in the form of an SMA male connector; the circuit board is a Rogowski 4350 nickel gold-plated PCB, the impedance of a microwave path system is 50 ohms through simulation, and a grounding hole with the diameter of 0.5mm is designed, so that the good grounding of the microwave single-chip circuit is ensured, and meanwhile, a certain isolation effect is achieved on signals between the circuits; the locating piece 3 is polytetrafluoroethylene material, and briquetting 2 adopts brass material, and hollow structure guarantees that the measured piece can receive electromagnetic radiation signal's influence, and the other part plays the shielding effect to the inside microwave circuit of anchor clamps and direct current circuit, avoids the production of coupling noise.
0043. The pressing block 2 is made of brass with good shielding performance, a cavity is reserved only above the tested piece, the internal circuit of the clamp is shielded while the tested piece is guaranteed to be subjected to electromagnetic radiation, the PCB 6 is connected with the SMA female connector through a direct current path and a microwave path. Before use, the PCB 6 is tightly adhered to the base by using conductive adhesive, the SMA connector 7 is installed, the positioning block 3 is fixed above the PCB 6 by using screws, and the positioning block is fixed by using a pressing device after being installed into a tested piece.
0044. When the QFN packaging microwave single-product circuit is tested, the test clamp and the direct-current power supply, the microwave signal source, the vector network analyzer, the frequency spectrograph and the like are connected through the shielding cable to implement the monitoring instrument, the test clamp and part of the cable are arranged in the full-wave darkroom, the monitoring instrument and the like are arranged outside the full-wave darkroom, and the cavity on the metal box cover 1 on the clamp is positioned above a tested piece, so that the tested QFN packaging microwave single-product circuit is ensured to receive electromagnetic radiation signal influence. And after the preparation, the tested sample is in a normal working state, and then electromagnetic radiation signals are applied to test the immunity of the tested sample.
0045. The clamp can be used for electromagnetic radiation immunity test of QFN packaging microwave single-chip circuits.
0046. The series of clamps can be suitable for QFN packaging microwave single-chip circuits with different specifications, are simple and accurate in positioning and convenient to install, can monitor electromagnetic radiation sensitive electrical parameters of a tested piece in an electromagnetic radiation field in real time, effectively eliminate line coupling signal test noise, and can realize electromagnetic radiation immunity test of the QFN packaging microwave single-chip circuits.
0047. The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.
Claims (9)
1. The utility model provides a microwave monolithic circuit immunity test fixture for centre gripping microwave monolithic circuit carries out immunity test, its characterized in that: the microwave single-chip circuit comprises a base main body, a PCB (printed circuit board) arranged on the base main body and used for placing a microwave single-chip circuit, a positioning block arranged on the PCB and sleeved on the periphery of the microwave single-chip circuit, a metal box cover detachably connected to the base main body, and a pressing block arranged on the metal box cover and used for pressing and fixing the microwave single-chip circuit, wherein a microwave single-chip circuit positioning hole used for positioning the microwave single-chip circuit is arranged on the positioning block, a second electromagnetic compatible signal radiation signal hole corresponding to the microwave single-chip circuit is arranged on the pressing block, a first electromagnetic compatible signal radiation signal hole corresponding to the second electromagnetic compatible signal radiation signal hole is arranged on the metal box cover, and the PCB is electrically connected with a power supply; the second electromagnetic compatible signal radiation signal hole is an inverted quadrangular frustum pyramid-shaped through hole.
2. The microwave monolithic immunity test fixture of claim 1, wherein: the pressing block is in sliding connection with the metal box cover, a limiting piece used for limiting the pressing block is arranged on the metal box cover, and an elastic piece used for providing elastic force for the pressing block is arranged between the metal box cover and the pressing block.
3. The microwave monolithic immunity test fixture of claim 2, wherein: the limiting piece is a limiting screw.
4. The microwave monolithic immunity test fixture of claim 2, wherein: the elastic piece is a spring.
5. The microwave monolithic immunity test fixture as recited in claim 4, wherein: the metal box cover is provided with a first spring positioning hole for installing the spring, and the pressing block is provided with a second spring positioning hole for installing the spring.
6. The microwave monolithic immunity test fixture of claim 1, wherein: the metal box cover is connected with the base body through screws.
7. The microwave monolithic immunity test fixture of claim 1, wherein: and the base main body is provided with an SMA connector connected with the PCB, and the SMA connector is electrically connected with a power supply.
8. The microwave monolithic immunity test fixture of claim 1, wherein: the pressing block is provided with an anti-rotation edge, and the metal box cover is provided with an anti-rotation table matched with the anti-rotation edge.
9. The microwave monolithic immunity test fixture of claim 1, wherein: the periphery of the box edge of the base body is provided with a plugboard which is in plug-in fit with the metal box cover.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710487535.XA CN107367648B (en) | 2017-06-23 | 2017-06-23 | Microwave monolithic circuit immunity test fixture |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710487535.XA CN107367648B (en) | 2017-06-23 | 2017-06-23 | Microwave monolithic circuit immunity test fixture |
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| CN107367648A CN107367648A (en) | 2017-11-21 |
| CN107367648B true CN107367648B (en) | 2023-07-04 |
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| CN112730909A (en) * | 2020-12-25 | 2021-04-30 | 无锡国芯微电子系统有限公司 | Microwave module test fixture |
| CN116908658B (en) * | 2023-08-01 | 2024-01-05 | 中国人民解放军国防科技大学 | Small-size small-signal circuit board testing device |
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